DE602004001927T2 - Heterostructures of III-nitride semiconductor material for light-emitting devices - Google Patents
Heterostructures of III-nitride semiconductor material for light-emitting devices Download PDFInfo
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- 239000000463 material Substances 0.000 title description 8
- 239000004065 semiconductor Substances 0.000 title description 7
- 230000004888 barrier function Effects 0.000 claims description 64
- 239000000203 mixture Substances 0.000 claims description 52
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims description 44
- 229910052738 indium Inorganic materials 0.000 claims description 43
- 239000002800 charge carrier Substances 0.000 claims description 32
- 239000000758 substrate Substances 0.000 claims description 6
- 239000000969 carrier Substances 0.000 description 9
- 239000013078 crystal Substances 0.000 description 8
- 230000010287 polarization Effects 0.000 description 8
- 238000010586 diagram Methods 0.000 description 7
- 230000006798 recombination Effects 0.000 description 6
- 238000005215 recombination Methods 0.000 description 6
- 230000005641 tunneling Effects 0.000 description 6
- 229910002601 GaN Inorganic materials 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 230000007423 decrease Effects 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- 239000002019 doping agent Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 229910052594 sapphire Inorganic materials 0.000 description 2
- 239000010980 sapphire Substances 0.000 description 2
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 2
- 229910010271 silicon carbide Inorganic materials 0.000 description 2
- 229910002704 AlGaN Inorganic materials 0.000 description 1
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- 229910000807 Ga alloy Inorganic materials 0.000 description 1
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 239000011149 active material Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052787 antimony Inorganic materials 0.000 description 1
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 229910003465 moissanite Inorganic materials 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 229910052716 thallium Inorganic materials 0.000 description 1
- BKVIYDNLLOSFOA-UHFFFAOYSA-N thallium Chemical compound [Tl] BKVIYDNLLOSFOA-UHFFFAOYSA-N 0.000 description 1
- 238000001429 visible spectrum Methods 0.000 description 1
- 230000005428 wave function Effects 0.000 description 1
- 230000002087 whitening effect Effects 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/3425—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers comprising couples wells or superlattices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34333—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer based on Ga(In)N or Ga(In)P, e.g. blue laser
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34346—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser characterised by the materials of the barrier layers
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- Engineering & Computer Science (AREA)
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- Optics & Photonics (AREA)
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- Life Sciences & Earth Sciences (AREA)
- Electromagnetism (AREA)
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Description
HINTERGRUNDBACKGROUND
Gebiet der ErfindungField of the invention
Die vorliegende Erfindung bezieht sich im Allgemeinen auf Licht emittierende Halbleiteranordnungen, und im Besonderen auf aktive Bereiche für Licht emittierende III-Nitrid-Anordnungen.The The present invention relates generally to light-emitting Semiconductor devices, and in particular active regions for light emitting III-nitride devices.
Beschreibung des verwandten Standes der Technikdescription of the related art
Licht emittierende Halbleiteranordnungen, wie z.B. Licht emittierende Dioden (LEDs), gehören zu den leistungsfähigsten Lichtquellen, welche zurzeit zur Verfügung stehen. Materialsysteme, die gegenwärtig bei der Herstellung LEDs großer Helligkeit, die einen Betrieb über das sichtbare Spektrum ermöglichen, von Interesse sind, sind Halbleiter der Gruppe III-V, insbesondere binäre, ternäre und quaternäre Legierungen aus Gallium, Aluminium, Indium und Stickstoff, ebenfalls als III-Nitrid-Materialien bezeichnet. Typischerweise werden III-Nitrid-Schichten auf Saphir-, Siliciumcarbid- oder Galliumnitridsubstrate epitaxial aufgewachst.light emitting semiconductor devices, such as e.g. Light-emitting Diodes (LEDs) belong to the most powerful Light sources, which are currently available. Material systems, the present in the production LEDs big Brightness, which is about operation enable the visible spectrum of interest are group III-V semiconductors, in particular binary, ternary and quaternaries Alloys of gallium, aluminum, indium and nitrogen, also referred to as III-nitride materials. Typically, III-nitride layers are formed Sapphire, silicon carbide or gallium nitride grown epitaxially.
III-Nitrid-Materialien werden gewöhnlich bei einem Licht emittierenden oder aktiven Bereich aufgebracht, welcher mehrere Quantentopfschichten, die durch Barriereschichten getrennt sind, aufweist. Der aktive Bereich ist zwischen einem p-leitenden Bereich und einem n-leitenden Bereich angeordnet. Der p- und n-leitende Bereich führen den Quantentöpfen in dem aktiven Bereich, wo die positiven und negativen Ladungsträger zur Erzeugung von Licht rekombinieren, positive und negative Ladungsträger (Elektronen und Defektelektronen) zu. Die Helligkeit einer Licht emittierenden Anordnung wird zumindest teilweise durch den inneren Quantenwirkungsgrad der Anordnung bestimmt, welcher angibt, wie viele Licht emittierende Elektron-Loch-Rekombinationen in dem aktiven Bereich stattfinden.III-nitride materials become ordinary applied to a light emitting or active region, which several quantum well layers, by barrier layers are separated. The active region is between a p-type region and an n-type region. The p- and n-conducting Lead area the quantum wells in the active area, where the positive and negative charge carriers to Generation of light recombine positive and negative charge carriers (electrons and holes). The brightness of a light-emitting Arrangement is at least partially due to the internal quantum efficiency the arrangement determines which indicates how many light emitting Electron-hole recombination occur in the active region.
Jede Quantentopfschicht kann zu einem bestimmten Zeitpunkt eine endliche Anzahl Ladungsträger halten. Die Trägerkapazität einer Halbleiterschicht hängt davon ab, wie viel Material in der Schicht vorhanden ist; je dicker somit eine Quantentopfschicht ist, desto mehr Ladungsträger kann diese Quantentopfschicht halten. Bei III-Nitrid-Anordnungen sind die Quantentopfschichten jedoch typischerweise aus InGaN, welches im Vergleich zu anderen III-Nitridschichten auf Grund der großen Größe von Indiumatomen und der Menge Indium, welche erforderlich ist, um den Quantentopf Licht emittierend zu machen, eine schlechte Kristallqualität aufweist. Eine weitere Komplikation ist, dass InGaN gewöhnlich bei einer niedrigeren Temperatur als GaN aufgebracht wird, was in verminderter Kristallqualität resultiert. Darüber hinaus tritt in den InGaN-Schichten eine In-Fluktuation auf, welche die Trägerkapazität der Licht emittierenden Schichten begrenzt. Piezoelektrische Felder können bei reduzierter Oszillatorstärke zur Rekombination eine verringerte Überlappung von Elektronen- und Defektelektronen-Wellenfunktionen bewirken. Schließlich können Defekte in den kristallinen Halbleiterschichten einer Anordnung eine nicht radiative Rekombination von positiven und negativen Ladungsträgern bewirken, was die Menge des Lichts, welches durch eine Anordnung erzeugt wird, reduzieren kann, indem die Quantentopfschichten Ladungsträgern beraubt werden. Somit sind die Quantentopfschichten, um die Kristallqualität und den inneren Quantenwirkungsgrad der Licht emittierenden Anordnung aufrechtzuerhalten, im Allgemeinen dünn, und die Barriereschichten, welche die Quantentopfschichten trennen, sind im Allgemeinen dicke Schichten, welche eine bessere Kristallqualität als die In-enthaltenden Quantentopfschichten aufweisen.each Quantum well layer can be a finite at a given time Number of charge carriers hold. The carrier capacity of a Semiconductor layer hangs depending on how much material is present in the layer; the thicker thus, a quantum well layer is, the more charge carriers can hold this quantum well layer. For III-nitride devices, the quantum well layers are however, typically InGaN, which is compared to other III nitride layers because of the big ones Size of indium atoms and the amount of indium needed to make the quantum well Making light emitting has a poor crystal quality. Another complication is that InGaN is usually at a lower level Temperature is applied as GaN, resulting in reduced crystal quality. Furthermore In-In fluctuation occurs in the InGaN layers, which is the carrier capacity of the light limited to emitting layers. Piezoelectric fields can at reduced oscillator strength for Recombination a reduced overlap of electron and hole wave functions. After all can Defects in the crystalline semiconductor layers of an assembly cause non-radiative recombination of positive and negative charge carriers, what the amount of light that is generated by an arrangement can reduce by the quantum well layers robbed charge carriers become. Thus, the quantum well layers are the crystal quality and the maintain internal quantum efficiency of the light-emitting device, generally thin, and the barrier layers separating the quantum well layers, are generally thick layers which have better crystal quality than the In-containing ones Have quantum well layers.
Y T Rebane et al, Light emitting diode with charge asymmetric resonance tunnelling, Physics Status Solidi (a), Bd. 180, Seiten 121–126 (2000), beschreibt Licht emittierende Dioden, wobei ein Elektronenemitter über eine Barriere mit dem aktiven Bereich verbunden ist. Die Elektronen tunneln durch die Barriere in den aktiven Quantentopf, wo sie sich zur Erzeugung von Licht mit Defektelektronen rekombinieren.Y T Rebane et al, Light emitting diode with charge asymmetric resonance Tunneling, Physics Status Solidi (a), Vol. 180, pp. 121-126 (2000), describes light-emitting diodes, wherein an electron emitter via a Barrier is connected to the active area. The electrons tunnel through the barrier into the active quantum well, where they are generating recombine light with holes.
T C Wen et al, InGaN/GaN tunnel injection blue light-emitting diodes, IEEE transactions on Electron Devices, Bd. 49, Nr. 6, Seiten 1093–1095 (2002), beschreibt Licht emittierende Dioden, wobei ein Elektronenemitter über eine Barriere mit dem aktiven Quantentopf verbunden ist, wobei der aktive Quantentopf eine Multi-Quantum-Well(MQW) Struktur aufweist, welche aus mehreren schmalen Quantentöpfen besteht, die durch Durchtunnelungsbarrieren getrennt sind.T C Wen et al, InGaN / GaN tunnel injection blue light-emitting diodes, IEEE transactions on Electron Devices, Vol. 49, No. 6, pp. 1093-1095 (2002) Light emitting diodes, wherein an electron emitter via a Barrier is connected to the active quantum well, wherein the active Quantum well has a multi-quantum well (MQW) structure, which from several narrow quantum wells which are separated by tunneling barriers.
P Battacharya et al, Tunneling injection lasers: a new dass of lasers with reduces hot carrier effects, IEEE Journal of Quantum Electronic, Bd. 32, Seiten 1620–1629 (1996), beschreibt Laserdioden, wobei ein Elektronenemitter über eine Barriere mit dem aktiven Quantentopf verbunden ist, wobei der aktive Quantentopf eine Multi-Quantum- Well-(MQW) Struktur aufweist, welche aus mehreren schmalen Quantentöpfen besteht, die durch Durchtunnelungsbarrieren getrennt sind.P Battacharya et al, Tunneling laser Lasers: a new that of lasers with reduced hot carrier effects, IEEE Journal of Quantum Electronic, Vol. 32, pages 1620-1629 (1996), describes laser diodes, wherein an electron emitter via a Barrier is connected to the active quantum well, wherein the active Quantum well a multi-quantum well (MQW) structure which consists of a plurality of narrow quantum wells, which by Durchrunungsbarrieren are separated.
ZUSAMMENFASSUNGSUMMARY
Gemäß Ausführungsbeispielen der vorliegenden Erfindung sind Heterostrukturausführungen, durch welche die in den Quantentopfschichten des aktiven Bereichs vorhandene Anzahl Ladungsträger erhöht werden kann, für Licht emittierende III-Nitrid-Anordnungen, wie z.B. Licht emittierende Dioden, offenbart. In einem ersten Ausführungsbeispiel ist eine Reservoirschicht zusammen mit einer Barriereschicht und Quantentopfschicht in dem aktiven Bereich einer Licht emittierenden Anordnung vorgesehen. In einigen Ausführungsbeispielen ist die Reservoirschicht dicker als die Barriereschicht und Quantentopfschicht, weist eine größere Indiumzusammensetzung als die Barriereschicht und eine geringere Indiumzusammensetzung als die Quantentopfschicht auf. In einigen Ausführungsbeispielen ist die Reservoirschicht in Angrenzung an die Quantentopfschicht angeordnet und ist in „Trichter"-Träger in die Quantentopfschicht gradiert.According to embodiments of the present invention, heterostructure designs by which the number of carriers present in the quantum well layers of the active region can be increased for light emitting III-Nit rid arrangements, such as light-emitting diodes disclosed. In a first embodiment, a reservoir layer is provided together with a barrier layer and quantum well layer in the active region of a light-emitting device. In some embodiments, the reservoir layer is thicker than the barrier layer and quantum well layer, has a larger indium composition than the barrier layer and a lower indium composition than the quantum well layer. In some embodiments, the reservoir layer is disposed adjacent the quantum well layer and is graded into "funnel" carriers into the quantum well layer.
In einem zweiten Ausführungsbeispiel ist der aktive Bereich einer Licht emittierenden Anordnung ein Übergitter aus abwechselnden Quantentopfschichten und Barriereschichten. In einigen Ausführungsbeispielen sind die Barriereschichten so dünn, dass Ladungsträger durch eine Barriereschicht zwischen Quantentopfschichten tunneln können.In a second embodiment For example, the active region of a light-emitting device is a superlattice from alternating quantum well layers and barrier layers. In some embodiments the barrier layers are so thin that charge carrier tunnel through quantum well layers through a barrier layer can.
BESCHREIBUNG DER ZEICHUNGDESCRIPTION OF THE DRAWING
Ausführungsbeispiele der Erfindung sind in der Zeichnung dargestellt und werden im Folgenden näher beschrieben. Es zeigen:embodiments The invention are illustrated in the drawings and will be described in more detail below. Show it:
DETAILLIERTE BESCHREIBUNGDETAILED DESCRIPTION
Gemäß Ausführungsbeispielen der vorliegenden Erfindung werden Heterostrukturausführungen, durch welche die Anzahl der in den Quantentopfschichten des aktiven Bereichs vorhandenen Ladungsträger erhöht werden kann, für Licht emittierende III-Nitrid-Anordnungen, wie z.B. Licht emittierende Dioden, offenbart. III-Nitrid-Halbleiterschichten, wie hier verwendet, beziehen sich auf, durch die allgemeine Formel AlxGayIn1-x-yN (0 ≤ x ≤ 1, 0 ≤ y ≤ 1, 0 ≤ x + y ≤ 1) dargestellte Verbindungen, welche weiterhin Elemente der Gruppe III, wie z.B. Bor und Thallium, enthalten können, und bei welchen ein Teil des Stickstoffs durch Phosphor, Arsen, Antimon oder Bismut ersetzt werden kann.In accordance with embodiments of the present invention, heterostructure designs that can increase the number of carriers present in the quantum well layers of the active region are disclosed for III-nitride light emitting devices, such as light emitting diodes. Ill-nitride semiconductor layers as used herein, compounds represented refer to, by the general formula Al x Ga y In 1-xy N (0 ≤ x ≤ 1, 0 ≤ y ≤ 1, 0 ≤ x + y ≤ 1) which may further contain Group III elements such as boron and thallium and in which part of the nitrogen may be replaced by phosphorus, arsenic, antimony or bismuth.
Der
aktive Bereich
Barriereschichten
Die
Reservoirschichten
Die
Wahrscheinlichkeit, Barriereschichten
Obgleich
Wie
in den
Bei
der in
Die
in den
Sind
die Barrieren dünn
genug, damit Ladungsträger,
wie in
Zweitens
kann in einem Übergitter
als aktiver Bereich ein geringerer Beschränkungsnachteil als in einem
konventionellen, aktiven Bereich mit dicken Barriereschichten bestehen.
Der Beschränkungsnachteil
ist in den
Drittens
kann ein Übergitter
als aktiver Bereich die Einflüsse
von Polarisationsfeldern reduzieren.
Auf Grund der vorliegenden, detaillierten Beschreibung können von Fachkundigen Modifikationen vorgenommen werden, ohne dabei von der Erfindung, wie in den Ansprüchen definiert, abzuweichen. Der Anwendungsbereich der Erfindung ist daher nicht auf die dargestellten und beschriebenen, spezifischen Ausführungsbeispiele zu beschränken.On Reason of the present, detailed description may be of Expert modifications are made without going by the Invention as in the claims defined, depart. The scope of the invention is therefore not on the illustrated and described, specific embodiments to restrict.
Claims (17)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/465,775 US6995389B2 (en) | 2003-06-18 | 2003-06-18 | Heterostructures for III-nitride light emitting devices |
| US465775 | 2003-06-18 |
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| Publication Number | Publication Date |
|---|---|
| DE602004001927D1 DE602004001927D1 (en) | 2006-09-28 |
| DE602004001927T2 true DE602004001927T2 (en) | 2007-09-06 |
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| DE602004001927T Expired - Lifetime DE602004001927T2 (en) | 2003-06-18 | 2004-06-08 | Heterostructures of III-nitride semiconductor material for light-emitting devices |
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| Country | Link |
|---|---|
| US (1) | US6995389B2 (en) |
| EP (1) | EP1489708B1 (en) |
| JP (1) | JP2005012216A (en) |
| DE (1) | DE602004001927T2 (en) |
| TW (1) | TWI345841B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102007058723A1 (en) * | 2007-09-10 | 2009-03-12 | Osram Opto Semiconductors Gmbh | Light emitting structure |
Families Citing this family (58)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6955933B2 (en) * | 2001-07-24 | 2005-10-18 | Lumileds Lighting U.S., Llc | Light emitting diodes with graded composition active regions |
| TWI238549B (en) * | 2003-08-21 | 2005-08-21 | Toyoda Gosei Kk | Light-emitting semiconductor device and a method of manufacturing it |
| JP2005244207A (en) * | 2004-01-30 | 2005-09-08 | Showa Denko Kk | Gallium nitride compound semiconductor light emitting device |
| KR100513923B1 (en) * | 2004-08-13 | 2005-09-08 | 재단법인서울대학교산학협력재단 | Growth method of nitride semiconductor layer and light emitting device using the growth method |
| FI20041213A0 (en) * | 2004-09-17 | 2004-09-17 | Optogan Oy | The semiconductor heterostructure |
| WO2006074916A1 (en) * | 2005-01-13 | 2006-07-20 | Ecole Polytechnique Federale De Lausanne Industrial Relations Office (Sri) | Group iii nitride light-emitting devices having a polarization-doped region |
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-
2003
- 2003-06-18 US US10/465,775 patent/US6995389B2/en not_active Expired - Lifetime
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- 2004-06-08 EP EP04102581A patent/EP1489708B1/en not_active Expired - Lifetime
- 2004-06-08 DE DE602004001927T patent/DE602004001927T2/en not_active Expired - Lifetime
- 2004-06-15 JP JP2004177062A patent/JP2005012216A/en active Pending
- 2004-06-15 TW TW093117230A patent/TWI345841B/en not_active IP Right Cessation
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102007058723A1 (en) * | 2007-09-10 | 2009-03-12 | Osram Opto Semiconductors Gmbh | Light emitting structure |
| US8390004B2 (en) | 2007-09-10 | 2013-03-05 | Osram Opto Semiconductors Gmbh | Light-emitting structure |
Also Published As
| Publication number | Publication date |
|---|---|
| US6995389B2 (en) | 2006-02-07 |
| DE602004001927D1 (en) | 2006-09-28 |
| TWI345841B (en) | 2011-07-21 |
| JP2005012216A (en) | 2005-01-13 |
| TW200507301A (en) | 2005-02-16 |
| EP1489708A1 (en) | 2004-12-22 |
| US20040256611A1 (en) | 2004-12-23 |
| EP1489708B1 (en) | 2006-08-16 |
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Owner name: PHILIPS LUMILEDS LIGHTING COMPANY,LLC, SAN JOS, US |