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DE602004009875D1 - Verfahren zur Bildverarbeitung für Profilbestimmung mittels strukturiertes Lichts - Google Patents

Verfahren zur Bildverarbeitung für Profilbestimmung mittels strukturiertes Lichts

Info

Publication number
DE602004009875D1
DE602004009875D1 DE602004009875T DE602004009875T DE602004009875D1 DE 602004009875 D1 DE602004009875 D1 DE 602004009875D1 DE 602004009875 T DE602004009875 T DE 602004009875T DE 602004009875 T DE602004009875 T DE 602004009875T DE 602004009875 D1 DE602004009875 D1 DE 602004009875D1
Authority
DE
Germany
Prior art keywords
image processing
structured light
profile determination
profile
determination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE602004009875T
Other languages
English (en)
Other versions
DE602004009875T2 (de
Inventor
Qingying Hu
Kevin George Harding
Joseph Benjamin Ross
Peter William Lorraine
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of DE602004009875D1 publication Critical patent/DE602004009875D1/de
Application granted granted Critical
Publication of DE602004009875T2 publication Critical patent/DE602004009875T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
DE602004009875T 2003-08-28 2004-08-26 Verfahren zur Bildverarbeitung für Profilbestimmung mittels strukturiertem Lichts Expired - Lifetime DE602004009875T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US652366 2003-08-28
US10/652,366 US7302109B2 (en) 2003-08-28 2003-08-28 Method and system for image processing for structured light profiling of a part

Publications (2)

Publication Number Publication Date
DE602004009875D1 true DE602004009875D1 (de) 2007-12-20
DE602004009875T2 DE602004009875T2 (de) 2008-08-28

Family

ID=34194674

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004009875T Expired - Lifetime DE602004009875T2 (de) 2003-08-28 2004-08-26 Verfahren zur Bildverarbeitung für Profilbestimmung mittels strukturiertem Lichts

Country Status (4)

Country Link
US (1) US7302109B2 (de)
EP (1) EP1519142B1 (de)
JP (1) JP4792214B2 (de)
DE (1) DE602004009875T2 (de)

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US7916898B2 (en) * 2003-09-15 2011-03-29 Deere & Company Method and system for identifying an edge of a crop
US7336374B2 (en) * 2005-10-24 2008-02-26 General Electric Company Methods and apparatus for generating a mask
JP4812568B2 (ja) * 2006-09-07 2011-11-09 株式会社ミツトヨ 光学式測定装置、光学式測定方法、及び光学式測定処理プログラム
US7821649B2 (en) 2008-03-05 2010-10-26 Ge Inspection Technologies, Lp Fringe projection system and method for a probe suitable for phase-shift analysis
US7969583B2 (en) * 2008-03-05 2011-06-28 General Electric Company System and method to determine an object distance from a reference point to a point on the object surface
US7812968B2 (en) * 2008-03-05 2010-10-12 Ge Inspection Technologies, Lp Fringe projection system and method for a probe using a coherent fiber bundle
US8107083B2 (en) * 2008-03-05 2012-01-31 General Electric Company System aspects for a probe system that utilizes structured-light
US8422030B2 (en) * 2008-03-05 2013-04-16 General Electric Company Fringe projection system with intensity modulating by columns of a plurality of grating elements
WO2011088249A2 (en) * 2010-01-14 2011-07-21 Alces Technology, Inc. Compact display system
US8723923B2 (en) 2010-01-14 2014-05-13 Alces Technology Structured light system
CN102175182B (zh) * 2011-01-27 2012-10-10 浙江大学宁波理工学院 结构光三维测量装置及其完整点云数据的获取方法
US8755627B2 (en) * 2011-04-14 2014-06-17 Lexmark International, Inc. Method and system for reducing speckles in a captured image
ITBO20130407A1 (it) * 2013-07-26 2015-01-27 Swisslog Italia Spa Dispositivo e procedimento per singolarizzare prodotti raggruppati in blister
US9389069B2 (en) 2014-03-26 2016-07-12 Alces Technology, Inc. Compact 3D depth capture systems
US10018113B2 (en) * 2015-11-11 2018-07-10 General Electric Company Ultrasonic cleaning system and method
CN106091985B (zh) * 2016-06-07 2018-12-04 西安交通大学 一种三维采集装置及三维扫描系统
CN106767707B (zh) * 2016-12-16 2019-06-04 中南大学 一种基于结构光的储物状态检测方法及系统

Family Cites Families (18)

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US4875777A (en) 1987-09-30 1989-10-24 Industrial Technology Institute Off-axis high accuracy structured light profiler
JPH06105166B2 (ja) * 1988-02-22 1994-12-21 浜松ホトニクス株式会社 ビーム中心位置検出装置
JPH04287290A (ja) * 1990-11-20 1992-10-12 Imra America Inc ハフ変換画像処理装置
US5606390A (en) * 1991-09-27 1997-02-25 Canon Kabushiki Kaisha Visual-line detecting device and optical apparatus having the same
US6005984A (en) * 1991-12-11 1999-12-21 Fujitsu Limited Process and apparatus for extracting and recognizing figure elements using division into receptive fields, polar transformation, application of one-dimensional filter, and correlation between plurality of images
US6850252B1 (en) * 1999-10-05 2005-02-01 Steven M. Hoffberg Intelligent electronic appliance system and method
JPH0674724A (ja) * 1992-08-28 1994-03-18 Koyo Seiko Co Ltd ３次元形状測定における光切断線の重心位置算出方法
JP2715895B2 (ja) * 1994-01-31 1998-02-18 日本電気株式会社 光強度分布シミュレーション方法
US5528339A (en) * 1994-08-26 1996-06-18 Eastman Kodak Company Color image reproduction of scenes with color enhancement and preferential tone mapping
US5999840A (en) 1994-09-01 1999-12-07 Massachusetts Institute Of Technology System and method of registration of three-dimensional data sets
US5852672A (en) 1995-07-10 1998-12-22 The Regents Of The University Of California Image system for three dimensional, 360 DEGREE, time sequence surface mapping of moving objects
JP3327068B2 (ja) * 1995-10-05 2002-09-24 松下電器産業株式会社 路面計測装置
US6249315B1 (en) * 1997-03-24 2001-06-19 Jack M. Holm Strategy for pictorial digital image processing
EP1207414B1 (de) * 1997-10-29 2016-05-04 Motic China Group Co., Ltd. Gerät und Verfahren zur Mikroskopie unter Verwendung räumlich modulierten Lichtes
US6782137B1 (en) * 1999-11-24 2004-08-24 General Electric Company Digital image display improvement system and method
US6639597B1 (en) * 2000-02-28 2003-10-28 Mitsubishi Electric Research Laboratories Inc Visibility splatting and image reconstruction for surface elements
US6633683B1 (en) * 2000-06-26 2003-10-14 Miranda Technologies Inc. Apparatus and method for adaptively reducing noise in a noisy input image signal
JP2002071325A (ja) * 2000-09-01 2002-03-08 Kobe Steel Ltd 物体形状計測方法及びその装置

Also Published As

Publication number Publication date
DE602004009875T2 (de) 2008-08-28
EP1519142B1 (de) 2007-11-07
JP2005077411A (ja) 2005-03-24
US20050046872A1 (en) 2005-03-03
US7302109B2 (en) 2007-11-27
EP1519142A3 (de) 2006-09-20
EP1519142A2 (de) 2005-03-30
JP4792214B2 (ja) 2011-10-12

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Legal Events

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