DE602004006051D1 - Optisches Projektionssystem - Google Patents
Optisches ProjektionssystemInfo
- Publication number
- DE602004006051D1 DE602004006051D1 DE602004006051T DE602004006051T DE602004006051D1 DE 602004006051 D1 DE602004006051 D1 DE 602004006051D1 DE 602004006051 T DE602004006051 T DE 602004006051T DE 602004006051 T DE602004006051 T DE 602004006051T DE 602004006051 D1 DE602004006051 D1 DE 602004006051D1
- Authority
- DE
- Germany
- Prior art keywords
- projection system
- optical projection
- optical
- projection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000003287 optical effect Effects 0.000 title 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70258—Projection system adjustments, e.g. adjustments during exposure or alignment during assembly of projection system
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/0025—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration
- G02B27/0037—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration with diffracting elements
- G02B27/0043—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration with diffracting elements in projection exposure systems, e.g. microlithographic systems
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Lenses (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003155292 | 2003-05-30 | ||
| JP2003155292A JP3728301B2 (ja) | 2003-05-30 | 2003-05-30 | 投影光学系 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE602004006051D1 true DE602004006051D1 (de) | 2007-06-06 |
| DE602004006051T2 DE602004006051T2 (de) | 2007-11-22 |
Family
ID=33128327
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE602004006051T Expired - Lifetime DE602004006051T2 (de) | 2003-05-30 | 2004-05-28 | Optisches Projektionssystem |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7006197B2 (de) |
| EP (1) | EP1482343B1 (de) |
| JP (1) | JP3728301B2 (de) |
| KR (1) | KR100659245B1 (de) |
| CN (1) | CN1297834C (de) |
| DE (1) | DE602004006051T2 (de) |
| TW (1) | TWI259288B (de) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004354909A (ja) * | 2003-05-30 | 2004-12-16 | Orc Mfg Co Ltd | 投影露光装置および投影露光方法 |
| US20060158615A1 (en) * | 2005-01-18 | 2006-07-20 | Williamson David M | Catadioptric 1x projection system and method |
| CN100459679C (zh) * | 2005-11-24 | 2009-02-04 | 台达电子工业股份有限公司 | 用于投影设备的光机中的成像系统 |
| JP5114061B2 (ja) * | 2006-04-26 | 2013-01-09 | 株式会社オーク製作所 | 投影露光装置 |
| WO2007130299A2 (en) * | 2006-05-05 | 2007-11-15 | Corning Incorporated | Distortion tuning of a quasi-telecentric imaging lens |
| DE102006038455A1 (de) * | 2006-08-16 | 2008-02-21 | Carl Zeiss Smt Ag | Optisches System für die Halbleiterlithographie |
| JP5090780B2 (ja) * | 2007-04-26 | 2012-12-05 | 株式会社オーク製作所 | 露光描画装置 |
| JP5398185B2 (ja) * | 2008-07-09 | 2014-01-29 | キヤノン株式会社 | 投影光学系、露光装置およびデバイス製造方法 |
| CN103105741B (zh) * | 2013-01-22 | 2015-01-21 | 北京京东方光电科技有限公司 | 对位补偿装置及曝光装置 |
| US9488811B2 (en) | 2013-08-20 | 2016-11-08 | Ultratech, Inc. | Wynne-Dyson optical system with variable magnification |
| US11175487B2 (en) * | 2017-06-19 | 2021-11-16 | Suss Microtec Photonic Systems Inc. | Optical distortion reduction in projection systems |
| CN117852663B (zh) * | 2024-03-07 | 2024-12-27 | 国开启科量子技术(安徽)有限公司 | 离子寻址装置及离子阱量子计算机 |
| CN118859646B (zh) * | 2024-08-30 | 2025-09-12 | 源卓微纳科技(苏州)股份有限公司 | 一种反射式光刻镜头 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5159172A (en) * | 1990-08-07 | 1992-10-27 | International Business Machines Corporation | Optical projection system |
| JPH08179217A (ja) | 1994-08-19 | 1996-07-12 | Tamarack Scient Co Inc | ダイソンレンズ系 |
| US5559629A (en) * | 1994-08-19 | 1996-09-24 | Tamarack Scientific Co., Inc. | Unit magnification projection system and method |
| US5557469A (en) | 1994-10-28 | 1996-09-17 | Ultratech Stepper, Inc. | Beamsplitter in single fold optical system and optical variable magnification method and system |
| US5815245A (en) * | 1995-03-22 | 1998-09-29 | Etec Systems, Inc. | Scanning lithography system with opposing motion |
| US5757469A (en) * | 1995-03-22 | 1998-05-26 | Etec Systems, Inc. | Scanning lithography system haing double pass Wynne-Dyson optics |
| US5739964A (en) * | 1995-03-22 | 1998-04-14 | Etec Systems, Inc. | Magnification correction for small field scanning |
| DE10127227A1 (de) * | 2001-05-22 | 2002-12-05 | Zeiss Carl | Katadioptrisches Reduktionsobjektiv |
-
2003
- 2003-05-30 JP JP2003155292A patent/JP3728301B2/ja not_active Expired - Fee Related
-
2004
- 2004-05-03 TW TW093112388A patent/TWI259288B/zh not_active IP Right Cessation
- 2004-05-27 US US10/854,673 patent/US7006197B2/en not_active Expired - Lifetime
- 2004-05-28 CN CNB2004100455450A patent/CN1297834C/zh not_active Expired - Fee Related
- 2004-05-28 DE DE602004006051T patent/DE602004006051T2/de not_active Expired - Lifetime
- 2004-05-28 EP EP04012815A patent/EP1482343B1/de not_active Expired - Lifetime
- 2004-05-29 KR KR1020040038620A patent/KR100659245B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US20040240210A1 (en) | 2004-12-02 |
| CN1573405A (zh) | 2005-02-02 |
| KR20040103458A (ko) | 2004-12-08 |
| TWI259288B (en) | 2006-08-01 |
| TW200502576A (en) | 2005-01-16 |
| US7006197B2 (en) | 2006-02-28 |
| DE602004006051T2 (de) | 2007-11-22 |
| JP3728301B2 (ja) | 2005-12-21 |
| EP1482343B1 (de) | 2007-04-25 |
| KR100659245B1 (ko) | 2006-12-18 |
| EP1482343A1 (de) | 2004-12-01 |
| JP2004354910A (ja) | 2004-12-16 |
| CN1297834C (zh) | 2007-01-31 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8364 | No opposition during term of opposition |