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DE60029705D1 - Abtastverriegelungschaltung - Google Patents

Abtastverriegelungschaltung

Info

Publication number
DE60029705D1
DE60029705D1 DE60029705T DE60029705T DE60029705D1 DE 60029705 D1 DE60029705 D1 DE 60029705D1 DE 60029705 T DE60029705 T DE 60029705T DE 60029705 T DE60029705 T DE 60029705T DE 60029705 D1 DE60029705 D1 DE 60029705D1
Authority
DE
Germany
Prior art keywords
abtastverriegelungschaltung
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60029705T
Other languages
English (en)
Inventor
William Bryan Barnes
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics Ltd Great Britain
STMicroelectronics lnc USA
Original Assignee
STMicroelectronics Ltd Great Britain
SGS Thomson Microelectronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics Ltd Great Britain, SGS Thomson Microelectronics Inc filed Critical STMicroelectronics Ltd Great Britain
Application granted granted Critical
Publication of DE60029705D1 publication Critical patent/DE60029705D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318541—Scan latches or cell details

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
DE60029705T 1999-08-24 2000-04-04 Abtastverriegelungschaltung Expired - Lifetime DE60029705D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB9920077.6A GB9920077D0 (en) 1999-08-24 1999-08-24 Scan latch circuit

Publications (1)

Publication Number Publication Date
DE60029705D1 true DE60029705D1 (de) 2006-09-14

Family

ID=10859747

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60029705T Expired - Lifetime DE60029705D1 (de) 1999-08-24 2000-04-04 Abtastverriegelungschaltung

Country Status (4)

Country Link
US (1) US6622273B1 (de)
EP (1) EP1081498B1 (de)
DE (1) DE60029705D1 (de)
GB (1) GB9920077D0 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7246287B1 (en) * 2002-04-04 2007-07-17 Mips Technologies, Inc. Full scan solution for latched-based design
WO2004073041A2 (en) * 2003-02-13 2004-08-26 Mentor Graphics Corporation Testing embedded memories in an integrated circuit
KR20050039256A (ko) * 2003-10-24 2005-04-29 삼성전자주식회사 스캔 테스트 장치
US7313744B2 (en) * 2004-02-27 2007-12-25 International Business Machines Corporation Methods and apparatus for testing a scan chain to isolate defects
US7842948B2 (en) * 2004-02-27 2010-11-30 Nvidia Corporation Flip chip semiconductor die internal signal access system and method
KR101076809B1 (ko) * 2004-06-18 2011-10-25 삼성전자주식회사 불필요한 전력소모를 줄일 수 있는 스캔 플립플롭 회로
US7279887B1 (en) * 2004-08-06 2007-10-09 Nvidia Corporation In-process system level test before surface mount
US7272761B2 (en) * 2004-11-04 2007-09-18 International Business Machines Corporation Method, system, and program product for controlling test data of a logic built-in self-test of an integrated circuit
US7237163B2 (en) * 2004-11-05 2007-06-26 International Business Machines Corporation Leakage current reduction system and method
TWI273259B (en) * 2004-11-09 2007-02-11 Via Tech Inc Built-in test architecture
US8051350B2 (en) * 2004-11-09 2011-11-01 Via Technologies Inc. Serial interface device built-in self test
US7640475B2 (en) * 2006-03-30 2009-12-29 Texas Instruments Incorporated At-speed transition fault testing with low speed scan enable
US7707466B2 (en) * 2007-02-23 2010-04-27 Freescale Semiconductor, Inc. Shared latch for memory test/repair and functional operations
US8065647B2 (en) * 2007-10-19 2011-11-22 The University Of Utah Research Foundation Method and system for asynchronous chip design
US8271252B2 (en) * 2007-11-08 2012-09-18 Nvidia Corporation Automatic verification of device models
US8510616B2 (en) * 2008-02-14 2013-08-13 Nvidia Corporation Scalable scan-based test architecture with reduced test time and test power
US8745200B2 (en) * 2008-05-06 2014-06-03 Nvidia Corporation Testing operation of processors setup to operate in different modes
US8943457B2 (en) * 2008-11-24 2015-01-27 Nvidia Corporation Simulating scan tests with reduced resources
US11017135B2 (en) 2015-11-24 2021-05-25 Microchip Technology Incorporated Scan logic for circuit designs with latches and flip-flops

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8501143D0 (en) * 1985-01-17 1985-02-20 Plessey Co Plc Integrated circuits
US5319646A (en) * 1991-09-18 1994-06-07 Ncr Corporation Boundary-scan output cell with non-critical enable path
JPH05232196A (ja) * 1992-02-25 1993-09-07 Mitsubishi Electric Corp テスト回路
US5592493A (en) * 1994-09-13 1997-01-07 Motorola Inc. Serial scan chain architecture for a data processing system and method of operation
US5574731A (en) * 1995-02-22 1996-11-12 National Semiconductor Corporation Set/reset scan flip-flops
US5710779A (en) * 1996-04-09 1998-01-20 Texas Instruments Incorporated Real time data observation method and apparatus
US5825785A (en) * 1996-05-24 1998-10-20 Internaitonal Business Machines Corporation Serial input shift register built-in self test circuit for embedded circuits
US6158032A (en) * 1998-03-27 2000-12-05 International Business Machines Corporation Data processing system, circuit arrangement and program product including multi-path scan interface and methods thereof
US6185710B1 (en) * 1998-03-30 2001-02-06 International Business Machines Corporation High-performance IEEE1149.1-compliant boundary scan cell
US6195775B1 (en) * 1998-09-02 2001-02-27 International Business Machines Corporation Boundary scan latch configuration for generalized scan designs
US6393592B1 (en) * 1999-05-21 2002-05-21 Adaptec, Inc. Scan flop circuitry and methods for making the same

Also Published As

Publication number Publication date
EP1081498B1 (de) 2006-08-02
GB9920077D0 (en) 1999-10-27
US6622273B1 (en) 2003-09-16
EP1081498A1 (de) 2001-03-07

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Legal Events

Date Code Title Description
8332 No legal effect for de