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DE3885218D1 - Vorrichtung zum punktweisen Abtasten eines Gegenstandes. - Google Patents

Vorrichtung zum punktweisen Abtasten eines Gegenstandes.

Info

Publication number
DE3885218D1
DE3885218D1 DE88201826T DE3885218T DE3885218D1 DE 3885218 D1 DE3885218 D1 DE 3885218D1 DE 88201826 T DE88201826 T DE 88201826T DE 3885218 T DE3885218 T DE 3885218T DE 3885218 D1 DE3885218 D1 DE 3885218D1
Authority
DE
Germany
Prior art keywords
point
scanning
point scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE88201826T
Other languages
English (en)
Other versions
DE3885218T2 (de
Inventor
Albert Smid
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Publication of DE3885218D1 publication Critical patent/DE3885218D1/de
Application granted granted Critical
Publication of DE3885218T2 publication Critical patent/DE3885218T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/50—Optics for phase object visualisation

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Microscoopes, Condenser (AREA)
  • Image Processing (AREA)
DE88201826T 1987-09-03 1988-08-26 Vorrichtung zum punktweisen Abtasten eines Gegenstandes. Expired - Fee Related DE3885218T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL8702071A NL8702071A (nl) 1987-09-03 1987-09-03 Inrichting voor het puntsgewijs aftasten van een voorwerp.

Publications (2)

Publication Number Publication Date
DE3885218D1 true DE3885218D1 (de) 1993-12-02
DE3885218T2 DE3885218T2 (de) 1994-05-05

Family

ID=19850544

Family Applications (1)

Application Number Title Priority Date Filing Date
DE88201826T Expired - Fee Related DE3885218T2 (de) 1987-09-03 1988-08-26 Vorrichtung zum punktweisen Abtasten eines Gegenstandes.

Country Status (5)

Country Link
US (1) US5450501A (de)
EP (1) EP0307029B1 (de)
JP (1) JPH01158578A (de)
DE (1) DE3885218T2 (de)
NL (1) NL8702071A (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8926435D0 (en) * 1989-11-22 1990-01-10 Secr Defence Phase measuring scanning optical microscope
JP3018687B2 (ja) * 1991-12-12 2000-03-13 松下電器産業株式会社 走査型レーザー顕微鏡
WO1998033370A2 (en) * 1997-01-16 1998-08-06 Wilhelm, Michael Method for recording the dynamics of microscopic objects, and device for applying same
US6121603A (en) * 1997-12-01 2000-09-19 Hang; Zhijiang Optical confocal device having a common light directing means
US6262818B1 (en) * 1998-10-07 2001-07-17 Institute Of Applied Optics, Swiss Federal Institute Of Technology Method for simultaneous amplitude and quantitative phase contrast imaging by numerical reconstruction of digital holograms
US7557929B2 (en) 2001-12-18 2009-07-07 Massachusetts Institute Of Technology Systems and methods for phase measurements
US7365858B2 (en) * 2001-12-18 2008-04-29 Massachusetts Institute Of Technology Systems and methods for phase measurements
FR2842407B1 (fr) * 2002-07-18 2005-05-06 Mauna Kea Technologies "procede et appareillage d'imagerie de fluorescence confocale fibree"
US8662962B2 (en) * 2008-06-30 2014-03-04 3M Innovative Properties Company Sandpaper with non-slip coating layer and method of using
WO2018089839A1 (en) 2016-11-10 2018-05-17 The Trustees Of Columbia University In The City Of New York Rapid high-resolution imaging methods for large samples
TWI662262B (zh) * 2018-04-20 2019-06-11 國立臺灣大學 具等向性轉換函數之量化差分相位對比顯微系統

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL7413162A (nl) * 1974-10-07 1976-04-09 Philips Nv Inrichting voor het uitlezen van een schijf- vormige registratiedrager.
US4020333A (en) * 1975-05-06 1977-04-26 International Business Machines Corporation Digital filter for filtering complex signals
NL7600843A (nl) * 1976-01-28 1977-08-01 Philips Nv Inrichting voor het uitlezen van een registratie- drager waarop informatie, bijvoorbeeld en/of ge- luidsinformatie, is aangebracht.
NL8103505A (nl) * 1981-07-24 1983-02-16 Philips Nv Inrichting voor het puntsgewijs aftasten van een voorwerp.
US4791590A (en) * 1985-11-19 1988-12-13 Cornell Research Foundation, Inc. High performance signal processor

Also Published As

Publication number Publication date
EP0307029A1 (de) 1989-03-15
US5450501A (en) 1995-09-12
JPH01158578A (ja) 1989-06-21
NL8702071A (nl) 1989-04-03
EP0307029B1 (de) 1993-10-27
DE3885218T2 (de) 1994-05-05

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: PHILIPS ELECTRONICS N.V., EINDHOVEN, NL

8339 Ceased/non-payment of the annual fee