DE3641688C2 - - Google Patents
Info
- Publication number
- DE3641688C2 DE3641688C2 DE3641688A DE3641688A DE3641688C2 DE 3641688 C2 DE3641688 C2 DE 3641688C2 DE 3641688 A DE3641688 A DE 3641688A DE 3641688 A DE3641688 A DE 3641688A DE 3641688 C2 DE3641688 C2 DE 3641688C2
- Authority
- DE
- Germany
- Prior art keywords
- ball
- electrode layer
- depth
- copper
- bonding
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/40—Investigating hardness or rebound hardness
- G01N3/42—Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid
-
- H10W72/019—
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0098—Tests specified by its name, e.g. Charpy, Brinnel, Mullen
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45147—Copper (Cu) as principal constituent
-
- H10P74/203—
-
- H10W72/07141—
-
- H10W72/075—
-
- H10W72/07521—
-
- H10W72/07533—
-
- H10W72/07553—
-
- H10W72/531—
-
- H10W72/536—
-
- H10W72/5363—
-
- H10W72/5522—
-
- H10W72/5524—
-
- H10W72/5525—
-
- H10W72/59—
-
- H10W72/934—
-
- H10W72/952—
-
- H10W90/756—
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Wire Bonding (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60291084A JPS62150730A (ja) | 1985-12-24 | 1985-12-24 | 半導体装置の評価方法 |
| JP61017348A JPS62174936A (ja) | 1986-01-28 | 1986-01-28 | 半導体装置の評価方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE3641688A1 DE3641688A1 (de) | 1987-07-02 |
| DE3641688C2 true DE3641688C2 (ja) | 1989-10-12 |
Family
ID=26353848
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19863641688 Granted DE3641688A1 (de) | 1985-12-24 | 1986-12-06 | Verfahren zur qualitaetspruefung einer elektrodenschicht eines halbleiterbauelements |
Country Status (1)
| Country | Link |
|---|---|
| DE (1) | DE3641688A1 (ja) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102007030951A1 (de) * | 2007-07-04 | 2009-01-08 | Fachhochschule Augsburg | Vorrichtung für die Bestimmung von mechanischen Eigenschaften eines zu untersuchenden Objekts |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102013222439B4 (de) | 2013-11-05 | 2023-10-12 | F&S Bondtec Semiconductor GmbH | Messung der Nachgiebigkeit |
-
1986
- 1986-12-06 DE DE19863641688 patent/DE3641688A1/de active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102007030951A1 (de) * | 2007-07-04 | 2009-01-08 | Fachhochschule Augsburg | Vorrichtung für die Bestimmung von mechanischen Eigenschaften eines zu untersuchenden Objekts |
| DE102007030951B4 (de) * | 2007-07-04 | 2011-05-12 | Fachhochschule Augsburg | Vorrichtung für die Bestimmung von mechanischen Eigenschaften eines zu untersuchenden Objekts |
Also Published As
| Publication number | Publication date |
|---|---|
| DE3641688A1 (de) | 1987-07-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE69930433T2 (de) | Verfahren und Vorrichtung zur "Flip-Chip" Montage eines elektronischen Bauteils | |
| DE3701652C2 (ja) | ||
| EP1440322B1 (de) | Mikrosensor | |
| DE2938240C2 (de) | Verfahren zum Herstellen einer druckempfindlichen Einrichtung | |
| DE69737621T2 (de) | Halbleiterelement mit einer Höckerelektrode | |
| DE3703694A1 (de) | Ball-bondverfahren und vorrichtung zur durchfuehrung derselben | |
| DE4303049C2 (de) | Dehnungsmeßaufnehmer und Verfahren zu seiner Anbringung auf ein zylindrisches Bauteil | |
| EP1310319B1 (de) | Prüfverfahren für Bondverbindungen und Drahtbonder | |
| EP0498936A1 (de) | Verfahren und Einrichtung zur Messung der Schwingungsamplitude an einem Energietransducer | |
| DE19717368A1 (de) | Drahtbondverfahren, Drahtbondvorrichtung und mit denselben hergestellte Halbleitereinrichtung | |
| DE19709912B4 (de) | Ultraschallbondvorrichtung | |
| DE3641688C2 (ja) | ||
| DE3780630T2 (de) | Verbindung von elektronischen bauteilen untereinander. | |
| EP0279216A1 (de) | Gerät zur Messung von Bondparametern | |
| DE112018007032T5 (de) | Keilwerkzeug, Bondvorrichtung und Bondprüfverfahren | |
| EP1464433A1 (de) | Verfahren und Vorrichtung zur Prüfung einer Drahtbondverbindung | |
| EP2133915A1 (de) | Halbleiteranordnung mit besonders gestalteten Bondleitungen und Verfahren zum Herstellen einer solchen Anordnung | |
| DE4131565C2 (de) | Verfahren zur Optimierung des Schweißprozesses bei Bondverfahren | |
| DE4435579C2 (de) | Vorrichtung zur Prüfung der Klebehaftung eines Trägerelements mit IC-Bausteinen in einer Chipkarte | |
| DE102004028397B4 (de) | Verfahren für die Überprüfung der Qualität einer Wedgeverbindung | |
| DE102020211503A1 (de) | Drahtbondiereinrichtung und Drahtbondierverfahren | |
| Aguila et al. | Ball bond characterization: An intensive analysis on ball size and shear test results and applicability to existing standards | |
| DE19928547B4 (de) | Verfahren zur Herstellung eines Drucksensors | |
| DE3153395C2 (en) | Use of a very fine wire made of a copper/tin alloy | |
| DE4021031C2 (de) | Verfahren zur Herstellung eines Halbleiterbauelementes |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OP8 | Request for examination as to paragraph 44 patent law | ||
| D2 | Grant after examination | ||
| 8364 | No opposition during term of opposition | ||
| 8339 | Ceased/non-payment of the annual fee |