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DE3579119D1 - Verfahren zur bestimmung des oberflaechenglanzes eines koerpers. - Google Patents

Verfahren zur bestimmung des oberflaechenglanzes eines koerpers.

Info

Publication number
DE3579119D1
DE3579119D1 DE8585115140T DE3579119T DE3579119D1 DE 3579119 D1 DE3579119 D1 DE 3579119D1 DE 8585115140 T DE8585115140 T DE 8585115140T DE 3579119 T DE3579119 T DE 3579119T DE 3579119 D1 DE3579119 D1 DE 3579119D1
Authority
DE
Germany
Prior art keywords
determining
surface gloss
gloss
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8585115140T
Other languages
English (en)
Inventor
Yuichiro Research Labora Asano
Yoshiaki Research Labo Shibata
Motoji Hanshin Works Shiozumi
Hitoshi Hanshin Works Aizawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Original Assignee
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP59253529A external-priority patent/JPS61130857A/ja
Priority claimed from JP59253530A external-priority patent/JPS61130858A/ja
Priority claimed from JP26663885A external-priority patent/JPS62126331A/ja
Application filed by Kawasaki Steel Corp filed Critical Kawasaki Steel Corp
Application granted granted Critical
Publication of DE3579119D1 publication Critical patent/DE3579119D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G01N2021/4716—Using a ring of sensors, or a combination of diaphragm and sensors; Annular sensor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N2021/555—Measuring total reflection power, i.e. scattering and specular
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N2021/556—Measuring separately scattering and specular
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
DE8585115140T 1984-11-30 1985-11-29 Verfahren zur bestimmung des oberflaechenglanzes eines koerpers. Expired - Fee Related DE3579119D1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP59253529A JPS61130857A (ja) 1984-11-30 1984-11-30 物体表面の光沢度判定方法
JP59253530A JPS61130858A (ja) 1984-11-30 1984-11-30 物体表面の光沢度判定方法
JP26663885A JPS62126331A (ja) 1985-11-27 1985-11-27 物体表面の光沢度判定装置

Publications (1)

Publication Number Publication Date
DE3579119D1 true DE3579119D1 (de) 1990-09-13

Family

ID=27334240

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8585115140T Expired - Fee Related DE3579119D1 (de) 1984-11-30 1985-11-29 Verfahren zur bestimmung des oberflaechenglanzes eines koerpers.

Country Status (4)

Country Link
US (1) US4750140A (de)
EP (1) EP0183270B1 (de)
CA (1) CA1240052A (de)
DE (1) DE3579119D1 (de)

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US5133019A (en) * 1987-12-03 1992-07-21 Identigrade Systems and methods for illuminating and evaluating surfaces
US4864150A (en) * 1988-02-09 1989-09-05 Russell Corporation Method for inspecting, detecting and distinguishing sides of fabrics
WO1990004166A1 (de) * 1988-10-14 1990-04-19 Byk-Gardner Gmbh Verfahren und vorrichtung zur glanzmessung
JP2918045B2 (ja) * 1988-10-28 1999-07-12 株式会社リコー 画像濃度制御装置
US4992963A (en) * 1988-12-02 1991-02-12 Simon Fraser University Method and apparatus for determining ambient light and surface reflectance
US4957368A (en) * 1989-03-16 1990-09-18 Photoacoustic Technology, Inc. Apparatus and process for performing ellipsometric measurements of surfaces
JP3185031B2 (ja) * 1991-06-17 2001-07-09 株式会社キーエンス 光沢検出器
DE4243885A1 (de) * 1992-12-23 1994-06-30 Fogra Forschungsgesellschaft D Verfahren und Anordnung zur Messung von Farbe und Glanz
US5552890A (en) * 1994-04-19 1996-09-03 Tricor Systems, Inc. Gloss measurement system
DE4434203C2 (de) * 1994-09-24 2003-06-12 Byk Gardner Gmbh Vorrichtung und Verfahren zum Messen visueller Eigenschaften von Oberflächen
DE19604076C2 (de) * 1996-02-05 1998-02-19 F & O Electronic Systems Vorrichtung zur Inspektion der Oberfläche von Holz zwecks Feststellung von Oberflächenmerkmalen und Verfahren hierzu
US6294327B1 (en) * 1997-09-08 2001-09-25 Affymetrix, Inc. Apparatus and method for detecting samples labeled with material having strong light scattering properties, using reflection mode light and diffuse scattering
JP2000090233A (ja) * 1998-09-08 2000-03-31 Olympus Optical Co Ltd 画像処理装置
SE521948C2 (sv) * 1998-12-17 2003-12-23 Act Ab Mätinstrument och förfarande för mätning av damm- och smutsbeläggningsgrad på en yta
DE19930688A1 (de) * 1999-07-02 2001-01-04 Byk Gardner Gmbh Vorrichtung und Verfahren zur Bestimmung der Qualität von Oberflächen
GB9921826D0 (en) * 1999-09-15 1999-11-17 Rhopoint Instrumentation Limit Glossmeter
US6914684B1 (en) * 2001-07-05 2005-07-05 Lexmark International, Inc. Method and apparatus for detecting media type
JP3870044B2 (ja) * 2001-07-25 2007-01-17 株式会社日立製作所 パターン検査方法及びパターン検査装置
US6909791B2 (en) * 2002-04-03 2005-06-21 General Phosphorix, Llc Method of measuring a line edge roughness of micro objects in scanning microscopes
JP4210466B2 (ja) * 2002-04-22 2009-01-21 日立オムロンターミナルソリューションズ株式会社 判別装置
WO2004063733A1 (en) * 2003-01-09 2004-07-29 Matsushita Electric Industrial Co., Ltd. Image recognition apparatus and image recognition method
JP4366104B2 (ja) * 2003-04-17 2009-11-18 日立オムロンターミナルソリューションズ株式会社 紙葉類判別装置
JP3566276B1 (ja) * 2003-05-07 2004-09-15 株式会社日立製作所 血糖値測定装置
JP3566277B1 (ja) * 2003-06-23 2004-09-15 株式会社日立製作所 血糖値測定装置
JP3566278B1 (ja) * 2003-07-11 2004-09-15 株式会社日立製作所 血糖値測定装置
DE10336493A1 (de) * 2003-08-08 2005-03-03 Byk-Gardner Gmbh Vorrichtung und Verfahren zur Bestimmung von Oberflächeneigenschaften
JP3590047B1 (ja) * 2003-09-24 2004-11-17 株式会社日立製作所 光学測定装置及びそれを用いた血糖値測定装置
EP1522254A1 (de) * 2003-10-08 2005-04-13 Hitachi, Ltd. Vorrichtung zur Messung des Blutzuckerspiegels
JP3590049B1 (ja) * 2003-12-03 2004-11-17 株式会社日立製作所 血糖値測定装置
JP3859158B2 (ja) * 2003-12-16 2006-12-20 セイコーエプソン株式会社 マイクロレンズ用凹部付き基板、マイクロレンズ基板、透過型スクリーン、およびリア型プロジェクタ
JP3557425B1 (ja) * 2004-02-17 2004-08-25 株式会社日立製作所 血糖値測定装置
JP3557424B1 (ja) * 2004-02-17 2004-08-25 株式会社日立製作所 血糖値測定装置
JP3590053B1 (ja) * 2004-02-24 2004-11-17 株式会社日立製作所 血糖値測定装置
JP3590054B1 (ja) * 2004-02-26 2004-11-17 株式会社日立製作所 血糖値測定装置
CN100337589C (zh) * 2004-02-27 2007-09-19 株式会社日立制作所 血糖值测定装置
JP3868963B2 (ja) * 2004-05-10 2007-01-17 株式会社日立製作所 血糖値測定装置
US7251517B2 (en) * 2004-06-30 2007-07-31 Hitachi, Ltd. Blood sugar level measuring apparatus
US7215983B2 (en) * 2004-06-30 2007-05-08 Hitachi, Ltd. Blood sugar level measuring apparatus
JP3884036B2 (ja) * 2004-08-25 2007-02-21 株式会社日立製作所 血糖値測定装置
JP2006094992A (ja) * 2004-09-29 2006-04-13 Hitachi Ltd 血糖値測定装置及び血糖値測定方法
JP2006115947A (ja) * 2004-10-19 2006-05-11 Hitachi Ltd 血糖値測定装置
JP2006115948A (ja) * 2004-10-19 2006-05-11 Hitachi Ltd 血糖値測定装置
JP3938184B2 (ja) 2005-03-22 2007-06-27 キヤノン株式会社 情報処理方法及びその装置
DE102005031957B4 (de) * 2005-07-08 2007-03-22 Koenig & Bauer Ag Vorrichtung zur Inspektion eines Bedruckstoffes mit uneinheitlich reflektierenden Oberflächen
EP1987331A2 (de) * 2006-02-16 2008-11-05 Clean Earth Technologies, Llc Verfahren zur klassifizierung von spektraldaten und zu deren erkennung unter diversen beleuchtungsbedingungen
US7619740B2 (en) * 2007-10-11 2009-11-17 Honeywell International Inc. Microgloss measurement of paper and board
US8582116B2 (en) * 2009-04-14 2013-11-12 Canon Kabushiki Kaisha Recording sheet surface detection apparatus and image forming apparatus
DE102010032600A1 (de) * 2010-07-28 2012-02-02 Byk-Gardner Gmbh Vorrichtung und Verfahren zur Bestimmung von Oberflächeneigenschaften mit Mehrfachmessung
US9008984B2 (en) * 2010-10-15 2015-04-14 Axalta Coating Systems Ip Co., Llc Device for predicting gloss of low gloss coating by wet color measurement
US8637112B2 (en) * 2010-10-15 2014-01-28 Axalta Coating Systems Ip Co., Llc Process for predicting gloss of low gloss coating by wet color measurement
DE112012004576B4 (de) * 2011-11-01 2022-05-05 Coatings Foreign Ip Co. Llc Verfahren zur Vorhersage metallischen Glanzes einer Beschichtung resultierend von Beschichtungszusammensetzungen durch Nassfarbmessungen
DE102014105746C5 (de) * 2013-12-05 2020-12-24 Sick Ag Optoelektronischer Sensor und Verfahren zur Erfassung glänzender Objekte
DE102014108789B4 (de) * 2014-06-24 2026-01-29 Byk-Gardner Gmbh Mehrstufiges Verfahren zur Untersuchung von Oberflächen sowie entsprechende Vorrichtung
DE102021101594B3 (de) * 2021-01-26 2022-01-05 Carl Zeiss Spectroscopy Gmbh Messanordnung zum Messen von diffus reflektiertem Licht und von spekular reflektiertem Licht
CN115930847B (zh) * 2022-09-30 2023-09-22 中国科学院武汉岩土力学研究所 一种三维结构面粗糙度评价指标的定量确定方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1944088U (de) * 1966-06-16 1966-08-11 Bayer Ag Vorrichtung zur beurteilung der glanzeigenschaften von oberflaechen.
US4124803A (en) * 1976-12-22 1978-11-07 Kenneth Bowers Surface finish monitor
US4408880A (en) * 1981-09-22 1983-10-11 Chugai Seiyaku Kabushiki Kaisha Laser nephelometric system
DD208670A1 (de) * 1982-06-29 1984-04-04 Pentacon Dresden Veb Vorrichtung zur schnellen messung des glanzes beliebiger oberflaechen
FI65332C (fi) * 1982-06-29 1984-04-10 Labsystems Oy Foerfarande foer maetning i tvao prov av skillnaden av optiskaegenskaper beroende av ljusets riktning
JPS6097204A (ja) * 1983-11-01 1985-05-31 Senjiyou Seiki Kk 光反射型入力レベル相対出力方式を使用した被検査体の数量のカウント出力方法
US4585343A (en) * 1983-11-04 1986-04-29 Libbey-Owens-Ford Company Apparatus and method for inspecting glass

Also Published As

Publication number Publication date
US4750140A (en) 1988-06-07
EP0183270B1 (de) 1990-08-08
EP0183270A2 (de) 1986-06-04
EP0183270A3 (en) 1986-09-17
CA1240052A (en) 1988-08-02

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee