DE202011110077U1 - Arrangement for illuminating a sample - Google Patents

Abstract

Arrangement for illuminating a sample in SPIM microscopy a. with a light source for generating a light beam, b. with means for generating a light strip from the light bundle, in particular for illuminating a sample essentially in the form of a surface in an illumination plane from at least one direction, c. with at least one lens which has an optical system which is designed and intended to supply detection light emanating from the sample directly or indirectly to a detector, the optical system of the objective interacting with the light strip, i. and with a deflection device downstream of the optics of the lens for deflecting the light strip, the light strip after deflecting for illuminating a sample spreading at an angle other than zero degrees, in particular a right angle, to the optical axis of the lens and / or in an optical one Axis of the lens is not arranged in a parallel plane.

Description

The present invention relates to a microscope, in particular a scanning microscope and / or confocal scanning microscope, and an experimental setup for microscopically imaging a sample with such an arrangement.

The above-mentioned and this invention underlying SPIM method (Selective Plane Illumination Microscope) is known from the prior art and, for example, in Lindek et al; Journal of Modern Optics, 1999, vol. 46, no. 5, 843-858 described.

A SPIM-method microscope is in DE 102 57 423 A1 described. In this microscope, a sample is illuminated with a thin strip of light while the observation is perpendicular to the plane of the illuminating light strip. Here, the illumination and the detection via two separate optical beam paths, each with a separate optics, in particular with two separate, mutually perpendicular lenses. The light strip is generated by the illumination lens and a cylinder optics connected in front of it. For image acquisition, the sample is moved through the fixed relative to the detector strip of light to record layer by layer fluorescent and / or scattered light with a flat detector. The slice image data thus obtained can then be combined to form a data record corresponding to a three-dimensional image of the sample. In order to produce as thin a light strip as possible, the illumination objective must have a correspondingly high numerical aperture, wherein the free working distance of the illumination objective must be correspondingly large in order to avoid a collision with the observation objective. Such a vertical arrangement of the two lenses may be disadvantageous in the imaging of certain, in particular biological, samples. For example, it is often not possible to place spherical objects collision-free under a rectangular objective arrangement.

In addition to the extremely high demands on the Probenpärparation, it also often leads to unwanted shadowing in the sample.

At an in WO 2010/012980 A1 described modified SPIM process done lighting and detection with the same lens. For this purpose, the entrance pupil of the lens is underdeveloped decentrally, ie the illumination beam passes through a part of the entrance pupil, which is offset transversely to the optical axis. A cylinder lens arranged in front of the lens generates in the sample a light sheet which is inclined to the optical axis of the lens. The illuminated by this light sheet portion of the sample is then in turn imaged by the lens on a detector. However, this device is designed exclusively for an oblique illumination of the sample with a light sheet and does not allow a different application, in particular no pointwise confocal sampling of the sample or a variation of the spatial light intensity distribution of the light sheet and in particular with a perpendicular to the optical axis of the lens aligned light strip.

Out DE 10 2004 034 957 A1 an arrangement for microscopic observation of a sample via a microscope objective is known, in whose housing outside the lens optics light guides for the illumination light of the sample are provided. The illumination light initially runs parallel to the optical axis of the objective within the light guide and then impinges on the objective housing mounted reflectors with low aperture, which focus the illumination light by means of additional imaging elements perpendicular to the optical axis of the microscope objective and thus perpendicular to the observation direction in the sample. Again, the illumination of the sample is carried out areally according to the SPIM principle. By using a microscope objective designed in this way, it is also possible to dispense with the use of a further objective for the illumination light. However, the special design of this special lens with additional light guides and reflectors is technically very complicated and expensive.

Object of the present invention is to improve the above arrangements for illuminating a sample in SPIM microscopy in that a quickly adjustable and beyond reliable and versatile, area-like, in particular orthogonal to the viewing direction, illumination of the sample is possible preferably many already existing on a microscope, in particular scanning microscope, existing components can be used.

This object is achieved by an arrangement for illuminating a sample according to claim 1. Advantageous embodiments of the invention are subject matter of the subclaims.

• a. mit einer Lichtquelle zum Erzeugen eines Lichtbündels,
• b. mit Mitteln zum Erzeugen eines Lichtstreifens aus dem Lichtbündel, insbesondere zum im Wesentlichen flächenartigen Beleuchten einer Probe in einer Beleuchtungsebene aus wenigstens einer Richtung,
• c. mit wenigstens einem Objektiv, das eine Optik aufweist, die dazu ausgebildet und bestimmt ist, von der Probe ausgehendes Detektionslicht direkt oder indirekt einem Detektor zuzuführen, wobei die Optik des Objektivs mit dem Lichtstreifen in Wechselwirkung tritt,
• d. und mit einer der Optik des Objektivs nachgeschalteten Umlenkvorrichtung zum Umlenken des Lichtstreifens, wobei sich der Lichtstreifen nach dem Umlenken zum Beleuchten einer Probe in einem von Null Grad verschiedenen Winkel, insbesondere einem rechten Winkel, zur optischen Achse des Objektivs ausbreitet und/oder in einer optischen Achse des Objektivs nicht parallelen Ebene angeordnet ist.

Accordingly, the invention provides an arrangement

• a. with a light source for generating a light beam,
• b. with means for producing a light strip from the light bundle, in particular for substantially planar illumination of a sample in an illumination plane from at least one direction,
• c. with at least one objective having optics designed and intended for supplying detection light emanating from the sample directly or indirectly to a detector, the optics of the objective interacting with the light stripe,
• d. and with a deflection device downstream of the optics of the objective for deflecting the light strip, wherein the light strip propagates after deflection to illuminate a sample at an angle different from zero degrees, in particular a right angle, to the optical axis of the objective and / or in an optical Axis of the lens is not arranged parallel plane.

According to the invention, it has been recognized that for illuminating a sample according to the SPIM method, in particular for planar illumination in a plane perpendicular to the viewing direction, essentially a conventional microscope objective without additional optics can be used within the microscope housing, wherein the illumination light passes through the objective optics and can then be focused with a deflection at an angle different from zero degrees, in particular a right angle, to the optical axis of the lens in the sample.

To generate the light beam for the sample illumination, conventional and known light sources, such as, for example, CW lasers or pulsed lasers, are provided in microscopy according to the invention.

The provided according to the inventive method and the inventive arrangement optical means for generating the light strip may according to an advantageous embodiment of the invention comprise a Strahlablenkvorrichtung with which the light beam is preferably such fast in an illumination plane movable that de facto in the illumination plane is a light strip and / or that this illumination with the detectors provided for the detection of the light emanating from the sample and the downstream evaluation devices of a microscope is not distinguishable from a continuous light strip and / or that the recorded image data does not differ or does not differ materially from the data that is obtained in a Lighting a continuous light strip would be generated.

In particular, it can be provided that the pivoting movement of the light beam caused by the beam deflection device is used to move the focus within the sample and thus to produce a focused light strip for illuminating the sample from a specific direction in a planar manner. This can be achieved, for example, by the light beam being tilted back and forth by the beam deflecting device in front of the objective at a sufficiently fast speed so that the resulting oscillatory movement of the focused light bundle leads in a timely manner to a disc-like light distribution in an illumination plane within the sample ,

The beam deflecting device preferably deflects the light bundle in such a way that the light bundle remains approximately stationary at a tilting point in the region of the entrance pupil of the objective, while the light bundle at a distance from the entrance pupil in the direction of the beam deflecting device has a pivoting movement relative to a parallel to the optical axis of the objective Reference direction executes. This pivoting movement of the light beam converts the objective and the downstream deflection device into a corresponding movement of the focus of the light bundle, which is generated inter alia by the objective. For microscopy, the sample is preferably positioned in this focus. The actual size of the focus and the amplitude of the focus movement in the sample depend on the specific structure of the optics of the lens and possibly additionally used optical elements in the beam path.

In a particularly suitable and technically easy to implement manner, the beam deflection device can have at least one rotary mirror and / or one tilting mirror, preferably a galvanometer mirror, and / or a rotatable prism and / or a displaceable lens and / or acousto-optical deflector. In particular, the beam deflecting device can be the beam deflecting device of a scanning microscope or a confocal scanning microscope, which may already be present anyway.

In addition to or instead of the beam deflection device, according to a further embodiment of the invention, a cylinder optics may be provided as an optical means for generating the light strip.

According to a further advantageous embodiment of the invention, it is provided that the shape and / or the position and / or the orientation of the light strip, in particular with the previously described optical means and / or the lens and / or the deflection device can be adjusted or adjusted ,

The position and / or orientation of the light strip can be adjusted by means of a pivoting device pivotal movement. The shape, in particular the width, of the light strip can be adjusted, for example, by selecting different oscillation amplitudes of the pivoting movement.

In a particular embodiment, it is provided that the beam path of the light beam and / or the light strip and / or the detection light of the type are matched to each other, that the light strip has a focus on a sample location to be observed and that emanating from the sample location of the detection light on the detector has one of the detection foci.

Preferably, the detector is located in a plane corresponding to the detection plane. The position and orientation of the detection plane essentially depends on the type, the orientation and the position of the objective, the position of the detector and the further optical components optionally arranged between the detector and the objective. Preferably, the light strip of the type is positioned and aligned such that it is arranged after the deflection in the detection plane.

If both the illumination and the detection is carried out through the lens, it should be noted that the light path of the light strip from the pupil of the objective to its focus - in particular due to the deflection - is usually longer than the optical path of the directional light, which passes directly - starting from the illuminated by the focus of the light strip sample area and passing directly through the lens - to the objective pupil. This difference in path length can be compensated, for example, by virtue of the fact that the light bundle does not reach the objective as a parallel bundle of light but as a divergent bundle of light. A divergence can be achieved, for example, by means of an additional optics which acts exclusively on the light beam but not on the detection light. Alternatively, the path length difference can of course also be compensated by the detection beam path being extended accordingly. Of course, a combination of both measures is of course possible.

According to an independent idea of the invention, which is detached from the idea of a light strip, it can be provided that the sample is not illuminated like a strip, but only like a line, in particular if the light bundle does not execute a pivoting movement. In this case, the beam deflecting device can also be used to illuminate the sample sequentially with the focused light beam as a scanning or scanning, the light beam - unlike conventional scanning microscopes or confocal scanning microscopes - a non-zero angle to the optical axis of the lens can have.

In addition, the shape of the light strip can advantageously be varied by illuminating the entrance pupil of the objective by the light bundle, in that the light bundle does not penetrate the entire area of the entrance pupil and thus does not exploit the full aperture of the objective. This undercutting causes an expansion of the focus of the light beam both in the longitudinal direction and in the transverse direction.

In addition, the beam deflection device can be used, for example, to guide the light bundle at different locations, in particular decentrally on the entrance pupil. In this way it is achieved that the orientation of the focused light beam or of the light strip after the lens and thus also the orientation of the light beam or of the light strip in the sample change according to an advantageous embodiment of the invention.

For the invention is essential that the optics of the lens with the light beam or the light strip interacts, wherein the optics of the lens is also designed and determined, emanating from the sample detection light directly or indirectly a detector, such as a CCD Camera (Charged Coupled Device).

According to a further advantageous embodiment of the invention, however, it is also possible to use a further objective and / or condenser optics for direct or indirect feeding of the detection light emanating from the sample to the detector. For this purpose, the further objective and / or the condenser optics can be arranged opposite the objective along its optical axis, while the sample is located therebetween.

According to the invention, a deflecting device connected downstream of the optics of the objective serves to deflect the light strip in such a way that, after being deflected to illuminate the sample, it propagates at an angle different from zero degrees, in particular a right angle, to the optical axis of the objective and is preferably focused in the sample.

According to a further advantageous embodiment of the invention, the deflection device can be fixed or fixed to the objective and / or the further objective and / or to the condenser optics. In particular, the deflection device can be held displaceably on the abovementioned components against the force of an elastic element, in particular against a spring, in particular at an angle different from 90 ° with respect to the optical axis of the objective.

As technically particularly easy to implement connection for setting the deflection is conceivable after screw. To For example, the head of the objective, ie the side of the objective facing the specimen, can have an external thread centered on the optical axis of the objective, which can be brought into contact with a corresponding internal thread on the deflecting device.

Based on this results in a further advantageous embodiment of the invention, which is characterized in that the deflection again releasable, preferably manually releasable, connecting means, such that the deflection device can be set as a retrofit component to the lens and / or another conventional lens. In this way, an exchange of differently designed deflection can be achieved.

Alternatively, at least one component of the deflection device can be produced integrally with a component of the objective or a component of the further objective or a component of the condenser optics.

According to an advantageous embodiment of the invention, the deflection device for deflecting the light strip has at least one at least partially reflecting surface. For this purpose, the reflective surface may be formed, for example, as part of a plane mirror.

In order to avoid shading in the sample, it may also be advantageous if the sample is illuminated by means of the deflection device and / or the optical means for generating the light strip from at least two directions with the light strip, the light strip preferably from each of the at least two directions is focused in a single focus area in the sample. This can be achieved, for example, by virtue of the deflecting device having two mutually opposite mirrors and the strip of light being tilted symmetrically about the objective axis at two different angles by means of the beam deflecting device, in particular with a clock frequency in the range of 1 kHz, for example, so that the sample illuminated by the two mirrors from two opposite sides. In this case, the oscillation frequency for generating the light strip is substantially greater than the clock frequency for changing the direction of illumination.

According to another embodiment of the invention, the sample may be illuminated radially from all directions of a plane with the light strip, again focusing the light strip from each of the directions of the plane in a single focus area in the sample. For this purpose, the deflecting device can be designed such that the reflective surface is at least partially formed on the inside of a cone. In addition, the light stripe is guided in a circle around the optical axis of the objective with the aid of the beam deflecting device so that averaged over time radial illumination of the sample results from all sides.

The SPIM method explained in the introduction advantageously allows a three-dimensional image of a spatially extended sample. This imaging method is based on a layer-by-layer detection of the sample and subsequent reconstructions of the three-dimensional shape from the two-dimensional slice images. For the recording of the individual images, it is particularly advantageous if the sample is displaced or displaceable relative to the objective and to the deflection device, in particular along the optical axis of the objective. In addition, it can also be provided when the sample is rotated relative to the lens and the deflection device, in particular about the optical axis of the lens or is rotatable. Rotating the sample can also provide illumination from multiple directions.

Furthermore, it can be provided that the sample is positioned or positionable in an optical medium, in particular an immersion medium. This can serve to increase the optical resolution, to observe living cells or tissues surrounded by aqueous solutions and / or to suppress contrast-reducing reflections by avoiding refractive index changes. Possible immersion agents are, for example, water, silicone oil or glycerol.

In particular, when using such optical media, it may be advantageous if the sample is positioned or can be positioned in a sample chamber. Alternatively, a capillary for positioning the sample may also be provided.

In order to avoid a collision of the sample and / or the devices holding the sample with the deflection device and / or the objective, the sample can advantageously be positioned on a base or be positionable. By using a base, the sample can be positioned particularly close to the optics of the objective to increase the optical resolution, in particular when the deflection device, as described above, is designed such that it laterally surrounds the sample.

When using optical media, in particular of immersion means, it can be provided according to a further embodiment of the invention that the lens as an immersion objective is formed and that in addition the lens and / or the deflection device is immersed in the sample chamber and / or in the optical medium.

According to another embodiment of the invention it can be provided that several samples are arranged, for example, in a matrix form and that these are carried out successively or cyclically repeating microscopic examinations using the arrangement according to the invention for illumination and / or using the method according to the invention. For this purpose, the samples can be applied, for example, to a microscope slide, for example embedded in agar or water, and be run in succession. It can be provided that the sample carrier is lowered when the position is to be changed relative to the lens and / or the deflection device. After moving to the new location, the sample is moved back to the lens and the deflection device.

According to a particularly advantageous embodiment of the invention, a stimulation light beam and / or a stimulation light stripe can be superimposed or superimposed on the light stripe to increase the optical resolution according to the principle of STED microscopy. The principle of the principle of STED microscopy (Stimulated Emission Depletion) is, for example, in S. Hell, et al., Stimulated Emission Depletion Fluorescence Microscopy, Optics Letters. 19, No. 11, 1994, pp. 780-782 and generally serves to increase the spatial resolution of a light microscopic image beyond the diffraction limit. In this case, by the stimulation light beam or the stimulation light strip fluorescent dyes that are used to mark individual areas of the sample, specifically targeted and thus turned off, so that send out during detection no further fluorescent light. Accordingly, one could also designate the stimulation light beam as Ausschaltlichtstrahl and the stimulation light strip as Ausschaltlichtstreifen.

In the method and arrangement for illuminating the sample according to the invention, the STED method can be used such that the area in the sample from which fluorescent light is emitted from the sample is smaller than the area of the sample which is illuminated by the light strip becomes. Effectively, in an advantageous embodiment, it is achieved that the resulting light strip is thinner or shallower.

Another way to increase the resolution is to use Resolft technology. In this case, special dyes are used, which can be specifically offset by exposure to suitable light in a state in which they no longer give detection light. By selectively applying a portion of the light-stripe-illuminated sample area with appropriate light, the area of the detection light emitted can be reduced and thus the resolving power can be increased.

For this purpose, the light strip and the stimulation light beam or the stimulation light strip are particularly preferably superposed in such a way that both are focused in a common area in the sample. While in the conventional application of the STED method, the focus of the stimulation light beam in cross-section is annular, as a TEM _{01 *} Laguerre Gaussian mode, the embodiment of the invention described here advantageously provides a focus shape of the stimulation light beam symmetrically above and below that of The illumination plane generated by the light strip in cross-section two intensity maxima and in between the focus of the light stripe a minimum, as a TEM ₀₁ Hermite Gaussian mode has. For example, a phase plate can be used to generate such a light mode. This ensures that the light strip is reduced only in the direction of their focal transverse extension perpendicular to the illumination plane, but not in the direction of the focal length extension. Overall, this results in a large and at the same time very thin light stripes which allows spatially high-resolution step images of the sample to occur.

Other objects, advantages, features and applications of the present invention will become apparent from the following description of an embodiment with reference to the drawings. All described and / or illustrated features alone or in any meaningful combination form the subject matter of the present invention, also independent of their summary in the claims or their dependency.

Show it:

1a 3 is a schematic diagram illustrating a complete illumination of the entrance pupil of a lens for producing a focus;

1b c is a schematic representation illustrating the effect of tilting a light beam entering the entrance pupil of the objective;

2a 3 is a schematic diagram illustrating the under-illumination of the entrance pupil of a lens for producing a focus;

2 B c is a schematic diagram illustrating the effect of tilting a light beam that illuminates the entrance pupil of the objective;

3a a schematic representation illustrating the decentralized undercutting the entrance pupil of a lens for generating a focus,

3b c shows a schematic representation which illustrates the effect of tilting a light bundle that illuminates the entrance pupil of the objective decentrally,

4 a schematic representation of a possible embodiment of the inventive arrangement for carrying out the method according to the invention for illuminating a sample in SPIM microscopy,

5 a schematic representation of another possible embodiment of the inventive arrangement for performing the method according to the invention for illuminating a sample in SPIM microscopy, in addition to the in 4 embodiment shown has a cylinder optics,

6 a schematic representation of a deflecting device and a lens according to a third embodiment of the inventive arrangement for performing the method according to the invention and

7 a schematic representation of a fourth embodiment of the inventive arrangement for performing the method according to the invention for illuminating a sample in SPIM microscopy, which, inter alia, prefers the use of another lens.

With reference to the 1a - 1c . 2a - 2c and 3a - 3c In the following, the principles of the various pupil lighting options are first illustrated. It should be noted that these figures are purely schematic representations that are intended to better understand the invention. In the following discussion, reference will be made to a coordinate system whose x-axis is horizontal in the drawing plane and whose z-axis is vertically aligned in the drawing plane, while the y-axis is pointing out of the drawing plane.

In 1a is the case of a complete illumination of the entrance pupil 4.1 a lens 4 with a light beam 1 shown. The light beam 1 runs parallel to the optical axis O1 of the lens 4 (z-axis) and enters perpendicular to the entrance pupil 4.1 (xy plane) of the lens 4 one. The objective 4 produces a focused light distribution in the form of a focus of the light beam 1.1 whose extent along the optical axis O1 is greater than transverse to the optical axis O1.

The 1b and 1c show how the location of the focus 1.1 changes when the light beam 1 in the entrance pupil 4.1 of the lens 4 is tilted relative to the optical axis O1, but still the entrance pupil 4.1 completely illuminates. The change caused by the tilting of the direction of incidence A1 of the light beam 1 is through the the optics 4.2 of the lens 4 in a shift of focus 1.1 implemented transversely to the optical axis O1. Because the light beam 1 the entrance pupil 4.1 of the lens 4 completely penetrated, the focus remains 1.1 aligned with its longitudinal extent parallel to the optical axis O1.

In 2a is an under-illumination of the entrance pupil 4.1 of the lens 4 shown. As can be seen, the light beam penetrates 1 only a central part of the entrance pupil 4.1 of the lens 4 , Through the under-illumination of the entrance pupil 4.1 becomes an expansion of focus 1.1 causes, ie the focus 1.1 is larger overall than in the complete illumination of the entrance pupil 4.1 ,

In the 2 B and 2c now the case is shown in which the entrance pupil 4.1 Illuminating light bundles 1 centrally through the entrance pupil 4.1 runs and in the entrance pupil 4.1 is tilted. Taking into account the explanations with respect to the previous figures, a total displacement of the expanded focus results 1.1 to the outside, wherein the distance from the optical axis O1 is greater, the more the light beam 1 is tilted relative to the optical axis O1.

In 3a - 3c is this the entrance pupil 4.1 of the lens 4 Illuminating light bundles 1 additionally arranged offset decentralized, that is displaced transversely to the optical axis O1. This decentering of the light beam 1 in the entrance pupil 4.1 causes the focus 1.1 is inclined relative to the optical axis O1. This can be useful, for example, the light strip 2 at different angles to the optical axis O1 into the sample.

4 shows a schematic representation of a possible embodiment of the inventive arrangement for performing the method according to the invention for illuminating a sample in SPIM microscopy. For this purpose, the arrangement has a light source 8th for generating the light beam 1 on. In the exemplary embodiment shown here, the light source is a solid-state laser which has a CW Laser beam, for example, emitted with a wavelength of 532 nm.

Furthermore, the arrangement has a beam deflecting device 6 up, out of the light beam 1 in the manner described above, a light strip 2 generates and also the light beam 1 or the generated light strip 2 in the entrance pupil 4.1 of the lens 4 tilted with respect to the optical axis O1. In the present embodiment, two tilting mirrors are used for this purpose 6.1 as an integral part of the Strahlablenkvorrichtung 6 used. Each of these tilt mirrors 6.1 can be tilted along two orthogonal spatial direction with a maximum angular stroke of 20 degrees, wherein the tilting movement along both spatial directions is effected in each case with an electromagnetic actuator. In the present exemplary embodiment, the actuators enable inter alia an oscillating tilting movement of the tilting mirrors 6.1 along both directions with a maximum bandwidth of 12 kHz. Overall, it can be a light strip 2 produce. On the other hand, therefore, the light strip 2 or the light beam 1 at different angles and at different positions in the entrance pupil 4.1 of the lens 4 be guided.

Alternatively, instead of or in addition to the beam deflecting device 6 also a cylinder optics 13 for generating the light strip 2 exhibit. Such embodied embodiment of the invention with a cylinder optics 13 is in 5 shown, wherein the cylinder optics 13 the beam deflector 6 upstream. However, it is also conceivable in the case of using a cylinder optics at least parts without beam deflection - or on the entire beam deflection - to dispense.

The two in the 4 and 5 shown embodiments have in the further beam path, the lens 4 upstream additional lens optics 9 on. The additional lens optics 9 produced together with the optics 4.2 of the lens 4 in the manner explained above the focus 2.2 of the light strip 2 , which then from the deflection device in the sample 7 is diverted. The deflection takes place so that the light strip 2 after redirecting to illuminate the sample 7 at an angle different from zero degrees, in particular as here at a right angle, to the optical axis of the objective O1 and in the sample 7 is focused. Essential for the invention here is that the light strip 2 in interaction with the optics 4.2 of the lens 4 occurs. The optics 4.2 of the lens 2 but is also designed and trained by the sample 7 outgoing detection light 10 directly or indirectly to a detector 11 supply. In the present embodiment, this is a beam splitter 12 provided in the beam path, that of the sample 7 outgoing detection light 10 on a detector 11 , for example, as here a CCD camera leads.

The 4 and 5 It can also be seen that the deflection device 5 for deflecting the light strip - here with a right-angled arrow 5.1 shown - two plane mirrors 5.1 both of which are reflective for the intended wavelength and which are relative to the optical axis O1 of the objective 4 Opposite mirror symmetry. By using two opposing mirrors 5.1 can be achieved that the sample 7 to avoid shading advantageous illuminated from two directions. This is, as described above with the help of the Strahlablenkvorrichtung 6 , the light strip 2 for surface illumination of the sample 7 alternately over the two mirrors 5.1 into the sample 7 guided. The mirror 5.1 are arranged so that the light strip 2 from both directions into a single focus area 2.1 is focused or focusable.

Alternatively, a radial illumination of the sample can take place from all directions of a plane. For this purpose, the deflection device 5 according to a further embodiment of the invention, as in 6 shown a reflective surface 5.3 on that on the inside of a cone 5.4 is applied. Will now be the light strip 2 with the help of the beam deflector 6 in the entrance pupil 4.1 of the lens 4 guided on a circular path around the optical axis O1, so a time-aided areal lighting of the sample is achieved from all directions of a lighting level.

It is particularly advantageous if the deflection device 5 with the help of a manually detachable connection 5.5 on the housing 4.3 of the lens 4 can be determined. After the in 6 shown embodiment of the invention is to the cone-like deflection 5 an internal thread 5.6 provided, with which the deflection device by means of a corresponding external thread 5.7 on the housing 4.3 of the lens 4 to the lens 4 can be screwed. This is the particular advantage that the deflection 5 for example, can be replaced by a differently configured deflection. Alternatively, also a lens 2 in this way very easy for the SPIM process with a correspondingly designed deflection 5 be retrofitted.

7 shows a further embodiment of the invention, in which the sample 7 in one with an optical medium 15 filled sample chamber 14 located. In addition, the sample is 7 on a pedestal 16 positioned so that the sample 7 to the high-resolution optics 4.2 of the lens 4 moved up can be. In particular, the sample can 7 in this way collision-free between the two mirrors 5.1 the in 7 shown deflection 5 be positioned. Both the lens 2 , which is designed here as immersion objective, as well as the deflection device 5 dive into the optical medium 15 and therefore also in the sample chamber 14 one. As an optical medium 15 Glycerin is used in this example. However, water, silicone oil or other immersion agents are also conceivable.

Besides that is 7 to take that next to the lens 4 also another lens 17 or a condenser optics 18 can be used for detection, ie from the sample 7 outgoing detection light 10 directly or indirectly to a detector 11 supply. In the embodiment shown here is another lens 17 below the sample 7 , opposite the lens 2 and aligned along its optical axis O1. Also, as in 7 shown a cover slip 19 between the sample 7 and the other lens 4 its appearance 4.2 accordingly for observation by the cover glass 19 corrected.

LIST OF REFERENCE NUMBERS

1

light beam

1.1

Focus of the light beam

2

light strips

2.1

Focus of the light strip

3

Optical means (for generating a light strip)

4

lens

4.1

Entrance pupil (of the lens)

4.2

Optics (of the lens)

5

deflecting

5.1

planner mirror

5.2

right-angled arrow (symbolizes the deflection of the light strip)

5.3

reflective surface

5.4

Inside of the cone

5.5

again detachable connection

5.6

inner thread

5.7

external thread

6

beam deflection

6.1

tilting mirror

7

sample

8th

light source

9

additional lens optics

10

detection light

11

detector

12

beamsplitter

13

cylindrical optics

14

sample chamber

15

optical medium

16

base

17

another lens

18

condenser

19

cover glass

O1

optical axis of the lens

A1

Direction of incidence in the lens

QUOTES INCLUDE IN THE DESCRIPTION

This list of the documents listed by the applicant has been generated automatically and is included solely for the better information of the reader. The list is not part of the German patent or utility model application. The DPMA assumes no liability for any errors or omissions.

Cited patent literature

• DE 10257423 A1 [0003]
• WO 2010/012980 A1 [0005]
• DE 102004034957 A1 [0006]

Cited non-patent literature

• Lindek et al; Journal of Modern Optics, 1999, vol. 46, no. 5, 843-858 [0002]
• S. Hell, et al., Stimulated Emission Depletion Fluorescence Microscopy, Optics Letters. 19, No. 11, 1994, pp. 780-782 [0041]

Claims (15)

Arrangement for illuminating a sample in SPIM microscopy a. with a light source for generating a light beam, b. with means for producing a light strip from the light bundle, in particular for substantially planar illumination of a sample in an illumination plane from at least one direction, c. with at least one objective which has optics which are designed and intended to supply detection light emanating from the sample directly or indirectly to a detector, the optics of the objective interacting with the light stripe, d. and with a deflection device downstream of the optics of the objective for deflecting the light strip, wherein the light strip propagates after deflection to illuminate a sample at an angle different from zero degrees, in particular a right angle, to the optical axis of the objective and / or in an optical Axis of the lens is not arranged parallel plane. Arrangement according to claim 1, characterized in that a. the optical means for generating the light strip comprises at least one beam deflecting device and / or that b. the optical means for generating the light strip comprises at least one beam deflection device, which is designed as a beam deflection device of a scanning microscope or a confocal scanning microscope and / or that c. the optical means for generating the light strip comprises at least one beam deflection device with at least one rotating mirror and / or a tilting mirror, preferably a galvanometer mirror, and / or a rotatable prism and / or a displaceable lens and / or an acousto-optical deflector. Arrangement according to claim 1 or 2, characterized in that the optical means for generating the light strip comprises at least one cylinder optics. Arrangement according to one of claims 1 to 3, characterized in that a. the shape and / or the position and / or the orientation of the light strip is adjustable and / or b. in that the shape and / or the position and / or the orientation of the light strip can be adjusted by means of the optical means for producing the light strip and / or with the aid of the objective and / or with the aid of the deflection device. Arrangement according to one of claims 1 to 4, characterized in that a. the lens is a dip lens and / or that b. the objective is an immersion objective and that the objective is designed and intended, in particular together with the deflection device, to immerse in a sample chamber or in a sample vessel which is filled with an optical medium which surrounds a sample to be illuminated. Arrangement according to one of claims 1 to 5, characterized in that a further lens and / or a condenser optics for direct or indirect feeding of the emanating from the sample detection light to the detector. Arrangement according to one of claims 1 to 6, characterized in that a. the deflecting device can be fixed to the objective and / or the further objective and / or the condenser optics and / or is fixed and / or that b. the deflecting device is held displaceably on the objective and / or the further objective and / or on the condenser optics against the force of an elastic element, in particular against a spring, in particular at an angle different from 90 ° with respect to the optical axis of the objective. c. the deflection device has connecting means, such that the deflection device can be fixed as a retrofit component to the objective and / or another objective. Arrangement according to one of claims 1 to 7, characterized in that at least one component of the deflection device is made in one piece with a component of the objective or a component of the further objective or a component of the condenser optics. Arrangement according to claim one of claims 1 to 8, characterized in that a. the deflection device for deflecting the light strip has at least one at least partially reflecting surface and / or that b. the deflection device for deflecting the light strip has at least one at least partially reflecting surface, wherein the reflecting surface is formed as part of a plane mirror and / or that c. the deflection device for deflecting the light strip has at least one at least partially reflecting surface, wherein the reflective surface is at least partially formed on the inside of a cone. Arrangement according to one of claims 1 to 9, characterized in that a sample a. is illuminated from at least two directions with the light strip, wherein the light strip is preferably from each of the at least two directions in a focusable focus area in the sample and / or that b. radially illuminatable from all directions of a plane with the light stripe, wherein the stripe of light from each of the directions of the plane can be focused in a single focus area in the sample and / or that c. the sample can be illuminated from at least two directions by changing the irradiation direction, in particular by means of the deflection device and / or the optical means for producing the light strip, and / or that d. the sample can be illuminated radially from all directions of a plane with the light strip by rotating the irradiation direction, in particular by means of the deflection device and / or the optical means for producing the light strip. Arrangement according to one of claims 1 to 10, characterized in that the beam path of the light beam and / or the light stripe and / or the detection light of the type are matched to one another that the light stripe has a focus on a sample site to be observed and that emanate from the sample location of the detection light on the detector has one of the detection foci. Arrangement according to one of claims 1 to 11, characterized in that in particular for compensating a path length difference between a light path of the light beam and a light path of the detection light a. the light beam strikes the lens as a divergent light beam and / or that b. the light beam passes through an additional optical system which acts exclusively on the light beam but not on the detection light and / or that c. the arrangement has an extended detection beam path. Arrangement according to one of claims 1 to 12, characterized in that a. at least one stimulation light bundle and / or a stimulation light strip for increasing the optical resolution according to the principle of STED (Stimulated Emission Depletion) microscopy is superimposed on the light strip in such a way that the area of the sample from which the light to be detected is smaller as the area of the sample that is illuminated by the light strip and / or that b. the light strip at least one stimulation light strip for increasing the optical resolution according to the principle of STED (Stimulated Emission Depletion) microscopy is superimposed, wherein the light strip and the stimulation light strip partially overlap and are aligned parallel to each other. Microscope, in particular scanning microscope and / or confocal scanning microscope, and / or experimental setup for the microscopic imaging of a sample with an arrangement for illuminating according to one of Claims 1 to 13. Microscope and / or experimental setup according to claim 14, characterized in that, in particular for SPIM microscopy, a. a device is provided for displacing and / or rotating a sample relative to the objective and the deflection device, and / or that b. the sample is positionable in an optical medium, in particular an immersion medium, and / or that c. a sample chamber or a capillary or a sample dish is provided for one or more samples and / or that d. at least one pedestal is provided on which a sample can be positioned and / or positioned.

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