[go: up one dir, main page]

DE19983759T1 - Elektrisches Kontaktsystem - Google Patents

Elektrisches Kontaktsystem

Info

Publication number
DE19983759T1
DE19983759T1 DE19983759T DE19983759T DE19983759T1 DE 19983759 T1 DE19983759 T1 DE 19983759T1 DE 19983759 T DE19983759 T DE 19983759T DE 19983759 T DE19983759 T DE 19983759T DE 19983759 T1 DE19983759 T1 DE 19983759T1
Authority
DE
Germany
Prior art keywords
electrical contact
contact system
electrical
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE19983759T
Other languages
English (en)
Other versions
DE19983759B4 (de
Inventor
Stephen A Boyle
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RIKA DENSHI AMERICA, INC., ATTLEBORO, MASS., US
Original Assignee
RIKA ELECTRONICS INTERNAT Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RIKA ELECTRONICS INTERNAT Inc filed Critical RIKA ELECTRONICS INTERNAT Inc
Publication of DE19983759T1 publication Critical patent/DE19983759T1/de
Application granted granted Critical
Publication of DE19983759B4 publication Critical patent/DE19983759B4/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
    • H01R24/38—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts
    • H01R24/40—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency
    • H01R24/42—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency comprising impedance matching means or electrical components, e.g. filters or switches
    • H01R24/44—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency comprising impedance matching means or electrical components, e.g. filters or switches comprising impedance matching means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2103/00—Two poles

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
DE19983759T 1998-11-25 1999-11-15 Elektrisches Kontaktsystem Expired - Fee Related DE19983759B4 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11002698P 1998-11-25 1998-11-25
US60/110,026 1998-11-25
PCT/US1999/027198 WO2000031828A2 (en) 1998-11-25 1999-11-15 Electrical contact system

Publications (2)

Publication Number Publication Date
DE19983759T1 true DE19983759T1 (de) 2001-11-08
DE19983759B4 DE19983759B4 (de) 2004-06-03

Family

ID=22330854

Family Applications (2)

Application Number Title Priority Date Filing Date
DE19983760T Withdrawn DE19983760T1 (de) 1998-11-25 1999-11-15 Elektrisches Kontaktsystem
DE19983759T Expired - Fee Related DE19983759B4 (de) 1998-11-25 1999-11-15 Elektrisches Kontaktsystem

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE19983760T Withdrawn DE19983760T1 (de) 1998-11-25 1999-11-15 Elektrisches Kontaktsystem

Country Status (6)

Country Link
US (2) US6159056A (de)
JP (2) JP2002530841A (de)
KR (2) KR100429057B1 (de)
AU (2) AU1729800A (de)
DE (2) DE19983760T1 (de)
WO (2) WO2000031835A1 (de)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10316385A1 (de) * 2003-04-10 2004-11-04 Hirschmann Electronics Gmbh & Co. Kg Kontaktadapter für die Kontaktierung einer Antennenstruktur eines Fahrzeuges
US7682206B2 (en) 2004-07-13 2010-03-23 Era-Contact Gmbh Electrical pressure contact

Families Citing this family (86)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001143803A (ja) * 1999-11-16 2001-05-25 Yazaki Corp 突き当て式接触端子とそれを用いたコネクタ
FR2810803B1 (fr) 2000-06-22 2002-12-13 Marechal Sepm Contact electrique elastique a pression axiale, a borne de raccordement orientable
FR2810804B1 (fr) * 2000-06-22 2002-12-27 Marechal Sepm Contact electrique elastique a pression axiale et raccordement etanche
JP2004504703A (ja) * 2000-07-13 2004-02-12 リカ　エレクトロニクス　インターナショナル　インコーポレイテッド 試験機器に特に有用な接点器具
KR100562602B1 (ko) * 2000-10-26 2006-03-17 신에츠 폴리머 가부시키가이샤 압접 협지형 커넥터 및 그 접속 구조
SE519586C2 (sv) 2001-03-28 2003-03-18 Sutars Ab Stickkontakt för ett cigarettändarurtag
GB2373930B (en) * 2001-03-28 2004-06-16 Sutars Ab A plug for a cigarette lighter socket
JP3767810B2 (ja) * 2001-04-27 2006-04-19 株式会社ヨコオ スプリングコネクタ
US6667629B2 (en) 2001-09-24 2003-12-23 Rika Electronics International, Inc. Electrical test probes and methods of making the same
US6565395B1 (en) * 2001-12-21 2003-05-20 Northrop Grumman Corporation Electrical connection to a coil spring through a local interference fit for connection to a vibratory rotation sensor and method of forming the same
US6685492B2 (en) 2001-12-27 2004-02-03 Rika Electronics International, Inc. Sockets for testing electronic packages having contact probes with contact tips easily maintainable in optimum operational condition
DE60315813T2 (de) 2002-03-05 2008-05-21 Rika Denshi America, Inc., Attleboro Vorrichtung für eine schnittstelle zwischen elektronischen gehäusen und testgeräten
US6575772B1 (en) * 2002-04-09 2003-06-10 The Ludlow Company Lp Shielded cable terminal with contact pins mounted to printed circuit board
US6844749B2 (en) * 2002-07-18 2005-01-18 Aries Electronics, Inc. Integrated circuit test probe
US6720511B2 (en) * 2002-09-05 2004-04-13 Litton Systems, Inc. One-piece semi-rigid electrical contact
JP3768183B2 (ja) * 2002-10-28 2006-04-19 山一電機株式会社 狭ピッチｉｃパッケージ用ｉｃソケット
US7053640B2 (en) * 2002-12-27 2006-05-30 Agilent Technologies, Inc. System and method for providing high RF signal isolation and low common ground inductance in an RF circuit testing environment
US6824427B1 (en) * 2003-05-13 2004-11-30 3M Innovative Properties Company Coaxial probe interconnection system
TWI241757B (en) * 2003-05-16 2005-10-11 Parry Chen RF coaxial conductor
ITRM20030306A1 (it) 2003-06-20 2004-12-21 Link S R L Contatto elettrico maschio-femmina provvisto di dispositivo di sicurezza, dispositivo di sicurezza e contatto elettrico femmina da utilizzare
US7015708B2 (en) * 2003-07-11 2006-03-21 Gore Enterprise Holdings, Inc. Method and apparatus for a high frequency, impedance controlled probing device with flexible ground contacts
DE10353227A1 (de) * 2003-10-10 2005-05-12 Andrea Berger Prüfstift
CN2682641Y (zh) * 2003-11-20 2005-03-02 上海莫仕连接器有限公司 压接式导电端子
CN2682638Y (zh) * 2003-11-20 2005-03-02 上海莫仕连接器有限公司 压接式导电端子
WO2005060718A2 (en) * 2003-12-18 2005-07-07 Lecroy Corporation Cap at resistors of electrical test probe
JP4695337B2 (ja) 2004-02-04 2011-06-08 日本発條株式会社 導電性接触子および導電性接触子ユニット
JP4089976B2 (ja) * 2004-05-17 2008-05-28 リーノ アイエヌディー．インコーポレイテッド 大電流用プローブ
US7315176B2 (en) * 2004-06-16 2008-01-01 Rika Denshi America, Inc. Electrical test probes, methods of making, and methods of using
KR100600482B1 (ko) * 2004-06-22 2006-07-13 삼성전자주식회사 반도체 패키지 측정용 프로브
JP2006053043A (ja) * 2004-08-11 2006-02-23 Fujitsu Ltd プリント板試験装置
US7114996B2 (en) * 2004-09-08 2006-10-03 Advanced Interconnections Corporation Double-pogo converter socket terminal
KR100584225B1 (ko) * 2004-10-06 2006-05-29 황동원 전자장치용 콘택트
US7690925B2 (en) * 2005-02-24 2010-04-06 Advanced Interconnections Corp. Terminal assembly with pin-retaining socket
KR100715269B1 (ko) * 2005-10-28 2007-05-07 리노공업주식회사 동축 접촉 프로브
ITGE20060052A1 (it) * 2006-05-05 2007-11-06 Hypertac S P A Contatto per connessioni elettriche od elettroniche.
US7545159B2 (en) * 2006-06-01 2009-06-09 Rika Denshi America, Inc. Electrical test probes with a contact element, methods of making and using the same
US20080009148A1 (en) * 2006-07-07 2008-01-10 Glenn Goodman Guided pin and plunger
JP4814730B2 (ja) * 2006-08-30 2011-11-16 株式会社マックエイト プリント基板間の接続具
CN201000993Y (zh) * 2006-12-18 2008-01-02 富士康(昆山)电脑接插件有限公司 电连接器
CN201029131Y (zh) * 2007-03-02 2008-02-27 富士康(昆山)电脑接插件有限公司 电连接器端子
US7442045B1 (en) 2007-08-17 2008-10-28 Centipede Systems, Inc. Miniature electrical ball and tube socket with self-capturing multiple-contact-point coupling
US7862391B2 (en) * 2007-09-18 2011-01-04 Delaware Capital Formation, Inc. Spring contact assembly
US7847191B2 (en) * 2007-11-06 2010-12-07 Xerox Corporation Electrical component, manufacturing system and method
TWM337870U (en) * 2007-12-03 2008-08-01 Hon Hai Prec Ind Co Ltd Electrical connector
US7491069B1 (en) * 2008-01-07 2009-02-17 Centipede Systems, Inc. Self-cleaning socket for microelectronic devices
TWM349590U (en) * 2008-06-16 2009-01-21 Hon Hai Prec Ind Co Ltd Electrical contact
US8033877B2 (en) * 2008-07-22 2011-10-11 Centipede Systems, Inc. Connector for microelectronic devices
JP2010025844A (ja) * 2008-07-23 2010-02-04 Unitechno Inc コンタクトプローブおよび検査用ソケット
EP2180326B1 (de) * 2008-10-24 2017-05-03 Tyco Electronics Services GmbH Testsonde
US7967611B2 (en) 2009-02-06 2011-06-28 The Boeing Company Electrical interconnect and method for electrically coupling a plurality of devices
JP2011002267A (ja) * 2009-06-17 2011-01-06 Hioki Ee Corp コンタクトプローブ
KR101139531B1 (ko) * 2009-12-22 2012-05-02 김동선 케이블 연결 장치
US9882330B2 (en) * 2010-07-29 2018-01-30 Andrew E. Kalman Solar panel array
DE202011111143U1 (de) * 2010-10-04 2021-01-29 Stamford Devices Limited Aerosolgenerator
JP5647869B2 (ja) * 2010-11-18 2015-01-07 株式会社エンプラス 電気接触子及び電気部品用ソケット
DE202011001670U1 (de) * 2011-01-18 2011-03-31 Ingun Prüfmittelbau Gmbh Hochfrequenz-Prüfstift Vorrichtung
US8574017B2 (en) * 2011-07-20 2013-11-05 Tyco Electronics Corporation Electrical contact with adjustable length
JPWO2013018809A1 (ja) * 2011-08-02 2015-03-05 日本発條株式会社 プローブユニット
CN103018625A (zh) * 2011-09-21 2013-04-03 鸿富锦精密工业（深圳）有限公司 连接器检测装置
US8905795B2 (en) 2011-10-12 2014-12-09 Apple Inc. Spring-loaded contacts
US8734189B2 (en) * 2011-10-12 2014-05-27 Apple Inc. Spring-loaded contact having dome-shaped piston
US8758066B2 (en) * 2012-02-03 2014-06-24 Interconnect Devices, Inc. Electrical connector with insulation member
USD699607S1 (en) * 2012-03-01 2014-02-18 Yamaichi Electronics Co., Ltd. Contact probe
US20130330983A1 (en) 2012-06-10 2013-12-12 Apple Inc. Spring-loaded contacts having sloped backside with retention guide
CN103794944A (zh) * 2014-01-07 2014-05-14 清华大学 一种单向操作快捷插座装置
TWI548879B (zh) * 2014-01-28 2016-09-11 Spring sleeve probe
US10119993B2 (en) * 2014-10-30 2018-11-06 Tongfu Microelectronics Co., Ltd. Testing probe and semiconductor testing fixture, and fabrication methods thereof
US9887478B2 (en) * 2015-04-21 2018-02-06 Varian Semiconductor Equipment Associates, Inc. Thermally insulating electrical contact probe
US10505293B2 (en) * 2016-01-18 2019-12-10 Huber+Suhner Ag Highspeed board connector
JP2017142080A (ja) * 2016-02-08 2017-08-17 日本電産リード株式会社 接触端子、検査治具、及び検査装置
CN106099486B (zh) * 2016-08-22 2019-11-26 深圳市华惠连接器有限公司 电连接器可伸缩接触件
DE112017005724T5 (de) 2016-12-22 2019-08-22 Murata Manufacturing Co., Ltd. Sondenstruktur
CN106803618B (zh) * 2016-12-29 2019-07-09 中国航天时代电子公司 一种毛纽扣式射频同轴连接器
US10069257B1 (en) * 2017-09-06 2018-09-04 Carlisle Interconnect Technologies, Inc. Inline compression RF connector
CN109103644A (zh) * 2018-08-31 2018-12-28 东莞中探探针有限公司 弹簧式探针
JP7141796B2 (ja) * 2018-09-26 2022-09-26 株式会社エンプラス コンタクトピン及びソケット
CN109638505B (zh) * 2018-12-28 2020-09-15 廊坊市东电腾达电力工程有限公司 电线电缆耐压试验专用接头
KR102184792B1 (ko) * 2019-08-01 2020-11-30 퀄맥스시험기술 주식회사 부싱을 이용한 전자 부품 검사용 장치
US11567102B2 (en) * 2019-09-04 2023-01-31 Chien Wen Chang Auxiliary device for functional expansion and signal acquisition of testing system
WO2021177086A1 (ja) * 2020-03-06 2021-09-10 株式会社村田製作所 検査用コネクタ
KR102235724B1 (ko) * 2020-04-10 2021-04-02 주식회사 메가터치 전자 부품 제조용 금속 자재 제조 방법, 그 금속 자재 및 그 금속 자재를 이용하여 제조된 포고핀
US11942722B2 (en) 2020-09-25 2024-03-26 Apple Inc. Magnetic circuit for magnetic connector
US11437747B2 (en) 2020-09-25 2022-09-06 Apple Inc. Spring-loaded contacts having capsule intermediate object
KR102447287B1 (ko) * 2021-04-19 2022-09-26 주식회사 센서뷰 케이블용 어댑터
JP7786408B2 (ja) * 2022-03-10 2025-12-16 株式会社村田製作所 検査用コネクタ
WO2025231352A1 (en) * 2024-05-03 2025-11-06 Ardent Concepts, Inc. Compliant contact assembly for a controlled-impedance connection with compensation for axial motion

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2480963A (en) 1946-04-12 1949-09-06 Gen Motors Corp Connector
US3416125A (en) * 1966-10-20 1968-12-10 Ostby & Barton Co Co-axial connector
DE2421321C3 (de) 1974-05-02 1978-05-11 Georg Dipl.-Ing. Dr.-Ing. 8152 Feldkirchen-Westerham Spinner Abgedichtete koaxiale Steckverbindungseinrichtung
US4012105A (en) * 1974-09-30 1977-03-15 Bell Industries, Inc. Coaxial electrical connector
CA1038042A (en) 1975-03-03 1978-09-05 Motorola Programmable probe fixture and method of connecting units under test with test equipment
US4174875A (en) * 1978-05-30 1979-11-20 The United States Of America As Represented By The Secretary Of The Navy Coaxial wet connector with spring operated piston
US4245189A (en) 1979-06-14 1981-01-13 Upa Technology, Inc. Probe assembly for measuring conductivity of plated through holes
US4397519A (en) 1981-05-12 1983-08-09 Pylon Company, Inc. Electrical contact construction
US4734046A (en) * 1984-09-21 1988-03-29 International Business Machines Corporation Coaxial converter with resilient terminal
US4740746A (en) 1984-11-13 1988-04-26 Tektronix, Inc. Controlled impedance microcircuit probe
JPS6256865A (ja) * 1985-09-06 1987-03-12 Yamaichi Seiko:Kk プロ−ブコンタクト
US4636026A (en) * 1985-12-20 1987-01-13 Augat Inc. Electrical test probe
US5291129A (en) * 1988-10-24 1994-03-01 Nhk Spring Co., Ltd. Contact probe
US5330448A (en) * 1990-03-08 1994-07-19 Cristina Chu Method and apparatus for medical fluid transfer
EP0462706A1 (de) * 1990-06-11 1991-12-27 ITT INDUSTRIES, INC. (a Delaware corporation) Kontaktanordnung
US5175493A (en) * 1991-10-11 1992-12-29 Interconnect Devices, Inc. Shielded electrical contact spring probe assembly
US5850147A (en) * 1992-03-10 1998-12-15 Virginia Panel Corporation Coaxial double-headed spring contact probe assembly and coaxial surface contact for engagement therewith
US5227718A (en) * 1992-03-10 1993-07-13 Virginia Panel Corporation Double-headed spring contact probe assembly
US5576631A (en) 1992-03-10 1996-11-19 Virginia Panel Corporation Coaxial double-headed spring contact probe assembly
US6034532A (en) * 1993-07-01 2000-03-07 Alphatest Corporation Resilient connector having a tubular spring
JP2997155B2 (ja) * 1993-08-13 2000-01-11 ヒロセ電機株式会社 接触端子及び電気コネクタ
JP3279053B2 (ja) * 1994-04-27 2002-04-30 松下電器産業株式会社 コネクターおよびコネクターによる電気機器本体と電気機器分体の接続構造
US5936421A (en) * 1994-10-11 1999-08-10 Virginia Panel Corporation Coaxial double-headed spring contact probe assembly and coaxial surface contact for engagement therewith
ATE176966T1 (de) * 1997-02-04 1999-03-15 Durtal Sa Federkontaktelement
KR20010033843A (ko) * 1998-01-05 2001-04-25 리카 일렉트로닉스 인터내셔널, 인크. 동축 전기 접점 조립체

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10316385A1 (de) * 2003-04-10 2004-11-04 Hirschmann Electronics Gmbh & Co. Kg Kontaktadapter für die Kontaktierung einer Antennenstruktur eines Fahrzeuges
US7682206B2 (en) 2004-07-13 2010-03-23 Era-Contact Gmbh Electrical pressure contact

Also Published As

Publication number Publication date
JP2003526874A (ja) 2003-09-09
JP2002530841A (ja) 2002-09-17
DE19983760T1 (de) 2001-11-08
US6159056A (en) 2000-12-12
WO2000031835A1 (en) 2000-06-02
US6275054B1 (en) 2001-08-14
KR100429057B1 (ko) 2004-04-29
AU1820900A (en) 2000-06-13
AU1729800A (en) 2000-06-13
DE19983759B4 (de) 2004-06-03
KR20010093108A (ko) 2001-10-27
WO2000031828A2 (en) 2000-06-02
KR20010080546A (ko) 2001-08-22
WO2000031828A3 (en) 2007-11-15

Similar Documents

Publication Publication Date Title
DE19983759T1 (de) Elektrisches Kontaktsystem
ID23616A (id) Penghubung listrik
ITTO981002A0 (it) Connettore elettrico.
DE69504481D1 (de) Elektrisches kontaktglied
EP1113275A4 (de) Leitfähiger kontakt
DE69808595D1 (de) Kontaktsatz
DE59910310D1 (de) Elektrodensystem
BR9501444A (pt) Contato elétrico
DE59808504D1 (de) Elektrisches Kontaktelement
DK0952635T3 (da) Elektrisk konnektor
DE19980577T1 (de) Elektroschalter
IT1305180B1 (it) Connettore elettrico.
DE59807185D1 (de) Elektrisches Kontaktelement
DE59802258D1 (de) Hochstromkontakteinrichtung
DE59803794D1 (de) Elektrische steckverbindung
NO991216L (no) Elektrisk kopling
DE69923506D1 (de) Elektrisches Verbindungsgehäuse
PT1051793E (pt) Turbogerador electrico
ITTO980543A0 (it) Connettore elettrico.
DE59903376D1 (de) Elektrisches Verbindungselement
IT1303119B1 (it) Connettore elettrico.
DE69710905D1 (de) Elektrisches kontaktglied
BR9805877B1 (pt) contato elétrico.
DE59900878D1 (de) Elektrische steckverbindung
DE69929302D1 (de) Leiteranordnung

Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: RIKA DENSHI AMERICA, INC., ATTLEBORO, MASS., US

8339 Ceased/non-payment of the annual fee