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DE19859314A1 - Light diffraction device for separating excitation and emission light in confocal microscope e.g. laser scanning microscope, uses at least one diffraction element for diffraction of selected wavelength of excitation light - Google Patents

Light diffraction device for separating excitation and emission light in confocal microscope e.g. laser scanning microscope, uses at least one diffraction element for diffraction of selected wavelength of excitation light

Info

Publication number
DE19859314A1
DE19859314A1 DE1998159314 DE19859314A DE19859314A1 DE 19859314 A1 DE19859314 A1 DE 19859314A1 DE 1998159314 DE1998159314 DE 1998159314 DE 19859314 A DE19859314 A DE 19859314A DE 19859314 A1 DE19859314 A1 DE 19859314A1
Authority
DE
Germany
Prior art keywords
light
excitation
diffraction
arrangement according
aotf
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE1998159314
Other languages
German (de)
Inventor
Ralf Wolleschensky
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Carl Zeiss Microscopy GmbH
Original Assignee
VEB Carl Zeiss Jena GmbH
Carl Zeiss Jena GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by VEB Carl Zeiss Jena GmbH, Carl Zeiss Jena GmbH filed Critical VEB Carl Zeiss Jena GmbH
Priority to DE1998159314 priority Critical patent/DE19859314A1/en
Priority to DE19936573A priority patent/DE19936573A1/en
Priority to HK01108690.5A priority patent/HK1038797B/en
Priority to EP05012775.2A priority patent/EP1591825B2/en
Priority to DE59912534T priority patent/DE59912534D1/en
Priority to PCT/EP1999/010262 priority patent/WO2000037985A2/en
Priority to DE59915074T priority patent/DE59915074D1/en
Priority to EP99964647A priority patent/EP1141763B2/en
Priority to JP2000589988A priority patent/JP4532745B2/en
Priority to US09/857,205 priority patent/US7009763B1/en
Publication of DE19859314A1 publication Critical patent/DE19859314A1/en
Withdrawn legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10Beam splitting or combining systems
    • G02B27/14Beam splitting or combining systems operating by reflection only
    • G02B27/143Beam splitting or combining systems operating by reflection only using macroscopically faceted or segmented reflective surfaces
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052Optical details of the image generation
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052Optical details of the image generation
    • G02B21/0064Optical details of the image generation multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10Beam splitting or combining systems
    • G02B27/1086Beam splitting or combining systems operating by diffraction only

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

The light diffraction device uses at least one light diffraction element, e.g. an acousto-optical tunable filter (AOTF), inserted in the light path of both the excitation and the emission beams in a confocal microscope, for selective diffraction of at least one selected wavelength of the excitation beam, the emission light passing through the diffraction element without being affected.

Description

In Fig. 1-3 werden beispielhaft erfindungsgemäße Anordnungen erläutert. In Fig. 1 wird über einen Spiegel SP und einen Strahlteiler ST das Licht (Anregungslicht) zweier Laser L1, L2 mit unterschiedlichen Wellenlängen in einen gemeinsamen Strahlengang eingekoppelt, der an der Seite S1 eines verspiegelten Prismas in Richtung eines AOTF (Acousto-Optical Tunable Filter) reflektiert wird. Das Anregungslicht wird in den AOTF eingeführt, wobei in der ersten Ordnung gebeugtes Licht für über die Ansteuerfrequenz des AOTF eingestellte Wellenlänge genau in Richtung eines Pinholes PH mit vor- und nachgeordneter Pinholeoptik PHO zur Einstellung des Strahlprofiles abgelenkt wird, während andere mögliche Wellenlängen ungebeugt in nullter Ordnung den AOTF durchqueren und nicht auf das Pinhole gelangen.In Fig. 1-3 arrangements by way of example the invention will be explained. In Fig. 1, the light (excitation light) of two lasers L1, L2 with different wavelengths is coupled into a common beam path via a mirror SP and a beam splitter ST, which on the side S1 of a mirrored prism in the direction of an AOTF (Acousto-Optical Tunable Filter ) is reflected. The excitation light is introduced into the AOTF, with light diffracted in the first order for the wavelength set via the control frequency of the AOTF being deflected exactly in the direction of a pinhole PH with upstream and downstream pinhole optics PHO for setting the beam profile, while other possible wavelengths are undeflected in zero Cross the AOTF and don't get to the pinhole.

Das Pinhole PH dient hier gleichzeitig als Anregungs- und Detektionspinhole. Über Scaneinheiten SC1, SC2 und eine Scanoptik SCO wird das Anregungslicht in Richtung eines Mikroskopischen Strahlengangs MI in Richtung einer Probe abgebildet.The pinhole PH serves here as an excitation and detection pinhole at the same time. The excitation light is generated via scanning units SC1, SC2 and a scanning optics SCO in the direction of a microscopic beam path MI in the direction of a sample pictured.

Das von der Probe emittierte Licht, bestehend aus Anteilen des Anregungslichtes und wellenlängenverschobenen Flureszenzanteilen, durchläuft den Lichtweg in umgekehrter Richtung bis zum AOTF. Hier gelangen die Wellenlängenanteile des Anregungslichtes wiederum über die Beugung erster Ordnung auf die Spiegelseite S1 des Prismas PS, während die Fluoreszenzanteile den AOTF ungebeugt in nullter Ordnung durchqueren und dadurch einen Winkel zum reflektierten Anregungslicht einnehmen.The light emitted by the sample, consisting of parts of the excitation light and wavelength shifted fluorescence components, passes through the light path in reverse direction to the AOTF. This is where the wavelength components of the Excitation light in turn via first-order diffraction on the mirror side S1 of the prism PS, while the fluorescence components undiffracted the AOTF in zero Cross order and thereby an angle to the reflected excitation light take in.

Zwischen den rückkehrenden Strahlen nullter und erster Ordnung ist nun genau die Spitze zwischen den Prismenflächen S1 und S2 angeordnet, wodurch das Fluoreszenzlicht auf die Seite S2 trifft und von dieser in Richtung einer Detektionseinheit, hier beispielhaft bestehend aus einem Linienfilter LF, einem Farbteiler NFT und zwei Detektoren für unterschiedliche Wellenlängen, reflektiert wird. Between the returning zeroth and first order rays is exactly that Point arranged between the prism surfaces S1 and S2, whereby the Fluorescent light hits side S2 and from it towards one Detection unit, here consisting for example of a line filter LF, a Color splitter NFT and two detectors for different wavelengths, reflected becomes.  

Durch die niedrige Bandbreite des AOTF von ca. 2 nm Bandbreite für das Anregungslicht wirkt er als extremer Kantenfilter mit deutlichen Vorteilen etwa gegen dichroitische Filter mit Bandbreiten größer 10 nm.Due to the low bandwidth of the AOTF of approx. 2 nm bandwidth for the Excitation light acts as an extreme edge filter with clear advantages, for example against dichroic filters with bandwidths greater than 10 nm.

Das ist von besonderer Bedeutung, weil der Abstand von Anregungswellenlänge und Fluoreszenzwellenlängen kleiner als 10 nm sein kann und durch die erfindungsgemäße Anordnung eine wellenlängenabhängige Trennung dennoch möglich ist.This is particularly important because the distance from the excitation wavelength and fluorescence wavelengths can be less than 10 nm and through which arrangement according to the invention nevertheless a wavelength-dependent separation is possible.

Durch Frequenzänderung kann der AOTF von der Wellenlänge des Lasers L1 auf die Wellenlänge des Lasers L2 umgeschaltet werden und wiederum das Anregungslicht vom Fluoreszenzlicht getrennt werden.By changing the frequency, the AOTF can change from the wavelength of the laser L1 the wavelength of the laser L2 are switched and again that Excitation light can be separated from fluorescent light.

Statt des Prismas mit den Seiten S1, S2 können auch zwei unabhängige, den Seiten S1, S2 entsprechende, aber nicht zusammenhängende Spiegel verwendet werden. Ein Vorteil ist, daß diese auch drehbar ausgebildet sein können, um eine genaue Einstellung auf den AOTF bzw. die Detektion DE zu ermöglichen.Instead of the prism with sides S1, S2, two independent sides can be used S1, S2 corresponding but not connected mirrors are used. An advantage is that they can also be rotated to provide an accurate To enable adjustment to the AOTF or the detection DE.

In Fig. 2 ist eine ähnliche Anordnung mit nur einem Scanner SC dargestellt. Hier ist statt des Prismas ein Spiegel S vorgesehen, der das Anregungslicht in Richtung des AOTF analog zu Fig. 1 umlenkt, wobei hier das in nullter Ordnung zurückkehrende Fluoreszenzlicht durch den AOTF hindurchgehende Licht neben dem Spiegel S verläuft und auf diese Weise in Richtung einer hier nicht dargestellten Detektion gelangt.In Fig. 2 is a similar arrangement with only a scanner SC is illustrated. Here, instead of the prism, a mirror S is provided, which deflects the excitation light in the direction of the AOTF analogously to FIG. 1, the fluorescence light returning in zero order here passing through the AOTF next to the mirror S and in this way in the direction of one here detection, not shown.

Grundsätzlich sind auch Anordnungen denkbar, bei der der AOTF allein als Separationseinheit von Anregungslicht und Fluoreszenzlicht dienen kann, indem das Laserlicht in Richtung der ersten Ordnung ohne ein vorgeschaltetes Element in den AOTF gelangt und das Detektionslicht unter einem Winkel zum Anregungslicht den AOTF verläßt und direkt in eine Detektionseinheit gelangt, was lediglich Auswirkungen auf die Baulänge hat, da der Winkel mit beispielsweise vier Grad recht klein ausfällt und Überlagerungen der Wellenlängenanteile vermieden werden sollen.In principle, arrangements are also conceivable in which the AOTF alone as Separation unit of excitation light and fluorescent light can serve by the Laser light in the direction of the first order without an upstream element in the AOTF arrives and the detection light at an angle to the excitation light AOTF leaves and goes directly into a detection unit, which is just Has an impact on the overall length, as the angle is, for example, four degrees turns out quite small and overlaps of the wavelength components are avoided should.

Weiterhin kann auch nur für das Fluoreszenzlicht ein separierender Spiegel vorgesehen sein.Furthermore, a separating mirror can also be used only for the fluorescent light be provided.

In Fig. 3 ist eine weitere vorteilhafte Ausführung in Form eines unverspiegelten Prismas vorgesehen, das durch Brechung das Licht eines Anregungslasers in erster Ordnung in den AOTF hineinführt und die nullte Ordnung (das Fluoreszenzlicht) in Richtung der Detektion DE ablenkt.In Fig. 3, a further advantageous embodiment in the form of a non-mirrored prism is provided inside through refraction, the light of an excitation laser to first order in the AOTF and deflects the zeroth order (the fluorescent light) in the direction of the detection DE.

Durch den Winkel zwischen erster und nullter Ordnung und unterschiedlicher Wellenlängen ist vorteilhaft eine deutliche Separierung der Wellenlängenanteile möglich.By the angle between first and zero order and different Wavelengths is advantageously a clear separation of the wavelength components possible.

Die Erfindung ist besonders vorteilhaft in einem Laser-Scanning-Mikroskop mit einem AOTF anwendbar.The invention is particularly advantageous in using a laser scanning microscope applicable to an AOTF.

Andere vorteilhafte Anwendungen eines anderen lichtbeugenden Elementes zur Strahlungstrennung durch verschiedene Beugungsordnungen sind jedoch in einem mikroskopischen Strahlengang denkbar und vorteilhaft in den Umfang der Erfindung eingeschlossen.Other advantageous applications of another light diffractive element Radiation separation through different diffraction orders are however in one microscopic beam path conceivable and advantageous in the scope of the invention locked in.

Claims (7)

1. Anordnung eines lichtbeugenden Elementes zur Separierung von Anregungs- und Emissionslicht in einem mikroskopischen Strahlengang, vorzugsweise in einem konfokalen Mikroskop, und insbesondere in einem Laser-Scanning-Mikroskop.1. Arrangement of a light diffractive element for the separation of excitation and Emission light in a microscopic beam path, preferably in one confocal microscope, and especially in a laser scanning microscope. 2. Anordnung nach Anspruch 1, wobei das lichtbeugende Element sowohl vom Anregungslicht als auch vom Emissionslicht durchlaufen wird.2. Arrangement according to claim 1, wherein the light diffractive element from both Excitation light and emission light are passed through. 3. Anordnung nach einem der vorangehenden Ansprüche, wobei das lichtbeugende Element mindestens eine Wellenlänge der Anregung durch Beugung beeinflußt, während andere von der Probe emittierte Wellenlängen das Element unbeeinflußt durchlaufen und dadurch räumlich vom Anregungslicht getrennt werden.3. Arrangement according to one of the preceding claims, wherein the light diffractive element has at least one wavelength of excitation affected by diffraction while other wavelengths emitted by the sample pass through the element unaffected and thereby spatially by the excitation light be separated. 4. Anordnung nach einem der vorangehenden Ansprüche, wobei im Anregungsstrahlengang vor dem Element und/oder im Detektionsstrahlengang nach dem Element zur verbesserten Trennung der Lichtanteile mindestens ein die Lichtrichtung beeinflussendes optisches Element vorgesehen ist.4. Arrangement according to one of the preceding claims, being in the excitation beam path in front of the element and / or in Detection beam path after the element for improved separation of the Light components at least one optical element influencing the direction of light is provided. 5. Anordnung nach einem der vorangehenden Ansprüche, mit einem AOTF als lichtbeugendes Element.5. Arrangement according to one of the preceding claims, with an AOTF as a light diffractive element. 6. Anordnung nach einem der vorangehenden Ansprüche, mit einem Reflexionselement als optisches Element6. Arrangement according to one of the preceding claims, with a reflection element as an optical element 7. Anordnung nach einem der vorangehenden Ansprüche, mit einem lichtbrechenden Element als optisches Element.7. Arrangement according to one of the preceding claims, with a refractive element as an optical element.
DE1998159314 1998-12-22 1998-12-22 Light diffraction device for separating excitation and emission light in confocal microscope e.g. laser scanning microscope, uses at least one diffraction element for diffraction of selected wavelength of excitation light Withdrawn DE19859314A1 (en)

Priority Applications (10)

Application Number Priority Date Filing Date Title
DE1998159314 DE19859314A1 (en) 1998-12-22 1998-12-22 Light diffraction device for separating excitation and emission light in confocal microscope e.g. laser scanning microscope, uses at least one diffraction element for diffraction of selected wavelength of excitation light
DE19936573A DE19936573A1 (en) 1998-12-22 1999-08-03 Arrangement for the separation of excitation and emission light in a microscope
HK01108690.5A HK1038797B (en) 1998-12-22 1999-12-22 Arrangement for separation excitation light and emission light in a microscope
EP05012775.2A EP1591825B2 (en) 1998-12-22 1999-12-22 Device for coupling light into the light path of a micropscope
DE59912534T DE59912534D1 (en) 1998-12-22 1999-12-22 ARRANGEMENT FOR SEPARATING ATTACHING AND EMISSION LIGHT IN A MICROSCOPE
PCT/EP1999/010262 WO2000037985A2 (en) 1998-12-22 1999-12-22 Arrangement for separating excitation light and emission light in a microscope
DE59915074T DE59915074D1 (en) 1998-12-22 1999-12-22 Device for coupling light into a beam path of a microscope
EP99964647A EP1141763B2 (en) 1998-12-22 1999-12-22 Arrangement for separating excitation light and emission light in a microscope
JP2000589988A JP4532745B2 (en) 1998-12-22 1999-12-22 Separation structure of excitation light and emission light in microscope
US09/857,205 US7009763B1 (en) 1998-12-22 1999-12-22 Arrangement for separating excitation light and emission light in a microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE1998159314 DE19859314A1 (en) 1998-12-22 1998-12-22 Light diffraction device for separating excitation and emission light in confocal microscope e.g. laser scanning microscope, uses at least one diffraction element for diffraction of selected wavelength of excitation light

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DE19859314A1 true DE19859314A1 (en) 2000-06-29

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DE1998159314 Withdrawn DE19859314A1 (en) 1998-12-22 1998-12-22 Light diffraction device for separating excitation and emission light in confocal microscope e.g. laser scanning microscope, uses at least one diffraction element for diffraction of selected wavelength of excitation light

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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1281997A3 (en) * 2001-07-30 2004-02-04 Leica Microsystems Heidelberg GmbH Scanning microscope and optical element
DE10038526B4 (en) * 2000-08-08 2004-09-02 Carl Zeiss Jena Gmbh Method and arrangement for recording the wavelength-dependent behavior of an illuminated sample
WO2005010590A1 (en) * 2003-07-26 2005-02-03 Leica Microsystems Heidelberg Gmbh Scanning microscope
DE10137158B4 (en) * 2001-07-30 2005-08-04 Leica Microsystems Heidelberg Gmbh Method for scanning microscopy and scanning microscope
US6967764B2 (en) 2001-07-30 2005-11-22 Leica Microsystems Heidelberg Gmbh Optical arrangement and scan microscope
WO2008043459A3 (en) * 2006-10-06 2008-07-10 Zeiss Carl Microimaging Gmbh System for detection light division
US7420674B2 (en) 2002-05-16 2008-09-02 Carl Zeiss Microimaging Gmbh Method and arrangement for analyzing samples

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5422712A (en) * 1992-04-01 1995-06-06 Toa Medical Electronics Co., Ltd. Apparatus for measuring fluorescent spectra of particles in a flow
DE19510102C1 (en) * 1995-03-20 1996-10-02 Rainer Dr Uhl Confocal fluorescence microscope

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5422712A (en) * 1992-04-01 1995-06-06 Toa Medical Electronics Co., Ltd. Apparatus for measuring fluorescent spectra of particles in a flow
DE19510102C1 (en) * 1995-03-20 1996-10-02 Rainer Dr Uhl Confocal fluorescence microscope

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10038526B4 (en) * 2000-08-08 2004-09-02 Carl Zeiss Jena Gmbh Method and arrangement for recording the wavelength-dependent behavior of an illuminated sample
EP1281997A3 (en) * 2001-07-30 2004-02-04 Leica Microsystems Heidelberg GmbH Scanning microscope and optical element
US6850358B2 (en) 2001-07-30 2005-02-01 Leica Microsystems Heidelberg Gmbh Scanning microscope and optical element
DE10137158B4 (en) * 2001-07-30 2005-08-04 Leica Microsystems Heidelberg Gmbh Method for scanning microscopy and scanning microscope
US6958858B2 (en) 2001-07-30 2005-10-25 Leica Microsystems Heidelberg Gmbh Method for scanning microscopy; and scanning microscope
US6967764B2 (en) 2001-07-30 2005-11-22 Leica Microsystems Heidelberg Gmbh Optical arrangement and scan microscope
US7016101B2 (en) 2001-07-30 2006-03-21 Leica Microsystems Heidelberg Gmbh Scanning microscope and optical element
US7420674B2 (en) 2002-05-16 2008-09-02 Carl Zeiss Microimaging Gmbh Method and arrangement for analyzing samples
WO2005010590A1 (en) * 2003-07-26 2005-02-03 Leica Microsystems Heidelberg Gmbh Scanning microscope
WO2008043459A3 (en) * 2006-10-06 2008-07-10 Zeiss Carl Microimaging Gmbh System for detection light division

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