DE19813872C2 - Optical storage device - Google Patents

Abstract

A division test write processing unit is provided, and a test write process for setting an optimum light emission energy by performing test write on a medium is divided into a plurality of division test write processes. When an upper command is received, in the division test write processing unit, a division control unit jumps to a division execution unit, which is located at the head of the processes that have not yet been executed, among a plurality of division execution units and enables that Division processes of test writing are carried out for a predetermined time.

Description

BACKGROUND OF THE INVENTION

The invention relates to an optical storage device device in which a removable medium, such as a magneto optical cassette, an optical disc of phase change type, a DVD-RAM or the like, is used, and in particular an optical storage device for performing a close handles a command, taking optimal light emission energy through a test letter on a medium at the emp starting a host command.

An optical disk emerged as a storage medium lifted, which serves as a multimedia core, and that in the developed rapidly in recent years. For example, in recent years in the case of a 3.5 inch MO cassette, in addition to a conventional 128 MB medium, also a 540 MB or 640 MB medium with high-density recording posed. With the MO cassette, which is in an optical disk drive is used, a ZCAV recording (on drawing with zone constant angular velocity) sets, where a media track is divided into zones, and the Number of sectors in each zone is set equal. The 128 MB medium uses the recording method of a Pit position modulation (PPM). It is sufficient that the light emission energy in three stages of a reading energy, erase energy and recording energy. The 230 MB, 540 MB and 640 MB media, on the other hand, use this Pulse Width Modulation (PWM) recording method, to increase the recording density. At the PWM recording It is necessary to reduce the light emission energy in four Levels of reading energy, erasing energy, a first Writing energy and a second writing energy change. In the PWM recording of a medium of the type that one  corresponds to direct overwriting, the delete operation is not necessary, it is necessary to emit the light sion energy in four stages of reading energy, an auxiliary energy, the first writing energy and the second writing change energy.

In the high density recording medium such as 540 MB or 640 MB where PWM recording is performed however, the scope of optimal writing energy is one Narrow laser diode used for media recording becomes. When the temperature of the medium changes, it changes the optimal writing energy. The optimal writer The technology also changes depending on the manufacturing conditions conditions of the medium or a difference in writing performance of the optical disk drive. That is, in the case of the up drawing by a predetermined writing energy, the was determined without conditions in a training level, the writing energy differs greatly from the actual opti paint writing energy, and a case occurs where the Recording operation cannot be performed so that the problem arises that the writing and reading deteriorate.

From US 5513166 A is an optical storage device with a unit for adjusting the light emission energy of a Laser diode known. However, this device has the after Share on that the test letter is on a schedule in advance given time intervals.

SUMMARY OF THE INVENTION

According to the invention, an optical storage device device provided, which is constructed such that, even if a difference in device performance or manufacture conditions of the media, or if the Device temperature changes, always an optimal write energy can be put, and that further, even if it it takes a long time until a process has the optimal energy sets, no error due to a time error for an upper one Device occurs.

An optical storage device of the invention is used  a test letter to get the optimal writing energy put. The test writing is such a process that before starting the recording operation in a non-loading user area (test area) on a medium, a test pattern is recorded, changing a writing energy, and after that the test pattern is reproduced, an error rate by comparing data is obtained a write energy at which the error rate is minimal found and such energy as optimal writing energy is used for erasing and writing. The execution of the Test writing is done at the time when a Write command is generated by the upper device when it is determined that since the previous test cry elapsed time or a change in temperature has exceeded the specific value, or the like. If that Test writing, however, executed in such a state becomes that the device temperature changes significantly, and the optimal writing energy from the default writer deviates fairly by an initial setting was set because the optimal energy through the change sel from the default energy to a predetermined energy is searched at a time it takes a very long time until the optimal writing energy is found so that the Case occurs where the upper device has a timing error for command execution is determined and a device error occurs on.

An optical storage device of the invention comprises:
a light emission energy setting unit for setting a light emission energy of a laser diode used for recording and reproducing a medium; and
a split test write processing unit for dividing a test write process to set an optimum light emission energy by performing a test write on the medium into a plurality of processes, and for sequentially executing the split processes each time an upper command is received. By the division test write process as mentioned above, a series of test write processes accompanied by the erase, write and read operations (the medium of the type corresponding to the direct overwrite in which the erase operation is not necessary is the test write process for writing and reading) when the upper command is received, divided into a plurality of processing stages and executed sequentially. Even if the device temperature changes rapidly, and the optimal energy differs significantly from the default energy that was initially set, and it takes a long time to complete the test write operation to find the optimal energy as the processes are distributed and executed, there is no timing error for the above command, and the recording and reproducing operations can be performed as much as possible even if the energy deviates from the optimal energy, so that the performance of the device is improved.

The division test write processing unit includes a division execution unit and a division control unit. The division execution unit shares the test writing process in a variety of processes and executes them out. When receiving the upper command, the Tei discriminates control unit the need for test writing. If it is determined that test writing is required, the division control unit jumps to the head of the unausge performed processes in the division execution unit and he allows the division process of the test write operation is executed for a predetermined time. Each times when one of the split execution processes ends the division control unit secures the processed one  Number and a processing result. If since then Start of the division process elapsed time is shorter than a predetermined time, the processing routine goes to next division process. When a predetermined time elapses deletes, the division control unit interrupts the processes and waits for the next command above. If they have been the previous division process by the division execution unit passed up to the current division process Time is longer than a predetermined time, raises the Tei Control unit the processed numbers and processing results up to the previous time, and leads again the division processes from the beginning. If the Interruption time of the division process becomes too long a case where the optimal energy due to the tempera door change or the like. fluctuates during the interruption time iert. In this case, a more accurate optimal energy is ge found by running the processes again from the beginning become.

The division execution unit is constructed, for example, from:
a first division execution unit for setting a predetermined initial light emission energy (default value) at the first time and setting a light emission energy obtained by changing the initial light emission energy by each predetermined value at the second and subsequent times;
a second division execution unit for deleting a test area of a medium by the set light emission energy;
a third division execution unit for writing a predetermined test pattern in the deleted test area;
a fourth division execution unit for reading out the test pattern written in the test area; and
a fifth division execution unit for setting the number of times of data mismatch (error rate) by comparing the test pattern with the read pattern, and calculating the optimal light emission energy based on the number of times of mismatch performed by the test write operations Plurality of times is obtained from the first to fourth division execution units.

In this case, as with the direct overwrite type medium where the erase operation is not required, the division execution unit is constructed from:
a first division execution unit for setting a predetermined initial light emission energy (default value) at the first time and setting a light emission energy obtained by changing the initial light emission energy by each predetermined value at the next and subsequent times;
a third division execution unit for writing a predetermined test pattern in a test area;
a fourth division execution unit for reading out the test pattern written in the test area; and
a fifth division execution unit for determining the number of times of data mismatch (error rate) by comparing the test pattern with the read pattern, and calculating an optimal light emission energy based on the number of times of mismatch performed by the test write operations Plurality of times is obtained from the first to fourth division execution units.

The division control unit has a timing control unit for controlling by discriminating whether the division test writing process  is carried out or not the basis of the start time setting that has been predetermined device elapsed time. In this case as a start time setting, in addition to the time setting, if the medium is loaded into the device, also one Recovery time setting from a sleep mode, in a servo unit and a spindle motor are stopped, and the like. The timing control unit works effective for a period of time until the start time setting elapsed time, like loading the me diums or the like. reaches a predetermined time, whereby controlled a plurality of division execution units becomes. That is, a temperature in the device rises rapidly, and a distribution of internal temperatures will fairly uneven over a period of time, until about Two to three minutes elapse after the medium is closed was loaded together with the switching on of the device, so that the device is in a state in which a detection value of the temperature sensor is not guaranteed can be. Hence the need for test writing discriminated based on elapsed time so that if the time elapsed since the media was loaded is short, the test writing is carried out at high frequency and when the elapsed time becomes long and the tem temperature becomes stable, the frequency of the test letter redu is decorated. That is, the timing control unit sets the optimal light emission energy by performing a Large number of test writing processes through the first upper command, and also sets a valid time Tv, when it is unnecessary, the optimal light emission energy the base of the elapsed time at that time len. After the first time, the timing control inhibits unit a division test letter for the upper command,  until a predetermined lead time of the valid time Tv passes and leads to the division test letter according to the above command for a period of time up to at the valid time Tv from the predetermined lead time out. The timing control unit sets the valid time Tv, so that they are gradually proportional to since the start time setting elapsed time extended. The time run control unit inhibits test writing for a Time zone that is shorter than, for example, 90% of the valid one time and allows test writing for a time zone, that exceeds 90% of the valid time. If the past time the valid time Tv during the execution stage of the division test letter exceeds as the possible There is a fact that the optimal energy deviates significantly, in this case, the timing control unit does that remaining division test letters by a flat rate next command above.

On the other hand, the division control unit has a temp raturenderungs control unit for control by the crime kidney whether the division test write process is executed or not, based on a change in device temperature. The temperature change control unit is working thereafter for a predetermined time during which the Timing control unit works, for example, lapsed Chen 160 seconds from the start time setting of the device tion, and the temperature of the device becomes stable. The Temperature change control unit detects the temperature in the device at any predetermined time and when a temperature difference between the previous detec tion temperature and the current temperature certain temperature exceeds, for example 3 ° C, ge it allows the division process to be carried out. If the temperature difference is an upper limit temperature, for example  4 ° C, which is higher than the predetermined temperature temperature of 3 ° C, during the interruption of the division pro exceeds zesses, there is a possibility that the optimal energy changes greatly. In this case allowed hence the temperature change control unit of the division Execution unit to carry out the division processes at a flat rate to lead. If the temperature difference between the previous existing and the current division process a predetermined Temperature, for example 2 ° C, during the division processes through the division execution unit the possibility that the interruption time in the division stood too long, and the optimal energy clearly changes. Therefore, the temperature change control unit lifts the processed numbers and processing results up to previous time, and he leads the division processes from the beginning.

According to the invention, a medium is in a variety of Areas divided in the radial direction, for example into an inner border area, an intermediate area and an outer edge area, and the processes are controlled by the Division test write processing unit and the division Control unit for each area executed independently. This is due to the fact that the CAV for the rotation Control of the medium is used, and peripheral Ge speeds in the radial direction of the medium below divide, so that laser energy for heating the Differentiate medium. Therefore, the optimal energy of each Found by placing the medium in three Areas is shared, and the sharing write test for each area runs independently. Since the medium in a plurality of zones divided in the radial direction is a multitude of zones in groups for each lot number of zones divided in the radial direction, whereby  a division into a variety of areas. The Processes by the division test write processing unit and the division control unit become independent for everyone Area executed.

Furthermore, it is according to a further embodiment of the Invention also possible, the division test writing processes by the division test write processing unit in About in accordance with a predetermined schedule of a ver elapsed time without dependence on an upper command to execute sequentially. If a change in temperature occurs predetermined value or above occurs, it is excluded possible, the division test writing processes by the Tei development test write processing unit without dependence on execute the above command.

The above and other tasks, features and advantages The present invention is illustrated by the following detail lated description with reference to the drawings easier to understand.

BRIEF DESCRIPTION OF THE DRAWINGS

Fig. 1A and 1B are block diagrams of an optical disk drive according to the invention;

Fig. 2 is an explanatory view of an internal structure of an apparatus in which an MO cassette has been loaded;

Fig. 3 is a block diagram of a laser diode control circuit in Figs. 1A and 1B;

FIGS. 4A to 4J are timing charts of signals, light emission currents, Subtraktionsströmen and surveil a monitoring current through the PWM recording of the invention in a medium of which speaks to a direct overwriting ent;

Fig. 5A to 5J are time charts of signals, light emission currents Subtraktionsströmen and surveil a monitoring current through the PPM recording of the invention in the medium of the type corresponding to a direct overwriting;

FIGS. 6A and 6B are functional block diagrams of a test writing process of the invention, which is performed by an MPU in Fig. 1;

FIGS. 7A and 7B are explanatory views of the test writing process of the invention in accordance with a schedule, after the medium has been loaded;

Fig. 8 is an explanatory diagram of a table for setting the valid time used for the test writing process of the invention;

Fig. 9 is a graphical representation of light emission energies and the number of errors obtained by a split test write process to calculate an optimal light emission energy of the invention;

Fig. 10 is an explanatory diagram of a default erasing energy table in Fig. 6;

Fig. 11 is an explanatory diagram of a default write energy table in Fig. 6;

Fig. 12 is an explanatory diagram of a temperature correction coefficient table in Fig. 6;

Fig. 13 is a schematic flow diagram for the overall operation of the device including a split test write of the invention;

Fig. 14 is a flowchart for a valid time test write process for discriminating the need for test write based on a valid time in Fig. 13;

FIG. 15A and 15B are detailed flowcharts for the division test writing process in Fig. 14;

FIG. 16A and 16B are detailed flowcharts for the division test writing process in Fig 14, which follow Figure 15B..;

Fig. 17 is a flowchart for an optimum energy calculation process in Figs. 16A and 16B;

FIG. 18A and 18B are flowcharts for a shown batch test writing process by extracting a proces beitungsteils in a case where a batch execution flag in the division test write process of FIG 15A, 15B, 16A and 16b is turned on. and

FIG. 19 is a flowchart for a temperature change test writing process for discriminating the necessity of test writing based on a temperature change in FIG. 13.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT Device construction

FIGS. 1A and 1B are circuit block diagrams dung an optical disk drive as an optical storage apparatus of the OF INVENTION. The optical disk drive of the invention is constructed from a control unit 10 and an enclosure 12 . The control unit 10 has: an MPU 14 for performing the entire control of the optical disk drive; an interface controller 16 for sending and receiving commands and data to an upper device; an optical disk controller (ODC) 18 having functions of a formatter and an ECC necessary to read / write data from an optical disk medium; and a buffer memory 20 . An encoder 22 and a laser diode control circuit 24 are provided as a writing system for the optical disk controller 18 . A control output of the laser diode control circuit 24 is supplied to a laser diode unit 30 which is provided on the side of the envelope 12 . The laser diode unit 30 contains an integrated laser diode and a light-sensing arrangement for monitoring. As the optical disk for recording and reproducing using the laser diode unit 30 , that is, as a removable MO cassette medium, any MO cassette medium of 128MB, 230MB, 540MB and 640MB, and also direct transfer type media can be used writing corresponds, with 540 MB and 640 MB in the embodiment. With respect to the 128MB MO cassette medium among them, a pit position record (PPM record) is used to record data according to the presence or absence of a mark on the medium. A recording format of the medium is based on the ZCAV and is set to one zone in the case of the 128 MB medium and to ten zones in the case of the 230 MB medium. In contrast, with respect to the MO cassette medium with 230 MB, 540 MB and 640 MB, pulse width recording (PWM recording) is used in which edges of a marking, namely the front and rear edges of a marking, are to correspond to data. The PWM recording is also called marker recording or edge recording. A difference between the storage capacities of 640 MB and 540 MB is caused by a difference in the sector capacities. If the sector capacity is 2 kB, the storage capacity is 640 MB. On the other hand, when the sector capacity is 512 B, the storage capacity is 540 MB. The recording format of the medium is based on the ZCAV and is set to 10 zones in the case of the 230 MB medium, to 11 zones in the case of the 640 MB medium and to 18 zones in the case of the 540 MB medium. As indicated above, the optical disk drive of the invention can accommodate the MO cartridges with storage capacities of 128MB, 230MB, 540MB and 640MB, as well as the direct overwrite type media cartridges. Therefore, when an MO cartridge is loaded into the optical disk drive, an ID region of the medium is first read, the type of the medium is recognized by the MPU 14 from the pit interval, and the recognition result is sent to the optical disk controller 18 transmitted. Accordingly, in the case of the 128MB or 230MB medium, a formatting process corresponding to the PPM record is carried out. In the case of the 540 MB or 640 MB medium, a formatting process according to the PWM recording is carried out.

As a reading system for the optical disk controller 18 , a decoder 26 and a read LSI circuit 28 are seen easily. A light sensing signal of a reflected light of a beam from the laser diode 30 , which is received by a detector 32 provided for the cladding 12 , is sent as an ID signal and an MO signal to the read LSI circuit 28 via a head amplifier 34 entered. The read LSI circuit 28 has circuit functions of an AGC circuit, a filter, a sector mark detection circuit, a synthesizer, a PLL, and the like. The read LSI circuit 28 forms a read clock and read data from the input ID signal and MO signal, and outputs it to the decoder 26 . Since the ZCAV is used as a recording method of the medium by a spindle motor 40 , switching control of a clock frequency corresponding to a zone is performed by the MPU 14 for the synthesizer built in the read LSI circuit 28 . The modulation of the encoder 22 and the demodulation of the decoder 26 are switched for modulating and demodulating the PPM recording in the case of the 128 MB and 230 MB media in accordance with the media type recognized by the optical disk controller 18 . In the case of the 540 MB and 640 MB media, they are switched to modulate and demodulate the PWM recording. A detection signal from a temperature sensor 36 provided on the side of the casing 12 is fed to the MPU 14 . Based on an ambient temperature in the device detected by the temperature sensor 36 , the MPU 14 controls each of the light emission energies for reading, writing and erasing in the laser diode control circuit 24 to an optimal value. As a controller for optimizing the light emission energies in the invention, test writing is performed so that when an upper write command is received with respect to the 540MB and 640MB media, a test pattern is written in a test region of the medium, and after that, that is Test patterns are read out, and the optimal light emission energy is found by discriminating the number of errors. According to the invention, a division test write is carried out so that a test write is divided for each group of steps when the upper write command is received, division processes are executed sequentially when an execution time exceeds a predetermined time, the division processes are interrupted, and when the upper write command is subsequently received, the division process of the test write is carried out from the interrupted step. Furthermore, the MPU 14 controls the spindle motor 40 , which is seen on the side of the casing 12 , by a driver 38 . Since the recording format of the MO cassette is ZCAV, the spindle motor 40 is rotated at a constant speed of, for example, 3600 rpm. The MPU 14 also controls an electric magnet 44 , which is provided on the side of the casing 12 , via a driver 42nd The electromagnet 44 is arranged on the side opposite to the side of the radiation of the MO cassette loaded in the device, and applies an external magnetic field to the medium in the recording and erasing mode. A DSP 15 performs a servo function for positioning the beam from the laser diode 30 to the medium. For this purpose, a 4-split detector 46 is provided for receiving a beam mode light from the medium for the optical unit on the envelope 12 side, and an FES detection circuit (focus error signal detection circuit) 48 forms a focus error signal E1 from the light sensing outputs of the 4-split Detector 46 , and there in the DSP 15 . A TES detection circuit (tracking error signal detection circuit) 50 forms a tracking error signal E2 from the light sensing outputs of the 4-divided detector 46 , and inputs it to the DSP 15 . The tracking error signal E2 is input to a TZC (track zero crossing detection circuit) 45 , and a track zero crossing pulse E3 is formed and input to the DSP 15 . Further, a lens position sensor 52 for detecting a position of an objective lens for irradiating the laser beam onto the medium on the case 12 side is provided, and a lens position detection signal (LPOS) E4 of the lens position sensor 52 is input to the DSP 15 . The DSP 15 drives a focus actuator 56 , a lens actuator 60 and a VCM 64 via drivers 54 , 58 and 62 for the purpose of beam positioning.

Fig. 2 shows schematically the enclosure in the optical disk drive. The spindle motor 40 is provided in a housing 66 . By inserting an MO cassette 70 from the side of an inlet door 68 into a hub of a shaft of the spin delmotors 40 , loading is performed such that an MO medium 72 in the MO cassette 70 is attached to the hub of the shaft of the spindle motor 40 becomes. A carriage 76 , which can be moved in the direction traversing the media tracks by the VCM 64 , is provided below the MO medium 72 of the loaded MO cassette 70 . An objective lens 80 is mounted on the carriage 76 , and a beam from a semiconductor laser intended for a fixed optical system 78 enters the objective lens 80 through a prism 82 , thereby forming a beam spot on the surface of the MO medium 72 . The objective lens 80 is moved in the direction of the optical axis by the focus actuator 56 shown in the envelope 12 in FIG. 1, and can also be moved by the lens actuator 60 in a radial direction that traverses the media tracks within a range of example some 10 tracks can be moved. The position of the objective lens 80 mounted on the carriage 76 is detected by the lens position sensor 52 in FIG. 1. The lens position sensor 52 sets the lens position detection signal to "0" at a neutral position where the optical axis of the objective lens 80 is directed upward, and generates the lens position signal E4 according to movement amounts with different polarities for the movement to the outside and the movement to Inside.

LD light emission control

Fig. 3 is a circuit block diagram of the laser diode control circuit 24 provided for the control unit 10 in Figs. 1A and 1B, and shows an MO cartridge medium which requires the erase operation before the write operation as an example. As for a medium of the direct overwrite type where the erase operation is not necessary, an erase energy of the MO cartridge is replaced with an auxiliary energy to increase the increasing speed of a write energy in the case of the direct overwrite operation. In the laser diode unit 30 , a laser diode 100 and a monitoring photodiode 102 are provided integrally. The laser diode 100 receives a driving current I through an energy voltage Vcc and emits light. A laser beam is formed and irradiated onto the media surface by the optical unit, and the recording and reproducing operations are performed. The monitoring photodiode 102 receives part of the light from the laser diode 100 and outputs a light sensing current 10 that is proportional to the light emission energy of the laser diode 100 . A read energy current source 104 , a write energy current source 106 , a first write energy current source 108 and a second write energy current source 110 are connected in parallel with the laser diode 100 and carry a read energy current I0, a delete energy current I1, a first write energy Current I2 or a third write energy current I3. That is, the read energy current I0 flows at the time of the read energy light emission, a current (I0 + I1) obtained by adding the erase energy current I1 with the read energy current I0 flows at the time of the erase energy light emission, and a current (I0 + I1 + I2) obtained by further adding the first write energy 12 to the current (I0 + I1) flows at the time of the first write energy light emission. A current (I0 + I1 + I3) obtained by adding the second write energy current I3 with the read energy current I0 and the erase energy current I1 flows at the time of the second write energy light emission. An automatic power control unit (hereinafter referred to as "APC") 138 is provided for the reading power source 104 . A specified target reading energy is set as the target energy in the APC 138 via a target DAC register 120 and a D / A converter (hereinafter referred to as "DAC"). An EP stream DAC register 122 and a DAC 140 are provided as an EP stream instruction unit for the extinguishing power source 106 . A WP1 current DAC register 124 and a DAC 142 are provided as the WP1 current instruction unit for the first write energy current source 108 . Furthermore, a WP2 current DAC register 126 and a DAC 144 are provided as a WP2 current instruction unit for the second write energy current source 110 . Accordingly, the currents of the current sources 104 , 106 , 108 and 110 can be changed appropriately by setting DAC instruction values in the respective registers 120 , 122 , 124 and 126 , respectively. A light emission power source circuit is formed from the registers, DACs and constant current sources. The APC 138 performs a feedback control so that a monitoring current im, which is obtained from the light sensing current i0 of the photodiode 102 , coincides with the target voltage of the DAC 136 , which corresponds to the target reading energy. For this purpose, subtraction current sources 112 , 114 and 116 are provided for the monitoring photodiode 102 in order to subtract the light sensing currents when the light is emitted by the erasing energy and by the first and second writing energy, which exceed the reading energy, and by the monitoring current im , which corresponds to the reading energy, to the APC. An arbitrary subtraction stream i1 can be set in the subtraction stream source 112 for the erase energy by an EP subtraction DAC register 128 and a DAC 146 , which serve as an EP subtraction stream instruction unit. An arbitrary subtraction stream 12 may be set in the subtraction stream source 114 for the first write energy by a WP1 subtraction DAC register 130 and a DAC 148 , which serve as a WP1 subtraction stream instruction unit. Furthermore, an arbitrary subtraction current i3 can also be set in the subtraction current source 116 for the second write energy by a WP2 subtraction DAC register 132 and a DAC 150 , which serve as a WP2 subtraction current instruction unit. The monitor currents in the light emission modes of the above three subtraction current sources i1, i2 and i3 are as follows.

• A) At the time of reading energy light emission:
  im = i0
  
• B) At the time of the extinguishing energy light emission:
  im = i0 - i1
• C) At the time of the first writing energy light emission:
  im = i0 - (i1 + i2)
• D) At the time of the second writing energy light emission:
  im = i0 - (i1 + i3)

Accordingly, at the time of light emission by any one of the erasing energy, the first writing energy and the second writing energy which the target reading energy exceeds, by subtracting the corresponding subtraction current from the light sensing current i0, the monitoring current im as a current corresponding to the reading energy becomes an objection Stand 118 led to detect a monitoring voltage, and is returned to the APC 138 . The APC 138 therefore controls the read energy power source 104 to always maintain the target read energy regardless of the type of light emission energy, thereby performing the automatic energy control of the specified erase energy, first write energy and second write energy. Also with respect to the subtraction current, a subtraction current source circuit is formed by the registers, DACs and constant current sources. A monitor voltage by the monitor voltage detection resistor 118 , which corresponds to the monitor current im, is converted into digital data by an A / D converter (hereinafter referred to as "ADC") 152 . After the digital data have been entered into a monitoring ADC register 134 , they are read out to the MPU 14 side. The ADC 152 and the monitoring ADC register 134 accordingly form a measuring unit of the monitoring current in the.

Figure 3 shows the MO cartridge which requires the erase operation as an example. In the case of a cassette medium of the direct overwrite type, PWM recording adds a first write energy WP1 and a second write energy WP2 with an energy (RP + AP) obtained by adding an auxiliary energy AP to a read energy RP becomes. In the PPM recording, the first write energy WP1 is added to the energy (RP + AP) which is obtained by adding the auxiliary energy AP to the read energy RP. Accordingly, it is sufficient that the registers 124 and 128 , the DACs 142 and 146 and the current sources 110 and 112 for an erasing energy EP in FIG. 3 are replaced for those for the auxiliary energy AP. It is clear that registers, DACs and power sources that are used exclusively for auxiliary energy can also be added.

FIGS. 4A to 4J are timing charts for signals of the PWM recording, the light emission current and the subtraction current in the laser diode control circuit 24 in Fig. 3, and show the 540 MB or 640 MB cartridge medium of the type corresponding to a direct overwriting, wherein the delete operation is not necessary as an example. Assuming that write data of Fig. 4B was supplied in synchronism with a write gate of Fig. 4A, the write data is now converted to pulse width data of Fig. 4D in synchronism with a write clock of Fig. 4C. Based on the pulse width data, an auxiliary pulse as shown in FIG. 4E is generated, and further a first write pulse as shown in FIG. 4F is generated. A second write pulse of Fig. 4G is also generated. The second write pulse has a pulse number according to the pulse width of the pulse width data of Fig. 4D. For example, the head pulse width data has a pulse width of four clocks, the next pulse width data has a pulse width of two clocks, and the following pulse width data has a pulse width of three clocks. Accordingly, the second write pulse of FIG. 4G generates two pulses with respect to the width of four clocks of the header data after the first write pulse of FIG. 4F, generates a zero pulse with respect to the next width of two clocks, and generates a pulse with respect to to the third pulse width of three clocks, whereby information indicating the pulse width is recorded. FIG. 4H shows the light emission currents and energies based on the auxiliary pulse of FIG. 4E, first write pulse of FIG. 4F and second write pulse of FIG. 4G. A read current is always supplied, and DC light emission is made by the read energy RP. Accordingly, a light emission current (I0 + I1) flows in synchronism with the auxiliary pulse, so that the current is increased by an amount corresponding to the auxiliary power AP. The light emission current I2 is added to the time setting of the first write pulse, so that the current is increased by an amount which corresponds to the first write energy WP1. Furthermore, the light emission current I3 is added to the time setting of the second write pulse (I0 + I1 + I3), so that the current is increased by an amount which corresponds to the second write energy WP2. In synchronization with the light emission current of Fig. 4H flows a subtraction current of Fig. 4I in the subtraction current sources 112, 114 and 116 in Fig. 3. That is, it flows the subtraction current i1, the energy of the increased amount of the auxiliary AP corresponds. The subtraction current i2, which corresponds to the increased amount of the next first write energy WP1, is added, and a received subtraction current (i1 + i2) flows. Furthermore, the subtraction current i3, which corresponds to the increased amount of the second write energy WP2, is added, and a received subtraction current (i1 + i3) flows. The monitoring current im of FIG. 4J is a value obtained by subtracting the subtraction current of FIG. 4H from the light sensing current i0, which corresponds to the light emission current and the light emission energy of FIG. 4H, and is always in a constant current, which is the reading energy corresponds, even during the light emission, and the constant current is fed back to the APC 138 .

Fig. 5A to 5J are time charts for signals, light emission streams, stream the subtraction current, and monitoring if the PPM recording at the 540 MB or 640 MB Me dium type corresponding to a direct overwrite is performed as an example. Assuming that write data of FIG. 5B was supplied in synchronism with a write gate of FIG. 5A, pulse width data of FIG. 5D are now formed in synchronism with a write clock of FIG. 5C. Corresponding to the pulse width data, an auxiliary pulse of Fig. 5E and a first write pulse of Fig. 5F are generated. A second write pulse of Fig. 5G is not used in the PPM recording. By supplying a light. 5H emission current of Fig through the auxiliary pulse and the first writing pulse to the laser diode, a Lichtemis sion power P can be obtained. In the PPM recording, an energy (PR + AP) is obtained by adding the auxiliary energy AP with the reading energy RP to set the time of the auxiliary pulse. In this case, the auxiliary energy AP is set to the reading energy RP itself (AP = RP), so that the light emission by the reading energy RP from the reading energy current I0 is maintained even for the time setting of the auxiliary pulse. To set the time of the first write pulse, the light emission current is increased only by an amount of (I1 + I2), and an energy is used which is obtained by adding an amount of the auxiliary energy AP to an amount of the first write energy WP1. A subtraction current (i1 + i2) of FIG. 51 is used to set the light emission time of the first write pulse. The monitoring current in FIG. 5J is therefore always kept at a current which is equivalent to the light-sensing current of the reading energy.

Division test writing process

FIGS. 6A and 6B are functional block diagrams of a Tei lungs test writing process according to the invention, which is run by the MPU 14 in the optical disk drive in Fig. 1A and 1B through. A division test write processing unit 160 is constructed from a division control unit 162 and a division execution unit 173 . The division control unit 162 discriminates the need for the test write process when a write command is received from the upper device. When the test write process is necessary, the division execution unit 173 is started and allowed to perform the test write process. There are the following two processes for determining the need for test writing by the division control unit 162 .

• A) Determine the need for test writing the basis of the time elapsed since the medium was loaded,
• B) Determining the need for test writing based on a change in temperature in the device that is detected by temperature sensor 36 in FIG. 1.

To determine the need for the two types of test writing, the division control unit 162 has a timing control unit 164 and a temperature change control unit 166 . The timing test unit 164 and the temperature change control unit 166 determine the need for the test write as shown in the schedule of FIG. 7A.

Fig. 7A shows the schedule when the media cartridge is loaded into the optical disk drive. A period of time required, for example, 160 seconds to elapse from loading the medium, is set to a valid time test write processing period 204 to determine the need for test write by the timing controller 164 . With respect to the time after 160 seconds, when the valid time test write processing period 204 has passed, the schedule is switched from the temperature change control unit 166 to a temperature change test write processing period 206 . The valid time test write processing period 204 is started from the time setting of loading the medium into the optical disk drive. The time elapsed since the media was loaded is measured by a timing timer 170 provided in the division control unit 162 in Figs. 6A and 6B. The time measured by the time-out timer 170 is expressed by an elapsed time A. When the medium in Fig. 7A is loaded, a first write command is issued from the upper device. In response to the first write command, the timing controller 164 in the division control unit 162 turns on a batch execution flag for setting a batch process and a division process of the test write for the division execution unit 173 , and a batch test write process is executed. That is, in the invention, the test write process is divided into a plurality of execution units, which are sequentially performed every time the write command is received from the upper device. With respect to the first write command, however, since the optimum light emission energy is not obtained, the dividing process is not carried out, and the optimum light emission energy is found by the batch test writing. When the batch test writing is performed by the first command in Fig. 7A and the optimal light emission energy is determined, a valid time Tv becomes, in which the optimal light emission energy determined by the batch test writing can be validly used , set in accordance with the elapsed time A measured by the time-out timer 170 at that time. The relationship of the valid time Tv to the elapsed time A is set by a valid time table 168 .

Fig. 8 shows an example of valid period table 168 in FIG. 6A and 6B. The valid time Tv is set so that the longer the elapsed time, the longer it is. For example, if the test light determines the optimal light emission energy within 0 to 19 seconds of the elapsed time A, the valid time Tv is set to 20 seconds. With respect to an elapsed time of 20 to 39 seconds, the valid time is set to 40 seconds. With respect to an elapsed time of 40 to 59 seconds, Tv is set to 60 seconds. With respect to an elapsed time of 60 to 160 seconds, Tv is set to 160 seconds. That is, just after the optical disk drive power is turned on and the media cartridge is loaded, the temperature in the drive rises rapidly and the temperature distribution in the drive is not uniform. Therefore, when the elapsed time A is short, the test writing is often performed. If the elapsed time A is long, the valid time Tv is set to reduce the frequency of the test write, and the need for the test write is determined.

FIG. 7B is process a schedule for the division test writing, when a write command from the upper apparatus in the valid time test write processing period is collected emp 204 after the first optimum light emission power by the batch test writing on the basis of the first command in Figure . 7A was determined. At the time of completing the previous test writing process, the valid time Tv when the next test writing is necessary is set from the valid time table of FIG. 8 based on the elapsed time at that time. The timing controller 164 in FIGS . 6A and 6B sets 90% of the valid time Tv as the test write remaining period 208 . Even if the write command is received from the upper device for the test write remaining period 208 , the optimal light emission energy is validated by the previous test write process and the test write process is not executed. After the test write remaining period 208 , which is determined as 90% of the valid time, a valid division test write period 210 is set with a duration of 10% of the valid time, which is in a range from 90% to 100% of the valid period Tv is set. When the write command is received from the upper device in the valid division test write period 210 , the timing controller 164 turns off the batch execution flag, whereby the division test write process is executed by the division execution unit 173 . As shown by the division execution unit 173 in FIGS. 6A and 6B, the division test write process in the valid division test write period 210 is divided into five division processes sequentially by a first division execution unit 174 , a second division execution unit 176 , a third division execution unit 178 , a fourth division execution unit 180, and a fifth division execution unit 182 . The first division execution unit 174 sets a default value of the light emission energy as an initial value in order to obtain the optimal light emission energy. If the light emission energy is not obtained by the default value, the default value is updated. The default value is read out from a default erase / auxiliary power table 188 and a default writer table 190 provided for a light emission power setting unit 186 , and is set. Instead of the default delete / auxiliary energy table 188 , a default delete energy table and a default auxiliary energy table can also be provided individually, which are used exclusively. In the first division execution unit 174 , the correction of the default value by the temperature in the device, which is stored in a register group 184 when the default value is set, is carried out by reading out a temperature correction coefficient from a temperature correction coefficient table 192 , which is provided for the light emission energy setting unit 186 . As in setting the default value for determining the light emission energy for the test writing by the first division execution unit 174 , the test writing is performed, changing the default value for each predetermined default unit. Specifically, the test writing is carried out, and the light emission energy is changed in five stages from (default - 2), (default - 1), (default), (default + 1) and (default + 2). The second division execution unit 176 erases a test region of the medium by the light emission of the laser diode with an erasing energy set by the first division execution unit 174 . In the case of the medium of the direct overwrite type, the process of the second division execution unit 176 is skipped. The third division execution unit 178 drives the laser diode to emit light by the writing energy set by the first division execution unit 174 , thereby writing a predetermined test pattern in the erased test region. The fourth division execution unit 180 performs a process of reading out the test pattern written by the third division execution unit 178 . Further, the fifth division execution unit 182 compares a write pattern from the third division execution unit 178 with a read pattern of the fourth division execution unit 180 based on bit units, and determines the number of times of no match for the light emission energy at that time. In the division test writing processes by the first to fifth division execution units 174 to 182 , the processes in the five stages (-2, -1, 0, +1, +2) for the default value of the light emission energy by the first division Execution unit 174 is repeated, and the fifth division execution unit 182 determines the optimum light emission energy from the processing result. That is, in order to find the optimal light emission energy through a test writing process, it is necessary to repeat the division test writing of setting, deleting, writing, reading and comparing five times. Further, if the optimal light emission energy is not found even after the division test writing is repeated five times, the default value itself, which is initially set by the first division execution unit 174 , is updated to another value, the same processes are repeated, and the test writing is repeated until the optimal light emission energy is maintained.

FIG. 9 shows a measurement result obtained by the test write process to set the optimum light emission energy by the division execution unit 173 in FIG. 6, and it relates to the optimal light emission setting of the write energy as an example. Before the test writing, the first division execution unit 174 determines a target energy DWP, which is corrected by the device temperature at that time, and first sets a writing energy:

WP = DWP - 2,

which is 2 units lower than the default energy DWP. The erase operation by the second division execution unit 176 , the write operation of the test pattern by the third division execution unit 178, and the read operation by the fourth division execution unit 180 are performed. Furthermore, the number of times of mismatch between the write pattern and the read pattern is measured by the fifth division execution unit 182 . The number (E) times of mismatch in this case is equal to a point O and exceeds a threshold value Eth indicating the limit of the optimal light emission energy.

Then there is a writing energy

WP = DWP - 1,

where the default energy DWP is increased by the unit of -1, updated and set in the first division execution unit 174 . The erase operation by the second division execution unit 176 , the write operation of the test pattern by the third division execution unit 178 and the read operation by the fourth division execution unit 180 are performed. The number of times the bits do not match between the write pattern and the read pattern is measured by the fifth division execution unit 182 . In this case, the number of times of a mismatch is less than the threshold value Eth indicating the limit of the optimal light emission energy, such as a point P, and the writing energy (DWP-1) can be given as the optimal energy. Similarly, the writing energy WP is changed to 0, +1 and +2 for the default energy DWP, and the number of times of mismatch at this time is obtained as shown at the Q, R and S points. In this case, the number of times of mismatch at each of the points Q and R is less than the threshold Eth, and is in the range of the optimal light emission energy. At point S, the number of times a mismatch is greater than the threshold Eth, and is outside the range of the optimal light emission energy. If the number of times of mismatch in the test writing is obtained by setting the writing energy WP in five stages of (-2, -1, 0, +1, +2) for the default energy DWP, the average of the three points P, Q and R, which are smaller than the threshold value Eth, namely the writing energy WP = DWP at point Q, are determined as the optimal light emission energy. The characteristic of the number of times a mismatch due to the test writing for the writing energy WP is shifted to the right and to the left depending on the temperature in the device. That is, assuming that the device temperature is 25 ° C, the characteristic 212 , which is shown with a solid line, and at five measuring points O, P, Q, R and S is indicated by the test letter in is shifted in such a direction that the optimum writing energy is increased as shown by the broken line 214 when the device temperature drops to 10 ° C. On the other hand, when the device temperature rises to 55 ° C, the characteristic curve 212 is shifted in such a direction that the optimal light emission energy is reduced, as shown by the characteristic curve 216 , which is shown alternately with one long and two short dashes. As is clear from the characteristic curves 212 , 214 , 216 of the number of errors for the optimal light emission energy, which differs depending on the device temperature, it is clear that the optimal light emission energy at the time of the test writing fluctuates greatly due to the device temperature at this time. When the test writing is performed in a state where the optimal writing energy corresponding to the device temperature at that time is far from the default writing energy, for example, in a state like that of the characteristic curve 216 when the device temperature rises to 55 ° C , there is therefore a case where the optimal writing energy in test writing cannot be found in five stages (-2, -1, 0, +1, +2) of the writing energy for the preliminary energy DWP. It is therefore necessary to change the default energy DWP to DWP = DWP - 1, to change the writing energy WP to (-2, -1, 0, +1, +2) for the default energy after the correction, and to test cry ben to perform. Therefore, it is clear that if the device temperature changes greatly and the optimal energy deviates greatly from the specification, it will take quite a long time to find the optimal writing energy. Thus, it takes a fairly long time to find the optimal light emission energy and the device determines that the timing error for access by the upper device occurs, resulting in an error. According to the invention, however, as shown in the division execution unit 173 in Figs. 6A and 6B, the test writing becomes one by one until the erase, write, read and compare setting operations after the light emission energy is set, in five Processes shared and running. Until the optimal target energy is found after the completion of the division process, the device responds to an upper command by accessing the previous optimal light emission energy. Therefore, even if it takes a long time for the test writing to find the optimum light emission energy, such a situation can be surely prevented that the device determines the occurrence of the timing error for the above command and the error occurs.

In the temperature change control unit 166 provided for the division control unit 162 in Figs. 6A and 6B, as shown in the medium loading schedule in Fig. 7A, the need for test writing is related to the temperature change test write processing period 206 discriminates, which is set as the time period after the lapse of the valid time test write processing period 204 for 160 seconds. That is, the temperature change control unit 166 detects the device temperature at every maximum time, namely, Tv = 160 seconds of the valid time, which is determined, for example, by the end time of 160 seconds in the valid time test write processing period 204 in the temperature change test write processing period 206 is set, and calculates a temperature difference between the detected temperature and the previous detection temperature. If the temperature difference is greater than or equal to, for example, 3 ° C, it is determined that test writing is necessary. Each time the write command is received from the upper device as shown in FIG. 7A, the division processes of the first to fifth division execution units 174 to 182 provided for the division execution unit 173 are sequentially repeated. On the other hand, the division test writing process has an advantage, so that it is possible to prevent the situation that if it takes time to set the optimum light emission energy, the time error for the above command occurs and an error occurs. In contrast, if the interruption time period of the division process is so long, the device temperature changes greatly for such a long interruption time period, and there is a case where the results cannot be validly used until the previous division process. In the timing control unit 164 , therefore, as shown in FIG. 7B, with respect to the time period after the lapse of the valid division test write period 210 with a width of the valid time of 10% of the range from 90% to 100% of the valid time Tv, namely after the lapse of the valid time Tv, a batch test write period 211 is set. If the process is interrupted during the division process without all of the division test writing processes being completed by the valid time Tv when the write command is received from the upper device at the time of the elapse of the valid time Tv, the processing mode becomes batch. Test write mode switched to the general implementation of the remaining division processes. In this way, the after part is prevented that the division test writing is performed during the valid time Tv, and the time required for the test writing that has been divided is too long, and the optimal light emission energy during such a long time Time differs.

If the temperature difference by detecting the device temperature of each maximum valid time Tv = 160 seconds is greater than or equal to, for example, 4 ° C, which exceeds 3 ° C, which are used to discriminate the necessity of the division test writing process, it takes Temperature change control unit 166 in FIGS. 6A and 6B one time, and the setting of the optimal light emission energy is delayed in the case of performing the division test writing process. In this case, therefore, the processing mode for the batch test write process is switched to perform the remaining division test write processes in a blanket manner. Each time the division process is carried out, the temperature difference between the current temperature and the detection temperature in the previous division process is checked. For example, if there is a temperature change of 2 ° C or more because the results of the division processes have not yet been validly used, all of the previous division processes are canceled and the division processes are carried out again from the beginning.

In addition to the device temperature, the type of the medium, write / erase information indicating the type of the upper command, and the zone number of the medium in which the access track is contained were set in the register group 184 to support the division process in the division test write processing unit 160 ren in Fig. 6A and 6B auszufüh. As a type of medium that is set in the register group 184, there are media with 128 MB, 230 MB, 540 MB and 640 MB. Furthermore, information can also be stored which indicates whether the medium is an overwrite medium in which data can be written without the erase operation being necessary, or an ordinary medium in which the erase and write operations are performed individually. If the medium is the overwrite medium because the erase operation is unnecessary, the process by the second division execution unit 176 provided for the division execution unit 173 is not performed. As for the zone number of the register group 184 , the media zone in the case of the 540MB and 640MB media is divided into three areas, and the optimum light emission energy by the test write is found in the test write process in the division test write processing unit 160 . Therefore, the area of the medium where the test writing is carried out is discriminated by the zone number. The test write operations in the division test write processing unit 160 are performed in parallel in each area. The area of the medium for test writing in the media with 540 MB and 640 MB is divided into three areas of an inner edge area, an intermediate area and an outer edge area. For example, in the case of the 640MB medium, there are 11 zones, and they are classified so that zone numbers 1 to 4 correspond to the inner edge area, zone numbers 5 to 8 correspond to the intermediate area, and zone numbers 9 to 11 correspond to the outer edge area . Inherent optimal light emission energy is found for each area by test writing. Since there are 18 zones in the case of the 540 MB medium, they are divided into three areas of an inner edge area, an intermediate area and an outer edge area based on a unit of 6 zones. Optimal light emission energy is found for each area by test writing.

The light emission energy setting unit 186 in Figs. 6A and 6B will now be described. The light emission energy setting unit 186 executes a light emission energy setting process upon activation related to turning on the optical disk drive, and stores a processing result in the default erase / auxiliary table 188 and default write power table 190 as default values. Furthermore, the temperature correction coefficient table 192 is provided, in which the temperature correction coefficients which correspond to the device stem temperature have been stored. In the case of the 640MB medium, default erase powers DEPi were stored as, for example, 3.0 mW to 4.5 mW in the default erase / auxiliary table 188 corresponding to the zone numbers 1 to 11 , as shown in FIG. 10. In the case of the 640MB medium as shown in Fig. 11, default write energies DWP = 6.0 mW to 11.0 mW were stored in the default write energy table 190 corresponding to the zone numbers i = 1 to 11. In addition, the temperature correction coefficients Kt = -0.10 to 0.10 as shown in Fig. 12 were stored in the temperature correction coefficient table 192 in correspondence to the zone numbers i = 1 to 11 of the 540 MB medium. The coefficients Kt in the temperature correction coefficient table 192 in Fig. 12 show the values in the case of a device temperature T = 25 ° C. Referring again to FIGS. 6A and 6B, an erase / auxiliary energy table 194 , a first write energy table 196 and a second write energy table 198 for storing the optimal light emission energy found by test writing the division test write processing unit 160 are for the light emission energy setting unit 186 is provided. The erase energy EP used for the ordinary MO cartridge and the auxiliary energy AP used for the direct overwrite medium have been stored in the erase / auxiliary energy table 194 and are selectively used in accordance with the discrimination result of the kind of the medium. Instead of the extinguishing / auxiliary energy table 194 , the extinguishing energy table and auxiliary energy table can also be provided individually for exclusive use. Two types of write energies used for PWM recording, as shown in the time charts of FIGS. 4A to 4J, were stored in the first write energies table 196 and second write energies table 198 . Default values in the first write energy table 196 were stored in the default write energy table 190 , and an energy ratio of the second write energy to the first write energy was predetermined. Therefore, by multiplying the default write energy in the default write energy table 190 by a predetermined energy ratio, the second write energy WP2 is obtained, and the second write energy table 198 can be obtained. As initial values of the erase / auxiliary power table 194 , the first write energy table 196 and the second write energy table 198 , the temperature correction coefficients Kt with reference to the temperature correction coefficient table 192 are obtained based on the device temperature in a register 200 at that time, and the values obtained by the temperature correction of the default values in the default erase / auxiliary power table 188 and default write power table 190 by the temperature correction coefficients Kt are stored. An equation for the temperature correction is given by

WP = DWP (1 + Kt),

in which
WP: writing energy after completion of the temperature correction,
DWP: default writing energy,
Kt: temperature correction coefficients corresponding to zone no. I.

The processing operation by the division test write processing unit 160 in Figs. 6A and 6B will now be described. Fig. 13 is a schematic representation of the entire process in the optical disk drive with the Tei lungs test write processing unit 160 in Fig. 6A and 6B according to the invention. When the optical disk drive power is turned on, an initialization process is performed in step S1. A set setting of each default value, the temperature correction coefficients and the like by the light emission energy setting unit 186 in Figs. 6A and 6B is included in the initialization process. If the loading of the medium is discriminated in step S2, step S3 follows and the measurement of the elapsed time (A) by the timing timer 170 is started. In step S4, it is discriminated whether the command has been received or not. If the command is received from the upper device, a check is made in step S5 to see if the received command is the write command. If YES, step S6 follows and a check is made to see if the elapsed time (A) measured by the time-out timer 170 is less than 160 seconds. If it is shorter than 160 seconds, step S7 follows, and the test write process based on the valid time by the timing controller 164 is performed. When the test write process is finished, the write command from the upper device is executed in step S8. If the medium is not loaded, the processing routine is returned to step S4 in step S9, and the device waits to receive a next command from the upper device. If the elapsed time (A) is greater than or equal to 160 seconds in step S6, step S11 follows, and the test write process based on the temperature change by the temperature change control unit 166 in FIGS. 6A and 6B is carried out. After the completion of the test write process, the write command from the upper device is executed in step S8. If the write command is discriminated in step S5, the read command is executed in step S8. If the discharge of the medium is discriminated in step S9, step S10 follows. If the device is not stopped, the processing routine is returned to step S2 and the device waits for the next medium to be loaded. When the device is stopped, a series of processes are ended.

Fig. 14 7A is a flow chart for the valid write process time test, which in the valid time-Testschreibverar beitungsperiode 204 in Fig., In step S7 in Fig. 13 executed when the since the loading of the media elapsed time (A) is shorter than 160 seconds. In the valid time test write process, a check is made to see if the write command from the upper device is the first command in step S1. In the case of the first write command, step S2 follows. In this case, since the optimal light emission energy is not found, the batch execution flag is turned on, and the division processes of the division test writing process are not executed in step S9. The processes by the five first to fifth division execution units 174 to 182 , which are provided for the division execution unit 173 in FIGS . 6A and 6B, are performed across the board, whereby the optimum light emission energy is found. When the batch test writing is finished by turning on the batch execution flag, the valid time Tv is determined from the elapsed time (A) at that time in step S11, and the valid time timer 172 is started. A measurement time of the valid timer 172 is referred to as (B). If the command is the second or a subsequent write command from the upper device in step S1, the measurement time (B) of the valid time timer 172 is read in step S3. In step S4, a check is made to see whether or not the value (B) of the valid time timer 172 is greater than or equal to the 90% valid time of the valid time Tv at that time. If the value (B) is less than the 90% valid time, the processes in steps S5 to S11 are skipped, and the division test writing is not performed. If the value (B) of the valid time timer is greater than or equal to the 90% valid time in step S4, step S5 follows. A check is made to see whether or not the value (B) of the valid time timer is greater than or equal to the valid time Tv at that time. If the value (B) is less than the valid time Tv, the batch execution flag is turned off in step S6. The division test writing process is carried out in step S9. In this case, a check is made in step S7 to see whether or not the time elapsed since the previous execution of the division process is greater than or equal to the 10% valid time of the valid time Tv at that time. If the elapsed time of the division process exceeds the 10% valid time, the results of the previous division processes cannot be used validly. Therefore, the division process processing number is deleted in step S8, whereby the division test writing process in step S9 is performed again from the beginning. In the division test writing process in step S9, with respect to division processing numbers # 1, # 2, # 3, # 4 and # 5, which are respectively the first to fifth division execution units 174 to 182 of the division execution unit 173 in FIG. 6A and 6B, the process of the division execution unit is being executed at this time, which corresponds to the header division processing number which has not yet been processed. When any of the division test writing processes is finished in step S9, a check is made in step S10 to see if the division test writing process has been completed. If NO, the processing routine is returned to the main routine in Fig. 3, and the device waits for the division test write by the next upper command. When the division test write process is completed, the valid time Tv is determined from the elapsed time (A) measured by the timing timer 170 with reference to the valid time table 168 in FIG. 8. The valid timer 172 for monitoring the next valid time is cleared and started.

The division test write process in step S9 in Fig. 14 is as shown in the flowcharts in Figs. 15A, 15B, 16A and 16B. The division test writing process in FIGS. 15A to 16B is divided into five processing parts shown by the first to fifth division execution units 174 to 182 as division execution unit 173 in FIGS . 6A and 6B, and the processing numbers # 1 to # 5 are each set. That is, steps S1 to S10 relate to a process of processing # 1 by the first division execution unit 174 . Steps S11 to S16 relate to the process of processing # 2 by the second division execution unit 176 . Steps S17 to S21 relate to the process of processing # 3 by the third division execution unit 178 . Steps S22 to S26 relate to the division process of processing # 4 by the fourth division execution unit 180. Steps S27 to S34 relate to the division process of processing No. # 5 by the fifth division execution unit 182 .

First, a default setting update process by the first division execution unit 174 in steps S1 to S10, which corresponds to processing # 1, is explained. First, a check is made in step S1 to see if a laser diode reset flag is ON. The laser diode reset flag is turned on by a debugging process when, for example, a read error or a write error occurs due to the execution of the above command. In step S2, the readjustment of the laser diode is carried out by the light emission energy setting unit 186 in FIGS . 6A and 6B. Since the laser diode reset flag is OFF, the laser diode reset in step S2 is generally skipped. In step S3, a media area of the access track designated by the write command from the upper device is then discriminated. In the case of the 540 MB or 640 MB medium, which requires the test writing, the media zone is divided into three areas of an inner edge area, intermediate area and outer edge area. Therefore, the media area for test writing belonging to the access lane is discriminated by the zone number. In step S4, a search operation for positioning the light beam on the test area of the discriminated media area is performed. In the case of dividing the medium into three areas of the inner edge area, intermediate area and outer edge area, for example in the case of the 640 MB medium, as shown in the default deletion energy table in FIG. 10, the inner edge area corresponds to zone No. 1 to 4, the intermediate area corresponds to zone No. 5 to 8, and the outer peripheral area corresponds to zone No. 9 to 11. In zone No. 1 to 11, for example, five tracks at the zone boundary are provisionally assigned to each zone as a user area. The non-user area at the zone boundary can be used as a test area for test writing. In this case, each area is divided into a plurality of zones and is divided into 5 track parts at each zone boundary of the non-user area. Therefore, it is preferable to carry out the test writing using the non-user area of the zone as the test area located at the center of each area. In step S5, the current time is saved, and a check is made to see if the next division process has been carried out. In the initial state, since all processes of division processing numbers # 1 to # 5 are not yet executed, the light emission energy for test writing is initially set based on the device temperature at that time in accordance with the head division processing No. 1 which has not yet been executed is. The initial adjustment of the light emission energy is carried out by the light emission energy adjustment unit 186 in FIGS. 6A and 6B. The default values and the temperature coefficients are read out from the default erase / auxiliary energy table 188 , the default write energy table 190 and the temperature correction coefficient table 192 . The default erase energy DEP, first default write energy DWP1 and second default write energy DWP2, each corrected by the temperature coefficients, are obtained. Initially, an energy is set at which the initial value "-2" among the values, 19124 00070 552 001000280000000200012000285911901300040 0002019813872 00004 19005 at which the light emission energy is at five levels of (-2, -1, 0, +1, +2) each Default value is set from which the default energy is subtracted. In the case of the overwrite medium, an auxiliary power AP is initially set, which is obtained by subtracting the initial value "-2" from the default auxiliary power DAP. Then, in step S8, the division processing # 1 is saved, which indicates the end of the setting process by the first division execution unit 174 . In step S9, a check is made to see if the batch execution flag is ON. In this case, since the batch execution flag is OFF, step S10 follows and a check is made to see if the processing time has exceeded a predetermined division execution time of 0.5 seconds. If 0.5 seconds has been exceeded at this time, the processes from step S11 are not executed, but the processing routine is returned to the main routine in FIG. 13. On the other hand, if 0.5 seconds is not exceeded in step S10, step S11 follows and a check is made to see if the next dividing process has been carried out.

Since the process of division processing # 2 of the second division execution unit 176 is not yet executed as the next division process, step S12 follows and a check is made to see if the medium is the overwrite medium. Since the erase operation of the test sector in step S13 is unnecessary in the case of the write medium, this process is skipped. In the case of the ordinary MO medium, the test sector is erased in step S13 by the light emission of the erasing energy EP = DEP1-2 at this time. When the erase operation of the test sector is finished in step S13, division processing # 2 is saved in the RAM or the like in step S14. A check is made in step S15 to see if the batch execution flag is ON. A check is made in step S16 to see if the processing time has exceeded 0.5 seconds. If YES, the processes from step S17 are not executed, and the processing routine is returned to the main routine in FIG. 13. If the time in step S16 is less than or equal to 0.5 seconds, step S17 in Fig. 16 follows . A check is made to see if the next division process has been carried out, namely, the process of division processing # 3 of the third division execution unit 178 . If the process of division processing # 3 is not yet executed, the writing process of the test pattern for the test writing sector is carried out in step S18. In this case, in the write process of the test write sector, the ECC and CRC are not performed, and only the write operation of predetermined write patterns is carried out. Test patterns that were prepared in the RAM at the time of the batch test write process by the first write command are used as test patterns that are used for the write process. As the write pattern prepared in RAM, "596595" is used as the worst pattern, which is predicted to be the most likely to generate errors, and "FEDC .... 3210" as all the patterns of each word in hexadecimal notation. After completion of the writing process for the test writing sector in step S18, the division processing # 3 of the writing process is saved in the RAM in step S19. A check is then made in step S20 to see if the batch execution flag is ON. In step S21, a check is made to see if the processing time has exceeded 0.5 seconds. If YES, the processing routine is returned to the main routine in FIG. 13. If it is less than or equal to 0.5 seconds, a check is made in step S22 to see if the next process of division processing # 3 has been carried out by the third division execution unit 178 . If it has not yet been executed, step 23 follows and the test write sector that was written in step S18 is read. In this case, the reading process is carried out as the reading process without error correction of the ECC and CRC. When the reading process is finished, division processing # 4 is saved in the RAM in step S24. Thereafter, it is discriminated in step S25 whether the batch execution flag is ON or not. In step S26, a check is made to see if the processing time has exceeded 0.5 seconds. If YES, the processing routine is returned to the main routine in FIG. 13. If the processing time does not exceed 0.5 seconds, a check is made in step S27 to see if the process of division processing # 5 of the fifth division execution unit 182 serving as the next division process has been carried out. If it has not yet been executed, the number of errors is calculated in step S28 from the processing results derived from the division processes of the previous division processes # 1 to # 4. That is, the write patterns written in the test write sector of the medium in step S18 and the read pattern read out from the test write sector in step S23 are compared on the basis of bit units, whereby the number of times of mismatch is calculated. In step S25, division processing # 5 is saved in the RAM. Thereafter, in step S30, a check is made to see whether the set value of the light emission energy of the test write has exceeded "preset + 2", which serves as the maximum set value, namely whether the erase, write and read processes by setting the light emission energy five times have ended. If they have not yet ended, the light emission energy is increased by one unit in step S31. Thereafter, the processing routine is returned to step S10 in Fig. 15B. When the processes of the five times that the light emission energy is changed are finished, the process for calculating the optimal energy is carried out in step S32. If the optimum energy can be calculated, all division processings # 1 to # 5 of the processes that have been performed are deleted. Further, since the new optimal energy can be set in step S34, the valid time Tv is obtained from the measurement time (A) of the time-out timer 170 at the time with reference to the valid time table 168 in FIG. B, the valid time timer 172 is cleared and the counting operation of the valid time (B) is restarted. If the elapsed time (A) of the timing timer 170 is greater than or equal to A = 160 seconds, the valid time Tv is set to the maximum value Tv = 160 seconds.

FIG. 17 shows the optimal energy calculation process in step S2 in FIG. 16A. Five points, 0, P, Q, R and S, which indicate the number of times a mismatch occurs when the default energy DWP, which yields characteristic curve 212 in FIG. 10, for example, is (-2, -1, 0, + 1, +2) are obtained by the detection result of the number of times of mismatch based on the erase, write and read processes for five times in which the light emission energy is changed in Figs. 15A to 16B. Therefore, the number of errors and the threshold value Eth are compared to discriminate the optimum light emission energy, whereby in step S1, the light emission energies are extracted with the number of times of a mismatch that is less than or equal to the threshold value Eth. In step S2, a check is made to see if there are two or more light emission energies that indicate the number of times a mismatch that is less than or equal to the threshold value Eth. If there are two or more light emission energies, the optimum energy is determined as ½ the difference between the maximum and minimum values of the two energies in step S3. If, in step S2, the number of light emission energies where the number of times of mismatch is less than or equal to the threshold value Eth that is less than 2, namely, when there is only one light emission energy, the optimal energy cannot be determined. Therefore, step S4 follows, an energy shift direction is discriminated, and the default is corrected. The direction of energy shift of the default in this case is corrected so that the default energy is shifted by one unit to the light emission energy side in which the number of errors exceeds the threshold value Eth. In step S5, a check is made to see whether the corrected default value has exceeded a predetermined limit, namely the lower limit or upper limit of the write energy. If NO, the processing routine is returned to the routine in Figs. 16A and 16B.

If the default energy after setting the limit exceeds, the processing routine is called an abnormality lity ended.

The flow charts of FIGS. 18A and 18B show the batch test writing process which is executed when the first write command is received, and they are shown as Flußserie without the parts that are skipped in Fig. 15A, 15B, 16A and 16B in a state where the batch execution flag is ON. That is, when the processes are discriminated in the case where the ON state of the batch execution flag is discriminated in steps S9, S15 and S25 in Figs. 15A to 16B, only the processes in steps S1 to S4, S7, S12, S13, S18, S23, S28, S30, S32 and S34 in Figures 18A and 18B. The content of the batch test write process is similar to that in the corresponding steps in Figs. 15A to 16B, except for one point that the access track in step S3 in the area discrimination process since the command is the first write command, the write data patterns used for test writing be prepared in RAM.

FIG. 19 is a flowchart for the test writing process based on the temperature change and shown in step S11 in FIG. 13. As shown in the schedule in FIG. 7A, the test write process is performed based on the temperature change for the temperature change test write processing period 206 after the elapse of 160 seconds corresponding to the valid time test write processing time 204 since the medium was loaded. When the temperature change test write process is activated based on the write command from the upper device, a check is made in step S1 to see if the device is on the way of the division test write. That is, discrimination is made as to whether the division test letter was interrupted or not. If the device is not on the way of the division test writing, step S2 follows and the time elapsed from the previous detection temperature is detected. The elapsed time is obtained from the measurement time (B) of the valid timer 172 . In step S3, it is discriminated whether the elapsed time (B) is greater than or equal to 160 seconds or not. If the elapsed time (B) is less than 160 seconds, the processes are skipped from step S4 and the processing routine is returned to the main routine in FIG. 13. If the elapsed time (H) is greater than or equal to 160 seconds, step S4 follows and a temperature difference between the previous and current temperature is calculated. In step S5, it is discriminated whether the temperature difference is greater than or equal to 3 ° C. or not. If the temperature difference is greater than or equal to 3 ° C, step S6 follows and a check is made to see if it is greater than or equal to 4 ° C or not. If it is less than 4 ° C, the batch execution flag is turned off in step S7. In step 8 , the processing routine goes to the division test write process. The division test write processes in Figs. 15A to 16B are executed. If the completion of the test writing is detected in step S9, the new optimal light emission energy is obtained. Therefore, step S10 follows and the timing timer 170 is reset. Thereafter, the valid time timer 172 for measuring the elapsed time (B) is reset and started. If it is determined in step S1 that the device is on the way of the division test writing, namely, that the division test writing has been interrupted, step S11 follows, and a temperature difference between the previous and the current temperature with respect to the division execution becomes calculated. In step S12, if the temperature change in the division execution interruption time is greater than or equal to 2 ° C, since the temperature change in the division interruption time period is too large, the results obtained so far by the division execution cannot be validly used. Therefore, the division processing number is deleted in step S13, so that the division test writing process in step 8 is executed again from the beginning. If the temperature difference between the previous and the current temperature is greater than or equal to 4 ° C, namely, if the temperature changes greatly in step S6 because there is a possibility that the optimal light emission energy deviates greatly, the processing routine goes to step S14, and the batch execution flag is turned on. The remaining division processes are carried out across the board in step S8. The division test write process in the case of turning on the batch execution flag in step S14 becomes the batch test write process based on the batch execution flag in FIGS . 18A and 18B.

According to the invention, as stated above, a Series of test writing processes that are performed by the erase, write and read operations are accompanied when the top command is received, in a variety of processing stages divides and executes sequentially. Even in the case where the device temperature suddenly changes, and the opti paint energy from the originally set default energy deviates greatly, so that it takes a long time until the end of the Test writing process takes to find the optimal energy the processes are distributed and executed. Accordingly access is responding to the above command during the interruption of the writing energy division process ended so that the error due to the time error for the  upper command is not generated. Even if the energy of the optimal energy during the division process of the Test writing deviates, the recording and repro production as far as possible. To this In this way, the overall performance of the device can be improved become.

The above embodiment has been described with reference to an example in a case where every time the write command is received from the upper device, the need for test write is discriminated and the split test write process is carried out. As a further embodiment of the invention, however, it is also possible to provide such a construction that the valid time Tv with reference to the valid time table 168 on the basis of the time (A) elapsed since the medium was read in FIG. Timer 170 is obtained without being dependent on the write command, and each time the valid time Tv elapses, the split test write is performed for the processing time every 0.5 seconds.

As for the division test writing process based on the Temperature change of the device concerns, it is also possible to provide such a construction that if the device temperature, for example, around 3 ° C or changes, the division test write process is started, and divided at each processing time period of 0.5 seconds which is executed.

Regarding the current time test write processing period, the valid time, the elapsed time in valid time test writing process corresponds, and the numbers values of temperature change in the event of discrimination of the Need to write a test based on tempera turkey change shown in the above embodiment  suitable values can be determined as required, and the Invention is not based on the numerical values of the embodiment limited.

Although the above embodiment is related to the 540 MB medium and 640 MB medium are described as examples the division test letter can also be used in a similar way 230 MB medium can be used. In the case of the 230 MB medium however, it is sufficient as a media area where the test write an area related to the write to put entire surface of the medium. Therefore it is not necessary the media area in a variety of areas to share, and the test writing for each area as with 540 MB medium and 640 MB medium to execute.

Furthermore, the test writing of the invention Changes in writing energy are formed in five stages by a default unit is added to the default value or sub thereof is trawled. The changes in writing energy can however, can also be formed by using the default value with before determined coefficients, such as 0.8, 0.9, 1.0, 1.1 and 1.2, respectively is multiplied.

Although the invention relates to the MO cassette medium that needs the erase operation and the cartridges medium of the type that corresponds to a direct overwrite, the delete operation is not required as a games has been described, the embodiment of the Er invention is also similar to other media, such as one phase change type optical disc and a disc of Recording system, such as a DVD-RAM or the like, under Using a light energy.

Claims (22)

1. Optical storage device, with:
a light emission energy setting unit for setting a light emission energy of a laser diode used for recording and reproducing a medium, characterized by a split test write processing unit for sharing a test write process to set an optimal light emission energy by performing test write on the medium in a variety of processes, and for sequentially executing the division processes when predetermined test writing conditions are met by the respective medium. 2. The apparatus of claim 1, wherein the division test write processing unit comprises:
a plurality of division execution units for dividing the test writing process into a plurality of processes and for executing; and
a division control unit for discriminating the need for test writing when an upper command is received when the need for test writing is determined, for skipping the process to the division process located at the head of the division process which is in the division Execution unit have not yet been executed, thereby allowing the division process to be executed to be executed for a predetermined time. 3. Apparatus according to claim 2, in which in the Tei control unit every time the process in one Division execution unit is finished, a processed Number and a processing result are saved if one that has passed since the start of the division process Time is shorter than a predetermined time, the process moved to the next process of the division execution unit  and when the elapsed time is the predetermined one Time, the process is interrupted, and the Division control unit on a next upper command wait. 4. The apparatus of claim 2, wherein when one of the previous division process by a variety of Tei execution execution units up to the current division process elapsed time exceeds a predetermined time, the division control unit processes numbers and processors processing results up to the previous time, and executes the division processes again from the beginning. 5. The apparatus of claim 2, wherein in the case of a medium requiring an erase operation, the division execution unit comprises:
a first division execution unit for setting a predetermined initial light emission energy at the first time and for setting light emission energies obtained by changing the initial light emission energy by each predetermined value at the second and subsequent times;
a second division execution unit for deleting a test area of the medium by the light emission energy;
a third division execution unit for writing a predetermined test pattern in the deleted test area;
a fourth division execution unit for reading out the test pattern written in the test area; and
a fifth division execution unit for detecting the number of times of mismatch of data by comparing the test pattern with a pattern that has been read out, and determining an optimal light emission energy based on the number of times of mismatched by test write operations Times from the first to fourth division execution unit is obtained. 6. The apparatus of claim 2, wherein in the case of a medium of a direct overwrite type medium with no erase operation required, the partition execution unit comprises:
a first division execution unit for setting a predetermined initial light emission energy at the first time and for setting a light emission energy obtained by changing the initial light emission energy by each predetermined value at the second and subsequent times;
a second division execution unit for writing a predetermined test pattern in a test area of the medium;
a third division execution unit for reading out the test pattern written in the test area; and
a fourth division execution unit for detecting the number of times of mismatch of data by comparing the test pattern with a pattern that has been read out and setting an optimal light emission energy based on the number of times of mismatched by test write operations Times from the first to third division execution unit is obtained. 7. The device according to claim 2, wherein the dividing Control unit a timing control unit for controlling the Division test write processing unit based on a since a predetermined start time setting direction elapsed time. 8. The apparatus of claim 7, wherein the time run control unit the division test write processing unit  operates and controls validly for a period of time, until the elapsed time from the start time setting predetermined time reached. 9. The apparatus of claim 8, wherein the time run control unit an optimal light emission energy be agrees by writing the division processes of the division test processing unit flat rate by a first upper Be fail to run, a valid time sets to an on provide the optimal light emission energy on the basis the time elapsed up to the current time unnecessarily make the division process for the upper command by Elapse of a predetermined retention time of the valid one Time inhibits, and allows division for the upper command for the valid time from the predetermined one Lead time is executed. 10. The apparatus of claim 9, wherein the time from run control unit the division process in a time zone in that is less than 90% of the valid time, and the Splitting process allowed in a time zone that 90% of the time valid time. 11. The apparatus of claim 9, wherein when the elapsed time the valid time on the way to a Execution level of the division process exceeds that Timing control unit the remaining division processes is generally carried out by a next upper command. 12. The apparatus of claim 9, wherein the time run control unit sets the valid time so that it proportional to the elapsed time since the start time setting Time is gradually long. 13. The apparatus of claim 2, wherein the dividing Control unit a temperature change control unit for Control the division test write processing unit on the Based on a change in device temperature.   14. The apparatus of claim 13, wherein the time run control unit the division test write processing validly operates and controls after the Start time setting elapsed time a predetermined one Has exceeded time. 15. The apparatus of claim 13, wherein the tempera change control unit a temperature in the Vorrich detected every predetermined time, and enables that the division test write processing unit the part processes when a temperature difference between the detected temperature and a previous one Detection temperature above a predetermined temperature steps. 16. The apparatus of claim 15, wherein when the Temperature difference an upper limit temperature, the higher is as the predetermined temperature, on the way one Execution level of the division process exceeds that Temperature change control unit of the division test write processing unit allowed to pau the division processes to execute scarf. 17. The apparatus of claim 16, wherein when the Temperature difference between the previous and current len division process the predetermined temperature on the Path of the division process through the division test letter processing unit exceeds the temperature change Control unit the processed numbers and processing results up to previous time, and again executes the division processes from the beginning. 18. Device according to one of claims 7, 8 and 13, at which the start time setting a time setting at Load the medium into the device and set a time when returning from a sleep mode in which a Servo unit or a spindle motor is stopped contains.   19. The apparatus of claim 2, wherein the medium in a plurality of areas in a radial direction is divided, and the processes through the division test write processing unit and the division control unit independent gig for each area. 20. The apparatus of claim 2, wherein the medium in a plurality of zones divided in a radial direction is, the plurality of zones grouped into one Variety of areas divided for each zone and the processes through the division test writing process processing unit and the division control unit independently run for each area.   21. Optical storage device comprising:
a light emission energy setting unit for setting a light emission energy of a laser diode used for recording and reproducing a medium, characterized by a split test write processing unit for sharing a test write process to set an optimal light emission energy by performing a test write on the medium in a plurality of division processes, and for sequentially executing the division processes in accordance with a predetermined time schedule elapsed times. 22. Optical storage device comprising:
a light emission energy setting unit for setting a light emission energy of a laser diode used for recording and reproducing a medium, characterized by a split test write processing unit for sharing a test write process to set an optimal light emission energy by performing a test write on the medium in a plurality of division processes, and for sequentially executing the division processes when there is a temperature change of a predetermined value or above.