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DE19781611T1 - Speichertestgerät - Google Patents

Speichertestgerät

Info

Publication number
DE19781611T1
DE19781611T1 DE19781611T DE19781611T DE19781611T1 DE 19781611 T1 DE19781611 T1 DE 19781611T1 DE 19781611 T DE19781611 T DE 19781611T DE 19781611 T DE19781611 T DE 19781611T DE 19781611 T1 DE19781611 T1 DE 19781611T1
Authority
DE
Germany
Prior art keywords
memory tester
tester
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE19781611T
Other languages
English (en)
Inventor
Masaru Goishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE19781611T1 publication Critical patent/DE19781611T1/de
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/003—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation in serial memories
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31935—Storing data, e.g. failure memory
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/44—Indication or identification of errors, e.g. for repair

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
DE19781611T 1996-12-19 1997-12-19 Speichertestgerät Ceased DE19781611T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP8339206A JPH10188597A (ja) 1996-12-19 1996-12-19 メモリ試験装置
PCT/JP1997/004720 WO1998027556A1 (fr) 1996-12-19 1997-12-19 Ensemble essai memoire

Publications (1)

Publication Number Publication Date
DE19781611T1 true DE19781611T1 (de) 1999-03-18

Family

ID=18325253

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19781611T Ceased DE19781611T1 (de) 1996-12-19 1997-12-19 Speichertestgerät

Country Status (6)

Country Link
US (1) US6061813A (de)
JP (1) JPH10188597A (de)
KR (1) KR100312248B1 (de)
CN (1) CN1157739C (de)
DE (1) DE19781611T1 (de)
WO (1) WO1998027556A1 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7308629B2 (en) 2004-12-07 2007-12-11 Texas Instruments Incorporated Addressable tap domain selection circuit with TDI/TDO external terminal
JP2000113695A (ja) * 1998-10-01 2000-04-21 Mitsubishi Electric Corp 同期型半導体記憶装置
JP2000195295A (ja) * 1998-12-24 2000-07-14 Advantest Corp メモリデバイス試験装置
US6553525B1 (en) * 1999-11-08 2003-04-22 International Business Machines Corporation Method and apparatus for selectively enabling and disabling functions on a per array basis
US6553526B1 (en) * 1999-11-08 2003-04-22 International Business Machines Corporation Programmable array built-in self test method and system for arrays with imbedded logic
JP2002305223A (ja) * 2001-04-05 2002-10-18 Toshiba Corp 半導体装置における座標変換システム、及び座標変換プログラム
WO2004057354A1 (ja) * 2002-12-20 2004-07-08 Advantest Corporation 半導体試験装置
KR20050085898A (ko) * 2002-12-27 2005-08-29 가부시키가이샤 어드밴티스트 반도체 시험 장치
JP4241157B2 (ja) * 2003-04-16 2009-03-18 株式会社アドバンテスト 試験装置
KR100498509B1 (ko) * 2003-11-12 2005-07-01 삼성전자주식회사 검사시간을 단축하는 플래시 메모리 테스터 및 이를이용한 전기적 검사방법
EP1538635B1 (de) * 2003-11-26 2008-05-14 Texas Instruments Incorporated Scan-testbarer FIFO-Speicher
JP4599146B2 (ja) * 2004-11-30 2010-12-15 株式会社アドバンテスト 試験装置、及び電源回路
US7152192B2 (en) * 2005-01-20 2006-12-19 Hewlett-Packard Development Company, L.P. System and method of testing a plurality of memory blocks of an integrated circuit in parallel
US8006149B2 (en) * 2006-11-27 2011-08-23 Verigy (Singapore) Pte. Ltd. System and method for device performance characterization in physical and logical domains with AC SCAN testing
US9881694B2 (en) * 2015-07-15 2018-01-30 International Business Machines Corporation Built-in-self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register
DE102017121308B4 (de) * 2017-06-30 2019-06-06 Taiwan Semiconductor Manufacturing Co., Ltd. Synchron-write-through-abtastprüfungsarchitekturen für einen speicherbaustein

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5673354A (en) * 1979-11-21 1981-06-18 Advantest Corp Testing device for ic
JP2641739B2 (ja) * 1988-07-29 1997-08-20 富士通株式会社 試験装置
JPH03102274A (ja) * 1989-05-17 1991-04-26 Mitsubishi Electric Corp シリアルアクセスメモリのテスト回路
US5481671A (en) * 1992-02-03 1996-01-02 Advantest Corporation Memory testing device for multiported DRAMs
JP3070305B2 (ja) * 1992-10-30 2000-07-31 安藤電気株式会社 フェイルメモリ
JP3186359B2 (ja) * 1993-07-28 2001-07-11 安藤電気株式会社 物理アドレス変換回路
KR960035944A (ko) * 1995-03-28 1996-10-28 김주용 반도체 소자 제조시 불량분석 방법
JPH0935496A (ja) * 1995-07-12 1997-02-07 Advantest Corp メモリ試験装置
JP3608694B2 (ja) * 1996-09-18 2005-01-12 株式会社アドバンテスト メモリ試験装置

Also Published As

Publication number Publication date
KR100312248B1 (ko) 2001-12-12
JPH10188597A (ja) 1998-07-21
US6061813A (en) 2000-05-09
CN1213455A (zh) 1999-04-07
WO1998027556A1 (fr) 1998-06-25
CN1157739C (zh) 2004-07-14
KR19990082664A (ko) 1999-11-25

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8131 Rejection