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DE19680643T1 - Verfahren und Vorrichtung zur Messung und Bestimmung des Polarisationszustands, der Polarisationseigenschaften und der Polarisationsmodendispersion - Google Patents

Verfahren und Vorrichtung zur Messung und Bestimmung des Polarisationszustands, der Polarisationseigenschaften und der Polarisationsmodendispersion

Info

Publication number
DE19680643T1
DE19680643T1 DE19680643T DE19680643T DE19680643T1 DE 19680643 T1 DE19680643 T1 DE 19680643T1 DE 19680643 T DE19680643 T DE 19680643T DE 19680643 T DE19680643 T DE 19680643T DE 19680643 T1 DE19680643 T1 DE 19680643T1
Authority
DE
Germany
Prior art keywords
polarization
measuring
determining
state
mode dispersion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE19680643T
Other languages
English (en)
Inventor
Osamu Aso
Isamu Oshima
Haruki Ogoshi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Furukawa Electric Co Ltd
Original Assignee
Furukawa Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Furukawa Electric Co Ltd filed Critical Furukawa Electric Co Ltd
Publication of DE19680643T1 publication Critical patent/DE19680643T1/de
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light
    • G01J4/04—Polarimeters using electric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/336—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by measuring polarization mode dispersion [PMD]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/337—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by measuring polarization dependent loss [PDL]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Dispersion Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optical Communication System (AREA)
DE19680643T 1995-06-30 1996-06-27 Verfahren und Vorrichtung zur Messung und Bestimmung des Polarisationszustands, der Polarisationseigenschaften und der Polarisationsmodendispersion Ceased DE19680643T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP18783795 1995-06-30
JP18783895 1995-06-30
PCT/JP1996/001786 WO1997002476A1 (en) 1995-06-30 1996-06-27 Method of evaluating and measuring polarization state, polarization state and polarization mode dispersion and apparatus therefor

Publications (1)

Publication Number Publication Date
DE19680643T1 true DE19680643T1 (de) 1997-07-24

Family

ID=26504591

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19680643T Ceased DE19680643T1 (de) 1995-06-30 1996-06-27 Verfahren und Vorrichtung zur Messung und Bestimmung des Polarisationszustands, der Polarisationseigenschaften und der Polarisationsmodendispersion

Country Status (3)

Country Link
US (1) US5965874A (de)
DE (1) DE19680643T1 (de)
WO (1) WO1997002476A1 (de)

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JP3131144B2 (ja) * 1996-03-29 2001-01-31 株式会社アドバンテスト 偏波モード分散の測定装置
DE19827638A1 (de) * 1998-06-20 1999-12-23 Alcatel Sa Methode zur Messung von Störungseffekten auf Glasfaserübertragungsstrecken sowie Übertragungssystem
JP2000031903A (ja) * 1998-07-07 2000-01-28 Hitachi Ltd 偏波分散補償装置および偏波分散補償方法
US6342945B1 (en) * 1999-03-31 2002-01-29 Corning Incorporated System and method for measuring polarization mode dispersion suitable for a production environment
US6449033B2 (en) * 1999-04-26 2002-09-10 Corning Incorporated Apparatus and method for measuring polarization dependent loss
US7009666B2 (en) * 1999-08-23 2006-03-07 Kent Displays Incorporated Back lit cholesteric liquid crystal display
KR100337132B1 (ko) * 1999-10-15 2002-05-18 윤덕용 광 신호 대 잡음비를 측정하는 장치 및 방법
US6381385B1 (en) * 1999-12-22 2002-04-30 Nortel Networks Limited Polarization mode dispersion emulation
US6950611B2 (en) * 2000-03-08 2005-09-27 Fitel Usa Corp. In-line polarization monitoring and control in lightwave communication systems
US7076169B2 (en) * 2000-09-26 2006-07-11 Celight, Inc. System and method for orthogonal frequency division multiplexed optical communication
HU226937B1 (en) 2000-11-17 2010-03-29 Mta Szegedi Biolog Koezpont Method and apparatus for determining polarization amount of material by a laser scanning microscope
CA2336753C (en) * 2001-02-14 2007-07-03 Itf Optical Technologies Inc.-Technologies Optiques Itf Inc. Method for measuring polarization dependent loss and insertion loss
CN1509535A (zh) * 2001-03-19 2004-06-30 ��������幫˾ 光传输介质中偏振模色散的补偿
WO2002093237A1 (en) * 2001-05-15 2002-11-21 Optellios, Inc. Polarization analysis unit, calibration method and optimization therefor
US6721467B2 (en) 2001-06-07 2004-04-13 3M Innovative Properties Company Method and apparatus for aligning the polarization of a polarization maintaining optical fiber to the polarization of a light source
US20030067641A1 (en) * 2001-08-14 2003-04-10 Terapulse, Inc. Apparatus and methods for polarization measurements across a spectral range
CN1593024A (zh) * 2001-09-27 2005-03-09 特拉脉冲公司 光传输介质中传输畸变高阶补偿的方法和装置
US6912328B2 (en) * 2001-10-04 2005-06-28 Massachusetts Institute Of Technology Real-time polarization mode dispersion characterization
US7369232B2 (en) * 2002-01-17 2008-05-06 The Furukawa Electric Co., Ltd. Stokes parameter measurement device and method
US6909506B2 (en) * 2002-01-17 2005-06-21 The Furukawa Electric Co., Ltd. Stokes parameter measurement device and method
AU2003225774A1 (en) * 2002-03-15 2003-09-29 Terapulse, Inc. Athermal delay line
US7106443B2 (en) * 2002-04-10 2006-09-12 Lighthouse Capital Partners, Inc. Optical signal-to-noise monitor having increased coherence
US7330663B2 (en) * 2002-06-03 2008-02-12 Lucent Technologies Inc. PMD-reduction processing for a multi-channel receiver
JP2004061515A (ja) * 2002-07-29 2004-02-26 Cark Zeiss Smt Ag 光学系による偏光状態への影響を決定する方法及び装置と、分析装置
US20060159452A1 (en) * 2003-01-31 2006-07-20 Tucker Rodney S Polarization resolving heterodyne optical receiver
US7289223B2 (en) * 2003-01-31 2007-10-30 Carl Zeiss Smt Ag Method and apparatus for spatially resolved polarimetry
JP4241252B2 (ja) * 2003-07-24 2009-03-18 横河電機株式会社 光ファイバ特性測定装置および光ファイバ特性測定方法
JP2005140585A (ja) * 2003-11-05 2005-06-02 Fujitsu Ltd 偏光状態測定装置
US20080079941A1 (en) * 2004-09-07 2008-04-03 Agency For Science, Technology And Research Differential Geomety-Based Method and Apparatus for Measuring Polarization Mode Dispersion Vectors in Optical Fibers
JP2006243311A (ja) * 2005-03-03 2006-09-14 Fuji Photo Film Co Ltd 光学媒体の光学特性の解析方法、解析装置及製造監視方法
EP1908304A2 (de) * 2005-07-11 2008-04-09 Neurok Optics LLC Zweischirm-flüssigkristallsystem mit zirkularpolarisation und polarisierergläser mit eignung für dreidimensionale abbildung
US8319821B2 (en) * 2007-06-05 2012-11-27 Tandent Vision Science, Inc. Polarization-based shadow detection
US20090128814A1 (en) * 2007-11-21 2009-05-21 Bogdan Szafraniec Modulated polarizer-based polarimeter, and method for determining the polarization state of an optical signal
CN102116674B (zh) * 2010-01-06 2012-09-05 西安交通大学 光偏振态斯托克斯参量的测量方法及系统
EP2651051A1 (de) * 2012-04-13 2013-10-16 Alcatel Lucent Nichtlinearer Kreuzpolarisationsabschwächungsalgorithmus
US9304058B2 (en) * 2012-10-09 2016-04-05 Ofs Fitel, Llc Measuring modal content of multi-moded fibers
US20150316468A1 (en) 2014-04-30 2015-11-05 Nova Measuring Instruments Ltd. Method and system for optical characterization of patterned samples
JP6531598B2 (ja) * 2015-09-29 2019-06-19 沖電気工業株式会社 偏波速度ベクトル測定装置及び偏波速度ベクトル測定方法
DE102017216358A1 (de) * 2017-09-14 2019-03-14 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung und Verfahren zur Bestimmung eines Polarisationszustandes einer elektromagnetischen Welle
US10627341B1 (en) * 2019-02-25 2020-04-21 United States Of America As Represented By Secretary Of The Navy Optical interrogator for measuring polarization properties
CN111698026B (zh) * 2019-03-12 2023-05-12 富士通株式会社 偏振态变化监测方法、装置和接收机
CN110631705B (zh) * 2019-09-17 2021-04-20 哈尔滨理工大学 一种利用dmd进行实时斯托克斯偏振测量的方法及装置
CN112630156B (zh) * 2020-02-18 2023-06-16 合肥工业大学 一种高精度分振幅同时偏振成像系统的制备方法
CN113810124B (zh) 2020-06-17 2023-07-07 富士通株式会社 偏振态跟踪恢复方法和装置
CN112035794B (zh) * 2020-07-13 2024-02-23 西安电子科技大学 一种基于穆勒矩阵的偏振识别方法、装置及电子设备
CN119354502B (zh) * 2024-12-23 2025-04-22 希烽光电科技(南京)有限公司 一种应用于光芯片测试的噪声校正系统及噪声校正方法

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Publication number Priority date Publication date Assignee Title
US5298972A (en) * 1990-01-22 1994-03-29 Hewlett-Packard Company Method and apparatus for measuring polarization sensitivity of optical devices
US5227623A (en) * 1992-01-31 1993-07-13 Hewlett-Packard Company Method and apparatus for measuring polarization mode dispersion in optical devices
JP3761899B2 (ja) * 1993-02-09 2006-03-29 株式会社東芝 光ファイバ偏波分散等化光回路

Also Published As

Publication number Publication date
US5965874A (en) 1999-10-12
WO1997002476A1 (en) 1997-01-23

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