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DE19581748T1 - Mit einem externen Taktsignal synchronisiertes Halbleitertestgerät - Google Patents

Mit einem externen Taktsignal synchronisiertes Halbleitertestgerät

Info

Publication number
DE19581748T1
DE19581748T1 DE19581748T DE19581748T DE19581748T1 DE 19581748 T1 DE19581748 T1 DE 19581748T1 DE 19581748 T DE19581748 T DE 19581748T DE 19581748 T DE19581748 T DE 19581748T DE 19581748 T1 DE19581748 T1 DE 19581748T1
Authority
DE
Germany
Prior art keywords
clock signal
pct
divider
test rate
external clock
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE19581748T
Other languages
English (en)
Inventor
Yasutaka Tsuruki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE19581748T1 publication Critical patent/DE19581748T1/de
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation
    • H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Tests Of Electronic Circuits (AREA)
DE19581748T 1995-07-20 1995-07-20 Mit einem externen Taktsignal synchronisiertes Halbleitertestgerät Ceased DE19581748T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP1995/001438 WO1997004327A1 (en) 1995-07-20 1995-07-20 Semiconductor tester synchronized with external clock

Publications (1)

Publication Number Publication Date
DE19581748T1 true DE19581748T1 (de) 1997-08-21

Family

ID=14126114

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19581748T Ceased DE19581748T1 (de) 1995-07-20 1995-07-20 Mit einem externen Taktsignal synchronisiertes Halbleitertestgerät

Country Status (3)

Country Link
US (1) US5886536A (de)
DE (1) DE19581748T1 (de)
WO (1) WO1997004327A1 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1138100A (ja) * 1997-07-18 1999-02-12 Advantest Corp 半導体試験装置
JP2000338190A (ja) * 1999-05-28 2000-12-08 Ando Electric Co Ltd Ｉｃ試験装置、及びｉｃ試験方法
DE10048895A1 (de) * 1999-10-01 2001-06-13 Schlumberger Technologies Inc Testverfahren und -vorrichtung für quellensynchrone Signale
DE10392202T5 (de) 2002-01-10 2005-01-05 Advantest Corp. Testvorrichtung für einen LSI-Prüfling, Jitteranalysator und Phasendifferenzdetektor
JP4006260B2 (ja) * 2002-04-26 2007-11-14 株式会社アドバンテスト 半導体試験装置
JP4446892B2 (ja) * 2002-12-20 2010-04-07 株式会社アドバンテスト 半導体試験装置
JP4319146B2 (ja) * 2002-12-27 2009-08-26 株式会社アドバンテスト 半導体試験装置
GB2397956B (en) * 2003-01-29 2005-11-30 Phyworks Ltd Phase detector
US20050179459A1 (en) * 2004-02-17 2005-08-18 Texas Instruments Incorporated Method and system for testing an electronic device
US20070226567A1 (en) * 2006-03-23 2007-09-27 Gorman Kevin W High speed bist utilizing clock multiplication
NO340804B1 (en) 2015-09-02 2017-06-19 Cubility As A device for separating a medium comprising a mixture of a solid portion and a fluid portion
DE102017113730A1 (de) 2017-06-21 2018-12-27 Infineon Technologies Ag Radar-frontend mit hf-oszillator-überwachung

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5616547Y2 (de) * 1976-09-14 1981-04-17
JPS5616547A (en) * 1979-07-20 1981-02-17 Dainippon Ink & Chem Inc Flame-resistant polyester resin composition
JPS6211181A (ja) * 1985-07-08 1987-01-20 Nec Corp 大規模集積回路用テスタ−
JPS63148176A (ja) * 1986-12-11 1988-06-21 Ando Electric Co Ltd 論理回路試験装置
US5295079A (en) * 1991-07-18 1994-03-15 National Semiconductor Corporation Digital testing techniques for very high frequency phase-locked loops
JPH0738979A (ja) * 1993-07-23 1995-02-07 Canon Inc リモコン送信ユニット
US5446420A (en) * 1993-08-25 1995-08-29 Motorola, Inc. Method and apparatus for reducing jitter and improving testability of an oscillator
JP2598551Y2 (ja) * 1993-12-22 1999-08-16 株式会社アドバンテスト 半導体試験装置

Also Published As

Publication number Publication date
US5886536A (en) 1999-03-23
WO1997004327A1 (en) 1997-02-06

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
8607 Notification of search results after publication
8131 Rejection