DE10391780D2 - Röntgenstrahlquelle mit einer kleinen Brennfleckgrösse - Google Patents
Röntgenstrahlquelle mit einer kleinen BrennfleckgrösseInfo
- Publication number
- DE10391780D2 DE10391780D2 DE10391780T DE10391780T DE10391780D2 DE 10391780 D2 DE10391780 D2 DE 10391780D2 DE 10391780 T DE10391780 T DE 10391780T DE 10391780 T DE10391780 T DE 10391780T DE 10391780 D2 DE10391780 D2 DE 10391780D2
- Authority
- DE
- Germany
- Prior art keywords
- ray source
- spot size
- focal spot
- small focal
- small
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
- H01J35/08—Anodes; Anti cathodes
- H01J35/112—Non-rotating anodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2235/00—X-ray tubes
- H01J2235/08—Targets (anodes) and X-ray converters
- H01J2235/081—Target material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
- H01J35/08—Anodes; Anti cathodes
- H01J35/112—Non-rotating anodes
- H01J35/116—Transmissive anodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/16—Vessels; Containers; Shields associated therewith
- H01J35/18—Windows
- H01J35/186—Windows used as targets or X-ray converters
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE10391780T DE10391780D2 (de) | 2002-03-26 | 2003-03-26 | Röntgenstrahlquelle mit einer kleinen Brennfleckgrösse |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE10213496 | 2002-03-26 | ||
| DE10391780T DE10391780D2 (de) | 2002-03-26 | 2003-03-26 | Röntgenstrahlquelle mit einer kleinen Brennfleckgrösse |
| PCT/DE2003/001004 WO2003081631A1 (de) | 2002-03-26 | 2003-03-26 | Roentgenstrahlquelle mit einer kleinen brennfleckgroesse |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE10391780D2 true DE10391780D2 (de) | 2005-02-17 |
Family
ID=28050861
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE10391780T Expired - Lifetime DE10391780D2 (de) | 2002-03-26 | 2003-03-26 | Röntgenstrahlquelle mit einer kleinen Brennfleckgrösse |
Country Status (2)
| Country | Link |
|---|---|
| DE (1) | DE10391780D2 (de) |
| WO (1) | WO2003081631A1 (de) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111902903A (zh) * | 2018-01-26 | 2020-11-06 | 卡尔蔡司工业测量技术有限公司 | 用于辐射源的靶、用于生成侵入性电磁辐射的辐射源、辐射源的用途、以及产生用于辐射源的靶的方法 |
Families Citing this family (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102005053324B4 (de) * | 2005-11-07 | 2012-08-02 | Diamond Materials Gmbh | Target für eine Mikrofocus- oder Nanofocus-Röntgenröhre |
| DE102005053386A1 (de) * | 2005-11-07 | 2007-05-16 | Comet Gmbh | Nanofocus-Röntgenröhre |
| DE102010009276A1 (de) | 2010-02-25 | 2011-08-25 | Dürr Dental AG, 74321 | Röntgenröhre sowie System zur Herstellung von Röntgenbildern für die zahnmedizinische oder kieferorthopädische Diagnostik |
| US20150117599A1 (en) | 2013-10-31 | 2015-04-30 | Sigray, Inc. | X-ray interferometric imaging system |
| JP6253233B2 (ja) * | 2013-01-18 | 2017-12-27 | キヤノン株式会社 | 透過型x線ターゲットおよび、該透過型x線ターゲットを備えた放射線発生管、並びに、該放射線発生管を備えた放射線発生装置、並びに、該放射線発生装置を備えた放射線撮影装置 |
| US20150092924A1 (en) * | 2013-09-04 | 2015-04-02 | Wenbing Yun | Structured targets for x-ray generation |
| US9449781B2 (en) | 2013-12-05 | 2016-09-20 | Sigray, Inc. | X-ray illuminators with high flux and high flux density |
| US10295485B2 (en) | 2013-12-05 | 2019-05-21 | Sigray, Inc. | X-ray transmission spectrometer system |
| US10269528B2 (en) | 2013-09-19 | 2019-04-23 | Sigray, Inc. | Diverging X-ray sources using linear accumulation |
| US10297359B2 (en) | 2013-09-19 | 2019-05-21 | Sigray, Inc. | X-ray illumination system with multiple target microstructures |
| US9570265B1 (en) | 2013-12-05 | 2017-02-14 | Sigray, Inc. | X-ray fluorescence system with high flux and high flux density |
| US9390881B2 (en) | 2013-09-19 | 2016-07-12 | Sigray, Inc. | X-ray sources using linear accumulation |
| US10304580B2 (en) | 2013-10-31 | 2019-05-28 | Sigray, Inc. | Talbot X-ray microscope |
| USRE48612E1 (en) | 2013-10-31 | 2021-06-29 | Sigray, Inc. | X-ray interferometric imaging system |
| US9823203B2 (en) | 2014-02-28 | 2017-11-21 | Sigray, Inc. | X-ray surface analysis and measurement apparatus |
| US10401309B2 (en) | 2014-05-15 | 2019-09-03 | Sigray, Inc. | X-ray techniques using structured illumination |
| US10352880B2 (en) | 2015-04-29 | 2019-07-16 | Sigray, Inc. | Method and apparatus for x-ray microscopy |
| US10295486B2 (en) | 2015-08-18 | 2019-05-21 | Sigray, Inc. | Detector for X-rays with high spatial and high spectral resolution |
| US10247683B2 (en) | 2016-12-03 | 2019-04-02 | Sigray, Inc. | Material measurement techniques using multiple X-ray micro-beams |
| WO2018175570A1 (en) | 2017-03-22 | 2018-09-27 | Sigray, Inc. | Method of performing x-ray spectroscopy and x-ray absorption spectrometer system |
| EP3399304A1 (de) * | 2017-05-02 | 2018-11-07 | FEI Company | Innovative röntgenquelle zur verwendung in der tomographischen bildgebung |
| US10520454B2 (en) | 2017-05-02 | 2019-12-31 | Fei Company | Innovative X-ray source for use in tomographic imaging |
| US10578566B2 (en) | 2018-04-03 | 2020-03-03 | Sigray, Inc. | X-ray emission spectrometer system |
| US10989822B2 (en) | 2018-06-04 | 2021-04-27 | Sigray, Inc. | Wavelength dispersive x-ray spectrometer |
| US10658145B2 (en) | 2018-07-26 | 2020-05-19 | Sigray, Inc. | High brightness x-ray reflection source |
| US10656105B2 (en) | 2018-08-06 | 2020-05-19 | Sigray, Inc. | Talbot-lau x-ray source and interferometric system |
| US10962491B2 (en) | 2018-09-04 | 2021-03-30 | Sigray, Inc. | System and method for x-ray fluorescence with filtering |
| DE112019004478T5 (de) | 2018-09-07 | 2021-07-08 | Sigray, Inc. | System und verfahren zur röntgenanalyse mit wählbarer tiefe |
| WO2021011209A1 (en) | 2019-07-15 | 2021-01-21 | Sigray, Inc. | X-ray source with rotating anode at atmospheric pressure |
| DE112023000574T5 (de) | 2022-01-13 | 2024-10-24 | Sigray, Inc. | Mikrofokus-röntgenquelle zur erzeugung von röntgenstrahlen mit hohem fluss und niedriger energie |
| WO2023168204A1 (en) | 2022-03-02 | 2023-09-07 | Sigray, Inc. | X-ray fluorescence system and x-ray source with electrically insulative target material |
| US12181423B1 (en) | 2023-09-07 | 2024-12-31 | Sigray, Inc. | Secondary image removal using high resolution x-ray transmission sources |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR984432A (fr) * | 1943-09-23 | 1951-07-05 | Tubix Sa | Tube pour rayons x de grande longueur d'onde |
| GB1249341A (en) * | 1968-10-08 | 1971-10-13 | Rigaku Denki Company Ltd | Improvements in or relating to x-ray tubes |
| US5148462A (en) * | 1991-04-08 | 1992-09-15 | Moltech Corporation | High efficiency X-ray anode sources |
| DE19509516C1 (de) * | 1995-03-20 | 1996-09-26 | Medixtec Gmbh Medizinische Ger | Mikrofokus-Röntgeneinrichtung |
| JP2001035428A (ja) * | 1999-07-22 | 2001-02-09 | Shimadzu Corp | X線発生装置 |
-
2003
- 2003-03-26 DE DE10391780T patent/DE10391780D2/de not_active Expired - Lifetime
- 2003-03-26 WO PCT/DE2003/001004 patent/WO2003081631A1/de not_active Ceased
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111902903A (zh) * | 2018-01-26 | 2020-11-06 | 卡尔蔡司工业测量技术有限公司 | 用于辐射源的靶、用于生成侵入性电磁辐射的辐射源、辐射源的用途、以及产生用于辐射源的靶的方法 |
| CN111902903B (zh) * | 2018-01-26 | 2024-04-26 | 卡尔蔡司工业测量技术有限公司 | 用于辐射源的靶及其产生方法和辐射源及其用途 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2003081631A1 (de) | 2003-10-02 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8130 | Withdrawal |