DE102022104061A1 - Method and device for checking the temperature sensors of an electrical component - Google Patents

Abstract

A device for checking a set of n temperature sensors, with n≥3, of an electrical component is described. The device is set up to determine a set of temperature measurement values of the corresponding set of temperature sensors. The device is also set up to determine a permissible measured value interval for the measured temperature values based on the set of measured temperature values, and to identify an impaired temperature sensor from the set of temperature sensors based on the determined measured value interval.

Description

The invention relates to a method and a corresponding device for checking temperature sensors, e.g. temperature sensors on and/or in an electrical energy store.

An at least partially electrically powered vehicle includes an electrical energy store for storing electrical energy for the operation of an electric drive motor of the vehicle. The electrical energy store can include a large number of temperature sensors, in particular NTC (negative temperature coefficient) sensors, which are arranged at different points on the energy store and which are each set up to record measured values relating to the temperature of the energy store at the point of the respective temperature sensor .

During the operation of the energy store, a temperature sensor can be impaired, which leads to a falsification of the measured values recorded by the temperature sensor.

The present document deals with the technical task of detecting an impairment of a temperature sensor in an efficient, reliable and safe manner, in particular to provide temperature monitoring for an energy storage device that has a certain level of functional safety, in particular a certain ASIL (Automotive Safety integrity level) level.

The object is solved by each of the independent claims. Advantageous embodiments are described inter alia in the dependent claims. It is pointed out that additional features of a patent claim dependent on an independent patent claim without the features of the independent patent claim or only in combination with a subset of the features of the independent patent claim can form a separate invention independent of the combination of all features of the independent patent claim, which can be made the subject of an independent claim, a divisional application or a subsequent application. This applies equally to the technical teachings described in the description, which can form an invention independent of the features of the independent patent claims.

According to one aspect, a device for checking a set of n temperature sensors, with n >_ 3, of an electrical component is described. The device can also be designed to effect temperature monitoring of the electrical component (using the set of temperature sensors). The electrical component can include an electrical energy store (in particular a high-voltage store) for storing electrical energy for a drive motor of a motor vehicle. The different temperature sensors can be arranged at different locations, in particular at different storage cells, of the energy store. The individual temperature sensors can each be NTC (negative temperature coefficient) sensors.

The device is set up to determine a set of temperature measurement values of the corresponding set of temperature sensors for or at a checking time. In other words, the measured temperature values recorded by the individual temperature sensors at the time of the check can be determined.

The device is also set up to determine a permissible measured value interval for the measured temperature values (at the checking time) on the basis of the set of measured temperature values. A permissible measured value interval can thus be determined specifically for the checking time on the basis of the measured temperature values (determined for or at the checking time). This reading interval can then be used to identify a compromised temperature sensor.

To determine the measured value interval, the (arithmetic) mean value of the set of temperature measured values can be determined. Furthermore, the scatter of the set of measured temperature values can be determined. The measured value interval can then be determined in a precise manner on the basis of the mean value and/or on the basis of the scatter.

wobei x̅ der (arithmetische) Mittelwert der Temperatur-Messwerte aus der Menge von Temperatur-Messwerten ist und wobei x_i die einzelnen Temperatur-Messwerte der Menge von Temperatur-Messwerten sind.The scatter σ of the set of temperature readings can be determined as $$\sigma =\sqrt{\frac{1}{n}{\displaystyle \sum _{i=1}^n{\left(x_i-\overline{x}\right)}^2}}$$

where x̅ is the (arithmetic) mean of the temperature readings from the set of temperature readings and x _i are the individual temperature readings of the set of temperature readings.

(z.B. wenn n >_ 10 ist), oder $$Schwell{e}_{min}=\overline{x}-b\sqrt{\frac{n-1}{n}}\sigma$$

(z.B. wenn n < 10 ist). Dabei ist b ein Gewichtungsfaktor (der z.B. einen Wert zwischen 1 und 3 aufweist). Der Gewichtungsfaktor kann im Vorfeld (z.B. experimentell) festgelegt worden sein.The device can be set up to determine a minimum threshold value as the lower limit of the measured value interval $$ScHwell{e}_{min}=\overline{x}-b\cdot \sigma$$

(e.g. if n >_ 10), or $$ScHwell{e}_{min}=\overline{x}-b\sqrt{\frac{n-1}{n}}\sigma$$

(e.g. when n < 10). In this case, b is a weighting factor (eg having a value between 1 and 3). The weighting factor can have been established in advance (eg experimentally).

(z.B. wenn n >_ 10 ist), oder $$Schwell{e}_{max}=\overline{x}+b\sqrt{\frac{n-1}{n}}\sigma$$

(z.B. wenn n < 10 ist).Furthermore, the device can be set up to determine a maximum threshold value as the upper limit of the measured value interval $$ScHwell{e}_{max}=\overline{x}+b\cdot \sigma$$

(e.g. if n >_ 10), or $$ScHwell{e}_{max}=\overline{x}+b\sqrt{\frac{n-1}{n}}\sigma$$

(e.g. when n < 10).

The permissible measured value interval for the checking time can be determined in a particularly precise manner on the basis of the mean value and on the basis of the scatter of the set of temperature measured values.

The device is also set up to identify an impaired temperature sensor from the set of temperature sensors based on the determined measured value interval. In other words, the device can be set up to check, on the basis of the measured value interval determined, whether or not the set of temperature sensors has an impaired temperature sensor at the checking time. For this purpose, the individual measured temperature values can be compared with the determined measured value interval, and it can be checked in each case whether the respective measured temperature value is within or outside the permissible measured value interval.

The device can be set up to identify a temperature measurement value from the set of temperature measurement values that lies outside the determined measurement value interval. The temperature sensor from which the identified temperature reading was taken may then be identified as the compromised temperature sensor. On the other hand, a temperature sensor whose temperature reading is within the reading interval can be considered unimpaired.

A device is thus described which uses the measured temperature values from a number of temperature sensors in order to determine a permissible measured value interval for these temperature sensors, which can then be used for a reliable, safe and robust check of the individual temperature sensors. In this way, the temperature sensors can be checked and the temperature of the electrical component can be monitored, which has a high degree of functional safety.

The device may be set up to remove an impaired temperature sensor from the set of temperature sensors in order to determine a reduced set of temperature sensors. The temperature of the component can then be monitored in a particularly reliable and safe manner using the reduced number of temperature sensors. Furthermore, a check of the reduced number of temperature sensors can be carried out at a subsequent check time (with the method described in this document).

The device can be set up to determine a set of measured temperature values of the corresponding set of temperature sensors at a sequence of successive checking times. In other words, at the individual check times, the quantity of temperature measurement values recorded by the corresponding temperature sensors at the respective check time can be viewed.

Furthermore, at the respective checking time, the respective permissible measured value interval for the temperature measuring values (at the respective checking time) can be determined on the basis of the respective set of measured temperature values. On the basis of the determined measured value interval, it can then be checked whether the number of temperature sensors at the respective checking time has an impaired temperature sensor or not.

A repeated (in particular a periodic) check of the temperature sensors can thus be carried out. A permissible measured value interval can be determined at the respective check times on the basis of the measured temperature values recorded in each case. In this way, the reliability and safety of the temperature monitoring of the electrical component can be further increased.

The component can have a large number of different temperature sensors. The different temperature sensors can be arranged in different partial areas of the component, for example in an edge area or in a central area of the component. The temperature sensors in the different sub-areas of the component may have tempera Provide tur measurements that have a systematic offset to each other. For example, the temperature sensors in the edge area can have a systematic offset in relation to the temperature sensors in the central area of the component.

The device can be configured to use a classifier (e.g. using a clustering algorithm) to assign each of the different temperature sensors to a set of a plurality of different sets in order to provide a plurality of homogeneous sets of temperature sensors. The temperature sensors in a specific set then preferably have no (significant) offset relative to one another. It is thus possible to determine a number of homogeneous sets of temperature sensors, with the temperature sensors providing a set of temperature measurement values which have no significant offset relative to one another.

It can then be checked for each of the homogeneous sets of temperature sensors (by the method described in this document) whether the respective homogeneous set has a degraded temperature sensor or not. By classifying the temperature sensors into different, intrinsically homogeneous sets, the quality of the checking of the temperature sensors and thus the quality of the temperature monitoring of the electrical component can be further increased.

$$Tem{p}_{max}=\overline{x}+a\cdot \sigma$$

oder als (z.B., wenn n < 10 ist), $$Tem{p}_{min}=\overline{x}-a\sqrt{\frac{n-1}{n}}\cdot \sigma$$

$$Tem{p}_{max}=\overline{x}+a\sqrt{\frac{n-1}{n}}\cdot \sigma$$

The device can be set up to determine a minimum measured value and/or a maximum measured value for the temperature of the set of temperature sensors on the basis of the measured temperature values recorded. In this case, preferably only the recorded temperature measurement values of the reduced number of temperature sensors are considered (if an impaired temperature sensor was identified in the number of temperature sensors). A mean value and a scatter can be determined on the basis of the recorded temperature measurement values (the number of temperature sensors or the reduced number of temperature sensors). For this purpose, the formulas described in this document can be used (possibly using n - 1 instead of n if only the reduced set of temperature sensors is considered). A minimum measured value (ie a minimum temperature) and/or a maximum measured value (ie a maximum temperature) can then be determined on the basis of the mean value and/or the scatter, if necessary using the following formulae, e.g as (e.g. when n ≥ 10), $$Tem{p}_{min}=\overline{x}-a\cdot \sigma$$

$$Tem{p}_{max}=\overline{x}+a\cdot \sigma$$

or as (e.g. when n < 10), $$Tem{p}_{min}=\overline{x}-a\sqrt{\frac{n-1}{n}}\cdot \sigma$$

$$Tem{p}_{max}=\overline{x}+a\sqrt{\frac{n-1}{n}}\cdot \sigma$$

In this case, a weighting factor a<b can be used. The weighting factor a can be greater than 1 and/or less than 3, for example. The weighting factor a can be such that x% of the recorded temperature measurement values are in the temperature interval [Temp _min , Temp _max ], eg with x equal to 90 or more, or x equal to 95 or more.

The device can be set up to operate the electrical component as a function of the determined minimum measured value and/or maximum measured value. In particular, the determined maximum measured value can be compared with a temperature threshold value. The device can be set up to bring about a protective measure to protect the electrical component if it is detected that the maximum measured value is equal to or greater than the temperature threshold value. For example, the electrical component can be deactivated or degraded as a protective measure.

The device can thus be set up, on the basis of at least part of the set of measured temperature values (in particular based on the measured temperature values of the reduced set of temperature sensors (without taking into account the measured temperature value of the identified, impaired, temperature sensor) a minimum measured value and /or to determine a maximum measured value (as described in this document). Furthermore, the device can be set up to operate the electrical component as a function of the minimum measured value and/or as a function of the maximum measured value a protective measure for protecting the electrical component can be effected as a function of the minimum measured value and/or as a function of the maximum measured value.

According to a further aspect, a (road) motor vehicle (in particular a passenger car or a truck or a bus or a motorcycle) is described which comprises the device described in this document.

According to one aspect, a method for monitoring the temperature of an electrical component using a set of n temperature sensors, with n≧3. The method can alternatively or additionally be designed to identify an impaired temperature sensor.

The method includes determining a set of temperature readings from the corresponding set of temperature sensors. The method also includes determining, on the basis of the set of measured temperature values, a permissible measured value interval for the measured temperature values. The method also includes identifying an impaired temperature sensor from the set of temperature sensors based on the determined measured value interval.

According to a further aspect, a software (SW) program is described. The SW program can be set up to be executed on a processor (e.g. on a vehicle's control unit) and thereby to carry out the method described in this document.

According to a further aspect, a storage medium is described. The storage medium can comprise a SW program which is set up to be executed on a processor and thereby to carry out the method described in this document.

It should be noted that the methods, devices and systems described in this document can be used both alone and in combination with other methods, devices and systems described in this document. Furthermore, any aspects of the methods, devices and systems described in this document can be combined with one another in a variety of ways. In particular, the features of the claims can be combined with one another in many different ways. Furthermore, features listed in brackets are to be understood as optional features.

• 1a ein beispielhaftes Fahrzeug mit einem elektrischen Energiespeicher;
• 1b einen beispielhaften elektrischen Energiespeicher;
• 2 eine beispielhafte Verteilung der Messwerte einer Menge von Temperatursensoren;
• 3 einen beispielhaften zeitlichen Verlauf der Messwerte und der Temperatur-Intervallgrenzen für eine Menge von Temperatursensoren; und
• 4 ein Ablaufdiagramm eines beispielhaften Verfahrens zur Überwachung einer Menge von Temperatursensoren.

The invention is described in more detail below using exemplary embodiments. show it

• 1a an exemplary vehicle with an electrical energy storage device;
• 1b an exemplary electrical energy storage device;
• 2 an exemplary distribution of the measured values of a set of temperature sensors;
• 3 an exemplary time course of the measured values and the temperature interval limits for a set of temperature sensors; and
• 4 FIG. 10 is a flowchart of an exemplary method for monitoring a set of temperature sensors.

As explained at the outset, this document deals with the efficient and reliable monitoring of a large number of temperature sensors. In this context shows 1a an exemplary vehicle 100 with an electrical energy store 102 for storing electrical energy for the operation of an electric drive motor of the vehicle 100. The energy store 102 can have a nominal voltage of 300V or more, in particular 800V or more. The energy store 102 can be monitored by a (monitoring) device 101 . In particular, the temperature of energy store 102 can be monitored, for example in order to detect a defect in energy store 102, for example a defective storage cell in energy store 102, and/or to detect a (local) temperature increase in energy store 102.

1b shows further details of an exemplary energy storage device 102, which has a multiplicity of different storage cells 112 (eg prismatic cells or round cells) in a housing 111. FIG. Furthermore, the energy store 102 can comprise a multiplicity of different temperature sensors 113 which are arranged at different points of the energy store 102, for example at different storage cells 112 of the energy store 102. The multiplicity of temperature sensors 113 of the energy store 102 can be divided into a number of different subgroups or subsets 115 of temperature sensors 113 . In this case, temperature sensors 113 from the multiplicity of temperature sensors 113 which typically provide similar temperature measurement values (eg due to a similar spatial arrangement) can be combined to form a set 115 of temperature sensors 113 .

One or more sets 115 of temperature sensors 113 can thus be formed, with each set 115 of temperature sensors 113 providing homogeneous temperature measurement values (e.g. because the temperature sensors 113 of the respective set 115 are arranged at similarly designed locations on the energy store 102). For example, a set 115 of temperature sensors 113 for an edge area and a further set 115 of temperature sensors 113 for a central area of the energy store 102 can be formed.

An energy store 102 can thus have one or more sets 115 of temperature sensors 113 have, wherein the temperature sensors 113 within a specific set 115 have similar boundary conditions (e.g. are arranged at similar locations within the energy store 102) and/or wherein the temperature sensors 113 within a specific set 115 provide similar measured temperature values during the operation of the energy store 102.

It can happen that a temperature sensor 113 from a (homogeneous) set 115 of temperature sensors 113 is impaired, which means that the temperature measurement values of the impaired temperature sensor 113 are incorrect. In particular, it can happen that a temperature sensor 113 exhibits a drift, which leads to an offset or drift in the measured temperature values detected by the impaired temperature sensor 113 . An impaired temperature sensor 113 can in turn lead to incorrect temperature monitoring of the energy store 102 .

An impairment of a temperature sensor 113 can be detected by checking the temperature difference between the measured values of two temperature sensors 113, with the temperature sensors 113 measuring at the same point or measuring at comparable points. If the temperature difference exceeds a certain threshold, this can be taken as an indication of a degraded temperature sensor 113 . The temperature reading of the compromised temperature sensor 113 can then be qualified as invalid.

A direct comparison between the temperature readings from two temperature sensors 113 typically leads to a relatively high tolerance of the reading that is used in a partition and/or in a cluster of the energy storage device 102 for temperature monitoring if the measurement locations of the two temperature sensors 113 behave differently. There is therefore typically a relatively high ASIL (Automotive Safety Integrity Level) tolerance in accordance with ISO26262-10:2018 tolerance. A high ASIL (in particular ASIL-C) tolerance may lead to a reduced operating range of the component (in particular of the energy store 102), which leads to a reduced utilization potential of the component. For example, a relatively high ASIL tolerance of the monitoring of the temperature sensors 113 can lead to a relatively long charging time when DC charging an electrical energy store 113 or to a relatively early degradation of the performance of a vehicle 100 during dynamic driving.

A method for checking the temperature sensors 113 of an electrical component 102 (in particular an electrical energy store) is therefore described in the present document, which has a reduced ASIL tolerance and which thus enables an extended use of the electrical component 102 .

To monitor the individual temperature sensors 113 of a component 102, a homogeneous set 115 of temperature sensors 113 can be considered, which includes more than two, eg n≧5 or n≧7 or n≧10, temperature sensors 113. At a specific checking point in time, a temperature measurement value 201, 221 can be recorded by the n temperature sensors 113 (as exemplified in 2 shown). The measured temperature values 201 of the n temperature sensors 113 typically have a statistical distribution 202 with a mean value 210 around which the measured temperature values 201, 221 are distributed. Furthermore, the distribution 202 has a certain spread of the measured values 201, 221 around the mean value 210. The scatter can be described, for example, by a standard deviation or by a variance.

wobei n die Anzahl von Temperatursensoren 113 und Temperatur-Messwerte 201, 221 ist, wobei x der Mittelwert 210 der Verteilung 202 bzw. der Temperatur-Messwerte 201, 221 ist, und wobei x_i die einzelnen Temperatur-Messwerte 201, 221 sind.The scatter σ of the distribution 202 can be calculated, for example, using the following formula on the basis of the measured temperature values 201, 221: $$\sigma =\sqrt{\frac{1}{n}{\displaystyle \sum _{i=1}^n{\left(x_i-\overline{x}\right)}^2}}$$

where n is the number of temperature sensors 113 and temperature readings 201, 221, where x is the mean value 210 of the distribution 202 or of the temperature readings 201, 221, and where x _i are the individual temperature readings 201, 221.

$$Tem{p}_{max}=\overline{x}+a\cdot \sigma$$

wobei a ein Gewichtungsfaktor ist. Der zu erwarteten Minimal-Messwert und der zu erwarteten Maximal-Messwert sind in 2 durch die klein gestrichelten Intervallgrenzen 211 dargestellt.Based on the scatter σ, a minimum measured value to be expected and a maximum measured value to be expected can be determined, for example as $$Tem{p}_{min}=\overline{x}-a\cdot \sigma$$

$$Tem{p}_{max}=\overline{x}+a\cdot \sigma$$

where a is a weighting factor. The minimum measured value to be expected and the maximum measured value to be expected are in 2 represented by the small dashed interval boundaries 211 .

$$Schwell{e}_{max}=\overline{x}+b\cdot \sigma$$

wobei b ein Gewichtungsfaktor ist, der z.B. gemäß dem Grubbs-Test zur Erkennung von Ausreißern festgelegt werden kann. Der Minimal-Schwellenwert und der Maximal-Schwellenwert sind in 2 durch die groß gestrichelten Intervallgrenzen 212 dargestellt.Alternatively or additionally, a minimum threshold value and a maximum threshold value can be defined for detecting an outlier, for example as a $$ScHwell{e}_{min}=\overline{x}-b\cdot \sigma$$

$$ScHwell{e}_{max}=\overline{x}+b\cdot \sigma$$

where b is a weighting factor, eg according to the Grubbs test for detecting outliers can be set. The minimum threshold and the maximum threshold are in 2 represented by the large dashed interval boundaries 212 .

It can be checked whether a temperature measurement value 221 from the n temperature measurement values 201, 222 is located outside the measurement value interval [threshold _min , threshold _max ]. If this is the case, this temperature measurement value 221 can be classified as incorrect. The corresponding temperature sensor 113 can then be removed from the set 115 of temperature sensors 113 as the impaired temperature sensor 113 .

$$Tem{p}_{max}=\overline{x}-a\sqrt{\frac{n-1}{n}}\cdot \sigma$$

und $$Schwell{e}_{min}=\overline{x}-b\sqrt{\frac{n-1}{n}}\sigma$$

$$Schwell{e}_{max}=\overline{x}-b\sqrt{\frac{n-1}{n}}\sigma$$

If there is a relatively small number n of temperature sensors 113 (e.g. n<10), the minimum/maximum measured values or the minimum/maximum threshold values can be calculated using the following formulas, $$Tem{p}_{min}=\overline{x}-a\sqrt{\frac{n-1}{n}}\cdot \sigma$$

$$Tem{p}_{max}=\overline{x}-a\sqrt{\frac{n-1}{n}}\cdot \sigma$$

and $$ScHwell{e}_{min}=\overline{x}-b\sqrt{\frac{n-1}{n}}\sigma$$

$$ScHwell{e}_{max}=\overline{x}-b\sqrt{\frac{n-1}{n}}\sigma$$

The device 101 for temperature monitoring of a component 102 (in particular an energy store) can thus be set up, based on the temperature measured values 201, 221 of a (homogeneous) set 115 of temperature sensors 113 of the component 102, a permissible measured value interval [threshold _min , threshold _max ]. It can then be checked whether a measured temperature value 201, 221 is outside the permissible measured value interval. If this is the case, then the temperature sensor 113 of the identified temperature reading 221 can be identified as degraded. This temperature sensor 113 can then be picked out of the set 115 of temperature sensors 113 used to monitor the component 102 .

By determining the permissible measured value interval on the basis of the temperature measured values 201, 221 recorded by the temperature sensors 113, robust sensor monitoring with a relatively low ASIL tolerance can be provided. As a result, the allowable operating range of the component 102 can be expanded.

The temperature monitoring can, as exemplified in 3 shown, are repeated at a sequence of consecutive monitoring times. In 3 the horizontal axis corresponds to the time axis. The vertical axis shows the temperature readings 201, 221 from the temperature sensors 113. A set of measured temperature values 201, 221 for the corresponding set of temperature sensors 113 can be determined at each checking time. Based on this, a mean value 210, 310 of the measured temperature values 201, 221, a minimum threshold value 311 and/or a maximum threshold value 312 can then be determined. It can then be checked in each case whether the measured temperature values 201, 221 are between the minimum threshold value 311 and the maximum threshold value 312 or not, in order to identify an impaired temperature sensor 113 if necessary.

As explained above, a component 102 can have a multiplicity of different temperature sensors 113 which are arranged at different points of the component 102 . In this case, subsets 115 of the temperature sensors 113 can be arranged on the component 102 in such a way that the temperature sensors 113 of a subset 115 each provide similar temperature measured values 201 .

Prior to the monitoring of the multiplicity of temperature sensors 113, the temperature sensors 113 can be classified in such a way that homogeneous subsets 115 of temperature sensors 113 are formed. The individual subsets 115 of temperature sensors 113 can then be monitored as described in this document. The temperature sensors 113 can each be assigned to one of the subsets 115 in such a way that the (non-impaired) temperature sensors 113 within a subset 115 provide measured temperature values 201 that lie in the temperature interval [Temp _min , Temp _max ]. The temperature interval is typically smaller than the corresponding measured value interval. The temperature interval can be selected to be relatively small in order to provide subsets 115 of temperature sensors 113 that are as homogeneous as possible. On the other hand, the temperature interval can be chosen sufficiently large to obtain a sufficiently high number n of temperature sensors 113 per subset 115 . The temperature sensors 113 can be classified using a clustering algorithm for clustering the temperature measurement values 201 of the temperature sensors 113 .

As part of the procedure described in this document, a permissible measurement interval for the temperature measurement values 201 determined, which is not constant but depends on the scatter of the temperature measurement values 201 . As a result, the ASII,-C tolerance is dependent on the respective operating case, which means that the operating potential of the component 102 to be monitored is better utilized. Furthermore, the maximum temperature and the minimum temperature of the component 102 (in particular of the energy store) can be determined. These can be determined on the basis of the scatter of the measured temperature values 201 .

4 shows a flow chart of a (possibly computer-implemented) method 400 for temperature monitoring of an electrical component 102 (in particular an electrical energy storage device, which comprises, for example, several storage cells) using a set 115 of n temperature sensors 113, with n ≥ 3 (preferably n ≥ 5 or n ≥ 7). The temperature sensors 113 can be arranged at different points of the electrical component 102 . Furthermore, the temperature sensors 113 can be designed and/or arranged on the electrical component 102 in such a way that the temperature sensors 113 typically acquire measured temperature values 201 at a check point in time that are similar to one another and/or that have no systematic offset to one another (if none of the temperature sensors 113 is impaired, in particular has a drift). In particular, the temperature sensors 113 of the set 115 can be designed to provide temperature measurement values 201 at any checking time with a certain probability (e.g. of 90% or more) that are within a certain temperature interval (e.g. [Temp _min , Temp _max ]) lay. The temperature interval is typically smaller than the measured value interval (described in this document). A homogeneous set 115 of temperature sensors 113 can thus be considered.

As part of the monitoring of the electrical component 102 based on the measured temperature values 201 of the temperature sensors 113, the temperature sensors 113 can be checked in order to identify an impaired temperature sensor 113 (in particular a temperature sensor 113 with a drift). A degraded temperature sensor 113 can be excluded from monitoring the electrical component 102 in order to increase the reliability and the quality of the temperature monitoring of the electrical component 102 .

The method 400 may be repeatedly (e.g., periodically) performed at a sequence of consecutive verification times. The method 400 can include, for a verification point in time, the determination 401 of a set of measured temperature values 201 of the corresponding set 115 of temperature sensors 113. In other words, it can be carried out at the respective verification point in time based on the set 115 of temperature sensors 113 a corresponding set of measured temperature values 201 can be recorded.

The method 400 also includes determining 402, on the basis of the set of measured temperature values 201, a permissible measured value interval for the measured temperature values 201. The measured value interval can depend on the scatter of the set of measured temperature values 201. A specific measured value interval can thus be determined for the checking time, which is typically different for different checking times.

The method 400 also includes identifying 403 an impaired temperature sensor 113 from the set 115 of temperature sensors 113 based on the determined measured value interval. In other words, it can be checked on the basis of the measured value interval determined whether (precisely) one of the temperature sensors 113 is impaired or not. As discussed above, a compromised temperature sensor 113 may be excluded from temperature monitoring of component 102 to allow for accurate and safe temperature monitoring of component 102.

The present invention is not limited to the exemplary embodiments shown. In particular, it should be noted that the description and the figures are only intended to illustrate the principle of the proposed methods, devices and systems by way of example.

Claims (11)

Device (101) for checking a set (115) of n temperature sensors (113), with n ≥ 3, of an electrical component (102); wherein the device (101) is set up for a verification time, - to determine a set of measured temperature values (201) of the corresponding set (115) of temperature sensors (113); - to determine a permissible measurement interval for the temperature measurement values (201) on the basis of the set of temperature measurement values (201); and - identify an impaired temperature sensor (113) from the set (115) of temperature sensors (113) based on the measured value interval. Device (101) according to claim 1 , wherein the device (101) is set up - to identify a measured temperature value (221) from the set (115) of measured temperature values (201) which lies outside the determined measured value interval; and - identify the temperature sensor (113) from which the identified temperature reading (221) was taken as the compromised temperature sensor (113). Device (101) according to one of the preceding claims, wherein the device (101) is set up - removing the compromised temperature sensor (113) from the set (115) of temperature sensors (113) to determine a reduced set (115) of temperature sensors (113); and - carry out a temperature monitoring of the component (102) on the basis of the reduced quantities (115) of temperature sensors (113). Device (101) according to one of the preceding claims, wherein the device (101) is set up - to determine a mean value (210, 310) of the set of temperature measurement values (201); - to determine a scatter of the set of temperature measurement values (201); and - determine the measured value interval on the basis of the mean value (210, 310) and on the basis of the scatter. Device (101) according to claim 4 , wherein the device (101) is set up to determine the scattering σ as $$\sigma =\sqrt{\frac{1}{n}{\displaystyle \sum _{i=1}^n{\left(x_i-\overline{x}\right)}^2}}$$

where x is the mean (210, 310) of the temperature readings (201), and where x _i are the individual temperature readings (201) of the set of temperature readings (201). Device (101) according to one of Claims 4 until 5 , wherein the device (101) is set up - to determine a minimum threshold value (311) as the lower limit of the measured value interval, as $$ScHwell{e}_{min}=\overline{x}-b\cdot \sigma$$

or $$ScHwell{e}_{min}=\overline{x}-b\sqrt{\frac{n-1}{n}}\sigma$$

where x is the mean (210, 310) of the temperature readings (201), where σ is the spread, and where b is a weighting factor; and/or - to determine a maximum threshold value (312) as the upper limit of the measured value interval, as $$ScHwell{e}_{max}=\overline{x}+b\cdot \sigma$$

or $$ScHwell{e}_{max}=\overline{x}+b\sqrt{\frac{n-1}{n}}\sigma .$$

Device (101) according to any one of the preceding claims, wherein the device (101) is arranged at a sequence of consecutive verification times, respectively - to determine a set of measured temperature values (201) of the corresponding set (115) of temperature sensors (113); - to determine the respective permissible measurement interval for the temperature measurement values (201) on the basis of the set of temperature measurement values (201); and - to check on the basis of the measured value interval whether the set (115) of temperature sensors (113) at the respective check time has an impaired temperature sensor (113) or not. Device (101) according to any one of the preceding claims, wherein - The component (102) has a plurality of different temperature sensors (113); and - the device (101) is set up, - to assign the different temperature sensors (113) to a set (115) from a plurality of different sets (115) using a classifier, in order to provide a plurality of homogeneous sets (115) of temperature sensors (113); and - checking for each of the homogeneous sets (115) of temperature sensors (113) whether the respective homogeneous set (115) has a degraded temperature sensor (113) or not. Device (101) according to one of the preceding claims, wherein the device (101) is set up - to determine a minimum measured value and/or a maximum measured value on the basis of at least part of the set of measured temperature values (201); and - operate the electrical component (102) as a function of the minimum measured value and/or as a function of the maximum measured value. Device (101) according to one of the preceding claims, wherein the electrical component (102) comprises an electrical energy store for storing electrical energy for a drive motor of a motor vehicle (100). Method (400) for checking a set (115) of n temperature sensors (113), with n ≥ 3, of an electrical component (102); where the method (400) comprises, - determining (401) a set of measured temperature values (201) of the corresponding set (115) of temperature sensors (113); - determining (402), on the basis of the set of measured temperature values (201), a permissible measured value interval for the measured temperature values (201); and - identifying (403) an impaired temperature sensor (113) from the set (115) of temperature sensors (113) using the measured value interval determined.

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