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DE102011122230B8 - Optikanordnung und Verfahren zum Untersuchen oder Bearbeiten eines Objekts - Google Patents

Optikanordnung und Verfahren zum Untersuchen oder Bearbeiten eines Objekts Download PDF

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Publication number
DE102011122230B8
DE102011122230B8 DE102011122230.1A DE102011122230A DE102011122230B8 DE 102011122230 B8 DE102011122230 B8 DE 102011122230B8 DE 102011122230 A DE102011122230 A DE 102011122230A DE 102011122230 B8 DE102011122230 B8 DE 102011122230B8
Authority
DE
Germany
Prior art keywords
examining
processing
optical arrangement
optical
arrangement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE102011122230.1A
Other languages
English (en)
Other versions
DE102011122230B4 (de
DE102011122230A1 (de
Inventor
Michael Mei
Ronald Holzwarth
Marc Fischer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Menlo Sys GmbH
Menlo Systems GmbH
Original Assignee
Menlo Sys GmbH
Menlo Systems GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Menlo Sys GmbH, Menlo Systems GmbH filed Critical Menlo Sys GmbH
Priority to DE102011122230.1A priority Critical patent/DE102011122230B8/de
Priority to US13/723,922 priority patent/US8816302B2/en
Publication of DE102011122230A1 publication Critical patent/DE102011122230A1/de
Publication of DE102011122230B4 publication Critical patent/DE102011122230B4/de
Application granted granted Critical
Publication of DE102011122230B8 publication Critical patent/DE102011122230B8/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J19/00—Chemical, physical or physico-chemical processes in general; Their relevant apparatus
    • B01J19/08—Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor
    • B01J19/12—Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor employing electromagnetic waves
    • B01J19/121—Coherent waves, e.g. laser beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6402—Atomic fluorescence; Laser induced fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/069—Supply of sources
    • G01N2201/0696—Pulsed
    • G01N2201/0697—Pulsed lasers

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Microscoopes, Condenser (AREA)
DE102011122230.1A 2011-12-23 2011-12-23 Optikanordnung und Verfahren zum Untersuchen oder Bearbeiten eines Objekts Active DE102011122230B8 (de)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE102011122230.1A DE102011122230B8 (de) 2011-12-23 2011-12-23 Optikanordnung und Verfahren zum Untersuchen oder Bearbeiten eines Objekts
US13/723,922 US8816302B2 (en) 2011-12-23 2012-12-21 Optical arrangement and method for examining or processing an object

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102011122230.1A DE102011122230B8 (de) 2011-12-23 2011-12-23 Optikanordnung und Verfahren zum Untersuchen oder Bearbeiten eines Objekts

Publications (3)

Publication Number Publication Date
DE102011122230A1 DE102011122230A1 (de) 2013-06-27
DE102011122230B4 DE102011122230B4 (de) 2023-03-16
DE102011122230B8 true DE102011122230B8 (de) 2023-07-06

Family

ID=48575586

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102011122230.1A Active DE102011122230B8 (de) 2011-12-23 2011-12-23 Optikanordnung und Verfahren zum Untersuchen oder Bearbeiten eines Objekts

Country Status (2)

Country Link
US (1) US8816302B2 (de)
DE (1) DE102011122230B8 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102014005671A1 (de) * 2014-04-20 2015-10-22 Keming Du Optische Anordnung zur Einstellung von Strahlverteilung und/oder zur Veränderung von Pulsprofil
US10485437B2 (en) * 2015-03-30 2019-11-26 Bose Corporation Light guide system for physiological sensor
WO2017004656A1 (en) 2015-07-03 2017-01-12 The University Of Adelaide System and method for generating an optical frequency standard
CN105511030B (zh) * 2016-01-15 2017-05-03 京东方科技集团股份有限公司 一种激光脉冲延时系统和激光退火系统
US9945730B2 (en) * 2016-09-02 2018-04-17 Cymer, Llc Adjusting an amount of coherence of a light beam
US10274310B2 (en) 2016-12-22 2019-04-30 The Boeing Company Surface sensing systems and methods for imaging a scanned surface of a sample via sum-frequency vibrational spectroscopy
CN115356264A (zh) * 2022-08-12 2022-11-18 大连理工大学 一种硅片中位裂纹与侧位裂纹分离化检测方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10056382A1 (de) 2000-11-14 2002-05-23 Leica Microsystems Lichtquelle zur Beleuchtung in der Scanmikroskopie und Scanmikroskop
DE10235914A1 (de) 2002-08-06 2004-02-19 Leica Microsystems Heidelberg Gmbh Lichtquelle zur Beleuchtung mikroskopischer Objekte und Scanmikroskopsystem

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4461686A (en) * 1981-12-03 1984-07-24 Allied Corporation Sequential multiphoton excitation method
US6483735B1 (en) * 1989-04-25 2002-11-19 The Regents Of The University Of California Two-photon, three-or four-dimensional, color radiation memory
US5034613A (en) 1989-11-14 1991-07-23 Cornell Research Foundation, Inc. Two-photon laser microscopy
US6108081A (en) 1998-07-20 2000-08-22 Battelle Memorial Institute Nonlinear vibrational microscopy
DE19911103B4 (de) 1999-03-12 2005-06-16 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Erzeugung stabilisierter, ultrakurzer Lichtpulse und deren Anwendung zur Synthese optischer Frequenzen
US6844963B2 (en) * 2000-03-23 2005-01-18 Olympus Optical Co., Ltd. Double-resonance-absorption microscope
DE10044404C2 (de) 2000-09-08 2002-08-14 Max Planck Gesellschaft Verfahren und Vorrichtung zur Erzeugung von stabilisierten ultrakurzen Laser-Lichtpulsen
DE102006023601B4 (de) 2006-05-19 2009-01-15 Menlo Systems Gmbh Lasersystem
DE102008026484A1 (de) 2008-06-03 2009-12-10 Skz - Kfe Ggmbh Kunststoff-Forschung Und -Entwicklung Verfahren zum Erzeugen zweier optischer Pulse mit variablem, zeitlichem Pulsabstand
US8610996B2 (en) * 2010-05-06 2013-12-17 Leica Microsystems Cms Gmbh Tunable multiple laser pulse scanning microscope and method of operating the same

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10056382A1 (de) 2000-11-14 2002-05-23 Leica Microsystems Lichtquelle zur Beleuchtung in der Scanmikroskopie und Scanmikroskop
DE10235914A1 (de) 2002-08-06 2004-02-19 Leica Microsystems Heidelberg Gmbh Lichtquelle zur Beleuchtung mikroskopischer Objekte und Scanmikroskopsystem

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
Broschüre MenloSystems FC1500 Optial frequency synthesizer(https://web.archive.org/web/20101215163651/http://www.menlosystems.com/home/products/optical-frequency-combs/fc1500-250-optical-frequency-synthesizer-overview.html,m2; abgerufen über WaybackMachine, spätestens verfügbar ab dem 15.12.2010)
Squier, Jeff, and Michiel Müller. "High resolution nonlinear microscopy: A review of sources and methods for achieving optimal imaging." Review of Scientific Instruments 72.7 (2001): 2855-2867

Also Published As

Publication number Publication date
DE102011122230B4 (de) 2023-03-16
US8816302B2 (en) 2014-08-26
DE102011122230A1 (de) 2013-06-27
US20130161538A1 (en) 2013-06-27

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R012 Request for examination validly filed
R016 Response to examination communication
R016 Response to examination communication
R018 Grant decision by examination section/examining division
R020 Patent grant now final