DE102008004162A1 - Terminal contact, IC test socket and procedure - Google Patents

Abstract

In summary, the present invention relates to a terminal contact (10) for an IC test socket, comprising: a contact pin (12) having a spring contact area (18) designed to contact a spring element (14), an IC contact area ( 28) adapted to contact an IC, and comprising - a spring attachment portion (24), the contact pin (12) being integrally formed, and the terminal contact further comprising - a spring member (14) having - a contact pin attachment portion (36), wherein the spring attachment portion (24) and the contact pin attachment portion (36) are connected to each other so that the contact pin (12) and the spring member (14) are fixed to each other, and an IC test socket and a method of manufacturing.

Description

The The present invention relates to a terminal contact for an IC test socket, a IC test socket and a method of manufacturing.

traditionally, become connection contacts for integrated circuit (IC) test socket used such that a plurality of these terminal contacts in a matrix in the IC test socket are arranged. Each of the terminal contacts contacted in operational use a corresponding contact of the IC. Furthermore, everyone contacts connection contact an evaluation device, in particular a printed circuit board, with a measuring device signal technology connected is. The connection contact is conventionally resiliently stored in the IC test socket, so that the connection contact can come into electrical contact with the IC when the IC, for example from the top of the IC test socket is placed without the terminal contact soldered to the IC must become.

by virtue of the small dimensions are conventional terminal contacts made manually. conventional connecting contacts consist of a housing, in which a contact pin for contacting the IC is housed. Furthermore, a contact pin for contacting the evaluation device in the case accommodated. The housing is conventional approximately hollow cylindrical formed, with the two Kotaktpins on opposite Ends from the case protrude. Between the contact pins a spring is arranged, which pushes the two contact pins away from each other and in particular causes that the two contact pins from the housing protrude. To the connection contact to make the first contact pin, the intermediate Spring and the second contact pin arranged in the hollow cylinder and the ends of the hollow cylinder are tapered, So that the Although contact pins are movable, but not completely leave the hollow cylinder can.

Becomes an IC placed on the test socket presses the contact pin due the spring force against the IC, causing contact between the contact pin and the IC.

Corresponding presses the other contact pin against the evaluation. To test The IC can exchange signals between the IC and the evaluation device where the signal originates from the IC via the first contact pin, the housing and the second contact pin is routed to the evaluation device (and vice versa). Signals for testing ICs are regularly very high sensitive.

It It is therefore an object of the present invention that a terminal contact with good signal transmission can be produced in a simple and safe manner. This task will solved through the terminal contact according to claim 1, the IC test socket according to claim 14 and the method for producing the terminal according to claim 15. Preferred embodiments are the subject of the dependent Claims.

Terminal contact according to a aspect

• – einen Kontaktstift mit
• – einem Federkontaktbereich, der ausgelegt ist, ein Federelement zu kontaktieren,
• – einem IC-Kontaktbereich, der ausgelegt ist, einen IC zu kontaktieren und mit
• – einem Federbefestigungsbereich, wobei der Kontaktstift einstückig ausgebildet ist, und wobei er Anschlußkontakt ferner
• – ein Federelement mit
• – einem Kontaktstiftbefestigungsbereich umfaßt, wobei der Federbefestigungsbereich und der Kotaktstiftbefestigungsbereich derart miteinander verbunden sind, daß der Kontaktstift und das Federelement aneinander fixiert sind.

One aspect of the present invention relates to a terminal contact for an IC test socket comprising:

• - a contact pin with
• A spring contact area configured to contact a spring element,
• An IC contact area designed to contact and communicate with an IC
• - A spring mounting portion, wherein the contact pin is integrally formed, and wherein it further contact terminal
• - A spring element with
• - Includes a contact pin mounting portion, wherein the spring mounting portion and the Kotaktstiftbefestigungsbereich are connected to each other such that the contact pin and the spring element are fixed to each other.

Of the The term "integral" describes that the contact pin in the terminal contact a single, coherent one Unit forms. Here, the contact pin can be made in one piece be, for. B. as a piece can be poured, pulled, sprayed etc. The contact pin can also have multiple elements that are interconnected, for example inserted into each other, in particular pressed and / or each other glued, soldered welded are, etc., for example the IC contact area and the spring contact area be two separate components, however connected to each other. The two components can, for. B. by means of the spring mounting portion (as a separate separate Component) be connected to each other, so that the contact pin is a unit forms.

Of the Term "IC" stands for "integrated circuit. "An IC may for example be part of a microprocessor. One IC can also be part of another electronic or be electrical device. An IC can in particular any Kind of so-called "embedded electronic " or its component.

The IC contact region is in particular designed to contact a contact point or a contact element of the IC. The IC may have a plurality of contact elements. The contact elements can preferably be arranged like a matrix be. Each contact element can, for. B. have a soldering point or a similar configuration that can contact the IC contact area. In particular, it is possible that the IC contact region at least partially penetrates into the contact element. This is possible, for example, if the contact element comprises a metal or another conductive material, which is preferably softer than the IC contact region, so that by exerting a force, the IC contact region can at least partially penetrate into the contact element. Thus, a particularly good electrical and / or mechanical contact between the IC contact region and the contact element of the IC is advantageously made possible.

advantageously, can the terminal contact in easier and more reliable Way, since it is not necessary in particular Components of the terminal, such as B. contact pins and spring to be arranged in a housing. Rather, it can attached in a simple manner, the spring element on the contact pin be, causing the terminal contact already made. In particular, advantageously connection contact thus manually produced in a simple and reliable manner, since only the contact pin are pushed into the spring element must and the spring contact area and the contact pin contact area with each other need to be connected. The spring contact area and the contact pin contact area can hereby a positive connection and / or Having adhesion. In particular, you can Spring contact area and the contact pin contact area with each other pressed welded, soldered be, etc. Thus, it is further advantageously possible that also in Applying a force to the spring element and / or the contact pin the connection between the spring contact area and the contact pin contact area preserved. In other words, the term "fixed" describes that on the contact pin and spring element oppositely directed forces can be applied, wherein the connection is maintained when a force is between about 0.01 N and about 5 N is applied, i. H. the spring element and the contact pin not be separated from each other. The force may preferably be greater than about 0.05 N, greater than about 0.1N, greater than about 0.2 N, greater than about 0.5 N, greater than be about 1N. The force can be less than about 4 N, less than about 3N, less than about 2N, less than about 1.5N.

Farther Advantageously, thus an electrical signal transmission between the IC and an evaluation device improved since the Number of electrical transition contacts, the signal from the IC to the evaluation via the connection contact must happen compared to a conventional one connection contact with two in a housing arranged contact pins, is reduced (see below).

Preferred embodiments of the connection contact

Preferably For example, the IC contact area has at least six contact tips and the contact tips are designed to be a contact element of an IC to contact.

Of the IC contact area can also be more than six contact tips, z. B. 8, 10, 12, etc. have contact tips. Advantageously Thus achieved that the IC contact area a contact element of the IC contacted reliably, in particular a good electrical contact with a low contact resistance is achieved and therefore also an improved signal transmission.

Preferably the IC contact area has at least six contact edges, wherein the contact edges are designed at least partially, a contact element to contact an IC.

Of the IC contact area can also be more than six contact edges, z. B. 8, 10, 12, etc. have contact edges. Advantageously Thus achieved that the IC contact area a contact element of the IC contacted reliably, in particular a good electrical contact with a low contact resistance is achieved and thus also an improved signal transmission. Here, each contact edge, the contact area at least partially to contact. It is also possible, that each Contact edge of the IC or a contact element of the IC substantially along the entire length of the Contact edge contacted. Thus, a contact length of Contact edges increased with the contact element, causing the mechanical and / or electrical contact is improved, in particular the ohmic Contact resistance between the contact edges and the contact element of Reduces ICs and thus achieved an improved signal transmission.

Preferably For example, the IC contact region has at least twelve contact surfaces and the contact surfaces are at least partially designed, a contact element of a Contact ICs, in particular capacitive with a contact element to be coupled to an IC.

The IC contact area may also have more than twelve contact areas, e.g. B. 14, 16, 18, 20, etc. have contact surfaces. Advantageously, it is thus achieved that the IC contact region reliably contacts a contact element of the IC, in particular good electrical contact with a low contact resistance being achieved. Further advantageously, due to the large number of Contact surfaces achieved a high capacitive coupling of the IC contact region with the contact element of the ICs. Consequently, an improved signal transmission is achieved. Preferably, the spring element and the contact pin are connected together such that the terminal contact is free of housing.

advantageously, is it thus possible the connection contact in a simple and cost-effective manner manufacture.

Preferably comprises the spring element is a contact area and the contact area designed, an electronic component, in particular a printed circuit board to contact.

advantageously, it is not necessary to connect the terminal with another, to provide separate contact pin, causing the terminal contact in easier and cheaper Way can be produced. Advantageously, it is not in particular necessary that the connection contact provided with a housing is.

Of the Term "fixed" describes that the spring attachment area the spring element and the Kotaktstiftbefestigungsbereich the contact pin preferably connected to each other in such a way that upon application of a force the spring element with a longitudinal direction LR of the terminal contact substantially parallel force component between about 0.1 N and about 2 N, the spring element and the contact pin connected to each other stay.

Of the connection contact is advantageously stable enough formed that the terminal contact no casing needed d. H. housing free is. This is achieved in particular by the fact that the spring element and the Contact pin are so firmly connected to each other, d. H. the spring element and the contact pin are fixed to one another (or vice versa), that at intended use and also in the intended production of connection contact the spring element and the contact pin remain connected to each other.

Preferably the contact pin and the spring element are connected to each other in such a way that the IC contact area outside the spring element is arranged and the spring contact region at least partially, especially complete is disposed within the spring element.

advantageously, Thus, the IC contact area can be contacted with the IC in a simple manner. By the arrangement of the spring contact area in the interior of the spring element it is advantageously possible in a simple manner to ensure that the spring contact area in the contact position or the contact state of the terminal contact contacted the spring element. Thus, in a simple way a reliable signal transport from the contact pin over the Spring element on the evaluation possible.

Preferably the contact pin between the IC contact area and the spring contact area in the radial direction, a projection, wherein the projection in such a way is formed, that the spring element along the longitudinal direction LR can not pass the lead.

Preferably the projection is a separate element which is pressed onto the contact pin or with pressed the contact pin is. It is also possible that the lead connected in another way with the contact pin, z. B., the projection may be glued to the contact pin, soldered, welded etc. It is also possible that the Contact pin (incl. Projection) is made of one piece, for example sprayed, pulled, pressed, etc.

advantageously, is therefore a simple and reliable installation of the spring element possible with the contact pin, since the contact pin is slidable into an interior of the spring element, until the projection abuts the spring element (or vice versa, the spring element on the Push pin until the spring element abuts against the projection).

The longitudinal direction For example, LR is a direction parallel to a longitudinal axis the contact pin and / or the spring element is arranged. For example can be the longitudinal direction LR parallel to at least one cylinder axis of the contact pin and / or the spring element.

Preferably the spring element has at least three spring element regions, wherein the spring element in an inner or middle (in terms of on the longitudinal direction LR) spring element region along the longitudinal direction LR more extensible and / or is compressible than in the remaining spring element areas.

In In other words, the inner or middle region can be more elastic be than the remaining areas, i. H. the remaining areas can be stiffer be as the inner or middle area. A remaining area For example, the transition region and the contact pin contact region shown in the figures include. Another remaining area can be, for example, the Be pin attachment area.

Of the Term includes "along" a direction in particular parallel and / or antiparallel to this direction.

Preferably is the spring element is a coil spring, wherein the distance of Spiral turns of the spiral spring of the inner and middle (in terms of on the longitudinal direction LR) spring element area is larger as the distance of the spiral turns of the other spring element areas the spiral spring.

Preferably, the spring element and the spring contact region are arranged and configured such that in a state of rest ( 1 ) of the terminal contact of the spring contact area and the spring element are non-contact.

Of the Hibernation of the connection contact For example, the state in which at the terminal contact essentially no outer forces are present. For example, the idle state of the terminal contact may be present when the connection contact is on a horizontal plane in the frame of reference of the earth, d. H. if the longitudinal axis the connection contact, in particular the longitudinal axis the contact pin is substantially parallel. The resting state is in particular the state in which along the longitudinal axis of the spring element no force is applied to the spring element, d. H. the spring element along the longitudinal direction is essentially not compressed and not stretched.

Preferably the spring element is compressible along the longitudinal direction LR, that in a contact state of the spring contact region at least one turn of the contact area.

IC test socket according to one aspect

• – in jeder Öffnung ein Anschlußkontakt gemäß einem der vorhergehenden Ansprüche angeordnet ist,
• – die Öffnungen mittels einer gemeinsamen Abdeckung verschlossen sind,
• – der Kontaktbereich eines jeden Anschlußkontakts entlang der Längsrichtung über das Gehäuse des IC-Testsockels hinausragt und wobei
• – der IC-Kontaktbereich durch die Abdeckung hindurch ragt und entlang der Längsrichtung über das Gehäuse des IC-Testsockels hinausragt.

One aspect of the present invention relates to an IC test socket having a housing having a plurality of openings, wherein

• In each opening a connection contact according to one of the preceding claims is arranged,
• - The openings are closed by a common cover,
• - The contact area of each terminal along the longitudinal direction protrudes beyond the housing of the IC test socket and wherein
• - The IC contact area protrudes through the cover and protrudes along the longitudinal direction over the housing of the IC test socket.

Method according to one aspect

• – Bereitstellen des Kontaktstiftes
• – Bereitstellen des Federelements
• – Einführen des Kontaktstiftes in das Federelement
• – Verbinden des Kontaktstiftbefestigungsbereichs mit dem Federbefestigungsbereich.

One aspect of the present invention relates to a method for producing a connection contact according to the invention with the steps:

• - Providing the contact pin
• - Providing the spring element
• - Insertion of the contact pin in the spring element
• - Connect the contact pin attachment area with the spring attachment area.

Of the Term "Introduce" describes one Relative movement, d. H. that the Contact pin is fixed and the spring element relative to the fixed contact pin is moved, in particular via the contact pin is pushed. Alternatively, the spring element is fixed and the Contact pin is moved relative to the fixed spring element, pushed in particular into the spring element. Alternatively pushed both the spring element and the contact pin.

Preferred embodiments of the procedure

Preferably the contact pin is inserted as far into the spring element until the contact pin attachment portion abuts the projection.

Preferably bumps the contact pin attachment area while connecting the spring element and contact pin to the projection.

The The invention is not limited to the aspects or embodiments described above limited. Much more can individual features of the aspects and / or embodiments detached from the corresponding aspect or the corresponding embodiment be combined with each other and in particular thus new embodiments be formed. In other words, the above statements apply to the individual features of the device mutatis mutandis, for the IC test socket as well as the process and vice versa.

figure description

preferred embodiments a connection contact will be described by way of example with reference to accompanying figures. It shows

1 : A side view of an exemplary terminal contact;

2 : a view according to 1 ;

3 : a view according to 1 ;

4 : a view according to 1 ;

5 : a supervision of a terminal contact;

6 : A perspective view of a terminal contact.

1 shows a connection contact 10 with a contact pin 12 and a spring 14 as a preferred spring element. The feather 14 is at least be shown sectioned cut. 1 shows the connection contact 10 in a substantially relaxed state, ie on the spring 14 There is substantially no force along a longitudinal direction LR. In other words shows 1 the terminal contact in the idle state. The longitudinal direction LR is substantially parallel to an axis of symmetry 16 of the connection contact 10 , The in 1 shown contact pin 12 is executed at least partially cylindrical. Preferably, the axis of symmetry 16 equal to a cylinder axis 16 the cylindrical portions of the contact pin 12 ,

The contact pin 12 has several areas. In particular, the contact pin 12 a spring contact area 18 , a transition area 20 , an inner or middle area 22 , a spring attachment area 24 , a projection area 26 and an IC contact area 28 on. The feather 14 is preferably a coil spring 14 that has a contact area or contact pin contact area 30 , a transition area 32 , an inner or middle area 34 and a contact pin attachment area 36 having.

The spring contact area 18 of the contact pin 12 is particularly dimensioned and designed so that it the contact pin contact area 30 the feather 14 can contact. The transition area 32 the feather 14 is particularly dimensioned and designed so that the transition region 32 the contact pin 12 , in particular the spring contact area 18 of the contact pin 12 can lead to the spring contact area 18 of the contact pin 12 with the contact pin contact area 30 the feather 14 can contact when the spring 14 is compressed.

The spring attachment area 24 of the contact pin 12 is particularly dimensioned and designed so that the spring attachment area 24 with the contact pin attachment area 36 the feather 14 can get in contact. In particular, the spring attachment area 24 of the contact pin 12 and the contact pin attachment area 36 the feather 14 coordinated so that the spring 14 at the contact pin 12 is fixed. For example, the inner diameter of the contact pin attachment area 36 smaller than the outer diameter of the spring attachment portion 24 so that to mount the spring 14 to the contact pin 12 the contact pin attachment area 36 must be stretched in the radial direction and / or the spring mounting portion must be compressed in the radial direction. The feather 14 is in the contact pin attachment area 36 formed resiliently in the radial direction such that a force against the radial direction of the contact pin attachment region 36 on the spring attachment area 24 is transmitted. Accordingly, the spring attachment area 24 be formed resilient in the radial direction. This will be the spring 14 at the contact pin 12 fixed. For example, the spring attachment area 24 Recesses in the form of grooves or grooves or grooves 38a . 38b . 38c etc. have. Each groove 38a . 38b . 38c , etc. is dimensioned such that a turn 40a . 40b . 40c , etc. in exactly one of the grooves 38a . 38b . 38c fits. The grooves 38a . 38b . 38c can have different sizes in the radial direction, wherein the projection area 26 down the grooves 38a . 38b . 38c grow.

It is also possible that the spring attachment area 24 projections 38a . 38b . 38c etc., which are formed as cylinders with the same or different radii and which are arranged one behind the other in the longitudinal direction, wherein the outer diameter of the projections 38a . 38b . 38c etc. to the projecting area 26 increase.

Thus, the spring 14 such with the contact pin 12 be connected that between the contact pin attachment area 36 the feather 14 and the spring attachment area 24 of the contact pin 12 there is a frictional connection due to the force in the radial direction. Likewise, a positive engagement due to partially engaging behind surfaces of the grooves 38a . 38b . 38c , ... and surfaces of the turns 40a . 40b . 40d the ... are present.

Additionally or alternatively, the contact pin attachment area 36 and the spring attachment area 24 also welded together, glued and / or soldered.

Additionally or alternatively, the contact pin attachment area 36 comprise a sleeve, in particular be sleeve-shaped, wherein the sleeve over the spring attachment area 24 is pressed and wherein the inner diameter of the sleeve is smaller than the outer diameter of the spring mounting portion 24 and thus can be a frictional connection. In this case, the spring attachment region may be conical, for example, wherein the outer diameter of the spring attachment region 24 to the projecting area 26 to take. Likewise, the sleeve may have a conical inner diameter, which decreases in the direction towards the contact area. It is also possible that a latching closure is present, wherein an element of the contact pin 12 with an element of the spring 14 locked.

Advantageously, it is achieved that the spring 14 in a simple way with the contact pin 12 is connectable. In particular, a simple manual production of the terminal contact 10 possible because the spring 14 over the contact pin 12 is slipped and the contact pin attachment area 36 the feather 14 with the spring attachment area 24 of the contact pin 12 is pressed. In particular, it is not necessary that contact pin 12 and spring 14 in a housing which has the shape of a hollow cylinder or a sleeve, must be introduced and the sleeve must be closed in a further separate operation. In other words, there is the terminal contact 10 preferably only from the contact pin 12 and the spring 14 and is free of other elements, such. B. a jacket or an encapsulation or a housing, etc. Further advantageously, the spring travel of the terminal contact is not limited by a housing. Rather, the spring can 14 be selected only according to desired or necessary spring properties. Are the spring 14 and the contact pin 12 limited in a housing, this is not readily possible because, for example, the housing length is included in the selection of the spring properties. In particular, also allows the integrally formed contact pin 12 in that the connection contact 10 can be formed freely from a housing. Thus, also the spring 14 not limited by the housing length, as is the case if the terminal contact has two contact pins, which are connected by means of the housing. Further advantageously, the signal path is improved over a terminal contact with a two-part pin and housing, since only three instead of four electrical junction contacts are formed and thus less signal loss is present, since the signal must pass only three transition contact resistors.

at a two-part contact pin with housing enters an electrical Contact and thus also a contact resistance (1st contact resistance) between the IC and the contact pin which contacts the IC is. Furthermore, an electrical contact and thus also a contact resistance occurs (2nd contact resistance) between the contact pin and the housing. Furthermore, an electrical contact and thus also a contact resistance occurs (3rd contact resistance) between the housing and the contact pin, which is connected to the evaluation device. Finally occurs an electrical contact and thus also a contact resistance (4. Contact resistance) between the contact pin and the evaluation device on. In other words, that has to be Signal from the IC to the evaluation via four electrical transition contacts run.

According to the present invention, there are only three contacts, namely between the IC and the IC contact area 28 (1st contact resistance), between the spring contact area 18 and the contact pin contact area 30 the feather 14 (2nd contact resistance) and the contact pin contact area 30 the feather 14 and the evaluation device (3rd contact resistance).

The adhesion and / or the positive connection between the contact pin attachment area 36 the feather 14 and the spring attachment area 24 of the contact pin 12 is between about 0.1 N and about 5 N, preferably between about 0.5 n and about 2 N.

The projection area 26 of the contact pin 12 is preferably designed so that, for example, the contact pin attachment area 26 the feather 14 strikes against it, in particular can be pressed against it, thus in a simple way the spring 14 and the contact pin 12 to assemble with each other. Furthermore, the projection area 26 serve that the terminal contact 10 arranged in a simple manner in a corresponding opening of the IC test socket, in particular can be mounted. For example, there is an opening in the IC test socket into which the terminal contact is inserted. The opening is closed with a lid, wherein the IC contact area protrudes through an opening of the lid through the lid. However, the opening of the lid is smaller than the outer diameter of the projecting portion 26 so that the terminal contact 10 is fixed in the opening. As the terminal contact 10 does not have its own housing, thus also the spring travel of the spring 14 be enlarged compared to a terminal contact with housing. The projection area 26 does not necessarily have to be cylindrical. The projection area 26 can (in supervision) also be rectangular, in particular square, elliptical, etc.

The IC contact area 28 has at least six points of contact 42 on. Based on the six contact tips 42 For example, mechanical and / or electrical contact with corresponding contact areas of the IC can be produced. For example, the contact tips 42 come into contact with a solder ball of the IC, in particular deform the solder ball, for example, in the solder bump. Further, between the contact tips 42 Contact surfaces (shown in 5 and 6 ) arranged. The contact surfaces can also come in contact with corresponding contact points of the IC at least in certain areas. Advantageously, this achieves that better mechanical and / or electrical contact between the IC contact area 28 and the IC can be produced. Based on the enlarged surface of the IC contact area 28 between the contact tips 42 is also an improved capacitive coupling between the contact pin 12 and the IC possible.

Furthermore, due to the increased surface area between the contact tips 42 a lower ohmic resistance between the IC contact area 28 and the corresponding contact of the IC.

In 1 are still exemplary dimensions of the terminal 10 shown, where 1 an exemplary technical drawing of a preferred embodiment of the terminal contact 10 is. Further embodiments of the connection contacts 10 may have other dimensions.

The IC contact area 28 of the connection contact 10 is substantially cylindrical with an outer diameter between about 0.4 mm and about 0.2 mm, in particular with a diameter of about 0.3 mm. The projection area 26 is also substantially cylindrical with an outer diameter between about 0.7 mm and about 0.3 mm, in particular with a diameter of about 0.55 mm. The height or length of the IC contact area 28 is between about 0.9 mm and about 1.3 mm, in particular, the length of the IC contact area 28 about 1.1 mm ± 0.08 mm. The entire length of the connection contact 10 is in a substantial relaxed state of the spring 14 (ie in the quiescent state) between about 3.9 mm and about 5.6 mm, preferably between about 4.9 mm and about 5.4 mm, in particular about 5.15 mm. The entire length of the connection contact 10 can be in a substantial relaxed state of the spring 14 between about 4.0 mm and about 4.5 mm, in particular about 4.2 mm. Is the length of the connection contact 10 in the resting state between about 4.9 mm and about 5.4 mm, preferably about 5.15 mm, the distance of one of the contact tips 42 indicative end of the projecting portion 26 from the free end of the spring 14 , ie, the end of the spring, which can contact an evaluation unit, a board, etc., be between about 3.8 mm and about 4.3 mm, in particular about 4.05 mm. The length of the contact pin contact area 30 in this case is between about 0.4 and about 0.8 mm, in particular about 0.6 mm. At a different length of the connection contact 10 the aforementioned dimensions are adapted accordingly, ie preferably reduced by the length difference in the resting state of the spring.

The contact pin contact area 30 may be substantially cylindrical. The contact pin contact area 30 can also be at least partially conical.

2 shows a connection contact 10 according to 1 ie the terminal contact 10 has in the resting state of the spring 14 a length between about 4.9 mm and about 5.4 mm, preferably about 5.15 mm, wherein the spring 14 already partially compressed. In particular, the terminal contact 10 as he is in 2 is shown, compared to the in 1 port shown 10 compressed to a total length of about 4.8 mm. Further, the terminal contact 10 in 2 opposite the terminal contact 10 in 1 around the cylinder axis 16 shown rotated by 30 degrees. At a different length of the connection contact 10 the aforementioned dimensions are adapted accordingly, ie preferably reduced by the length difference in the resting state of the spring.

Due to the compression of the spring 14 protrudes a tip of the spring contact area 18 at least in some areas in the transition area 32 the feather 14 , The transition area 32 is at least partially conical. As a result, for example, the top 44 of the spring contact area 18 through the conical shape of the transition area 32 the feather 14 be guided. For example, the contact pin 12 deflected relative to the longitudinal direction, due to the transition region 32 when compressing the spring 14 made sure the tip 44 of the contact pin in the contact pin contact area 30 is insertable.

Furthermore, in 2 two edges 46a . 46b two opposite contact tips 42 shown. The edges preferably include an angle of between about 80 and about 100 degrees, more preferably an angle of about 90 degrees.

3 shows the connection contact 10 according to 1 and 2 , wherein the terminal contact 10 is compressed further to a length of about 4.5 mm. As in 3 is shown, the top sticks out 44 of the spring contact area 18 of the contact pin 12 already partially in the contact pin contact area 30 the feather 14 into it. Will the terminal contact 10 further compressed, as for example in 4 is shown, the spring contact area protrudes 18 of the contact pin 12 so far in the contact pin contact area 30 the feather 14 into it, that the tip 44 of the contact pin 12 essentially at the position of the first turn 48 the feather 14 (from the free end of the spring 14 seen from) is. The length of the in 4 shown connection contact 10 is between about 4 mm and about 4.5 mm, in particular 4.25 mm. In the 3 and 4 given dimensions are preferably, if the terminal contact 10 in the resting state of the spring 14 a length between about 4.9 mm and about 5.4 mm, preferably about 5.15 mm, at a different length of the terminal 10 the aforementioned dimensions are adapted accordingly, ie preferably reduced by the length difference in the resting state of the spring.

The contact pin contact area 30 the feather 14 can be designed such that the inner diameter of the contact pin contact area 30 greater than the outer diameter of the contact pin 12 , In other words, contact pin 12 and spring 14 be formed such that the contact pin 12 the feather 14 preferably not touched. The contact pin 12 can thus be an evaluation (not shown) contact directly.

It is also possible that one or more turns of the contact pin contact area 30 an inner diameter smaller than the outer diameter of the spring contact portion 18 of the contact pin 12 , In other words, the spring contact area contacts 18 the contact pin contact area 30 at least at these turns. Preferably applies in particular for the first turn 48 in that the spring contact area 18 of the contact pin 12 with an inner surface of the first turn 48 of the contact pin contact area 30 can occur in mechanical and in particular electrical contact. Thus, it can be a signal from the contact tips 42 over the contact pin 12 to the first turn 48 and transferred to an evaluation device or to another electrical component.

1 shows the terminal contact in particular in a relaxed position or a relaxed state or idle state, for example, when the terminal contact 10 is aligned in the gravitational field of the earth with its longitudinal axis substantially horizontally, and thus no force acts on the spring along the longitudinal direction LR. 2 shows the connection contact 10 in a position in which the terminal contact 10 is mounted in the IC test socket. In this case, preferably, the terminal contact 10 aligned in the rotation field of the earth substantially vertically. Thus, the weight of the contact pin presses 12 in the longitudinal direction LR on the spring 14 and compresses the spring. Likewise, the spring 14 due to the dimensions of the opening in the IC test socket in which the terminal contact 10 is arranged, compressed. 3 shows the connection contact 10 when the terminal contact is disposed on another electrical element, such as a printed circuit board. In this case, the contact pin contact area or contact area contacts 30 the feather 14 the electrical element, in particular the board (not shown), so that the spring 14 is compressed further. 4 shows the connection contact 10 if the IC contact area 28 is in contact with the IC. The weight of the IC makes the terminal contact 10 further compressed. This shows 4 the connection contact 10 just before the top 44 of the spring contact area 18 the first turn 48 contacted. If (compared to 4 ) the spring is further compressed by 0.1 mm so that the tip 44 of the spring contact area 18 the first turn 48 the feather 14 contacted, is the terminal contact 10 in the contact position or the contact state. In the contact position or the contact state of the terminal contact 10 a length of about 4.15 mm.

Overall, the terminal contact 10 starting from a resting position compared to the position in which the tip 44 of the spring contact area 18 with the first turn 48 is in contact to be contracted by about 1 mm.

5 shows a plan view of the terminal 10 , in particular, the contact tips 42 and the contact tips 42 connecting surfaces 50 as well as the projection area 26 are shown. The contact tips 42 and thus also contact edges 52 are preferably uniform over the circumference of the IC contact area 28 distributed. For a number of 6 contact tips 42 are the contact tips 42 arranged at an angle of 60 ° to each other.

6 shows a perspective view of the terminal 10 , wherein in particular also the contact tips 42 and the contact tips 42 connecting surfaces 50 as well as the contact edges 52 are shown. The connection contact 10 , as in 5 shown is in a relaxed position or a resting state.

10

connection contact

12

pin

14

Bungee / spring / coil spring

16

Symmetry axis / cylinder axis

18

Spring contact portion

20

Transition area

22

internal Area

24

Spring fastening area

26

projection portion

28

IC contact area

30

Contact area / pin contact area

32

Transition area

34

internal Area

36

Pin attachment area

38a

groove

38b

groove

38c

groove

40a

convolution

40b

convolution

40c

convolution

42

contact tip

44

top

46a

edge

46b

edge

48

convolution

50

area

52

Contact edges

LR

longitudinal direction

Claims (16)

Connection contact ( 10 ) for an IC test socket comprising: a contact pin ( 12 ) with a spring contact area ( 18 ), which is designed a spring element ( 14 ), - an IC contact area ( 28 ) adapted to contact an IC and having - a spring attachment area ( 24 ), wherein the contact pin ( 12 ) is integrally formed, and wherein the terminal contact further - a spring element ( 14 ) with a contact pin attachment area ( 36 ), wherein the spring attachment area ( 24 ) and the Kotaktstiftbefestigungsbereich ( 36 ) are connected together in such a way that the contact pin ( 12 ) and the spring element ( 14 ) are fixed to each other. Connection contact ( 10 ) according to claim 1, wherein the IC contact area ( 28 ) at least six contact tips ( 42 ) and the contact tips ( 42 ) are adapted to contact a contact element of an IC. Connection contact ( 10 ) according to one of the preceding claims, wherein the IC contact region ( 28 ) at least six contact edges ( 52 ) where the contact edges ( 52 ) are at least partially designed to contact a contact element of an IC. Connection contact ( 10 ) according to one of the preceding claims, wherein the IC contact region ( 28 ) at least twelve contact surfaces ( 50 ) and the contact surfaces ( 50 ) are at least partially adapted to contact a contact element of an IC, in particular to be capacitively coupled to a contact element of an IC. Connection contact ( 10 ) according to one of the preceding claims, wherein the spring element ( 14 ) and the contact pin ( 12 ) are interconnected such that the terminal contact ( 10 ) is housing-free. Connection contact ( 10 ) according to one of the preceding claims, wherein the spring element ( 14 ) a contact area ( 30 ) and the contact area ( 30 ) is designed to contact an electronic component, in particular a printed circuit board. Connection contact ( 10 ), wherein the spring attachment area ( 24 ) of the spring element ( 14 ) and the Kotaktstiftbefestigungsbereich ( 36 ) of the contact pin ( 12 ) are connected to one another such that when a force is applied to the spring element ( 14 ) with one to a longitudinal direction (LR) of the terminal ( 10 ) substantially parallel force component between about 0.1 N and about 2 N, the spring element ( 14 ) and the contact pin ( 12 ) stay connected. Connection contact ( 10 ) according to one of the preceding claims, wherein the contact pin ( 12 ) and the spring element ( 14 ) are interconnected such that the IC contact area ( 28 ) outside the spring element ( 14 ) and the spring contact area ( 18 ) at least partially, in particular completely within the spring element ( 14 ) is arranged. Connection contact ( 10 ) according to one of the preceding claims, wherein the contact pin ( 12 ) between the IC contact area ( 28 ) and the spring contact area ( 18 ) in the radial direction a projection ( 26 ), and the projection ( 26 ) is designed such that the spring element ( 14 ) along the longitudinal direction (LR) the projection ( 26 ) can not happen. Connection contact ( 10 ) according to one of the preceding claims, wherein the spring element ( 14 ) at least three spring element areas ( 30 . 32 . 34 . 36 ) and the spring element ( 14 ) in an inner spring element area ( 34 ) is more extensible and / or compressible along the longitudinal direction (LR) than in the remaining spring element regions (FIG. 30 . 32 . 34 ). Connection contact ( 10 ) according to claim 10, wherein the spring element ( 14 ) a coil spring ( 14 ) and the distance of the spiral turns of the spiral spring ( 14 ) of the inner spring element region ( 34 ) is greater than the distance of the spiral turns of the other spring element areas ( 30 . 32 . 36 ) of the spiral spring ( 14 ). Connection contact ( 10 ) according to claim 10 or 11, wherein the spring element ( 14 ) and the spring contact area ( 18 ) are arranged and configured such that in a state of rest ( 1 ) of the terminal contact of the spring contact area ( 18 ) and the spring element ( 14 ) are non-contact. Connection contact ( 10 ) according to claim 12, wherein the spring element ( 14 ) along the longitudinal direction (LR) is compressible such that in a contact state of the spring contact region ( 18 ) at least one turn ( 48 ) of the contact area ( 30 ) touched. IC test socket with a housing having a plurality of openings, wherein - in each opening a terminal contact ( 10 ) according to one of the preceding claims, - the openings are closed by means of a common cover, - the contact area ( 30 ) of each terminal along the longitudinal direction (LR) protrudes beyond the housing of the IC test socket and wherein - the IC contact area ( 28 ) protrudes through the cover and projects beyond the housing of the IC test socket along the longitudinal direction (LR). Method for producing a connection contact ( 10 ) according to one of claims 1 to 13, comprising the steps of: - providing the contact pin ( 12 ) - providing the spring element ( 14 ) - insertion of the contact pin ( 12 ) in the spring element ( 14 ) - connecting the contact pin mounting area ( 36 ) with the spring attachment area ( 24 ). Method according to claim 15, wherein the contact pin ( 12 ) far into the spring element ( 14 ) is inserted until the contact pin attachment area ( 36 ) to the projection ( 26 ) pushes.