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CN2480855Y - a detection device - Google Patents

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Publication number
CN2480855Y
CN2480855Y CN 01223091 CN01223091U CN2480855Y CN 2480855 Y CN2480855 Y CN 2480855Y CN 01223091 CN01223091 CN 01223091 CN 01223091 U CN01223091 U CN 01223091U CN 2480855 Y CN2480855 Y CN 2480855Y
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China
Prior art keywords
base
embossing
detection device
substrate
view
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Expired - Lifetime
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CN 01223091
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Chinese (zh)
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杨清雨
王忠平
吕俊庆
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Pegatron Corp
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Asustek Computer Inc
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Abstract

A detector for detecting the position of object to be detected is composed of a first base with multiple sensing units (probes) on it and able to be moved in contact with said substrate, a second base with multiple sensing units (probes) on it, and an embossing unit arranged on said second base in separable mode and including an embossing unit and a pressing unit connected to said pressing unit. The detection device can improve the production efficiency and avoid the inconvenience of manual operation.

Description

一种检测装置a detection device

本实用新型涉及一种检测装置,特别是涉及一种用于对所检测的基底(电路板)进行自动盖章程序的检测装置。The utility model relates to a detection device, in particular to a detection device for performing an automatic stamping procedure on a detected substrate (circuit board).

对于一般的基底或电路板进行组装及测试的生产线而言,操作人员必须对其所检测后的基底或电路板进行检测盖章或检验记号的标注,而标注的方式多半采用手动盖章。For a production line where general substrates or circuit boards are assembled and tested, operators must mark the substrates or circuit boards that have been inspected with inspection stamps or inspection marks, and most of the marking methods are manually stamped.

有监于此,本实用新型的目的是针对上述公知技术而提出的改进。In view of this, the purpose of this utility model is to improve the above-mentioned known technology.

因此,本实用新型的目的在于提供一种检测装置,该装置可对于一基底或电路板进行检测。Therefore, the object of the present invention is to provide a detection device, which can detect a substrate or a circuit board.

本实用新型涉及一种检测装置,其适用于对一基底进行检测,其特征在于,它包括:The utility model relates to a detection device, which is suitable for detecting a substrate, and is characterized in that it comprises:

一第一基座,该基底设置于该第一基座上;a first base, the base is set on the first base;

一第二基座,可移动朝向于该第一基座;以及a second base movable towards the first base; and

一压印装置,以可分离方式设置于该第二基座上,该压印装置包括一用于对该第一基座上的该基底进行压印的压印部。An embossing device is disposed on the second base in a detachable manner, and the embossing device includes an embossing part for embossing the substrate on the first base.

按照本实用新型所述的检测装置,其进一步包括多个感测部,该感测部接触于该基底;所述的感测部为探针;According to the detection device described in the present invention, it further includes a plurality of sensing parts, and the sensing parts are in contact with the substrate; the sensing parts are probes;

其中,所述的压印装置进一步包括一推捍,该压印部连接于该推捍;Wherein, the embossing device further includes a push rod, and the embossing part is connected to the push rod;

按照本实用新型所述的检测装置,其中,该基底为电路板。According to the detection device of the present utility model, the base is a circuit board.

本实用新型还涉及一种检测装置,其适用于对一基底进行检测,其特征在于,它包括:The utility model also relates to a detection device, which is suitable for detecting a substrate, and is characterized in that it includes:

一第一基座,该基底设置于该第一基座;a first base, the base is set on the first base;

一第二基座,具有多个感测部,该感测部以可移动方式接触于该基底;其中,该感测部为探针;该基底为电路板;以及A second base has a plurality of sensing parts, and the sensing parts are in contact with the base in a movable manner; wherein, the sensing parts are probes; the base is a circuit board; and

一压印装置,以可分离方式设置于该第二基座上,该压印装置包括一用于对该第一基座上的该基底进行压印的压印部及一推捍。An embossing device is disposed on the second base in a detachable manner, and the embossing device includes an embossing part for embossing the base on the first base and a push bar.

本实用新型所述的检测装置的优点在于,其借由该压印装置以对该基底进行自动化压印或盖章,借由该检测装置除了可提高生产效能之外,同时可避免人为操作的不便。The advantage of the detection device described in the present invention is that it uses the imprinting device to automatically imprint or seal the substrate, and the detection device can not only improve production efficiency, but also avoid manual operations. inconvenient.

为使本实用新型的上述目的、特征及优点能更明显易懂,下文特举一较佳实施例,并配合所列附图,作详细说明如下:In order to make the above-mentioned purposes, features and advantages of the present utility model more obvious and understandable, a preferred embodiment is specially cited below, and in conjunction with the accompanying drawings, the detailed description is as follows:

附图简要说明:Brief description of the drawings:

图1表示本实用新型检测装置T的主视图;Fig. 1 shows the front view of the utility model detection device T;

图2A表示根据图1的检测装置T中的机台B的立体图,该机台B包括一第一基座1、一第二基座2及一压印装置3,于该第一基座1上设置有一基底4;2A shows a perspective view of the machine B in the detection device T according to FIG. A base 4 is arranged on it;

图2B表示根据图2A的检测装置T中的机台B对于该基底4进行压印处理的立体图;FIG. 2B shows a perspective view of the embossing process performed on the substrate 4 by the machine B in the detection device T of FIG. 2A;

图2C表示根据图2B的检测装置T中的机台B完成对于该基底4的压印处理后的立体图;FIG. 2C shows a perspective view of the machine B in the detection device T according to FIG. 2B after completing the embossing process for the substrate 4;

图3A表示根据图2A中的虚线区域Z中的局部检测装置T结构的放大立体图;FIG. 3A shows an enlarged perspective view according to the structure of the local detection device T in the dotted line area Z in FIG. 2A;

图3B表示根据图3A的压印装置3分离于该第二基座2的立体图;以及FIG. 3B shows a perspective view of the imprinting device 3 according to FIG. 3A separated from the second base 2; and

图4表示该压印装置3的立体图。FIG. 4 shows a perspective view of the imprint device 3 .

实施例Example

请参见图1。See Figure 1.

图1表示本实用新型检测装置T的主视图。本实用新型检测装置T主要针对一基底4(例如:电路板)等进行各接点的检测及进行压印处理。Fig. 1 shows the front view of the detection device T of the present invention. The detection device T of the present invention mainly detects and embosses a base 4 (such as a circuit board) and the like for each contact point.

检测装置T包括一机台B、一动力源P及一控制装置C,其中,该机台B设置于该动力源P、该控制装置C之间,借由该动力源P提供该机台B进行检测时的动力,并且利用该控制装置C对于该机台B、该动力源P进行电性操控。The detection device T includes a machine B, a power source P and a control device C, wherein the machine B is arranged between the power source P and the control device C, and the power source P provides the machine B The power during detection is performed, and the control device C is used to electrically control the machine B and the power source P.

请参见图2A、2B、2C。Please see Figures 2A, 2B, 2C.

图2A表示根据图1的检测装置T中的机台B的立体图,图2B表示根据图2A的检测装置T中的机台B对于该基底4进行压印处理的立体图,图2C表示根据图2B的检测装置T中的机台B完成对于该基底4的压印处理后的立体图。2A shows a perspective view of the machine B in the detection device T of FIG. 1 , and FIG. 2B shows a perspective view of the substrate 4 being imprinted by the machine B in the detection device T of FIG. 2A . FIG. A perspective view of the machine B in the detection device T after the embossing process for the substrate 4 is completed.

如图2A所示,机台B包括一第一基座1、一第二基座2及一压印装置3,其中,该基底4定位于第一基座1之上,并且该第二基座2借由多个推杆P1而连接于该动力源P,借由多个推杆P1可将该第二基座2以接近于该第一基座1的方式进行往复移动。于第二基座2上设置有多个导杆220,并且于第一基座1上形成有相对于多个导杆220的多个导孔100,借由多个导杆220以分别配合于多个导孔100的方式可对于移动进行中的该第二基座2进行导引。As shown in FIG. 2A, machine B includes a first base 1, a second base 2 and an embossing device 3, wherein the substrate 4 is positioned on the first base 1, and the second base The base 2 is connected to the power source P through a plurality of push rods P1, and the second base 2 can be reciprocated to be close to the first base 1 through the plurality of push rods P1. A plurality of guide rods 220 are provided on the second base 2, and a plurality of guide holes 100 corresponding to the plurality of guide rods 220 are formed on the first base 1, and the plurality of guide rods 220 are respectively matched with A plurality of guide holes 100 can guide the moving second base 2 .

第二基座2主要包括两相互间隔的板件21、22,其中,板件21的表面21S1连接于多个推杆P1,于两板件21、22之间是借由多个支柱210所连接,这些支柱210以相互间隔的方式分别连接于该板件21的另一表面21S2及板件22的表面22S1。除了于板件22上设置有多个导杆220之外,于该另一表面22S2上设置有多个压杆221及多个感测部23(例如:探针),并且于该板件22上形成有一穿孔22H。The second base 2 mainly includes two plates 21, 22 spaced apart from each other, wherein the surface 21S1 of the plate 21 is connected to a plurality of push rods P1, between the two plates 21, 22 is formed by a plurality of pillars 210. These struts 210 are respectively connected to the other surface 21S2 of the board 21 and the surface 22S1 of the board 22 in a spaced manner. In addition to being provided with a plurality of guide rods 220 on the board 22, a plurality of pressing rods 221 and a plurality of sensing parts 23 (such as probes) are provided on the other surface 22S2, and on the board 22 A through hole 22H is formed thereon.

请先参见图4。图4表示该压印装置3的立体图。Please see Figure 4 first. FIG. 4 shows a perspective view of the imprint device 3 .

压印装置3包括有一连接部30、一气压缸用推捍31及一压印部32,其中,气压缸用推捍31电性连接于该控制装置C,该连接部30借由两螺丝30B定位、而30B以可分离方式定位于凸出于该第一基座22的表面22S1上的两凸柱211、212,而该压印部32设置于该气压缸用推捍31的自由端部上,该压印部32可在该气压缸用推捍31的驱动下而于板件22的穿孔22H中进行往复移动。The embossing device 3 includes a connecting portion 30, a push rod 31 for a pneumatic cylinder, and a stamping portion 32, wherein the push rod 31 for the pneumatic cylinder is electrically connected to the control device C, and the connecting portion 30 is connected by two screws 30B. Positioning, and 30B is detachably positioned on the two protrusions 211, 212 protruding from the surface 22S1 of the first base 22, and the embossing part 32 is arranged on the free end of the pusher 31 for the pneumatic cylinder Above, the embossing part 32 can reciprocate in the through hole 22H of the plate 22 under the drive of the pneumatic cylinder pusher 31 .

如图2B所示,当该第二基座2朝向该第一基座1进行既定行程的移动时,借由多个压杆221事先平均地压制于基底4之上,使得该基底4上的各测试点保持于一既定的水平面上,进而便可利用各感测部23对于该基底4上的各测试点(图未示)进行接触式的检测,并且该压印部32可在该气压缸用推捍31的驱动下对于该基底4所指定的部位进行压印,如此便可得到如图2C所示的印痕300。As shown in FIG. 2B, when the second base 2 moves toward the first base 1 with a predetermined stroke, a plurality of pressing rods 221 are evenly pressed on the base 4 in advance, so that the base 4 Each test point is maintained on a predetermined horizontal plane, and then each sensing part 23 can be used to carry out contact detection on each test point (not shown) on the substrate 4, and the embossing part 32 can Driven by the cylinder pusher 31, the designated part of the substrate 4 is imprinted, so that an imprint 300 as shown in FIG. 2C can be obtained.

请参见图3A、3B。Please see Figures 3A, 3B.

图3A表示根据图2A中的虚线区域Z中的局部检测装置T结构的放大立体图,图3B表示根据图3A的该压印装置3分离于该第二基座2的立体图。FIG. 3A shows an enlarged perspective view of the structure of the local detection device T in the dotted line area Z in FIG. 2A , and FIG. 3B shows a perspective view of the embossing device 3 separated from the second base 2 according to FIG. 3A .

如图3A、3B所示,于板件21上形成有一穿孔21H,该压印装置3的该连接部30的大小可以容纳于该穿孔21H之中,该压印装置3便可经由该穿孔21H而定位或取出于该第二基座2,并且借由此一定位方式可让操作者经由两板件21、22之间的空间对于该压印装置3进行定位。As shown in Figures 3A and 3B, a perforation 21H is formed on the plate 21, the size of the connecting portion 30 of the embossing device 3 can be accommodated in the perforation 21H, and the embossing device 3 can pass through the perforation 21H It is positioned or removed from the second base 2 , and the operator can position the embossing device 3 through the space between the two boards 21 , 22 by means of this positioning method.

因此,借由本实用新型检测装置T除了可对于基底4或电路板进行检测之外,借由自动化压印方式的压印装置3的设置更可大幅提高生产效能,同时避免人为操作的不便。Therefore, the detection device T of the present invention can not only detect the substrate 4 or the circuit board, but also greatly improve the production efficiency by setting the stamping device 3 in an automatic stamping mode, while avoiding the inconvenience of manual operation.

虽然本实用新型已以较佳实施例揭示如上,然其并非用以限制本实用新型,任何本领域熟练的技术人员,在不脱离本实用新型的精神和范围内,所做出的更动与润饰,均应属于本实用新型的保护范围之内。Although the utility model has been disclosed as above with preferred embodiments, it is not intended to limit the utility model. Any skilled person in the art can make changes and modifications without departing from the spirit and scope of the utility model. Retouching should all belong to the scope of protection of the present utility model.

Claims (8)

1.一种检测装置,适用于对一基底进行检测,其特征在于,它包括:1. A detection device, suitable for detecting a substrate, is characterized in that it comprises: 一第一基座,该基底设置于该第一基座上;a first base, the base is set on the first base; 一第二基座,可移动朝向于该第一基座;以及a second base movable towards the first base; and 一压印装置,以可分离方式设置于该第二基座上,该压印装置包括一用于对该第一基座上的该基底进行压印的压印部。An embossing device is disposed on the second base in a detachable manner, and the embossing device includes an embossing part for embossing the substrate on the first base. 2.如权利要求1所述的检测装置,其特征在于,它进一步包括多个感测部,该感测部接触于该基底。2. The detecting device as claimed in claim 1, further comprising a plurality of sensing parts, the sensing parts are in contact with the substrate. 3.如权利要求1所述的检测装置,其特征在于,该压印装置进一步包括一推捍,该压印部连接于该推捍。3. The detection device according to claim 1, wherein the embossing device further comprises a push bar, and the embossing part is connected to the push bar. 4.如权利要求2所述的检测装置,其特征在于,该感测部为探针。4. The detection device according to claim 2, wherein the sensing part is a probe. 5.如权利要求1、2、3或4所述的检测装置,其特征在于,该基底为电路板。5. The detection device according to claim 1, 2, 3 or 4, wherein the substrate is a circuit board. 6.一种检测装置,适用于对一基底进行检测,其特征在于,它包括:6. A detection device suitable for detecting a substrate, characterized in that it comprises: 一第一基座,该基底设置于该第一基座;a first base, the base is set on the first base; 一第二基座,具有多个感测部,该感测部以可移动方式接触于该基底;以及A second base has a plurality of sensing parts, and the sensing parts are in contact with the base in a movable manner; and 一压印装置,以可分离方式设置于该第二基座上,该压印装置包括一用于对该第一基座上的该基底进行压印的压印部及一推捍,该压印部连接于该推捍。An embossing device, disposed on the second base in a detachable manner, the embossing device includes an embossing portion for embossing the substrate on the first base and a push bar, the embossing The Indian part is connected to the pusher. 7.如权利要求6所述的检测装置,其特征在于,该感测部为探针。7. The detection device according to claim 6, wherein the sensing part is a probe. 8.如权利要求6所述的检测装置,其特征在于,该基底为电路板。8. The detection device according to claim 6, wherein the substrate is a circuit board.
CN 01223091 2001-05-09 2001-05-09 a detection device Expired - Lifetime CN2480855Y (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101871993B (en) * 2009-04-27 2012-11-21 富葵精密组件(深圳)有限公司 Electrical test device
CN102879612A (en) * 2012-10-12 2013-01-16 竞陆电子(昆山)有限公司 Circuit board open/short circuit test fixture with marking function
CN105785255A (en) * 2016-03-01 2016-07-20 珠海格力电器股份有限公司 Detection device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101871993B (en) * 2009-04-27 2012-11-21 富葵精密组件(深圳)有限公司 Electrical test device
CN102879612A (en) * 2012-10-12 2013-01-16 竞陆电子(昆山)有限公司 Circuit board open/short circuit test fixture with marking function
CN105785255A (en) * 2016-03-01 2016-07-20 珠海格力电器股份有限公司 Detection device

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