CN223123168U - Intelligent card test system - Google Patents
Intelligent card test systemInfo
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- CN223123168U CN223123168U CN202520961988.1U CN202520961988U CN223123168U CN 223123168 U CN223123168 U CN 223123168U CN 202520961988 U CN202520961988 U CN 202520961988U CN 223123168 U CN223123168 U CN 223123168U
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Abstract
The utility model discloses a smart card testing system which comprises a main control processor, a first radio frequency sensing module, a second radio frequency sensing module, a time accumulator, a counter and a power module, wherein the first radio frequency sensing module is used for continuously reading a test card, obtaining a first luminous state of an LED lamp of the test card, outputting a first electric signal to the time accumulator according to the first luminous state, the time accumulator is used for accumulating and receiving the first electric signal to determine accumulated testing duration of the test card, the second radio frequency sensing module is used for periodically reading the test card according to a preset time interval, obtaining a second luminous state of the LED lamp of the test card, outputting a second electric signal to the counter according to the second luminous state, and the counter is used for accumulating the received second electric signal to determine accumulated testing times of the test card, so that the durability test of a product fed back by an LED optical signal in the smart card is realized.
Description
Technical Field
The embodiment of the utility model relates to the technical field of testing, in particular to a smart card testing system.
Background
Currently, there is a new product in the field of smart cards, which is used for feeding back light signals of light emitting diodes (LIGHT EMITTING Diode, LED) into near field Communication (NEAR FIELD Communication) products (such as flash bank cards, various types of inductive integrated circuits (INTEGRATED CIRCUIT, IC) rechargeable cards/consumer cards, etc.), and when the new product is used in daily life, the LED in the card body emits light, thereby playing an attractive and warning role. The novel product can be widely applied to the fields of payment cards, intelligent access cards and the like, and provides user interaction experience through LED optical signal feedback, such as prompting card status or successful transaction. However, there is currently no apparatus for testing durability of products incorporating LED optical signal feedback in NFC.
Disclosure of utility model
The utility model provides a smart card testing system, which realizes the durability test of products with LED optical signal feedback added in a smart card.
The embodiment of the utility model provides a smart card testing system which comprises a main control processor, a first radio frequency induction module, a second radio frequency induction module, a time accumulator, a counter and a power module, wherein the first radio frequency induction module is respectively connected with the power module and the time accumulator;
the main control processor is respectively connected with the first radio frequency induction module, the second radio frequency induction module, the time accumulator, the counter and the power supply module;
The power supply module is used for supplying power to the main control processor, the first radio frequency induction module, the second radio frequency induction module, the time accumulator and the counter;
The first radio frequency induction module is used for continuously reading a test card, acquiring a first luminous state of an LED lamp of the test card, and outputting a first electric signal to the time accumulator according to the first luminous state, wherein the first luminous state comprises the luminous duration of the LED lamp;
The cumulative timer is used for cumulatively receiving the first electric signal to determine the cumulative test duration of the test card;
The second radio frequency induction module is used for periodically reading a test card according to a preset time interval, obtaining a second luminous state of an LED lamp of the test card, and outputting a second electric signal to the counter according to the second luminous state, wherein the second luminous state comprises whether the LED lamp emits light or not;
The counter is used for accumulating the received second electric signals to determine the accumulated test times of the test card.
Further, the first radio frequency induction module comprises a first NFC card reading module and a first optical signal detection module;
The first NFC card reading module is used for continuously reading the test card and triggering an LED lamp of the test card;
the first light signal detection module is used for detecting a first light-emitting state of the LED lamp, converting the first light-emitting state into a first electric signal and outputting the first electric signal to the time accumulator.
Further, the second radio frequency induction module comprises a second NFC card reading module and a second optical signal detection module;
The second NFC card reading module is used for periodically reading the test card according to a preset time interval and triggering an LED lamp of the test card;
The second light signal detection module is used for detecting a second light-emitting state of the LED lamp, converting the second light-emitting state into a second electric signal and outputting the second electric signal to the counter.
The system further comprises a control panel, wherein the control panel is connected with the main control processor and comprises a display module;
The display module is used for displaying the accumulated test duration and/or the accumulated test times of the test card.
The control panel further comprises a reset module, wherein the reset module is connected with the main control processor;
the reset module is used for resetting the accumulator and/or the counter.
The system further comprises a data storage module, wherein the data storage module is connected with the main control processor;
The data storage module is used for storing system information of the test process of the test card.
The system further comprises a communication module, wherein the communication module is connected with the main control processor;
The communication module is used for transmitting the system information to external equipment.
The system further comprises a monitoring module, wherein the monitoring module is connected with the main control processor;
The monitoring module is used for monitoring the system state of the system and transmitting the monitored system state to the main control processor.
The system further comprises a state indication module, wherein the state indication module is connected with the main control processor;
the state indicating module is used for displaying the system state according to the instruction of the main control processor.
The system further comprises an alarm module, wherein the alarm module is connected with the main control processor;
The alarm module is used for alarming under the condition that the system state is abnormal.
The embodiment of the utility model provides a smart card testing system. The system comprises a main control processor, a first radio frequency induction module, a second radio frequency induction module, a time accumulator, a counter and a power supply module, wherein the first radio frequency induction module is respectively connected with the power supply module and the time accumulator, the second radio frequency induction module is respectively connected with the power supply module and the counter, the main control processor is respectively connected with the first radio frequency induction module, the second radio frequency induction module, the time accumulator, the counter and the power supply module, the power supply module is used for supplying power to the main control processor, the first radio frequency induction module, the second radio frequency induction module, the time accumulator and the counter, the first radio frequency induction module is used for continuously reading a test card, obtaining a first luminous state of an LED lamp of the test card and outputting a first electric signal to the time accumulator according to the first luminous state, the first luminous state comprises luminous time of the LED lamp, the time accumulator is used for accumulating and receiving the first electric signal to determine whether the test card is used for accumulating the first electric signal to receive the test card, the second luminous state is obtained by the time accumulator according to the first luminous state, and the second luminous state of the test card is used for accumulating the second luminous state to count. According to the technical scheme, the luminous state of the intelligent card is obtained by using the radio frequency sensing module, and the test result is recorded by the time accumulator and/or the counter, so that the durability test of the product added with LED optical signal feedback in the intelligent card is realized.
Drawings
FIG. 1 is a schematic diagram of a smart card testing system according to an embodiment of the present utility model;
FIG. 2 is a schematic diagram of another smart card testing system according to an embodiment of the present utility model;
FIG. 3 is a schematic diagram of a control panel according to an embodiment of the present utility model;
fig. 4 is a schematic diagram of an execution process of a smart card testing system according to an embodiment of the present utility model.
Detailed Description
The utility model is described in further detail below with reference to the drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the utility model and are not limiting thereof. It should be further noted that, for convenience of description, only some, but not all of the structures related to the present utility model are shown in the drawings.
Fig. 1 is a schematic structural diagram of a smart card testing system 10 according to an embodiment of the present utility model. Referring to fig. 1, a main control processor 101, a first radio frequency induction module 102, a second radio frequency induction module 103, a timer 104, a counter 105 and a power module 106, wherein the first radio frequency induction module 102 is respectively connected with the power module 106 and the timer 104, and the second radio frequency induction module 103 is respectively connected with the power module 106 and the counter 105;
The main control processor 101 is respectively connected with the first radio frequency induction module 102, the second radio frequency induction module 103, the timer 104, the counter 105 and the power supply module 106;
The power module 106 is used for supplying power to the main control processor 101, the first radio frequency induction module 102, the second radio frequency induction module 103, the timer 104 and the counter 105;
The first radio frequency sensing module 102 is configured to continuously read the test card, obtain a first light emitting state of an LED lamp of the test card, and output a first electrical signal to the accumulator 104 according to the first light emitting state, where the first light emitting state includes a light emitting duration of the LED lamp;
the accumulator 104 is configured to receive the first electrical signal in an accumulated manner, so as to determine an accumulated test duration of the test card;
The second rf sensing module 103 is configured to periodically read the test card according to a preset time interval, obtain a second light emitting state of the LED lamp of the test card, and output a second electrical signal to the counter 105 according to the second light emitting state, where the second light emitting state includes whether the LED lamp emits light;
The counter 105 is used to accumulate the received second electrical signal to determine the accumulated number of tests of the test card.
In this embodiment, the main control processor 101 is connected to the first rf sensing module 102, the second rf sensing module 103, the timer 104, the counter 105 and the power module 106, respectively. The master processor 101 may be used to control execution of various modules in the system, and the master processor 101 may be an ARM Cortex-M4 processor, for example. The power module 106 may be a built-in battery or a charging power source.
Specifically, the first rf sensing module 102 may be a module that continuously performs a radio frequency test on the test card, and the first rf sensing module 102 may continuously read the test card and obtain a first light emitting state of an LED lamp of the test card. The test card may be a card with LED light signal feedback added to the NFC product, and exemplary, the test card may be an NFC smart card including an LED light. It should be noted that the smart card testing system 10 provided by the present utility model may be applicable to other NFC products embedded with LED lamps. The first light emitting state may be a light emitting state of an LED lamp obtained by the first rf sensing module 102 continuously and continuously reading the test card, and the first light emitting state may include a light emitting duration of the LED lamp of the test card.
After the first light emitting state is obtained, a first electric signal can be output to the accumulator 104 according to the first light emitting state, and the accumulator 104 can continuously perform time accumulation according to the obtained light emitting duration of the LED to determine the accumulated test duration of the test card, so as to realize the test of the use duration of the test card.
Specifically, the second rf sensing module 103 may be configured to periodically read the test card according to a preset time interval, where the preset time interval may be a preset test interval duration, and an exemplary preset time interval may be 0.5 seconds, and then the test card may be read once every 0.5 seconds with 0.5 seconds as a period. It should be understood that the first rf sensing module 102 may perform the test on the test card continuously, and immediately begin to perform a new test after one test is completed, and the second rf sensing module 103 may perform the new test after one test is completed for a period of time (e.g., 0.5 seconds or 1 second).
And each time the test card is read, the LED can emit light once, and a second light emitting state of the LED lamp of the test card can be obtained, wherein the second light emitting state comprises whether the LED lamp emits light or not. After the second light emitting state is obtained, a second electrical signal may be output according to the second light emitting state and transmitted to the counter 105. The counter 105 can continuously accumulate the light emitting times according to the light emitting times of the LED lamps so as to determine the accumulated test times of the test card and realize the test of the use times of the test card.
It should be noted that the test mode of the test card may include performing a test of a usage period, a test of a usage number, a test of a test number statistics in a preset period, or a test of a test period statistics in a preset measurement number. The specific test mode can be determined according to the test requirements of clients. By way of example, the test requirements of a customer may be the time required for 3 ten thousand hours of continuous communication of the LED signal to continue to be used, 90 ten thousand times of repeated communication of the LED signal to continue to be used, 30 ten thousand times of testing within 1 ten thousand hours of the LED signal to be used, and/or 60 ten thousand times of test observation to be performed.
The method includes the steps of enabling a user to observe the time duration displayed by the accumulator 104 without paying attention to the frequency displayed by the counter 105 when the user's test requirement is that the LED signal lamp can be continuously used for 3 ten thousand hours of continuous communication, enabling the user to observe the time duration displayed by the counter 105 without paying attention to the time duration displayed by the accumulator 104 when the user's test requirement is that the user can repeatedly communicate for 90 ten thousand times, enabling the user to set the accumulator 104 if the user's test requirement is that the user can perform 30 ten thousand times of tests within 1 ten thousand hours, enabling the accumulator 104 to stop timing after the time duration of the accumulator 104 reaches ten thousand hours, and sending a reminder (a buzzer reminder, a voice reminder and the like) and stopping the test to observe whether the time duration displayed by the counter 105 reaches 30 ten thousand times or not, enabling the counter 105 to stop counting for 60 ten thousand times and stopping the time duration displayed by the accumulator 104.
In this embodiment, the range of the timer 104 is 999999 hours, the timer 104 can be automatically cleared after the range is exceeded, the range of the counter 105 is 999999 times, and the counter 105 can be automatically cleared to zero after the range is exceeded. It should be noted that, after the timer 104 or the counter 105 exceeds the testing range, whether to continue the test may be selected according to the testing requirement of the user. Specifically, when the test requirement of the user is smaller than the test range of the accumulator 104 or the counter 105, the test can be performed normally. When the test requirement of the user is greater than or equal to the test range of the timer 104 or the counter 105, after the test range of the timer 104 or the counter 105 is reached, a test report can be generated and sent to the main control processor 101, and a tester can be prompted that the timer 104 or the counter 105 reaches the maximum test range, wherein the tester can be reminded through the buzzer alarm, a voice module can be added into the main control processor 101, and the tester can be reminded through the voice module, so that the maximum test range is reached. After reminding the tester to reach the maximum test range, the main control processor 101 can receive the instruction provided by the tester to continue testing, and continue testing, so as to complete the test requirement of the user.
For example, the test requirement of the user is 200 ten thousand times of tests, the test range of the counter 105 is exceeded, when the test technology reaches 999999 times, a test report is generated and sent to the main control processor 101, and the maximum test times are sent out through the voice module in the main control processor 101 to determine whether to continue the test, and the test is continued under the condition that the instruction of continuing the test provided by the tester is received.
The embodiment provides a smart card testing system, which utilizes a radio frequency sensing module to acquire the luminous state of a smart card, records a testing result through a timer and/or a counter, and realizes the durability test of a product added with LED optical signal feedback in the smart card.
On the basis of the above embodiment, fig. 2 is a schematic structural diagram of another smart card testing system 10 provided by the present utility model, and referring to fig. 2, the first radio frequency sensing module 102 includes a first NFC card reading module 1021 and a first optical signal detecting module 1022, where the first NFC card reading module 1021 is configured to continuously read a test card and trigger an LED lamp of the test card, and the first optical signal detecting module 1022 is configured to detect a first light emitting state of the LED lamp, convert the first light emitting state into a first electrical signal, and output the first electrical signal to the accumulator 104.
The second radio frequency sensing module 103 includes a second NFC card reading module 1031 and a second optical signal detecting module 1032, where the second NFC card reading module 1031 is configured to periodically read a test card according to a preset time interval and trigger an LED lamp of the test card, and the second optical signal detecting module 1032 is configured to detect a second light emitting state of the LED lamp, convert the second light emitting state into a second electrical signal, and output the second electrical signal to the counter 105.
Specifically, the first rf sensing module 102 includes a first NFC card reading module 1021 and a first optical signal detecting module 1022. The first NFC card reading module 1021 may be configured to continuously read the test card and trigger an LED lamp of the test card, and the first optical signal detection module 1022 is configured to detect a first light emitting state of the LED lamp, convert a light emitting duration of the first light emitting state into a first electrical signal, and output the first electrical signal to the accumulator 104.
For example, the first NFC card reading module 1021 continuously and uninterruptedly reads the internal chip of the NFC embedded LED card body, so that the LED lamp emits light, and the first optical signal detecting module 1022 detects the first light emitting state of the LED lamp, converts the light emitting duration of the first light emitting state into the first electrical signal, and feeds back the accumulator 104 at the same time, so that the accumulator 104 counts time.
Specifically, the second radio frequency sensing module 103 includes a second NFC card reading module 1031 and a second optical signal detecting module 1032, where the second NFC card reading module 1031 is configured to periodically read a test card according to a preset time interval and trigger an LED lamp of the test card, and the second optical signal detecting module 1032 is configured to detect a second light emitting state of the LED lamp, convert a number of light emitting times of the second light emitting state into a second electrical signal, and output the second electrical signal to the counter 105.
For example, the second NFC card 1031 reads the internal chip of the NFC embedded LED card body with one period of 0.5 seconds, so that the LED lamp flashes, and the second optical signal detecting module 1032 detects the second light emitting state of the LED lamp, and simultaneously converts the number of times of light emission in the second light emitting state into a second electrical signal, and the second electrical signal is fed back to the counter 105, so that the counter 105 counts.
Further, the smart card testing system 10 further comprises a control panel 107, wherein the control panel 107 is connected with the main control processor 101, and comprises a display module 1071;
The display module 1071 is used for displaying the accumulated test duration and/or the accumulated test times of the test card.
Specifically, the display module 1071 may be located on the control panel 107 for displaying the accumulated test duration and/or the accumulated test times of the test card.
Further, the control panel 107 also comprises a reset module 1072, wherein the reset module 1072 is connected with the main control processor 101;
the reset module 1072 is configured to reset the accumulator 104 and/or the counter 105.
In the present utility model, the reset module 1072 may be used to reset the accumulator and/or counter.
Fig. 3 is a schematic diagram of a control panel according to the present embodiment, and referring to fig. 3, the control panel includes two display screens for displaying the accumulated time (seconds) and the accumulated number of times (times), respectively. Reset button 1 can realize the reset to the tired time ware, reset button 2 can realize the reset to the counter.
If the user's test purpose is to see how many times the test has been performed, that is, see how many times the counter has reached the thinking time, the test is stopped without paying attention to the time of the timer. If the test purpose is to see how long it has been, it is necessary to see if the timer is a preset test time that is reached, at which time the number of times the timer is not of interest. If the user's test purpose is to see how many times the test was measured in the set time, then the accumulator and the accumulator need be connected in parallel simultaneously to realize this function to satisfy the test demand of user.
Further, the system also comprises a data storage module 108, wherein the data storage module 108 is connected with the main control processor 101;
the data storage module 108 is used for storing system information of a test process of the test card.
It is understood that the present utility model may further include a data storage module 108, where the data storage module 108 may store system information of the test card during the test. The system information may include test data of the test card during the test process.
Further, the system also comprises a communication module 109, wherein the communication module 109 is connected with the main control processor 101;
The communication module 109 is used to transmit system information to an external device.
It may be appreciated that the present utility model may further include a communication module 109, where the main control processor 101 may control the communication module 109 to transmit the system information stored in the data storage module 108 to an external device, and the communication module 109 may be, for example, a type-c interface and/or a bluetooth communication manner. The system information may include test data, test settings, system anomaly information, etc. of the test card during the test process. Further, the system also comprises a monitoring module 110, wherein the monitoring module 110 is connected with the main control processor 101;
the monitoring module 110 is configured to monitor a system state of the system, and transmit the monitored system state to the main control processor 101.
Specifically, the monitoring module 110 may monitor the system status of the smart card testing system 10, and transmit the monitored system status to the main control processor 101. The system state may include a system state of the smart card test system 10, such as a device connection state, a communication state, a test progress state, a power state, and the like of various devices, and a test state of a test card, such as a test being performed, a test ending, and the like. Further, the system also comprises a status indication module 111, wherein the status indication module 111 is connected with the main control processor 101;
The status indication module 111 is configured to display a system status according to an instruction of the main control processor 101.
Specifically, after the main control processor 101 receives the monitoring state of the monitoring module 110, the state indicating module 111 may display the system state according to the instruction of the main control processor 101. For example, the status indication module may be a status indicator light that is displayed by a multi-color LED. If the status indicator light is green, the system status is considered to be normal, and if the status indicator light is red, the system status is considered to be abnormal.
Further, the system also comprises an alarm module 112, wherein the alarm module 112 is connected with the main control processor 101;
the alarm module 112 is used for alarming in case of abnormal system state.
Specifically, in the event that the system state is abnormal, the alarm module 112 may issue an alarm. The alarm module 112 may be a buzzer, for example.
Fig. 4 is a schematic diagram of an execution process of the smart card testing system provided by the utility model, as shown in fig. 4, a first radio frequency induction module is used for continuously inducing an NFC smart card product embedded with an LED lamp to obtain a first electric signal output and outputting the first electric signal to a cumulative timer, and a second radio frequency induction module is used for periodically inducing the NFC product embedded with the LED lamp according to an induction period of 0.5 seconds to obtain a second electric signal output and outputting the second electric signal to a counter;
Note that the above is only a preferred embodiment of the present utility model and the technical principle applied. It will be understood by those skilled in the art that the present utility model is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the utility model. Therefore, while the utility model has been described in connection with the above embodiments, the utility model is not limited to the embodiments, but may be embodied in many other equivalent forms without departing from the spirit or scope of the utility model, which is set forth in the following claims.
Claims (10)
1. The intelligent card testing system is characterized by comprising a main control processor, a first radio frequency induction module, a second radio frequency induction module, a time accumulator, a counter and a power module, wherein the first radio frequency induction module is respectively connected with the power module and the time accumulator;
the main control processor is respectively connected with the first radio frequency induction module, the second radio frequency induction module, the time accumulator, the counter and the power supply module;
The power supply module is used for supplying power to the main control processor, the first radio frequency induction module, the second radio frequency induction module, the time accumulator and the counter;
The first radio frequency induction module is used for continuously reading a test card, acquiring a first luminous state of an LED lamp of the test card, and outputting a first electric signal to the time accumulator according to the first luminous state, wherein the first luminous state comprises the luminous duration of the LED lamp;
The cumulative timer is used for cumulatively receiving the first electric signal to determine the cumulative test duration of the test card;
The second radio frequency induction module is used for periodically reading a test card according to a preset time interval, obtaining a second luminous state of an LED lamp of the test card, and outputting a second electric signal to the counter according to the second luminous state, wherein the second luminous state comprises whether the LED lamp emits light or not;
The counter is used for accumulating the received second electric signals to determine the accumulated test times of the test card.
2. The system of claim 1, wherein the first radio frequency sensing module comprises a first NFC card reading module and a first optical signal detection module;
The first NFC card reading module is used for continuously reading the test card and triggering an LED lamp of the test card;
the first light signal detection module is used for detecting a first light-emitting state of the LED lamp, converting the first light-emitting state into a first electric signal and outputting the first electric signal to the time accumulator.
3. The system of claim 1, wherein the second radio frequency sensing module comprises a second NFC card reading module and a second optical signal detection module;
The second NFC card reading module is used for periodically reading the test card according to a preset time interval and triggering an LED lamp of the test card;
The second light signal detection module is used for detecting a second light-emitting state of the LED lamp, converting the second light-emitting state into a second electric signal and outputting the second electric signal to the counter.
4. The system of claim 1, further comprising a control panel, wherein the control panel is coupled to the master processor, wherein the control panel comprises a display module;
The display module is used for displaying the accumulated test duration and/or the accumulated test times of the test card.
5. The system of claim 4, wherein the control panel further comprises a reset module, wherein the reset module is coupled to the master processor;
the reset module is used for resetting the accumulator and/or the counter.
6. The system of claim 1, further comprising a data storage module, wherein the data storage module is coupled to the master processor;
The data storage module is used for storing system information of the test process of the test card.
7. The system of claim 6, further comprising a communication module, wherein the communication module is coupled to the master processor;
The communication module is used for transmitting the system information to external equipment.
8. The system of claim 1, further comprising a monitoring module, wherein the monitoring module is coupled to the master processor;
The monitoring module is used for monitoring the system state of the system and transmitting the monitored system state to the main control processor.
9. The system of claim 8, further comprising a status indication module, wherein the status indication module is coupled to the master processor;
the state indicating module is used for displaying the system state according to the instruction of the main control processor.
10. The system of claim 9, further comprising an alarm module, wherein the alarm module is coupled to the master processor;
The alarm module is used for alarming under the condition that the system state is abnormal.
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| CN202520961988.1U CN223123168U (en) | 2025-05-16 | 2025-05-16 | Intelligent card test system |
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| CN202520961988.1U CN223123168U (en) | 2025-05-16 | 2025-05-16 | Intelligent card test system |
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