CN222800832U

CN222800832U - LTCC filter test equipment

Info

Publication number: CN222800832U
Application number: CN202420579771.XU
Authority: CN
Inventors: 韦鹏; 付迎华; 梁启新; 陈亚伟
Original assignee: Shenzhen Microgate Technology Co ltd
Current assignee: Shenzhen Microgate Technology Co ltd
Priority date: 2024-03-25
Filing date: 2024-03-25
Publication date: 2025-04-25
Anticipated expiration: 2034-03-25

Abstract

The utility model discloses an LTCC filter testing device which comprises a PCB for testing, a probe fixing device and a probe for testing, wherein the probe for testing is fixedly arranged in the probe fixing device, and the probe for testing is positioned on the upper surface of the PCB for testing. The probe can be well matched with the heights of the electrodes of different pins of the LTCC filter during testing, and the problems of easy inclination, poor testing precision and conductive adhesive loss in the electrical performance testing process caused by the fact that plating thicknesses of the electrodes of different pins of the LTCC filter are different are solved.

Description

LTCC filter testing device

Technical Field

The utility model discloses a testing device, and particularly relates to an LTCC filter testing device.

Background

LTCC (Low Temperature Co-FIRED CERAMIC) filter is a high frequency filter manufactured using low temperature co-fired ceramic technology. This technique allows simultaneous sintering of the ceramic substrate and the internal metallic conductive layers at a relatively low temperature (typically between 850 ℃ and 900 ℃) to form complex three-dimensional structures, which makes LTCC filters particularly suitable for applications requiring miniaturized, high performance and multi-layer Integrated Circuits (ICs), such as in mobile communications, satellite communications, radar systems and other Radio Frequency (RF) and microwave applications.

After sintering, the LTCC filter needs to be electroplated on the electrode pin part so as to be used for subsequent welding, but the existing LTCC filter product has the problem that the electrode pin is uneven after electroplating, particularly for multi-terminal products, the electrode pin is poor in coplanarity, the product is easy to skew in the process of testing the electrical performance, and the test stability is poor so that the test result is inaccurate.

Disclosure of Invention

Aiming at the problems that the electrode pins of the LTCC filter in the prior art are poor in coplanarity and poor in test stability, so that a test result is inaccurate, the utility model provides a novel LTCC filter test device, which can connect the electrode pins of the filter with a PCB for testing through a probe and solves the problems of easy inclination, poor test precision and conductive adhesive loss in the electrical performance test process caused by the fact that plating thicknesses of electrodes of different pins of the LTCC filter are poor in electroplating process.

The technical scheme includes that the LTCC filter testing device comprises a PCB for testing, a probe fixing device and a probe for testing, wherein the probe for testing is fixedly arranged in the probe fixing device, and the probe for testing is positioned on the upper surface of the PCB for testing.

The technical scheme adopted by the utility model for solving the technical problems further comprises the following steps:

the PCB is provided with a microstrip line.

The thickness of the conductor layer of the microstrip line on the PCB is 0.02mm, the width of the line width of the conductor layer of the microstrip line on the PCB is 0.025mm, and the conductor layer of the microstrip line on the PCB is covered on the surface of the microstrip line in a gold deposition mode.

The base material of the PCB adopts a glass fiber board, the thickness is 1.0+/-0.05 mm, and the dielectric constant of the base material of the PCB is 4.4+/-0.2.

The thickness of the outer edge of the probe fixing device is 4.45mm, and the thickness of the inner edge of the probe fixing device is 2.95mm.

The probe fixing device is connected with the PCB 1 through 4 set screws.

The probe fixing device is provided with 4 positioning cylinders.

The total height of the probe is 3.3mm, and the upper and lower telescopic heights of the probe are 0.3mm.

The utility model has the beneficial effects that the probe can be well matched with the heights of different pin electrodes of the LTCC filter during testing, and the problems of easy inclination, poor testing precision and conductive adhesive loss in the electrical performance testing process caused by the plating thickness difference generated in the electroplating process of the different pin electrodes of the LTCC filter are solved.

The utility model will be further described with reference to the drawings and detailed description.

Drawings

Fig. 1 is a schematic top view of a LTCC filter testing apparatus according to the present utility model.

Fig. 2 is a schematic diagram of the front view structure of the LTCC filter testing apparatus of the present utility model.

Fig. 3 is a schematic top view of a PCB board according to the present utility model.

FIG. 4 is a schematic diagram of the structure of the probe according to the present utility model.

FIG. 5 is a schematic view of a fixed probe device according to the present utility model.

In the figure, a 1-PCB board, a 2-probe fixing device, a 3-probe, a 4-screw and a 5-positioning cylinder.

Detailed Description

This example is a preferred embodiment of the present utility model, and other principles and basic structures are the same as or similar to those of this example, and all fall within the scope of the present utility model.

Referring to fig. 1 to 5, the utility model provides an LTCC filter testing device, which mainly comprises a testing PCB 1, a probe fixing device 2 and a testing probe 3, wherein the testing probe 3 is fixedly arranged in the probe fixing device 2, and the testing probe 3 is positioned on the upper surface of the testing PCB 1, the LTCC filter is electrically connected with the testing PCB 1 through the probe 3, and the probe 3 has flexibility, so that the electrode of the LTCC filter can be prevented from being uneven.

In this embodiment, a microstrip line is disposed on the PCB board 1 for conducting a line and transmitting signals, and the microstrip line is specifically designed according to the specific tested LTCC filter internal circuit structure and electrode pin arrangement mode. In the embodiment, the thickness of the conductor layer of the microstrip line on the PCB 1 is 0.02mm, the width of the line width of the conductor layer of the microstrip line on the PCB 1 is 0.025mm, and the conductor layer of the microstrip line on the PCB 1 is covered on the surface of the microstrip line in a gold plating mode.

In this embodiment, the substrate of the PCB board 1 is a glass fiber board (i.e. FR 4) with a thickness of 1.0±0.05mm, and the substrate of the PCB board 1 has a dielectric constant of 4.4±0.2.

In this embodiment, the probe fixing device 2 is made of 22 x 22mm square plastic, the thickness of the outer edge of the probe fixing device 2 is 4.45mm, the thickness of the inner edge of the probe fixing device 2 is 2.95mm, and in this embodiment, the inner edge of the probe fixing device 2 is the position where the probe 3 is installed. The probe fixing device 2 is connected with the PCB 1 through 4 set screws 4, and the connection of the probe 3 and the PCB 1 is ensured by the 4 set screws 4. In this embodiment, 4 positioning columns 5 are installed on the probe fixing device 2, and the test positions of the probe 3 and the test PCB board 1 are positioned by the 4 positioning columns 5.

In this embodiment, the total height of the probe 3 is 3.3mm, and the height of the probe 3 which can be extended and retracted up and down is 0.3mm. Preferably, the probe 3 is embedded in the probe fixing device 2, the upper side of the probe 3 leaks out of the upper surface of the probe fixing device 2 by 0.3mm and is a retractable probe, and the lower side of the probe 3 leaks out of the lower surface of the probe fixing device 2 by 0.15mm and is a retractable probe.

The manufacturing process of the PCB 1 is that the corresponding PCB 1 is designed according to the product impedance of the LTCC filter, and the PCB with the same height as the microstrip line is manufactured. By measuring the height difference of each pin of the filter, reversely calculating the height of the probe which can be telescopic, and calculating to obtain the probe 3 with the upper and lower telescopic heights of 0.3mm, fixing the probe 3 by fixing the probe fixing device 2 in the middle of 22 x 22mm square hollow plastic, and only exposing the telescopic probe, wherein the thickness of the outer edge of the probe fixing device 2 is 4.45mm, and the thickness of the inner edge probe is 2.95mm.

The LTCC filter is electrically connected with the PCB 1 through the probe 3, and the probe 3 has elasticity, so that uneven electrode height of the LTCC filter can be avoided. During testing, the probe 3 can be well matched with the heights of different pin electrodes of the LTCC filter, the LTCC filter is not inclined, and the problems of easy inclination, poor testing precision and conductive adhesive loss in the electrical performance testing process caused by the fact that plating thicknesses of different pin electrodes of the LTCC filter are poor in electroplating process are solved.

Those skilled in the art will recognize that numerous variations are possible in light of the above description, and that the examples and figures are merely intended to illustrate one or more particular embodiments, although described and illustrated as exemplary embodiments of the utility model, it will be apparent to those skilled in the art that various changes and substitutions may be made thereto. In addition, many modifications may be made to adapt a particular situation to the teachings of the utility model without departing from the central concept thereof as described herein. Therefore, it is intended that the utility model not be limited to the particular embodiment disclosed, but that the utility model will include all embodiments falling within the scope of the utility model and equivalents thereof.

Claims

1. A LTCC filter testing device, characterized in that: the testing device comprises a testing PCB board (1), a probe fixing device (2) and a testing probe (3), the testing probe (3) being fixedly arranged in the probe fixing device (2), and the testing probe (3) being located on the upper surface of the testing PCB board (1).

2. The LTCC filter testing device according to claim 1, characterized in that a microstrip line is provided on the PCB board (1).

3. The LTCC filter test device according to claim 2 is characterized in that: the conductor layer thickness of the microstrip line on the PCB board (1) is 0.02 mm; the conductor layer width of the microstrip line on the PCB board (1) is 0.025 mm; the conductor layer of the microstrip line on the PCB board (1) is covered on the surface of the microstrip line by immersion gold.

4. The LTCC filter testing device according to claim 1, characterized in that: the substrate of the PCB board (1) is a glass fiber board with a thickness of 1.0±0.05 mm; and the dielectric constant of the substrate of the PCB board (1) is 4.4±0.2.

5. The LTCC filter testing device according to claim 1, characterized in that: the outer edge thickness of the probe fixture (2) is 4.45 mm, and the inner edge thickness of the probe fixture (2) is 2.95 mm.

6. The LTCC filter testing device according to claim 1, characterized in that: the probe fixing device (2) is connected to the PCB board 1 through four positioning screws (4).

7. The LTCC filter testing device according to claim 1, characterized in that: four positioning cylinders (5) are installed on the probe fixing device (2).

8. The LTCC filter testing device according to claim 1, characterized in that: the total height of the probe (3) is 3.3 mm, and the upper and lower telescopic heights of the probe (3) are both 0.3 mm.