CN203217048U - An embedded system test and analysis platform for linear array CCD devices - Google Patents

Abstract

The utility model relates to an embedded system testing/analyzing platform of a linear array charge coupled device (CCD). The embedded system testing/analyzing platform includes the following components of: a linear array CCD image source; a decoding chip which is connected with the linear array CCD image source; a storage unit which is connected with the decoding chip and is use for storing image decoding data; an FPGA unit which is connected with the storage unit and is used for providing pixel, synchronization and control signals for displaying images; a DVI encoding array unit which is connected with the FPGA unit and comprises a plurality of DVI encoders, wherein the plurality of DVI encoders are correspondingly connected with a plurality of display units respectively through DVI data lines; and an ARM unit which is connected with the display units, the FPGA unit and the storage unit, and is used for controlling image playback and detecting the number of the display units so as to control image segmentation of the FPGA unit. The embedded system testing/analyzing platform of the linear array CCD of the utility model is used for detecting the pixels of high-resolution images, such that whether the pixels are lost or not can be judged.

Description

An embedded system test and analysis platform for linear array CCD devices

technical field

The utility model relates to an embedded system test and analysis platform of a linear array CCD device.

Background technique

In recent years, laser and optical technologies have developed rapidly, and the fields involved have gradually expanded. Charge-coupled device (CCD) is a relatively popular device in photoelectric sensors. A linear array CCD device arranges many pixel units in a line. The shooting process is to scan the object along the vertical direction of the CCD line in one-dimensional relative motion. For a two-dimensional image, due to the high pixel of the linear array CCD device, when shooting at a long distance, a small target is usually only a few pixels in size, but each target in the image may have a certain meaning and cannot be lost. Therefore, a test and analysis platform is needed to accurately test and analyze the shooting results of the linear array CCD device.

Utility model content

The technical problem to be solved by the utility model is to provide an embedded system test and analysis platform for linear array CCD devices. question.

In order to solve the above-mentioned technical problems, the utility model provides a kind of 1, an embedded system test and analysis platform of a linear array CCD device, comprising:

A line array CCD image source, a decoding chip connected to the line array CCD image source for decoding image signals, a storage unit connected to the decoding chip for storing image decoding data, and a storage unit connected to the storage unit for An FPGA unit that provides pixels for displaying images, synchronization, and control signals, and a DVI encoding array unit connected to the FPGA unit, the DVI encoding array unit includes several DVI encoders;

The plurality of DVI encoders are correspondingly connected to a plurality of display units through DVI data lines;

An ARM unit connected to each display unit, FPGA unit and storage unit for controlling image playback and detecting the number of display units to control the FPGA unit to divide images.

Compared with the prior art, the above-mentioned technical solution of the utility model has the following advantages: (1) through the storage unit, the data captured by the linear array CCD image source can be replayed and detected, so as to test the performance of the linear array CCD device; The display unit and ARM unit connected to several DVI encoders can detect and analyze the pixels of high-resolution images to determine whether there is pixel loss.

Description of drawings

In order to make the content of the utility model easier to understand clearly, the utility model will be further described in detail according to the specific embodiments below in conjunction with the accompanying drawings, wherein

Fig. 1 is a structural block diagram of an embedded system test and analysis platform of a linear array CCD device of the present invention.

Detailed ways

Below in conjunction with accompanying drawing and embodiment the present invention is described in detail:

See Figure 1, an embedded system test and analysis platform for linear array CCD devices, including:

A line array CCD image source, a decoding chip connected to the line array CCD image source for decoding image signals, a storage unit connected to the decoding chip for storing image decoding data, and a storage unit connected to the storage unit for An FPGA unit that provides pixels for displaying images, synchronization, and control signals, and a DVI encoding array unit connected to the FPGA unit, the DVI encoding array unit includes several DVI encoders;

The plurality of DVI encoders are correspondingly connected to a plurality of display units through DVI data lines;

An ARM unit connected to each display unit, FPGA unit and storage unit for controlling image playback and detecting the number of display units to control the FPGA unit to divide images.

The FPGA unit provides pixels, synchronization, and control signals of images corresponding to the segmented images.

The linear array CCD image source is connected with the decoding chip through the CAMERA_LINK interface, the decoding chip adopts DS90CR286, the FPGA adopts the Spartan series chip of Xilinx Company, the DVI decoder adopts the SII1162 chip, the DVI data line adopts the DVI-D cable, and the ARM chip adopts For S3C2440A, the display unit can be a liquid crystal display or a large-screen LCD TV.

Apparently, the above-mentioned embodiments are only examples for clearly illustrating the utility model, rather than limiting the implementation of the utility model. For those of ordinary skill in the art, other changes or changes in different forms can be made on the basis of the above description. It is not necessary and impossible to exhaustively list all the implementation manners here. And these obvious changes or variations derived from the spirit of the present invention are still within the protection scope of the present invention.

Claims (1)

1. the embedded system test analysis platform of a line array CCD device is characterized in that comprising:

The linear array CCD image source, the decoding chip that being used for of linking to each other with this linear array CCD image source decodes to picture signal, the storage unit that is used for the memory image decoded data that links to each other with this decoding chip, the pixel that link to each other with this storage unit be used for providing shows image, synchronously, the FPGA unit of control signal, the DVI encoding array unit that links to each other with this FPGA unit, this DVI encoding array unit comprises some DVI scramblers;

Described some DVI scramblers are corresponding with some display units continuous respectively by the DVI data line;

What link to each other with described each display unit, FPGA unit, storage unit is used for the control image reproducing, and detects the quantity of display unit, to control the ARM unit of described FPGA unit split image.

Images