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CN201066375Y - Test fixture for card reading interface - Google Patents

Test fixture for card reading interface Download PDF

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Publication number
CN201066375Y
CN201066375Y CNU2007201462605U CN200720146260U CN201066375Y CN 201066375 Y CN201066375 Y CN 201066375Y CN U2007201462605 U CNU2007201462605 U CN U2007201462605U CN 200720146260 U CN200720146260 U CN 200720146260U CN 201066375 Y CN201066375 Y CN 201066375Y
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interface
memory card
card
storage card
card slot
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陈镇
周刚
陈玄同
刘文涵
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Inventec Corp
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Inventec Corp
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Abstract

The utility model provides a test fixture of card reading interface is applied to the card reading interface including multiple memory card interface and is integrated these memory card interfaces in a memory card slot. The test fixture is electrically connected to the memory card slot, and the test fixture comprises: the storage card, the switching unit, the connecting part and the connecting circuit; the switching unit is connected with the notebook computer and receives a switching instruction sent by the notebook computer; the switching unit selects the corresponding memory card according to the received switching instruction; the connecting part is connected between the memory card slot and the switching unit; the connecting circuit is connected between the switching unit and the memory card and transmits the detection data to the notebook computer. The notebook computer detects the detection data before and after access, and not only judges whether the memory card slot operates normally, but also reduces the plugging of the memory card slot.

Description

读卡接口的测试治具 Test fixture for card reader interface

技术领域 technical field

本实用新型涉及一种读卡接口的测试治具及其测试方法,特别涉及一种用以测试具有多种存储卡接口的读卡接口的测试治具。The utility model relates to a test fixture for a card-reading interface and a testing method thereof, in particular to a test fixture for testing a card-reading interface with multiple memory card interfaces.

背景技术 Background technique

随着存储卡种类的多样化,使得使用者需要购买其对应的读卡接口,用以存取存储卡中的数据。例如,使用者若是使用CF存储卡,则另外购买CF读卡接口。若是使用者欲存取SD存储卡的数据时,则另外购买SD读卡接口,所以一种规格的存储卡就要其对应的读卡接口,这使得使用者会造成许多的不便。为了解决多种读卡接口的问题,所以有厂商把多种规格的读卡接口整合于一体里。这种多合一的读卡接口将各类存储卡接口设置于同一存储卡插槽中,通过不同存储卡外型依序设置在存储卡插槽中。With the diversification of types of memory cards, users need to purchase corresponding card reading interfaces for accessing data in the memory cards. For example, if the user uses a CF memory card, he needs to purchase a CF card reader interface separately. If the user wants to access the data of the SD memory card, an SD card reader interface is purchased separately, so a memory card of one specification needs its corresponding card reader interface, which causes a lot of inconvenience to the user. In order to solve the problem of multiple card-reading interfaces, some manufacturers integrate card-reading interfaces of various specifications into one body. In this all-in-one card reading interface, various memory card interfaces are arranged in the same memory card slot, and the memory card slots are sequentially arranged in the memory card slot through different memory card shapes.

请参考图1所示,其为具有多存储卡接口的存储卡插槽与存储卡连接示意图。使用者只要找到该存储卡插槽中对应的存储卡位置即可使用。这样一来,除了可以整合多种存储卡于一个读卡接口中,也可以节省读卡接口的体积。为了扩充笔记本计算机的连接功能,许多笔记本计算机上开始设置有上述的多合一读卡接口。使得使用者在外出时就不需额外再携带读卡接口借以减少其负担。Please refer to FIG. 1 , which is a schematic diagram of connection between a memory card slot with multiple memory card interfaces and memory cards. The user only needs to find the corresponding memory card position in the memory card slot to use it. In this way, in addition to integrating multiple memory cards into one card reading interface, the volume of the card reading interface can also be saved. In order to expand the connection function of the notebook computer, the above-mentioned all-in-one card reader interface is initially provided on many notebook computers. The user does not need to carry the card reading interface additionally when going out so as to reduce the burden on the user.

厂商为了测试此种多合一读卡接口通常的测试方式如下列步骤所示,请参考图2所示:选择一存储卡(参见步骤S210)。将选择的存储卡插入其对应的存储卡插槽中(参见步骤S220)。由笔记本计算机提供测试信号至存储卡(参见步骤S230)。笔记本计算机检测发送前与接收到的测试信号(参见步骤S240)。若比对后无误,则重复步骤S210直至所有的存储卡都完成检测。这样的测试方式都需要进行抽换的动作,以N合一种读卡接口为例,则需要进行N次的插拔及其测试。对于读卡接口与测试用的存储卡来说,插拔的动作或多或少都会造成设备的损伤。特别是对存储卡而言,因为要测试多台笔记本计算机,所以插拔的次数更多更容易被磨损,使得厂商需要经常购入新的一批存储卡。这对于厂商而言会增加测试成本。The manufacturer usually uses the following steps to test the multi-in-one card reader interface, please refer to FIG. 2: select a memory card (see step S210). Insert the selected memory card into its corresponding memory card slot (see step S220). The notebook computer provides a test signal to the memory card (see step S230). The notebook computer detects the pre-sent and received test signals (see step S240). If there is no error after the comparison, repeat step S210 until all the memory cards are detected. Such a test method needs to be replaced. Taking N-in-one card reader interface as an example, it needs to perform N times of plugging and testing. For the card reading interface and the memory card used for testing, the action of plugging and unplugging will more or less cause damage to the device. Especially for the memory card, because it is necessary to test multiple notebook computers, it is more likely to be inserted and pulled out more often, which makes the manufacturer need to purchase a new batch of memory cards frequently. This will increase the test cost for the manufacturer.

实用新型内容Utility model content

鉴于以上的问题,本实用新型的主要目的在于提供一种读卡接口的测试治具,用以连接至笔记本计算机中的一读卡接口。此读卡接口设置一存储卡插槽,于存储卡插槽中具有多种规格的存储卡接口。In view of the above problems, the main purpose of the present invention is to provide a test fixture for a card reader interface, which is used to connect to a card reader interface in a notebook computer. The card reading interface is provided with a memory card slot, and there are memory card interfaces of various specifications in the memory card slot.

为达上述目的,本实用新型所揭示一种读卡接口的测试治具,存储卡插槽至少包括一个以上存储卡接口,测试治具电连接于存储卡插槽,测试治具中包括:存储卡、切换单元、连接部与连接电路。In order to achieve the above purpose, the utility model discloses a test fixture for a card reading interface. The memory card slot includes at least one memory card interface, and the test fixture is electrically connected to the memory card slot. The test fixture includes: A card, a switching unit, a connecting part, and a connecting circuit.

依据本实用新型的实施例,上述利用测试治具中提供多种存储卡;一切换单元,电连接于该笔记本计算机,该切换单元输入从该笔记本计算机所发送的一切换指令,并输出用以选择对应的所述存储卡的信号;一连接部,电连接于该存储卡插槽与该切换单元之间;以及一连接电路,电连接于该切换单元与所述存储卡之间,该连接电路向所述存储卡输出检测数据,并且所述检测数据通过所述存储卡插槽输出至该笔记本计算机,该笔记本计算机输出用以判断该存储卡插槽是否正常运作的信号。According to an embodiment of the present invention, the above-mentioned utilization test fixture provides various memory cards; a switching unit is electrically connected to the notebook computer, and the switching unit inputs a switching command sent from the notebook computer, and outputs a switching command for Select the corresponding signal of the memory card; a connection part, electrically connected between the memory card slot and the switching unit; and a connection circuit, electrically connected between the switching unit and the memory card, the connection The circuit outputs detection data to the memory card, and the detection data is output to the notebook computer through the memory card slot, and the notebook computer outputs a signal for judging whether the memory card slot is in normal operation.

上述的读卡接口的测试治具,其中优选地,该存储卡插槽至少包括一CF接口、一SD接口、一MS接口、一SM接口、一XD接口、MSP接口或一MMC接口。In the test fixture for the above-mentioned card reading interface, preferably, the memory card slot at least includes a CF interface, an SD interface, an MS interface, an SM interface, an XD interface, an MSP interface or an MMC interface.

上述的读卡接口的测试治具,其中优选地,该存储卡为一CF存储卡、一SD存储卡、一MS存储卡、一SM存储卡、一XD存储卡、MSP存储卡或一MMC存储卡。The test fixture of the above-mentioned card reading interface, wherein preferably, the memory card is a CF memory card, an SD memory card, an MS memory card, an SM memory card, an XD memory card, an MSP memory card or an MMC memory card Card.

上述的读卡接口的测试治具,其中优选地,该笔记本计算机向该切换单元发送用以触发一种存储卡中的一芯片选择脚位使其被选择作为检测用存储卡的串行外设接口命令作为切换指令。The test fixture for the above-mentioned card reading interface, wherein preferably, the notebook computer sends a serial peripheral device for triggering a chip selection pin in a memory card to be selected as a memory card for testing to the switching unit The interface command acts as a switching instruction.

本实用新型提供一种读卡接口的测试治具,用以连接具有多规格存储卡接口的读卡接口插槽,可以降低对读卡接口插槽的插拔次数。并且通过笔记本计算机发送切换指令,借以选择所欲测试的存储卡接口。The utility model provides a test fixture for a card-reading interface, which is used for connecting a card-reading interface slot with multi-standard memory card interfaces, which can reduce the number of times of inserting and pulling out the card-reading interface slot. And send a switching command through the notebook computer, so as to select the memory card interface to be tested.

附图说明 Description of drawings

图1为具有多存储卡接口的存储卡插槽与存储卡连接示意图。FIG. 1 is a schematic diagram of the connection between a memory card slot with multiple memory card interfaces and memory cards.

图2为现有技术测试流程图。Fig. 2 is a flow chart of prior art testing.

图3为本实用新型与笔记本计算机连接示意图。Fig. 3 is a schematic diagram of the connection between the utility model and a notebook computer.

图4为利用本实用新型的测试流程图。Fig. 4 is the test flowchart utilizing the utility model.

图5为本实用新型中存储卡的连接示意图。Fig. 5 is a schematic diagram of the connection of the memory card in the present invention.

其中,附图标记说明如下:Wherein, the reference signs are explained as follows:

110~读卡接口    111~存储卡插槽    300~测试装置110~card reading interface 111~memory card slot 300~test device

310~连接部      320~存储卡        330~切换单元310~connection part 320~memory card 330~switching unit

340~连接电路340~connection circuit

具体实施方式 Detailed ways

有关本实用新型的特征与实作,配合附图对最佳实施例详细说明如下:Relevant feature and implementation of the present utility model, in conjunction with accompanying drawing, the preferred embodiment is described in detail as follows:

本实用新型提供一种读卡接口110的测试治具300。笔记本计算机提供存储卡插槽,存储卡插槽中可以是但不限于为CF(紧凑式闪存卡,CompactFlash)接口、SD(安全数字,Secure Digital)接口、MS(存储棒,Memory Stick)接口、SM(智能存储介质Smart Media)接口、XD(扩展卡)接口、MSP接口(高级存储棒,Memory Stick Pro)或MMC(多媒体存储卡,Multimedia Card)接口的存储卡。在测试治具300中包括:连接部310、存储卡320、切换单元330与连接电路340。The utility model provides a test fixture 300 for a card reading interface 110 . The notebook computer provides a memory card slot, which can be but not limited to CF (Compact Flash Card, CompactFlash) interface, SD (Secure Digital, Secure Digital) interface, MS (Memory Stick, Memory Stick) interface, Memory card with SM (Smart Media) interface, XD (Extension Card) interface, MSP interface (Memory Stick Pro) or MMC (Multimedia Card) interface. The test fixture 300 includes: a connection part 310 , a memory card 320 , a switch unit 330 and a connection circuit 340 .

请参考图3所示,其为本实用新型与笔记本计算机连接示意图。在测试治具300中设置有多种不同规格的存储卡320,并将其整合于一电路板上。连接部310用以电连接于存储卡插槽111与切换单元330之间。为能减少对于存储卡插槽111的插拔,所以连接部310的外观则是设计与存储卡插槽111相符合,并且对应存储卡插槽111中具有的存储卡接口。所以在测试治具300中同时包括了多种规格接口的存储卡320,例如,CF存储卡、SD存储卡、MS存储卡、SM存储卡、XD存储卡、MSP存储卡(Memory Stick Pro Card)或MMC存储卡。当连接部310置入于存储卡插槽111时,测试治具300与存储卡插槽111中所具有的存储卡接口电连接。Please refer to FIG. 3 , which is a schematic diagram of the connection between the utility model and a notebook computer. A variety of memory cards 320 with different specifications are arranged in the test fixture 300 and integrated on a circuit board. The connecting portion 310 is used for electrically connecting between the memory card slot 111 and the switching unit 330 . In order to reduce the insertion and removal of the memory card slot 111 , the appearance of the connecting portion 310 is designed to match the memory card slot 111 and correspond to the memory card interface in the memory card slot 111 . Therefore, the test fixture 300 also includes memory cards 320 with various specifications and interfaces, for example, CF memory card, SD memory card, MS memory card, SM memory card, XD memory card, MSP memory card (Memory Stick Pro Card) or MMC memory card. When the connecting portion 310 is placed in the memory card slot 111 , the test fixture 300 is electrically connected to the memory card interface in the memory card slot 111 .

切换单元330电连接于笔记本计算机,切换单元330用以接收笔记本计算机所发送的切换指令。切换单元330根据所接收的切换指令输出用以选择对应的存储卡320的信号。切换指令为串行外设接口(Serial PeripheralInterface,SPI)命令。串行外设接口为微处理器和接口设备的一种同步的串行数据协议,串行外设接口用以提供CPU与外围元件之间高频宽的网络连接。The switching unit 330 is electrically connected to the notebook computer, and the switching unit 330 is used for receiving a switching instruction sent by the notebook computer. The switching unit 330 outputs a signal for selecting the corresponding memory card 320 according to the received switching instruction. The switching command is a Serial Peripheral Interface (SPI) command. The serial peripheral interface is a synchronous serial data protocol for microprocessors and interface devices. The serial peripheral interface is used to provide high-bandwidth network connections between the CPU and peripheral components.

连接电路340电连接于切换单元330与存储卡320之间,连接电路340用以传递检测数据至存储卡320,并通过存储卡插槽111输出至笔记本计算机,使得笔记本计算机用以检测存取前的检测数据与存取后的检测数据,借以输出判断存储卡插槽111是否正常运作的信号。笔记本计算机发送串行外设接口命令用以触发该种存储卡320中的芯片选择脚位。The connection circuit 340 is electrically connected between the switching unit 330 and the memory card 320, the connection circuit 340 is used to transmit the detection data to the memory card 320, and output to the notebook computer through the memory card slot 111, so that the notebook computer is used to detect the data before accessing. The detected data and the accessed detected data are used to output a signal for judging whether the memory card slot 111 is operating normally. The notebook computer sends the SPI command to trigger the chip select pin in the memory card 320 .

本实用新型的测试治具的运作流程,其测试方法包括下列步骤,请同时参考图4所示:整合多个存储卡于一测试治具中(参见步骤S410)。将测试治具与存储卡插槽中所具有的存储卡接口电连接(参见步骤S420)。自多个存储卡中选定一待测的存储卡,并使被选定的存储卡通过测试治具与存储卡插槽中的相应的存储卡接口建立通讯关系(参见步骤S430)。发送一检测数据至被选定的存储卡,再从被选定的存储卡读取发送的检测数据,并对发送的检测数据及读取的数据作一比较,以判断存储卡插槽中对应的存储卡接口是否发生错误(参见步骤S440)。并重复步骤S430选择其它存储卡,直至所有的存储卡接口被测试完成为止。The operation process of the test fixture of the present invention, the test method includes the following steps, please also refer to FIG. 4 : integrate multiple memory cards into one test fixture (see step S410). Electrically connect the test fixture to the memory card interface in the memory card slot (see step S420). Select a memory card to be tested from the plurality of memory cards, and make the selected memory card establish a communication relationship with the corresponding memory card interface in the memory card slot through the test fixture (see step S430). Send a test data to the selected memory card, then read the sent test data from the selected memory card, and compare the sent test data with the read data to determine the corresponding memory card slot. Whether an error occurs in the memory card interface (see step S440). And repeat step S430 to select other memory cards until all memory card interfaces are tested.

为更清楚解释本实用新型的详细的运作流程,以下利用SD、Mini SD与MMC三种存储卡作为本实用新型流程介绍,若读卡接口110中具有更多不同规格的存储卡320也可利用此一方法作为切换之用。请参考图5所示,其为本实用新型中存储卡的连接示意图。In order to explain the detailed operation process of the utility model more clearly, three kinds of memory cards SD, Mini SD and MMC are used as the process introduction of the utility model below. This method is used for switching. Please refer to FIG. 5 , which is a schematic diagram of connection of the memory card in the present invention.

假设SD卡为第一个测试存储卡并且SD的芯片选择脚位为低电位时为有效动作,而高电位时则是对选择的存储卡320发出禁能指示。当测试治具300置入读卡接口110时,测试治具300会接收到笔记本计算机所发出的切换指令,借以触发SD卡中的芯片选择脚位(降低电位使其有效),使SD卡被选择作为检测用的该种存储卡320。所以当SD卡测试完毕后,笔记本计算机再发送一次切换指令,并拉高对SD卡的芯片选择脚位的电位,使SD卡禁能。接着,测试治具300中的切换单元330检测到此一变化后,测试治具300将SD卡切换成SPI模式。于此同时,笔记本计算机与SD卡则是保持为SPI通信模式。笔记本计算机再选择次一回合欲测试的存储卡320并重复上述的切换、测试、通信及选择的步骤,直至所有的存储卡320都被测试完成为止。Assuming that the SD card is the first memory card to be tested and the SD chip selection pin is active when it is at a low potential, and it is a disable instruction for the selected memory card 320 when it is at a high potential. When the test fixture 300 is inserted into the card reader interface 110, the test fixture 300 will receive the switch command sent by the notebook computer, so as to trigger the chip selection pin in the SD card (lower the potential to make it effective), so that the SD card will be activated. This type of memory card 320 for testing is selected. Therefore, after the SD card test is completed, the notebook computer sends a switching command again, and pulls up the potential of the chip selection pin of the SD card to disable the SD card. Then, after the switch unit 330 in the test fixture 300 detects this change, the test fixture 300 switches the SD card to the SPI mode. At the same time, the notebook computer and the SD card remain in the SPI communication mode. The notebook computer selects the memory card 320 to be tested in the next round and repeats the above steps of switching, testing, communication and selection until all the memory cards 320 are tested.

本实用新型提供一种读卡接口110的测试治具300,用以连接具有多规格存储卡接口的读卡接口插槽,可以降低对读卡接口插槽的插拔次数。并且通过笔记本计算机发送切换指令,借以选择所欲测试的存储卡接口。The utility model provides a test fixture 300 for the card reading interface 110, which is used for connecting the card reading interface slots with multi-standard memory card interfaces, and can reduce the number of times of inserting and pulling out the card reading interface slots. And send a switching command through the notebook computer, so as to select the memory card interface to be tested.

虽然本实用新型以上述的较佳实施例揭示如上,然而其并非用以限定本实用新型,任何本领域技术人员,在不脱离本实用新型的精神和范围内,当可作些许的更动与润饰,因此本实用新型的专利保护范围须视本说明书所附的权利要求所界定的范围为准。Although the present invention is disclosed above with the above-mentioned preferred embodiments, it is not intended to limit the present invention. Any person skilled in the art may make some modifications and changes without departing from the spirit and scope of the present invention. Retouching, so the patent protection scope of the utility model shall be subject to the scope defined by the appended claims of this specification.

Claims (4)

1. the measurement jig of a card reading interface, being applied to one comprises the card reading interface of multiple memory card interface and described memory card interface is integrated in the storage card slot of this card reading interface, this card reading interface is electrically connected on a notebook, it is characterized in that, comprises in this measurement jig:
Multiple storage card;
One switches the unit, is electrically connected on this notebook, and this switch unit input is from the switching instruction that this notebook sent, and output is in order to select the signal of corresponding described storage card;
A junction is electrically connected between this storage card slot and this switch unit; And
One connecting circuit, be electrically connected between this switch unit and the described storage card, this connecting circuit is to described storage card output test data, and described detection data export this notebook to by described storage card slot, and the output of this notebook is in order to judge the whether signal of normal operation of this storage card slot.
2. the measurement jig of card reading interface as claimed in claim 1 is characterized in that, this storage card slot comprises a CF interface, a SD interface, a MS interface, a SM interface, an XD interface, MSP interface or a MMC interface at least.
3. the measurement jig of card reading interface as claimed in claim 1 is characterized in that, this storage card is a Compact Flash, a SD storage card, a MS storage card, a SM storage card, an XD storage card, MSP storage card or a MMC storage card.
4. the measurement jig of card reading interface as claimed in claim 1, it is characterized in that this notebook sends in order to a chip that triggers in a kind of storage card to this switch unit selects the pin position to make its selected conduct detection use the Serial Peripheral Interface (SPI) order of storage card as switching command.
CNU2007201462605U 2007-08-01 2007-08-01 Test fixture for card reading interface Expired - Lifetime CN201066375Y (en)

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CNU2007201462605U CN201066375Y (en) 2007-08-01 2007-08-01 Test fixture for card reading interface

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105510755A (en) * 2016-01-25 2016-04-20 联宝(合肥)电子科技有限公司 Testing device
CN106326168A (en) * 2015-07-02 2017-01-11 纬创资通股份有限公司 Connecting circuit and computer system with same

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106326168A (en) * 2015-07-02 2017-01-11 纬创资通股份有限公司 Connecting circuit and computer system with same
CN106326168B (en) * 2015-07-02 2019-06-07 纬创资通股份有限公司 Connecting circuit and computer system with same
CN105510755A (en) * 2016-01-25 2016-04-20 联宝(合肥)电子科技有限公司 Testing device

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