CN201035106Y - test module - Google Patents

Abstract

The utility model provides a test module, which can be used to test an electronic device with a fixed cover. The test module includes a first adapter board, which can be accommodated in the fixed cover, one plane of the first adapter board includes a plurality of first contact parts, and another plane includes a plurality of second contact parts, and the first adapter board includes a plurality of first wires, each of the plurality of second contact parts is electrically connected to each of the plurality of first contact parts through each of the plurality of first wires, wherein the distance between the plurality of second contact parts is smaller than the distance between the plurality of first contact parts.

Description

test module

technical field

The utility model relates to a test module, in particular to a test module for testing electronic devices.

Background technique

In the prior art, the central processing unit (CPU) is inserted and fixed in the electrical contacts of the processor socket of the computer by its protruding pins. When it is desired to test the solder joint problems (such as empty soldering, short circuit) of the electrical contacts of the processor socket, the adapter board for testing is first placed in the processor socket, and the two planes of the adapter board are equipped with Contact part, one of the planes contacts the electrical contacts of the processor socket, and the upper part of the other plane is connected to a test fixture with the same width as the processor socket, so that multiple probes of the test fixture can directly contact the adapter The contact part on the board is used for the connection of the circuit, and then the subsequent ICT/ATE test can be carried out. Because of this type of processor socket, the pins of the processor are fixed to the electrical contacts of the processor socket by force in the horizontal direction. However, due to the structure of the processor socket in this form, noise is likely to be generated during operation, causing inconvenience in use.

In order to improve the disadvantages caused by the above-mentioned processor socket structure, another form of processor accommodating slot structure is produced. Please refer to FIG. 1 , which is a schematic diagram of a processor accommodating slot of an electronic device in the prior art. The processor accommodating slot 50 includes a fixed cover 90 and an electrical contact 80 , wherein the electrical contact 80 is protruding, and the contact point of the processor is also protruding. A vertical fastening force is applied to the processor through the fixing cover 90 so as to fix the processor to the processor accommodating slot 50 . However, due to the limited area around the fixed cover 90 where some probes can be implanted, the electrical contacts 80 on the periphery of the processor accommodating slot 50 cannot be tested by conventional test fixtures.

In order to solve the above problems, the solution in the prior art is to build a test circuit in a test piece similar in appearance to a processor, and directly perform the test in a digital operation mode. Although the problem of blocking the test due to the fixed cover 90 is eliminated, the cost High, and the coverage rate of the electrical contacts of the processor accommodating slot 50 is only about 90%, which cannot effectively test all the contacts on the processor accommodating slot 50 comprehensively.

Therefore, it is necessary to provide a test module for testing an electronic device with a fixed cover, which solves the problem that the fixed cover blocks the electrical contacts of the test part, so as to improve the existing problems in the prior art.

Utility model content

The purpose of this utility model is to provide a test module for testing an electronic device with a fixed cover, so as to solve the above problems.

To achieve the above purpose, the test module includes a first adapter board, a conductive sheet and a second adapter board. Wherein, the first adapter plate can be accommodated in the fixed cover, one plane of the first adapter plate includes a plurality of first contact portions, the other plane includes a plurality of second contact portions, and the first adapter plate includes A plurality of first wires, each of the plurality of second contact portions is electrically connected to each of the plurality of first contact portions through each of the plurality of first wires, wherein the pitch of the plurality of second contact portions is smaller than the pitch of the plurality of first contact portions. The conductive sheet includes a plurality of conductive parts, and at least a part of the plurality of conductive parts can be electrically connected to the plurality of second contact parts. The second adapter plate is placed on the conductive sheet, one of the planes of the second adapter plate includes a plurality of third contact portions, and the other plane includes a plurality of fourth contact portions, and the second adapter plate includes a plurality of first contact portions. Two wires, each of the plurality of fourth contact portions is electrically connected to each of the plurality of third contact portions through each of the plurality of second wires, wherein the distance between the plurality of fourth contact portions is greater than the distance between the plurality of third contact portions.

According to one embodiment of the present invention, the distance between the plurality of first contact portions is substantially equal to the distance between the plurality of fourth contact portions.

The utility model has the advantage that the test module mainly utilizes two transfers in succession, first the first transfer board is used to reduce the distance between the contact parts, and then the second transfer board is used to enlarge the contact part distance to avoid The blocking problem caused by the convex part of the fixed cover is fixed, and the coverage rate of the electrical contacts that can be tested can reach 100%, so as to effectively test all the contacts comprehensively, and the cost is not high.

Description of drawings

1 is a schematic diagram of a processor accommodating slot of an electronic device in the prior art;

Fig. 2 is a schematic diagram of an embodiment of the test module of the present invention.

Component representative symbol description:

Test module 1 first adapter board 10

First contact part 11 Second contact part 12

First wire 13 Second adapter board 20

Third contact part 21 Fourth contact part 22

Second wire 23 conductive sheet 30

Conductive part 31 Filler 32

Processor accommodation slot 50 Connecting wire 60

Motherboard 70 Electrical contacts 80

Fixed cover 90 Convex part 91

Electronic device 99 Length L1, L2

Detailed ways

In order to make the above and other purposes, features and advantages of the present invention more comprehensible, specific embodiments of the present invention are specifically listed below, together with the attached drawings, for a detailed description as follows.

Please refer to Figure 2. Fig. 2 is a schematic diagram of an embodiment of the test module of the present invention. The test module 1 of the present utility model can be used to test an electronic device (such as a CPU module) having a fixed cover 90 and a plurality of electrical contacts 80, wherein the fixed cover 90 includes a convex portion 91, and the test module 1 is mainly used for testing the electronic device The state of each electrical contact. The test module 1 of the present invention includes a first adapter plate 10 , a conductive sheet 30 and a second adapter plate 20 . In this embodiment, the test module 1 is used to test the state of the electrical contacts of the central processing unit (CPU) module, so as to know whether each electrical contact has problems such as empty welding and short circuit.

Wherein, the first adapter board 10 is flat and can be accommodated in the fixed cover 90. When testing, the first adapter board 10 is placed in the processor accommodating groove 50, that is, placed in the central processing unit. The location where it should be accommodated. One of the planes of the first riser board 10 includes a plurality of first contact portions 11, the number and spacing of the first contact portions 11 are the same as the number of electrical contacts 80 of the processor socket 50, therefore, the plurality of first contact portions 11 can be in contact with a plurality of electrical contacts 80, so that the two are electrically connected.

Another plane of the first adapter plate 10 includes a plurality of second contact portions 12, and the first adapter plate 10 includes a plurality of first wires 13, and each second contact portion 12 communicates with each first wire 13 through each first wire 13. The contacts 11 are electrically connected. The number of the second contact portions 12 is the same as the number of the plurality of first contact portions 11 , the difference lies in the pitch of the contact portions. Since the convex portion 91 of the fixing cover 90 blocks the space around the processor accommodating slot 50 , the first contact portion 11 around the first adapter board 10 cannot be passed vertically upward.

In order to make the energy of all the first contact portions 11 pass through the first wire 13 to the outside of the fixed cover 90 smoothly, the distance between the multiple first contact portions 11 must be reduced, that is, the distance between the multiple second contact portions 12 is smaller than the distance between the multiple second contact portions 12. The pitch of the first contact portion 11. At this time, the plurality of first contact portions 11 are shrunk inward by the first wire 13, so that all the first contact portions 11 originally distributed over the length L1 are reduced in pitch, the purpose of which is to distribute all the second contact portions 12 in a relatively small area. within a small length L2. Consider the proportion of the area covered by the convex part 91 of the fixed cover 90, and at the same time, according to the distance between the electrical contacts 80 of the processor accommodating slot 50 of a certain form is 1.27mm, and then consider the form of the processor accommodating slot 50 of different specifications Therefore, specifically, the reasonable range of the distance between the plurality of second contact portions 12 is between 0.6 mm and 1 mm.

The conductive sheet 30 is placed on the first riser board 10 . The purpose of disposing the conductive sheet 30 is to fill the thickness of the protrusion 91 of the fixed cover 90 , so its thickness must be at least the thickness of the protrusion 91 . The conductive sheet 30 includes a plurality of conductive parts 31 , which can transmit the plurality of second contact parts 12 respectively. The number of conductive parts 31 must be at least equal to the number of second contact parts 12. Therefore, each second contact part 12 can contact at least one conductive part 31. The two contact portions 12 are electrically connected, further in order to improve electrical contact, the distance between the second contact portions 12 can be reduced to between 0.2mm and 0.6mm, so as to ensure that each second contact portion 12 can electrically connect at least two Conductive part 31 .

In this embodiment, the conductive sheet 30 has elastic conductive glue, which is composed of a conductive portion 31 and a non-conductive filler 32 . Through the elasticity of the conductive sheet 30 , the closeness between the conductive sheet 30 and the first adapter plate 10 and the second adapter plate 20 which are in contact with the conductive sheet 30 can be increased, so that the contacts can be effectively contacted. Wherein, the pitch of the conductive portion 31 can be selected in different specifications according to actual requirements, and the material of the conductive portion 31 is not limited to the above.

It should only be noted that, in addition to the flat plate shape described in this embodiment, the first adapter plate 10 can also be designed as a convex shape (such as the first adapter plate in this embodiment). connection board 10 plus the volume of the conductive sheet 30), the conductive sheet 30 can be unnecessary at this moment.

Because the spacing of the probes of the existing test fixtures (which can also be in the form of winding or contact contacts) is designed to match the contacts of the processor accommodating groove 50, in order to directly utilize the existing test fixtures, it is necessary to The pitch of the second contact portion 12 that has been reduced is enlarged to the pitch of the original first contact portion 11 , so that the second riser board 20 is additionally placed on the conductive sheet 30 . The second adapter plate 20 is in the shape of a flat plate and is located outside the fixing cover 90 . One of the planes of the second adapter board 20 includes a plurality of third contact portions 21, the number of the third contact portions 21 is the same as the number of electrical contacts 80 of the processor socket, in this embodiment, the plurality of second The pitch of the contact portions 12 is substantially equal to the pitch of the plurality of third contact portions 21 , and the plurality of third contact portions 21 can be electrically connected to the plurality of conductive portions 31 .

Another plane of the second adapter board 20 includes a plurality of fourth contact portions 22, the second adapter board 20 includes a plurality of second wires 23, and each of the plurality of fourth contact portions 22 passes through each of the plurality of second wires 23 It is electrically connected to each of the plurality of third contact portions 21 . The number of the plurality of fourth contact portions 22 is the same as the number of the plurality of third contact portions 21 , the difference lies in the pitch of the contact portions. In order to restore the spacing of all the third contact portions 21 to be the same as the spacing of the electrical contacts 80 of the processor accommodating slot 50, the spacing of the plurality of fourth contact portions 22 must be increased, that is, the spacing of the plurality of fourth contact portions 22 must be increased. The distance between the contact portions 22 is greater than the distance between the plurality of third contact portions 21 . In this embodiment, the distance between the plurality of first contact portions 11 is substantially equal to the distance between the plurality of fourth contact portions 22, so that all the contacts avoid the blocked area, and the second adapter plate 20 is used for transfer. After that, you can continue to use the existing test fixtures for follow-up operations. Due to the testing method of the testing module 1 of the present invention, the coverage rate of the electrical contact 80 that can be tested can reach 100%.

However, it should be noted that if the pitch of the probes of the test fixture connected to the test module 1 can match the pitch of the second contact portion 12, the second adapter plate 20 may not be needed to connect the third contact portion 21 to the pitch of the second contact portion 12. The spacing is enlarged, and the first adapter board 10 is directly connected to the test fixture for subsequent operations. At this time, due to the smaller pitch, the test fixture needs to use smaller probes.

To sum up the above, the test module 1 of the present utility model mainly utilizes two transfers successively, first the spacing of the contact parts is reduced by the first transfer board 10, and then the spacing of the contact parts is enlarged by the second transfer board 20, so as to The problem of blocking caused by the convex portion 91 of the fixed cover 90 is avoided.

In summary, the utility model shows its characteristics that are very different from the prior art in terms of purpose, means and efficacy. However, it should be noted that the above-mentioned embodiments are only illustrative to illustrate the principles and effects of the present invention, and are not intended to limit the scope of the present invention. Any person familiar with the technology can modify and change the embodiments without violating the technical principle and spirit of the present utility model. The scope of protection of the rights of the utility model should be described in the appended claims.

Claims (9)

1. test module, can be used for testing a electronic installation with a fixed cap, it is characterized in that, this test module comprises: one first card extender, it can be placed in this fixed cap, a wherein plane of this first card extender comprises a plurality of first contact sites, another plane comprises a plurality of second contact sites, comprise a plurality of first leads in this first card extender, each this a plurality of second contact sites are electrically connected by each this these a plurality of first contact sites of a plurality of first leads and each, wherein between these a plurality of second contact sites distance less than the spacing of these a plurality of first contact sites.

2. test module as claimed in claim 1 is characterized in that, this test module more comprises: a conducting strip, comprise a plurality of conductive parts in this conducting strip, and these a plurality of conductive parts of at least a portion can be electrically connected with these a plurality of second contact sites; One second card extender, place on this conducting strip, a wherein plane of this second card extender comprises a plurality of the 3rd contact sites, another plane comprises a plurality of the 4th contact sites, comprise a plurality of second leads in this second card extender, each this a plurality of the 4th contact sites are electrically connected by each this these a plurality of the 3rd contact sites of a plurality of second leads and each, and wherein the spacing of these a plurality of the 4th contact sites is greater than the spacing of these a plurality of the 3rd contact sites.

3. test module as claimed in claim 2 is characterized in that the spacing of these a plurality of first contact sites equals the spacing of these a plurality of the 4th contact sites.

4. test module as claimed in claim 2 is characterized in that the spacing of these a plurality of second contact sites equals the spacing of these a plurality of the 3rd contact sites.

5. test module as claimed in claim 4 is characterized in that the spacing of these a plurality of second contact sites is between between the 0.2mm to 0.6mm.

6. test module as claimed in claim 2 is characterized in that, this second card extender is positioned at this fixed cap outside.

7. test module as claimed in claim 2 is characterized in that this conducting strip has elasticity.

8. test module as claimed in claim 1 is characterized in that the spacing of these a plurality of second contact sites is between between the 0.6mm to 1mm.

9. test module as claimed in claim 1 is characterized in that, this electronic installation is a CPU module.

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