CN209583627U - microfluidic actuator - Google Patents
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- CN209583627U CN209583627U CN201920060983.6U CN201920060983U CN209583627U CN 209583627 U CN209583627 U CN 209583627U CN 201920060983 U CN201920060983 U CN 201920060983U CN 209583627 U CN209583627 U CN 209583627U
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Abstract
Description
技术领域technical field
本案关于一种致动器,尤指一种使用微机电面型及体型加工制程制作的微流体致动器。This case relates to an actuator, especially a microfluidic actuator manufactured using micro-electromechanical surface and body processing.
背景技术Background technique
目前于各领域中无论是医药、电脑科技、打印、能源等工业,产品均朝精致化及微小化方向发展,其中微帮浦、喷雾器、喷墨头、工业打印装置等产品所包含的流体致动器为其关键技术。At present, in various fields, whether it is medicine, computer technology, printing, energy and other industries, products are developing towards refinement and miniaturization. Among them, the fluid contained in products such as micro pumps, sprayers, inkjet heads, and industrial printing devices The actuator is its key technology.
随着科技的日新月异,流体输送结构的应用上亦愈来愈多元化,举凡工业应用、生医应用、医疗保健、电子散热……等,甚至近来热门的穿戴式装置皆可见它的踨影,可见传统的流体致动器已渐渐有朝向装置微小化、流量极大化的趋势。With the rapid development of science and technology, the application of fluid conveying structure is becoming more and more diversified, such as industrial application, biomedical application, medical care, electronic heat dissipation, etc., and even the recent popular wearable devices can be seen. It can be seen that traditional fluid actuators are gradually trending toward device miniaturization and flow maximization.
现有技术中已发展多种微机电制程制出的微流体致动器,然而,借创新结构增进流体传输的功效,仍为发展的重要内容。In the prior art, various micro-fluidic actuators produced by micro-electromechanical processes have been developed. However, improving the efficiency of fluid transmission through innovative structures is still an important content of development.
实用新型内容Utility model content
本案的主要目的是提供一种有阀式微流体致动器,使用微机电制程制作,可传输流体。本案的微流体致动器使用微机电面型及体型加工制程,并辅以封装技术制作而成。The main purpose of this case is to provide a valved microfluidic actuator, which is manufactured using microelectromechanical processes and can transmit fluids. The microfluidic actuator in this case is manufactured using micro-electromechanical surface and body processing, supplemented by packaging technology.
本案的一广义实施态样为一种微流体致动器,包含:一基板、一腔体层、一振动层、一第一金属层、一压电致动层、一隔离层、一第二金属层、一防水层、一光阻层、一入口层、一流道层、一共振层以及一阵列孔片。基板具有一第一表面及一第二表面,并透过蚀刻制程形成一出口沟槽、多个第一出流孔洞以及多个第二出流孔洞。出口沟槽与多个第一出流孔洞以及多个第二出流孔洞相连通。多个第二出流孔洞设置在多个第一出流孔洞的外侧。腔体层透过沉积制程形成于基板的第一表面上,且透过蚀刻制程形成一储流腔室。储流腔室与多个第一出流孔洞以及多个第二出流孔洞相连通。振动层透过沉积制程形成于腔体层上,且透过蚀刻制程形成多个流体沟槽以及一振动区。多个流体沟槽对称形成于振动层的相对两侧,借以定义出振动区。第一金属层透过沉积制程形成于振动层上,且透过蚀刻制程形成一下电极区、多个阻障区以及多个间隙。下电极区形成于对应振动区的位置。多个间隙形成于下电极区与多个阻障区之间。多个阻障区对应形成于多个流体沟槽之外侧位置。压电致动层透过沉积制程形成于第一金属层上,且透过蚀刻制程于对应第一金属层的下电极区的位置形成一作动区。隔离层透过沉积制程形成于压电致动层与第一金属层上,且透过蚀刻制程于多个间隙内形成多个间隙壁。第二金属层透过沉积制程形成于压电致动层、第一金属层以及隔离层上,且透过蚀刻制程于第一金属层上形成一上电极焊垫以及一下电极焊垫。防水层透过镀膜制程形成于第一金属层、第二金属层以及隔离层上,并透过蚀刻制程露出上电极焊垫以及下电极焊垫。光阻层透过显影制程形成于第一金属层、第二金属层以及防水层上。入口层透过蚀刻制程或激光制程形成多个流体入口。流道层形成于入口层上,且透过光刻制程形成一入流腔室、多个入流通道以及多个流道入口。多个流道入口分别与入口层的多个流体入口相连通。多个入流通道以及多个流道入口围绕设置于入流腔室周围。多个入流通道连通于多个流道入口与入流腔室之间。共振层透过滚压制程形成于流道层上,透过蚀刻制程形成一腔体通孔,且透过翻转对位制程以及晶圆接合制程接合于光阻层上。阵列孔片透过粘贴制程形成于基板上。阵列孔片具有多个孔片孔洞。多个孔片孔洞与多个第一出流孔洞以及多个第二出流孔洞相互错位设置,借此封闭第一基板的多个第一出流孔洞以及多个第二出流孔洞。提供具有不同相位电荷的驱动电源至上电极焊垫以及下电极焊垫,以驱动并控制振动层的振动区产生上下位移,使流体自多个流体入口吸入,通过多个入流通道流至入流腔室,再通过腔体通孔流至共振腔室,最后通过多个流体沟槽流至储流腔室,再最后受挤压经由多个第一出流孔洞以及多个第二出流孔洞并推开阵列孔片后自多个孔片孔洞排出以完成流体传输。A broad implementation of this case is a microfluidic actuator, including: a substrate, a cavity layer, a vibration layer, a first metal layer, a piezoelectric actuation layer, an isolation layer, a second Metal layer, a waterproof layer, a photoresist layer, an entrance layer, a channel layer, a resonant layer and an array hole sheet. The substrate has a first surface and a second surface, and an outlet groove, a plurality of first outflow holes and a plurality of second outflow holes are formed through an etching process. The outlet groove communicates with a plurality of first outflow holes and a plurality of second outflow holes. The plurality of second outflow holes are arranged outside the plurality of first outflow holes. The cavity layer is formed on the first surface of the substrate through a deposition process, and a flow storage chamber is formed through an etching process. The flow storage chamber communicates with a plurality of first outflow holes and a plurality of second outflow holes. The vibration layer is formed on the chamber layer through a deposition process, and a plurality of fluid grooves and a vibration region are formed through an etching process. A plurality of fluid grooves are symmetrically formed on opposite sides of the vibrating layer to define a vibrating area. The first metal layer is formed on the vibration layer through a deposition process, and a lower electrode region, a plurality of barrier regions and a plurality of gaps are formed through an etching process. The lower electrode area is formed at a position corresponding to the vibration area. A plurality of gaps are formed between the lower electrode region and the plurality of barrier regions. A plurality of barrier regions are correspondingly formed on positions outside of the plurality of fluid grooves. The piezoelectric actuation layer is formed on the first metal layer through a deposition process, and an active region is formed at a position corresponding to the lower electrode region of the first metal layer through an etching process. The isolation layer is formed on the piezoelectric actuation layer and the first metal layer through a deposition process, and a plurality of spacers are formed in a plurality of gaps through an etching process. The second metal layer is formed on the piezoelectric actuation layer, the first metal layer and the isolation layer through a deposition process, and an upper electrode pad and a lower electrode pad are formed on the first metal layer through an etching process. The waterproof layer is formed on the first metal layer, the second metal layer and the isolation layer through the coating process, and the upper electrode pad and the lower electrode pad are exposed through the etching process. The photoresist layer is formed on the first metal layer, the second metal layer and the waterproof layer through a developing process. The inlet layer forms a plurality of fluid inlets through an etching process or a laser process. The flow channel layer is formed on the inlet layer, and an inflow chamber, a plurality of inflow channels and a plurality of flow channel inlets are formed through a photolithography process. The plurality of flow channel inlets are respectively communicated with the plurality of fluid inlets of the inlet layer. A plurality of inflow channels and a plurality of flow channel inlets are arranged around the inflow chamber. The multiple inflow channels are connected between the multiple flow channel inlets and the inflow chamber. The resonant layer is formed on the channel layer through a rolling process, a cavity through hole is formed through an etching process, and bonded on the photoresist layer through an inversion alignment process and a wafer bonding process. The array hole sheet is formed on the substrate through a bonding process. A punch array has a plurality of punch holes. The plurality of hole sheets and the plurality of first outflow holes and the plurality of second outflow holes are mutually dislocated so as to close the plurality of first outflow holes and the plurality of second outflow holes of the first substrate. Provide driving power with different phase charges to the upper electrode pad and the lower electrode pad to drive and control the vibration area of the vibration layer to move up and down, so that the fluid is sucked from multiple fluid inlets and flows into the inflow chamber through multiple inflow channels , and then flow to the resonance chamber through the through holes of the cavity, and finally flow to the storage chamber through a plurality of fluid grooves, and finally be squeezed through a plurality of first outflow holes and a plurality of second outflow holes and pushed After the hole array is opened, it is discharged from a plurality of holes of the hole sheet to complete the fluid transmission.
附图说明Description of drawings
图1A为本案微流体致动器的第一实施例的正面剖面示意图。FIG. 1A is a schematic front cross-sectional view of the first embodiment of the microfluidic actuator of the present invention.
图1B为本案第一实施例的侧面剖面示意图。FIG. 1B is a schematic side sectional view of the first embodiment of the present case.
图2A至图2AH为本案第一实施例的制造步骤分解示意图。2A to 2AH are exploded schematic views of the manufacturing steps of the first embodiment of the present invention.
图3为本案第一实施例的俯视示意图。FIG. 3 is a schematic top view of the first embodiment of the present invention.
图4为本案第一实施例的入口层的俯视示意图。FIG. 4 is a schematic top view of the entrance layer of the first embodiment of the present invention.
图5为本案第一实施例的流通孔的俯视示意图。FIG. 5 is a schematic top view of the flow holes of the first embodiment of the present invention.
图6A至图6E为本案第一实施例的作动示意图。6A to 6E are schematic diagrams of the action of the first embodiment of the present application.
图7A为本案微流体致动器的第二实施例的剖面示意图。FIG. 7A is a schematic cross-sectional view of the second embodiment of the microfluidic actuator of the present invention.
图7B为本案其他实施例的仰视示意图。Fig. 7B is a schematic bottom view of other embodiments of the present case.
图8为本案第三实施例的阵列孔片的仰视示意图。FIG. 8 is a schematic bottom view of the array hole sheet according to the third embodiment of the present application.
图9A至图9C为本案第四实施例的翻转对位制程以及晶圆接合制程示意图。FIG. 9A to FIG. 9C are schematic diagrams of the inversion alignment process and the wafer bonding process of the fourth embodiment of the present application.
附图标记说明Explanation of reference signs
100、100'、100"、100'":微流体致动器100, 100', 100", 100'": microfluidic actuators
10:致动单元10: Actuation unit
1a、1a'":第一基板1a, 1a'": first substrate
11a:第一表面11a: first surface
12a:第二表面12a: Second surface
13a:出口沟槽13a: Outlet groove
14a:辅助沟槽14a: Auxiliary groove
15a、15a'":第一出流孔洞15a, 15a'": the first outflow hole
16a、16a'":第二出流孔洞16a, 16a'": the second outflow hole
1b:腔体层1b: cavity layer
1c:振动层1c: Vibration layer
11c:流体沟槽11c: Fluid groove
12c:振动区12c: Vibration zone
1d:第一金属层1d: first metal layer
11d:下电极区11d: lower electrode area
12d:阻障区12d: Barrier zone
13d:间隙13d: Clearance
1e:压电致动层1e: piezoelectric actuation layer
11e:作动区11e: Action area
1f:隔离层1f: isolation layer
11f:间隙壁11f: spacer wall
1g:第二金属层1g: second metal layer
11g:焊垫隔离区11g: Solder pad isolation area
12g:上电极区12g: Upper electrode area
13g:上电极焊垫13g: Upper electrode pad
14g:下电极焊垫14g: Bottom electrode pad
1h:防水层1h: waterproof layer
1i:第二基板1i: Second substrate
1j:薄膜胶层1j: film adhesive layer
1k:入口层1k: entry layer
1m:共振层1m: resonance layer
11m:腔体通孔11m: cavity through hole
12m:可动部12m: movable part
13m:固定部13m: fixed part
1n:罩幕层1n: mask layer
11n:罩幕开口11n: Mask opening
12n:罩幕孔洞12n: mask hole
13n:第一罩幕通孔13n: first mask through hole
14n:第二罩幕通孔14n: second mask through hole
1o、1o'":阵列孔片1o, 1o'": hole array
11o:孔片孔洞11o: holes in the hole
12o、12o'":定位孔12o, 12o'": positioning hole
13o'":支架部13o'": bracket part
AM1:第一接合对位记号AM1: First joint alignment mark
AM2:第二接合对位记号AM2: Second joining alignment mark
AW:接合对位记号窗AW: Engage the alignment mark window
C1:入流腔室C1: Inflow chamber
C2:共振腔室C2: Resonance Chamber
C3:储流腔室C3: reservoir chamber
I:流体入口I: Fluid inlet
M1:第一光阻层M1: the first photoresist layer
M1a:第一光阻区M1a: the first photoresist area
M2:第二光阻层M2: second photoresist layer
M2a:第二光阻孔洞M2a: second photoresist hole
M2b:第二光阻开口M2b: second photoresist opening
M3:流道层M3: runner layer
M31:流道入口M31: runner inlet
M32:腔体开口M32: cavity opening
M33:入流通道M33: Inflow channel
M4:第三光阻层M4: The third photoresist layer
M41:第三光阻开口M41: Third photoresist opening
P、P'":定位柱P, P'": positioning column
具体实施方式Detailed ways
体现本案特征与优点的一些典型实施例将在后段的说明中详细叙述。应理解的是本案能够在不同的态样上具有各种的变化,其皆不脱离本案的范围,且其中的说明及图示在本质上当作说明之用,而非用以限制本案。Some typical embodiments embodying the features and advantages of the present application will be described in detail in the description in the following paragraphs. It should be understood that the present case can have various changes in different aspects without departing from the scope of the present case, and the descriptions and diagrams therein are used for illustration in nature rather than limiting the present case.
本案的微流体致动器用于输送流体,请参阅图1A以及图1B,于本案实施例中,微流体致动器100包含:一第一基板1a、一腔体层1b、一振动层1c、一第一金属层1d、一压电致动层1e、一隔离层1f、一第二金属层1g、一防水层1h、一第二基板1i、一薄膜胶层1j、一入口层1k、一共振层1m、一罩幕层1n、一阵列孔片1o、一第一光阻层M1、一第二光阻层M2、一流道层M3以及一第三光阻层M4。阵列孔片1o、第一基板1a、腔体层1b、振动层1c、第一金属层1d、压电致动层1e、隔离层1f、第二金属层1g、防水层1h、第二光阻层M2、共振层1m、流道层M3以及入口层1k是依序堆叠结合后形成为一体,其制程如下说明。于本案第一实施例中,微流体致动器100包含一致动单元10。The microfluidic actuator in this case is used to transport fluid, please refer to FIG. 1A and FIG. 1B. In the embodiment of this case, the microfluidic actuator 100 includes: a first substrate 1a, a cavity layer 1b, a vibrating layer 1c, A first metal layer 1d, a piezoelectric actuation layer 1e, an isolation layer 1f, a second metal layer 1g, a waterproof layer 1h, a second substrate 1i, a film adhesive layer 1j, an entrance layer 1k, a The resonant layer 1m, a mask layer 1n, a hole array sheet 1o, a first photoresist layer M1, a second photoresist layer M2, a channel layer M3 and a third photoresist layer M4. Array hole sheet 1o, first substrate 1a, cavity layer 1b, vibration layer 1c, first metal layer 1d, piezoelectric actuation layer 1e, isolation layer 1f, second metal layer 1g, waterproof layer 1h, second photoresist The layer M2, the resonant layer 1m, the channel layer M3 and the inlet layer 1k are sequentially stacked and combined to form a whole. The manufacturing process is described as follows. In the first embodiment of the present application, the microfluidic actuator 100 includes an actuating unit 10 .
请参阅图2A,于本案第一实施例中,第一基板1a为一硅基材。第一基板1a具有一第一表面11a以及一相对于第一表面11a的第二表面12a。于本案第一实施例中,腔体层1b透过一二氧化硅材料沉积制程形成于第一基板1a的第一表面11a之上,沉积制程可为一物理气相沉积制程(PVD)、一化学气相沉积制程(CVD)或两者的组合,但不以此为限。于本案第一实施例中,振动层1c透过一氮化硅材料沉积制程形成于腔体层1b之上。Please refer to FIG. 2A, in the first embodiment of the present case, the first substrate 1a is a silicon substrate. The first substrate 1a has a first surface 11a and a second surface 12a opposite to the first surface 11a. In the first embodiment of the present case, the cavity layer 1b is formed on the first surface 11a of the first substrate 1a through a silicon dioxide material deposition process. The deposition process can be a physical vapor deposition process (PVD), a chemical vapor phase Deposition process (CVD) or a combination of both, but not limited thereto. In the first embodiment of the present application, the vibration layer 1c is formed on the cavity layer 1b through a silicon nitride material deposition process.
请参阅图2B以及图3,于本案第一实施例中,振动层1c透过一蚀刻制程形成多个流体沟槽11c以及一振动区12c。流体沟槽11c对称形成于振动层1c的相对两侧,借以定义出振动区12c。值得注意的是,于本案第一实施例中,蚀刻制程可为一湿式蚀刻制程、一干式蚀刻制程或两者的组合,但不以此为限。值得注意的是,于本案第一实施例中,振动层1c,具有二流体沟槽11c,分别形成于振动层1c纵向的相对两侧,但不以此为限。Please refer to FIG. 2B and FIG. 3 , in the first embodiment of the present application, the vibration layer 1c forms a plurality of fluid grooves 11c and a vibration region 12c through an etching process. The fluid grooves 11c are symmetrically formed on opposite sides of the vibrating layer 1c, thereby defining a vibrating region 12c. It should be noted that, in the first embodiment of the present application, the etching process can be a wet etching process, a dry etching process or a combination of both, but not limited thereto. It should be noted that in the first embodiment of the present application, the vibrating layer 1c has two fluid grooves 11c respectively formed on opposite sides of the vibrating layer 1c in the longitudinal direction, but not limited thereto.
请参阅图2C以及图2D,于本案第一实施例中,第一金属层1d透过一第一金属材料沉积制程形成于振动层1c之上。于本案实施例中,第一金属材料为一氮化钛金属材料或一钽金属材料,但不以此为限。第一金属层1d透过蚀刻制程形成一下电极区11d、多个阻障区12d、多个间隙13d以及多个第一接合对位记号AM1。下电极区11d形成于对应振动层1c的振动区12c的位置。间隙13d形成于下电极区11d与阻障区12d之间。阻障区12d对应形成于振动层1c的流体沟槽11c的外侧位置。第一接合对位记号AM1形成于阻障区12d之上。Please refer to FIG. 2C and FIG. 2D , in the first embodiment of the present application, the first metal layer 1d is formed on the vibrating layer 1c through a first metal material deposition process. In this embodiment, the first metal material is a titanium nitride metal material or a tantalum metal material, but not limited thereto. The first metal layer 1d forms a lower electrode region 11d, a plurality of barrier regions 12d, a plurality of gaps 13d and a plurality of first alignment marks AM1 through an etching process. The lower electrode region 11d is formed at a position corresponding to the vibration region 12c of the vibration layer 1c. A gap 13d is formed between the lower electrode region 11d and the barrier region 12d. The barrier region 12d corresponds to an outer position of the fluid groove 11c formed in the vibration layer 1c. The first alignment mark AM1 is formed on the barrier region 12d.
请参阅图2E以及图2F,于本案第一实施例中,压电致动层1e透过一压电材料沉积制程形成于第一金属层1d之上,且透过蚀刻制程于对应第一金属层1d的下电极区11d的位置形成一作动区11e。Please refer to FIG. 2E and FIG. 2F. In the first embodiment of the present case, the piezoelectric actuation layer 1e is formed on the first metal layer 1d through a piezoelectric material deposition process, and is formed on the corresponding first metal layer 1d through an etching process. The position of the lower electrode region 11d of the layer 1d forms an active region 11e.
请参阅图2G以及图2H,于本案第一实施例中,隔离层1f透过一二氧化硅材料沉积制程形成于第一金属层1d以及压电致动层1e上,且透过蚀刻制程于第一金属层1d之间隙13d内形成多个间隙壁11f。Please refer to FIG. 2G and FIG. 2H. In the first embodiment of the present case, the isolation layer 1f is formed on the first metal layer 1d and the piezoelectric actuation layer 1e through a silicon dioxide material deposition process, and is formed on the first metal layer 1d and the piezoelectric actuation layer 1e through an etching process. A plurality of spacers 11f are formed in the gap 13d of the first metal layer 1d.
请参阅图2I以及图2J,于本案第一实施例中,第一光阻层M1透过一光阻涂布制程形成于第一金属层1d、压电致动层1e以及隔离层1f上,并透过一显影制程形成一第一光阻区M1a。值得注意的是,光阻涂布制程可为一旋涂(Spin Coating)制程或一层压(LaminateRolling)制程,但不以此为限,得以依照制程需求作变更。于本案第一实施例中,第一光阻层M1为一负光阻,但不以此为限。Please refer to FIG. 2I and FIG. 2J. In the first embodiment of the present case, the first photoresist layer M1 is formed on the first metal layer 1d, the piezoelectric actuation layer 1e and the isolation layer 1f through a photoresist coating process, And a first photoresist region M1a is formed through a developing process. It should be noted that the photoresist coating process can be a spin coating process or a lamination roll (Laminate Rolling) process, but not limited thereto, and can be changed according to the process requirements. In the first embodiment of the present application, the first photoresist layer M1 is a negative photoresist, but not limited thereto.
请参阅图2K、图2L以及图3,于本案第一实施例中,第二金属层1g透过一第二金属材料沉积制程形成于第一金属层1d、压电致动层1e、该隔离层1f以及第一光阻层M1的第一光阻区M1a之上。于本案第一实施例中,第二金属材料为一金金属材料或一铝金属材料,但不以此为限。第二金属层1g透过一掀离(Lift-Off)制程将第一光阻层M1移除,借以形成一焊垫隔离区11g、一上电极区12g、一上电极焊垫13g以及一下电极焊垫14g。上电极区12g形成于压电致动层1e的作动区11e之上。上电极焊垫13g以及下电极焊垫14g形成于第一金属层1d之上,并位于压电致动层1e的作动区11e的相对两侧。上电极区12g与下电极焊垫14g借由焊垫隔离区11g相分离。Please refer to FIG. 2K, FIG. 2L and FIG. 3. In the first embodiment of the present case, the second metal layer 1g is formed on the first metal layer 1d, the piezoelectric actuation layer 1e, the isolation layer 1d through a second metal material deposition process. Layer 1f and the first photoresist region M1a of the first photoresist layer M1. In the first embodiment of the present application, the second metal material is a gold metal material or an aluminum metal material, but it is not limited thereto. The second metal layer 1g removes the first photoresist layer M1 through a lift-off process to form a pad isolation region 11g, an upper electrode region 12g, an upper electrode pad 13g and a lower electrode Solder pads 14g. The upper electrode region 12g is formed on the active region 11e of the piezoelectric actuation layer 1e. The upper electrode pad 13g and the lower electrode pad 14g are formed on the first metal layer 1d and located on opposite sides of the active region 11e of the piezoelectric actuation layer 1e. The upper electrode region 12g is separated from the lower electrode pad 14g by the pad isolation region 11g.
请参阅图2M,于本案第一实施例中,防水层1h透过一镀膜制程形成于第一金属层1d、第二金属层1g以及隔离层1f上,并透过蚀刻制程露出第二金属层1g的上电极焊垫13g以及下电极焊垫14g。值得注意的是,于本案第一实施例中,防水层1h为一聚对二甲苯(Parylene)材质,但不以此为限。聚对二甲苯可于室温下镀膜,并且具有包覆性强、耐化性高以及生物相容性佳等优点。值得注意的是,防水层1h的设置,可避免第一金属层1d、压电致动层1e以及第二金属层1g遭流体腐蚀而产生短路现象。Please refer to FIG. 2M. In the first embodiment of the present case, the waterproof layer 1h is formed on the first metal layer 1d, the second metal layer 1g and the isolation layer 1f through a coating process, and the second metal layer is exposed through an etching process. 1g of upper electrode pads 13g and lower electrode pads 14g. It should be noted that, in the first embodiment of the present application, the waterproof layer 1h is made of parylene (Parylene), but it is not limited thereto. Parylene can be coated at room temperature, and has the advantages of strong coating, high chemical resistance and good biocompatibility. It is worth noting that the provision of the waterproof layer 1h can prevent the first metal layer 1d, the piezoelectric actuation layer 1e and the second metal layer 1g from being corroded by the fluid and causing a short circuit.
请参阅图2N以及图2O,于本案第一实施例中,第二光阻层M2透过光阻涂布制程形成于第一金属层1d、第二金属层1g以及防水层1h上,并透过显影制程形成多个第二光阻孔洞M2a以及一第二光阻开口M2b。Please refer to FIG. 2N and FIG. 2O. In the first embodiment of this case, the second photoresist layer M2 is formed on the first metal layer 1d, the second metal layer 1g and the waterproof layer 1h through a photoresist coating process, and is transparent A plurality of second photoresist holes M2a and a second photoresist opening M2b are formed through the developing process.
请参阅图2P、图2Q以及图4,于本案第一实施例中,第二基板1i为一玻璃基板。薄膜胶层1j透过一滚压制程形成于第二基板1i上。入口层1k透过滚压制程形成于薄膜胶层1j。于本案第一实施例中,入口层1k为一聚酰亚胺(Polyimide,PI)材质,但不以此为限。薄膜胶层1j以及入口层1k透过蚀刻制程形成多个流体入口I以及多个接合对位记号窗AW。接合对位记号窗AW形成于流体入口I之外侧。值得注意的是,成形流体入口I以及接合对位记号窗AW的蚀刻制程为一干蚀刻制程或一激光蚀刻制程,但不以此为限。于本案第一实施例中,微流体致动器100具有四个流体入口I,分别位于微流体致动器100的四个角落,于其他实施例中,流体入口I的数量以及分布方式得依设计需求而变化。Please refer to FIG. 2P , FIG. 2Q and FIG. 4 , in the first embodiment of the present case, the second substrate 1 i is a glass substrate. The film adhesive layer 1j is formed on the second substrate 1i through a rolling process. The entrance layer 1k is formed on the film adhesive layer 1j through a rolling process. In the first embodiment of the present application, the inlet layer 1k is made of a polyimide (PI) material, but it is not limited thereto. The thin film adhesive layer 1j and the inlet layer 1k form a plurality of fluid inlets I and a plurality of alignment mark windows AW through an etching process. The alignment mark window AW is formed outside the fluid inlet I. It should be noted that the etching process for forming the fluid inlet I and bonding the alignment mark window AW is a dry etching process or a laser etching process, but not limited thereto. In the first embodiment of the present case, the microfluidic actuator 100 has four fluid inlets I, which are respectively located at the four corners of the microfluidic actuator 100. In other embodiments, the number and distribution of the fluidic inlets I may depend on Varies according to design requirements.
请参阅图2R、图2S以及图4,于本案第一实施例中,流道层M3透过光阻涂布制程形成于入口层1k上,且透过显影制程形成多个流道入口M31、一腔体开口M32以及多个入流通道M33。流道入口M31分别与入口层1k的流体入口I相连通。流道入口M31以及入流通道M33围绕设置在腔体开口M32周围。入流通道M33连通于流道入口M31与腔体开口M32之间。于本案第一实施例中,流道层M3具有四个流道入口M31以及四个入流通道M33,于其他实施例中,流道入口M31以及入流通道M33的数量可以设计需求而变更,不以此为限。于本案第一实施例中,流道层M3为一厚膜光阻,但不以此为限。Please refer to FIG. 2R, FIG. 2S and FIG. 4. In the first embodiment of the present case, the flow channel layer M3 is formed on the inlet layer 1k through a photoresist coating process, and a plurality of flow channel inlets M31, M31 are formed through a developing process. A cavity opening M32 and a plurality of inflow channels M33. The flow channel inlets M31 communicate with the fluid inlets I of the inlet layer 1k respectively. The flow channel inlet M31 and the inflow channel M33 are arranged around the opening M32 of the cavity. The inflow channel M33 communicates between the flow channel inlet M31 and the cavity opening M32. In the first embodiment of this case, the flow channel layer M3 has four flow channel inlets M31 and four inflow channels M33. In other embodiments, the number of flow channel inlets M31 and inflow channels M33 can be changed according to the design requirements, not in accordance with This is the limit. In the first embodiment of the present application, the channel layer M3 is a thick film photoresist, but it is not limited thereto.
请参阅图2T以及图2U,于本案第一实施例中,共振层1m透过滚压制程形成于流道层M3上,且透过蚀刻制程形成一腔体通孔11m以及多个第二接合对位记号AM2。共振层1m覆盖流道层M3的腔体开口M32,借以定义出一入流腔室C1。腔体通孔11m与流道层M3的入流腔室C1相连通。第二接合对位记号AM2形成于共振层1m之外侧。共振层1m自腔体通孔11m向外延伸至对应入流腔室C1外缘处定义为一可动部12m。共振层1m自可动部12m向外延伸至第二接合对位记号AM2处定义为一固定部13m。值得注意的是,成形共振层1m的蚀刻制程为干蚀刻制程或激光蚀刻制程,但不以此为限。Please refer to FIG. 2T and FIG. 2U. In the first embodiment of the present case, the resonant layer 1m is formed on the channel layer M3 through a rolling process, and a cavity through hole 11m and a plurality of second joints are formed through an etching process. Alignment mark AM2. The resonance layer 1m covers the cavity opening M32 of the channel layer M3, thereby defining an inflow cavity C1. The cavity through hole 11m communicates with the inflow chamber C1 of the channel layer M3. The second alignment mark AM2 is formed outside the resonant layer 1m. The resonant layer 1m extends outward from the cavity through hole 11m to a position corresponding to the outer edge of the inflow chamber C1 to define a movable portion 12m. The resonant layer 1m extends outward from the movable portion 12m to the second alignment mark AM2 to define a fixed portion 13m. It should be noted that the etching process for forming the resonant layer 1m is a dry etching process or a laser etching process, but not limited thereto.
请参阅图2V,于本案第一实施例中,共振层1m透过一翻转对位制程以及一晶圆接合制程接合于第二光阻层M2上。于翻转对位制程时,利用接合对位记号窗AW与相对应的第一接合对位记号AM1以及相对应的第二接合对位记号AM2相对准,以完成对位制程。值得注意的是,于本案第一实施例中,由于流道层M3以及第二基板1i呈透光性,于翻转对位制程时,可借由正面透视对位(Top-Side Transparent Alignment)方法进行人工对位,因此对位精度需求为±10μm。于本案第一实施例中,共振层1m为一聚酰亚胺(Polyimide,PI)材质,但不以此为限。Please refer to FIG. 2V. In the first embodiment of the present application, the resonant layer 1m is bonded on the second photoresist layer M2 through an inversion alignment process and a wafer bonding process. When the alignment process is reversed, the alignment mark window AW is used to align with the corresponding first alignment mark AM1 and the second alignment mark AM2 to complete the alignment process. It is worth noting that, in the first embodiment of the present case, since the channel layer M3 and the second substrate 1i are light-transmitting, during the reverse alignment process, the top-side transparent alignment (Top-Side Transparent Alignment) method can be used. Manual alignment is performed, so the alignment accuracy requirement is ±10μm. In the first embodiment of the present application, the resonant layer 1 m is made of a polyimide (PI) material, but it is not limited thereto.
请参阅图2W,于本案第一实施例中,第二基板1i借由将薄膜胶层1j浸泡药剂使薄膜胶层1j失去粘性而移除。值得注意的是,于本案第一实施例中,浸泡薄膜胶层1j所需的时间极短,并且薄膜胶层1j与流道层M3的材质特性不同,因此药剂不会对流道层M3起反应,也不会产生泡胀(Swelling)的问题。Please refer to FIG. 2W. In the first embodiment of the present application, the second substrate 1i is removed by soaking the film adhesive layer 1j in a chemical to make the film adhesive layer 1j lose its viscosity. It is worth noting that in the first embodiment of this case, the time required to soak the film adhesive layer 1j is extremely short, and the material properties of the film adhesive layer 1j and the flow channel layer M3 are different, so the medicine will not react to the flow channel layer M3 , There will be no problem of swelling (Swelling).
请参阅图2X至图2Z,于本案第一实施例中,罩幕层1n透过一二氧化硅材料沉积制程形成于第一基板1a的第二表面12a上,且透过蚀刻制程形成一罩幕开口11n以及多个罩幕孔洞12n,使得第一基板1a露出。第一基板1a的第二表面12a分别沿着罩幕开口11n以及罩幕孔洞12n,透过蚀刻制程形成一出口沟槽13a以及多个辅助沟槽14a。出口沟槽13a以及辅助沟槽14a具有相同的蚀刻深度,且蚀刻深度为蚀刻至第一表面11a以及第二表面12a之间且不与腔体层1b接触。辅助沟槽14a对称设置在出口沟槽13a的相对两侧。每一辅助沟槽14a与出口沟槽13a之间形成一定位柱P。Please refer to FIG. 2X to FIG. 2Z. In the first embodiment of the present case, the mask layer 1n is formed on the second surface 12a of the first substrate 1a through a silicon dioxide material deposition process, and a mask layer 1n is formed through an etching process. The curtain opening 11n and the plurality of mask holes 12n expose the first substrate 1a. An exit trench 13a and a plurality of auxiliary trenches 14a are formed through an etching process on the second surface 12a of the first substrate 1a along the mask opening 11n and the mask hole 12n respectively. The exit groove 13 a and the auxiliary groove 14 a have the same etching depth, and the etching depth is etched between the first surface 11 a and the second surface 12 a without contacting the cavity layer 1 b. The auxiliary grooves 14a are symmetrically disposed on opposite sides of the outlet groove 13a. A positioning post P is formed between each auxiliary groove 14a and the outlet groove 13a.
请参阅图2AA及图2AB,于本案第一实施例中,罩幕层1n再透过一二氧化硅材料沉积制程形成于第一基板1a的出口沟槽13a以及辅助沟槽14a内,且透过一精密穿孔制程于出口沟槽13a内形成多个第一罩幕通孔13n以及多个第二罩幕通孔14n。第二罩幕通孔14n对称设置于第一罩幕通孔13n的外侧。于本案第一实施例中,第一罩幕通孔13n的孔径小于第二罩幕通孔14n的孔径,但不以此为限。第一罩幕通孔13n以及第二罩幕通孔14n的穿孔深度为至与第一基板1a接触为止,使得第一基板1a得以露出。于本案第一实施例中,精密穿孔制程为一准分子激光加工制程,但不以此为限。Please refer to FIG. 2AA and FIG. 2AB. In the first embodiment of the present case, the mask layer 1n is formed in the outlet groove 13a and the auxiliary groove 14a of the first substrate 1a through a silicon dioxide material deposition process, and through A plurality of first mask through-holes 13n and a plurality of second mask through-holes 14n are formed in the exit trench 13a through a precise drilling process. The second mask through hole 14n is symmetrically disposed outside the first mask through hole 13n. In the first embodiment of the present application, the aperture diameter of the first mask through hole 13n is smaller than the aperture diameter of the second mask through hole 14n, but it is not limited thereto. The penetration depth of the first mask through hole 13n and the second mask through hole 14n is until it contacts the first substrate 1a, so that the first substrate 1a is exposed. In the first embodiment of the present case, the precise drilling process is an excimer laser processing process, but it is not limited thereto.
请参阅图2AC、图2AD以及图5,于本案第一实施例中,第一基板1a透过一低温深蚀刻制程蚀刻第一基板1a对应于第一罩幕通孔13n以及第二罩幕通孔14n的部分,借以形成第一基板1a的多个第一出流孔洞15a以及多个第二出流孔洞16a。第一出流孔洞15a为分别沿第一罩幕通孔13n蚀刻至与腔体层1b接触为止所构成,以及第二出流孔洞16a为分别沿第二罩幕通孔14n蚀刻至与腔体层1b接触为止所构成。借此,第二出流孔洞16a设置在第一出流孔洞15a的外侧,并且每一第二出流孔洞16a的孔径大于每一第一出流孔洞15a的孔径。于本案第一实施例中,低温深蚀刻制程为一深反应性离子蚀刻制程(BOSCH Process),但不以此为限。于本案第一实施例中,每一第一出流孔洞15a以及每一第二出流孔洞16a具有方形的截面,但不以此为限。Please refer to FIG. 2AC, FIG. 2AD and FIG. 5. In the first embodiment of the present case, the first substrate 1a is etched through a low-temperature deep etching process corresponding to the first mask through hole 13n and the second mask through hole. Portions of the holes 14n are used to form a plurality of first outflow holes 15a and a plurality of second outflow holes 16a of the first substrate 1a. The first outflow holes 15a are formed by etching along the first mask through holes 13n until they contact the cavity layer 1b, and the second outflow holes 16a are etched along the second mask through holes 14n to reach the cavity layer respectively. Layer 1b is formed until it contacts. Thereby, the second outflow hole 16a is disposed outside the first outflow hole 15a, and the diameter of each second outflow hole 16a is larger than the diameter of each first outflow hole 15a. In the first embodiment of the present application, the low-temperature deep etching process is a deep reactive ion etching process (BOSCH Process), but it is not limited thereto. In the first embodiment of the present application, each first outflow hole 15 a and each second outflow hole 16 a has a square cross-section, but not limited thereto.
值得注意的是,于本案第一实施例中,罩幕层1n利用准分子激光加工制程形成第一罩幕通孔13n以及第二罩幕通孔14n来克服光阻不易涂布以及接触式光罩曝光难以聚焦等问题。此外,于本案第一实施例中,深反应性离子蚀刻制程(BOSCH Process)属于低温制程,可避免加工所产生的高温,影响后端压电材料的极性分布,造成退极化反应。再者,于本案第一实施例中,深反应性离子蚀刻制程(BOSCH Process)所形成的穿孔具有高深宽比(Aspect Ratio),所以穿孔的蚀刻深度以100μm为宜,使得穿孔的孔径可以达到10μm以下,借此维持结构的强度。于本案第一实施例中,出口沟槽13a的设置使得深反应性离子蚀刻制程(BOSCH Process)所形成的穿孔得以降低。It is worth noting that in the first embodiment of the present case, the mask layer 1n utilizes an excimer laser processing process to form the first mask through hole 13n and the second mask through hole 14n to overcome the difficulty of coating the photoresist and contact light. Mask exposure is difficult to focus and other issues. In addition, in the first embodiment of this case, the deep reactive ion etching process (BOSCH Process) is a low-temperature process, which can avoid the high temperature generated by processing, which will affect the polarity distribution of the rear-end piezoelectric material and cause depolarization reactions. Furthermore, in the first embodiment of the present case, the through-hole formed by the deep reactive ion etching process (BOSCH Process) has a high aspect ratio (Aspect Ratio), so the etching depth of the through-hole is preferably 100 μm, so that the diameter of the through-hole can reach 10 μm or less, thereby maintaining the strength of the structure. In the first embodiment of the present application, the setting of the outlet trench 13a reduces the through hole formed by the deep reactive ion etching process (BOSCH Process).
请参阅图2AD,于本案第一实施例中,腔体层1b再经一湿蚀刻制程于内部蚀刻出一储流腔室C3。意即,透过蚀刻液由第一罩幕通孔13n以及第二罩幕通孔14n流入,经由第一出流孔洞15a以及第二出流孔洞16a流至腔体层1b,进而蚀刻并释放移除腔体层1b的部分,借以定义出储流腔室C3。借此,储流腔室C3与第一出流孔洞15a以及第二出流孔洞16a相连通。值得注意的是,透过湿蚀刻制程成形储流腔室C3的同时,罩幕层1n亦会被一并移除。完成储流腔室C3成形与移除罩幕层1n后,第一出流孔洞15a以及第二出流孔洞16a与出口沟槽13a相连通。Please refer to FIG. 2AD. In the first embodiment of the present application, the cavity layer 1b is etched inside a fluid storage chamber C3 through a wet etching process. That is, the permeating etchant flows in from the first mask through hole 13n and the second mask through hole 14n, flows to the cavity layer 1b through the first outflow hole 15a and the second outflow hole 16a, and then etches and releases Portions of the chamber layer 1b are removed, thereby defining the reservoir chamber C3. Accordingly, the flow storage chamber C3 communicates with the first outflow hole 15 a and the second outflow hole 16 a. It should be noted that when the reservoir chamber C3 is formed through the wet etching process, the mask layer 1n will also be removed. After the formation of the flow storage chamber C3 and the removal of the mask layer 1n are completed, the first outflow hole 15a and the second outflow hole 16a communicate with the outlet groove 13a.
值得注意的是,于本案第一实施例中,由于储流腔室C3周围两侧距离略大于出口沟槽13a的两侧距离,因此每一第二出流孔洞16a的孔径大于每一第一出流孔洞15a的孔径的设置有利于储流腔室C3的腔体侧蚀。It is worth noting that, in the first embodiment of the present case, since the distance between the two sides around the storage chamber C3 is slightly greater than the distance between the two sides of the outlet groove 13a, the diameter of each second outflow hole 16a is larger than that of each first one. The setting of the diameter of the outflow hole 15a is beneficial to the cavity side erosion of the storage chamber C3.
请参阅图2AE至图2AG,于本案第一实施例中,第三光阻层M4透过滚压制程形成于入口层1k上,且透过显影制程形成多个第三光阻开口M41。第三光阻开口M41对应上电极焊垫13g以及下电极焊垫14g的位置而设置。上电极焊垫13g以及下电极焊垫14g透过蚀刻制程移除位于上电极焊垫13g以及下电极焊垫14g上的结构,使得上电极焊垫13g以及下电极焊垫14g得以露出。于本案第一实施例中,第三光阻层M4为一硬遮罩干膜光阻,但不以此为限。值得注意的是,为了避免第一基板1a完成蚀刻后的结构支撑力不足,第三光阻层M4的覆膜也可在完成共振层1m与第二光阻层M2的晶圆接合制程后先进行,但不以此为限。Referring to FIGS. 2AE to 2AG , in the first embodiment of the present application, the third photoresist layer M4 is formed on the entrance layer 1k through a rolling process, and a plurality of third photoresist openings M41 are formed through a developing process. The third photoresist opening M41 is disposed corresponding to the positions of the upper electrode pad 13g and the lower electrode pad 14g. The upper electrode pad 13g and the lower electrode pad 14g remove the structure on the upper electrode pad 13g and the lower electrode pad 14g through an etching process, so that the upper electrode pad 13g and the lower electrode pad 14g are exposed. In the first embodiment of the present application, the third photoresist layer M4 is a hard mask dry film photoresist, but it is not limited thereto. It is worth noting that, in order to avoid insufficient structural support after the first substrate 1a is etched, the coating of the third photoresist layer M4 may also be formed after the wafer bonding process of the resonant layer 1m and the second photoresist layer M2 is completed. carried out, but not limited to.
请参阅图2AH以及图5,于本案第一实施例中,阵列孔片1o具有多个孔片孔洞11o以及多个定位孔12o,并透过一粘贴制程贴附于第一基板1a的出口沟槽13a以及辅助沟槽14内。孔片孔洞11o与第一出流孔洞15a以及第二出流孔洞16a相互错位设置,借此封闭第一出流孔洞15a以及第二出流孔洞16a,以构成一单向阀,避免在传输流体时发生流体回流的现象。第一基板1a的定位柱P分别穿过定位孔12o。于本案第一实施例中,第一基板1a的定位柱P的设置使得粘贴阵列孔片1o时可以以人工定位,并借由胶合方式固定,于其他实施例中,阵列孔片1o可以以光学自动对位方式进行定位,如此可增加阵列孔片1o的孔片孔洞11o以及与第一基板1a的第一出流孔洞15a以及第二出流孔洞16a的设置密集度。于本案第一实施例中,每一定位孔12o的孔径大于每一定位柱P的孔径50μm,但不以此为限。于本案第一实施例中,阵列孔片1o为一聚酰亚胺(Polyimide,PI)材质,但不以此为限。于本案第一实施例中,阵列孔片1o具有二定位孔12o,于其他实施例中,定位孔12o的数量可依设计需求而变更,不以此为限。Please refer to FIG. 2AH and FIG. 5. In the first embodiment of the present case, the array hole sheet 1o has a plurality of hole sheet holes 11o and a plurality of positioning holes 12o, and is attached to the outlet groove of the first substrate 1a through an adhesive process. groove 13a and auxiliary groove 14. The orifice holes 11o, the first outflow hole 15a and the second outflow hole 16a are misaligned with each other, thereby closing the first outflow hole 15a and the second outflow hole 16a to form a one-way valve, avoiding the flow of fluid during transmission. Fluid backflow occurs. The positioning pillars P of the first substrate 1a respectively pass through the positioning holes 12o. In the first embodiment of the present case, the setting of the positioning post P on the first substrate 1a enables manual positioning when pasting the array hole sheet 1o, and is fixed by gluing. In other embodiments, the array hole sheet 1o can be optically fixed. Positioning is performed in an automatic alignment manner, so that the arrangement density of the hole 11o of the array hole 1o and the first outflow hole 15a and the second outflow hole 16a of the first substrate 1a can be increased. In the first embodiment of the present application, the diameter of each positioning hole 12 o is larger than the diameter of each positioning post P by 50 μm, but it is not limited thereto. In the first embodiment of the present application, the hole array 1o is made of polyimide (PI), but it is not limited thereto. In the first embodiment of the present application, the hole array 1o has two positioning holes 12o. In other embodiments, the number of the positioning holes 12o can be changed according to design requirements, and is not limited thereto.
请参阅图3,值得注意的是,于本案第一实施例中,振动层1c的二流体沟槽11c分别形成于振动层1c纵向的相对两侧,如此,以振动层1c的横向支撑,可使得振动层1c在纵向有较佳的变形量。Please refer to FIG. 3. It is worth noting that in the first embodiment of the present case, the two fluid grooves 11c of the vibrating layer 1c are respectively formed on opposite sides of the vibrating layer 1c in the longitudinal direction. In this way, with the lateral support of the vibrating layer 1c, the This makes the vibration layer 1c have a better deformation in the longitudinal direction.
请参阅图1A、图1B、图6A至图6E,于本案第一实施例中,微流体致动器100的具体作动方式,是提供具有不同相位电荷的驱动电源至上电极焊垫13g以及下电极焊垫14g,以驱动并控制振动层1c的振动区12c产生上下位移。如图1A以及图6A所示,当施加负电压给上电极焊垫13g以及正电压给下电极焊垫14g时,压电致动层1e的作动区11e带动振动层1c的振动区12c朝向靠近第一基板1a的方向位移。借此,外部流体由流体入口I被吸入至微流体致动器100内,而进入微流体致动器100内的流体接着依序通过流道层M3的流道入口M31、入流通道M33流至入流腔室C1,再通过共振层1m的腔体通孔11m流至内共振腔室C2。如图1A以及图6B所示,停止施加电压给上电极焊垫13g以及下电极焊垫14g,使得压电致动层1e的作动区11e带动振动层1c的振动区12c回复到未被致动的位置。此时,共振层1m的可动部12m因共振而位移,朝向靠近第一基板1a的方向位移并贴附于防水层1h上,使得共振层1m的腔体通孔11m与共振腔室C2不连通。借此,共振腔室C2内的流体被挤压后通过振动层1c的流体沟槽11c汇入腔体层1b的储流腔室C3内。如图1A以及图6C所示,接着转换上电极焊垫13g以及下电极焊垫14g的电性,施加正电压给上电极焊垫13g以及负电压给下电极焊垫14g,如此振动层1c的振动区12c朝向远离第一基板1a的方向位移,以及共振层1m的可动部12m回复到未产生共振位移时的位置,使共振腔室C2内体积受振动层1c压缩,致使汇集于储流腔室C3内的流体开始注入第一出流孔洞15a以及第二出流孔洞16a。如图1A以及图6D所示,再停止施加电压给上电极焊垫13g以及下电极焊垫14g,使得压电致动层1e的作动区11e带动振动层1c的振动区12c回复到未被致动的位置。此时,共振层1m的可动部12m因共振而位移,朝向远离第一基板1a的方向位移并贴附于入口层1k上,使得共振层1m的腔体通孔11m与入流腔室C1不连通。借此,储流腔室C3内的流体被挤压后通过第一出流孔洞15a以及第二出流孔洞16a后推开阵列孔片1o。如图1A以及图6E所示,当共振层1m的可动部12m停止共振并回复到未产生共振位移时的位置,流体通过阵列孔片1o的孔片孔洞11o后排出于微流体致动器100外,以完成流体的传输。Please refer to FIG. 1A, FIG. 1B, and FIG. 6A to FIG. 6E. In the first embodiment of this case, the specific action mode of the microfluidic actuator 100 is to provide driving power with different phase charges to the upper electrode pad 13g and the lower electrode pad 13g. The electrode pad 14g is used to drive and control the vibration region 12c of the vibration layer 1c to generate up and down displacement. As shown in FIG. 1A and FIG. 6A, when a negative voltage is applied to the upper electrode pad 13g and a positive voltage is applied to the lower electrode pad 14g, the actuation area 11e of the piezoelectric actuation layer 1e drives the vibration area 12c of the vibration layer 1c toward The displacement is in the direction close to the first substrate 1a. Thus, the external fluid is sucked into the microfluidic actuator 100 from the fluid inlet I, and the fluid entering the microfluidic actuator 100 then flows through the flow channel inlet M31 and the inflow channel M33 of the flow channel layer M3 to the It flows into the chamber C1, and then flows into the inner resonance chamber C2 through the cavity through hole 11m of the resonance layer 1m. As shown in FIG. 1A and FIG. 6B , stop applying voltage to the upper electrode pad 13g and the lower electrode pad 14g, so that the actuation area 11e of the piezoelectric actuation layer 1e drives the vibration area 12c of the vibration layer 1c back to the unactuated state. moving position. At this time, the movable part 12m of the resonant layer 1m is displaced due to resonance, and is displaced toward the direction close to the first substrate 1a and attached to the waterproof layer 1h, so that the cavity through hole 11m of the resonant layer 1m is not in contact with the resonant chamber C2. connected. Thereby, the fluid in the resonance chamber C2 is squeezed and flows into the fluid storage chamber C3 of the cavity layer 1b through the fluid groove 11c of the vibrating layer 1c. As shown in Figure 1A and Figure 6C, then switch the electrical properties of the upper electrode pad 13g and the lower electrode pad 14g, apply a positive voltage to the upper electrode pad 13g and a negative voltage to the lower electrode pad 14g, so that the vibrating layer 1c The vibration region 12c is displaced in a direction away from the first substrate 1a, and the movable part 12m of the resonance layer 1m returns to the position where no resonance displacement occurs, so that the volume in the resonance chamber C2 is compressed by the vibration layer 1c, resulting in the collection of The fluid in the chamber C3 begins to inject into the first outflow hole 15a and the second outflow hole 16a. As shown in FIG. 1A and FIG. 6D , stop applying voltage to the upper electrode pad 13g and the lower electrode pad 14g, so that the actuation area 11e of the piezoelectric actuation layer 1e drives the vibration area 12c of the vibration layer 1c to return to the state that was not activated. actuation position. At this time, the movable part 12m of the resonant layer 1m is displaced due to resonance, and is displaced in a direction away from the first substrate 1a and attached to the entrance layer 1k, so that the cavity through hole 11m of the resonant layer 1m is not connected to the inflow chamber C1. connected. In this way, the fluid in the fluid storage chamber C3 is squeezed and then passes through the first outflow hole 15 a and the second outflow hole 16 a and then pushes away the orifice array 1 o . As shown in Figure 1A and Figure 6E, when the movable part 12m of the resonant layer 1m stops resonating and returns to the position where no resonance displacement occurs, the fluid passes through the hole 11o of the array hole 1o and is discharged into the microfluidic actuator 100 to complete the fluid transfer.
请参阅图7A,本案第二实施例与第一实施例大致相同,不同之处在于微流体致动器100'包含二个致动单元10,借以增加流量输出。Please refer to FIG. 7A , the second embodiment of the present case is substantially the same as the first embodiment, except that the microfluidic actuator 100 ′ includes two actuating units 10 to increase the flow output.
请参阅图7B,于本案其他实施例中,微流体致动器100"包含多个致动单元10。多个致动单元10可借串联、并联或串并联方式设置,借以增加流量输出,多个致动单元10的设置方式可依照使用需求而设计,不以此为限。Please refer to FIG. 7B. In other embodiments of the present case, the microfluidic actuator 100 "comprises a plurality of actuator units 10. The plurality of actuator units 10 can be arranged in series, in parallel or in series-parallel to increase the flow output. The arrangement of each actuating unit 10 can be designed according to the usage requirements, and is not limited thereto.
请参阅图8,本案第三实施例与第一实施例大致相同,不同之处在于微流体致动器100'"的定位柱P'"以及阵列孔片1o'"的定位孔12o'"对称设置于第一基板1a”'的相对角落,并且每一第一出流孔洞15a'"以及每一第二出流孔洞16a'"具有一圆形截面。此外,阵列孔片1o'"具有一支架部13o'",用以增加阵列孔片1o'"的伸张量,达到一弹簧的效果。于本案第三实施例中,阵列孔片1o'"可用以过滤流体中的杂质,增加微流体致动器100'"中元件的可靠性及使用寿命。Please refer to Fig. 8, the third embodiment of this case is substantially the same as the first embodiment, the difference is that the positioning column P'" of the microfluidic actuator 100'" and the positioning hole 12o'" of the array hole sheet 1o'" are symmetrical Set at opposite corners of the first substrate 1a"', and each first outflow hole 15a'" and each second outflow hole 16a'" has a circular cross-section. In addition, the array hole sheet 1o'" has a The bracket part 13o'" is used to increase the stretching of the array hole sheet 1o'" to achieve the effect of a spring. In the third embodiment of the present application, the orifice array 1o'" can be used to filter impurities in the fluid, increasing the reliability and service life of the components in the microfluidic actuator 100'".
请参阅图9A至图9C,本案第四实施例与第一实施例大致相同,不同之处在于翻转对位制程以及晶圆接合制程不同。由于第一基板1a与第二基板1i的热传导差异大,加上晶圆接合制程易有热应力及气泡(Void)等问题发生,因此,先成形第一基板1a、腔体层1b、振动层1c、第一金属层1d、压电致动层1e、隔离层1f、第二金属层1g、防水层1h、第二光阻层M2以及共振层1m成为一单颗半成品后,再另外于入口层1k上进行滚压及显影制程成形流道层M3,最后翻转入口层1k及流道层M3以覆晶(Flip Chip)方式与前述单颗半成品进行光学双面对位完成接合。此外,为了减少第一基板1a经过蚀刻制程后产生脆裂的可能,可先于接合表面进行活性处理,借此降低热压时的压力。于本案第四实施例中,入口层1k为一电铸或不锈钢材质,借以增加入口层1k的刚性,但不以此为限。Referring to FIG. 9A to FIG. 9C , the fourth embodiment of the present case is substantially the same as the first embodiment, except that the inversion alignment process and the wafer bonding process are different. Since the heat conduction difference between the first substrate 1a and the second substrate 1i is large, and the wafer bonding process is prone to problems such as thermal stress and voids, the first substrate 1a, the cavity layer 1b, and the vibration layer are formed first. 1c, the first metal layer 1d, the piezoelectric actuation layer 1e, the isolation layer 1f, the second metal layer 1g, the waterproof layer 1h, the second photoresist layer M2 and the resonant layer 1m become a single semi-finished product, and then separately Rolling and developing processes are carried out on the layer 1k to form the flow channel layer M3, and finally the inlet layer 1k and the flow channel layer M3 are flipped over to perform optical double-sided alignment with the aforementioned single semi-finished product to complete bonding. In addition, in order to reduce the possibility of embrittlement of the first substrate 1a after the etching process, the active treatment can be performed before the bonding surface, so as to reduce the pressure during hot pressing. In the fourth embodiment of the present case, the inlet layer 1k is made of electroformed or stainless steel to increase the rigidity of the inlet layer 1k, but it is not limited thereto.
本案提供一微流体致动器,主要以微机电制程来完成的微流体致动器,并且借由施加不同相位电荷的驱动电源于上电极焊垫以及下电极焊垫,使得振动层的振动区产生上下位移,进而达到流体传输。此外,借由贴覆一阵裂孔片于出流孔洞上,作为一单向阀,避免流体回流现象发生,极具产业的利用价值,依法提出申请。This case provides a microfluidic actuator, which is mainly completed by the microelectromechanical process, and by applying the driving power of different phase charges to the upper electrode pad and the lower electrode pad, the vibration area of the vibration layer Generate up and down displacement, and then achieve fluid transmission. In addition, by pasting a series of cracked holes on the outflow hole, it can be used as a one-way valve to avoid the phenomenon of fluid backflow.
本案得由熟知此技术的人士任施匠思而为诸般修饰,然皆不脱如附申请专利范围所欲保护者。This case can be modified in various ways by the people who are familiar with this technology, Ren Shijiang, but all of them do not break away from the intended protection of the scope of the attached patent application.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111434603A (en) * | 2019-01-15 | 2020-07-21 | 研能科技股份有限公司 | Microfluidic actuator |
| CN113493185A (en) * | 2020-03-19 | 2021-10-12 | 研能科技股份有限公司 | Method for manufacturing micro-fluid actuator |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111434603A (en) * | 2019-01-15 | 2020-07-21 | 研能科技股份有限公司 | Microfluidic actuator |
| CN111434603B (en) * | 2019-01-15 | 2025-05-27 | 研能科技股份有限公司 | Microfluidic Actuators |
| CN113493185A (en) * | 2020-03-19 | 2021-10-12 | 研能科技股份有限公司 | Method for manufacturing micro-fluid actuator |
| CN113493185B (en) * | 2020-03-19 | 2024-05-10 | 研能科技股份有限公司 | Method for manufacturing microfluidic actuator |
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