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CN204008869U - Contactless electrostatic potential tester - Google Patents

Contactless electrostatic potential tester Download PDF

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Publication number
CN204008869U
CN204008869U CN201420071943.9U CN201420071943U CN204008869U CN 204008869 U CN204008869 U CN 204008869U CN 201420071943 U CN201420071943 U CN 201420071943U CN 204008869 U CN204008869 U CN 204008869U
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CN
China
Prior art keywords
potential
operational amplifier
data processing
processing circuit
tester
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Expired - Fee Related
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CN201420071943.9U
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Chinese (zh)
Inventor
曹鹤飞
武占成
孙永卫
刘存礼
杨洁
原青云
张希军
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Ordnance Engineering College of PLA
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Ordnance Engineering College of PLA
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Priority to CN201420071943.9U priority Critical patent/CN204008869U/en
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Abstract

本实用新型公开了一种非接触式静电电位测试仪,涉及电变量的测量工具技术领域。包括用于感应带电体表面电位的平行板电容,用于对平行板电容采集到的电位信号进行处理生成单片机能够处理的数字信号的数据处理电路,用于计算数据处理电路处理后的电位信号的微处理器,以及用于显示微处理器处理后的电位信号数值的显示单元。所述电位测试仪通过平行板电容对被测物体的电位进行实时测量,不使用机械装置,减小了电位测试仪的体积,且平行板电容不与被测物体相接触,对被测物体的电位影响较小;此外,所述测试仪通过可控开关和单片机的配合使用,可使平板电容归零,有效解决了测试仪的零漂问题,实现了被测物体电位的实时测量。

The utility model discloses a non-contact electrostatic potential tester, which relates to the technical field of measuring tools for electric variables. It includes a parallel plate capacitor for sensing the surface potential of a charged body, a data processing circuit for processing the potential signal collected by the parallel plate capacitor to generate a digital signal that can be processed by a single-chip microcomputer, and a data processing circuit for calculating the potential signal processed by the data processing circuit A microprocessor, and a display unit for displaying the value of the potential signal processed by the microprocessor. The potential tester measures the potential of the measured object in real time through the parallel plate capacitance, without using a mechanical device, which reduces the volume of the potential tester, and the parallel plate capacitance does not contact the measured object, and the The influence of the potential is small; in addition, the tester can reset the plate capacitance to zero through the use of the controllable switch and the single-chip microcomputer, which effectively solves the zero drift problem of the tester and realizes the real-time measurement of the potential of the measured object.

Description

Contactless electrostatic potential tester
Technical field
The utility model relates to the survey instrument technical field of electric variable, relates in particular to a kind of contactless electrostatic potential tester.
Background technology
At present common contactless static electrical quantity sensor has Spiralism type, variable displacement type etc. in the world, but these sensors are all by mechanical motion, tested voltage signal to be transformed into alternating signal to measure, therefore in the time that tested voltage signal change frequency approaches or is greater than mechanical motion frequency, measure and will occur error.Simultaneously, due to the existence of mechanical movement means, sensor can not be accomplished miniaturization, and mechanical hook-up can exert an influence to testee current potential, causes measurement result to occur error.In addition, some existing direct feeling sensors, because the drift problem of test circuit electronic devices and components and system existence itself causes occurring error in to the real-time measuring process of testee, therefore often can only carry out discontinuous measurement.
Utility model content
Technical problem to be solved in the utility model is to provide a kind of contactless electrostatic potential tester, and it is little that described tester has volume, and testee current potential is affected to little feature.
For solving the problems of the technologies described above, technical solution adopted in the utility model is: a kind of contactless electrostatic potential tester, it is characterized in that: comprise the parallel plate capacitor for induction charging surface current potential, processes the data processing circuit of the digital signal that generation single-chip microcomputer can process for electric potential signal that parallel plate capacitor is collected, for the microprocessor of the electric potential signal after computational data processing circuit processes, and for showing the display unit of the electric potential signal numerical value after microprocessor processes.
Preferably, described data processing circuit comprises resistance R 1-R3, operational amplifier U1-U2, controllable switch S 1 and analog-to-digital conversion module U3, ground connection after one end of controllable switch S 1 is electrically connected with one end of capacity plate antenna C1, after being electrically connected with the other end of controllable switch S 1, the other end of capacity plate antenna C1 is electrically connected with the in-phase input end of operational amplifier U1, the inverting input of operational amplifier U1 is electrically connected with the output terminal of operational amplifier U1, the output terminal of operational amplifier U1 is successively through resistance R 1, resistance R 3 is electrically connected with the output terminal of operational amplifier U2, one termination power of resistance R 2, the other end of resistance R 2 is divided into two-way, the node of first via connecting resistance R1 and resistance R 3, the second tunnel connects the inverting input of operational amplifier U2, the in-phase input end ground connection of described operational amplifier U2, the input end of the output termination analog-to-digital conversion module U3 of described operational amplifier U2, the control end of described controllable switch S 1 is electrically connected with the output control terminal of microprocessor, the output terminal of analog-to-digital conversion module U3 is the output terminal of described data processing circuit.
Preferably, described microprocessor is single-chip microcomputer or RAM processor.
Preferably, described display unit is LED display or LCD display.
The beneficial effect that adopts technique scheme to produce is: described potential test instrument is measured the current potential of testee in real time by parallel plate capacitor, do not use mechanical hook-up, reduce the volume of potential test instrument, and parallel plate capacitor does not contact with testee, less on the current potential impact of testee; In addition, described tester is used in conjunction with by gate-controlled switch and single-chip microcomputer, can make capacity plate antenna make zero, and efficiently solves the drift problem of tester, has realized the real-time measurement of testee current potential.
Brief description of the drawings
Below in conjunction with the drawings and specific embodiments, the utility model is described in further detail.
Fig. 1 is circuit theory diagrams of the present utility model.
Embodiment
Described in background technology, the utility model provides following technical scheme to solve problems of the prior art:
As shown in Figure 1, a kind of contactless electrostatic potential tester, comprise the parallel plate capacitor for induction charging surface current potential, processes the data processing circuit of the digital signal that generation single-chip microcomputer can process for electric potential signal that parallel plate capacitor is collected, for the microprocessor of the electric potential signal after computational data processing circuit processes, and for showing the display unit of the electric potential signal numerical value after microprocessor processes.
It is more than the application's core concept, below in conjunction with the accompanying drawing in the utility model embodiment, the technical scheme in the utility model embodiment is clearly and completely described, obviously, described embodiment is only a part of embodiment of the present utility model, instead of whole embodiment.Based on the embodiment in the utility model, those of ordinary skill in the art are not making the every other embodiment obtaining under creative work prerequisite, all belong to the scope of the utility model protection.
A lot of details are set forth in the following description so that fully understand the utility model, but the utility model can also adopt other to be different from alternate manner described here and implement, those skilled in the art can do similar popularization without prejudice to the utility model intension in the situation that, and therefore the utility model is not subject to the restriction of following public specific embodiment.
Embodiment mono-
As shown in Figure 1, a kind of contactless electrostatic potential tester, comprise the parallel plate capacitor for induction charging surface current potential, processes the data processing circuit of the digital signal that generation single-chip microcomputer can process for electric potential signal that parallel plate capacitor is collected, for the microprocessor of the electric potential signal after computational data processing circuit processes, described microprocessor is single-chip microcomputer or RAM processor; And for showing the display unit of the electric potential signal numerical value after microprocessor processes, described display unit is LED display or LCD display.
Data processing circuit has a lot of forms, and in the present embodiment, described data processing circuit comprises resistance R 1-R3, operational amplifier U1-U2, controllable switch S 1 and analog-to-digital conversion module U3.Ground connection after one end of controllable switch S 1 is electrically connected with one end of capacity plate antenna C1, after being electrically connected with the other end of controllable switch S 1, the other end of capacity plate antenna C1 is electrically connected with the in-phase input end of operational amplifier U1, the inverting input of operational amplifier U1 is electrically connected with the output terminal of operational amplifier U1, the output terminal of operational amplifier U1 is successively through resistance R 1, resistance R 3 is electrically connected with the output terminal of operational amplifier U2, one termination power of resistance R 2, the other end of resistance R 2 is divided into two-way, the node of first via connecting resistance R1 and resistance R 3, the second tunnel connects the inverting input of operational amplifier U2, the in-phase input end ground connection of described operational amplifier U2, the input end of the output termination analog-to-digital conversion module U3 of described operational amplifier U2, the control end of described controllable switch S 1 is electrically connected with the output control terminal of microprocessor, the output terminal of analog-to-digital conversion module U3 is the output terminal of described data processing circuit.
Principle of work: before (1) test, gate-controlled switch is in off-state, parallel plate capacitor during near electrified body due to electric field induction, parallel plate capacitor front surface will be responded to certain voltage, owing to responding to, electric weight is less can not realize direct measurement, first through a voltage follower being formed from steady zero formula operational amplifier U1 by copped wave, it is low that the voltage signal of being exported by operational amplifier U1 has height to have, there is positive voltage also to have negative voltage, can not meet the acquisition process of data processing circuit below, then the anti-phase adder calculator through being formed by operational amplifier U2, make induced voltage signal Numerical Control between 0-3.3V, to meet signals collecting voltage request.The signal of being exported by operational amplifier U2 is converted to digital signal through A/D module by simulating signal, then obtains testee magnitude of voltage through single-chip microcomputer collection, reverse computing, and preserves measurement result, through display unit, test result is shown.
(2) single-chip microcomputer sends instruction by gate-controlled switch closure subsequently, and in this process, single-chip microcomputer stops data acquisition, and after closed a period of time of gate-controlled switch, single-chip microcomputer sends instruction disconnection gate-controlled switch.
(3) after gate-controlled switch disconnects, repeat the measuring process of (1), the test number obtaining and the numerical value of last test storage are added, and obtain the final magnitude of voltage of testee, and preserve test result, through display unit, test result are shown.
(4) repeat (2), so just realized the real-time measurement to electrified body surface potential size.
Can draw by above principle: described potential test instrument is measured the current potential of testee in real time by parallel plate capacitor, do not use mechanical hook-up, reduced the volume of potential test instrument, and parallel plate capacitor do not contact with testee, less on the current potential impact of testee; In addition, described tester is used in conjunction with by gate-controlled switch and single-chip microcomputer, can make capacity plate antenna make zero, and efficiently solves the drift problem of tester, has realized the real-time measurement of testee current potential.

Claims (3)

1.一种非接触式静电电位测试仪,其特征在于:包括用于感应带电体表面电位的平行板电容,用于对平行板电容采集到的电位信号进行处理生成单片机能够处理的数字信号的数据处理电路,用于计算数据处理电路处理后的电位信号的微处理器,以及用于显示微处理器处理后的电位信号数值的显示单元;所述数据处理电路包括电阻R1-R3、运算放大器U1-U2、可控开关S1和模数转换模块U3,可控开关S1的一端与平板电容C1的一端电连接后接地,平板电容C1的另一端与可控开关S1的另一端电连接后与运算放大器U1的同相输入端电连接,运算放大器U1的反相输入端与运算放大器U1的输出端电连接,运算放大器U1的输出端依次经电阻R1、电阻R3与运算放大器U2的输出端电连接,电阻R2的一端接电源,电阻R2的另一端分为两路,第一路接电阻R1与电阻R3的结点,第二路接运算放大器U2的反相输入端,所述运算放大器U2的同相输入端接地,所述运算放大器U2的输出端接模数转换模块U3的输入端,所述可控开关S1的控制端与微处理器的输出控制端电连接,模数转换模块U3的输出端为所述数据处理电路的输出端。 1. A non-contact electrostatic potential tester, characterized in that: comprise a parallel plate capacitor for inductive charged body surface potential, for processing the potential signal collected by the parallel plate capacitor to generate the digital signal that the single-chip microcomputer can handle A data processing circuit, a microprocessor for calculating the potential signal processed by the data processing circuit, and a display unit for displaying the value of the potential signal processed by the microprocessor; the data processing circuit includes resistors R1-R3, an operational amplifier U1-U2, the controllable switch S1 and the analog-to-digital conversion module U3, one end of the controllable switch S1 is electrically connected to one end of the plate capacitor C1 and grounded, and the other end of the plate capacitor C1 is electrically connected to the other end of the controllable switch S1. The non-inverting input terminal of the operational amplifier U1 is electrically connected, the inverting input terminal of the operational amplifier U1 is electrically connected to the output terminal of the operational amplifier U1, and the output terminal of the operational amplifier U1 is electrically connected to the output terminal of the operational amplifier U2 through the resistor R1 and the resistor R3 in turn. , one end of the resistor R2 is connected to the power supply, and the other end of the resistor R2 is divided into two circuits, the first circuit is connected to the node of the resistor R1 and the resistor R3, the second circuit is connected to the inverting input terminal of the operational amplifier U2, and the operational amplifier U2 The non-inverting input terminal is grounded, the output terminal of the operational amplifier U2 is connected to the input terminal of the analog-to-digital conversion module U3, the control terminal of the controllable switch S1 is electrically connected to the output control terminal of the microprocessor, and the output of the analog-to-digital conversion module U3 The terminal is the output terminal of the data processing circuit. 2.根据权利要求1所述的非接触式静电电位测试仪,其特征在于:所述微处理器为单片机或RAM处理器。 2. The non-contact electrostatic potential tester according to claim 1, characterized in that: the microprocessor is a single-chip microcomputer or a RAM processor. 3.根据权利要求1所述的非接触式静电电位测试仪,其特征在于:所述显示单元为LED显示屏或LCD显示屏。 3. The non-contact electrostatic potential tester according to claim 1, wherein the display unit is an LED display or an LCD display.
CN201420071943.9U 2014-02-19 2014-02-19 Contactless electrostatic potential tester Expired - Fee Related CN204008869U (en)

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105807146A (en) * 2014-12-31 2016-07-27 清华大学 Electrostatic distribution measurement device
CN108872690A (en) * 2018-07-04 2018-11-23 桂林市华谊智测科技有限责任公司 A kind of non-contact inductive piece and test pencil
TWI645200B (en) * 2018-01-04 2018-12-21 國立彰化師範大學 Non-contact electrostatic measuring device
CN110554252A (en) * 2019-09-27 2019-12-10 萧县众科电磁检测有限公司 An electrostatic tester
CN114137325A (en) * 2021-11-30 2022-03-04 中国人民解放军陆军工程大学 Bionic circuit and method for non-contact electrostatic potential distribution test

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105807146A (en) * 2014-12-31 2016-07-27 清华大学 Electrostatic distribution measurement device
CN105807146B (en) * 2014-12-31 2018-10-02 清华大学 Electrostatic apparatus for measuring distribution
TWI645200B (en) * 2018-01-04 2018-12-21 國立彰化師範大學 Non-contact electrostatic measuring device
CN108872690A (en) * 2018-07-04 2018-11-23 桂林市华谊智测科技有限责任公司 A kind of non-contact inductive piece and test pencil
CN108872690B (en) * 2018-07-04 2024-05-14 桂林市华谊智测科技有限责任公司 Non-contact type induction sheet and test pencil
CN110554252A (en) * 2019-09-27 2019-12-10 萧县众科电磁检测有限公司 An electrostatic tester
CN114137325A (en) * 2021-11-30 2022-03-04 中国人民解放军陆军工程大学 Bionic circuit and method for non-contact electrostatic potential distribution test

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CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20141210

Termination date: 20160219