CN1900700B - Quantitative method for adjustable defect grading - Google Patents

Abstract

The invention provides an adjustable defect grading quantitative method, which is used for solving the difficulties encountered in moire detection and improving the possibility and the advantage of the existing human eye detection efficiency by neglect.

Description

A Quantitative Method for Adjustable Defect Rating

technical field

The invention relates to a quantitative method for grading defects, in particular to a quantitative method for grading defects of an adjustable test panel.

Background technique

Measurement and inspection play an important role in the display manufacturing process. Nowadays, manufacturers at all levels want to use automatic inspection systems to replace or strengthen traditional visual inspection methods. Some manufacturers have developed or are developing a standard (test method and evaluation criterion), which is mainly aimed at the uneven brightness defect in the automatic detection system, which is called the "Mura defect" detection method of the flat panel display. Mura defect detection is an important topic for display components, subsystems, and various display technologies. Display system components such as microdisplays, diffusers, polarizers, backlight modules, glass substrates, and brightness enhancement films must also be inspected to identify defects that cause mura dissimilation in the final display system.

According to the flat panel display measurement standard of the Video Electronics Standards Association (VESA), the mura defect is defined as "when the display is displayed at a constant gray value, the imperfection of the display pixel area can be seen. The mura defect is characterized by low contrast, brightness Non-uniform areas appear in an area that is generally larger than a single pixel." Similarly, the Mura defect is defined by the Semiconductor Equipment and Materials International (SEMI) in terms of brightness non-uniformity.

In existing patent documents, such as US Patent No. 5754678 "Substrate inspection apparatus and method (Substrate inspection apparatus and method)" discloses an automated substrate inspection apparatus and method, please refer to Figure 1 for the flow chart of the substrate inspection method, including capturing a substrate location in an image detection device (S100), limiting intensity variations due to background adjustments (S102), comparing a first pixel within a first pixel consisting of four pixels and a first pixel consisting of four pixels The first pixel in the second pixel composed (S104), compare the second pixel in the first pixel composed of four pixels with the second pixel in the second pixel composed of four pixels pixels (S106), and determine the sub-pixels on the detection substrate (S108).

Also, as U.S. Patent No. 5917935 "Mura detection apparatus and method (Mura detection apparatus and method)" discloses a method and device for automatic defect detection, the method is aimed at detecting moiré patterns and detection devices on substrates , wherein the substrate includes liquid crystal flat panel displays, active matrix displays, and other similar displays. Please refer to FIG. 2, which is a flow chart of the substrate moiré detection method, which includes obtaining an original image of a substrate (S200), generating a plurality of sub-sampled images from the original image (S202), and performing defect-specific filtering of each image (S204). ), establish each point (BLOB) (S206) with the threshold of each image, determine the defect of moiré (mura) by analyzing each point (S208), characterize the defect of moiré (S210), and selectively post-process to Line moiré defects are determined (S212).

However, the difficulties encountered by various manufacturers in moiré detection: (1) Difficult to be qualitative; (2) Difficult to quantify; (3) The repeatability of moiré patterns is low; (5) Different customers have different requirements, even the same customer has different requirements at different times.

Contents of the invention

In order to solve the above-mentioned problems and the prior art ignores the possibility and advantages of improving the existing human eye detection efficiency, the present invention proposes an adjustable defect grading quantitative method based on the human factor of the human eye visual model, supplemented by An adjustable device to achieve the purpose of quantifying moiré.

The human eye's threshold for detecting objects varies depending on the size of the object, the brightness contrast between the object and the background, and the brightness of the background. In the field of vision research, Just Noticeable Difference is often used to define the detection threshold.

In order to achieve the above-mentioned purpose of quantifying moiré, the present invention provides a quantitative method for grading adjustable defects, including obtaining at least one test panel pre-work; detecting at least one defect degree of at least one test panel; Generate at least one optical density value through an adjustment conversion action; convert the optical density value into at least one just noticeable difference (Just Noticeable Difference); and collect the just noticeable difference to make at least one adjustable defect definition Quantitative value of the level.

Description of drawings

FIG. 1 is a flow chart of a substrate detection method in the prior art;

Fig. 2 is the flow chart of the prior art substrate moiré detection method;

Fig. 3 is the flow chart of the quantitative method of the adjustable defect grading of the present invention; and

Fig. 4 is a flow chart of the quantitative numerical method of adjustable defect grading in the present invention.

Detailed ways

In order to further illustrate the technology, method and effect that the present invention takes to achieve the intended purpose, please refer to the following detailed description and accompanying drawings of the present invention. It is believed that the purpose, characteristics and characteristics of the present invention can be obtained from this in-depth and specific It is understood that the accompanying drawings are only for reference and illustration, and are not intended to limit the present invention.

The present invention is based on the human factor based on the visual model of the human eye, and is supplemented with an adjustable device to achieve the purpose of quantifying the moiré.

Please refer to FIG. 3 , which is a flow chart of the quantitative method for the adjustable defect grading of the present invention, including the pre-operation (S300) of obtaining at least one test panel, wherein the test panel is a liquid crystal panel, a cathode ray tube TV panel, Plasma panels or other types of test panels. Detecting at least one defect degree of at least one test panel (S302), and generating at least one identification value through an adjustment conversion action on the defect degree (S304), wherein the adjustment conversion action is achieved by an adjustable device, The adjustment conversion action includes adjusting the penetration time or penetration intensity. For example, LCD glasses have the characteristic of changing the penetration rate, so they can be used as an embodiment of the adjustable device, and the adjustable device can also be mechanical, spatial Formula or time formula, the entire brightness (wavelength visible to human eyes) can be reduced through the adjustable device, wherein the identification value is the light attenuation rate, and the mathematical formula of the light attenuation rate is D=log1/T, D is the optical attenuation rate (Optical Density), and T is the light transmittance.

Converting the recognition value into at least one visual difference (S306), the visual difference is converted according to whether the viewer can see a certain object or cannot see the same object when the recognition is blurred. The obtained ratios are used to define a switching threshold (thresholds), and the visual discrepancies are collected to produce at least one quantitative value for adjustable defect grading (S308).

The conversion model of light attenuation rate and visual difference can be expressed as the following formula:

δ(JND)=k* ^Dn

In the above formula, k and n are the modulation parameters, and D is the light attenuation rate. The essence of the formula is that the JND change can be obtained by modulating the light attenuation rate, so as to achieve the goal of quantifying defects.

Please refer to FIG. 4 for a flow chart of the quantitative numerical method for adjustable defect grading of the present invention, including the pre-operation (S400) of obtaining at least one test panel, wherein the test panel is a liquid crystal panel, a cathode ray tube TV panel, Plasma panels or other types of test panels. Detecting at least one defect level of at least one test panel (S402), and generating at least one identification value by subjecting the defect level to an adjustment conversion action (S404), wherein the adjustment conversion action is achieved by an adjustable device, The adjustment conversion action includes adjusting the penetration time or penetration intensity. For example, LCD glasses have the characteristic of changing the penetration rate, so they can be used as an embodiment of the adjustable device, and the adjustable device can also be mechanical, spatial Formula or time formula, the entire brightness (wavelength visible to human eyes) can be reduced through the adjustable device, wherein the identified value is the light attenuation rate. Decreasing a penetration strength of the adjustment conversion action (S406), and obtaining at least one quantitative value of adjustable defect grading by the penetration strength (S408).

The present invention can solve the shortcoming of prior art, and compare the present invention with prior art as follows:

1. The present invention can be used to quantitatively link the recognition value and the visual difference;

2. The present invention can be used to objectively quantify the relationship between the identification value and the panel level, without shifting with time or customers;

3. The present invention has taken different brightness backgrounds into consideration;

4. When judging whether there is a clear boundary in the moire (mura), the present invention can judge the two types of moire simultaneously;

5. There is no limit to the size of the moiré;

6. The present invention is faster than the prior art in discriminating moiré.

The present invention can clearly provide a design that is completely different from the existing ones by means of the technology disclosed above, which can improve the overall use value.

The drawings and descriptions disclosed above are only embodiments of the present invention. Those who are skilled in this art can make other various improvements based on the above descriptions, and these changes still belong to the spirit of the present invention and the following definitions within the scope of the patent.

Claims (6)

1. the quantivative approach of an adjustable fault grading comprises:

Detect at least one defect level of at least one test panel;

Described defect level is adjusted switching motion to produce at least one identification numerical value via one of an adjustable device, and wherein this adjustment switching motion comprises adjustment time of break-through or transmitted intensity, and this identification numerical value is light decay rate;

Changing described identification numerical value is that at least one vision just distinguishes poor; And

Compile described vision and distinguish that just difference is to make the quantitative value of at least one adjustable fault grading.

2. the quantivative approach of adjustable fault grading according to claim 1 before wherein this detects the step of at least one test panel, further comprises the previous operations that obtains at least one test panel.

3. the quantivative approach of adjustable fault grading according to claim 1, wherein said test panel is liquid crystal panel, cathode-ray tube TV panel or plasma panel.

4. the quantitative value method of an adjustable fault grading comprises:

Detect at least one defect level of at least one test panel;

Described defect level is adjusted switching motion to produce at least one identification numerical value via one of an adjustable device, and wherein this identification numerical value is light decay rate, and this adjustment switching motion comprises adjusts time of break-through or transmitted intensity;

Reduce a transmitted intensity of this adjustment switching motion; And

Obtain the quantitative value of at least one adjustable fault grading by this transmitted intensity.

5. the quantitative value method of adjustable fault grading according to claim 4 before wherein this detects the step of at least one test panel, further comprises the previous operations that obtains at least one test panel.

6. the quantitative value method of adjustable fault grading according to claim 4, wherein said test panel is liquid crystal panel, cathode-ray tube TV panel or plasma panel.

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