CN1607395A - Non-destructive contact detection method and its detection equipment - Google Patents
Non-destructive contact detection method and its detection equipment Download PDFInfo
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- CN1607395A CN1607395A CN 200310100550 CN200310100550A CN1607395A CN 1607395 A CN1607395 A CN 1607395A CN 200310100550 CN200310100550 CN 200310100550 CN 200310100550 A CN200310100550 A CN 200310100550A CN 1607395 A CN1607395 A CN 1607395A
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- 238000001514 detection method Methods 0.000 title claims abstract description 50
- 239000004020 conductor Substances 0.000 claims abstract description 103
- 239000007788 liquid Substances 0.000 claims abstract description 46
- 230000001066 destructive effect Effects 0.000 claims description 58
- 238000010438 heat treatment Methods 0.000 claims description 9
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 claims description 5
- 229910052753 mercury Inorganic materials 0.000 claims description 5
- 238000005259 measurement Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 description 17
- 238000009659 non-destructive testing Methods 0.000 description 7
- 239000000523 sample Substances 0.000 description 7
- 238000013461 design Methods 0.000 description 6
- 230000002950 deficient Effects 0.000 description 5
- 230000000694 effects Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 2
- WABPQHHGFIMREM-RKEGKUSMSA-N lead-214 Chemical compound [214Pb] WABPQHHGFIMREM-RKEGKUSMSA-N 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000000994 depressogenic effect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- 239000012774 insulation material Substances 0.000 description 1
- 239000002346 layers by function Substances 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
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Abstract
The invention relates to a nondestructive contact detection method, which is suitable for detecting the electrical characteristics of an object to be detected at a detection temperature. The liquid conductor does not damage the surface of the object to be tested when contacting the object to be tested, so that the finished product can normally act. The nondestructive contact detection apparatus includes: a body having at least one opening; and at least one conductor which is liquid at the detection temperature and is exposed out of the main body through the opening to be contacted with the surface of the object to be detected. The invention can avoid the object to be measured from being damaged during the measurement, and has industrial utilization value; the device can make the object to be detected still normally act after detection, thereby being more practical.
Description
Technical field
The present invention relates to a kind of detection method and checkout equipment thereof of non-destructive contact, it is destroyed during measuring particularly to relate to a kind of determinand of can avoiding, but can make determinand regular event still after detecting, and have detection method (non-destructive contact test) and checkout equipment thereof that the non-destructive of the value on the industry contacts.
Background technology
Usually all can carry out every detection during the product manufacturing or after finishing, classify, then can be divided into destructive the detection and detect two kinds of method of testings with non-destructive and whether come to harm at product itself.Wherein, nondestructive testing method is not because can damage product, thus the detection during more often being applied to make, so that can proceed to make by the semi-manufacture that detect.Yet, still have part to need the detection of direct contact measured thing can't accomplish that non-destructive detects at present.
For instance, practical Organic Light Emitting Diode (organiclight emitting diode still can't be proposed in the prior art, be called for short OLED) array (array) detection mode, because the array base palte of Organic Light Emitting Diode is after finishing and do not form as yet before each organic functional layer, the wherein left indium tin oxide that is connected with Organic Light Emitting Diode (ITO) anode is electrically to float the state of (floating).If the driving circuit of measuring picture element (pixel) whether regular event and homogeneity, then needing provides an electrode at the ITO end, if but do actual contact with general probe, and will damage ITO, make the final produced Organic Light Emitting Diode can't regular event.
This shows that above-mentioned existing nondestructive testing method and checkout equipment thereof still have defective, and demand urgently further being improved.In order to solve the defective of existing nondestructive testing method and checkout equipment thereof, relevant manufacturer there's no one who doesn't or isn't seeks solution painstakingly, but does not see always that for a long time suitable design finished by development, and this obviously is the problem that the anxious desire of relevant dealer solves.
Because the defective that above-mentioned existing nondestructive testing method and checkout equipment thereof exist, the inventor is based on being engaged in this type of product design manufacturing abundant for many years practical experience and professional knowledge, actively studied innovation, in the hope of founding detection method and the checkout equipment thereof that a kind of new non-destructive contacts, can improve general existing nondestructive testing method and checkout equipment thereof, make it have more practicality.Through constantly research, design, and after studying repeatedly and improving, create the present invention who has practical value finally.
Summary of the invention
The objective of the invention is to, overcome the defective that existing nondestructive testing method exists, and detection ten thousand methods that provide a kind of new non-destructive to contact, technical matters to be solved is to make it can avoid determinand destroyed during measuring, and has the value on the industry.
Another object of the present invention is to, the detection method of a kind of non-destructive contact is provided, but technical matters to be solved is to make it can make determinand regular event still after detecting.
A further object of the present invention is, overcome the defective that existing non-destructive checkout equipment exists, and the checkout equipment that provides a kind of new non-destructive to contact, technical matters to be solved is to make it can avoid determinand destroyed during measuring, and has the value on the industry.
An also purpose of the present invention is, a kind of checkout equipment of non-destructive contact is provided, but technical matters to be solved is to make it make determinand regular event still after detecting, thereby is suitable for practicality more.
The object of the invention to solve the technical problems realizes by the following technical solutions.The detection method that a kind of non-destructive that proposes according to the present invention contacts, be suitable under a detected temperatures, detecting the electrical specification of a determinand, the detection method of this non-destructive contact may further comprise the steps: a checkout equipment is provided, it includes a conductor, and wherein this conductor is in a liquid state under this detected temperatures; And use this conductor to be contacted with the surface of this determinand, in order to detect the electrical specification of this determinand.
The object of the invention to solve the technical problems also can be applied to the following technical measures to achieve further.
The detection method of aforesaid non-destructive contact, the fusing point of wherein said conductor is lower than this detected temperatures, and this conductor is being lower than under the temperature of this detected temperatures for solid-state, before wherein using this conductor to contact the surface of this determinand, more comprise this conductor is carried out a heating steps, so that this conductor becomes liquid state.
The detection method of aforesaid non-destructive contact, wherein said conductor is liquid being lower than under the temperature of this detected temperatures, wherein this conductor comprises mercury.
The detection method of aforesaid non-destructive contact, wherein said this conductor that is in a liquid state are to adjust its height by the mode of vacuum attraction.
The object of the invention to solve the technical problems also adopts following technical scheme to realize.The detection method that a kind of non-destructive that proposes according to the present invention contacts, be suitable under a detected temperatures, detecting the electrical specification of an active cell array, have a plurality of picture elements on this active cell array, the detection method of this non-destructive contact may further comprise the steps: a, provide a checkout equipment, this checkout equipment has a plurality of conductors, and wherein those conductors are in a liquid state under this detected temperatures; B, make the surface of those those picture elements of conductor contact portion; And c, detect the electrical specification of those picture elements by those conductors.
The object of the invention to solve the technical problems also can be applied to the following technical measures to achieve further.
The detection method of aforesaid non-destructive contact wherein more comprises after step c: d, mobile this pick-up unit; And repeating step b～d, detect each those picture element up to those conductors.
The object of the invention to solve the technical problems also adopts following technical scheme to realize.The checkout equipment of a kind of non-destructive contact that proposes according to the present invention is suitable for detecting the electrical specification of a determinand under a detected temperatures, the checkout equipment of this non-destructive contact comprises: a main body has at least one opening; And at least one conductor, it is in a liquid state under this detected temperatures, and this conductor is exposed to outside this main body via this opening, in order to contact the surface of this determinand.
The object of the invention to solve the technical problems also can be applied to the following technical measures to achieve further.
The checkout equipment of aforesaid non-destructive contact, the fusing point of wherein said conductor is lower than this detected temperatures, when wherein this conductor is solid-state under being lower than the temperature of this detected temperatures, more comprises a heating arrangement, links to each other with this main body, in order to heat those conductors.
The checkout equipment of aforesaid non-destructive contact, wherein said conductor is liquid being lower than under the temperature of this detected temperatures, wherein this conductor comprises mercury.
The checkout equipment of aforesaid non-destructive contact, it more comprises a vacuum system, the height of this conductor that is in a liquid state with the mode adjustment by vacuum attraction.
The present invention compared with prior art has tangible advantage and beneficial effect.By above technical scheme as can be known, in order to reach aforementioned goal of the invention, major technique of the present invention thes contents are as follows:
The present invention proposes a kind of detection method of non-destructive contact, be suitable under a detected temperatures, detecting the electrical specification of a determinand, this detection method provides a checkout equipment, this checkout equipment has a conductor that is in a liquid state, use the conductor contact measured thing surface that is in a liquid state earlier, detect the electrical specification of determinand again via the conductor that is in a liquid state, to judge whether fault of determinand.
The present invention proposes a kind of detection method of non-destructive contact again, be suitable under a detected temperatures, detecting the electrical specification of an active cell array, have a plurality of picture elements on this active cell array, and the detection method of this non-destructive contact, comprise the surface of using a plurality of conductor contact picture elements that are in a liquid state earlier, detect the electrical specification of picture element again by the conductor that is in a liquid state, to find out the fault in the picture element.
The present invention also proposes a kind of detection method of non-destructive contact in addition, be suitable under a detected temperatures, detecting the electrical specification of a active cell array with a plurality of picture elements, this detection method may further comprise the steps: a, provide a checkout equipment, this checkout equipment to have a plurality of conductors that are in a liquid state.Afterwards, b, make the surface of the conductor contact portion picture element that is in a liquid state of checkout equipment.Then, c, detect the electrical specification of determinand by the conductor that is in a liquid state, to judge whether fault is arranged in the picture element.
The present invention reintroduces a kind of checkout equipment of non-destructive contact, is suitable for detecting under a detected temperatures electrical specification of a determinand, and this checkout equipment comprises a main body and the conductor that is in a liquid state, and wherein main body has at least one opening.And the conductor that is in a liquid state is exposed to outside the main body via opening, in order to the surface of contact measured thing.
Warp is with as can be known above-mentioned, the detection method of non-destructive contact of the present invention, be suitable under a detected temperatures, detecting the electrical specification of a determinand, this detection method is to use a conductor contact measured thing surface that is in a liquid state earlier, detect the electrical specification of determinand again via the conductor that is in a liquid state, to judge whether fault of determinand.Because the conductor that is in a liquid state can not injure its surface when touching determinand, it is hereby ensured that the product after finishing can regular event.
The present invention is because adopt than low resistance and low-melting conductor, utilize heating or alternate manner to make the conductor liquefy, this kind liquid forms globule shape because of cohesion (cohesion), utilize the conductor of globule shape liquid state to be used as the medium that is connected with determinand, so can avoid destroying because of the determinand that uses the probe contact to be caused in the existing known techniques, can avoid the resistance that is connected in series excessive again, cause error in the detection.
In sum, the detection method and the checkout equipment thereof of the non-destructive contact of the novel special construction of the present invention can be avoided determinand destroyed during measuring, and have the value on the industry; But can make determinand regular event still after detecting, thereby be suitable for practicality more.It has above-mentioned many advantages and practical value, and in same class methods, equipment, do not see have similar design to publish or use and really genus innovation, no matter it is all having bigger improvement on method, the structure or on the function, have large improvement technically, and produced handy and practical effect, and more existing nondestructive testing method and checkout equipment thereof have the multinomial effect of enhancement, thereby be suitable for practicality more, and have the extensive value of industry, really be a new and innovative, progressive, practical new design.
Above-mentioned explanation only is the general introduction of technical solution of the present invention, for can clearer understanding technological means of the present invention, and can be implemented according to the content of instructions, below with preferred embodiment of the present invention and conjunction with figs. describe in detail as after.
Description of drawings
Fig. 1 is a kind of schematic top plan view of active cell array.
Fig. 2 is the schematic perspective view of checkout equipment when detecting according to the non-destructive contact of the present invention one first embodiment.
Fig. 3 A and Fig. 3 B are the flow process schematic top plan view of checkout equipment when detecting that the non-destructive according to the present invention one second embodiment contacts.
Fig. 4 is the schematic perspective view of clothing according to the checkout equipment of the non-destructive contact of second embodiment of the invention.
Fig. 5 is the schematic perspective view according to the checkout equipment of the non-destructive contact of third embodiment of the invention.
10: substrate 100,300: array (array)
102: scan wiring 104: the data distribution
106: pixel electrode 108: active member
110,302: picture element 200,310: checkout equipment
202,311: main body 204,304: opening
210: electrical specification pick-up unit 212,312: conductor
214,314: lead 216,316: probe
Embodiment
Below in conjunction with accompanying drawing and preferred embodiment, detection method and its concrete grammar of checkout equipment, step, feature and the effect thereof of the non-destructive contact that foundation the present invention is proposed, describe in detail as after.
Notion of the present invention is to improve at the mode that electrical specification detects, and is destroyed during measuring to avoid determinand, below two embodiment be to be example with the active cell array.Yet this exposure only be several applications method wherein, be used for usefulness for example but should understand these embodiment, but not in order to limit the scope of the invention.
First embodiment
Fig. 1 is a kind of schematic top plan view of active cell array.See also shown in Figure 1, general active cell array 100, consisted essentially of scan wiring (scan line) 102, data distribution (dataline) 104, pixel electrode 106 and active member 108, wherein the material of pixel electrode 106 for example is indium tin oxide (ITO).And, scan wiring 102 defines a plurality of picture elements 110 with data distribution (being data wiring) 104, pixel electrode 106 promptly is positioned among each picture element 110, and active member 108 then is electrical connected each other with scan wiring 102, data distribution 104 and pixel electrode 106.Whether the driving circuit that detects each picture element 110 among this figure as desire regular event and homogeneity, then sees also shown in Figure 2.
Fig. 2 is the schematic perspective view of checkout equipment when detecting according to the contact of the non-destructive of one first embodiment of the present invention, and wherein determinand is the pixel electrode 106 of active cell array 100 of the II-II section of Fig. 1.
See also shown in Figure 2, the checkout equipment 200 of the non-destructive contact of present embodiment is suitable for detecting determinand (being pixel electrode 106) under a detected temperatures, this checkout equipment 200, include a main body 202, it has an opening 204 and an electrical specification pick-up unit 210, and it has a conductor 212, and conductor 212 is in a liquid state under detected temperatures, wherein main body 202 for example is a wheeled apparatus, and the shape of opening 204 can be done various distortion, is preferably circle.Moreover, electrical specification pick-up unit 210 is to be arranged in the main body 202, and when the material of main body 202 is the insulation material, electrical specification pick-up unit 210 more can comprise a lead 214, wherein conductor 212 is to be exposed to outside the main body 202 via opening 204, and contact pixel electrode 106 surfaces, 214 in lead and conductor 212 are electrical connected.Moreover conductor 212 acts on because of its cohesion (cohesion), and can keep globule shape when detecting.And the fusing point of conductor 212 need be lower than detected temperatures, to be in a liquid state when detecting.Particularly the determinand (being ITO pixel electrode 106) with present embodiment is an example, and the fusing point of conductor 212 need be lower than 400 degree Celsius, goes bad because of being heated to avoid determinand.In addition, when if conductor 212 is solid-state under being lower than the temperature of detected temperatures, can in checkout equipment 200, install a heating arrangement (not shown) additional, link to each other with main body 202, in order to before using conductor 212 contact picture elements 110 surfaces, be solid-state conductor 212 before heating detects and make it become liquid state; Otherwise,, then do not need heating arrangement as mercury (Hg) if conductor 212 is liquid being lower than under the temperature of detected temperatures.
Please continue to consult shown in Figure 2, when utilizing the checkout equipment 200 of this figure to detect, be to use earlier conductor 212 contacts that are in a liquid state to be formed at pixel electrode 106 surfaces in the picture element 110 on the substrate 10, detect its electrical specifications by the conductor 212 that is in a liquid state again, to find out the fault in the picture element 110.In addition, electrical specification pick-up unit 210 can also install a probe 216 additional, and this probe 216 is to be connected in lead 214 and the conductor 212 that is in a liquid state.In addition, the checkout equipment 200 of this figure more can install a vacuum system (not shown) additional, to adjust the height of conductor 212 by the mode of vacuum attraction.Moreover, can utilize moving of checkout equipment 200, adjust the exposure level of the pixel electrode 106 in conductor 212 and the picture element 110.
Second embodiment
Fig. 3 A and Fig. 3 B are the flow process schematic top plan view of checkout equipment when detecting that the non-destructive according to one second embodiment of the present invention contacts.Please at first consult shown in Fig. 3 A, when active cell array 300 that determinand is made up of a plurality of picture elements 302, one checkout equipment 310 can be provided earlier under a detected temperatures, and this checkout equipment 310 has a plurality of conductors 312, and wherein conductor 312 is in a liquid state under detected temperatures.Afterwards, make the surface of the picture element 302 of conductor 312 contact portions.Then, by the electrical specification of conductor 312 detection picture elements 302, whether fault person is wherein arranged to judge.At this moment, from this figure, still have many picture elements 302 not detected.Therefore, need carry out next step.
See also shown in Fig. 3 B, with the move right distance of a picture element 302 of checkout equipment 310, repeat the detection method of Fig. 3 A again, wherein the figure acceptance of the bid picture element 302 that is shown with shade is the picture element through detecting.Therefore can know by inference, as long as mobile detection apparatus 310 detects each picture element 302 up to conductor 312, the electrical specification that can finish whole array 300 detects.And the schematic perspective view of the checkout equipment 310 of present embodiment is as follows.
Fig. 4 is the schematic perspective view according to the checkout equipment of the non-destructive contact of the second embodiment of the present invention.See also shown in Figure 4, the checkout equipment 310 of the non-destructive contact of present embodiment is similar with Fig. 2, comprising the main body 311 with plurality of openings 304 and a plurality of conductor 312, and conductor 312 is in a liquid state under detected temperatures, wherein conductor 312 is to be exposed to outside the main body 311 via opening 304, conductor 312 is suitable for contact measured thing (being picture element 302) surface, and when the material of main body 311 is conductive material, checkout equipment 310 can comprise that more one shares lead 314, it links to each other with main body 311, is depressed into conductor 312 with the supply same electrical.Wherein, the opening 304 of present embodiment for example is that the mode with matrix distributes, it is arranged needs to cooperate the shape of determinand and distribution to change, and for example sets the program that detects, and makes the area of the area of the conductor 312 contact measured things that are in a liquid state less than the tested position of determinand.
The 3rd embodiment
More than being basic structure of the present invention, but under the situation that does not exceed the technology of the present invention design covering scope, still can being out of shape checkout equipment, as shown in Figure 5, is the schematic perspective view of the checkout equipment that contacts of the non-destructive according to third embodiment of the invention.See also shown in Figure 5, checkout equipment and Fig. 2 of the non-destructive contact of present embodiment are similar, comprising main body 311, conductor 312 and the lead 314 with plurality of openings 304, and conductor 312 is in a liquid state under detected temperatures, wherein conductor 312 is to be exposed to outside the main body 311 via opening 304, and 314 in lead and conductor 312 are electrical connected.Wherein, the opening 304 of present embodiment is to distribute in staggered mode.In addition, can also install a probe 316 additional, it is to be connected in lead 314 and conductor 312.
In addition, in the described checkout equipment of aforementioned each embodiment, can also increase some servicing unit (not shown), for example install an analysis instrument additional,, analyze the fiduciary level of determinand with the electrical specification data that get by detection.
Therefore, one of characteristics of the present invention are for adopting low-melting conductor, utilize heating or alternate manner to make the conductor liquefy, this kind liquid forms globule shape because of cohesion, utilize the conductor of globule shape liquid state to be used as the medium that is connected with determinand, so can avoid in the existing known techniques because of the determinand that uses the probe contact to be caused destroys, can avoid the resistance that is connected in series excessive again, the error in the detection of causing.
The above, it only is preferred embodiment of the present invention, be not that the present invention is done any pro forma restriction, though the present invention discloses as above with preferred embodiment, yet be not in order to limit the present invention, any those skilled in the art, in not breaking away from the technical solution of the present invention scope, when the method that can utilize above-mentioned announcement and technology contents are made a little change or be modified to the equivalent embodiment of equivalent variations, but every content that does not break away from technical solution of the present invention, according to technical spirit of the present invention to any simple modification that above embodiment did, equivalent variations and modification all still belong in the scope of technical solution of the present invention.
Claims (10)
1, the detection method of a kind of non-destructive contact is suitable for detecting the electrical specification of a determinand under a detected temperatures, it is characterized in that the detection method of this non-destructive contact may further comprise the steps:
One checkout equipment is provided, and it includes a conductor, and wherein this conductor is in a liquid state under this detected temperatures; And
Use this conductor to be contacted with the surface of this determinand, in order to detect the electrical specification of this determinand.
2, the detection method of non-destructive contact according to claim 1, the fusing point that it is characterized in that wherein said conductor is lower than this detected temperatures, and this conductor is being lower than under the temperature of this detected temperatures for solid-state, before wherein using this conductor to contact the surface of this determinand, more comprise this conductor is carried out a heating steps, so that this conductor becomes liquid state.
3, the detection method of non-destructive contact according to claim 1 is characterized in that wherein said conductor is liquid being lower than under the temperature of this detected temperatures, and wherein this conductor comprises mercury.
4, the detection method of non-destructive contact according to claim 1 is characterized in that wherein said this conductor that is in a liquid state is to adjust its height by the mode of vacuum attraction.
5, the detection method of a kind of non-destructive contact is suitable for detecting the electrical specification of an active cell array under a detected temperatures, have a plurality of picture elements on this active cell array, it is characterized in that the detection method of this non-destructive contact may further comprise the steps:
A, provide a checkout equipment, this checkout equipment has a plurality of conductors, and wherein those conductors are in a liquid state under this detected temperatures;
B, make the surface of those those picture elements of conductor contact portion; And
C, detect the electrical specification of those picture elements by those conductors.
6, the detection method of non-destructive contact according to claim 5 is characterized in that wherein more comprising after step c:
D, mobile this pick-up unit; And
Repeating step b～d detects each those picture element up to those conductors.
7, the checkout equipment of a kind of non-destructive contact is suitable for detecting the electrical specification of a determinand under a detected temperatures, it is characterized in that the checkout equipment of this non-destructive contact comprises:
One main body has at least one opening; And
At least one conductor, it is in a liquid state under this detected temperatures, and this conductor is exposed to outside this main body via this opening, in order to contact the surface of this determinand.
8, the checkout equipment of non-destructive contact according to claim 7, the fusing point that it is characterized in that wherein said conductor is lower than this detected temperatures, when wherein this conductor is solid-state under being lower than the temperature of this detected temperatures, more comprise a heating arrangement, link to each other with this main body, in order to heat those conductors.
9, the checkout equipment of non-destructive contact according to claim 7 is characterized in that wherein said conductor is liquid being lower than under the temperature of this detected temperatures, and wherein this conductor comprises mercury.
10, the checkout equipment of non-destructive according to claim 7 contact is characterized in that it more comprises a vacuum system, the height of this conductor that is in a liquid state with the mode adjustment by vacuum attraction.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200310100550 CN1607395A (en) | 2003-10-16 | 2003-10-16 | Non-destructive contact detection method and its detection equipment |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200310100550 CN1607395A (en) | 2003-10-16 | 2003-10-16 | Non-destructive contact detection method and its detection equipment |
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| CN1607395A true CN1607395A (en) | 2005-04-20 |
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| CN 200310100550 Pending CN1607395A (en) | 2003-10-16 | 2003-10-16 | Non-destructive contact detection method and its detection equipment |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107688107A (en) * | 2016-08-04 | 2018-02-13 | 创意电子股份有限公司 | Testing device and probe connector thereof |
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2003
- 2003-10-16 CN CN 200310100550 patent/CN1607395A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107688107A (en) * | 2016-08-04 | 2018-02-13 | 创意电子股份有限公司 | Testing device and probe connector thereof |
| CN107688107B (en) * | 2016-08-04 | 2019-11-22 | 创意电子股份有限公司 | Test fixture with its probe connectors |
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