CN1696710A - Detection device - Google Patents

Abstract

A detection device is prepared as setting operation table for placing tested object on probe platform, setting probe seat on operation table and erecting probe on the seat, installing electronic video camera on the probe and connecting monitor to the electronic video camera.

Description

Detection device

【Technical field】

The invention relates to a detection device, in particular to a detection device which uses a probe to detect a circuit.

【Background technique】

During the manufacturing process of the flat-panel display, it must first be tested to ensure that there is no open circuit or other abnormal conditions in the circuit on it before the next step of assembly and sales can be carried out.

A detection device in the prior art is shown in FIG. 1 . The detection device 1 includes a probe platform 11 , two probe holders 12 and 17 , a support 14 , a holding arm 15 and an optical microscope 16 .

The probe platform 11 includes a working surface 111 and two opposite sides 112 . The work surface 111 is a horizontal plane, which is used to place the workpiece to be detected, such as a flat panel display. The work surface 111 defines a Z axis perpendicular to the work surface 111, an X axis perpendicular to the Z axis, and an X axis perpendicular to the Z axis. The Y-axis and the X-axis are both perpendicular to the Y-axis. The two side surfaces 112 are perpendicular to the working surface 111 , and are respectively provided with a slide groove 113 parallel to the Y-axis.

The probe base 12 is disposed on the edge of the working surface 111 and includes a probe 13 for probing a circuit. The probe base 17 is the same as the probe base 12, it is also arranged on the edge of the working surface 111, and includes a probe 18 for probing the circuit. Both the probe bases 12 and 17 can move on the working surface 111 to probe circuits at different positions.

The bracket 14 includes two vertical rods 141 and a horizontal rod 142 connecting the two vertical rods 141. The lower ends of the two vertical rods 141 are slidably engaged with the slide groove 113, so that the bracket 14 can move freely along the Y-axis direction. Move back and forth. The holding arm 15 is used to hold the optical microscope 16 , is disposed on the horizontal bar 142 , and can move back and forth along the horizontal bar 142 to drive the optical microscope 16 to freely move back and forth along the X-axis direction.

In actual operation, the probes 13 and 18 can work alone or in cooperation to detect the on and off of the circuit, and the optical microscope 16 is used as an observation tool for the operator to observe the probe positions of the probes 13 and 18 is it right or not.

But there is following shortcoming in above-mentioned detection device 1:

First of all, because only one optical microscope 16 can be installed on the probe platform 11, it cannot observe the contacting conditions of each probe 13 and 18 pairs of circuits at the same time;

Secondly, when the size of the probe platform 11 is large, it is very inconvenient for the operator to simultaneously operate the probes 13 and 18 on the probe platform 11 when watching the optical microscope 16;

Furthermore, because the cost of the optical microscope is too high, the cost of the entire detection device 1 is also relatively high.

【Content of invention】

In order to overcome the problems of inconvenient operation and high cost of the detection device in the prior art, the present invention provides a detection device with convenient operation and low cost.

The detection device of the present invention includes a probe platform, a probe base, a probe, an electronic camera and a monitor, the probe platform has a working surface for placing the object to be tested, and the probe base is arranged on On the working surface, the probe is installed on the probe base, the electronic camera is installed on the probe base, and the monitor is connected with the electronic camera.

Compared with the prior art, since the detection device of the present invention uses an electronic camera to photograph the probe and the image of the probe touching the circuit, the captured image is then displayed on the monitor, and the operator directly observes the monitor It is easy to operate; moreover, because the electronic camera is much cheaper than the optical microscope, the cost of the detection device of the present invention can be greatly reduced.

【Description of drawings】

Fig. 1 is a schematic perspective view of a detection device in the prior art.

Fig. 2 is a schematic perspective view of the detection device of the present invention.

Fig. 3 is a schematic plan view of the probe base and the electronic camera of the detection device of the present invention.

【Detailed ways】

As shown in FIG. 2 , it is a schematic perspective view of the detection device of the present invention. The detection device 2 includes a probe platform 21 , two probe bases 22 and 32 , two probes 23 and 33 , and two electronic cameras 27 and 28 .

The probe platform 21 includes a working surface 211 and two opposite sides 212 . The work surface 211 is a horizontal plane, which is used to place workpieces to be detected (not shown), the work surface 211 defines a Z-axis perpendicular to the work surface 211, an X-axis perpendicular to the Z-axis and an X-axis perpendicular to the Z-axis Both the Z axis and the X axis are vertical to the Y axis. The two side surfaces 212 are perpendicular to the working surface 211 , and are respectively provided with a slide groove 213 parallel to the Y-axis.

The probe base 22 is arranged on the edge of the working surface 211 , and the probe 23 is mounted on the probe base 22 and used for probing the circuit of the workpiece to be detected. The probe base 32 is the same as the probe base 22 , it is also arranged on the edge of the working surface 211 , and is equipped with a probe 33 for probing the circuit. Both the probe bases 22 and 32 can move on the working surface 211 to probe circuits at different positions. The electronic camera 27 is installed on the probe base 22 and is used to obtain images of the probe 23 and the circuit touched by the probe 23 . The electronic camera 28 is installed on the probe base 32 and is used to obtain images of the probe 33 and the circuit touched by the probe 33 .

The detection device 2 also includes a bracket 24 and an electronic camera 26 mounted on the bracket 24 through a holding arm 25 . The bracket 24 includes two vertical rods 241 and a horizontal rod 242 connecting the two vertical rods 241. The lower ends of the two vertical rods 241 are slidably matched with the chute 213, so that the bracket 24 is installed on the probe platform. 21 and can freely move back and forth along the Y-axis direction. The holding arm 25 is used to hold the electronic camera 26 , is disposed on the horizontal bar 242 , and can move back and forth along the horizontal bar 242 to drive the electronic camera 26 to freely move back and forth along the X-axis direction.

In this embodiment, the electronic cameras 26, 27 and 28 are all charge coupled devices (Charge Couple Device, CCD).

Referring to FIG. 3 together, it is a schematic plan view of the probe base 22 and the electronic camera 27 of the detection device 2 of the present invention. The probe base 22 includes a suction cup 226 , an X-axis adjustment knob 221 , a Y-axis adjustment knob 222 , a Z-axis adjustment knob 223 and an angle adjustment knob 224 . The sucker 226 can be arbitrarily adsorbed on the working surface 211 through vacuum adsorption, the X-axis direction adjustment knob 221 is used to adjust the displacement of the probe 23 in the X-axis direction, and the Y-axis direction adjustment knob 222 is used to adjust the displacement of the probe 23. 23 in the Y-axis direction, the Z-axis direction adjustment knob 223 is used to adjust the displacement of the probe 23 in the Z-axis direction, and the angle adjustment knob 224 cooperates with a spring 225 to adjust the probe 23 relative to the probe The angle of the working surface 211 of the platform 21 . The electronic camera 27 is connected to a light source (not shown) through a light guide fiber 272, the light guide fiber 272 is used to transmit the light emitted by the light source to the internal lens of the electronic camera 27, and a signal line 271 connects the electronic camera 27 The signal is transmitted to a signal processing device (not shown in the figure), and the signal processing device outputs the processed signal to a monitor (not shown in the figure), and the monitor is used to display the image obtained by the electronic camera 27 .

The structure of the probe base 32 is the same as that of the probe base 22, and the structures of the electronic cameras 26 and 28 are the same as those of the electronic camera 27, which will not be described in detail here. Of course, the images of the electronic cameras 26 and 28 could be displayed on the same monitor as described above.

In actual operation, use the suction cup 226 of the probe base 22 to fix the probe base 22 at an approximate position, then observe the alignment status of the probe 23 and the circuit on the probe base 22 through the electronic camera 26, and then adjust the knob 221, 222 or 223 finely adjust the probe 23 to an accurate position, and then the circuit inspection can be carried out, and the electronic camera 27 on the probe base 22 transmits the image to the monitor in real time, so that the operator can observe. The operation mode of the probe base 32 is the same as that of the probe base 22, and the two probes 23 and 33 can act independently or in cooperation to detect whether the circuit is on or off.

Compared with the prior art, because the detection device 2 of the present invention uses electronic cameras 27 and 28 to take pictures of the probes and the images of the probes touching the circuit, the captured images are then displayed on the monitor, allowing the operator to directly Just observe the images on the monitor, which is convenient to operate; and, because the electronic cameras 27, 28 are much cheaper than optical microscopes, the cost of the detection device 2 of the present invention can be greatly reduced. In addition, because the weight of the electronic camera is relatively light, the design of the support 24 on the probe platform 21 can be simplified; and because the detection device 2 of the present invention uses a plurality of electronic cameras, the images obtained can be simultaneously displayed on a monitor , which is convenient for the operator to observe multiple targets at the same time.

The suction cup 226 of the probe base 22 can also be a magnet sheet, and the probe base 22 can be arbitrarily adsorbed on the working surface 211 by utilizing the magnetic attraction between the magnet sheet and the probe platform 21 .

Claims (9)

1. pick-up unit, it comprises a probe platform, a probe base and a probe, this probe platform has a workplace that is used to place determinand, this probe base is arranged on this workplace, this probe is installed on this probe base, it is characterized in that: this pick-up unit further comprises one first electronic still camera and a monitor, and this first electronic still camera is installed on this probe base, and this monitor links to each other with this first electronic still camera.

2. pick-up unit as claimed in claim 1 is characterized in that: comprise that further a support and is installed in second electronic still camera on this support, this support is installed on this probe platform and can comes and goes along a first direction that is parallel to this workplace and moves.

3. pick-up unit as claimed in claim 2 is characterized in that: this second electronic still camera can be parallel to this workplace and round mobile perpendicular to the second direction of this first direction along one.

4. pick-up unit as claimed in claim 1 is characterized in that: this probe base comprises a sucker, and this sucker is adsorbed on this workplace.

5. pick-up unit as claimed in claim 1 is characterized in that: this probe base comprises a flat thin magnet, and this flat thin magnet is adsorbed on this workplace.

6. pick-up unit as claimed in claim 1 is characterized in that: this probe base comprises a first direction adjusting knob, and this first direction is parallel to this workplace.

7. pick-up unit as claimed in claim 6 is characterized in that: this probe base comprises a second direction adjusting knob, and this second direction is parallel to this workplace and perpendicular to this first direction.

8. pick-up unit as claimed in claim 1 is characterized in that: this probe base comprises a third direction adjusting knob, and this third direction is perpendicular to this workplace.

9. pick-up unit as claimed in claim 1 is characterized in that: this probe base comprises an angular adjustment knob.

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