CN1577738A - Single-line arrangement development processing apparatus and method - Google Patents
Single-line arrangement development processing apparatus and method Download PDFInfo
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- CN1577738A CN1577738A CNA2004100552605A CN200410055260A CN1577738A CN 1577738 A CN1577738 A CN 1577738A CN A2004100552605 A CNA2004100552605 A CN A2004100552605A CN 200410055260 A CN200410055260 A CN 200410055260A CN 1577738 A CN1577738 A CN 1577738A
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- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
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Abstract
本发明提供一种不增加运送线的长度、不产生显影不均匀的一字排列式显影处理装置。对于在表面上形成了曝光过的抗蚀剂膜的基板(W),在显影液供给部(2)中向表面供给显影液,在运送的同时进行显影反应,然后在显影液回收部(4)中回收显影液,之后在漂洗液供给·回收部(6)中进行清洗和清洗液回收,最后送至干燥部(8)。在这一系列显影处理的过程中,在基板进入下游侧的处理部的情况下,于该处理部之前的待机部、例如该处理部是显影液回收部(4)的情况下,在其之前的待机部(3)中,使滚轮(10a)重复进行正反旋转,基板(W)往返移动。结果是,在基板(W)的背面,与滚轮(10a)接触的部分始终移动而不停止在一个部位上,基板的温度分布是均匀的。
The present invention provides an in-line developing treatment device which does not increase the length of the conveying line and does not cause uneven development. For the substrate (W) on which the exposed resist film is formed on the surface, the developer is supplied to the surface in the developer supply part (2), and the development reaction is carried out while being transported, and then the developer is recovered in the developer recovery part (4). ), the developer is recovered in the rinse solution supply and recovery unit (6), and the cleaning solution is recovered in the rinse solution supply and recovery unit (6), and finally sent to the drying unit (8). In the process of this series of development processing, when the substrate enters the processing part on the downstream side, the standby part before the processing part, for example, in the case where the processing part is the developer solution recovery part (4), before it In the standby part (3), the roller (10a) is repeatedly rotated forward and reverse, and the substrate (W) moves back and forth. As a result, on the back surface of the substrate (W), the portion in contact with the roller (10a) always moves without stopping at one position, and the temperature distribution of the substrate is uniform.
Description
技术领域technical field
本发明涉及一种对玻璃基板等基板连续进行显影液的供给、显影液的回收和漂洗等工序的一字排列式显影处理装置及其方法。The present invention relates to an in-line developing treatment device and method for continuously performing processes such as supplying developing solution, recovering developing solution, and rinsing a substrate such as a glass substrate.
背景技术Background technique
在用作液晶基板等的玻璃基板上形成预定图形的抗蚀剂膜时,对在玻璃基板表面上形成的抗蚀剂膜进行预定图形的曝光,通过显影只留下(或除去)预定图形的抗蚀剂膜。When forming a resist film of a predetermined pattern on a glass substrate such as a liquid crystal substrate, the resist film formed on the surface of the glass substrate is exposed to a predetermined pattern, and only the predetermined pattern is left (or removed) by development. resist film.
在进行上述显影处理时,首先在曝光后的抗蚀剂膜表面上供给施加显影液,在预定时间内进行显影反应,反应结束之后,回收或废弃显影液,然后经漂洗工序后进行干燥。而且,通过滚轮在运送基板的同时进行所述显影工序的一字排列式显影方法是公知的(专利文献1)。When performing the above-mentioned development treatment, firstly, a developer is supplied and applied to the exposed resist film surface, and a development reaction is carried out within a predetermined time period. After the reaction is completed, the developer is collected or discarded, and then dried after a rinsing process. Furthermore, an in-line developing method in which the above-mentioned developing step is carried out while conveying the substrate by rollers is known (Patent Document 1).
此外,还提出在玻璃基板的表面和背面的前后左右隔开间隔来配置喷出调温空气的喷嘴(专利文献2)。In addition, it has been proposed to dispose nozzles for ejecting temperature-regulated air at intervals in the front, rear, left, and right sides of the front and rear surfaces of the glass substrate (Patent Document 2).
[专利文献][Patent Document]
专利文献1:特开平11-204411号公报段落[0002]Patent Document 1: Paragraph [0002] of JP-P11-204411 Bulletin
专利文献2:特开2002-72492号公报段落[0002]~[0006]Patent Document 2: Paragraphs [0002] to [0006] of JP-A-2002-72492
发明内容Contents of the invention
在上述显影处理中,显影液的供给需要的时间、显影反应需要的时间、显影液的回收需要的时间以及漂洗需要的时间彼此不同,因此在采用一字排列式显影处理装置进行显影的情况下,需要将时间最长的工序与其它工序调配。为此,一旦基板在运送线的预定位置停止,则要调整生产节拍时间。In the above-mentioned development process, the time required for the supply of the developer, the time required for the development reaction, the time required for the recovery of the developer, and the time required for rinsing are different from each other. , the process with the longest time needs to be allocated with other processes. For this reason, tact time is adjusted once the substrate stops at a predetermined position on the transport line.
基板停止期间滚轮不旋转。为此,滚轮与基板背面的规定位置接触、且不与其它位置接触的状态持续规定时间。如果滚轮的表面温度与环境空气温度不同,因此在与滚轮接触的部分和不与其接触的部分上,在基板表面产生温度差,因此显影液的挥发速度局部地变化,在其影响下,表面的抗蚀剂显影化学处理速度存在差别,因而显影不均匀。The rollers do not rotate while the substrate is stopped. For this reason, a state in which the rollers are in contact with a predetermined position on the back surface of the substrate and not in contact with other positions is continued for a predetermined time. If the surface temperature of the roller is different from the ambient air temperature, a temperature difference is generated on the surface of the substrate between the part that is in contact with the roller and the part that is not in contact with it, so that the volatilization speed of the developer changes locally, and under its influence, the surface There are differences in the speed of resist development chemistry, resulting in non-uniform development.
特别是,作为滚轮,有时采用将轴方向长度比基板宽度短的滚轮以交错形式设置的运送线,这种情况下,由于滚轮接触的部分和不接触的部分的温度差而在基板的背面产生水滴,因此显影不均匀性更明显。In particular, as the rollers, there may be used a transfer line in which rollers whose length in the axial direction is shorter than the width of the substrate are arranged in a staggered manner. water droplets, so development unevenness is more noticeable.
此外,在由专利文献2提供的方法中,产生卷起粒子并附着于基板表面的新问题。特别是,随着目前玻璃基板的大型化,不均匀性的产生成为一个大问题。Furthermore, in the method provided by Patent Document 2, a new problem of rolling up particles and adhering to the substrate surface arises. In particular, with the current increase in the size of glass substrates, occurrence of unevenness has become a major problem.
反之,即使在滚轮的温度和周围空气温度相同的情况下,由于空气和滚轮的热传递系数不同,因此仍产生显影不均匀的问题。Conversely, even when the temperature of the roller is the same as that of the surrounding air, the problem of uneven development occurs due to the difference in heat transfer coefficient between the air and the roller.
此外,如果不停止基板,则可以消除滚轮在基板的特定位置接触规定时间而造成的问题,但必须增长这部分的运送线,因而装置规模大。In addition, if the substrate is not stopped, the problem caused by the roller contacting the specific position of the substrate for a predetermined time can be eliminated, but the transfer line of this part must be increased, so the scale of the device is large.
为解决上述问题,根据本发明提供一种一与排列式显影处理装置,在由多个滚轮构成的运送线的途中设置将显影液施加于基板表面的显影液供给部,与该显影液供给部相比沿着运送线在下游侧设置显影液回收、漂洗或干燥等次工序处理部,在所述显影液供给部和次工序处理部之间设置待机部,可以正反旋转构成该待机部的滚轮。In order to solve the above-mentioned problems, according to the present invention, a kind of one-and-row type development treatment device is provided, and a developer solution supply part for applying developer solution to the substrate surface is provided in the middle of a conveying line composed of a plurality of rollers, and the developer solution supply part Compared with setting the developer recovery, rinsing or drying on the downstream side along the conveying line, a standby section is provided between the developer supply section and the next process section, and the parts that constitute the standby section can be rotated forward and reverse. scroll wheel.
所述滚轮在轴方向上具有相同的直径,以便在轴方向上连续与基板背面接触。The rollers have the same diameter in the axial direction so as to continuously contact the back surface of the substrate in the axial direction.
利用上述构成,根据本发明的一字排列式显影处理方法,即使各个工序的处理时间各不相同,也不必停止基板,即可一面不断地改变滚轮与基板背面的接触位置,一面进行显影。With the above structure, according to the in-line development processing method of the present invention, even if the processing time of each process is different, the development can be performed while continuously changing the contact position of the roller and the back surface of the substrate without stopping the substrate.
附图说明Description of drawings
图1(a)是根据本发明的显影装置的整体平面图,图1(b)是其侧视图。Fig. 1(a) is an overall plan view of a developing device according to the present invention, and Fig. 1(b) is a side view thereof.
图2是待机部的放大侧视图。Fig. 2 is an enlarged side view of a standby unit.
图3(a)是根据本发明的显影装置的另一实施例的整体平面图,图3(b)是该另一实施例的侧视图。Fig. 3(a) is an overall plan view of another embodiment of a developing device according to the present invention, and Fig. 3(b) is a side view of the other embodiment.
附图标记说明如下:The reference signs are explained as follows:
1:运送线,2:显影液供给部,3、5、7:待机部,4:显影液回收部,5:待机部,6:漂洗液供给·回收部,8:干燥部,10、10a:滚轮,W:基板1: Conveying line, 2: Developer supply section, 3, 5, 7: Standby section, 4: Developer recovery section, 5: Standby section, 6: Rinse supply and recovery section, 8: Dryer section, 10, 10a : Roller, W: Substrate
具体实施方式Detailed ways
下面参照附图介绍本发明的实施方式。这里,图1(a)和图1(b)分别是根据本发明的显影装置的平面图及其侧视图,图2是待机部的放大侧视图,图3(a)和图3(b)是根据本发明的另一实施例的平面图及其侧视图。Embodiments of the present invention will be described below with reference to the drawings. Here, FIG. 1(a) and FIG. 1(b) are a plan view and a side view thereof, respectively, of a developing device according to the present invention, FIG. 2 is an enlarged side view of a standby portion, and FIG. 3(a) and FIG. 3(b) are A plan view and a side view thereof according to another embodiment of the present invention.
一字排列式显影装置沿着基板的运送线1、从上游侧依次配置显影液供给部2、待机部3、显影液回收部4、待机部5、漂洗液供给·回收部6、待机部7及干燥部8,构成运送线1的多个滚轮(圆筒状滚子)10等间隔地隔开并且在与基板的运送方向垂直的方向上配置轴。The in-line developing device is arranged in sequence from the upstream side along the
此外,在图示的例子中,分别在显影液回收部4、漂洗液供给部·回收部6以及干燥部8等各种部件之前设置待机部,但也可以在所有的工序之前不设置待机部,而在其中一个工序之前设置待机部。In addition, in the illustrated example, a standby unit is provided before various components such as the developer solution recovery unit 4, the rinse solution supply unit/recovery unit 6, and the drying unit 8, but the standby unit may not be provided before all the processes. , and set the standby section before one of the processes.
在所述显影液供给部2上配置一对显影液供给用缝隙式喷嘴21,在显影液回收部4上配置吸引回收显影液的缝隙式喷嘴41,在漂洗液供给·回收部6上配置漂洗液供给喷嘴61和回收喷嘴62。此外,代替设置显影液回收用的缝隙式喷嘴41,也可以设置使基板稍微倾斜或弯曲而使表面上施加的显影液落下的机构。A pair of
滚轮10是设置得比基板W的宽度稍长,并且在沿轴方向在所有部位上都为同一直径的连续型滚轮,与玻璃基板W的背面面接触。而且,在滚轮中的待机部3、5、7上设置的滚轮10a可以正反旋转。The
如上所述,表面上形成曝光过的抗蚀剂膜的基板W,在显影液供给部2中向抗蚀剂膜表面提供显影液,在运送的同时进行显影化学反应,然后显影液回收部4中回收显影液,之后在漂洗液供给·回收部6中进行清洗和清洗液的回收,最终送至干燥部8。As described above, the substrate W on which the exposed resist film is formed on the surface is supplied with the developer solution to the surface of the resist film in the developer solution supply part 2, and the development chemical reaction is carried out while being transported, and then the developer solution recovery part 4 The developing solution is recovered in the rinsing solution supply and recovery section 6, and the cleaning and cleaning solution are recovered in the rinse solution supply and recovery section 6, and finally sent to the drying section 8.
在这一系列显影处理的过程中,在基板进入下游侧的处理部的情况下,在该处理部之前的待机部,例如,该处理部是显影液回收部4的情况下,在其之前待机部3中使滚轮10a重复进行正反旋转,如图2所示,基板W往返移动。结果是,在基板W的背面,与滚轮10a接触的部分始终移动而不停止在一个位置上,基板的温度分布均匀。In the course of this series of development processes, when the substrate enters the processing section on the downstream side, the standby section before the processing section, for example, when the processing section is the developer solution recovery section 4, waits before it. In the section 3, the
由于基板的温度分布均匀,因此可以均匀地进行显影处理。Since the temperature distribution of the substrate is uniform, development can be performed uniformly.
在图3所示的另一实施例中,为了可以根据显影时间的长短来改变显影开始位置。而并列设置多个显影液供给部。例如,显影时间需要120秒的情况下,在显影液供给部2中装上显影液,原封不动地直接通过显影液供给部2’到达显影液回收部4。此外,在显影时间需要60秒的情况下,直接通过显影液供给部2而在显影液供给部2’中装上显影液。由于不用担心在显影处理结束的时刻发生显影不均,因此在另一实施例中不设置新的待机部,通过使显影液回收部4的滚轮10a正反旋转来兼用待机部。通过这种构成,处理装置整体不大即可。In another embodiment shown in FIG. 3 , in order to change the development start position according to the length of the development time. On the other hand, a plurality of developer solution supply parts are arranged in parallel. For example, when the developing time needs to be 120 seconds, the developer is filled in the developer supply part 2, and the developer is directly passed through the developer supply part 2' to the developer recovery part 4 as it is. In addition, when the developing time needs to be 60 seconds, the developing solution is filled in the developing solution supplying part 2' directly through the developing solution supplying part 2. Since there is no need to worry about development unevenness at the time of the end of the development process, in another embodiment, a new standby unit is not provided, and the
如上所述,根据本发明的一字排列式显影装置,由于始终使滚轮旋转来变化基板背面和滚轮接触的接触位置,因此基板背面的温度分布均匀,并且可以进行没有显影不均匀和线宽变化的高精度显影处理。As described above, according to the in-line developing device of the present invention, since the contact position between the back surface of the substrate and the roller is changed by always rotating the roller, the temperature distribution on the back surface of the substrate is uniform, and development unevenness and line width variation can be performed. High-precision development processing.
此外,在待机部中可以使滚轮正反旋转,即,由于不用停止基板而使其往复运动,因此不用延伸生产线整体长度而以小型方式构成效率高的一字排列式显影装置。In addition, since the rollers can be rotated forward and backward in the standby section, that is, since the substrate is reciprocated without stopping the substrate, an efficient in-line developing device can be configured compactly and efficiently without extending the entire length of the production line.
而且,如果将显影液回收部和待机部进行兼用,则可以进一步实现装置的小型化。Furthermore, if the developer solution recovery unit and the standby unit are used together, further miniaturization of the apparatus can be achieved.
Claims (4)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP183014/2003 | 2003-06-26 | ||
| JP183014/03 | 2003-06-26 | ||
| JP2003183014A JP4043410B2 (en) | 2003-06-26 | 2003-06-26 | In-line development processor |
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| CN1577738A true CN1577738A (en) | 2005-02-09 |
| CN100405544C CN100405544C (en) | 2008-07-23 |
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| JP (1) | JP4043410B2 (en) |
| KR (1) | KR20050001373A (en) |
| CN (1) | CN100405544C (en) |
| TW (1) | TW200503072A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102969259A (en) * | 2011-08-31 | 2013-03-13 | 细美事有限公司 | Device and method for processing substrate |
| CN104347352A (en) * | 2013-07-31 | 2015-02-11 | 细美事有限公司 | Apparatus and method for treating substrate |
| CN106542859A (en) * | 2016-09-22 | 2017-03-29 | 山东润金农林科技有限公司 | Preparation method of chicken manure fermented fertilizer with high fertilizer utilization rate for apple planting |
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| KR101308136B1 (en) * | 2011-08-31 | 2013-09-12 | 세메스 주식회사 | Substrate processing apparatus |
| CN102445840A (en) * | 2011-11-29 | 2012-05-09 | 上海华力微电子有限公司 | Coating and developing device |
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| JP2812143B2 (en) * | 1993-06-15 | 1998-10-22 | ノーリツ鋼機株式会社 | Photosensitive material alignment device |
| JP3245813B2 (en) * | 1996-11-27 | 2002-01-15 | 東京エレクトロン株式会社 | Coating film forming equipment |
| JPH10288840A (en) * | 1997-04-17 | 1998-10-27 | Mitsubishi Paper Mills Ltd | Development method of lithographic printing plate |
| JPH11191545A (en) * | 1997-12-26 | 1999-07-13 | Sony Corp | Cleaning method and cleaning device |
| JP2001271188A (en) * | 2000-03-24 | 2001-10-02 | Ses Co Ltd | Substrate treatment apparatus |
| JP4568419B2 (en) * | 2000-11-02 | 2010-10-27 | 株式会社ブリヂストン | OA roller manufacturing method |
| TWI226077B (en) * | 2001-07-05 | 2005-01-01 | Tokyo Electron Ltd | Liquid processing apparatus and liquid processing method |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN102969259A (en) * | 2011-08-31 | 2013-03-13 | 细美事有限公司 | Device and method for processing substrate |
| CN102969259B (en) * | 2011-08-31 | 2016-05-18 | 细美事有限公司 | The device for the treatment of substrate |
| CN104347352A (en) * | 2013-07-31 | 2015-02-11 | 细美事有限公司 | Apparatus and method for treating substrate |
| CN104347352B (en) * | 2013-07-31 | 2018-05-29 | 细美事有限公司 | A kind of substrate board treatment and substrate processing method using same |
| CN106542859A (en) * | 2016-09-22 | 2017-03-29 | 山东润金农林科技有限公司 | Preparation method of chicken manure fermented fertilizer with high fertilizer utilization rate for apple planting |
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| KR20050001373A (en) | 2005-01-06 |
| JP2005019720A (en) | 2005-01-20 |
| CN100405544C (en) | 2008-07-23 |
| TW200503072A (en) | 2005-01-16 |
| JP4043410B2 (en) | 2008-02-06 |
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