CN1548970A - pixel measuring method - Google Patents
pixel measuring method Download PDFInfo
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- CN1548970A CN1548970A CNA031306667A CN03130666A CN1548970A CN 1548970 A CN1548970 A CN 1548970A CN A031306667 A CNA031306667 A CN A031306667A CN 03130666 A CN03130666 A CN 03130666A CN 1548970 A CN1548970 A CN 1548970A
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- pixel
- electronic component
- measuring method
- electric capacity
- light
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- 238000000034 method Methods 0.000 title claims description 39
- 230000009021 linear effect Effects 0.000 claims description 25
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 claims description 5
- 229910052751 metal Inorganic materials 0.000 claims description 3
- 239000002184 metal Substances 0.000 claims description 3
- 238000007599 discharging Methods 0.000 abstract description 4
- 238000000691 measurement method Methods 0.000 abstract 3
- 239000003990 capacitor Substances 0.000 abstract 2
- 238000010586 diagram Methods 0.000 description 8
- 239000011159 matrix material Substances 0.000 description 8
- 238000005516 engineering process Methods 0.000 description 3
- 239000010408 film Substances 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 230000000007 visual effect Effects 0.000 description 2
- HPNSNYBUADCFDR-UHFFFAOYSA-N chromafenozide Chemical compound CC1=CC(C)=CC(C(=O)N(NC(=O)C=2C(=C3CCCOC3=CC=2)C)C(C)(C)C)=C1 HPNSNYBUADCFDR-UHFFFAOYSA-N 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 239000002932 luster Substances 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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- Electroluminescent Light Sources (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
Abstract
A pixel measurement method. The pixel measurement method is suitable for measuring pixels which are not coated with light-emitting elements in a display. The pixel measurement method is to form a capacitor between the open end of the electronic element connected to one pole of the light-emitting element and the added common line (or the original scan line or data line in the display) in the pixel without the light-emitting element. Then, the electronic element connected to the light-emitting element can be measured by charging and discharging the capacitor, and thus the present invention can measure all the elements in the pixel.
Description
Technical field
The present invention is relevant for a kind of pixel measuring method, and particularly relevant for a kind of pixel measuring method of measuring the pixel that does not apply light-emitting component in the display.
Background technology
The human dynamic image that can see the earliest is the film of documentary film pattern.Afterwards, the invention of cathode-ray tube (CRT) (Cathode Ray Tube is called for short CRT) successfully derives business-like televisor, and becomes the electrical home appliances of each family's indispensability.Along with development of science and technology, the application of CRT expands to the desktop monitor in the computer industry again, and makes CRT scene many decades nearly.But the made all types of displays of CRT all face the problem of radiant rays, and because the structure of internal electron rifle, and make that display is bulky and take up space, so be unfavorable for thin type and lightweight.
Since above-mentioned problem, and make the researchist start to develop so-called flat-panel monitor (FlatPanel Display).This field comprises LCD (Liquid Crystal Display, abbreviation LCD), Field Emission Display (Field Emission Display, abbreviation FED), vacuum fluorescent display (Vacuum Fluorescent Display, abbreviation VFD), Organic Light Emitting Diode (Organic LightEmitting Diode, be called for short OLED) and plasma display device (Plasma Display Panel is called for short PDP).
Wherein, Organic Light Emitting Diode is called organic electro-luminescent display (OrganicElectroluminescence Display) again, and it is the element of self-luminosity, and is the dot matrix type display.Because the characteristic of OLED is DC low-voltage driving, high brightness, high-level efficiency, high-contrast and light, thin, and its luminous color and luster is by red (Red, abbreviation R), green (Green, be called for short G) and blue (Blue, being called for short B) three primary colors are to white degree of freedom height, so OLED is called the development priority of next novel flat-plate from generation to generation.The OLED technology is except having the frivolous and high definition of LCD concurrently, and LED active luminous, response speed is fast with advantage such as power saving cold light source outside, many advantages such as the visual angle is wide in addition, color contrast is effective and cost is low.Therefore, OLED can be widely used in mobile phone, digital camera, personal digital assistant (PDA) and even more large-area display.
From the viewpoint of type of drive, OLED can be divided into passive matrix (Passive Matrix) type of drive and active matrix (Active Matrix) type of drive two big kinds.The advantage of passive matrix formula OLED is that structure very simply and not needs to use thin film transistor (TFT) (Thin Film Transistor, be called for short TFT) drive, thereby cost is lower, but its shortcoming is the application that is not suitable for the high definition image quality, and, can produce that power consumption increases, component life reduces and problem that display performance is good etc. when large size panel develops.And the advantage of active matric OLED is except the demand that can be applicable to large-sized driven with active matrix mode, and its visual angle is wide, high brightness and the fast characteristic of response speed also are very important, but its cost can be slightly higher than passive matrix formula OLED.
Next please refer to Fig. 1, it is illustrated in the circuit diagram of the pixel that does not apply OLED in the known OLED display.As shown in Figure 1, do not applying OLED (102) before, pixel 10 comprises scanning linear 104, data line 106, switching transistor 108, driving transistors 110 and electric capacity 112.
Because the source electrode of driving transistors 110 is open circuit, so when measuring pixel 10, can not measure electric charge, voltage or the electric current of the driving transistors 110 of flowing through from the drain electrode of driving transistors 110.Thus, after pixel 10 must apply OLED (102) by the time, just can measure the whole elements in the pixel 10.Therefore, known pixel measuring method can apply OLED (102) before, measures the electronic component that is connected with OLED (102).
Summary of the invention
In view of this, the present invention proposes a kind of pixel measuring method.This pixel measuring method is in not applying the pixel of light-emitting component, at the open end of the electronic component of a utmost point that is connected in light-emitting component, and forms electric capacity between the bridging line that increases (or in the display original scanning linear or data line).Then,, can measure the electronic component that is connected with light-emitting component, so the present invention can measure the whole elements in the pixel via discharging and recharging of electric capacity.
For reaching above-mentioned and other purpose, the present invention proposes a kind of pixel measuring method.This pixel measuring method is applicable to the pixel of measuring in the display that does not apply light-emitting component.This display comprises several scanning linears and several data lines.This pixel comprises an electronic component.The open end of this electronic component is connected to a utmost point of light-emitting component.In this pixel measuring method, at first can in this pixel, increase by a bridging line.Then form an electric capacity, this electric capacity has first end and second end, and wherein first end is connected to this open end and this utmost point, and second end is connected to this bridging line.Then, can charge to this electric capacity when this electronic component conducting, close when this pixel and have no progeny, this electric capacity can discharge into the measuring junction of this electronic component via this electronic component, afterwards, can learn electric charge, voltage or the electric current of this electronic component of flowing through by measuring this measuring junction.
In a preferred embodiment of the invention, this electric capacity covers this bridging line with indium tin oxide (ITO) and forms.
In a preferred embodiment of the invention, this bridging line forms with metal.
In a preferred embodiment of the invention, this electronic component is a driving transistors.
In a preferred embodiment of the invention, light-emitting component is an Organic Light Emitting Diode.
In a preferred embodiment of the invention, this display is an organic electro-luminescent display.
The present invention also proposes a kind of pixel measuring method.This pixel measuring method is applicable to the pixel of measuring in the display that does not apply light-emitting component.This display comprises several scanning linears and several data lines.This pixel comprises an electronic component.The open end of this electronic component is connected to a utmost point of light-emitting component.In this pixel measuring method, at first can form an electric capacity, this electric capacity has first end and second end, and wherein first end is connected to this open end and this utmost point, and second end is connected to the scanning linear in these scanning linears.Then, when this electronic component conducting, can charge to this electric capacity.Next, have no progeny in this pixel pass, this electric capacity can discharge into the measuring junction of this electronic component via this electronic component.Afterwards, can learn electric charge, voltage or the electric current of this electronic component of flowing through by measuring this measuring junction.
The present invention also proposes a kind of pixel measuring method in addition.This pixel measuring method is applicable to the pixel of measuring in the display that does not apply light-emitting component.This display comprises several scanning linears and several data lines.This pixel comprises an electronic component, and the open end of this electronic component is connected to a utmost point of light-emitting component.In this pixel measuring method, at first can form an electric capacity, this electric capacity has first end and second end, and wherein first end is connected to this open end and this utmost point, and second end is connected to the data line in these data lines.Then, when this electronic component conducting, can charge to this electric capacity.Have no progeny when this pixel pass, this electric capacity can discharge into the measuring junction of this electronic component via this electronic component.Afterwards, can learn electric charge, voltage or the electric current of this electronic component of flowing through by measuring this measuring junction.
In sum, this pixel measuring method is in not applying the pixel of light-emitting component, at the open end of the electronic component of a utmost point that is connected in light-emitting component, and forms electric capacity between the bridging line that increases (or in the display original scanning linear or data line).Then,, can measure the electronic component that is connected with light-emitting component, so the present invention can measure the whole elements in the pixel via discharging and recharging of electric capacity.
For allowing above-mentioned and other purposes of the present invention, feature and advantage, can become apparent more, preferred embodiment cited below particularly, and conjunction with figs. are described below in detail:
Description of drawings
Fig. 1 represents the circuit diagram that does not apply an OLED pixel before in the known OLED display;
Fig. 2 represents the circuit diagram of the pixel that does not apply light-emitting component in according to one preferred embodiment of the present invention the display.
Fig. 3 represents the circuit diagram of the pixel that does not apply light-emitting component in the display of another preferred embodiment according to the present invention; And
Fig. 4 represents the circuit diagram of the pixel that does not apply light-emitting component in the display of the another preferred embodiment according to the present invention.
The drawing reference numeral explanation:
10,20,30,40: pixel
102：OLED
202: light-emitting component
104,204,302: scanning linear
106,206,402: data line
108,208: switching transistor
110,210: driving transistors
112,212,214: electric capacity
216: bridging line
Embodiment
Pixel measuring method of the present invention is applicable to the pixel of measuring in the display (for example being organic electro-luminescent display) that does not apply light-emitting component (for example being OLED), and wherein, this display comprises several scanning linears and several data lines.Please refer to Fig. 2, the circuit diagram of the pixel that does not apply light-emitting component in its expression display according to one preferred embodiment of the present invention.As shown in Figure 2, do not applying light-emitting component (202) before, pixel 20 comprises scanning linear 204, data line 206, switching transistor 208, driving transistors 210, electric capacity 212, electric capacity 214 and bridging line 216.The source electrode system of this driving transistors 210 is in open-circuit condition.
In this pixel measuring method, at first can in pixel 20, increase bridging line 216, this bridging line 216 can for example form with metal, then form electric capacity 214, wherein an end of electric capacity 214 is connected to the source electrode of driving transistors 210 and a utmost point of light-emitting component (for example being anodal), and the other end of electric capacity 214 is connected to bridging line 216.Electric capacity 214 can for example cover bridging line 214 with indium tin oxide (ITO) and form.Then, the voltage that is provided when scanning linear 204 makes switching transistor 208 conductings, and the voltage that provides of data line 206 is greater than the starting potential of driving transistors 210, and when making driving transistors 210 conductings, can charge to electric capacity 214.Have no progeny when pixel 20 passes, electric capacity 214 can discharge into the drain electrode (being measuring junction) of driving transistors 210 via driving transistors 210.Afterwards, can learn electric charge, voltage or the electric current of the driving transistors 210 of flowing through by the drain electrode of measuring driving transistors 210.
Next please refer to Fig. 3, the circuit diagram of the pixel that does not apply light-emitting component in the display of its expression another preferred embodiment according to the present invention.By Fig. 3 and Fig. 2 more as can be known, pixel 30 and pixel 20 much at one, so only just both difference parts do explanation.Both difference parts only are that Fig. 3 does not increase bridging line, but the other end of electric capacity 214 is coupled to scanning linear 302 in the display.In the preferred embodiment,, also can be couple to scanning linear 204 or other scanning linear though the other end of electric capacity 214 is connected to the scanning linear 302 in the display.
Next please refer to Fig. 4, the circuit diagram of the pixel that does not apply light-emitting component in the display of its expression another preferred embodiment according to the present invention.By Fig. 4 and Fig. 2 more as can be known, pixel 40 and pixel 20 much at one, so only just both difference parts do explanation.Both difference parts only are that Fig. 4 does not increase bridging line, but the other end of electric capacity 214 is coupled to data line 402 in the display.In the preferred embodiment,, also can be couple to data line 206 or other data line though the other end of electric capacity 214 is connected to the data line 402 in the display.
From the above, feature of the present invention is the end that the open end of electronic component that will be connected in a utmost point of the light-emitting component that does not apply is connected to electric capacity, and the other end of electric capacity can be connected to a shared line of increase, or arbitrary scanning linear or arbitrary data line.Moreover, owing to can measure electric charge, voltage or the electric current of electronic component at the measuring junction of electronic component, therefore the measured value that each pixel in the display can be measured and the average value measured of whole front panel compare, and can know the usefulness of the element in each pixel.
In sum, this pixel measuring method is in not applying the pixel of light-emitting component, at the open end of the electronic component of a utmost point that is connected in light-emitting component, and forms electric capacity between the bridging line that increases (or in the display original scanning linear or data line).Then, can measure the electronic component that is connected with light-emitting component, so the present invention can measure the whole elements in the pixel via discharging and recharging of electric capacity.
Though the present invention with preferred embodiment openly as above; right its is not in order to limit the present invention; any those skilled in the art; under the situation that does not break away from the spirit and scope of the present invention; can carry out various changes and modification, so protection scope of the present invention is as the criterion with the claim institute restricted portion that is proposed.
Claims (13)
1. pixel measuring method, this pixel measuring method is applicable to a pixel that does not apply a light-emitting component of measuring in the display, this display comprises many scanning linears and many data lines, this pixel comprises an electronic component, one open end of this electronic component is connected to a utmost point of this light-emitting component, and this pixel measuring method comprises the following steps:
In this pixel, increase by a bridging line;
Form an electric capacity, this electric capacity has one first end and one second end, and wherein this first end is connected to this open end and this utmost point, and this second end is connected to this bridging line;
When this electronic component conducting, this electric capacity is charged;
Have no progeny in this pixel pass, this electric capacity can discharge into a measuring junction of this electronic component via this electronic component; And
Measure this measuring junction.
2. pixel measuring method as claimed in claim 1, wherein this electric capacity covers this bridging line with an indium tin oxide and forms.
3. pixel measuring method as claimed in claim 1, wherein this bridging line forms with a metal.
4. pixel measuring method as claimed in claim 1, wherein this electronic component is a driving transistors.
5. pixel measuring method as claimed in claim 1, wherein this light-emitting component is an Organic Light Emitting Diode.
6. pixel measuring method, this pixel measuring method is applicable to a pixel that does not apply a light-emitting component of measuring in the display, this display comprises many scanning linears and many data lines, this pixel comprises an electronic component, one open end of this electronic component is connected to a utmost point of this light-emitting component, and this pixel measuring method comprises the following steps:
Form an electric capacity, this electric capacity has one first end and one second end, and wherein this first end is connected to this open end and this utmost point, and this second end is connected to the scanning linear in those scanning linears;
When this electronic component conducting, this electric capacity is charged;
Have no progeny in this pixel pass, this electric capacity can discharge into a measuring junction of this electronic component via this electronic component; And
Measure this measuring junction.
7. pixel measuring method as claimed in claim 6, wherein this electric capacity covers this scanning linear with an indium tin oxide and forms.
8. pixel measuring method as claimed in claim 6, wherein this electronic component is a driving transistors.
9. pixel measuring method as claimed in claim 6, wherein this light-emitting component is an Organic Light Emitting Diode.
10. pixel measuring method, this pixel measuring method is applicable to a pixel that does not apply a light-emitting component of measuring in this display, this display comprises many scanning linears and many data lines, this pixel comprises an electronic component, one open end of this electronic component is connected to a utmost point of this light-emitting component, and this pixel measuring method comprises the following steps:
Form an electric capacity, this electric capacity has one first end and one second end, and wherein this first end is connected to this open end and this utmost point, and this second end is connected to the data line in those data lines;
When this electronic component conducting, this electric capacity is charged;
Have no progeny in this pixel pass, this electric capacity can discharge into a measuring junction of this electronic component via this electronic component; And
Measure this measuring junction.
11. pixel measuring method as claimed in claim 10, wherein this electric capacity covers this scanning linear with an indium tin oxide and forms.
12. pixel measuring method as claimed in claim 10, wherein this electronic component is a driving transistors.
13. pixel measuring method as claimed in claim 10, wherein this light-emitting component is an Organic Light Emitting Diode.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB031306667A CN100562755C (en) | 2003-05-07 | 2003-05-07 | pixel measuring method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB031306667A CN100562755C (en) | 2003-05-07 | 2003-05-07 | pixel measuring method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1548970A true CN1548970A (en) | 2004-11-24 |
| CN100562755C CN100562755C (en) | 2009-11-25 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB031306667A Expired - Fee Related CN100562755C (en) | 2003-05-07 | 2003-05-07 | pixel measuring method |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108646943A (en) * | 2018-03-13 | 2018-10-12 | 友达光电股份有限公司 | Touch control display device |
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2003
- 2003-05-07 CN CNB031306667A patent/CN100562755C/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108646943A (en) * | 2018-03-13 | 2018-10-12 | 友达光电股份有限公司 | Touch control display device |
| CN108646943B (en) * | 2018-03-13 | 2021-04-09 | 友达光电股份有限公司 | Touch control display device |
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| Publication number | Publication date |
|---|---|
| CN100562755C (en) | 2009-11-25 |
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Granted publication date: 20091125 Termination date: 20180507 |