CN1330368A - Film layer of recordable optical recording medium and its matching material - Google Patents

Abstract

A recordable optical recording medium with full optical range, high density, high resolution, high speed and high compatibility is composed of a transparent layer and a reflecting layer which react to form alloy or compound when they are heated by the irradiation of recording light, and a semi-transparent reflecting region formed by the reaction range of alloy or compound, which can (1) decrease the thickness of transparent layer and change the optical path difference to change the constructive interference or progressive destructive interference, (2) change the optical constant (n & k) to change the light reflection intensity and/or (3) change the polarizing angle.

Description

Film layer of recordable optical recording medium and its matching material

The invention relates to an optical recording medium, in particular to a film layer of a recordable optical recording medium with full optical range, high density, high resolution, high multiple speed and high compatibility and its matching material.

A recordable optical recording medium, which combines recording convenience and long-term preservation. It can be used in electronic publishing, multimedia information recording, or a large number of backups that require long-term preservation. Recently, it has occupied a considerable media market and is still growing.

The structure of a general recordable optical recording medium includes a substrate, a reactive layer, a reflective layer and a protective layer. The main parts for recording signals are the reaction layer and the reflective layer. However, most of the reactive layers of recordable optical recording media are made of organic dyes. Using organic dyes as recording materials has the following disadvantages:

1. It is easy to deteriorate when exposed to light, and the storage life of the product (before recording) is obviously short.

2. The potential for development in the direction of high density is not high.

3. The absorption wavelength is narrow and must be recorded at a specific wavelength, so the compatibility of the applicable recording system is low.

4. Organic dyes need to be manufactured with chemical substances such as organic solvents, causing environmental problems.

In the known technology, the optical recording medium uses inorganic materials as the recording film layer, such as Japanese JP Hei 6-171236 patent, uses aluminum or gold as the reflective layer, and cooperates with the reaction layer composed of germanium. Its reflectivity can be increased by up to 70%. But its chromatic aberration modulation method can only be up modulation, but not down modulation, which is incompatible with the current modulation method of optical recording media and limits its application. As another example, in US Patent No. 5,458,941, gold/chrome, gold/cobalt or aluminum/titanium is used as the reflective layer, and a semiconductor material is used as the reflective layer. The reflective layer is placed on the incident surface of the recording light source to increase the reflection intensity, but the use efficiency of the recording light source is low, and a higher power of the recording light source is required to record. Therefore, the practicality of the optical recording medium is hindered. The above two inorganic material-based optical recording media and dye-based optical recording media cannot meet the demands of high density and full optical range in the future. In addition, as disclosed in Japanese patent application 08-274809, a semiconductor material is used as a recording layer, and a metal reflective layer is provided (the matching condition is that semiconductor/metal contact crystals can be produced). Because the amorphous semiconductor coating (reactive layer, such as silicon) will crystallize at the semiconductor/metal (reflective layer, such as silicon) interface, resulting in modulation of light reflection intensity. Since only the amorphous/crystalline transition is used as signal modulation, the range of signal modulation is relatively limited, thereby limiting the compatibility with disc specifications.

The object of the present invention is to provide a film layer and matching material of a recordable optical recording medium with full optical range (all visible light ranges), high density, high resolution, high speed and high compatibility. It includes at least one substrate, a transparent layer and a reflective layer. When the transparent layer and the reflective layer of the film layer of the optical recording medium are irradiated and heated by the recording light, they react to form an alloy/compound, and the reaction range forms a semi-transparent reflective area. The transreflective region causes the following effects: (1) reduces the thickness of the effective transparent layer, changes the optical path difference, and causes changes in constructive or destructive interference; and/or (2) changes the optical constant (n&k), thereby changing the light reflection intensity; and/or (3) changing the simulated aurora angle. The aforementioned at least one effect constitutes the color difference modulation before/after recording on the optical recording medium.

The reasons for the film layer and matching material of the recordable optical recording medium of the present invention are (1) full optical range, (2) high density, (3) high resolution, (4) high speed and (5) high compatibility as follows:

(1) The metal or its alloy material of the reflective layer has a certain degree of reflection intensity in the visible wavelength range, and can produce a semi-transparent reflection area with the transparent layer in the entire light range of visible light, so as to achieve an appropriate recording contrast, On the contrary, the applicable recording light wavelength range is large;

(2) Combined with a high thermal conductivity reflective layer, the size of the semi-transparent reflective area can be reduced, so the recording density can be increased;

(3) The rapid heat dissipation through the reflective layer with high thermal conductivity can accelerate the reaction, so the recording speed can be increased;

(4) There is an obvious critical energy density requirement for the generation of the semi-transparent reflection area, resulting in a clear and obvious perimeter of the semi-transparent reflection area, resulting in high-resolution records;

(5) The formation of the transflective region is an exothermic reaction, which can appropriately reduce the power required by the recording light source, and the optical recording medium can be compatible with different specifications of the optical recording medium only with a slight adjustment.

The film layer of the recordable optical recording medium of the present invention and its matching material have the following effects:

1. The material provided by the present invention has a wide range of recording light wavelengths, which can be applied to the current CD disc system, or the DVD system in promotion, or the recording medium system of the future Blu-ray wavelength.

2. The present invention combines a highly thermally conductive alloy layer and an exothermic alloy reaction, so that the recording point can be small and the reaction speed is fast. A high-density optical recording medium suitable for high-speed recording.

3. The optical disc format film system provided by the present invention can have the same modulation specification as the current optical disc, or the opposite to the current optical disc modulation specification.

4. The inorganic material used in the present invention needs to exceed a specific optical drive intensity to produce a reaction, so the sensitivity to general light is low, the light resistance is stable, and the optical disc is not easy to deteriorate.

5. The present invention uses inorganic materials, which can avoid the environmental pollution problem of using organic solvents.

Hereinafter, an embodiment of the film layer and matching material of a recordable optical recording medium with full optical range, high density, high resolution, high multiple speed and high compatibility according to the present invention will be described with reference to the accompanying drawings.

FIG. 1A is a schematic structural view of the film layer (with heat dissipation layer) of the optical recording medium of the present invention.

FIG. 1B is a schematic structural view of the film layer of the optical recording medium (excluding the heat dissipation layer) of the present invention.

FIG. 2A is a schematic view of the structure change of the optical recording medium film layer (with heat dissipation layer) after writing in the present invention.

FIG. 2B is a schematic diagram of the structural change of the film layer (excluding the heat dissipation layer) of the optical recording medium of the present invention after writing.

Fig. 3 is after the static test of embodiment 1, the photo obtained by optical microscopic observation.

Fig. 4 is after the static test of embodiment 2, the photo obtained by optical microscopic observation.

Fig. 5 is after static test of embodiment 3, the photograph obtained by optical microscopic observation.

Symbol Description:

10-substrate; 20-first heat dissipation layer; 25-effective transparent layer; 30-transparent layer; 35-transflective region; 40-second heat dissipation layer;

In order to make the above and other objectives, features, and changes of the present invention more comprehensible, some preferred embodiments are specifically listed below, and are described in detail as follows in conjunction with the accompanying drawings.

preferred embodiment

The manufacturing procedure of the recordable optical recording medium film layer of the embodiment of the present invention is as follows:

Optical disc substrate → (or heat dissipation layer deposition) → transparent layer deposition → reflective layer deposition → (or heat dissipation layer deposition) → protective layer coating.

At the beginning of the manufacturing process, a substrate 10 is firstly prepared, and the substrate should be glass or polycarbonate. Secondly, a first heat dissipation layer 20 is formed on the substrate 10 . After that, a transparent layer 30 is formed on the first heat dissipation layer 20, the thickness of this transparent layer is between 5 and 500 nm, and its material can be made of silicon, germanium, gallium phosphide, indium phosphide, gallium arsenide, indium arsenide , Gallium Antimonide, Indium Tin Oxide, Tin Oxide, Indium Oxide, Zinc Oxide, Titanium Oxide, Antimony Tin Oxide and alloys or compounds of the preceding materials.

Next, a reflective layer 40 is formed on the transparent layer 30, the reflective thickness is between 1 and 500nm, and its material can be made of silver, aluminum, gold, platinum, copper, indium, tin, iridium, yttrium, tantalum, and other metal Alloys and combinations of the above metals are selected. The film thicknesses of the transparent layer 30 and the reflective layer 40 are matched with the materials. When heated by the recording light of any wavelength within the visible light wavelength range, the reaction forms an alloy/compound, and the reaction range forms a semi-transparent reflection area 35, as shown in Figure 2A and As shown in 2B, the transflective area is used as the recording point of the optical recording medium, and has an optical signal contrast modulation mechanism. The optical signal contrast modulation mechanism is for, when the writing light source 70 is any wavelength within the visible light wavelength range, the transflective region generated at least includes one or more of the following signal modulation effects:

(1) Due to the alloy/compound effect, the optical constant (n&k) changes in this transflective area, which changes the light reflection intensity;

(2) The transflective area reduces the thickness of the effective transparent layer, so that the optical path difference between the incident light and the reflected light changes, resulting in the shift of constructive interference or destructive interference:

(3) Due to the alloy/compound effect, the transflective area changes the angle of the polarized light, thereby changing the intensity of the signal read through the polarized light.

Furthermore, a third heat dissipation layer 50 is formed on the reflective layer 40 . Finally, a protection layer 60 is formed on the second heat dissipation layer 50. The protection layer 60 can be formed by spin coating. Its structure is shown in Figures 1A and 1B. Figure 1A is a schematic diagram of the structure with a heat dissipation layer. FIG. 1B is a schematic diagram of the structure without the heat dissipation layer.

The reading number modulation method of the film layer of the recordable optical recording medium in the embodiment of the present invention can adjust the thickness of the effective transparent layer 25 of the transparent layer 30 . When the thickness exceeds a specific thickness or is lower than another specific thickness, the read signal of the optical recording medium can be a modulation method of high reflection intensity before recording/low reflection intensity after recording, or low reflection before recording Intensity/recorded high reflection intensity two modulation methods.

Example 1

The structure of the test piece of Example 1 is shown in FIGS. 1A and 1B . The substrate 10 is transparent glass, and the transparent layer 30 is silicon, which is sputtered on the substrate for 10 minutes with a power of 300W for 30 minutes. The reflective layer 40 is a gold-silicon alloy, which is sputtered on the transparent layer 30, wherein the gold is sputtered with 260W, and the silicon is sputtered with a power of 210W, and the sputtering time is 30 minutes.

The static test uses a laser beam with a wavelength of 780nm, a laser beam composed of a DC 21mA (for reading signals) and a 1-5V pulse (for writing signals, the shortest pulse time is 10ns) to irradiate the recording film layer , to measure the change in its reflection intensity. Its optical system is the same as that of CD-ROM, but the diameter of its laser beam is larger than that of CD system.

Fig. 3 is the photograph obtained by optical microscope observation static test, can be observed from test result, when direct current 21mA and alternating current 3V, to the pulse time of 10ns still visible transflective region 35 (about 2ms size) clearly, transflective The contrast ratio of reflection intensity between area 35 and unrecorded (contrast ratio = (I _o - T _wr )/I _o × 100%; I _o is the reflection intensity before recording; T _wr is the reflection intensity after recording) reaches 85%. Test a commercially available recordable CD-R under the same conditions, and the size of the recording spot is about 16mm. The contrast ratio of the recorded point to the reflection intensity before recording is 50%.

Example 2

The structure of the test piece of Example 2 is shown in FIGS. 1A and 1B . The substrate 10 is transparent glass, and the transparent layer 30 is silicon, which is sputtered on the substrate 10 with a power of 300W. The reflective layer 40 is a gold-silicon alloy, which is sputtered on the transparent layer 30, wherein the gold is sputtered at 260W, and the silicon is sputtered with a power of 210W. The sputtering time of the transparent layer of the test piece of embodiment 2 was 10 minutes, and the sputtering time of the reflective layer was 30 minutes.

The static test is the same as in Example 1. Fig. 4 is the photograph obtained by observing the static test with an optical microscope. From the observation of the test results, it can be seen that when the transflective region 35 of all pulse times above DC 21mA and AC 3V is a reflection that the reflection intensity becomes stronger, the maximum contrast ratio can be obtained. up to -45%. Wherein the minimum recording point of the transflective area 35 can reach 2.0 mm.

Implementation 3

The structure of the test piece of embodiment 3 is as shown in Figure 1A and 1B, and substrate 10 is transparent glass, and transparent layer 30 is silicon, is sputtered on substrate 10 with the power of 300W (sputtering time is respectively 5,10,15 , 20, 25, 30, 35, and 40 minutes). The reflective layer 40 is gold-silicon alloy sputtered on the transparent layer 30, wherein gold is sputtered with 50-500W (sputtering power is respectively 50, 110, 180, 240, 300, 370, 440, and 500W), and silicon is sputtered with 210W. power sputtering. No assurance layer is added on top of it. The static test is the same as in Example 1.

Based on the reflection intensity measurement results of all the recording film layers in this embodiment, the reflection intensity in the wavelength range of 300-900 nm is between 5-90%. Table 1 shows the highest reflection intensity and the lowest reflection intensity of all the recording film layers in this embodiment at the recording light wavelengths of 780nm, 650nm and 400nm. It can be seen from Table 1 that the optical recording medium of the present invention maintains a relatively large reflection intensity in the visible light range.

Table 1

Recording light wavelength (nm) 780 650 400

Maximum reflection intensity (%) 55 62 37

Minimum reflection intensity (%) 8 14 24

Table 2 shows the arrangement and combination of reflection intensities of all the film layers of this embodiment combined at light wavelengths of 780nm, 650nm, and 400nm, which can achieve the maximum front-to-back contrast ratio. As can be seen from Table 2, the optical recording medium of the present invention has a considerable contrast ratio in the visible light domain when it is the same as or opposite to the current optical disc modulation specification (the positive contrast is the same as the current optical disc modulation specification or reversed). Contrast is opposite to the current optical disc modulation specification).

Table 2

Recording light wavelength (nm) 780 650 400

Positive contrast (%) 85 80 50

Inverse contrast (%) -90 -100 -50

Example 4

The structure of the test piece of Example 4 is shown in FIGS. 1A and 1B . The substrate 10 is polycarbonate, and the transparent layer 30 is silicon, which is sputtered on the substrate 10 with a power of 300W. The reflective layer 40 is made of gold and silicon sputtered on the transparent layer 30 , wherein gold is sputtered with 260W power and silicon is sputtered with 210W power. The sputtering time of each film layer of the test piece of this embodiment is the same as that of the test piece machine of embodiment 1.

The static test is the same as in Example 1, and Fig. 5 is a photo obtained by observing the static test with an optical microscope. From the test results, it can be seen that the semi-transparent reflection area 35 at all times above DC 21mA and AC 2V is the reflection intensity becomes lower reaction. The size of the transflective area 35 in the AC 2V time method is less than 1.5 mm, and the contrast ratio before and after recording is between 51-70%. Among them, the smallest area is below 1.5mm (writing pulse time 10ns), and the contrast ratio before and after recording can reach 51%. When the AC is 3V, the maximum contrast ratio of the transflective area 35 can reach 100%. Among them, the minimum recording point of the transflective area 35 can reach 2.0M.

Example 5

The structure of the test piece of Example 5 is shown in FIGS. 1A and 1B . The substrate 10 is transparent glass, and the transparent layer 30 is indium tin oxide with a thickness of about 50 nm. The reflective layer 40 is tin sputtered on the transparent layer 30 .

The static test is the same as in Example 1. From the test results, it can be seen that the transflective region 35 at all times when the direct current is 27mA and the alternating current is above 1V is a response that the reflection intensity becomes low. The size of the transflective area 35 is below 1.5mm when the AC is 2V, and the contrast ratio before and after recording is between 30-60%. The minimum area is below 1.5mm (writing time 10ns), and the contrast ratio before and after recording can reach 48%. When the AC is 3V, the maximum contrast ratio of the transflective area 35 can reach 60%.

Although the present invention has been disclosed above through several preferred embodiments, such disclosure is not intended to limit the present invention. Under the premise of not departing from the spirit and scope of the present invention, those skilled in the art can make changes and amendments, so the protection scope of the present invention is determined by the appended claims.

Claims (13)

1, the recordable optical record medium-membrane of a kind of full light territory, high density, high-res, high power speed and high-compatibility comprises at least:

One substrate;

One hyaline layer is formed on this substrate;

One reflection horizon, be formed on this hyaline layer, wherein, the thicknesses of layers in this hyaline layer and this reflection horizon and match materials, when the irradiation of the recording light of any wavelength was heated in being subjected to visible wavelength range, reaction formed alloy/compound, and its reaction range forms a semi-transparent echo area, this semi-transparent reflection district has light signal contrast modulation scheme as the measuring point of recording medium; And

One guarantees layer, is formed on this reflection horizon.

2, the recordable optical record medium-membrane of full light as claimed in claim 1 territory, high density, high-res, high power speed and high-compatibility, wherein this light signal contrast modulation scheme can for: when writing light source is in the visible wavelength range during any wavelength, and this semi-transparent reflection district of generation comprises more than one in the following modulating signal effect at least:

(1) this semi-transparent reflection district is because of alloy/compound effect, optical constant (n﹠amp; K) change, and change the light reflection strength;

(2) this semi-transparent reflection district reduces the thickness of this effective hyaline layer, and incident light and catoptrical optical path difference are changed, and causes the skew of constructive interference or destructive interference:

(3) this semi-transparent reflection district changes the polarized light angle because of alloy/compound effect, sees through signal intensity that polarized light reads and change.

3, the recordable optical record medium-membrane of full light as claimed in claim 1 territory, high density, high-res, high power speed and high-compatibility, wherein this substrate is to be glass or poly-carbon ester.

4, the recordable optical record medium-membrane of full light as claimed in claim 1 territory, high density, high-res, high power speed and high-compatibility, wherein the thickness of this hyaline layer is between 5 to 500nm, and its material is by selecting for use in silicon, germanium, gallium phosphide, phosphatization are pluged with molten metal, gallium arsenide, arsenicization are pluged with molten metal, zinc antimonide, titanium dioxide, antimony tin oxide and prostatitis material are formed alloy or the compound.

5, the recordable optical record medium-membrane of full light as claimed in claim 1 territory, high density, high-res, high power speed and high-compatibility, this reflection horizon wherein, thickness is between 1 to 500nm, and its material is by selecting for use in silicon, germanium, gallium phosphide, phosphatization are pluged with molten metal, gallium arsenide, arsenicization are pluged with molten metal, zinc antimonide, titanium dioxide, antimony tin oxide and prostatitis material are formed alloy or the compound.

6, the recordable optical record medium-membrane of full light as claimed in claim 1 territory, high density, high-res, high power speed and high-compatibility wherein further is included between this substrate and the hyaline layer or between this reflection horizon and this assurance layer and forms a heat dissipating layer.

7, the recordable optical record medium-membrane of full light as claimed in claim 1 territory, high density, high-res, high power speed and high-compatibility, the modulating signal mode that reads of this optical recording media wherein, can be via the thickness of adjusting hyaline layer:

When thickness surpasses a specific thicknesses or is lower than another specific thick timing, this optical recording media read signal, can be the modulation mode of low reflection strength behind the high reflex strength/record before the record, or the two kinds of modulation modes of high reflex strength behind the preceding low reflection strength/record of record.

8, the recordable optical record medium-membrane of a kind of full light territory, high density, high-res, high power speed and high-compatibility comprises at least:

One substrate;

One hyaline layer forms on this substrate of what;

One reflection horizon, be split on this hyaline layer of what, wherein, the thicknesses of layers in this hyaline layer and this reflection horizon and match materials, when the irradiation of the recording light of any wavelength was heated in being subjected to visible wavelength range, reaction formed alloy/compound, its reaction range forms a semi-transparent echo area, this semi-transparent reflection district has light signal people contrast modulation scheme as the measuring point of optical recording media, comprises in the following modulating signal effect more than one at least:

(1) this semi-transparent reflection district is because of alloy/compound effect, optical constant (n﹠amp; K) change, and change the light reflection strength,

(2) this semi-transparent reflection district reduces the thickness of this effective hyaline layer, and incident light and catoptrical optical path difference are changed, and causes the skew of constructive interference or destructive interference,

(3) this semi-transparent reflection district changes the polarized light angle because of alloy/compound effect, sees through signal intensity that polarisation reads and change; And one guarantee layer, is formed on this reflection horizon.

9, method as claimed in claim 8, wherein this substrate is to be glass or poly-carbon ester.

10, method as claimed in claim 8, this hyaline layer wherein, thickness is between 5 to 500nm, and its material is by selecting for use in silicon, germanium, gallium phosphide, phosphatization are pluged with molten metal, gallium arsenide, arsenicization are pluged with molten metal, tin-oxide is pluged with molten metal, pluged with molten metal to gallium antimonide, antimonyization, tin oxide, oxidation are pluged with molten metal, zinc paste, titanium dioxide, antimony tin oxygen personage and prostatitis material are formed alloy or the compound.

11, method as claimed in claim 8, wherein the thickness in this reflection horizon is between 1 to 500nm, and its material is to select for use in the combination by silver, aluminium, gold, platinum, copper, tin, iridium, tantalum, prostatitis metal alloy and above-mentioned metal.

12, method as claimed in claim 8 wherein more is included between this substrate and the hyaline layer or between this reflection horizon and this assurance layer and forms a heat dissipating layer.

13, method as claimed in claim 8, the modulating signal mode that reads of this optical recording media wherein, can be via the thickness of adjusting hyaline layer: when thickness surpasses a specific thicknesses or is lower than another specific thicknesses, this optical recording media read signal, can be the modulation mode of low reflection strength behind the high reflex strength/record before the record, or the two kinds of modulation modes of high reflex strength behind the preceding low reflection strength/record of record.

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