CN1308655C - Self-scanning projection measuring device for two-dimensional configuration outline - Google Patents
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Abstract
本发明公开了一种二维外形轮廓自扫描投影测量装置,它包括依次位于同一光路上的激光器、扩束镜、光缝隙、柱面镜组件、CCD和控制器,光缝隙位于光缝隙直线扫描器上,并由其驱动沿X向运动;光缝隙的长度大于被测的几何形体截面Y向的宽度,其缝宽小于X向的测量分辨率;柱面镜组件由柱面镜、或柱面镜和成像透镜组构成,控制器用于运动控制和测量信号的采集和处理。本发明长方向(X)的最小测量分辨率为20μm、宽方向(Y)的最小测量分辨率为1μm,而且被测对象与测量系统没有相对运动,即没有运动误差。由于运动件的质量很小,其扫描的工作极限频率大于200Hz。本发明具有光路短、简单和光噪声小的特点,且还具有结构简单、制造简便和稳定性好的特点。
The invention discloses a two-dimensional profile self-scanning projection measurement device, which includes a laser, a beam expander, an optical slit, a cylindrical mirror assembly, a CCD and a controller which are sequentially located on the same optical path, and the optical slit is located on the optical slit for linear scanning and driven by it to move along the X direction; the length of the optical slit is greater than the width of the measured geometric body section in the Y direction, and its slit width is smaller than the measurement resolution in the X direction; the cylindrical mirror assembly consists of a cylindrical mirror, or a cylinder It consists of a mirror and an imaging lens group, and the controller is used for motion control and acquisition and processing of measurement signals. The minimum measurement resolution in the long direction (X) of the present invention is 20 μm, and the minimum measurement resolution in the width direction (Y) is 1 μm, and there is no relative motion between the measured object and the measurement system, that is, there is no motion error. Because the quality of the moving parts is very small, the working limit frequency of its scanning is greater than 200Hz. The invention has the characteristics of short optical path, simplicity and low optical noise, and also has the characteristics of simple structure, convenient manufacture and good stability.
Description
技术领域technical field
本发明涉及一种投影测量装置,具体涉及一种背投平行光的不同长、宽方向测量分辨率的二维外形轮廓自扫描投影测量装置。The invention relates to a projection measurement device, in particular to a two-dimensional profile self-scanning projection measurement device with different length and width direction measurement resolutions for back-projected parallel light.
背景技术Background technique
二维轮廓光学扫描装置作为获取二维几何形状的一种有力的投影成像测量工具,在几何形状测量研究中获得广泛应用。近年来学者们对此技术进行了大量研究,一直以来主要以同样的长、宽方向测量分辨率的二维外形轮廓扫描装置为主。As a powerful projection imaging measurement tool for obtaining two-dimensional geometric shapes, the two-dimensional profile optical scanning device has been widely used in geometric shape measurement research. In recent years, scholars have conducted a lot of research on this technology, and have been mainly focusing on two-dimensional contour scanning devices with the same measurement resolution in the length and width directions.
在“车灯接触片检测方法”(见《光学仪器》,1998,20(2):3-7)一文中提出了一种典型的二维外形轮廓的投影成像测量方法。其特点是以面阵CCD(电荷耦合器件)为传感器、同样的长、宽方向测量分辨率,有标定误差。这种测量技术效果显著,但当被测对象的长、宽方向的尺寸的比很大(>10)且长、宽方向的测量分辨率要求不同(比率>5)时,它的测量效果显著变差。A typical two-dimensional profile projection imaging measurement method is proposed in the article "Detection Method of Car Lamp Contact Sheet" (see "Optical Instruments", 1998, 20(2): 3-7). It is characterized by using an area array CCD (charge-coupled device) as the sensor, the same measurement resolution in the length and width directions, and there is a calibration error. This measurement technique is effective, but when the ratio of the length and width of the measured object is large (>10) and the measurement resolution requirements of the length and width are different (ratio>5), its measurement effect is significant worse.
在“火车车轮踏面磨损量识别研究”(见《华中理工大学学报》,2000,28(7):51-53)一文中介绍了一种扫描式二维外形轮廓的投影成像测量方法。它采用线阵CCD图像传感器,被测对象相对测量系统运动来进行二维外形轮廓的测量。它的系统结构大,有运动误差。In the article "Recognition of Wear Amount of Train Wheel Tread" (see "Journal of Huazhong University of Science and Technology", 2000, 28(7): 51-53), a scanning projection imaging measurement method of two-dimensional contour is introduced. It uses a linear array CCD image sensor, and the measured object moves relative to the measuring system to measure the two-dimensional shape. Its system structure is large and has motion errors.
发明内容Contents of the invention
本发明的目的在于提供一种二维外形轮廓自扫描投影测量装置,该装置没有运动误差,结构小。The object of the present invention is to provide a two-dimensional profile self-scanning projection measurement device, which has no motion error and small structure.
本发明提供的一种二维外形轮廓自扫描投影测量装置,其特征在于:该装置包括依次位于同一光路上的激光器、扩束镜、光缝隙、柱面镜组件、CCD和控制器,光缝隙位于光缝隙直线扫描器上,并由其驱动沿X向运动;光缝隙的长度大于被测的几何形体截面Y向的宽度,其缝宽小于X向的测量分辨率;柱面镜组件为柱面镜、或由柱面镜和成像透镜组构成,控制器用于运动控制和测量信号的采集和处理。A two-dimensional profile self-scanning projection measurement device provided by the present invention is characterized in that the device includes a laser, a beam expander, an optical slit, a cylindrical mirror assembly, a CCD and a controller, and the optical slit is sequentially located on the same optical path. It is located on the optical slit linear scanner and driven by it to move along the X direction; the length of the optical slit is greater than the width of the measured geometric body section in the Y direction, and its slit width is smaller than the measurement resolution in the X direction; the cylindrical mirror assembly is a cylinder The surface mirror, or composed of a cylindrical mirror and an imaging lens group, the controller is used for motion control and acquisition and processing of measurement signals.
本发明采用一个背投射的大的准直激光束与光缝隙及其直线扫描器实现了被测的几何形体截面轮廓二维扫描。本发明利用光缝隙直线扫描器测量X方向的尺寸,利用光缝隙和CCD测量Y方向的尺寸,以此可解决被测对象的长、宽方向的尺寸的比很大(>10)且长、宽方向的测量分辨率可以不同(比率>5)的问题。与常规的二维扫描方法相比,本二维外形轮廓自扫描测量的长方向(X)的最小测量分辨率为20um、宽方向(Y)的最小测量分辨率为1um,而且被测对象与测量系统没有相对运动,即没有运动误差。由于运动件的质量很小,其扫描的工作极限频率大于200Hz。本发明具有光路短、简单和光噪声小的特点,且还具有结构简单、制造简便和稳定性好的特点。The invention adopts a back-projected large collimated laser beam, an optical slit and a linear scanner to realize the two-dimensional scanning of the section profile of the measured geometric body. The present invention uses an optical slit linear scanner to measure the size in the X direction, and uses an optical slit and a CCD to measure the size in the Y direction, so as to solve the problem that the ratio of the length and width dimensions of the measured object is large (>10) and long, The problem that the measurement resolution in the width direction can be different (ratio > 5). Compared with the conventional two-dimensional scanning method, the minimum measurement resolution of the self-scanning measurement of the two-dimensional shape profile in the long direction (X) is 20um, and the minimum measurement resolution in the width direction (Y) is 1um, and the measured object and The measuring system has no relative motion, ie no motion error. Because the quality of the moving parts is very small, the working limit frequency of its scanning is greater than 200Hz. The invention has the characteristics of short optical path, simplicity and low optical noise, and also has the characteristics of simple structure, convenient manufacture and good stability.
附图说明Description of drawings
图1为本发明的一种具体实施方式的结构示意图;Fig. 1 is the structural representation of a kind of specific embodiment of the present invention;
图2为本发明的另一种具体实施方式的结构示意图;Fig. 2 is a schematic structural view of another embodiment of the present invention;
图3为本发明的控制原理示意图。Fig. 3 is a schematic diagram of the control principle of the present invention.
具体实施方式Detailed ways
下面结合附图和实例对本发明作进一步详细的说明。Below in conjunction with accompanying drawing and example the present invention is described in further detail.
本发明定义直角坐标系为:垂直于光缝隙的方向为X(即长度方向);光缝隙的方向为Y(即宽度方向);背投平行光的方向为Z。The present invention defines a Cartesian coordinate system as follows: the direction perpendicular to the light slit is X (ie, the length direction); the direction of the light slit is Y (ie, the width direction); and the direction of the rear-projected parallel light is Z.
如图1所示,本发明包括依次位于同一光路上的激光器1、扩束镜2、光缝隙4、柱面镜组件6、CCD7和控制器8,光缝隙4位于光缝隙直线扫描器5上,被测几何形体3位于扩束镜2和光缝隙4之间。As shown in Fig. 1, the present invention comprises
光缝隙直线扫描器5用于驱动光缝隙4沿X向运动,光缝隙则自动获取了Y方向的尺寸信息。The optical slit
激光器1选用小功率的激光器。The
扩束镜2可采用单个扩束镜或由多个扩束镜在长度方向拼接而成,经扩束镜2扩束后的光束的长度应大于被测几何形体的长度。The beam expander 2 can be a single beam expander or a plurality of beam expanders spliced in the length direction, and the length of the beam expanded by the beam expander 2 should be greater than the length of the geometric object to be measured.
光缝隙4为长形缝隙,其长度大于被测的几何形体截面Y向的宽度,其缝宽小于X向的测量分辨率。The optical slit 4 is an elongated slit whose length is greater than the width of the measured geometric body section in the Y direction, and whose slit width is smaller than the measurement resolution in the X direction.
光缝隙直线扫描器5可以采用电驱动的机械装置,其运动的重复定位精度(包括XY平面内的偏转误差)小于X向的测量分辨率。The optical slit
柱面镜组件6由一个柱面镜和成像透镜组组成,当Y向成像比例为1∶1时,柱面镜组件6,可以只用一个柱面镜。The cylindrical lens assembly 6 is composed of a cylindrical lens and an imaging lens group. When the Y-direction imaging ratio is 1:1, only one cylindrical lens can be used in the cylindrical lens assembly 6 .
CCD7可以是线阵CCD或面阵CCD。The CCD7 may be a linear array CCD or an area array CCD.
控制器8用于运动控制和测量信号的采集和处理。首先控制器8向激光器1提供电源,并驱动光缝隙直线扫描器5及获得其位置信号。其次控制器8驱动CCD7,并获得Y向的信号。最后控制器8进行信号处理。The
激光器发射的激光束经扩束镜后,形成一个大的准直激光束并照射到被测几何形体,光源发出的光一部分被被测几何形体轮廓遮挡,另一部分则依次经光缝隙4、柱面镜组件6照射到CCD7上,形成了对应某一具体X坐标值处的被测几何形体截面轮廓的具体Y坐标值,这个具体Y坐标值对应CCD7的具体光敏单元,它由CCD7转化为光电信号输送给控制器8;同时控制器8记录对应的X坐标值。控制器8控制光缝隙直线扫描器5驱动光缝隙4沿X向运动就获得了被测的几何形体截面轮廓的对应所有具体X坐标值处的具体Y坐标值,控制器记录Y坐标值和对应的X坐标值,从而获得了被测的几何形体截面轮廓的X、y坐标值的集合,即数字化的被测的几何形体截面轮廓---二维外形轮廓。The laser beam emitted by the laser passes through the beam expander to form a large collimated laser beam and irradiates the measured geometric body. Part of the light emitted by the light source is blocked by the contour of the measured geometric body, and the other part passes through the light slit 4 and the column in turn. The mirror assembly 6 is irradiated on the CCD7 to form a specific Y coordinate value corresponding to the cross-sectional profile of the measured geometric body at a specific X coordinate value. This specific Y coordinate value corresponds to the specific photosensitive unit of the CCD7, which is converted into a photoelectric sensor by the CCD7 The signal is sent to the
如图2所示,被测几何形体3也可置于光缝隙4和柱面镜组件6之间。As shown in FIG. 2 , the measured geometric body 3 can also be placed between the light slit 4 and the cylindrical lens assembly 6 .
实例:Example:
本实施例采用功率mW级激光器,例如波长λ=0.670μm的半导体激光器。扩束镜可以采用扩束倍数大于10倍的透镜组组成,例如由一个焦距-15mm凹透镜和一个焦距200mm的凸透镜组成,且透镜组的间距可微调。光缝隙是宽度小于1mm且直线度误差为1/10缝宽的长形缝隙;光缝隙直线扫描器可以是一对转轴。柱面镜组件可以采用一个柱面镜和一个成像透镜组组成。CCD可以是线阵CCD或面阵CCD。In this embodiment, a laser with a power of mW is used, for example, a semiconductor laser with a wavelength of λ=0.670 μm. The beam expander can be composed of a lens group with a beam expansion factor greater than 10 times, for example, a concave lens with a focal length of -15mm and a convex lens with a focal length of 200mm, and the distance between the lens groups can be fine-tuned. The optical slit is a long slit with a width less than 1 mm and a straightness error of 1/10 of the slit width; the optical slit linear scanner can be a pair of rotating shafts. The cylindrical lens assembly can be composed of a cylindrical lens and an imaging lens group. The CCD can be a linear array CCD or an area array CCD.
本发明对同样的长、宽方向测量分辨率的二维外形轮廓的测量性能差,但对长、宽方向的尺寸的比很大(>10)且长、宽方向的测量分辨率要求不同(比率>5)的被测对象的测量中,本发明具有明显的优势。The present invention has poor performance in measuring the two-dimensional profile of the same measurement resolution in the length and width directions, but the ratio of the dimensions in the length and width directions is large (>10) and the measurement resolution requirements in the length and width directions are different ( In the measurement of the measured object whose ratio>5), the present invention has obvious advantages.
本发明并不局限于上面所述的实例,本领域一般技术人员可以根据本发明公开的内容采用多种实施方式实现本发明。The present invention is not limited to the examples described above, and those skilled in the art can implement the present invention by adopting various implementation modes according to the content disclosed in the present invention.
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| KR20100015475A (en) * | 2007-04-05 | 2010-02-12 | 가부시키가이샤 니콘 | Geometry measurement instrument and method for measuring geometry |
| CN101893425B (en) * | 2010-07-09 | 2012-06-27 | 清华大学 | Visual full-parameter wheel alignment detection system and method based on linear array images |
| CN104101611A (en) * | 2014-06-06 | 2014-10-15 | 华南理工大学 | Mirror-like object surface optical imaging device and imaging method thereof |
| CN105333835A (en) * | 2014-08-07 | 2016-02-17 | 上海通用汽车有限公司 | Size measuring device and method for finished vehicle |
| CN104930988B (en) * | 2015-06-29 | 2018-06-05 | 西南科技大学 | A kind of fiber array end face inclination angle measuring instrument and measuring method |
| CN112113512A (en) * | 2020-08-19 | 2020-12-22 | 信义汽车部件(天津)有限公司 | Method and device for determining outer contour of automobile glass |
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| CN1176351A (en) * | 1996-07-12 | 1998-03-18 | 希尔蒂股份公司 | Fixture for self-cutting anchor bolt |
| US20040004727A1 (en) * | 2002-07-04 | 2004-01-08 | Murata Manufacturing Co., Ltd. | Three-dimensional shape measuring method, and three-dimensional shape measuring apparatus |
| CN1568419A (en) * | 2000-11-22 | 2005-01-19 | 法国圣戈班玻璃厂 | Method and device for analysing the surface of a substrate |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN1176351A (en) * | 1996-07-12 | 1998-03-18 | 希尔蒂股份公司 | Fixture for self-cutting anchor bolt |
| CN1568419A (en) * | 2000-11-22 | 2005-01-19 | 法国圣戈班玻璃厂 | Method and device for analysing the surface of a substrate |
| US20040004727A1 (en) * | 2002-07-04 | 2004-01-08 | Murata Manufacturing Co., Ltd. | Three-dimensional shape measuring method, and three-dimensional shape measuring apparatus |
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