CN1386609A - Electronic package solder ball structure - Google Patents
Electronic package solder ball structure Download PDFInfo
- Publication number
- CN1386609A CN1386609A CN 01112936 CN01112936A CN1386609A CN 1386609 A CN1386609 A CN 1386609A CN 01112936 CN01112936 CN 01112936 CN 01112936 A CN01112936 A CN 01112936A CN 1386609 A CN1386609 A CN 1386609A
- Authority
- CN
- China
- Prior art keywords
- solder ball
- tin
- solder
- layer
- metal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 229910000679 solder Inorganic materials 0.000 claims abstract description 84
- 238000002844 melting Methods 0.000 claims abstract description 30
- 229910052751 metal Inorganic materials 0.000 claims abstract description 27
- 239000002184 metal Substances 0.000 claims abstract description 27
- 230000008018 melting Effects 0.000 claims abstract description 25
- 239000010410 layer Substances 0.000 claims description 45
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 23
- 229910052718 tin Inorganic materials 0.000 claims description 21
- 238000004100 electronic packaging Methods 0.000 claims description 11
- 229910052797 bismuth Inorganic materials 0.000 claims description 8
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 claims description 8
- 229910052738 indium Inorganic materials 0.000 claims description 8
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims description 8
- 150000002739 metals Chemical class 0.000 claims description 7
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 6
- 238000005253 cladding Methods 0.000 claims description 5
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 3
- QCEUXSAXTBNJGO-UHFFFAOYSA-N [Ag].[Sn] Chemical compound [Ag].[Sn] QCEUXSAXTBNJGO-UHFFFAOYSA-N 0.000 claims description 3
- NEIHULKJZQTQKJ-UHFFFAOYSA-N [Cu].[Ag] Chemical compound [Cu].[Ag] NEIHULKJZQTQKJ-UHFFFAOYSA-N 0.000 claims description 3
- PQIJHIWFHSVPMH-UHFFFAOYSA-N [Cu].[Ag].[Sn] Chemical compound [Cu].[Ag].[Sn] PQIJHIWFHSVPMH-UHFFFAOYSA-N 0.000 claims description 3
- 229910045601 alloy Inorganic materials 0.000 claims description 3
- 239000000956 alloy Substances 0.000 claims description 3
- 230000003064 anti-oxidating effect Effects 0.000 claims description 3
- KUNSUQLRTQLHQQ-UHFFFAOYSA-N copper tin Chemical compound [Cu].[Sn] KUNSUQLRTQLHQQ-UHFFFAOYSA-N 0.000 claims description 3
- 230000007423 decrease Effects 0.000 claims description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 3
- 229910052737 gold Inorganic materials 0.000 claims description 3
- 239000010931 gold Substances 0.000 claims description 3
- 229910052697 platinum Inorganic materials 0.000 claims description 3
- 229910052709 silver Inorganic materials 0.000 claims description 3
- 239000004332 silver Substances 0.000 claims description 3
- 239000011135 tin Substances 0.000 claims description 3
- 229910000969 tin-silver-copper Inorganic materials 0.000 claims description 3
- 229910052787 antimony Inorganic materials 0.000 claims description 2
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 claims description 2
- 239000011247 coating layer Substances 0.000 claims 1
- 239000000758 substrate Substances 0.000 abstract description 35
- 238000003466 welding Methods 0.000 abstract description 27
- 239000000463 material Substances 0.000 abstract description 24
- 238000012360 testing method Methods 0.000 abstract description 10
- 238000005476 soldering Methods 0.000 description 22
- 238000004806 packaging method and process Methods 0.000 description 9
- 238000010438 heat treatment Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 5
- 238000007711 solidification Methods 0.000 description 3
- 230000008023 solidification Effects 0.000 description 3
- 239000002344 surface layer Substances 0.000 description 3
- 229910001128 Sn alloy Inorganic materials 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 239000010953 base metal Substances 0.000 description 2
- 238000009833 condensation Methods 0.000 description 2
- 230000005494 condensation Effects 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 238000005336 cracking Methods 0.000 description 2
- 230000017525 heat dissipation Effects 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 229910000597 tin-copper alloy Inorganic materials 0.000 description 2
- -1 bismuth and indium Chemical compound 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000001010 compromised effect Effects 0.000 description 1
- 230000032798 delamination Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 210000002615 epidermis Anatomy 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
Images
Landscapes
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Abstract
Description
本发明与电子封装有关,特别是一种电子封装焊球结构。The invention relates to electronic packaging, in particular to an electronic packaging solder ball structure.
焊锡球主要作用是焊接微小部件时,可控地供给一定容量的焊材。The main function of the solder ball is to supply a certain volume of solder material in a controllable manner when welding small components.
焊接IC(集成电路)或电子基板的温度区域,以最适合基板封装温度210-230℃的范围内进行。实际作业时因空气流动、基板3加热方法、实际密度、零件等差异,吸热散热不同而影响温度的均恒。施焊时,部分可能低于设定温度10℃或20℃等不定,此时比较低温的部分会出现焊锡凝结吃锡不良。如果温度提高至比较低温的部分也能充分吃锡时,比较高温的部分会出现焊锡1的表面塌陷2(如图1所示)。The temperature range of soldering IC (integrated circuit) or electronic substrate is carried out in the most suitable range of substrate packaging temperature of 210-230°C. During actual operation, due to differences in air flow,
如果实施二层以上的焊接将很容易失败,因温度不均而高温部分产生熔陷现象6而完全分离第二层基板5,焊锡1陷入第一层基板4内(如图2所示)。If the soldering of more than two layers is implemented, it will easily fail, and the high-temperature part will completely separate the second-layer substrate 5 due to temperature unevenness and high-temperature part.
多次加工性上,因应现时要求发展,多层封装将成必然。多层封装,因施工上的困难必需采取多层、多次的焊接才能达到要求,在这种情况下,焊点必须能承受多次重复加温而不变形。也就是说,重复加温时先前焊接好的焊点重复加温至熔点时,不能因焊点的再次液熔流动而塌陷、龟裂……等而造成失败,但习用者往往会因多次重焊而失败。In terms of multiple processability, in response to the development of current requirements, multi-layer packaging will become inevitable. For multi-layer packaging, due to the difficulty in construction, it is necessary to adopt multi-layer and multiple welding to meet the requirements. In this case, the solder joints must be able to withstand repeated heating without deformation. That is to say, when the previously welded solder joints are repeatedly heated to the melting point during repeated heating, they cannot collapse or crack due to the re-melting of the solder joints...etc. Failed to re-solder.
本发明的主要目的,在于消除上述缺点,提供一种电子封装焊球结构,该焊球由内向外的融熔温度逐渐降低,具有多次加工性好,焊后强度佳、与基板焊材相容性高、变形少、便于测试、低电阻、成本低等特点。The main purpose of the present invention is to eliminate the above disadvantages and provide a solder ball structure for electronic packaging. The melting temperature of the solder ball decreases gradually from the inside to the outside, and has good multiple processability, good post-soldering strength, and the same solder material as the substrate. High capacitance, less deformation, easy to test, low resistance, low cost and so on.
本发明的目的是这样实现的:一种电子封装焊球结构,其特征在于:该焊锡球自内而外由其融熔温度逐渐降低的金属制成;The object of the present invention is achieved like this: an electronic packaging solder ball structure is characterized in that: the solder ball is made of metal whose melting temperature gradually decreases from the inside to the outside;
该焊锡球由内而外没有明显的分层;The solder ball has no obvious delamination from the inside to the outside;
该焊锡球由内而外为一具有高于外层融熔温度的金属球心和外层包覆一层以上单成分或二种成分以上的低温系金属而制成;The solder ball is made from the inside to the outside of a metal core with a higher melting temperature than the outer layer and the outer layer is coated with a low-temperature metal with more than one component or two components;
该球心使用白金、黄金、银、锡、锡银、锡银铜、锡铜或银铜低电阻金属制成;The center is made of platinum, gold, silver, tin, tin silver, tin silver copper, tin copper or silver copper low resistance metal;
该外层包覆层使用锡、锑、铅、铋、铟金属或其合金制成;The outer cladding is made of tin, antimony, lead, bismuth, indium metal or alloys thereof;
该焊锡球最外层还包覆有一抗氧化层;The outermost layer of the solder ball is also coated with an anti-oxidation layer;
该球心亦为多层金属包覆结构。The center of the ball is also a multi-layer metal cladding structure.
本发明的优点是:The advantages of the present invention are:
1.本发明的焊锡球用于IC或基板的封装焊接时,焊锡球高熔点球心未融熔而具等高线,外层液熔基板吃锡佳,具有多次加工性好、焊后强度佳、与基板焊材相容性高、变形少、便于测试、低电阻、成本低等特性。1. When the solder ball of the present invention is used for the packaging and welding of IC or substrate, the high melting point of the solder ball is not melted and has a contour line, and the outer layer of liquid-melted substrate is good for tin, and has good multiple processability and good post-soldering Good strength, high compatibility with substrate welding materials, less deformation, easy testing, low resistance, low cost and other characteristics.
2.本发明该焊锡球的球心采用便宜的锡或锡铜合金,而较贵的低温金属仅作外低温层包覆,使用量明显减少很多,成本可以降低。2. The center of the solder ball of the present invention is made of cheap tin or tin-copper alloy, and the more expensive low-temperature metal is only used as the outer low-temperature layer coating, so the amount of use is significantly reduced and the cost can be reduced.
3.本发明该焊锡球具有高熔点球心,因此焊点的焊锡球球心未熔而能保持一定的焊点高度,使每个焊点高度相同,测试作业较易进行而可靠。3. The solder ball of the present invention has a high melting point spherical center, so the solder ball center of the solder joint is not melted and can maintain a certain solder joint height, so that each solder joint has the same height, and the test operation is easier and more reliable.
有关本发明所采用的技术、手段及其功效,兹举一较佳实施例并结合附图详细说明于后:About technology, means and effect thereof that the present invention adopts, give a preferred embodiment hereby and describe in detail in conjunction with accompanying drawing in the following:
图1是习用焊点局部放大平面剖视图。Figure 1 is a partially enlarged planar cross-sectional view of a conventional solder joint.
图2是习用二层以上焊接局部放大平面剖视图。Fig. 2 is a partial enlarged plane sectional view of conventional welding with more than two layers.
图3是本发明电子封装焊球结构的焊接前局部放大平面示意图。Fig. 3 is a partially enlarged schematic plan view of the solder ball structure of the electronic package of the present invention before soldering.
图4是本发明电子封装焊球结构的焊后具等高线平面示意图。FIG. 4 is a schematic plan view of contour lines after soldering of the electronic packaging solder ball structure of the present invention.
图5是本发明电子封装焊球结构的双层焊后局部放大平面示意图。Fig. 5 is a partial enlarged plan view of the solder ball structure of the electronic package of the present invention after double-layer soldering.
图6是本发明电子封装焊球结构的双层焊前局部放大平面示意图。Fig. 6 is a partially enlarged schematic plan view of the double-layer solder ball structure of the electronic package before soldering according to the present invention.
图7是本发明电子封装焊球结构的焊后测试平面示意图。FIG. 7 is a schematic plan view of the post-soldering test of the electronic packaging solder ball structure of the present invention.
图8是本发明与习用者单层焊接比较局部放大平面示意图。Fig. 8 is a partially enlarged schematic plan view showing the comparison between the present invention and the single-layer welding of the practitioner.
图9是本发明与习用者双层焊接比较局部放大平面示意图。Fig. 9 is a partially enlarged plan view showing the comparison between the present invention and the double-layer welding of the experienced user.
图中:In the picture:
1-焊锡 2-塌陷1-Solder 2-Collapse
3-基板 4-第一层基板3-substrate
5-第二层基板 6-熔陷现象5-Second layer substrate 6-Sink phenomenon
7-焊锡球 10-电子基板7-Solder Ball 10-Electronic Substrate
11-第一层基板 12-第二层基板11-The first layer of substrate
20-焊锡球 21-球心20-solder ball 21-ball center
22-低温金属 30-等高线22-Low temperature metal 30-Contour
40-焊点 41-测试碰触点40-solder point 41-test contact point
本发明一种电子封装焊球结构,请参阅图3所示。一种电子封装焊球结构,主要是对IC或电子基板10的封装焊接的焊锡球20所作的发明。焊锡球20主要作用是焊接微小部件时,可控地供给一定容量的焊料。本发明是由内而外不分层,且由内而外以逐渐降低融熔温度的材料制成,由内向外逐渐降低熔点,中心部分超过230℃以上才能融熔。越接近表皮,熔点越低,最外层可低于180℃。没有层次的制法,以离子还原法或其他相关方法使金属堆叠二种以上的低温系金属。或者球心21采用具有高于外层融熔温度的金属,外层则为低熔点金属22而制成的焊锡球20。该焊锡球最外层还包覆一抗氧化层。下面将本发明与习用焊锡使用情况对比如下:最适合基板10封装温度210-230℃的范围内进行焊接。实际作业时因空气流动、基板加热方法、实际密度、零件等差异,吸热散热不同而影响温度的均恒。施焊时部分可能低于设定温度10℃或20℃等不定。习用者,则此时比较低温的部分会出现焊锡凝结吃锡不良。如果温度提高至比较低温的部分也能充分吃锡时,比较高温的部分会出现焊锡表面塌陷。如果施行于二层以上的焊接将会很容易失败。本发明可避免以上二种温度问题,因焊点有一等高线30(参阅图4所示),故二层以上施焊时(参阅图5所示)能确保每一焊点上下二侧第一层基板11侧、第二层基板12侧皆能吃锡,其中不会有焊点塌陷。高熔点球心21未融熔,外层低温层已充分成为液熔,故外层流动性良好,可确保其吃锡能力。An electronic packaging solder ball structure according to the present invention is shown in FIG. 3 . An electronic package solder ball structure is mainly an invention for
就多次加工性而言,因应现时要求发展,多层封装将成必然。多层封装,因施工上的困难必需采取多层、多次的焊接才能达到要求,在这种情况下,焊点必须能承受多次重复而不变形,习用者会因焊点的再次液熔流动而塌陷、龟裂……等而造成失败。本发明因有一高熔点球心21(参阅图5所示),可以忍受重复加温而不变形,因为再次加温至焊接温度时,外层虽然再次液熔,但球心21仍未熔。可保有一定的支撑强度而不变形塌陷,所以本发明的焊锡球20可使多层多次封装作业变成可靠而容易施行。In terms of multiple processability, multi-layer packaging will become inevitable in response to the development of current requirements. For multi-layer packaging, due to the difficulty in construction, it is necessary to adopt multiple layers of welding to meet the requirements. In this case, the solder joints must be able to withstand repeated repetitions without deformation. Flowing and collapsing, cracking, etc. cause failure. Because the present invention has a high-melting point ball center 21 (referring to shown in Figure 5), it can endure repeated heating without deformation, because when heating to the welding temperature again, although the outer layer is melted again, the
就焊锡强度而言,基板上焊接母材的不同,甚至世界各国环保问题而禁止使用含铅的各种母材与焊材,不含铅的焊材主要成分仍然是锡,再合以其他低熔点金属如铋、铟等……。但铋、铟等金属性脆强度不良。本发明高熔点球心21不含脆性金属。低熔点金属22(参阅图6所示)只使用在外层的包覆。焊接成品有球心21提供的强度支撑。受低温焊材的脆性影响,可有效减少。As far as solder strength is concerned, the soldering base metal on the substrate is different, and even the use of lead-containing base metals and soldering materials is prohibited in countries around the world due to environmental protection issues. The main component of lead-free soldering materials is still tin, combined with other low Melting point metals such as bismuth, indium, etc. . . . However, metals such as bismuth and indium have poor brittle strength. The high melting point
就基板10材料与焊材成分的相容性而言,基板在电路连线的各不同焊接点的材质可能有多种,焊材因应基板材质的相容性而设计,虽能有良好的吃锡能力。但焊接成品未必有良好的强度。如果考虑焊点强度的焊材,那吃锡能力与沾锡能力必打折扣。本发明因内有一高熔点球心21,此球心可使用较有强度的材质,使焊接成品保有强度。外层低熔点部分可因基板材质的吃锡能力、即母材与焊材的相容性要求而作各种选择性的制造。As far as the compatibility between the material of the
母材:指基板上用以提供电路连线及焊接点上的材质。焊材:指焊锡球(Solder Joint)而言。Base material: refers to the material used to provide circuit connections and solder points on the substrate. Solder material: refers to the solder ball (Solder Joint).
就凝固收缩量与应力而言,封装焊锡点在基板上加温融熔,焊点呈液熔时,因基板表面材质等其他因素影响,吃锡能力容易产生差异,因此每个焊点形状会出现差异。当凝固时,因形状的差异会影响凝固收缩量的不同,如果做双层以上的焊接时,凝固收缩量不同将产生极大应力,是焊点龟裂的主要原因。本发明因为有一超过焊接温度的高熔点球心21,故液熔时变形较少故收缩量少,可减少变形,避免焊点龟裂。In terms of solidification shrinkage and stress, package solder joints are heated and melted on the substrate. When the solder joints are molten, due to the influence of other factors such as the surface material of the substrate, the ability to absorb tin is prone to vary. Therefore, the shape of each solder joint will vary. There is a difference. When solidified, the difference in solidification shrinkage will be affected by the difference in shape. If more than two layers of welding are made, the difference in solidification shrinkage will produce extreme stress, which is the main cause of solder joint cracks. Because the present invention has a high-melting-
就测试而言,本发明便于测试,因为有一超过焊接温度的高熔点球心21,施焊时外层与基板10接触外层融熔液会因表面强力而降低高度,即球体外层变形,内部球心21因未达到熔点而基本保持不变。因此焊接完成时能使焊点40保持一定的高度。在同一基板10上焊点40数目可能达数百个。高熔点球心21能保持一定的焊点40高度,使每个焊点、测试碰触点41高度相同。所以测试作业会比较容易而可靠(参阅图7所示)。As far as testing is concerned, the present invention is convenient for testing, because there is a high-melting-
就电阻而言,焊接点或焊点40通常在基板上作电路连线,焊接点40的焊材中所含有的铅、铋、铟等皆为电的不良导体。极易在焊接点上形成电阻,使各焊点的温度不一致,在各部品间发生热差异及应力寿命减少,功能不良等情形。本发明可使不良导体的低熔点金属22,只用在焊材的表层并控制其量。高熔点球心21在焊接工作中并未融熔。所以球心21的成分可以使用白金、黄金、银、锡、锡银、锡银铜、锡铜、银铜……等等低电阻金属,而达到焊点40低电阻的要求。In terms of resistance, solder joints or
就成本而言,封装焊锡一般焊料为锡63%、铅37%的合金,无铅锡焊锡为主要材料加铋(BI)或铟(IN)等其他低熔点材料使其熔点降低。因为锡以外的低温金属如铋、铟等价格高昂。本发明球心21部分是比较便宜的锡或锡铜合金等。而其他比较贵的低熔点金属22只作表层的包覆,故使用量明显少很多,成本可以降低。In terms of cost, packaging solder is generally an alloy of 63% tin and 37% lead. Lead-free tin solder is the main material plus other low-melting point materials such as bismuth (BI) or indium (IN) to lower the melting point. Because low-temperature metals other than tin, such as bismuth and indium, are expensive. The
参阅图8所示,习用焊锡球7置于基板3(如a图示)经焊接后,有可能成为b图的较正常或c图所示的熔陷于基板3上;Referring to FIG. 8 , after the conventional solder ball 7 is placed on the substrate 3 (as shown in a) and soldered, it may become more normal as shown in FIG. b or melted on the
本发明的焊锡球20置于基板10(如d图示)经焊接后,表层液熔而球心21未熔(如e、f图示)。After the
参阅图9所示,习用焊锡球7置于第一、二层基板4、5间(如a图示),经焊接后,可能成为b图的正常状态或c图的龟裂、变形状态或d图的陷落形成断路状态;Referring to Figure 9, the conventional solder ball 7 is placed between the first and second layer substrates 4 and 5 (as shown in a), after soldering, it may become the normal state of the figure b or the cracked, deformed state of the figure c or The collapse of figure d forms an open circuit state;
而本发明的焊锡球20置于第一、二层基板11、12间(如e图示),经焊接后,高熔点球心21未熔而形成支撑,使基板与表层液熔的吃锡状况处于最佳状态(如f、g、h图示)。The
综上所述,可知本发明在同类产品中确有极佳的进步实用性。In summary, it can be known that the present invention has excellent progressive practicability among similar products.
上述实施例,仅用以举例说明本发明。特此声明,凡根据本发明而作的各种变形、修饰与应用,均应属本发明的保护范围。The above-mentioned embodiments are only used to illustrate the present invention. It is hereby declared that all variations, modifications and applications made according to the present invention shall belong to the protection scope of the present invention.
Claims (7)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 01112936 CN1386609A (en) | 2001-05-18 | 2001-05-18 | Electronic package solder ball structure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 01112936 CN1386609A (en) | 2001-05-18 | 2001-05-18 | Electronic package solder ball structure |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN1386609A true CN1386609A (en) | 2002-12-25 |
Family
ID=4659682
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 01112936 Pending CN1386609A (en) | 2001-05-18 | 2001-05-18 | Electronic package solder ball structure |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1386609A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101323056B (en) * | 2007-06-13 | 2012-11-28 | 富士康(昆山)电脑接插件有限公司 | Solder ball and electric connector using the solder ball |
| CN102867797A (en) * | 2011-07-07 | 2013-01-09 | 廖永丰 | Electronic packaging solder ball structure |
| CN103619529A (en) * | 2011-09-02 | 2014-03-05 | 三菱综合材料株式会社 | Solder powder, and solder paste using solder powder |
| CN106433558A (en) * | 2016-09-26 | 2017-02-22 | 麦科勒(滁州)新材料科技有限公司 | Bonding agent for electronic packaging and preparing method thereof |
| CN107541702A (en) * | 2017-09-08 | 2018-01-05 | 张家港创博金属科技有限公司 | A kind of is efficiently the method and apparatus of caryosphere coating |
| CN115808263A (en) * | 2023-02-06 | 2023-03-17 | 苏州森斯缔夫传感科技有限公司 | Pressure sensing device, packaging method and pressure monitoring equipment |
-
2001
- 2001-05-18 CN CN 01112936 patent/CN1386609A/en active Pending
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101323056B (en) * | 2007-06-13 | 2012-11-28 | 富士康(昆山)电脑接插件有限公司 | Solder ball and electric connector using the solder ball |
| CN102867797A (en) * | 2011-07-07 | 2013-01-09 | 廖永丰 | Electronic packaging solder ball structure |
| CN103619529A (en) * | 2011-09-02 | 2014-03-05 | 三菱综合材料株式会社 | Solder powder, and solder paste using solder powder |
| US8882934B2 (en) | 2011-09-02 | 2014-11-11 | Mitsubishi Materials Corporation | Solder powder, and solder paste using solder powder |
| CN106433558A (en) * | 2016-09-26 | 2017-02-22 | 麦科勒(滁州)新材料科技有限公司 | Bonding agent for electronic packaging and preparing method thereof |
| CN107541702A (en) * | 2017-09-08 | 2018-01-05 | 张家港创博金属科技有限公司 | A kind of is efficiently the method and apparatus of caryosphere coating |
| CN115808263A (en) * | 2023-02-06 | 2023-03-17 | 苏州森斯缔夫传感科技有限公司 | Pressure sensing device, packaging method and pressure monitoring equipment |
| CN115808263B (en) * | 2023-02-06 | 2023-10-27 | 苏州森斯缔夫传感科技有限公司 | Pressure sensing device, packaging method and pressure monitoring equipment |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6903919B2 (en) | Multilayer ceramic electronic component and mounting structure and method for the same | |
| US7436649B2 (en) | Ceramic electronic component and method for manufacturing the same | |
| US7145236B2 (en) | Semiconductor device having solder bumps reliably reflow solderable | |
| KR100629826B1 (en) | Compound and circuit device using the same | |
| CN101007365A (en) | Joining method, method of mounting semiconductor package, and substrate-joining structure | |
| US6278180B1 (en) | Ball-grid-array-type semiconductor device and its fabrication method and electronic device | |
| KR101933427B1 (en) | Coil Component and Method of Manufacturing the Same | |
| KR20190122741A (en) | Solder Materials, Solder Pastes, Foam Solders and Solder Joints | |
| JP2019063830A (en) | Solder alloy, solder joint material and electronic circuit board | |
| CN101030546A (en) | Capacitor attachment method | |
| JP3752064B2 (en) | Solder material and electronic component using the same | |
| CN1386609A (en) | Electronic package solder ball structure | |
| JP4228926B2 (en) | Semiconductor device | |
| JP2003109838A (en) | Ceramic electronic components | |
| TW201626412A (en) | Method for manufacturing laminated ceramic electronic device and apparatus thereof | |
| JP3444832B2 (en) | Method for manufacturing semiconductor device | |
| CN115770972A (en) | CGA soft solder cylinder and preparation method thereof | |
| JP4856362B2 (en) | High voltage ceramic capacitor | |
| CN101323056B (en) | Solder ball and electric connector using the solder ball | |
| JP5402107B2 (en) | Semiconductor device and manufacturing method thereof | |
| JP6427752B1 (en) | Solder alloy, solder joint material and electronic circuit board | |
| CN103480978A (en) | Environmentally-friendly lead-free anti-electrode-stripping solder wire | |
| JP2008270846A (en) | Manufacturing method of semiconductor device | |
| CN102867797A (en) | Electronic packaging solder ball structure | |
| WO2024090143A1 (en) | Device, electrical device, and substrate |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |