CN1236320C - Multi-channel high-accuracy voltage and ringing current tester - Google Patents

Abstract

A multi-channel high-precision voltage and ring current test device, including input protection and channel selection circuits connected in sequence, system self-calibration circuit, range conversion circuit, anti-interference circuit and conversion selection circuit, on the interface of the conversion circuit Also connected with an A/D self-calibration circuit and a waveform conversion circuit, the A/D conversion circuit exchanges information with a drive and control circuit, the waveform conversion circuit is connected with the drive and control circuit, the device has fast test speed, With the advantages of high test accuracy, wide measurement range, many test channels, and stable performance, this device can realize multi-channel wide-range voltage measurement without external circuits.

Description

Multi-channel high-precision voltage and ring current test device

The present invention relates to testing technology and testing technology based on VXI bus, more specifically, relates to a multi-channel high-precision voltage and ring current testing device.

The VXI (abbreviation of VME bus extension for Instrument, meaning the extension of the VME bus in the instrument field) bus originates from the industrial microcomputer VME (the abbreviation of VERSA-Module-Eurocard, referring to Motorola's VERSA bus-module-Eurocard) bus, and On this basis, it expands the chain and star trigger bus, clock and clock synchronization bus, local bus, device identification and analog summation line required by the instrument. It is an open and modular instrument bus that emerged and emerged in the late 1980s. , it absorbs the advantages of fast PC bus speed and high precision of GPIB (General Purpose Interface Bus) bus, and the VXI system composed of it integrates computer technology, GPIB technology, PC instrument technology, interface technology and Various technical achievements such as modular structure technology are recognized as the instrument bus system and automatic test system in the 21st century. As an important part of the VXI bus system: VXI module, there are many products, but the conventional data acquisition device can only realize the measurement of voltage, and there is no signal conditioning circuit, and there are few measurement channels, narrow measurement range, measurement Low precision, slow test speed and other shortcomings.

The object of the present invention is to provide a multi-channel high-precision voltage and ring current testing device, the provided device can simultaneously test multi-channel voltage and ring current, and the measurement accuracy is high, the speed is fast, not only can measure the DC voltage , can also measure AC voltage.

The purpose of the present invention is achieved through the following technical solutions: construct a multi-channel high-precision voltage and ring current test device, said device includes input protection and channel selection circuits connected in sequence, system self-calibration and test selection circuits, and automatic range conversion circuit, an isolation anti-jamming circuit and a test and conversion selection circuit, the interface of the test and conversion selection circuit is connected with a voltage conversion circuit, a waveform conversion circuit, and an A/D conversion circuit, and on the interface of the A/D conversion circuit An A/D self-calibration circuit is also connected, and a drive and control circuit connected to the A/D conversion circuit and the waveform conversion circuit are also included, and the output interfaces of the drive and control circuit are respectively connected to the voltage reference source , input protection and channel selection circuit, self-calibration and test selection circuit, automatic range conversion circuit and test and conversion selection circuit, also includes a programmable logic circuit connected with the drive and control circuit, and a programmable logic circuit connected with the programmable logic circuit Connected VXI bus and drive circuit.

In the above-mentioned multi-channel high-precision voltage and ring current testing device provided according to the present invention, the input protection and channel selection circuit includes a diode protection circuit, a filter circuit, and a relay array connected in sequence, and the control interface of the relay array is connected to the The driving and control circuits are connected.

In the above-mentioned multi-channel high-precision voltage and ring current testing device provided according to the present invention, the system self-calibration and test selection circuit includes a voltage reference source, a system reference zero input circuit, a system reference 10V input circuit and a relay switching circuit and Drive and control circuit, the drive and control circuit is connected to and controls the voltage reference source, the relay switching circuit, the voltage reference source is respectively connected to the system reference zero input circuit, the system reference 10V input circuit, and the The system reference zero input circuit and the system reference 10V input circuit are respectively connected to the relay switching circuit.

In the above-mentioned multi-channel high-precision voltage and ring current testing device provided according to the present invention, the automatic range conversion circuit includes a signal input circuit, and the input circuit is respectively connected with the reduction factor switching circuit and the amplification factor switching circuit, and the The reduction factor switching circuit is connected with the reduction circuit, the amplification factor switching circuit is connected with the amplification circuit, the amplification circuit and the reduction circuit are connected with the signal output circuit, the reduction factor switching circuit, the amplification factor switching circuit are respectively connected with The driving and control circuits are connected.

In the above-mentioned multi-channel high-precision voltage and ring current testing device provided by the present invention, the isolation and anti-interference circuit includes a diode protection circuit, a capacitor filter circuit and a voltage follower circuit connected in sequence.

In the above-mentioned multi-channel high-precision voltage and ring current testing device provided according to the present invention, the voltage conversion circuit includes a capacitor DC blocking circuit and an AC/DC conversion circuit connected in sequence, and the input interface of the capacitor DC blocking circuit is connected to the Diode protection circuit is connected.

In the multi-channel high-precision voltage and ring current testing device according to the present invention, the waveform conversion circuit includes a waveform input circuit, a zero-crossing comparison circuit, a level conversion circuit and a waveform output circuit connected in sequence.

In the above-mentioned multi-channel high-precision voltage and ring current testing device provided according to the present invention, the A/D self-calibration circuit includes an AD reference zero input circuit, an AD reference 10V input circuit, and the AD reference zero input circuit , the A/D conversion circuit connected to the AD reference 10V input circuit, the A/D conversion circuit is connected to the drive and control circuit, the AD reference zero input circuit and the AD reference 10V input circuit, The voltage reference source is connected.

In the above-mentioned multi-channel high-precision voltage and ring current test device provided according to the present invention, the A/D conversion circuit includes a capacitor filter circuit, an A/D conversion circuit, a zero-adjustment circuit and a full-scale adjustment circuit connected in sequence; The input interface of the capacitance filter circuit is connected with the diode protection circuit, and the A/D conversion circuit is connected with the driving and control circuit.

In the above-mentioned multi-channel high-precision voltage and ring current testing device provided according to the present invention, the voltage reference source includes a digital signal input circuit, a D/A conversion circuit, a zero-adjustment circuit, a full-scale circuit, and a reference circuit connected in sequence. The voltage output circuit, the digital signal input circuit, and the D/A conversion circuit are respectively connected to the driving and control circuits.

In the above-mentioned multi-channel high-precision voltage and ring current testing device provided according to the present invention, the drive and control circuit includes a data drive and a latch circuit connected to a programmable logic circuit, an address drive circuit, a relay drive circuit, a read Write latch control circuit and A/D conversion control circuit.

In the above-mentioned multi-channel high-precision voltage and ring current testing device provided according to the present invention, the programmable logic circuit includes an identification register setting circuit, a type register setting circuit, a control register setting circuit, a state Register setting circuit, dynamic configuration circuit, address comparison circuit, decoding circuit, A/D conversion timing circuit, clock reference circuit, frequency counting circuit, data driving circuit, the decoding circuit, the A/D conversion timing circuit, The clock reference circuit, the frequency counting circuit, the data drive circuit decoding circuit, the A/D conversion timing circuit, the clock reference circuit, the frequency counting circuit, and the data drive circuit, through a The drive and control interface circuit is connected with the drive and control circuit.

In the above-mentioned multi-channel high-precision voltage and ring current testing device provided by the present invention, the VXI bus and the driving circuit include a VXI bus and a bus driving circuit connected to the VXI bus and the programmable logic circuit.

Compared with the existing test devices, the multi-channel high-precision voltage and ring current test device provided by the present invention has the following characteristics: 1) It integrates signal conditioning, circuit protection, voltage and ring current measurement. Conventional data acquisition devices can only measure voltage and have no signal conditioning circuit; 2) There are many measurement channels and a wide measurement range. The device of the present invention has 16 voltage channels, and the measured DC voltage can range from a few millivolts to several hundred volts, and the measured AC voltage can reach several hundred volts. One piece of this device can realize multi-channel wide-range voltage without any external circuit. Measurement; 3) High measurement accuracy and fast test speed. Due to the use of A/D conversion devices with 200KHZ sampling frequency and 16-bit resolution, the test speed of the device is 150KHZ and the test accuracy can reach 14 bits within the range of 10V; 4) It can automatically determine whether the measured voltage is DC voltage or AC voltage, and automatically realize the measurement of DC voltage, AC voltage root mean square value and frequency measurement.

Below in conjunction with accompanying drawing and preferred embodiment, the present invention is described in further detail, in the accompanying drawing:

Fig. 1 is the composition block diagram of voltage of the present invention and bell current testing device;

Figure 2 is a block diagram of the input protection and channel selection circuit in Figure 1;

Fig. 3 is a compositional block diagram of the system self-calibration and test selection circuit in Fig. 1;

Fig. 4 is a block diagram of the composition of the automatic range conversion circuit in Fig. 1;

Fig. 5 is a block diagram of the isolated anti-jamming circuit in Fig. 1;

Fig. 6 is a block diagram of the composition of the voltage conversion circuit in Fig. 1;

Fig. 7 is a block diagram of the composition of the waveform conversion circuit in Fig. 1;

Fig. 8 is a block diagram of the composition of the A/D self-calibration circuit in Fig. 1;

Fig. 9 is a block diagram of the composition of the A/D conversion circuit in Fig. 1;

Fig. 10 is a composition block diagram of the voltage reference source in Fig. 1;

Fig. 11 is a compositional block diagram of the drive and control circuit in Fig. 1;

Fig. 12 is a compositional block diagram of the programmable logic circuit in Fig. 1;

Fig. 13 is the composition block diagram of VXI bus line and drive circuit among Fig. 1;

Fig. 14 is the functional block diagram of multi-channel DC voltage test;

Fig. 15 is the functional block diagram of ring current root mean square value test;

Figure 16 is a functional block diagram of the ringing current frequency test.

The multi-channel high-precision voltage and ring current test device provided by the present invention includes input protection and channel selection circuit, system self-calibration and test selection circuit, automatic range conversion circuit, isolation and anti-interference circuit, voltage conversion circuit, waveform conversion circuit, A /D conversion circuit, drive and control circuit, voltage reference source, programmable logic circuit, VXI bus and drive circuit, the input protection and channel selection circuit is composed of diode protection circuit, filter circuit, relay array, the system is self-contained The calibration and test selection circuit is composed of a system reference zero input and a system reference 10V input. The automatic range conversion circuit is composed of a signal input circuit, a reduction factor switching circuit, a reduction circuit, a magnification factor switching circuit, an amplification circuit, and a signal output circuit. The isolation and anti-interference circuit is composed of a diode protection circuit, a capacitor filter circuit, and a voltage follower circuit. The voltage conversion circuit is composed of a capacitor DC blocking circuit and an AC/DC conversion circuit. The waveform conversion circuit is composed of a waveform input circuit, a zero-crossing The A/D conversion circuit is composed of a comparison circuit, a level conversion circuit, and a waveform output circuit. The A/D conversion circuit is composed of an A/D conversion circuit, a zero adjustment circuit, and a full scale adjustment circuit. The voltage reference source is composed of a D/A conversion circuit, an adjustment circuit It is composed of zero circuit and full scale circuit. The drive and control circuit is composed of data drive and latch, address drive, relay drive, read and write latch control, and A/D conversion control. The programmable logic circuit is composed of identification register Setting circuit, type register setting circuit, control register setting circuit, status register setting circuit, dynamic configuration circuit, address comparison circuit, decoding circuit, A/D conversion sequence circuit, clock reference circuit, frequency counting circuit, data drive circuit, all Said VXI bus and driving circuit include VXI bus and bus driver.

In the composition structure of the device shown in Figure 1, there is a circuit 101 for completing input protection and channel selection, a circuit 102 for completing system self-calibration and test selection, an automatic range switching circuit 103 for realizing automatic range conversion, and a circuit 103 for completing isolation and anti-interference. Circuit 104, circuit 105 for testing and conversion selection, circuit 106 for voltage conversion, circuit 107 for waveform conversion, circuit 108 for A/D self-calibration, circuit 109 for A/D conversion, drive and control A circuit 110, a voltage reference source 111 for providing a voltage reference, a programmable logic circuit 112 for completing device configuration and frequency measurement, and a circuit 113 for providing VXI bus and driving.

As shown in FIG. 2 , in the input protection and channel selection circuit 101 of the device, a diode protection circuit 203 , a filter circuit 202 , and a relay array 201 are provided, and the relay array 201 is connected to the drive and control circuit 110 . In this embodiment, the protection diode is 1N5388B, the filter capacitor is CT81-16B-Y5V-1KV-0.01uF, and the relay array is TQ2-5V.

As shown in Figure 3, in the system self-calibration and test selection circuit 102 of the device, a system reference zero input circuit 302, a system reference 10V input circuit 301, a relay switching circuit 303 are provided; the relay switching circuit 303 is connected with the drive and The control circuit 110 is connected, and the system reference zero input circuit 302 and the system reference 10V input circuit 301 are connected to the voltage reference source 111 . In this embodiment, the type of switching relay is TQ2-5V.

As shown in Figure 4, in the automatic range conversion circuit 103 of device, be provided with signal input circuit 401, reduction factor switching circuit 406, reduction circuit 405, amplification factor switching circuit 402, amplification circuit 403, signal output circuit 404; The enlargement switching circuit 402 and the reduction factor switching circuit 406 are respectively connected to the driving and control circuit 110 . In this embodiment, the reduction factor switching circuit 406 adopts TQ2-5V, the reduction circuit 405 adopts a precision resistor network, the amplification switching circuit 402 adopts ADG406BN, and the amplification circuit 403 adopts AD713KN.

As shown in FIG. 5 , in the isolation and anti-interference circuit 104 of the device, a diode protection circuit 501 , a capacitor filter circuit 502 , and a voltage follower circuit 503 are provided. In this embodiment, the diode is IN5242B, the filter capacitor is CT41-X7R-50V-0.1uF, and the voltage follower circuit 503 is LF411ACN.

As shown in FIG. 6 , a capacitive blocking circuit 601 and an AC/DC converting circuit 602 are provided in the voltage conversion circuit 106 of the device, and the input interface of the capacitive blocking circuit 601 is connected to the diode protection circuit 501 . In a specific embodiment, the DC blocking capacitor adopts EMK316F335Z, and the AC/DC conversion circuit 602 adopts AD536AJD.

As shown in FIG. 7 , in the waveform conversion circuit 107 of the device, a waveform input circuit 701 , a zero-crossing comparison circuit 702 , a level conversion circuit 703 , and a waveform output circuit 704 are provided. In this embodiment, the zero-crossing comparison circuit 702 adopts LM339N, and the level conversion circuit 703 adopts SN74LS244N.

As shown in Figure 8, in the A/D self-calibration circuit 108 of the device, an A/D conversion circuit 803 is provided, and the AD reference 10V input 801 and the AD reference zero input 802 connected with the A/D conversion circuit The A/D conversion circuit 803 is connected with the driving and control circuit 110, and the AD reference zero input circuit 802 and the AD reference 10V input circuit 801 are connected with the voltage reference source 111.

As shown in Figure 9, in the A/D conversion circuit 109 of the device, be provided with the capacitor filter circuit 901, A/D conversion circuit 902, zero adjustment circuit 903, fullness adjustment circuit 904 connected in sequence; The input interface of 901 is connected to the diode protection circuit 501 , and the A/D conversion circuit 902 is also connected to the drive and control circuit 110 . In this embodiment, the filter capacitor adopts CT41-X7R-50V-0.015uF, and the A/D conversion circuit adopts AD976ACR.

As shown in FIG. 10 , the voltage reference source 111 of the device is provided with a digital signal input circuit A01, a D/A conversion circuit A02, a zero adjustment circuit A03, a full scale adjustment circuit A04, and a reference voltage output circuit A05 connected in sequence. The digital signal input circuit A01 and the D/A conversion circuit A02 are respectively connected to the driving and control circuit 110 . In this embodiment, D/A conversion circuit A02 adopts DAC703KU.

As shown in FIG. 11 , in the drive and control circuit 110 of the device, there are data drive and latch B01, address drive B02, relay drive B03, read-write latch control B04, and A/D conversion control B05. In this embodiment, the data address driver uses IDT74FCT16245CTPV, the relay driver uses TD62083AP, and the latch uses IDT74FCT16374CTPV and 74HC273.

As shown in Figure 12, in the programmable logic circuit 112 of the device, there are identification register setting circuit C01, type register setting circuit C02, control register setting circuit C03, status register setting circuit C04, dynamic configuration circuit C05, address comparison Circuit C06, decoding circuit C07, A/D conversion timing circuit C08, clock reference circuit C09, frequency counting circuit C10, data drive circuit C11, drive and control interface circuit C12. In this embodiment, the programmable logic device adopts EPM7192SQC160-15.

As shown in FIG. 13 , the VXI bus and the driving circuit 113 are provided with a VXI bus D01 and a bus driving circuit D02 connected to each other; the bus driving circuit D02 is connected to the programmable logic circuit 112 . In this embodiment, the bus driver uses IDT74FCT16245CTPV.

Below in conjunction with accompanying drawing 14-16, further describe the testing working principle of the testing device of the present invention in detail:

Figure 14 shows the principle of the multi-channel DC voltage test, run the test program, through the drive and control circuit 110, first switch the range to the maximum reduction multiple position, then switch the system reference zero voltage 302 and the system reference 10V voltage 301 to the relay respectively In the switching circuit 303, use the A/D conversion 902 to measure the corresponding values Vzero and Verf respectively, then switch the measured voltage to the circuit, use the A/D conversion to measure the corresponding value Vtest, and use Vzero, Verf and Vtest Digital filtering technology and error correction technology are used for corresponding conversion, and finally the actual value of the measured voltage is calculated, and according to the actual value of the measured voltage, the range is automatically adjusted through the test program, and the above test steps are repeated until a satisfactory result is obtained.

Figure 15 is a block diagram of the test principle of the RMS value of the ringing current; the test process is: run the test program, through the drive and control circuit, first switch the range to the appropriate position of the reduction multiple, and then switch the system reference zero voltage and the system reference 10V respectively Voltage into the circuit, use A/D conversion to measure its corresponding value Vzero, Verf respectively, then switch the ring current voltage to the circuit, use AC/DC conversion and A/D conversion to measure its corresponding value Vtest, Vzero, Verf Verf and Vtest adopt digital filtering technology and error correction technology to carry out corresponding conversion, and finally calculate and obtain the actual value of the root mean square of the measured ring current voltage, and send it to the VXI bus.

Figure 16 is a block diagram of the ringing current frequency test principle. During the test, run the test program, and through the drive and control circuit, first switch the range to the appropriate position of the reduction multiple, then switch the ringing current to the circuit, and use the waveform conversion circuit to convert the ringing current to a sine wave Transform into a square wave, and change its level into a TTL level, use a clock reference circuit to generate a standard clock, and use a frequency counting circuit to count the TTL level square wave, thereby realizing the measurement of the ringing current frequency. The frequency measured by the testing device of the present invention can range from several hertz to tens of megahertz.

The scope of protection of the test device proposed by the present invention is not limited to the description of this manual. On the basis of the present invention, its circuit is appropriately modified, so as to realize the measurement of single-channel and multi-channel AC voltage and the measurement of frequency parameters, and also Belong to the disclosed scope of the present invention.

Claims (13)

1; a kind of multi-channel high-accuracy voltage and ringing current tester; it is characterized in that; comprise the input protection and the channel selection circuit (101) that connect in regular turn; circuit (102) is selected in system self-calibration and test; automatic range translation circuit (103); isolate anti-jamming circuit (104) and test and conversion and select circuit (105); be connected with voltage conversion circuit (106) on the interface of described test and conversion selection circuit (105); waveform transformation circuit (107); A/D translation circuit (109); on the interface of described A/D translation circuit (109), also be connected with A/D self-calibration circuit (108); also comprise and described A/D translation circuit (109); driving and control circuit (110) that waveform transformation circuit (107) connects; the voltage-reference (111) that is connected with control circuit (110) with described driving; described driving and control circuit (110) also offer output signal respectively described input protection and channel selection circuit (101); circuit (102) is selected in system self-calibration and test; circuit (105) is selected in automatic range translation circuit (103) and test and conversion; also comprise the Programmable Logic Device (112) that is connected with control circuit (110) with described driving, vxi bus that is connected with described Programmable Logic Device (112) and driving circuit (113).

2, according to described multi-channel high-accuracy voltage of claim 1 and ringing current tester; it is characterized in that; described input protection and channel selection circuit (101) comprise protective circuit of diode (203), filtering circuit (202), the relay array (201) that connects in regular turn, and the control interface of described relay array (201) is connected with control circuit (110) with driving.

3, according to described multi-channel high-accuracy voltage of claim 1 and ringing current tester, it is characterized in that, described system self-calibration and test select circuit (102) to comprise system's benchmark zero-bit input circuit (302), the benchmark 10V of system input circuit (301) and relay commutation circuit (303), described driving is connected with control circuit (110) and controls described voltage-reference (111), described relay commutation circuit (303), described voltage-reference (111) respectively with described system's benchmark zero-bit input circuit (302), the benchmark 10V of system input circuit (301) connects, and described system's benchmark zero-bit input circuit (302) is connected with described relay commutation circuit (303) respectively with the described benchmark 10V of system input circuit (301).

4, according to described multi-channel high-accuracy voltage of claim 1 and ringing current tester, it is characterized in that, described automatic range translation circuit (103) comprises signal input circuit (401), described signal input circuit (401) is connected with an enlargement factor commutation circuit (402) with a minification commutation circuit (406) respectively, described minification commutation circuit (406) is dwindled circuit (405) and is connected with one, described enlargement factor commutation circuit (402) is connected with an amplifying circuit (403), described amplifying circuit with dwindle circuit and be connected described minification commutation circuit (406) with a signal output apparatus (404), enlargement factor commutation circuit (402) is connected with control circuit (110) with driving.

5, according to described multi-channel high-accuracy voltage of claim 1 and ringing current tester; it is characterized in that described isolation anti-jamming circuit (104) comprises protective circuit of diode (501), capacitor filter (502), the voltage follower circuit (503) that connects in regular turn.

6, according to described multi-channel high-accuracy voltage of claim 1 and ringing current tester; it is characterized in that; described voltage conversion circuit (106) comprises in regular turn electric capacity block isolating circuit (601) and the AC/DC change-over circuit (602) that connects, and the input interface of described electric capacity block isolating circuit (601) is connected with protective circuit of diode (501) in the described isolation anti-jamming circuit (104).

7, according to described multi-channel high-accuracy voltage of claim 1 and ringing current tester, it is characterized in that described waveform transformation circuit (107) comprises waveform input circuit (701), zero passage comparator circuit (702), level-conversion circuit (703) and the waveform output circuit (704) that connects in regular turn.

8, according to described multi-channel high-accuracy voltage of claim 1 and ringing current tester, it is characterized in that, described A/D self-calibration circuit (108) comprises AD benchmark zero-bit input circuit (802), AD benchmark 10V input circuit (801), with described AD benchmark zero-bit input circuit (802), the A/D translation circuit (803) that described AD benchmark 10V input circuit (801) connects, described A/D translation circuit (803) is connected described AD benchmark zero-bit input circuit (802) with driving with control circuit (110), described AD benchmark 10V input circuit (801) is connected with described voltage-reference (111).

9, according to described multi-channel high-accuracy voltage of claim 1 and ringing current tester, it is characterized in that described A/D translation circuit (109) comprises capacitor filter (901), A/D change-over circuit (902), the zeroing circuit (903) that connects in regular turn and transfers full scale circuit (904); The input interface of described capacitor filter (901) is connected with protective circuit of diode (501), and described A/D change-over circuit (902) is connected with control circuit (110) with driving.

10, according to described multi-channel high-accuracy voltage of claim 1 and ringing current tester, it is characterized in that, described voltage-reference (111) comprises digital signal input circuit (A01), D/A change-over circuit (A02), zeroing circuit (A03), accent full scale circuit (A04), the reference voltage output circuit (A05) that connects in regular turn, and described digital signal input circuit (A01), D/A change-over circuit (A02) are connected with control circuit (110) with driving respectively.

11, according to described multi-channel high-accuracy voltage of claim 1 and ringing current tester, it is characterized in that, be provided with data-driven and latch cicuit (B01), address driving circuit (B02), relay drive circuit (B03), read-write latch control circuit (B04) and A/D conversion control circuit (B05) in described driving and the control circuit (110); Foregoing circuit all is connected with Programmable Logic Device (112).

12, according to described multi-channel high-accuracy voltage of claim 1 and ringing current tester, it is characterized in that, described Programmable Logic Device (112) comprises that the marker register that is connected with vxi bus and driving circuit (113) respectively is provided with circuit (C01), the type register is provided with circuit (C02), control register is provided with circuit (C03), status register is provided with circuit (C04), dynamic-configuration circuit (C05), address comparison circuit (C06), decoding scheme (C07), A/D conversion timing sequence circuit (C08), clock reference circuit (C09), frequency counting circuit (C10), data drive circuit (C11), described decoding scheme (C07), A/D conversion timing sequence circuit (C08), clock reference circuit (C09), frequency counting circuit (C10), data drive circuit (C11) decoding scheme (C07), A/D conversion timing sequence circuit (C08), clock reference circuit (C09), frequency counting circuit (C10), data drive circuit (C11) is connected with control circuit (110) with driving with control interface circuit (C12) by a driving.

13, according to described multi-channel high-accuracy voltage of claim 1 and ringing current tester, it is characterized in that, be provided with interconnective vxi bus (D01) and bus driving circuits (D02) in described vxi bus and the driving circuit (113); Described bus driving circuits (D02) is connected with Programmable Logic Device (112).

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