CN120811506A

CN120811506A - Radio frequency index testing method, device, equipment, medium and product

Info

Publication number: CN120811506A
Application number: CN202510769082.4A
Authority: CN
Inventors: 郭军平; 赵峰; 王青; 施渊籍; 胡金龙
Original assignee: Zhongke Nanjing Mobile Communication And Computing Innovation Research Institute
Current assignee: Zhongke Nanjing Mobile Communication And Computing Innovation Research Institute
Priority date: 2025-06-10
Filing date: 2025-06-10
Publication date: 2025-10-17

Abstract

The present application discloses a radio frequency index testing method, device, equipment, medium and product, belonging to the field of radio frequency technology. The method includes: converting an analog signal received from a signal source into a digital signal through an analog-to-digital conversion chip; obtaining a frequency domain analysis result corresponding to the digital signal, wherein the frequency domain analysis result includes n complex signals, each complex signal includes I-channel data and Q-channel data, and n is an integer greater than 1; for each complex signal, dividing the square sum of the I-channel data and the Q-channel data in the complex signal by n to obtain the target value corresponding to the complex signal; determining the relevant power corresponding to the digital signal based on the target values corresponding to the n complex signals; and determining the radio frequency index corresponding to the digital signal based on the relevant power. The present application can improve the efficiency of existing testing methods.

Description

Radio frequency index testing method, device, equipment, medium and product

Technical Field

The present application relates to the field of radio frequency technologies, and in particular, to a method, an apparatus, a device, a medium, and a product for testing a radio frequency index.

Background

Radio Frequency (RF) refers to an electromagnetic wave Frequency range used in wireless communication, and the technology thereof has been widely used in the fields of wireless communication, radar, unmanned aerial vehicle, satellite navigation, and the like. The radio frequency index is a key quantization parameter for measuring the performance of the radio frequency system. With the rapid development of modern communication technologies (such as 5G/6G, internet of things and millimeter wave communication), higher requirements are put on accurate test and analysis of radio frequency signals to ensure the stability, reliability and compliance of the system.

At present, the traditional radio frequency index testing method mainly comprises the following two steps:

And the FPGA+software analysis method is to manually grasp AD sampling signals through the FPGA and then import data into specific software (such as MATLAB or LabVIEW) for offline analysis.

The FPGA + spectrometer analysis method is that AD sampling signals are manually grasped through the FPGA, and then data are transmitted to a high-performance spectrometer (such as Keysight or Rohde & Schwarz equipment) for analysis.

The two methods have complex calculation process, and the tester needs to manually set parameters of instruments such as a spectrometer and the like and manually read test data, so that the test efficiency is low and the requirements of on-site real-time test are difficult to meet. Therefore, development of a radio frequency index testing method is urgently needed to improve the testing efficiency.

The foregoing is provided merely for the purpose of facilitating understanding of the technical solutions of the present invention and is not intended to represent an admission that the foregoing is prior art.

Disclosure of Invention

The embodiment of the application mainly aims to provide a radio frequency index testing method, a device, equipment, a medium and a product, and aims to solve the problem of low efficiency of a multi-round dialogue system in the existing method.

In a first aspect, an embodiment of the present application provides a radio frequency indicator testing method, where the method includes:

converting an analog signal received from a signal source into a digital signal through an analog-to-digital conversion chip;

Obtaining a frequency domain analysis result corresponding to the digital signal, wherein the frequency domain analysis result comprises n complex signals, each complex signal comprises I-path data and Q-path data, and n is an integer greater than 1;

Dividing the square sum of the I path data and the Q path data in the complex signals by n for each complex signal to obtain a target value corresponding to the complex signal;

According to target values corresponding to the n complex signals, determining correlation power corresponding to the digital signals, wherein the correlation power comprises at least one of received signal power, useful signal power, noise power and maximum spurious signal power;

And determining a radio frequency index corresponding to the digital signal according to the related power, wherein the radio frequency index comprises at least one of stray and signal to noise ratio.

In a second aspect, an embodiment of the present application provides a radio frequency indicator testing method apparatus, where the apparatus includes:

The receiving conversion module is used for converting the analog signal received from the signal source into a digital signal through the analog-to-digital conversion chip;

The acquisition module is used for acquiring a frequency domain analysis result corresponding to the digital signal, wherein the frequency domain analysis result comprises n complex signals, each complex signal comprises I-path data and Q-path data, and n is an integer greater than 1;

The obtaining module is used for dividing the square sum of the I path data and the Q path data in the complex signals by n to obtain target values corresponding to the complex signals;

The first determining module is used for determining the relevant power corresponding to the digital signal according to the target values corresponding to the n complex signals, wherein the relevant power comprises at least one of received signal power, useful signal power, noise power and maximum spurious signal power;

and the second determining module is used for determining a radio frequency index corresponding to the digital signal according to the related power, wherein the radio frequency index comprises at least one of stray and signal to noise ratio.

In a third aspect, an embodiment of the present application provides a radio frequency index testing method device, where the device includes a memory, a processor, and a computer processing program stored on the memory and executable on the processor, where the computer processing program is configured to implement the radio frequency index testing method according to the first aspect.

In a fourth aspect, an embodiment of the present application provides a storage medium, where a computer processing program is stored, where the computer processing program, when executed by a processor, implements the radio frequency index testing method according to the first aspect.

In a fifth aspect, embodiments of the present application provide a computer program product stored in a storage medium, the program product being executable by at least one processor to implement the radio frequency indicator testing method according to the first aspect.

The application provides a radio frequency index testing method, device, equipment and medium, which are used for converting an analog signal received from a signal source into a digital signal through an analog-to-digital conversion chip, acquiring a frequency domain analysis result corresponding to the digital signal, wherein the frequency domain analysis result comprises n complex signals, each complex signal comprises I-path data and Q-path data, n is an integer larger than 1, dividing the square sum of the I-path data and the Q-path data in the complex signals by n for each complex signal to obtain a target value corresponding to the complex signal, determining relevant power corresponding to the digital signal according to the target value corresponding to the n complex signals, wherein the relevant power comprises at least one of received signal power, useful signal power, noise power and maximum spurious signal power, and finally determining a radio frequency index corresponding to the digital signal according to the relevant power, wherein the radio frequency index comprises at least one of spurious signals and signal to noise ratio. The application can directly calculate the related power according to the complex signal included in the frequency domain analysis result corresponding to the digital signal, and then calculate the radio frequency index according to the related power, thus solving the problem of low efficiency of the existing method, realizing rapid calculation of the signal power and the radio frequency index, effectively simplifying the calculation process, reducing the processing delay, and simultaneously reducing the use of hardware resources.

Drawings

FIG. 1 is a flow chart of a radio frequency index testing method according to an embodiment of the present application;

FIG. 2 is a schematic block diagram of a radio frequency index testing system corresponding to the radio frequency index testing method provided by the embodiment of the application;

FIG. 3 is a schematic diagram of a radio frequency index calculation algorithm of the radio frequency index test method according to the embodiment of the present application;

FIG. 4 is a schematic diagram of an undersampled signal spectrum provided by an embodiment of the present application;

FIG. 5 is a schematic diagram of an upper computer interface of a radio frequency test system according to an embodiment of the present application;

FIG. 6 is a device diagram of a method for testing RF indicators according to an embodiment of the present application;

fig. 7 is a schematic structural diagram of an electronic device according to an embodiment of the present application;

FIG. 8 is a second schematic diagram of an electronic device according to an embodiment of the present application;

The achievement of the objects, functional features and advantages of the present application will be further described with reference to the accompanying drawings, in conjunction with the embodiments.

Detailed Description

The technical solutions of the embodiments of the present application will be clearly described below with reference to the drawings in the embodiments of the present application, and it is apparent that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which are obtained by a person skilled in the art based on the embodiments of the present application, fall within the scope of protection of the present application.

The terms first, second and the like in the description and in the claims, are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged, as appropriate, such that embodiments of the present application may be implemented in sequences other than those illustrated or described herein, and that the objects identified by "first," "second," etc. are generally of a type, and are not limited to the number of objects, such as the first object may be one or more. Furthermore, in the description and claims, "and/or" means at least one of the connected objects, and the character "/", generally means that the associated object is an "or" relationship.

The radio frequency index testing method provided by the embodiment of the application is described in detail below through specific embodiments and application scenes thereof with reference to the accompanying drawings.

The embodiment of the application provides a radio frequency index testing method, which is applied to electronic equipment, as shown in fig. 1, and can comprise the following steps:

Step 101, converting an analog signal received from a signal source into a digital signal through an analog-to-digital conversion chip;

102, obtaining a frequency domain analysis result corresponding to the digital signal, wherein the frequency domain analysis result comprises n complex signals, each complex signal comprises I-path data and Q-path data, and n is an integer greater than 1;

step 103, for each complex signal, dividing the sum of squares of the I-path data and the Q-path data in the complex signal by n to obtain a target value corresponding to the complex signal;

104, determining the correlation power corresponding to the digital signal according to the target values corresponding to the n complex signals, wherein the correlation power comprises at least one of received signal power, useful signal power, noise power and maximum spurious signal power;

step 105, determining a radio frequency index corresponding to the digital signal according to the related power, where the radio frequency index includes at least one of a spurious and a signal-to-noise ratio.

The embodiment of the application converts an analog signal received from a signal source into a digital signal through an analog-to-digital conversion chip, acquires a frequency domain analysis result corresponding to the digital signal, wherein the frequency domain analysis result comprises n complex signals, each complex signal comprises I-path data and Q-path data, n is an integer larger than 1, the square sum of the I-path data and the Q-path data in the complex signals is divided by n for each complex signal to obtain a target value corresponding to the complex signal, the related power corresponding to the digital signal is determined according to the target value corresponding to the n complex signals, the related power comprises at least one of received signal power, useful signal power, noise power and maximum spurious signal power, and finally, the radio frequency index corresponding to the digital signal is determined according to the related power, and the radio frequency index comprises at least one of spurious signal and signal to noise ratio. The application can directly calculate the related power according to the complex signal included in the frequency domain analysis result corresponding to the digital signal, and then calculate the radio frequency index according to the related power, thus solving the problem of low efficiency of the existing method, realizing rapid calculation of the signal power and the radio frequency index, effectively simplifying the calculation process, reducing the processing delay, and simultaneously reducing the use of hardware resources.

In some embodiments, in step 101 described above, the analog signal is converted to a digital signal using an analog-to-digital converter (ADC) so that the signal of the signal source can be processed and analyzed in the part under test (the device performing the radio frequency index test).

In this embodiment, it should be noted that an analog-to-digital converter (ADC) may be an electronic device that converts an analog signal into a digital signal, and the ADC may be integrated into a tested piece, where the tested piece includes the ADC and a programmable hardware device.

In some embodiments, in step 102, the frequency domain analysis results corresponding to the digital signal are obtained, which typically involves performing a fourier transform (FFT) on the signal to analyze its frequency content. The frequency domain analysis result includes n complex signals, each of which is composed of a real part (I-path data) and an imaginary part (Q-path data).

In this embodiment, the frequency domain analysis may be to analyze the performance of the signal in the frequency domain, and may be used to understand the frequency components of the signal. The frequency domain analysis result may be a series of data and information obtained by performing frequency domain analysis on the signal, and may include n complex signals. The complex signal may be a signal composed of a real part (I-way data) and an imaginary part (Q-way data), wherein the I-way data (In-phase) may represent an In-phase component of the signal and the Q-way data (Quadrature) may represent a Quadrature component of the signal. n may be determined according to practical circumstances, and preferably n may be 4096.

In some embodiments, in step 103 described above, for each complex signal, a target value is calculated that is the sum of squares of its real and imaginary parts divided by n.

In some embodiments, in step 104, the correlation power of the digital signal, such as the received signal power, the useful signal power, the noise power, the maximum spurious signal power, etc., is determined based on the target values of the n complex signals. In this embodiment, the correlation power may be a power metric related to the signal, such as a received signal power, a useful signal power, a noise power, and the like.

In some embodiments, in step 105, a radio frequency index, such as a spurious and signal-to-noise ratio, corresponding to the digital signal is determined according to the calculated correlation power.

In this embodiment, it should be noted that the rf index may be a parameter describing the characteristics of the rf signal, such as spurious, signal-to-noise ratio, channel isolation, and the like. In some cases, the useful signal power, noise power, etc. in the related power may also be directly used as one of the radio frequency indicators.

The method comprises the steps of obtaining a frequency domain analysis result corresponding to a digital signal, processing each complex signal, and determining that relevant power and radio frequency indexes corresponding to the digital signal occur on Programmable hardware equipment, wherein the Programmable hardware equipment can be a Field-Programmable gate array (Field-Programmable GATE ARRAY, FPGA).

In some embodiments, the determining the correlation power corresponding to the digital signal according to the target values corresponding to the n complex signals includes at least one of the following:

Summing the target values corresponding to the n complex signals to obtain the received signal power;

Summing the largest two target values of the target values corresponding to the n complex signals and the target values adjacent to the largest two target values to obtain the useful signal power;

Subtracting the useful signal power from the received signal power to obtain the noise power;

And setting the maximum value of the target values corresponding to the n complex signals as the maximum spurious signal power under the condition that the target value at the useful signal position corresponding to the useful signal power is set to zero.

In this embodiment, the quality of the signal and the system performance can be evaluated by calculating the received signal power, the useful signal power, the noise power, and the spurious signal power. Meanwhile, analyzing the power can help diagnose problems in the system, in addition, the useful power is obtained through target value summation, processing delay can be effectively saved, data storage is reduced, and computational complexity is reduced. Considering the spectrum leakage condition of useful signals, the influence caused by spectrum leakage can be reduced by the method, higher test precision is obtained, and a more stable and reliable test result is obtained.

First, the target values corresponding to n complex signals are summed to obtain the total power of the received signal.

Then, the largest two target values and their adjacent target values are found out from the n target values, and these values are summed to obtain the power of the useful signal. And subtracting the useful signal power from the received signal power to obtain the noise power. Finally, the target value at the useful signal position is set to zero, and then the maximum value is found out from the n target values, which is the maximum spurious signal power.

In some implementations, the useful signal power may be calculated using the summing method of the present embodiment;

in some implementations, the useful signal power may be found by a multi-stage comparator.

The target value adjacent to the maximum two target values is found out from the n target values, and the adjacent target values may be target values each having a fixed length around the maximum two target values. The fixed length may be one target value each of which is included around the maximum two target values, or may be a plurality of target values each of which is included around the maximum two target values.

In the present embodiment, the target value may be obtained by dividing the square of the I-path data and the Q-path data by n for each complex signal. The received signal power may be the total power of all received signals.

The useful signal power may be the power of a useful portion of the signal and may be the desired received signal power. The noise power may be the power of other signals in the received signal than the useful signal and may include background noise and other interference. Spurious signal power may be signal distortion power due to nonlinear effects or other sources of interference.

In some embodiments, the determining, according to the correlated power, a radio frequency indicator corresponding to the digital signal includes at least one of:

dividing the useful signal power by the maximum spurious signal power to obtain the spurious;

Dividing the useful signal power by the noise power to obtain the signal-to-noise ratio.

In this embodiment, the useful signal power is divided by the maximum spurious signal power to obtain the spurious ratio. The useful signal power is divided by the noise power to obtain the signal to noise ratio. By calculating the spur ratio and the signal-to-noise ratio, the performance of the wireless communication system, including the clarity of the signal and the reliability of the communication, can be evaluated. Meanwhile, the stray ratio and the signal to noise ratio are obtained, and the system design is also optimized, such as the adjustment of the transmitting power and the like, so as to improve the communication quality.

In this embodiment, the spurious may be a measure of the leakage of signal power on an adjacent channel caused by nonlinear distortion in the wireless communication system. A lower spurious value generally indicates better frequency selectivity and lower interference.

The signal-to-noise ratio may be a measure of the ratio of signal power to background noise power. A higher signal-to-noise ratio value generally indicates better signal quality and higher communication reliability.

In some embodiments, when the number of the analog-to-digital conversion chips is plural, the radio frequency index further includes a channel isolation between adjacent analog-to-digital conversion chips, and the determining the radio frequency index of the digital signal according to the correlated power includes:

the received signal power corresponding to the digital signals corresponding to the two adjacent analog-to-digital conversion chips is subjected to difference to obtain a difference value;

and carrying out logarithmic operation on the difference value to obtain the channel isolation.

In this embodiment, the received signal power of the digital signal corresponding to each of the two adjacent analog-to-digital conversion chips is calculated. The two received signal powers are differenced to obtain a difference. And carrying out logarithmic operation on the obtained difference value to obtain the channel isolation. By calculating the channel isolation, the performance of the multichannel system can be evaluated, and the stability and reliability of the system during the simultaneous operation of the multichannel system are ensured. Meanwhile, good channel isolation can ensure that signals received by each channel are clear, and confusion and distortion are reduced. The high channel isolation is helpful to reduce interference between adjacent channels and improve signal quality and overall performance of the radio frequency system.

In this embodiment, the analog-to-digital conversion chip may be an electronic device that converts an analog signal into a digital signal. The channel isolation may be an indicator of how much one channel interferes with adjacent channels in a multi-channel rf system. High channel isolation means that the interference between adjacent channels is small and the signal is clearer. The difference may be the difference in received signal power of two adjacent channels. The logarithmic operation may be an operation for converting the difference value into a channel isolation.

In some embodiments, after the analog signal received from the signal source is converted into the digital signal by the analog-to-digital conversion chip, the method includes:

Selecting n continuous points from the digital signal, calculating direct current components of the n continuous points, and then subtracting the direct current components one by utilizing the n continuous points to obtain a digital signal after direct current removal;

And carrying out frequency domain analysis on the digital signal subjected to DC removal to obtain a frequency domain analysis result corresponding to the digital signal.

In this embodiment, by selecting n consecutive data points from the digital signal, a dc component is calculated for the selected n consecutive points, the dc component being the average value or offset of the signal. And subtracting the direct current components one by using n continuous points to obtain a digital signal after direct current removal. And carrying out frequency domain analysis on the digital signal after DC removal to obtain a frequency domain analysis result, wherein the frequency domain analysis result comprises n complex signals. Therefore, through DC removal and frequency domain analysis, the frequency components and the characteristics of the signals can be more clearly known, the noise can be recognized and suppressed, and the signal quality is improved.

In this embodiment, the dc component may be an average value or an offset of the signal, and represents a dc bias of the signal. Dc removal may be a process of removing a dc component from a signal, and is commonly used in signal processing. The frequency domain analysis may be an analysis of the behavior of the signal in the frequency domain, which may be used to understand the frequency content of the signal.

In some implementations, a fourier transform may be used to transform the digital signal from the time domain to the frequency domain, resulting in a frequency domain analysis result.

In some implementations, the frequency domain analysis results may be obtained directly using a fourier transform IP kernel.

In some embodiments, after determining the radio frequency index of the digital signal according to the correlated power, the method further includes:

Receiving a test instruction sent by an upper computer;

and responding to the test instruction, and sending the radio frequency index of the digital signal to the upper computer, wherein the radio frequency index of the digital signal is used for the upper computer to generate a test report.

In this embodiment, after determining the radio frequency index of the digital signal, the radio frequency index is sent to the upper computer in response to the test instruction of the upper computer to generate the test report. Thus, by analyzing the radio frequency index, the performance of the wireless communication system can be accurately evaluated, and the problem in the radio frequency system can be identified. Meanwhile, based on the test report, the radio frequency system can be optimized, and the communication quality and reliability are improved. The test report also provides data support for the decision maker, helping system maintenance and upgrades.

And determining the radio frequency index (such as straying, signal-to-noise ratio and the like) of the digital signal according to the calculated related power (such as received signal power, useful signal power, noise power and maximum spurious signal power), and sending a test instruction to a tested piece (equipment for executing radio frequency index test) by the upper computer. The tested piece responds to the test instruction of the upper computer, sends the radio frequency index to the upper computer, and the upper computer generates a test report by using the received radio frequency index. The upper computer can read the radio frequency index through the serial port according to the set test time interval, and can judge whether the received radio frequency index meets the index requirement or not according to the index requirement and generate a test report.

In this embodiment, the host computer may be a central control device or system that is responsible for transmitting instructions and receiving data in a communication or control system. The test report may be a report generated based on radio frequency index analysis for evaluating radio frequency system performance and guiding improvement.

The application provides a system corresponding to a radio frequency index testing method, and referring to fig. 2, fig. 2 provides a schematic block diagram of the radio frequency index testing system corresponding to the radio frequency index testing method.

The radio frequency index test system mainly comprises three parts, namely a signal source, a tested piece and an upper computer, wherein the signal source transmits signals with set frequency points to the tested piece, the tested piece comprises an AD chip (analog-to-digital conversion chip) and an FPGA chip, the AD chip is used for collecting signals and then transmitting digital signals to the FPGA through a serial port, the FPGA processes the digital signals and updates and calculates relevant radio frequency indexes according to the period, the upper computer sets a test interval period through an interface, reads the radio frequency indexes according to the test interval period after issuing test instructions, automatically records test results after judging the radio frequency indexes, and a tester can click to generate a test report and derive the test report according to requirements.

For convenience of understanding, the application also provides an example of the principle of the radio frequency index calculation algorithm in the embodiment of the radio frequency index testing method, and referring to fig. 3, fig. 3 provides a schematic diagram of the principle of the radio frequency index calculation algorithm of the radio frequency index testing method corresponding to the example. The analog-to-digital conversion chip samples the signal sent by the signal source, carries out DC and FFT processing on the sampled signal, further calculates power (related power), and then calculates channel isolation, spurious, signal-to-noise ratio and the like on the basis of the power. The method comprises the steps of determining channel isolation, correspondingly explaining that only one channel is provided under the condition that the number of analog-digital conversion chips is one, and no channel isolation exists, and the plurality of channels are provided under the condition that the number of analog-digital conversion chips is a plurality of, and the channel isolation exists, wherein the channel isolation is determined by the received signal power of every two channels. For example, there are three corresponding channels in 3 analog-to-digital conversion chips, and the received signal power is channel 1 received signal power, channel 2 received signal power, and channel 3 received signal power, respectively. For channel 1 there is a channel isolation 12 determined by the channel 1 received signal power, the channel 2 received signal power, for channel 2 there is a channel isolation 21 and a channel isolation 23 determined by the channel 2 received signal power, the channel 2 received signal power and the channel 2 received signal power, the channel 3 received signal power, respectively, and for channel 3 there is a channel isolation 32 determined by the channel 3 received signal power, the channel 2 received signal power. The specific processing may be as follows.

An AD (analog-to-digital conversion chip) samples a single-tone signal sent by a signal source, and performs automatic test analysis on the undersampled signal, wherein the AD uses a 100MHz sampling rate to undersample a 125MHz single-tone signal. The method comprises the steps of carrying out Signal processing on an AD undersampled Signal on an FPGA, carrying out DC removal processing on the AD undersampled Signal, wherein the process can effectively improve the accuracy and stability of radio frequency index test, carrying out frequency domain analysis on the Signal after DC removal, respectively calculating received Signal power, useful Signal power, spurious Signal power and Noise power, further calculating radio frequency indexes such as spurious (Spurious FREE DYNAMIC RANGE, SFDR), signal-to-Noise Ratio (SNR), channel isolation and the like, and finally transmitting the signals to an upper computer through a serial port. The measured piece comprises a plurality of receiving channels, wherein the value of the isolation of the radio frequency index channels is that one channel is kept open, the other channels are closed, and the difference value of the receiving signals of the open channel and the adjacent closed channels is the isolation of the open channel.

1.1 AD sampling.

AD sampling samples a single-tone signal sent by a signal source, and automatic test analysis is performed on undersampled signals. The AD samples the 125MHz single-tone signal with a 100MHz sampling rate, and performs spectrum analysis on the undersampled signal, so that the useful signal is respectively at 25MHz and 75MHz, and the spectrum diagram of the undersampled signal is shown in fig. 4.

1.2 And (5) digital signal processing.

And transmitting the AD sampled signal to the FPGA through a serial port or a high-speed interface, performing digital signal processing on the undersampled signal by the FPGA, and transmitting the radio frequency index obtained by calculation to an upper computer. Analyzing the actual collected data finds that a direct current signal exists in the received signal, and if the analysis is directly performed, the signal analysis precision can be affected. The algorithm design process of the digital signal processing comprises the steps of firstly carrying out DC removal operation on a received AD sampling signal, then carrying out FFT operation on the signal subjected to DC removal, then carrying out square summation calculation power on the FFT result, respectively calculating the received signal power, the useful signal power and the spurious signal power, further calculating the noise power, and finally calculating the corresponding index.

1.2.1 And D, removing direct current.

And taking a section of signal to calculate the average value of the section of signal to obtain a direct current component, and subtracting the direct current component from the section of signal to obtain a signal after direct current removal.

For example, 4096 numbers are taken for calculation, and when the FPGA calculates, the undersampled signal is divided into two paths, one path is buffered, and the other path is used for calculating the direct current component. After the direct current component is calculated, the data in the cache is read, the direct current component is subtracted, and the obtained direct current removed signal is transmitted to the FFT module.

1.2.2 FFT。

And carrying out FFT operation on the signal after DC removal. In FPGA implementation, the I and Q paths of data after FFT operation can be obtained by directly using an FFT IP core, and 4096-point FFT is performed on the signal after DC removal. Where 4096 represents the number n in the above embodiment.

1.2.3 Calculating power

The module needs to calculate the received signal power, useful signal power, spurious signal power and noise power respectively for the FFT operation result. Firstly, square operation is carried out on 4096 paths of I and Q data after FFT operation, and then the corresponding I and Q square results are added and divided by 4096 to obtain 4096 square sums. The following calculations are made regarding several power values:

(1) The received signal power is obtained by accumulating 4096 square sums;

(2) The useful signal power is obtained by finding out two maximum values in 4096 square sums and accumulating and summing the values obtained by two maximum value adjacent points;

(3) Noise power, namely subtracting useful signal power from the received signal power to obtain noise power;

(4) Maximum spurious signal power, namely, the maximum spurious signal power is obtained by finding the maximum signal value except the signal in 4096 square sums.

In actual reception, due to Doppler frequency offset caused by crystal oscillator and noise caused by hardware board card, signal spectrum leakage may occur in the spectrum analysis of the signals, so that the spectrum leakage of the useful signals is considered when calculating the power of the useful signals, and the number of each fixed length around the position of the useful signals is determined to be the useful signal according to the analysis and simulation of the data of the actual to-be-detected data. From the analysis of the AD sampling, the current time is aimed at undersampled signal spectrum analysis, and the useful signal position is determined, so that a simple counter can be used for taking out square sum data of the corresponding positions in the FPGA implementation, and the useful signal power can be obtained by accumulating the data. The operation and the traditional signal power calculation scheme use the multi-stage comparator to find useful signals, so that the processing delay can be effectively saved, the data storage can be reduced, and the calculation complexity can be reduced. And the influence caused by spectrum leakage can be considered, so that higher test precision and more stable and reliable test results can be obtained.

When the FPGA is implemented, the value of the square sum is set to 0 at the position of the useful signal according to the counter for calculating the useful signal, and then the maximum value is found in the sequence to obtain the maximum spurious signal.

1.2.4 Calculating radio frequency index

The main calculated test metrics include Spur (SFDR), signal-to-noise ratio (SNR), useful signal power, noise power, channel isolation, etc. The logarithmic value of the outgoing frequency index is calculated according to the definition of parameters such as spurious emission (SFDR), signal-to-noise ratio (SNR), channel isolation and the like.

The Spurious (SFDR) is the ratio of the useful signal power to the maximum spurious signal power, and the log of the ratio is the reported value.

The signal-to-noise ratio (SNR) is the ratio of useful signal power to noise power, and the reported value is obtained by taking the logarithm of the ratio.

The channel isolation is calculated by calculating the amplitude (or power) of the received signal for each channel, and the amplitude (or power) of the signals of the two channels are subjected to logarithmic operation by subtracting the logarithm from the 1-2 amplitude to obtain the magnitude of the isolation.

In FPGA implementation, the above data are subjected to logarithmic operation by using an approximate logarithmic scheme, the data are quantized in the calculation process, and quantized results are transmitted to an upper computer through a serial port according to the width of 2 bytes of each parameter

1.3 Upper computer

By clicking the test button, the upper computer can read the radio frequency index value calculated by the FPGA through the serial port according to the set test time interval. The upper computer judges whether the parameters meet the index requirements according to the index requirements and automatically generates a test record, and a test report can be generated by clicking a export button, wherein the test report records multiple test results during the test. Referring to fig. 5, a schematic diagram of a host computer interface of a radio frequency test system is provided.

Referring to fig. 6, in one embodiment of the present application, there is provided a radio frequency index testing method apparatus, including:

A receiving conversion module 601, configured to convert an analog signal received from a signal source into a digital signal through an analog-to-digital conversion chip;

The obtaining module 602 is configured to obtain a frequency domain analysis result corresponding to the digital signal, where the frequency domain analysis result includes n complex signals, each complex signal includes I-path data and Q-path data, and n is an integer greater than 1;

An obtaining module 603, configured to divide, for each complex signal, a sum of squares of I-path data and Q-path data in the complex signal by n, to obtain a target value corresponding to the complex signal;

A first determining module 604, configured to determine, according to target values corresponding to n complex signals, a correlation power corresponding to the digital signal, where the correlation power includes at least one of a received signal power, a useful signal power, a noise power, and a maximum spurious signal power;

A second determining module 605 is configured to determine, according to the correlation power, a radio frequency indicator corresponding to the digital signal, where the radio frequency indicator includes at least one of a spurious and a signal-to-noise ratio.

It should be noted that, the embodiment of the device and the embodiment of the method are based on the same inventive concept,

Therefore, the content of the method embodiment is also applicable to the embodiment of the present apparatus, and will not be described herein.

Optionally, as shown in fig. 7, the embodiment of the present application further provides an electronic device 700, including a processor 701 and a memory 702, where the memory 702 stores a program or an instruction that can be executed on the processor 701, and the program or the instruction implements each step of the above-mentioned embodiment of the radio frequency index testing method when executed by the processor 701, and can achieve the same technical effect, so that repetition is avoided, and no further description is given here.

The electronic device in the embodiment of the application includes the mobile electronic device and the non-mobile electronic device.

Fig. 8 is a schematic diagram of a hardware structure of an electronic device implementing an embodiment of the present application.

The electronic device 800 includes, but is not limited to, a radio frequency unit 801, a network module 802, an audio output unit 803, an input unit 804, a sensor 805, a display unit 806, a user input unit 807, an interface unit 808, a memory 809, and a processor 810.

Those skilled in the art will appreciate that the electronic device 800 may also include a power source (e.g., a battery) for powering the various components, which may be logically connected to the processor 810 by a power management system to perform functions such as managing charge, discharge, and power consumption by the power management system. The electronic device structure shown in fig. 8 does not constitute a limitation of the electronic device, and the electronic device may include more or less components than shown, or may combine certain components, or may be arranged in different components, which are not described in detail herein.

Wherein the processor 810 is configured to:

In some implementations, the processor 810 is further configured to:

Receiving a test instruction sent by an upper computer;

It should be appreciated that in embodiments of the present application, the input unit 804 may include a graphics processor (Graphics Processing Unit, GPU) 8041 and a microphone 8042, with the graphics processor 8041 processing image data of still pictures or video obtained by an image capturing device (e.g., a camera) in a video capturing mode or an image capturing mode. The display unit 806 may include a display panel 8061, and the display panel 8061 may be configured in the form of a liquid crystal display, an organic light emitting diode, or the like. The user input unit 807 includes at least one of a touch panel 8071 and other input devices 8072. Touch panel 8071, also referred to as a touch screen. The touch panel 8071 may include two parts, a touch detection device and a touch controller. Other input devices 8072 may include, but are not limited to, a physical keyboard, function keys (e.g., volume control keys, switch keys, etc.), a trackball, a mouse, a joystick, and so forth, which are not described in detail herein.

The memory 809 can be used to store software programs as well as various data. The memory 809 may mainly include a first storage area storing programs or instructions and a second storage area storing data, wherein the first storage area may store an operating system, application programs or instructions (such as a sound playing function, an image playing function, etc.) required for at least one function, and the like. Further, the memory 809 may include volatile memory or nonvolatile memory, or the memory 809 may include both volatile and nonvolatile memory. The nonvolatile Memory may be a Read-Only Memory (ROM), a Programmable ROM (PROM), an Erasable PROM (EPROM), an Electrically Erasable EPROM (EEPROM), or a flash Memory. The volatile memory may be random access memory (Random Access Memory, RAM), static random access memory (STATIC RAM, SRAM), dynamic random access memory (DYNAMIC RAM, DRAM), synchronous Dynamic Random Access Memory (SDRAM), double data rate Synchronous dynamic random access memory (Double DATA RATE SDRAM, DDRSDRAM), enhanced Synchronous dynamic random access memory (ENHANCED SDRAM, ESDRAM), synchronous link dynamic random access memory (SYNCH LINK DRAM, SLDRAM), and Direct random access memory (DRRAM). Memory 809 in embodiments of the application includes, but is not limited to, these and any other suitable types of memory.

Processor 810 may include one or more processing units, and optionally, processor 810 integrates an application processor that primarily processes operations involving an operating system, user interface, application program, etc., and a modem processor that primarily processes wireless communication signals, such as a baseband processor. It will be appreciated that the modem processor described above may not be integrated into the processor 810.

The embodiment of the application also provides a readable storage medium, wherein the readable storage medium stores a program or an instruction, and the program or the instruction realizes each process of the radio frequency index testing method embodiment when being executed by a processor, and can achieve the same technical effect, so that repetition is avoided and redundant description is omitted.

Wherein the processor is a processor in the electronic device described in the above embodiment. The readable storage medium includes computer readable storage medium such as computer readable memory ROM, random access memory RAM, magnetic or optical disk, etc.

In addition, an embodiment of the present application provides a computer program product, which is stored in a storage medium, and the program product is executed by at least one processor to implement each process of the above-mentioned embodiment of the radio frequency index testing method, and achieve the same technical effects, so that repetition is avoided, and a detailed description is omitted herein.

It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or system that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or system. Without further limitation, an element defined by the phrase "comprising one does not exclude the presence of other like elements in a process, method, article, or system that comprises the element. Furthermore, it should be noted that the scope of the methods and apparatus in the embodiments of the present application is not limited to performing the functions in the order shown or discussed, but may also include performing the functions in a substantially simultaneous manner or in an opposite order depending on the functions involved, e.g., the described methods may be performed in an order different from that described, and various steps may be added, omitted, or combined. Additionally, features described with reference to certain examples may be combined in other examples.

The foregoing embodiment numbers of the present invention are merely for the purpose of description, and do not represent the advantages or disadvantages of the embodiments.

From the above description of embodiments, it will be clear to a person skilled in the art that the above embodiment method may be implemented by means of software plus a necessary general hardware platform, but may of course also be implemented by means of hardware, but in many cases the former is a preferred embodiment. Based on this understanding, the technical solution of the present invention may be embodied essentially or in a part contributing to the prior art in the form of a software product stored in a storage medium (e.g. ROM/RAM, magnetic disk, optical disk) as described above, comprising instructions for causing a terminal device (which may be a mobile phone, a computer, a server, or a network device, etc.) to perform the method according to the embodiments of the present invention.

The embodiments of the present application have been described above with reference to the accompanying drawings, but the present application is not limited to the above-described embodiments, which are merely illustrative and not restrictive, and many forms may be made by those having ordinary skill in the art without departing from the spirit of the present application and the scope of the claims, which are to be protected by the present application.

Claims

1. A radio frequency index testing method, the method comprising:

2. The method of claim 1, wherein determining the associated power corresponding to the digital signal according to the target values corresponding to the n complex signals comprises at least one of:

3. The method of claim 1, wherein determining the radio frequency indicator corresponding to the digital signal based on the correlated power comprises at least one of:

4. The method of claim 1, wherein, in the case where the number of analog-to-digital conversion chips is plural, the radio frequency index further includes a channel isolation between adjacent analog-to-digital conversion chips;

the determining the radio frequency index of the digital signal according to the related power comprises the following steps:

5. The method of claim 1, wherein after converting the analog signal received from the signal source into the digital signal by the analog-to-digital conversion chip, comprising:

6. The method of claim 1, further comprising, after determining the radio frequency indicator of the digital signal based on the correlated power:

Receiving a test instruction sent by an upper computer;

7. A radio frequency index testing method device, characterized in that the device comprises:

8. An apparatus for a radio frequency index test method, characterized in that the apparatus comprises a memory, a processor and a computer processing program stored on the memory and executable on the processor, the computer processing program being configured to implement the radio frequency index test method according to any one of claims 1 to 6.

9. A storage medium having stored thereon a computer processing program which, when executed by a processor, implements the radio frequency index testing method according to any one of claims 1 to 6.

10. A computer program product, characterized in that instructions in the computer program product, when executed by a processor of an electronic device, cause the electronic device to perform the radio frequency indicator testing method according to any of claims 1 to 6.