CN1299974A - 电子元器件综合型老化筛选装置 - Google Patents
电子元器件综合型老化筛选装置 Download PDFInfo
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- CN1299974A CN1299974A CN 99126840 CN99126840A CN1299974A CN 1299974 A CN1299974 A CN 1299974A CN 99126840 CN99126840 CN 99126840 CN 99126840 A CN99126840 A CN 99126840A CN 1299974 A CN1299974 A CN 1299974A
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- 230000032683 aging Effects 0.000 title claims abstract description 25
- 238000012216 screening Methods 0.000 title claims description 7
- 238000012360 testing method Methods 0.000 claims abstract description 51
- 238000009423 ventilation Methods 0.000 claims abstract description 6
- 239000002184 metal Substances 0.000 claims description 2
- 230000009466 transformation Effects 0.000 claims description 2
- 238000006243 chemical reaction Methods 0.000 abstract description 6
- 238000005070 sampling Methods 0.000 abstract description 3
- 230000001105 regulatory effect Effects 0.000 abstract description 2
- 238000007689 inspection Methods 0.000 abstract 2
- 230000017525 heat dissipation Effects 0.000 abstract 1
- 238000005259 measurement Methods 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 3
- 230000035882 stress Effects 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000003491 array Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 208000002925 dental caries Diseases 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 99126840 CN1111284C (zh) | 1999-12-15 | 1999-12-15 | 电子元器件综合型老化筛选装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 99126840 CN1111284C (zh) | 1999-12-15 | 1999-12-15 | 电子元器件综合型老化筛选装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1299974A true CN1299974A (zh) | 2001-06-20 |
| CN1111284C CN1111284C (zh) | 2003-06-11 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN 99126840 Expired - Lifetime CN1111284C (zh) | 1999-12-15 | 1999-12-15 | 电子元器件综合型老化筛选装置 |
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| CN (1) | CN1111284C (zh) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1307425C (zh) * | 2003-03-13 | 2007-03-28 | 鸿富锦精密工业(深圳)有限公司 | 老化台车测试监控改良装置 |
| CN100412558C (zh) * | 2005-01-07 | 2008-08-20 | 统宝光电股份有限公司 | 显示面板的高温老化测试装置 |
| CN102305908A (zh) * | 2011-08-03 | 2012-01-04 | 华南理工大学 | 电子元器件参数测试平台 |
| CN104614622A (zh) * | 2015-02-13 | 2015-05-13 | 南京六九零二科技有限公司 | 智能老化架 |
| TWI548886B (zh) * | 2014-04-18 | 2016-09-11 | 創意電子股份有限公司 | 老化偵測電路及其方法 |
| CN112305362A (zh) * | 2020-11-18 | 2021-02-02 | 安徽远创电子有限公司 | 电器产品老化试验机 |
-
1999
- 1999-12-15 CN CN 99126840 patent/CN1111284C/zh not_active Expired - Lifetime
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1307425C (zh) * | 2003-03-13 | 2007-03-28 | 鸿富锦精密工业(深圳)有限公司 | 老化台车测试监控改良装置 |
| CN100412558C (zh) * | 2005-01-07 | 2008-08-20 | 统宝光电股份有限公司 | 显示面板的高温老化测试装置 |
| CN102305908A (zh) * | 2011-08-03 | 2012-01-04 | 华南理工大学 | 电子元器件参数测试平台 |
| CN102305908B (zh) * | 2011-08-03 | 2013-07-03 | 华南理工大学 | 电子元器件参数测试平台 |
| TWI548886B (zh) * | 2014-04-18 | 2016-09-11 | 創意電子股份有限公司 | 老化偵測電路及其方法 |
| CN104614622A (zh) * | 2015-02-13 | 2015-05-13 | 南京六九零二科技有限公司 | 智能老化架 |
| CN112305362A (zh) * | 2020-11-18 | 2021-02-02 | 安徽远创电子有限公司 | 电器产品老化试验机 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN1111284C (zh) | 2003-06-11 |
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Owner name: HANGZHOU TONGCE MICROELECTRONICS CO., LTD. Free format text: FORMER OWNER: CAO JI Effective date: 20060407 |
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Effective date of registration: 20060407 Address after: South Zone of high road 311231 of Zhejiang Province, Hangzhou Xiaoshan economic and Technological Development Zone No. 77 Patentee after: Hangzhou Tongce Micro-Electronic Co., Ltd. Address before: 310021 No. 88 Peng Pang Road, Zhejiang, Hangzhou Patentee before: Cao Ji |
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| EE01 | Entry into force of recordation of patent licensing contract |
Assignee: Hangzhou Reliability Electronic Ltd. Assignor: Hangzhou Tongce Micro-Electronic Co., Ltd. Contract fulfillment period: 2008.9.9 to 2013.9.9 Contract record no.: 2008330001102 Denomination of invention: Comprehensive aging and screening equipment for electronic components and devices Granted publication date: 20030611 License type: Exclusive license Record date: 20081016 |
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Free format text: EXCLUSIVE LICENSE; TIME LIMIT OF IMPLEMENTING CONTACT: 2008.9.9 TO 2013.9.9; CHANGE OF CONTRACT Name of requester: HANGZHOU RELIABLE INSTRUMENT FACTORY Effective date: 20081016 |
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