CN113835009A - A partitioned transistor aging system - Google Patents
A partitioned transistor aging system Download PDFInfo
- Publication number
- CN113835009A CN113835009A CN202111211568.4A CN202111211568A CN113835009A CN 113835009 A CN113835009 A CN 113835009A CN 202111211568 A CN202111211568 A CN 202111211568A CN 113835009 A CN113835009 A CN 113835009A
- Authority
- CN
- China
- Prior art keywords
- aging
- partitioned
- working area
- transistor
- ageing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000032683 aging Effects 0.000 title claims abstract description 211
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 32
- 238000001816 cooling Methods 0.000 claims abstract description 29
- 238000012360 testing method Methods 0.000 claims abstract description 28
- 238000005192 partition Methods 0.000 claims description 12
- 230000002452 interceptive effect Effects 0.000 claims description 7
- 230000002265 prevention Effects 0.000 claims description 4
- 230000008859 change Effects 0.000 claims description 3
- 238000006243 chemical reaction Methods 0.000 claims description 3
- 230000001788 irregular Effects 0.000 claims description 3
- 238000005057 refrigeration Methods 0.000 claims description 2
- 230000009286 beneficial effect Effects 0.000 abstract description 2
- 238000004891 communication Methods 0.000 description 11
- 238000000034 method Methods 0.000 description 6
- 230000007547 defect Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 238000007639 printing Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 3
- 230000001105 regulatory effect Effects 0.000 description 3
- 230000015556 catabolic process Effects 0.000 description 2
- 239000000498 cooling water Substances 0.000 description 2
- 238000006731 degradation reaction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 230000033228 biological regulation Effects 0.000 description 1
- 210000000476 body water Anatomy 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000002431 foraging effect Effects 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 238000000638 solvent extraction Methods 0.000 description 1
- 230000035882 stress Effects 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 238000000844 transformation Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
本发明涉及晶体管老化技术领域，尤其涉及一种分区式晶体管老化系统，包括老化台，老化台上设有控制模块、若干相互独立的老化工作区以及各个老化工作区所配套的老化电源、极性转换开关、报警装置，老化工作区内设有工位组，工位组上放置待测试晶体管，工位组通过驱动模块与控制模块连接。各个老化工作区设有可开关的柜门。老化工作区内设有温度传感器。老化台还设有水冷循环装置，水冷循环装置为分区设置，分别对各个老化工作区的温度进行调节。本发明具有如下有益效果：通过分区式的老化工作区以及分区的水冷循环装置，可以在老化台上同时模拟不同的老化环境，实现在同一时间在不同老化环境下对晶体管进行老化测试。
The invention relates to the technical field of transistor aging, in particular to a partitioned transistor aging system, comprising an aging table, a control module, a plurality of mutually independent aging work areas, and an aging power supply, polarity and corresponding to each aging work area. A transfer switch, an alarm device, and a station group are arranged in the aging working area. The transistor to be tested is placed on the station group, and the station group is connected with the control module through the drive module. Each aging work area is provided with a switchable cabinet door. There is a temperature sensor in the aging work area. The aging table is also equipped with a water-cooling circulation device, which is set up in zones, and adjusts the temperature of each aging work area respectively. The invention has the following beneficial effects: through the partitioned aging work area and the partitioned water cooling circulation device, different aging environments can be simulated on the aging table at the same time, and the aging test of transistors under different aging environments can be realized at the same time.
Description
Technical Field
The invention relates to the technical field of transistor aging, in particular to a partitioned transistor aging system.
Background
Today, as electronic technology develops rapidly, the requirement on the reliability of the whole machine is higher and higher, and screening of electronic components before formal use is very necessary. In normal operation of various electronic components including diodes, transistors, integrated circuits, etc., the reliability of the whole device is often affected due to component failure caused by manufacturing defects, etc., so it is very important to perform a reliability test on a certain batch of components in advance when the batch of components is used.
The failure phenomena of the electronic components can be classified into early failure, random failure and loss failure, the failure rate varies according to the working stage (power-on stress time), and fig. 1 shows the relationship between each working stage and the failure rate. A batch of product in a large batch, which is put into service without any aging measures, is found to be highly inefficient at the start of its operation, but quickly degrades. This stage of failure rate degradation is referred to as the early life stage. The failure in this period is caused by manufacturing defects, the failure rate of the component is stabilized after the unqualified component fails before Te, the working period is called the service life period, and the failure rate occurring in this period is called random, accidental or burst failure. Since these failures are random and unpredictable, degradation begins to occur when the product is operated to time Tw, and failure rates increase again due to aging and wear of components close to their "rated life".
Therefore, before a large quantity of electronic components are used, various potential defects hidden in the electronic components are often required to be exposed early through an aging test, so that the aim of removing the electronic components which fail early is fulfilled.
Patent CN202022605861.6 discloses an ageing testing board and ageing testing frame thereof, including ageing testing plate body and positioning groove, the front surface of ageing testing plate body is provided with accuse temperature plate body, and the outside of accuse temperature plate body is provided with socket group, the thermovent has been seted up to the inboard of ageing testing plate body, and the left and right sides of ageing testing plate body has all seted up the location slider, positioning groove sets up in the outside upper end of location slider, and positioning groove's inside is provided with fixture block, fixture block's upper end is connected with the location pivot, and fixture block's the outside is fixed with the gag lever post, the outside of gag lever post is provided with the test rack body, and the lower extreme of test rack body is fixed with the support column.
Although the technical scheme and the traditional burn-in platform can realize the burn-in test of the transistor, the technical scheme and the traditional burn-in platform still have the following defects: only a single aging environment can be provided at the same time, and the aging test can be carried out under the single aging environment, so that the requirement of simultaneously aging the transistor under various environments cannot be met.
Disclosure of Invention
The invention mainly aims to overcome the defects in the prior art and provide a partitioned transistor aging system. The aging system has the advantages of realizing subarea aging and the like.
The technical scheme adopted by the invention for realizing the technical purpose is as follows: a partition type transistor aging system comprises an aging platform and is structurally characterized in that: the aging table is provided with a control module, a plurality of aging working areas which are mutually independent, and an aging power supply, a polarity conversion switch and an alarm device which are matched with each aging working area, wherein a work position group is arranged in each aging working area, a transistor to be tested is placed on the work position group, the work position group is connected with the control module through a driving module, and the driving module is fixed in the aging working areas; each ageing workspace is provided with a cabinet door capable of being opened and closed.
The temperature sensor is arranged in the aging working area, so that the temperature of the aging working area is measured and fed back, and the temperature can be adjusted conveniently and timely.
The ageing platform still is equipped with water-cooling circulating device, water-cooling circulating device is the subregion setting, adjusts each ageing workspace's temperature respectively, makes each ageing workspace carry out ageing work under different ageing environment simultaneously.
The control module controls the whole operation of the aging system, is electrically connected with the temperature sensor, the water-cooling circulating device and the driving module, timely receives a temperature signal of the temperature sensor, feeds back the temperature signal through the water-cooling circulating device, and timely adjusts the temperature in the aging working area.
Preferably, the ageing desk sets gradually control module, ageing workspace, polarity change over switch and ageing power down from last, alarm device sets up in the cabinet door outside in ageing workspace, the water-cooling circulating device sets up in the rear in ageing workspace, when reducing whole volume, the staff of being convenient for operates.
Preferably, the alarm device comprises alarm indicating lamps, the number of the alarm indicating lamps is the same as that of the transistors to be tested on the station group, the alarm indicating lamps correspond to the transistors to be tested one by one, and the alarm indicating lamps are arranged on the outer sides of the cabinet doors of the aging working areas. The warning information is conveniently found by workers in time, and the transistor which specifically generates the warning information is quickly positioned.
Preferably, the control module comprises a main control board, an interactive keyboard and a display screen. And the aging time, the aging temperature interval and other information are set through the interactive keyboard, so that the operation is convenient.
Preferably, the water-cooling circulation device comprises a partition water tank and a main water tank, the partition water tank is arranged on the inner wall of the aging working area and communicated with the main water tank, a flow regulating valve is arranged at the communication position, and the main water tank is provided with a refrigerating assembly and arranged outside the aging working area.
Preferably, the surface of the partition water tank is irregular, so that the contact area between the partition water tank and the inside of the aging workbench is increased, and the cooling effect is improved.
Preferably, the water-cooling circulation device further comprises an overpressure and under-pressure water pressure gauge, so that the under-pressure and overpressure protection functions of the water pressure of the cooling water are realized.
Preferably, a plurality of work stations are arranged in the aging work area, transistors to be tested with different powers are arranged on different work stations, and aging tests of the transistors with different powers can be performed.
Preferably, the aging working area is provided with a plurality of groups of aging power supplies, and the aging power supplies can adapt to the power required by different station groups in the aging working area to carry out aging tests.
Preferably, the aging system further comprises a self-excitation prevention circuit for preventing self-excitation oscillation of the circuit.
Preferably, the side of the peripheral wall of the inner part of the aging working area except the inner wall is provided with a heat insulation layer, so that the aging working areas are mutually isolated, and the mutual influence is reduced.
Preferably, a heating assembly is arranged in the aging working area and electrically connected with the control module, so that the temperature in the aging working area can be increased, and a high-temperature aging environment can be simulated.
Preferably, the control module comprises a printing module and a communication module, and the printing module can print voltage and current parameters of each station in operation through the communication connection between the communication module and an external computer. The communication module can communicate with the computer and transmit the operation data to an external computer.
The invention has the beneficial effects that: according to the invention, different aging environments can be simulated on the aging table at the same time through the partitioned aging working area and the partitioned water-cooling circulating device, so that the transistor can be subjected to aging test in different aging environments at the same time, and the use is more convenient; and secondly, station groups with different powers and a plurality of groups of aging power supplies are arranged in the aging working area, so that the aging tests of transistors with different powers can be performed in the same aging working area, and the application range is wider.
Drawings
Fig. 1 is a relationship between each operation stage and failure rate of a failure phenomenon of an electronic component.
FIG. 2 is a schematic diagram of a partitioned transistor burn-in system according to the present invention.
FIG. 3 is an overall schematic diagram of a partitioned transistor burn-in system of the present invention.
Fig. 4 is a functional block diagram of a partitioned transistor burn-in system of the present invention.
FIG. 5 is a circuit diagram of a self-excitation prevention circuit of a partitioned transistor aging system of the present invention.
Wherein: 1. an aging table; 2. a control module; 21. a main control board; 22. an interactive keyboard; 23. a display screen; 24. a printing module; 25. a communication module; 3. an aging working area; 31. a station group; 32. a drive module; 33. a cabinet door; 34. a temperature sensor; 4. an aging power supply; 5. a polarity reversing switch; 6. an alarm device; 61. an alarm indicator light; 7. a water-cooling circulation device; 71. a partitioned water tank; 72. a main body water tank; 73. a flow regulating valve; 74. a refrigeration assembly; 75. an overpressure and underpressure water pressure gauge.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail below with reference to the accompanying drawings and examples. It should be understood, however, that the description herein of specific embodiments is only intended to illustrate the invention and not to limit the scope of the invention. Moreover, in the following description, descriptions of well-known structures and techniques are omitted so as to not unnecessarily obscure the concepts of the present invention.
In the description of the present invention, it should be noted that when an element is referred to as being "fixed" or "disposed" to another element, it can be directly on the other element or be indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or be indirectly connected to the other element.
In the description of the present invention, it should be noted that the terms "center", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings or the orientations or positional relationships in which the products of the present invention are conventionally placed when used, and are merely used for convenience of describing and simplifying the description, but do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," "third," and the like are used solely to distinguish one from another and are not to be construed as indicating or implying relative importance. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically defined otherwise. The meaning of "a number" is one or more unless specifically limited otherwise.
In the description of the present invention, it should also be noted that, unless otherwise explicitly specified or limited, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Referring to fig. 2, 3 and 4, in embodiment 1, a partitioned transistor aging system includes an aging table 1, where the aging table 1 is provided with a control module 2, a plurality of aging working areas 3 independent of each other, and an aging power supply 4, a polarity conversion switch 5 and an alarm device 6 which are matched with each aging working area 3, a station group 31 is arranged in each aging working area 3, a transistor to be tested is placed on the station group 31, the station group 31 is connected with the control module 2 through a driving module 32, and the driving module 32 is fixed in the aging working area; each aging working area 3 is provided with a cabinet door 33 which can be opened and closed. In this embodiment, there are four aging working areas, which are the first aging working area, the second aging working area, the third aging working area and the fourth aging working area.
And a temperature sensor 34 is arranged in each aging working area 3, so that the temperature of the aging working area 3 is measured and fed back, and the temperature can be adjusted conveniently and timely.
The aging platform 1 is further provided with a water-cooling circulation device 7, the water-cooling circulation device 7 is arranged in a partition mode, and the temperature of each aging working area 3 is adjusted respectively, so that each aging working area 3 can perform aging work under different aging environments at the same time. The water-cooling circulation device 7 comprises a partition water tank 71 and a main water tank 72, wherein the partition water tank 71 is arranged on the inner wall of the aging working area 3 and communicated with the main water tank 72, a flow regulating valve 73 is arranged at the communication position, and the main water tank 72 is provided with a refrigerating assembly 74 and arranged outside the aging working area 3. The temperature of each aging working area is adjusted by adjusting the flow rate of water flow through the flow adjusting valve 73.
Specifically, the control module is provided with an aging temperature and can be provided with an upper temperature interval and a lower temperature interval, the temperature sensor detects the real-time temperature in an aging working area in the aging process, and when the internal temperature is higher than the set temperature, the water flow is increased, and the temperature is reduced in an accelerated manner; when the internal temperature is lower than the set temperature, the water flow is reduced, the temperature reduction is slowed down, and the temperature is increased through the self heat generation of the transistor or the equipment.
The surface of the partition water tank 71 is irregular, so that the contact area between the partition water tank and the inside of the aging workbench is increased, and the cooling effect is improved.
The water-cooling circulation device 7 further comprises an overpressure and underpressure water pressure gauge 75, so that the underpressure and overpressure protection function of the water pressure of the cooling water is realized.
In the actual use process of the transistors, the same transistor batch is applied to different temperature environments, so that the same transistor batch needs to be aged in different environments, and the transistors subjected to the aging test at corresponding temperatures can be applied to corresponding use environments again. In this embodiment, the water-cooling circulation device and the four mutually independent aging working areas arranged in different regions can form four independent aging environments, and the same transistor batch can be subjected to aging tests in different aging environments at the same time and then applied to corresponding environments after the tests. The aging process is simpler, and the transistors aged in different aging environments can be simultaneously produced.
Meanwhile, the four aging working areas and the water-cooling circulating device are arranged in a partitioning mode, when one aging working area breaks down, the operation of other aging working areas cannot be influenced, and the aging work can be continued. However, the conventional aging device which is not partitioned cannot perform aging work on the whole after the aging device fails, and aging efficiency is affected.
The control module 2 controls the whole operation of the aging system, is electrically connected with the temperature sensor 34, the water-cooling circulating device 7 and the driving module 32, timely receives a temperature signal of the temperature sensor, feeds back the temperature signal through the water-cooling circulating device, and timely adjusts the temperature in an aging working area.
The aging platform 1 is sequentially provided with a control module 2, an aging working area 3, a polarity change-over switch 5 and an aging power supply 4 from top to bottom, an alarm device 6 is arranged outside a cabinet door 33 of the aging working area 3, a water-cooling circulation device 7 is arranged behind the aging working area 3, and the top of the aging platform is provided with a main switch. The whole volume is reduced, and meanwhile, the operation is convenient for workers.
Referring to fig. 4, as shown in the figure, a plurality of station groups are arranged in the aging working area 3, and transistors to be tested with different powers are arranged on different station groups, so that the aging tests of the transistors with different powers can be performed. In this embodiment, a work station group of 50W/16 work stations and 150W/8 work stations is provided in the aging work area.
The aging working area 3 is provided with a plurality of groups of aging power supplies 4, and the aging power supplies 4 can adapt to the power required by different work groups in the aging working area to carry out aging tests. In this embodiment, 4 groups of dc aging power supplies are configured as follows: vb power supply: 25V/40A, Vc Power supply: 60V/80A.
The power is supplied to the first aging working area by Vb1 and Vc1, the power is supplied to the second aging working area by Vb2 and Vc2, the power is supplied to the third aging working area by Vb3 and Vc3, and the power is supplied to the fourth aging working area by Vb4 and Vc 4.
The aging working area can select a station group of 50W/16 stations or 150W/8 stations for aging test, and simultaneously selects a corresponding aging power supply for supplying power. The aging test can be carried out on the transistors with different powers in the aging working area, the application range is wider, and meanwhile, the corresponding aging power supply is equipped, so that the use is more convenient.
The aging working area in this embodiment can simultaneously perform aging tests on transistors of the same power in different environments, except for the conventional method in which the transistors of the same power are aged in the same environment, and can simultaneously produce aged transistors in different aging environments to compare the failure probabilities of the transistors in different environments. And the transistors with different powers can be aged in the same environment or different environments, so that the use method is more diversified and the aging device is more convenient in the actual use process.
The alarm device 6 comprises alarm indicating lamps 61, the number of the alarm indicating lamps 61 is the same as that of the transistors to be tested on the station groups, the alarm indicating lamps 61 correspond to the transistors to be tested one by one, and the alarm indicating lamps 61 are arranged on the outer sides of the cabinet doors 33 of the aging work areas. In this embodiment, 16 alarm indicator lamps of the station group of 50W/16 stations are divided into two parallel rows and arranged outside the cabinet door 33. The number of the indicator lamps in the work station group of 150W/8 stations is 8, the overall shape of the indicator lamps is different from that of the alarm indicator lamps in the work station group of 50W/16 stations, and the indicator lamps are arranged below the 16 alarm indicator lamps. The setting of alarm indicator lamp, the staff of being convenient for in time discovers alarm information to fix a position the specific transistor that produces alarm information fast.
The control module 2 comprises a main control panel 21, an interactive keyboard 22 and a display screen 23. And the aging time, the aging temperature interval and other information are set through the interactive keyboard, so that the operation is convenient.
The aging system further comprises a self-excited prevention circuit for preventing self-oscillation of the circuit, and the circuit diagram is shown in fig. 5.
The side of the peripheral wall of the inner part of the aging working area except the inner wall is provided with a heat insulation layer, so that the aging working area is isolated from each other, and the mutual influence is reduced.
Be equipped with heating element in the ageing workspace, heating element is connected with the control module electricity, can improve the temperature in the ageing workspace, the ageing environment of simulation high temperature.
The control module 2 comprises a printing module 24 and a communication module 25, and the printing module is in communication connection with an external computer through the communication module and can print voltage and current parameters of each station in operation. The communication module can communicate with the computer and transmit the operation data to an external computer.
The real-time use process is as follows:
the staff sets for information such as time and temperature of aging testing through interactive keyboard on the control module and reality screen, opens the cabinet door in ageing work district, installs the transistor on the worker's position, opens polarity change over switch after closing the cabinet door, and ageing power supplies power to ageing work district, carries out the ageing of transistor, and water-cooling circulating device begins to operate simultaneously, carries out temperature regulation to ageing work district, accomplishes aging testing after the settlement time finishes.
It should be noted that, although the above embodiments have been described herein, the invention is not limited thereto. Therefore, based on the innovative concepts of the present invention, the technical solutions of the present invention can be directly or indirectly applied to other related technical fields by making changes and modifications to the embodiments described herein, or by using equivalent structures, equivalent processes, or equivalent functional transformations made in the contents of the present specification and the accompanying drawings, which are included in the scope of the present patent.
Claims (10)
1. A partitioned transistor burn-in system comprising a burn-in stage (1), characterized in that: the aging table (1) is provided with a control module (2), a plurality of aging working areas (3) which are mutually independent, and an aging power supply (4), a polarity conversion switch (5) and an alarm device (6) which are matched with each aging working area (3), wherein a work station group (31) is arranged in each aging working area (3), a transistor to be tested is placed on the work station group (31), the work station group (31) is connected with the control module (2) through a driving module (32), and the driving module (32) is fixed in the aging working areas; each aging working area (3) is provided with a cabinet door (33) which can be opened and closed;
a temperature sensor (34) is arranged in the aging working area (3) and is used for measuring the temperature of the aging working area (3);
the aging table (1) is also provided with a water-cooling circulating device (7), the water-cooling circulating device (7) is arranged in a subarea manner, and the temperature of each aging working area (3) is adjusted respectively, so that each aging working area (3) can perform aging work under different aging environments at the same time;
the control module (2) controls the whole aging system to operate and is electrically connected with the temperature sensor (34), the water-cooling circulating device (7) and the driving module (32).
2. The partitioned transistor burn-in system of claim 1, wherein:
ageing platform (1) sets gradually control module (2), ageing workspace (3), polarity change over switch (5) and ageing power (4) from last to down, alarm device (6) set up in the cabinet door (33) outside of ageing workspace (3), water-cooling circulating device (7) set up in the rear of ageing workspace (3).
3. The partitioned transistor burn-in system of claim 2, wherein:
the alarm device (6) comprises alarm indicating lamps (61), the number of the alarm indicating lamps (61) is the same as that of the transistors to be tested on the station group, the alarm indicating lamps correspond to the transistors to be tested one by one, and the alarm indicating lamps (61) are arranged on the outer sides of the cabinet doors (33) of the aging working areas.
4. The partitioned transistor burn-in system of claim 1, wherein:
the control module (2) comprises a main control board (21), an interactive keyboard (22) and a display screen (23).
5. The partitioned transistor burn-in system of claim 1, wherein:
water-cooling circulating device (7) are including subregion water tank (71), main part water tank (72), subregion water tank (71) is located ageing workspace (3) inner wall is linked together with main part water tank (72), and the intercommunication department is equipped with flow control valve (73), main part water tank (72) are equipped with refrigeration assembly (74), locate outside ageing workspace (3).
6. The partitioned transistor burn-in system of claim 5, wherein:
the surface of the partition water tank (71) is irregular, and the contact area between the partition water tank and the inside of the aging workbench is increased.
7. The partitioned transistor burn-in system of claim 5, wherein:
the water-cooling circulating device (7) further comprises an overpressure and under-pressure water pressure gauge (75).
8. The partitioned transistor burn-in system of claim 1, wherein:
a plurality of work stations are arranged in the aging work area (3), and transistors to be tested with different powers are arranged on different work stations.
9. The partitioned transistor burn-in system of claim 8, wherein:
the aging working area (3) is provided with a plurality of groups of aging power supplies (4), and the aging power supplies (4) can adapt to the power required by different work groups in the aging working area to carry out aging test.
10. The partitioned transistor burn-in system of claim 1, wherein: the aging system further comprises a self-excitation prevention circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111211568.4A CN113835009A (en) | 2021-11-23 | 2021-11-23 | A partitioned transistor aging system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111211568.4A CN113835009A (en) | 2021-11-23 | 2021-11-23 | A partitioned transistor aging system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN113835009A true CN113835009A (en) | 2021-12-24 |
Family
ID=78965234
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202111211568.4A Pending CN113835009A (en) | 2021-11-23 | 2021-11-23 | A partitioned transistor aging system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN113835009A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114384404A (en) * | 2022-03-23 | 2022-04-22 | 上海菲莱测试技术有限公司 | Cooling test assembly unit and aging cooling device |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20010016254A (en) * | 2000-11-28 | 2001-03-05 | 박재규 | Apparatus for and method of testing LCD modules on aging |
| CN207215920U (en) * | 2017-08-29 | 2018-04-10 | 深圳市东飞凌科技有限公司 | Weatherometer and aging testing system |
| CN108828432A (en) * | 2018-06-08 | 2018-11-16 | 湖州慧能机电科技有限公司 | A kind of high-power chip ageing tester |
| CN109119127A (en) * | 2018-08-30 | 2019-01-01 | 武汉精鸿电子技术有限公司 | A kind of semiconductor memory high/low temperature ageing test box |
| CN113533890A (en) * | 2021-07-29 | 2021-10-22 | 深圳市禹龙通电子股份有限公司 | Water-cooling aging equipment control system |
| CN216310187U (en) * | 2021-11-23 | 2022-04-15 | 杭州精瑞科技有限公司 | Partitioned transistor aging system |
-
2021
- 2021-11-23 CN CN202111211568.4A patent/CN113835009A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20010016254A (en) * | 2000-11-28 | 2001-03-05 | 박재규 | Apparatus for and method of testing LCD modules on aging |
| CN207215920U (en) * | 2017-08-29 | 2018-04-10 | 深圳市东飞凌科技有限公司 | Weatherometer and aging testing system |
| CN108828432A (en) * | 2018-06-08 | 2018-11-16 | 湖州慧能机电科技有限公司 | A kind of high-power chip ageing tester |
| CN109119127A (en) * | 2018-08-30 | 2019-01-01 | 武汉精鸿电子技术有限公司 | A kind of semiconductor memory high/low temperature ageing test box |
| CN113533890A (en) * | 2021-07-29 | 2021-10-22 | 深圳市禹龙通电子股份有限公司 | Water-cooling aging equipment control system |
| CN216310187U (en) * | 2021-11-23 | 2022-04-15 | 杭州精瑞科技有限公司 | Partitioned transistor aging system |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114384404A (en) * | 2022-03-23 | 2022-04-22 | 上海菲莱测试技术有限公司 | Cooling test assembly unit and aging cooling device |
| CN114384404B (en) * | 2022-03-23 | 2022-08-23 | 上海菲莱测试技术有限公司 | Cooling test assembly unit and aging cooling device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101813713B (en) | Probe unit for testing planar display panel | |
| CN216310187U (en) | Partitioned transistor aging system | |
| CN113835009A (en) | A partitioned transistor aging system | |
| CN112444736A (en) | Chip temperature testing system | |
| US20120103967A1 (en) | Burn-in oven having inverter fan and heat regulator | |
| KR101815495B1 (en) | LCD/OLED Display Panel Inspection method and System | |
| CN111426976B (en) | High-power DC-DC aging test device | |
| CN214795105U (en) | Chip product FT testing arrangement | |
| CN205910219U (en) | LED lamp bead test box with multiple test chambers | |
| CN110174414A (en) | A kind of Micro-OLED product optical detection apparatus and wafer chip detection method | |
| CN220252115U (en) | A relay batch calibrator | |
| TWM611776U (en) | An automated test system using bridge connection | |
| KR101997847B1 (en) | Interface board for testing semiconductor device using coolant | |
| CN213715322U (en) | Transformer direct current resistance tester | |
| CN215768817U (en) | Aging table for three-terminal voltage stabilizer | |
| CN114184935A (en) | ATE board card state display device and display method | |
| CN212301767U (en) | Circuit board testing device | |
| CN222913796U (en) | Semiconductor intelligent distributed SIC power device test equipment | |
| CN216626414U (en) | Rubidium atomic clock smelts screening installation always | |
| CN209894849U (en) | High-precision detection clamp for laser chip | |
| CN222212881U (en) | Chip aging testing device | |
| KR20230053759A (en) | Multi-cell lighting signal generator capable of long-distance signal transmission | |
| CN206321665U (en) | A kind of band automatic staight needle test jack of heating function | |
| CN220671854U (en) | Multi-input-output controller test board of DC110V system | |
| CN111722972A (en) | Memory high-low temperature testing device and testing method thereof |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |