CN113702859B - Power supply testing device - Google Patents

Abstract

The present application discloses a power supply test device, comprising: various detection devices; a test device connected to each test pin of the power supply to be tested and connected to each detection device; a controller connected to the test device and each detection device, used to control the state switching of the test device according to a preset automatic power supply test process to automatically adjust the test pin of the power supply to be tested connected to each detection device; and obtain the test result of the power supply to be tested by receiving the detection data sent by each detection device when executing the automatic power supply test process. By applying the scheme of the present application, the test of the power supply to be tested can be automatically completed, and no rewiring is required during the test process, which effectively improves the power supply test efficiency.

Description

A power supply testing device

Technical Field

The invention relates to the field of testing technology, and in particular to a power supply testing device.

Background technique

With the rapid development of the Internet, people are becoming more and more dependent on the network, and network data traffic has increased dramatically. Therefore, people are increasingly dependent on high-performance servers. The number of servers is also increasing, and the server development cycle is constantly shortening. The test of the power chip in the server is an important part of the server test, and it is very necessary to improve the test efficiency.

Currently, manual testing is used, which requires workers to find test points, weld flying wires, weld load wires, and connect oscilloscopes, electronic loads, multimeters and other testing equipment. In addition, since different test items require different test signals, when switching test items, it is often necessary to re-weld wires and reconnect with the testing equipment, resulting in low test efficiency.

In summary, how to effectively improve the power supply test efficiency is a technical problem that those skilled in the art urgently need to solve.

Summary of the invention

The object of the present invention is to provide a power supply testing device to effectively improve the power supply testing efficiency.

In order to solve the above technical problems, the present invention provides the following technical solutions:

A power supply testing device, comprising:

Various testing equipment;

A test device connected to each test pin of the power supply to be tested and connected to each of the detection devices;

A controller connected to the test device and each of the detection devices is used to control the state switching of the test device according to a preset automatic power supply test process to automatically adjust the test pins of the power supply to be tested connected to each of the detection devices; and obtain the test result of the power supply to be tested by receiving the detection data sent by each of the detection devices when executing the automatic power supply test process.

Preferably, the detection device comprises:

A first oscilloscope whose positive terminal is connected to the voltage input pin of the power supply to be tested through the test device and whose negative terminal is grounded; a second oscilloscope whose positive terminal is connected to the first end of the first switch switching circuit in the test device and whose negative terminal is grounded; a third oscilloscope whose positive terminal is connected to the voltage output pin of the power supply to be tested through the test device and whose negative terminal is grounded; a fourth oscilloscope whose positive terminal is connected to the enable pin of the power supply to be tested through the test device and whose negative terminal is grounded; an electronic load connected to the voltage output pin of the power supply to be tested through the test device;

The testing device comprises the first switch switching circuit, and the second end and the third end of the first switch switching circuit are respectively connected to the PG pin and the Phase pin of the power supply to be tested;

The controller is specifically used to: perform a power-on timing test and a jitter test on the power supply to be tested according to the automatic power supply test process;

When performing the power-on timing test, the first switch switching circuit is controlled to be in a default state so that the first end of the first switch switching circuit is turned on with the second end of the first switch switching circuit, so as to receive the PG signal of the power supply to be tested detected by the second oscilloscope, and receive the output voltage signal Vout of the power supply to be tested detected by the third oscilloscope, the input voltage signal Vin of the power supply to be tested detected by the first oscilloscope, and the enable signal EN of the power supply to be tested detected by the fourth oscilloscope, so as to obtain the power-on timing test result;

When performing the jitter test, the first switch switching circuit is controlled to a non-default state so that the first end of the first switch switching circuit and the third end of the first switch switching circuit are turned on to receive the Phase signal of the power supply to be tested detected by the second oscilloscope to obtain the jitter test result.

Preferably, the controller is also used for:

Performing a ripple test, a voltage overshoot test, and a voltage undershoot test on the power supply to be tested according to the automated power supply test process;

When performing the ripple test, receiving the output voltage signal Vout of the power supply to be tested detected by the third oscilloscope to obtain a ripple test result;

When performing the voltage overshoot test, receiving the output voltage signal Vout of the power supply to be tested detected by the third oscilloscope to obtain a voltage overshoot test result;

When performing the voltage undershoot test, the output voltage signal Vout of the power supply to be tested detected by the third oscilloscope is received to obtain a voltage undershoot test result.

Preferably, the controller is also used for:

Performing a surge voltage test on the power supply to be tested according to the automated power supply test process;

When performing the surge voltage test, the output voltage signal Vout of the power supply to be tested detected by the third oscilloscope is received to obtain a surge voltage test result.

Preferably, it further comprises: a first multimeter connected to the voltage output pin of the power supply to be tested through the testing device;

The controller is also used for:

The static voltage test of the power supply to be tested is performed according to the automatic power supply test process, and when performing the static voltage test, the output voltage signal Vout of the power supply to be tested detected by the first multimeter is received to obtain a static voltage test result.

Preferably, it also includes:

A first DC power supply connected to a third terminal of a second switch circuit in the test device; a second multimeter connected to a voltage input pin of the power supply to be tested through the test device;

The test device also includes a first resistor, a second switch switching circuit, a third switch switching circuit and a fourth switch switching circuit; the first end and the second end of the first resistor are respectively connected to the voltage output pin of the power supply to be tested and the input end of the electronic load; the first end and the second end of the second switch switching circuit are respectively connected to the voltage input pin of the power supply to be tested and the mainboard power supply pin of the power supply to be tested; the first end, the second end, and the third end of the third switch switching circuit are respectively connected to the positive terminal of the fourth oscilloscope, the enable terminal pin of the power supply to be tested, and the first end of the first resistor; the first end and the third end of the fourth switch switching circuit are respectively connected to the negative terminal of the fourth oscilloscope and the second end of the first resistor, and the second end of the fourth switch switching circuit is grounded;

The controller is also used to: perform efficiency test of the power supply to be tested according to the automatic power supply test process;

When performing the efficiency test, receiving an input voltage signal Vin of the power supply to be tested detected by the second multimeter and an output voltage signal Vout of the power supply to be tested detected by the first multimeter;

Controlling the second switch switching circuit to a non-default state so that the first end of the second switch switching circuit and the third end of the second switch switching circuit are conductive, so that the first DC power supply supplies power to the power supply to be tested, and determining a supply current value of the first DC power supply;

Controlling the third switch switching circuit and the fourth switch switching circuit to be in a non-default state, so that the first end of the third switch switching circuit is connected to the third end of the third switch switching circuit, and the first end of the fourth switch switching circuit is connected to the third end of the fourth switch switching circuit, so as to receive the terminal voltage signal of the first resistor detected by the fourth oscilloscope;

Based on the input voltage signal Vin of the power supply to be tested detected by the second multimeter, the output voltage signal Vout of the power supply to be tested detected by the first multimeter, the supply current value of the first DC power supply and the terminal voltage signal of the first resistor, the efficiency value of the power supply to be tested is determined as the efficiency test result.

Preferably, the controller is further used to: perform an overcurrent protection test and a short-circuit protection test of the power supply to be tested according to the automatic power supply test process;

When performing the overcurrent protection test, the electronic load is controlled so that the power supply to be tested triggers the overcurrent protection, the input voltage signal Vin of the power supply to be tested detected by the first oscilloscope and the output voltage signal Vout of the power supply to be tested detected by the third oscilloscope are received, and the first switch switching circuit is controlled to be in a default state to receive the PG signal of the power supply to be tested detected by the second oscilloscope, so as to obtain the overcurrent protection test result;

When performing the short-circuit protection test, the electronic load is controlled to be short-circuited, the input voltage signal Vin of the power supply to be tested detected by the first oscilloscope and the output voltage signal Vout of the power supply to be tested detected by the third oscilloscope are received, and the first switch switching circuit is controlled to be in a default state to receive the PG signal of the power supply to be tested detected by the second oscilloscope; the third switch switching circuit and the fourth switch switching circuit are controlled to be in a non-default state to determine the current value flowing through the first resistor and determine the short-circuit protection test result.

Preferably, it also includes:

A frequency response analyzer connected through the test device to the first frequency analysis pin and the second frequency analysis pin of the power supply to be tested;

The controller is also used to: perform a frequency response test of the power supply to be tested according to the automatic power supply test process;

When performing the frequency response test, an output signal of a frequency response analyzer is received and a frequency response test result is obtained.

Preferably, each test pin of the power supply to be tested is integrated in a preset connector.

Preferably, the controller is a controller in a host computer.

The technical solution provided by the embodiment of the present invention is applied, and a test device for connecting with each test pin of each detection device and the power supply to be tested is specially set, so that when the solution of the present application switches the test items, it is not necessary to reconnect the test device with each test pin of the power supply to be tested, nor is it necessary to reconnect the test device with each detection device, and the adjustment of the connection mode can be realized only through the controller. Specifically, the controller is connected with the test device and each detection device, and the state switching of the test device can be controlled according to the preset automatic power supply test process, so as to automatically adjust the test pin of the power supply to be tested connected by each detection device. In addition, the controller can obtain the test result of the power supply to be tested by the detection data sent by each detection device received when executing the automatic power supply test process, that is, by using the controller and the test device, it is possible to switch the connection without the need to, and automatically complete the test of the power supply to be tested, obtain the test result of the power supply to be tested, and effectively improve the power supply test efficiency.

BRIEF DESCRIPTION OF THE DRAWINGS

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

FIG1 is a schematic diagram of the structure of a power supply testing device in the present invention;

FIG2 is a schematic diagram of the structure of another power supply testing device in the present invention;

FIG3 is a schematic diagram of the structure of another power supply testing device in the present invention.

Detailed ways

The core of the present invention is to provide a power supply testing device, which can automatically complete the test of the power supply to be tested, and does not need to reconnect the wires during the test, thereby effectively improving the power supply testing efficiency.

In order to enable those skilled in the art to better understand the scheme of the present invention, the present invention is further described in detail below in conjunction with the accompanying drawings and specific implementation methods. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

Please refer to FIG. 1 , which is a schematic diagram of the structure of a power supply testing device in the present invention. The power supply testing device may include:

Various testing devices 10;

A test device 20 connected to each test pin of the power supply to be tested and connected to each detection device 10;

The controller 30 connected to the test device 20 and each detection device 10 is used to control the state switching of the test device 20 according to a preset automatic power supply test process to automatically adjust the test pins of the power supply to be tested connected to each detection device 10; and obtain the test result of the power supply to be tested by receiving the detection data sent by each detection device 10 when executing the automatic power supply test process.

The specific number and type of the detection devices 10 can be set and adjusted as needed, and will be affected by the specific items that need to be tested for the power supply to be tested. In practical applications, it is usually necessary to use multiple detection devices 10.

The test device 20 is connected to each test pin of the power supply to be tested, and is connected to each detection device 10. Therefore, each detection device 10 can be connected to the power supply to be tested through the test device 20, and the specific pins to be connected will be affected by the state of the test device 20. Therefore, when testing different items of the power supply to be tested, the solution of the present application does not need to re-plug the detection device 10 as in the traditional solution, but can switch the state of the test device 20 through the controller 30. That is, the controller 30 of the present application can control the state switching of the test device 20 according to the preset automatic power supply test process to automatically adjust the test pins of the power supply to be tested connected to each detection device 10.

Furthermore, when executing the automated power supply test process, the controller 30 of the present application can receive the test data sent by each detection device 10, so that the controller 30 can automatically obtain the test result of the power supply to be tested, further improving the power supply test efficiency of the present application solution.

The specific content of the automated power supply test process can be set and adjusted as needed. For example, in some cases, a complete set of tests for the power supply to be tested may be included, while in other cases, only a portion of the test items may be included as needed.

In a specific embodiment of the present invention, referring to FIG. 2 , the detection device 10 may include:

A first oscilloscope CH1 whose positive terminal is connected to the voltage input pin of the power supply to be tested through the test device 20 and whose negative terminal is grounded; a second oscilloscope CH2 whose positive terminal is connected to the first end of the first switch switching circuit 21 in the test device 20 and whose negative terminal is grounded; a third oscilloscope CH3 whose positive terminal is connected to the voltage output pin of the power supply to be tested through the test device 20 and whose negative terminal is grounded; a fourth oscilloscope CH4 whose positive terminal is connected to the enable pin of the power supply to be tested through the test device 20 and whose negative terminal is grounded; an electronic load Z1 connected to the voltage output pin of the power supply to be tested through the test device 20;

The test device 20 includes a first switch switching circuit 21, and the second end and the third end of the first switch switching circuit 21 are respectively connected to the PG pin and the Phase pin of the power supply to be tested;

The controller 30 is specifically used to: perform a power-on timing test and a jitter test on the power supply to be tested according to an automated power supply test process;

When performing a power-on timing test, the first switch switching circuit 21 is controlled to be in a default state so that the first end of the first switch switching circuit 21 is connected to the second end of the first switch switching circuit 21, so as to receive the PG signal of the power supply to be tested detected by the second oscilloscope CH2, and receive the output voltage signal Vout of the power supply to be tested detected by the third oscilloscope CH3, the input voltage signal Vin of the power supply to be tested detected by the first oscilloscope CH1, and the enable signal EN of the power supply to be tested detected by the fourth oscilloscope CH4, so as to obtain a power-on timing test result;

When performing a jitter test, the first switch switching circuit 21 is controlled to a non-default state so that the first end of the first switch switching circuit 21 and the third end of the first switch switching circuit 21 are turned on to receive the Phase signal of the power supply to be tested detected by the second oscilloscope CH2 to obtain the jitter test result.

The power supply testing device 20 in this embodiment can automatically complete the power-on timing test and jitter test of the power supply to be tested.

When performing a power-on sequence test, i.e., a SEQUENCE test, since the controller 30 controls the first switch switching circuit 21 to be in a default state, the first end of the first switch switching circuit 21 is connected to the second end of the first switch switching circuit 21, i.e., the controller 30 can receive the PG (Power Good) signal of the power supply to be tested detected by the second oscilloscope CH2. In addition to the PG signal, when performing a power-on sequence test, the output voltage signal Vout of the power supply to be tested detected by the third oscilloscope CH3, the input voltage signal Vin of the power supply to be tested detected by the first oscilloscope CH1, and the enable signal EN of the power supply to be tested detected by the fourth oscilloscope CH4 are also required. Through these four signals, the power-on sequence test result can be obtained.

In FIG. 3 of the present application, pins of each switch switching circuit are numbered, for example, 1, 2, and 3 of the first switch switching circuit 21 in FIG. 3 respectively represent the first terminal, the second terminal, and the third terminal of the first switch switching circuit 21. In addition, the controller 30 is not shown in FIG. 2 and FIG. 3 of the present application.

When performing a jitter test, i.e., a Jitter test, the controller 30 controls the first switch switching circuit 21 to a non-default state, so that the first end of the first switch switching circuit 21 and the third end of the first switch switching circuit 21 are connected, so that the second oscilloscope CH2 detects the Phase signal of the power supply to be tested, and the jitter test result can be obtained through the Phase signal. The Phase signal refers to the signal at the SW end of the power supply to be tested.

In addition, in FIG. 2 of the present application, only the positive terminals of the first oscilloscope CH1 to the fourth oscilloscope CH4 are shown, and the negative terminals of the first oscilloscope CH1 to the fourth oscilloscope CH4 are not shown. Unless otherwise specified, the negative terminals of the first oscilloscope CH1 to the fourth oscilloscope CH4 are all grounded by default. Similarly, the first terminal, i.e., the input terminal, of the electronic load Z1 is connected to the voltage output pin of the power supply to be tested through the test device 20, and the second terminal of the electronic load Z1 is grounded.

In practical applications, power-on timing test is usually the first test item in the automated power supply test process.

Furthermore, in a specific embodiment of the present invention, the controller 30 may also be used for:

Perform ripple test, voltage overshoot test and voltage undershoot test of the power supply to be tested according to the automated power supply test process;

When performing a ripple test, an output voltage signal Vout of the power supply to be tested detected by the third oscilloscope CH3 is received to obtain a ripple test result;

When performing a voltage overshoot test, an output voltage signal Vout of the power supply to be tested detected by the third oscilloscope CH3 is received to obtain a voltage overshoot test result;

When performing the voltage undershoot test, the output voltage signal Vout of the power supply to be tested detected by the third oscilloscope CH3 is received to obtain the voltage undershoot test result.

In this implementation, the automated power supply test process also includes a ripple test, a voltage overshoot test, and a voltage undershoot test. The test results of these three tests can be obtained based on the output voltage signal Vout of the power supply to be tested detected by the third oscilloscope CH3.

In a specific embodiment of the present invention, it may also include: a first multimeter 11 connected to the voltage output pin of the power supply to be tested through the testing device 20;

The controller 30 is also used to:

The static voltage test of the power supply to be tested is performed according to the automatic power supply test process, and when the static voltage test is performed, the output voltage signal Vout of the power supply to be tested detected by the first multimeter 11 is received to obtain the static voltage test result.

In this implementation scheme, considering that the oscilloscope is suitable for detecting waveforms, when performing a static voltage test, i.e., a Static test, it is necessary to determine a stable output voltage value of the power supply to be tested. Therefore, referring to FIG. 3 , in this implementation scheme, a first multimeter 11 connected to the voltage output pin of the power supply to be tested through a test device 20 is provided. The first multimeter 11 is used to detect the stable output voltage of the power supply to be tested, and the controller 30 can obtain the static voltage test result based on the value.

In a specific embodiment of the present invention, the controller 30 may also be used to:

Perform surge voltage test on the power supply to be tested according to the automated power supply test process;

When performing the surge voltage test, the output voltage signal Vout of the power supply to be tested detected by the third oscilloscope CH3 is received to obtain the surge voltage test result.

The surge voltage test is also called transient test. The surge voltage test result can be obtained by detecting the output voltage signal Vout of the power supply to be tested by the third oscilloscope CH3.

In a specific embodiment of the present invention, it may also include:

A first DC power supply DC1 connected to a third terminal of a second switch circuit 22 in the test device 20; a second multimeter 12 connected to a voltage input pin of a power supply to be tested through the test device 20;

The test device 20 also includes a first resistor R1, a second switch switching circuit 22, a third switch switching circuit 23 and a fourth switch switching circuit 24; the first end and the second end of the first resistor R1 are respectively connected to the voltage output pin of the power supply to be tested and the input end of the electronic load Z1; the first end and the second end of the second switch switching circuit 22 are respectively connected to the voltage input pin of the power supply to be tested and the mainboard power supply pin of the power supply to be tested; the first end, the second end, and the third end of the third switch switching circuit 23 are respectively connected to the positive terminal of the fourth oscilloscope CH4, the enable terminal pin of the power supply to be tested, and the first end of the first resistor R1; the first end and the third end of the fourth switch switching circuit 24 are respectively connected to the negative terminal of the fourth oscilloscope CH4 and the second end of the first resistor R1, and the second end of the fourth switch switching circuit 24 is grounded;

The controller 30 is also used to: perform efficiency test of the power supply to be tested according to the automated power supply test process;

When performing the efficiency test, receiving the input voltage signal Vin of the power supply to be tested detected by the second multimeter 12 and the output voltage signal Vout of the power supply to be tested detected by the first multimeter 11;

Control the second switch switching circuit 22 to a non-default state so that the first end of the second switch switching circuit 22 and the third end of the second switch switching circuit 22 are conductive, so that the first DC power supply DC1 supplies power to the power supply to be tested, and determine the supply current value of the first DC power supply DC1;

Control the third switch switching circuit 23 and the fourth switch switching circuit 24 to be in a non-default state, so that the first end of the third switch switching circuit 23 is connected to the third end of the third switch switching circuit 23, and the first end of the fourth switch switching circuit 24 is connected to the third end of the fourth switch switching circuit 24, so as to receive the terminal voltage signal of the first resistor R1 detected by the fourth oscilloscope CH4;

According to the input voltage signal Vin of the power supply to be tested detected by the second multimeter 12, the output voltage signal Vout of the power supply to be tested detected by the first multimeter 11, the supply current value of the first DC power supply DC1 and the terminal voltage signal of the first resistor R1, the efficiency value of the power supply to be tested is determined as the efficiency test result.

The aforementioned implementation is a test item for voltage. In this implementation, in order to determine the efficiency value of the power supply to be tested, that is, to perform an Efficiency test, it is necessary to obtain the current value flowing through the electronic load Z1. In traditional solutions, a current probe is usually used to achieve detection. In the solution of the present application, the controller 30 controls the third switch switching circuit 23 and the fourth switch switching circuit to be in a non-default state. At this time, the first end of the third switch switching circuit 23 is connected to the third end of the third switch switching circuit 23, and the first end of the fourth switch switching circuit 24 is connected to the third end of the fourth switch switching circuit 24. In this way, the fourth oscilloscope CH4 detects the terminal voltage signal of the first resistor R1. Combined with the known resistance value of the first resistor R1, the current value flowing through the electronic load Z1, that is, the output current value of the power supply to be tested, can be determined.

In addition to the output current value of the power supply to be tested, in order to determine the efficiency value of the power supply to be tested, this implementation also needs to detect the input voltage signal Vin of the power supply to be tested by the second multimeter 12, and the output voltage signal Vout of the power supply to be tested detected by the first multimeter 11, and the supply current value of the first DC power supply DC1 can be directly read from the first DC power supply DC1.

The first DC power supply DC1 is DC Source. The controller 30 of the present application controls the second switch switching circuit 22 to a non-default state so that the first end of the second switch switching circuit 22 and the third end of the second switch switching circuit 22 are conductive, so that the first DC power supply DC1 can supply power to the power supply to be tested. The controller 30 can directly read the supply current value of the first DC power supply DC1, that is, the input current value of the power supply to be tested.

In addition, it should be noted that the first end and the second end of the second switch switching circuit 22 are respectively connected to the voltage input pin of the power supply to be tested and the mainboard power supply pin of the power supply to be tested, that is, in the default state of the second switch switching circuit 22, the power supply to be tested receives the power supply from the mainboard. In most test items, the power supply to be tested needs to receive the power supply from the mainboard.

In a specific embodiment of the present invention, the controller 30 may also be used to: perform an overcurrent protection test and a short circuit protection test of the power supply to be tested according to an automated power supply test process;

When performing an overcurrent protection test, the electronic load Z1 is controlled to trigger the overcurrent protection of the power supply to be tested, the input voltage signal Vin of the power supply to be tested detected by the first oscilloscope CH1 and the output voltage signal Vout of the power supply to be tested detected by the third oscilloscope CH3 are received, and the first switch switching circuit 21 is controlled to be in a default state to receive the PG signal of the power supply to be tested detected by the second oscilloscope CH2, so as to obtain the overcurrent protection test result;

When performing a short-circuit protection test, the electronic load Z1 is controlled to be short-circuited, the input voltage signal Vin of the power supply to be tested detected by the first oscilloscope CH1 and the output voltage signal Vout of the power supply to be tested detected by the third oscilloscope CH3 are received, and the first switch switching circuit 21 is controlled to be in a default state to receive the PG signal of the power supply to be tested detected by the second oscilloscope CH2; the third switch switching circuit 23 and the fourth switch switching circuit 24 are both controlled to be in a non-default state to determine the current value flowing through the first resistor R1, and determine the short-circuit protection test result.

In this implementation, the controller 30 can also perform an overcurrent protection test, namely an OCP (Over Current Protection) test, and a short circuit protection test, namely an SCP (Short Circuit Protection) test, of the power supply to be tested according to the automated power supply test process.

The electronic load Z1 has overcurrent and short-circuit functions, and the controller 30 can control it, thereby obtaining overcurrent protection test results and short-circuit protection test results.

In the above implementations, various test items of the power supply to be tested are explained. In specific implementations, specific test items and test sequences can be selected as needed.

In a specific embodiment of the present invention, it may also include:

A frequency response analyzer connected to the first frequency analysis pin and the second frequency analysis pin of the power supply to be tested through the test device 20;

The controller 30 is also used to: perform a frequency response test of the power supply to be tested according to an automated power supply test process;

When performing a frequency response test, the output signal of the frequency response analyzer is received and a frequency response test result is obtained.

In this implementation, a frequency response analyzer is used to measure the Bode plot, thereby realizing a frequency response test.

In addition, in the implementation of FIG. 3 of the present application, only four switch switching circuits need to be provided in the test device 20, which has a simple structure, low cost, and is easy to implement.

In practical applications, each test pin of the power supply to be tested can be integrated on a preset connector, so as to facilitate connection with the test device 20. In practical applications, each test pin of the power supply to be tested can be integrated in the female head of the preset connector, and the test device 20 can be a test card, which is connected to the female head of the connector through the male head of the connector.

The controller 30 can be selected as the controller 30 in the host computer, for example, the user's laptop computer can be used to implement the functions of the controller 30 of the present application, which is connected to the test device 20 through a GPIB interface. The staff can operate on the computer to realize automatic testing of the power supply to be tested.

By applying the technical solution provided by the embodiment of the present invention, a test device 20 is specially provided for connecting with each test pin of each detection device 10 and the power supply to be tested, so that when the solution of the present application switches the test items, it is not necessary to reconnect the test device 20 with each test pin of the power supply to be tested, nor is it necessary to reconnect the test device 20 with each detection device 10, and the connection mode can be adjusted only through the controller 30. Specifically, the controller 30 is connected with the test device 20 and each detection device 10, and the state switching of the test device 20 can be controlled according to the preset automatic power supply test process, so as to automatically adjust the test pin of the power supply to be tested connected to each detection device 10. In addition, the controller 30 can obtain the test result of the power supply to be tested by receiving the detection data sent by each detection device 10 when executing the automatic power supply test process, that is, by using the controller 30 and the test device 20, there is no need to switch the connection, and the test of the power supply to be tested is automatically completed, and the test result of the power supply to be tested is obtained, which effectively improves the power supply test efficiency.

It should also be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the statement "comprise a ..." do not exclude the presence of other identical elements in the process, method, article or device including the elements.

Professionals may further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the composition and steps of each example have been generally described in the above description according to function. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians may use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of the present invention.

The principles and implementation methods of the present invention are described in this article using specific examples. The description of the above embodiments is only used to help understand the technical solution and core ideas of the present invention. It should be pointed out that for ordinary technicians in this technical field, without departing from the principles of the present invention, the present invention can also be improved and modified, and these improvements and modifications also fall within the scope of protection of the claims of the present invention.

Claims (2)

1. A power supply testing apparatus, comprising:

Each detection device;

The testing device is connected with each testing pin of the power supply to be tested and connected with each detection device;

The controller is connected with the testing device and each detection device and is used for controlling the state switching of the testing device according to a preset automatic power supply testing process so as to automatically adjust the testing pins of the power supply to be tested, which are connected with each detection device; obtaining a test result of the power supply to be tested through detection data sent by each detection device and received when the automatic power supply test flow is executed;

the detection apparatus includes:

The positive terminal is connected with a voltage input pin of the power supply to be tested through the testing device, and the negative terminal is grounded; the positive electrode end of the second oscilloscope is connected with the first end of the first switch switching circuit in the testing device, and the negative electrode of the second oscilloscope is grounded; the positive terminal is connected with a voltage output pin of the power supply to be tested through the testing device, and the negative terminal is grounded; the positive terminal is connected with an enabling terminal pin of the power supply to be tested through the testing device, and the negative terminal is grounded to a fourth oscilloscope; an electronic load connected with the voltage output pin of the power supply to be tested through the testing device;

The testing device comprises the first switch switching circuit, and a second end and a third end of the first switch switching circuit are respectively connected with a PG pin and a Phase pin of the power supply to be tested;

the controller is specifically used for: performing power-on time sequence test and jitter test of the power supply to be tested according to the automatic power supply test flow;

when the power-on time sequence test is performed, controlling the first switch switching circuit to be in a default state, so that a first end of the first switch switching circuit is conducted with a second end of the first switch switching circuit to receive a PG signal of the power to be tested detected by the second oscilloscope, and to receive an output voltage signal Vout of the power to be tested detected by the third oscilloscope, an input voltage signal Vin of the power to be tested detected by the first oscilloscope, and an enable signal EN of the power to be tested detected by the fourth oscilloscope, so as to obtain a power-on time sequence test result;

when the jitter test is performed, the first switch switching circuit is controlled to be in a non-default state, so that the first end of the first switch switching circuit is conducted with the third end of the first switch switching circuit, and a Phase signal of the power supply to be tested, detected by the second oscilloscope, is received, so that a jitter test result is obtained;

Further comprises: the first universal meter is connected with the voltage output pin of the power supply to be tested through the testing device;

the controller is further configured to:

performing a static voltage test of the power supply to be tested according to the automatic power supply test flow, and receiving an output voltage signal Vout of the power supply to be tested detected by the first universal meter when performing the static voltage test to obtain a static voltage test result;

Further comprises:

A first direct current power supply connected with a third end of a second switch switching circuit in the testing device; the second universal meter is connected with the voltage input pin of the power supply to be tested through the testing device;

The testing device also comprises a first resistor, a second switch switching circuit, a third switch switching circuit and a fourth switch switching circuit; the first end and the second end of the first resistor are respectively connected with the voltage output pin of the power supply to be tested and the input end of the electronic load; the first end and the second end of the second switch switching circuit are respectively connected with a voltage input pin of the power supply to be tested and a main board power supply pin of the power supply to be tested; the first end, the second end and the third end of the third switch switching circuit are respectively connected with the positive electrode end of the fourth oscilloscope, the enabling end pin of the power supply to be tested and the first end of the first resistor; the first end and the third end of the fourth switch switching circuit are respectively connected with the negative end of the fourth oscilloscope and the second end of the first resistor, and the second end of the fourth switch switching circuit is grounded;

the controller is further configured to: performing efficiency test of the power supply to be tested according to the automatic power supply test flow;

When the efficiency test is carried out, receiving an input voltage signal Vin of the power to be tested detected by the second universal meter and an output voltage signal Vout of the power to be tested detected by the first universal meter;

Controlling the second switch switching circuit to be in a non-default state, so that a first end of the second switch switching circuit is conducted with a third end of the second switch switching circuit, the first direct current power supply supplies power to the power to be tested, and a power supply current value of the first direct current power supply is determined;

controlling the third switch switching circuit and the fourth switch switching circuit to be in a non-default state, so that the first end of the third switch switching circuit is conducted with the third end of the third switch switching circuit, and the first end of the fourth switch switching circuit is conducted with the third end of the fourth switch switching circuit to receive the terminal voltage signal of the first resistor detected by the fourth oscilloscope;

According to the input voltage signal Vin of the power supply to be tested detected by the second universal meter, the output voltage signal Vout of the power supply to be tested detected by the first universal meter, the power supply current value of the first direct current power supply and the terminal voltage signal of the first resistor, the efficiency value of the power supply to be tested is determined, and the efficiency value is used as an efficiency test result;

Further comprises:

the frequency response analyzer is connected with a first frequency analysis pin and a second frequency analysis pin of the power supply to be tested through the testing device;

The controller is further configured to: performing frequency response test of the power supply to be tested according to the automatic power supply test flow;

When the frequency response test is carried out, receiving an output signal of a frequency response analyzer and obtaining a frequency response test result;

the controller is further configured to:

Performing ripple test, voltage overshoot test and voltage undershoot test of the power supply to be tested according to the automatic power supply test flow;

when the ripple test is carried out, receiving an output voltage signal Vout of the power supply to be tested, which is detected by the third oscilloscope, so as to obtain a ripple test result;

When the voltage overshoot test is carried out, receiving an output voltage signal Vout of the power supply to be tested, which is detected by the third oscilloscope, so as to obtain a voltage overshoot test result;

When the voltage undershoot test is carried out, receiving an output voltage signal Vout of the power supply to be tested, which is detected by the third oscilloscope, so as to obtain a voltage undershoot test result;

the controller is further configured to:

Carrying out surge voltage test of the power supply to be tested according to the automatic power supply test flow;

when the surge voltage test is carried out, receiving an output voltage signal Vout of the power supply to be tested, which is detected by the third oscilloscope, so as to obtain a surge voltage test result;

the electronic load has overcurrent and short-circuit functions and is controlled by the controller; the controller is further configured to: carrying out overcurrent protection test and short-circuit protection test of the power supply to be tested according to the automatic power supply test flow;

When the overcurrent protection test is carried out, the electronic load is controlled to enable the power supply to be tested to trigger overcurrent protection, an input voltage signal Vin of the power supply to be tested detected by the first oscilloscope and an output voltage signal Vout of the power supply to be tested detected by the third oscilloscope are received, and the first switch switching circuit is controlled to be in a default state so as to receive a PG signal of the power supply to be tested detected by the second oscilloscope, so that an overcurrent protection test result is obtained;

When the short-circuit protection test is carried out, controlling the electronic load to be short-circuited, receiving an input voltage signal Vin of the power to be detected by the first oscilloscope and an output voltage signal Vout of the power to be detected by the third oscilloscope, and controlling the first switch switching circuit to be in a default state so as to receive a PG signal of the power to be detected by the second oscilloscope; controlling the third switch switching circuit and the fourth switch switching circuit to be in a non-default state so as to determine the current value flowing through the first resistor and determine a short-circuit protection test result;

And each test pin of the power supply to be tested is integrated in a preset connector.

2. The power test device of claim 1, wherein the controller is a controller in a host computer.