CN113655260B - Picture processing method and device - Google Patents
Picture processing method and device Download PDFInfo
- Publication number
- CN113655260B CN113655260B CN202110950134.XA CN202110950134A CN113655260B CN 113655260 B CN113655260 B CN 113655260B CN 202110950134 A CN202110950134 A CN 202110950134A CN 113655260 B CN113655260 B CN 113655260B
- Authority
- CN
- China
- Prior art keywords
- waveform
- picture
- determining
- data
- index array
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T5/00—Image enhancement or restoration
- G06T5/50—Image enhancement or restoration using two or more images, e.g. averaging or subtraction
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10004—Still image; Photographic image
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20212—Image combination
- G06T2207/20221—Image fusion; Image merging
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Image Processing (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The embodiment of the invention discloses a picture processing method and equipment, wherein the method comprises the following steps: acquiring a first picture, wherein the first picture comprises a first waveform and a second waveform; the first waveform is obtained by testing a first point of the main board; the second waveform is obtained by testing a second point position of the main board; acquiring a second picture, wherein the second picture comprises a third waveform and a fourth waveform which correspond to the first waveform; the third waveform is obtained by testing the first point of the main board; the fourth waveform is obtained by testing a third point position of the main board; and combining the fourth waveform into the first picture according to the third waveform and the first waveform under the condition that the variation difference value of the first waveform and the third waveform does not exceed a specified threshold value, so as to obtain a third picture.
Description
Technical Field
The present invention relates to the field of image processing technologies, and in particular, to a method and apparatus for processing an image.
Background
In the prior art, the main board is often tested through the oscilloscope, but along with the development of technology, the types of the main board are more and more, the main board cannot be tested through one-time operation through the oscilloscope, the main board can be tested only through using a plurality of oscilloscopes or using the same oscilloscope for a plurality of times, a plurality of test pictures can be obtained through both test methods, and the interpretation of test results by users is very inconvenient.
Disclosure of Invention
The embodiment of the invention provides a picture processing method and equipment, which have the function of synthesizing pictures.
An aspect of an embodiment of the present invention provides a method for processing a picture, where the method includes: acquiring a first picture, wherein the first picture comprises a first waveform and a second waveform; the first waveform is obtained by testing a first point of the main board; the second waveform is obtained by testing a second point position of the main board; acquiring a second picture, wherein the second picture comprises a third waveform and a fourth waveform which correspond to the first waveform; the third waveform is obtained by testing the first point of the main board; the fourth waveform is obtained by testing a third point position of the main board; and combining the fourth waveform into the first picture according to the third waveform and the first waveform under the condition that the variation difference value of the first waveform and the third waveform does not exceed a specified threshold value, so as to obtain a third picture.
In an embodiment, the method further comprises: acquiring first waveform data corresponding to the first waveform and acquiring third waveform data corresponding to the third waveform; determining a first voltage change rate of the first waveform from the first waveform data; determining a third rate of change of voltage of the third waveform from the third waveform data; the change difference is determined from the first voltage change rate and the third voltage change rate.
In an embodiment, the determining the first voltage change rate of the first waveform from the first waveform data includes: determining the number of sampling points and the sampling rate according to the first waveform data; determining sampling time according to the number of sampling points and the sampling rate; determining high voltage data and low voltage data corresponding to the first waveform according to the first waveform data, and calculating to obtain a voltage difference value; and determining the voltage change rate through the voltage difference value and the sampling time.
In an embodiment, the merging the fourth waveform into the first picture according to the third waveform and the first waveform includes: determining a positional relationship of the fourth waveform relative to the third waveform; and combining the third waveform to the first waveform, and combining the fourth waveform to the first picture according to the position relation of the fourth waveform relative to the third waveform.
In an embodiment, the method further comprises: and when the variation difference exceeds a specified threshold, judging that the first picture and the second picture cannot be combined, and ending the combination.
In an embodiment, the merging the third waveform into the first waveform, and merging the fourth waveform into the first picture according to a positional relationship of the fourth waveform with respect to the third waveform, includes: performing first-order guiding processing on the first waveform data to obtain a first index array corresponding to the first waveform; the first index array at least comprises a first change edge array of a first waveform; performing first-order guiding processing on the third waveform data to obtain a third index array corresponding to the third waveform; the third index array at least comprises a third change edge array of the first waveform; determining the position relationship between the third index array and the first index array through the third change edge array and the first change edge array; inserting the third index array into the first picture according to the index position of the first index array according to the position relation between the third index array and the first index array; acquiring fourth waveform data corresponding to the fourth waveform, and performing first-order guiding processing on the fourth waveform data to acquire a fourth index array corresponding to the fourth waveform; and inserting a fourth index array into the first picture according to the position relation between the fourth index array and the third index array so as to enable the fourth waveform to be combined into the first picture to obtain a third picture.
In an embodiment, according to the position of the fourth waveform relative to the first waveform, the fourth waveform is combined into the first picture, and after obtaining the third picture, the method includes: if one or more index positions corresponding to the fourth index array and the first index array exist, and no numerical value exists in the index positions; determining the index position without the numerical value as a blank position; determining high voltage data and low voltage data of a fourth waveform according to the fourth waveform data; if the value adjacent to the blank position is high-voltage data, filling the blank position into the high-voltage data; and if the value adjacent to the blank position is low-voltage data, filling the blank position into the low-voltage data.
Another aspect of an embodiment of the present invention provides a picture processing apparatus, including: the device comprises an acquisition module, a display module and a display module, wherein the acquisition module is used for acquiring a first picture, and the first picture comprises a first waveform and a second waveform; the first waveform is obtained by testing a first point of the main board; the second waveform is obtained by testing a second point position of the main board; the acquisition module is also used for acquiring a second picture, wherein the second picture comprises a third waveform and a fourth waveform which correspond to the first waveform; the third waveform is obtained by testing the first point of the main board; the fourth waveform is obtained by testing a third point position of the main board; and the merging module is used for merging the fourth waveform into the first picture according to the third waveform and the first waveform under the condition that the variation difference value of the first waveform and the third waveform does not exceed a specified threshold value, so as to obtain a third picture.
In an embodiment, the apparatus further comprises: the acquisition module is also used for acquiring first waveform data corresponding to the first waveform and acquiring third waveform data corresponding to the third waveform; a determining module, configured to determine a first voltage change rate of the first waveform according to the first waveform data; determining a third rate of change of voltage of the third waveform from the third waveform data; and the determining module is used for determining the change difference value according to the first voltage change rate and the third voltage change rate.
In an embodiment, the determining module includes: the first determining submodule is used for determining the number of sampling points and the sampling rate according to the first waveform data; determining sampling time according to the number of sampling points and the sampling rate; determining high voltage data and low voltage data corresponding to the first waveform according to the first waveform data, and calculating to obtain a voltage difference value; and determining the voltage change rate through the voltage difference value and the sampling time.
In one embodiment, the combining module includes: a second determining sub-module for determining a positional relationship of the fourth waveform with respect to the third waveform; and the merging sub-module is used for merging the third waveform onto the first waveform, and merging the fourth waveform into the first picture according to the position relation of the fourth waveform relative to the third waveform.
In an embodiment, the apparatus further comprises: and the merging module is also used for judging that the first picture and the second picture cannot be merged when the change difference value exceeds a specified threshold value, and ending merging.
In one embodiment, the merging sub-module includes: the obtaining unit is used for carrying out first-order guiding processing on the first waveform data to obtain a first index array corresponding to the first waveform; the obtaining unit is further used for at least including a first change edge array of a first waveform in the first index array; performing first-order guiding processing on the third waveform data to obtain a third index array corresponding to the third waveform; the third index array at least comprises a third change edge array of the first waveform; a determining unit, configured to determine, through the third change edge array and the first change edge array, a positional relationship between the third index array and the first index array; the inserting unit is used for inserting the third index array into the first picture according to the index position of the first index array according to the position relation between the third index array and the first index array; the acquisition unit is also used for acquiring fourth waveform data corresponding to the fourth waveform, performing first-order guiding processing on the fourth waveform data, and acquiring a fourth index array corresponding to the fourth waveform; and the inserting unit is used for inserting the fourth index array into the first picture according to the position relation between the fourth index array and the third index array so as to combine the fourth waveform into the first picture and obtain a third picture.
In one embodiment, the combining module includes: the second determining submodule is further used for if one or more index positions corresponding to the fourth index array have no numerical value in the index positions corresponding to the first index array; determining the index position without the numerical value as a blank position; the second determining submodule is further used for determining high-voltage data and low-voltage data of a fourth waveform according to the fourth waveform data; the filling sub-module is used for filling the blank position into the high-voltage data if the value adjacent to the blank position is the high-voltage data; and if the value adjacent to the blank position is low-voltage data, filling the blank position into the low-voltage data.
Another aspect of an embodiment of the present invention provides a computer-readable storage medium comprising a set of computer-executable instructions for performing the picture processing method of any one of the above, when the instructions are executed.
The embodiment of the invention provides a picture processing method, which comprises the steps of obtaining a first picture and a second picture through testing, testing a first waveform formed in the first picture through testing a first point position, testing a third waveform formed in the second picture after testing the first point position, combining a fourth waveform in the second picture into the first picture through the connection between the first waveform and the third waveform, and obtaining a third picture for outputting, so that waveforms in different pictures are displayed in the same picture, and a user can read the waveforms more easily.
Drawings
The above, as well as additional purposes, features, and advantages of exemplary embodiments of the present invention will become readily apparent from the following detailed description when read in conjunction with the accompanying drawings. Several embodiments of the present invention are illustrated by way of example, and not by way of limitation, in the figures of the accompanying drawings and in which:
in the drawings, the same or corresponding reference numerals indicate the same or corresponding parts.
Fig. 1 is a schematic diagram of an implementation flow of a picture processing method according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a process for determining a variation difference according to an embodiment of the present invention;
Fig. 3 is a schematic diagram of an implementation flow of combining a fourth waveform into a first image according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of a flow chart for implementing filling of blank positions according to an embodiment of the present invention;
fig. 5 is a schematic diagram of a picture processing apparatus according to an embodiment of the present invention.
Detailed Description
In order to make the objects, features and advantages of the present invention more comprehensible, the technical solutions according to the embodiments of the present invention will be clearly described in the following with reference to the accompanying drawings, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Fig. 1 is a schematic diagram of an implementation flow of a picture processing method according to an embodiment of the present invention; please refer to fig. 1;
An aspect of the present invention provides a method for processing a picture, where the method includes: step 101, acquiring a first picture, wherein the first picture comprises a first waveform and a second waveform; the first waveform is obtained by testing a first point of the main board; the second waveform is obtained by testing a second point position of the main board; 102, acquiring a second picture, wherein the second picture comprises a third waveform and a fourth waveform which correspond to the first waveform; the third waveform is obtained by testing the first point of the main board; the fourth waveform is obtained by testing a third point position of the main board; and step 103, combining the fourth waveform into the first picture according to the third waveform and the first waveform to obtain a third picture when the variation difference value of the first waveform and the third waveform does not exceed a specified threshold value.
The embodiment of the invention provides a picture processing method, which comprises the steps of obtaining a first picture and a second picture through testing, testing a first waveform formed in the first picture through testing a first point position, testing a third waveform formed in the second picture after testing the first point position, combining a fourth waveform in the second picture into the first picture through the connection between the first waveform and the third waveform, and obtaining a third picture for outputting, so that waveforms in different pictures are displayed in the same picture, and a user can read the waveforms more easily.
In step 101 of the embodiment of the present invention, the first picture may be obtained by detecting a detection device, where the detection device includes at least an oscilloscope, and after detecting an electrical signal on a main board by a probe connected to the oscilloscope, the first picture is sent to a picture processing device, where the electrical signal is generated by the main board, and the oscilloscope is used to collect the electrical signal; the first picture comprises a first waveform and a second waveform, the first waveform is obtained by detecting a first point position of the main board through a probe connected with a first channel CH1 on the oscilloscope, and the second waveform is obtained by detecting a second point position on the main board through a probe connected with a second channel CH2 on the oscilloscope; the first point location and the second point location are different positions, the first point location and the second point location are located on the same plane, and the first point location and the second point location are points which are preset on the main board by a user and are used for testing the main board; the first waveform and the second waveform may also be different;
In step 102 of the embodiment of the present invention, the second image may be obtained after the electric signal detection of the main board is performed by using a probe connected with the oscilloscope, where the oscilloscope used for obtaining the first image and the oscilloscope used for obtaining the second image may be the same or different, the second image includes a third waveform and a fourth waveform, the third waveform is obtained by detecting the first point position of the main board by using the probe connected with the first channel CH1 on the oscilloscope, and the fourth waveform is obtained by detecting the third point position on the main board by using the probe connected with the second channel CH2 on the oscilloscope; wherein the locations of the first and third points may be different; the third waveform and the fourth waveform may also be different; wherein the first wave line and the second wave form are measured through the same point, and the first wave form and the second wave form are basically consistent because of the stability of the electric signal; specifically, the second point location and the third point location may be located at different positions of the same plane, or may be located at different planes, and specifically, when the second point location and the third point location are located at different planes of the motherboard, the first point location may be designed as a through line, that is, when the second point location and the third point location are located at different planes, the first point location may be tested.
In step 103, in the case that the variation difference between the first waveform and the third waveform does not exceed the specified threshold, where the variation difference refers to the variation difference between the shapes of the first waveform and the third waveform, specifically, when the attribute corresponding to the ordinate corresponding to the waveform is voltage, the variation difference may be the voltage variation rate; the specified threshold is a value preset by a user and is used for judging whether the third waveform meets the combination requirement, and when the variation difference exceeds the specified threshold, the first picture and the second picture are judged to be unable to be combined, and the combination is ended. And combining the fourth waveform into the first picture according to the third waveform and the first waveform when the variation difference value of the first waveform and the third waveform does not exceed a specified threshold value. The third picture may be obtained, specifically, the third picture may be obtained by directly displaying, or may be obtained by sending the third picture to the oscilloscope to display the third picture, and then capturing a picture of the oscilloscope. The channel sent to the oscilloscope may be the Reference channel. Through this scheme can merge more than two pictures, for example, still there is the fourth point position on the mainboard, obtains the fourth picture through first point position and fourth point position test, through the wave form that first point position corresponds, can merge first picture, second picture and fourth picture in same picture to the relation that makes between the multiple pictures presents more directly perceivedly, and the user is easier to read.
Providing a specific embodiment, measuring a reference signal A through an oscilloscope channel CH1, measuring a signal B through an oscilloscope channel CH2, setting a triggering mode of the oscilloscope, specifically, setting an edge triggering Single mode by CH1, wherein the Single triggering mode can automatically grab waveforms, and setting the voltage of the triggering level CH1 to 50%; setting scale values scale of an X axis and a Y axis, wherein the X axis is used for representing time, and the Y axis is used for representing voltage; designing measurement parameters of an oscilloscope; powering up the oscilloscope to obtain sampling waveform data (namely the first waveform and the second waveform);
Measuring a reference signal A through an oscilloscope channel CH1 in the same manner, and measuring a signal C through a channel CH 2; and acquiring sampling waveform data (namely the third waveform and the fourth waveform), synthesizing the two waveform data, wherein the synthesizing mode can be used for obtaining a third picture through recombination of sampling points in a logic relation between electric signals, wherein the sampling points are data acquired by acquiring the electric signals by an oscilloscope, and the sampling points acquire waveforms in the picture through time sequence arrangement.
FIG. 2 is a schematic diagram of a process for determining a variation difference according to an embodiment of the present invention; referring to fig. 2;
In an embodiment, the method further comprises: step 201, acquiring first waveform data corresponding to a first waveform and acquiring third waveform data corresponding to a third waveform; step 202, determining a first voltage change rate of a first waveform according to the first waveform data; determining a third voltage change rate of the third waveform from the third waveform data; step 203, determining a variation difference according to the first voltage variation rate and the third voltage variation rate.
In steps 201 to 203 of the present embodiment, the first waveform data refers to data corresponding to the first waveform, specifically, data corresponding to an acquisition point obtained by the oscilloscope by acquiring an electrical signal on the motherboard; the third waveform data refers to data corresponding to a third waveform; calculating a first voltage change rate of the first waveform according to the first waveform data, and calculating a third voltage change rate of the third waveform according to the third waveform; the voltage change rate refers to the ratio of the change amount of voltage to the time taken for completing the change, and is called the change rate of voltage; and calculating through the first voltage change rate and the third voltage change rate, and determining a change difference value of the first voltage change rate and the third voltage change rate, so as to judge whether the first picture and the second picture can be combined. Specifically, determining the number of sampling points and the sampling rate according to the first waveform data; determining sampling time according to the number of sampling points and the sampling rate; determining high voltage data and low voltage data corresponding to the first waveform according to the first waveform data, and calculating to obtain a voltage difference value; the voltage change rate is determined by the voltage difference and the sampling time.
Specifically, the voltage change rate can be calculated by the following formula:
Wherein Δu refers to a voltage change rate, and V high and V low respectively refer to high-voltage data and low-voltage data corresponding to the first waveform; a i2 and a i1 are respectively the nearest acquisition points along the distance change of the high-voltage data and the low-voltage data of the first waveform, and the number of the acquisition points is determined by difference between the two, wherein samplefreq is used for representing the acquisition rate, namely the number of the acquisition points acquired per second, and the acquisition time corresponding to the change between the high voltage and the low voltage is determined.
Specifically, the specified threshold may be 2% -3%, and in order to avoid erroneous judgment, it is preferable to use a voltage change rate of 3% as the judgment threshold.
Fig. 3 is a schematic diagram of an implementation flow of combining a fourth waveform into a first image according to an embodiment of the present invention; referring to fig. 3;
In one embodiment, combining the fourth waveform into the first picture according to the third waveform and the first waveform includes: step 301, determining a positional relationship of the fourth waveform with respect to the third waveform; step 302, combining the third waveform to the first waveform, and combining the fourth waveform to the first picture according to the positional relationship of the fourth waveform relative to the third waveform.
In step 301 of this embodiment, a positional relationship between the fourth waveform and the third waveform is determined, where the positional relationship may refer to a relationship between the third waveform and the shape of the fourth waveform in the second picture, or may refer to a positional relationship between an index array corresponding to the third waveform and an index array corresponding to the fourth waveform; since the X-axis is time and the Y-axis is voltage, the positional relationship between the third waveform and the fourth waveform also means the timing and voltage amplitude relationship between the third waveform and the fourth waveform.
In step 302 of this embodiment, according to the positional relationship between the third index array and the first index array, the third index array is inserted into the first picture according to the index position of the first index array; specifically, combining the third waveform to the first waveform, namely, performing first-order guiding processing on the first waveform data to obtain a first index array corresponding to the first waveform, wherein the first index array refers to an index array corresponding to the first waveform, and each index position corresponds to an acquisition point of the first waveform; the first index array at least comprises a first change edge array of a first waveform; the change trend of the first waveform data can be intuitively determined through the first waveform data after the first-order guiding process, so that the change edge can be determined, and the change edge can be a rising edge or a falling edge; performing first-order guiding processing on the third waveform data to obtain a third index array corresponding to the third waveform; the third index array at least comprises a third change edge array of the first waveform; determining the position relationship between the third index array and the first index array through the third change edge array and the first change edge array; the position of the third change edge and the position of the first change edge are determined, so that the superposition position of the first waveform and the third waveform is determined, specifically, the initial position of the third change edge is enabled to correspond to the initial position of the first change edge array by determining the initial position of the first change edge array, and the third index array is sequentially inserted into the first picture;
Combining the fourth waveform into the first picture according to the position relation of the fourth waveform relative to the third waveform, namely acquiring fourth waveform data corresponding to the fourth waveform, and performing first-order guiding processing on the fourth waveform data to acquire a fourth index array corresponding to the fourth waveform; because the third waveform and the fourth waveform are monitored simultaneously, a time sequence relationship exists between the third waveform and the fourth waveform, the obtained third index array and the obtained fourth index array also have a corresponding index relationship, and the fourth index array is inserted into the first picture according to the position relationship between the fourth index array and the third index array, namely, the fourth waveform is combined into the first picture, so that the third picture is obtained. Specifically, the index position of the third waveform in the first picture can be determined by the number of the third waveform, and the corresponding number of the fourth waveform is inserted into the first picture according to the index position.
Specifically, the first-order guiding method comprises the following steps: the first order derivative algorithm isUsing Y to represent sampled output sequence dx/dt, an algorithm employing a second order center can calculate Where i=0, 1,2, …, n-1, n is the x (t) sampling depth, i.e. the corresponding number of sampling points in a picture, when i is 0, it is the initial condition, i.e. the first sampling point, and when i is n, it is the final condition, i.e. the last sampling point.
FIG. 4 is a schematic diagram of a flow chart for implementing filling of blank positions according to an embodiment of the present invention; please refer to fig. 4;
in an embodiment, according to a position of the fourth waveform relative to the first waveform, combining the fourth waveform into the first picture, and after obtaining the third picture, the method includes: step 401, if there are one or more index positions corresponding to the first index array in the fourth index array, and there are no values in the index positions; determining the index position without the numerical value as a blank position; step 402, determining high voltage data and low voltage data of a fourth waveform according to the fourth waveform data; step 403, if the value adjacent to the blank position is high voltage data, filling the blank position into the high voltage data; and if the value adjacent to the blank position is the low-voltage data, filling the blank position into the low-voltage data.
In steps 401-403 of this embodiment, if there are one or more index positions corresponding to the fourth index array and the first index array, the index positions have no values; the fourth index array is inserted into the first picture, one or more index positions of the first index array are not provided with an array corresponding to the fourth index array, and the index position without a numerical value is determined as a blank position of the fourth waveform in the first picture; and filling the blank position according to the high-voltage data and the low-voltage data determined by the fourth waveform, specifically, judging whether the blank position is the high-voltage data or the low-voltage data according to the nearest voltage value of the blank position, and filling the blank position into the high-voltage data if the value adjacent to the blank position is the high-voltage data.
Fig. 5 is a schematic diagram of a picture processing apparatus according to an embodiment of the present invention. Please refer to fig. 5;
another aspect of an embodiment of the present invention provides a picture processing apparatus, including: the obtaining module 501 is configured to obtain a first picture, where the first picture includes a first waveform and a second waveform; the first waveform is obtained by testing a first point of the main board; the second waveform is obtained by testing a second point position of the main board; the obtaining module 501 is further configured to obtain a second picture, where the second picture includes a third waveform and a fourth waveform corresponding to the first waveform; the third waveform is obtained by testing the first point of the main board; the fourth waveform is obtained by testing a third point position of the main board; the merging module 502 merges the fourth waveform into the first picture according to the third waveform and the first waveform to obtain a third picture when the variation difference between the first waveform and the third waveform does not exceed a specified threshold.
In an embodiment, the apparatus further comprises: the acquiring module 501 is further configured to acquire first waveform data corresponding to the first waveform, and acquire third waveform data corresponding to the third waveform; a determining module 503, configured to determine a first voltage change rate of the first waveform according to the first waveform data; determining a third voltage change rate of the third waveform from the third waveform data; a determining module 503, configured to determine a change difference value according to the first voltage change rate and the third voltage change rate.
In one embodiment, the determining module 503 includes: a first determining submodule 5031 for determining the number of sampling points and the sampling rate according to the first waveform data; determining sampling time according to the number of sampling points and the sampling rate; determining high voltage data and low voltage data corresponding to the first waveform according to the first waveform data, and calculating to obtain a voltage difference value; the voltage change rate is determined by the voltage difference and the sampling time.
In one embodiment, the merge module 502 includes: a second determining submodule 5021 for determining a positional relationship of the fourth waveform with respect to the third waveform; and a merging submodule 5022, configured to merge the third waveform onto the first waveform, and merge the fourth waveform into the first picture according to a positional relationship of the fourth waveform relative to the third waveform.
In an embodiment, the apparatus further comprises: the merging module 502 is further configured to determine that the first picture and the second picture cannot be merged when the change difference exceeds a specified threshold, and end merging.
In one embodiment, the merge submodule 5022 includes: an obtaining unit 5023, configured to perform first-order derivative processing on the first waveform data to obtain a first index array corresponding to the first waveform; the obtaining unit 5023 is further configured to include at least a first variation edge array of the first waveform in the first index array; performing first-order guiding processing on the third waveform data to obtain a third index array corresponding to the third waveform; the third index array at least comprises a third change edge array of the first waveform; a determining unit 5024, configured to determine, through the third change edge array and the first change edge array, a positional relationship between the third index array and the first index array; an inserting unit 5025, configured to insert the third index array into the first picture according to the index position of the first index array according to the positional relationship between the third index array and the first index array; the obtaining unit 5023 is further configured to obtain fourth waveform data corresponding to a fourth waveform, perform first-order guiding processing on the fourth waveform data, and obtain a fourth index array corresponding to the fourth waveform; the inserting unit 5025 is configured to insert the fourth index array into the first picture according to the positional relationship between the fourth index array and the third index array, so that the fourth waveform is combined into the first picture, and a third picture is obtained.
In one embodiment, the merge module 502 includes: the second determining submodule 5021 is further configured to, if one or more index positions corresponding to the first index array exist in the fourth index array, if there is no value in the index positions; determining the index position without the numerical value as a blank position; the second determining submodule 5021 is further used for determining high-voltage data and low-voltage data of a fourth waveform according to the fourth waveform data; a filling submodule 5026, configured to fill the blank position into the high-voltage data if the value adjacent to the blank position is the high-voltage data; and if the value adjacent to the blank position is the low-voltage data, filling the blank position into the low-voltage data.
Another aspect of an embodiment of the present invention provides a computer-readable storage medium comprising a set of computer-executable instructions for performing the picture processing method of any one of the above when the instructions are executed.
In the description of the present specification, a description referring to terms "one embodiment," "some embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present invention. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, the different embodiments or examples described in this specification and the features of the different embodiments or examples may be combined and combined by those skilled in the art without contradiction.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In the description of the present invention, the meaning of "a plurality" is two or more, unless explicitly defined otherwise.
The foregoing is merely illustrative embodiments of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily think about variations or substitutions within the technical scope of the present invention, and the invention should be covered. Therefore, the protection scope of the invention is subject to the protection scope of the claims.
Claims (8)
1. A picture processing method, the method comprising:
Acquiring a first picture, wherein the first picture comprises a first waveform and a second waveform; the first waveform is obtained by testing a first point of the main board; the second waveform is obtained by testing a second point position of the main board;
acquiring a second picture, wherein the second picture comprises a third waveform and a fourth waveform which correspond to the first waveform; the third waveform is obtained by testing the first point of the main board; the fourth waveform is obtained by testing a third point position of the main board;
When the variation difference value of the first waveform and the third waveform does not exceed a specified threshold value, combining the fourth waveform into the first picture according to the third waveform and the first waveform to obtain a third picture;
Wherein the merging the fourth waveform into the first picture according to the third waveform and the first waveform includes:
determining a positional relationship of the fourth waveform relative to the third waveform; combining the third waveform to the first waveform, and combining the fourth waveform to the first picture according to the position relation of the fourth waveform relative to the third waveform;
The merging the third waveform into the first waveform, merging the fourth waveform into the first picture according to the positional relationship of the fourth waveform relative to the third waveform, includes:
performing first-order guiding processing on the first waveform data to obtain a first index array corresponding to the first waveform; the first index array at least comprises a first change edge array of a first waveform;
performing first-order guiding processing on the third waveform data to obtain a third index array corresponding to the third waveform; the third index array at least comprises a third change edge array of the first waveform;
determining the position relationship between the third index array and the first index array through the third change edge array and the first change edge array;
Inserting the third index array into the first picture according to the index position of the first index array according to the position relation between the third index array and the first index array;
acquiring fourth waveform data corresponding to the fourth waveform, and performing first-order guiding processing on the fourth waveform data to acquire a fourth index array corresponding to the fourth waveform;
And inserting a fourth index array into the first picture according to the position relation between the fourth index array and the third index array so as to enable the fourth waveform to be combined into the first picture to obtain a third picture.
2. The method according to claim 1, wherein the method further comprises:
Acquiring first waveform data corresponding to the first waveform and acquiring third waveform data corresponding to the third waveform;
determining a first voltage change rate of the first waveform from the first waveform data; determining a third rate of change of voltage of the third waveform from the third waveform data;
the change difference is determined from the first voltage change rate and the third voltage change rate.
3. The method of claim 2, wherein said determining a first rate of change of voltage of said first waveform from said first waveform data comprises:
determining the number of sampling points and the sampling rate according to the first waveform data; determining sampling time according to the number of sampling points and the sampling rate;
determining high voltage data and low voltage data corresponding to the first waveform according to the first waveform data, and calculating to obtain a voltage difference value;
And determining the voltage change rate through the voltage difference value and the sampling time.
4. The method according to claim 1, wherein the method further comprises:
And when the variation difference exceeds a specified threshold, judging that the first picture and the second picture cannot be combined, and ending the combination.
5. The method of claim 1, wherein merging the fourth waveform into the first picture based on the position of the fourth waveform relative to the first waveform, after obtaining a third picture, comprises:
If one or more index positions corresponding to the fourth index array and the first index array exist, and no numerical value exists in the index positions; determining the index position without the numerical value as a blank position;
determining high voltage data and low voltage data of a fourth waveform according to the fourth waveform data;
If the value adjacent to the blank position is high-voltage data, filling the blank position into the high-voltage data;
and if the value adjacent to the blank position is low-voltage data, filling the blank position into the low-voltage data.
6. A picture processing apparatus, characterized in that the apparatus comprises:
the device comprises an acquisition module, a display module and a display module, wherein the acquisition module is used for acquiring a first picture, and the first picture comprises a first waveform and a second waveform; the first waveform is obtained by testing a first point of the main board; the second waveform is obtained by testing a second point position of the main board;
The acquisition module is also used for acquiring a second picture, wherein the second picture comprises a third waveform and a fourth waveform which correspond to the first waveform; the third waveform is obtained by testing the first point of the main board; the fourth waveform is obtained by testing a third point position of the main board;
A merging module, configured to merge, when a variation difference between the first waveform and the third waveform does not exceed a specified threshold, the fourth waveform into the first picture according to the third waveform and the first waveform, so as to obtain a third picture;
The merging module comprises: a second determining sub-module for determining a positional relationship of the fourth waveform with respect to the third waveform; the merging submodule is used for merging the third waveform onto the first waveform and merging the fourth waveform into the first picture according to the position relation of the fourth waveform relative to the third waveform;
the merging submodule comprises: the obtaining unit is used for carrying out first-order guiding processing on the first waveform data to obtain a first index array corresponding to the first waveform; the first index array at least comprises a first change edge array of a first waveform; performing first-order guiding processing on the third waveform data to obtain a third index array corresponding to the third waveform; the third index array at least comprises a third change edge array of the first waveform; a determining unit, configured to determine, through the third change edge array and the first change edge array, a positional relationship between the third index array and the first index array; the inserting unit is used for inserting the third index array into the first picture according to the index position of the first index array according to the position relation between the third index array and the first index array; the obtaining unit is further used for obtaining fourth waveform data corresponding to the fourth waveform, performing first-order guiding processing on the fourth waveform data, and obtaining a fourth index array corresponding to the fourth waveform; the inserting unit is further configured to insert a fourth index array into the first picture according to a positional relationship between the fourth index array and the third index array, so that the fourth waveform is merged into the first picture, and a third picture is obtained.
7. The apparatus of claim 6, wherein the apparatus further comprises:
the acquisition module is also used for acquiring first waveform data corresponding to the first waveform and acquiring third waveform data corresponding to the third waveform;
A determining module, configured to determine a first voltage change rate of the first waveform according to the first waveform data; determining a third rate of change of voltage of the third waveform from the third waveform data;
And the determining module is used for determining the change difference value according to the first voltage change rate and the third voltage change rate.
8. The apparatus of claim 7, wherein the determination module comprises:
The first determining submodule is used for determining the number of sampling points and the sampling rate according to the first waveform data; determining sampling time according to the number of sampling points and the sampling rate; determining high voltage data and low voltage data corresponding to the first waveform according to the first waveform data, and calculating to obtain a voltage difference value; and determining the voltage change rate through the voltage difference value and the sampling time.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202110950134.XA CN113655260B (en) | 2021-08-18 | 2021-08-18 | Picture processing method and device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202110950134.XA CN113655260B (en) | 2021-08-18 | 2021-08-18 | Picture processing method and device |
Publications (2)
Publication Number | Publication Date |
---|---|
CN113655260A CN113655260A (en) | 2021-11-16 |
CN113655260B true CN113655260B (en) | 2024-07-12 |
Family
ID=78481060
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202110950134.XA Active CN113655260B (en) | 2021-08-18 | 2021-08-18 | Picture processing method and device |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN113655260B (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115795297A (en) * | 2022-12-06 | 2023-03-14 | 中国联合网络通信集团有限公司 | Abnormal shutdown identification method and device |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002282230A (en) * | 2001-03-23 | 2002-10-02 | Fukuda Denshi Co Ltd | Biological information collecting apparatus, biological information processing apparatus and processing method |
CN107290577A (en) * | 2017-08-14 | 2017-10-24 | 武汉虹信通信技术有限责任公司 | A kind of oscilloscope data processing system and method |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1235831A (en) * | 1969-02-21 | 1971-06-16 | British Broadcasting Corp | Improvements in or relating to television systems |
US5268847A (en) * | 1990-12-17 | 1993-12-07 | United Technologies Corporation | Digital synthesis of waveforms |
JP2000329792A (en) * | 1999-05-21 | 2000-11-30 | Hitachi Denshi Ltd | Data collection processing method |
CN1169354C (en) * | 2001-07-17 | 2004-09-29 | 康佳集团股份有限公司 | Splicing structure of combined display screen and its waveform correcting device and method for image distortion |
CN102175902B (en) * | 2011-01-04 | 2013-11-06 | 苏州瀚瑞微电子有限公司 | Digital waveform processing system and method for oscilloscope |
CN105427327B (en) * | 2015-12-10 | 2017-05-31 | 北京中科紫鑫科技有限责任公司 | The method for registering images and device of a kind of DNA sequencing |
US10126374B2 (en) * | 2016-07-20 | 2018-11-13 | Oracle International Corporation | Universal power distribution test tool and methodology |
CN107219422B (en) * | 2017-06-05 | 2019-05-21 | 安徽江淮汽车集团股份有限公司 | Vehicle-mounted electrical appliance electrified test system and method |
CN107817034B (en) * | 2017-10-27 | 2020-02-07 | 深圳友讯达科技股份有限公司 | Method and device for correcting temperature of meter |
-
2021
- 2021-08-18 CN CN202110950134.XA patent/CN113655260B/en active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002282230A (en) * | 2001-03-23 | 2002-10-02 | Fukuda Denshi Co Ltd | Biological information collecting apparatus, biological information processing apparatus and processing method |
CN107290577A (en) * | 2017-08-14 | 2017-10-24 | 武汉虹信通信技术有限责任公司 | A kind of oscilloscope data processing system and method |
Also Published As
Publication number | Publication date |
---|---|
CN113655260A (en) | 2021-11-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US20060267599A1 (en) | Measuring capacitance | |
CN201654130U (en) | Automatic measuring and calibrating device of high-impedance measuring apparatus | |
US5256975A (en) | Manually-operated continuity/shorts test probe for bare interconnection packages | |
CN111258828A (en) | I2C bus test method, test device and computer readable storage medium | |
CN113655260B (en) | Picture processing method and device | |
CN107064846A (en) | The sensitivity detection method and device of live testing apparatus for local discharge | |
TWI509260B (en) | System and method for low voltage differential signaling test | |
US8271220B2 (en) | Evaluating high frequency time domain in embedded device probing | |
CN216646688U (en) | Volt-ampere characteristic analysis and test device for semiconductor laser | |
JP2013024614A (en) | Semiconductor testing device, and electric length measurement method | |
CN113219363B (en) | Power supply noise test method and device and storage medium | |
US7031856B2 (en) | Automatic wire dielectric analyzer | |
US7668235B2 (en) | Jitter measurement algorithm using locally in-order strobes | |
KR100594268B1 (en) | Measurement circuit and method for serially merging single-ended signals | |
CN108880726B (en) | A kind of time deviation measurement method and system | |
CN107991640B (en) | Pulse current calibration device and method for semiconductor discrete device test system | |
AU715105B2 (en) | Electronic signal measurement apparatus and method for the acquisition and display of short-duration analog signal events | |
CN107414251B (en) | Welding equipment, arcing determination processing method and device | |
TWI447407B (en) | Cable detection device and cable detection method | |
CN114152860B (en) | Probe calibration method and device, electronic equipment and storage medium | |
JP5290213B2 (en) | Error rate measuring apparatus and method | |
CN115174428A (en) | Ethernet PMA test method and test device | |
CN114509596A (en) | A kind of automatic detection method and device of equipment working voltage | |
CN221485531U (en) | High-precision insulating conduction measurement functional module | |
CN120161382B (en) | DC power supply module transient response test method and system |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |