CN112269422A - Clock generation circuit and spread spectrum test system - Google Patents
Clock generation circuit and spread spectrum test system Download PDFInfo
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- CN112269422A CN112269422A CN202011079403.1A CN202011079403A CN112269422A CN 112269422 A CN112269422 A CN 112269422A CN 202011079403 A CN202011079403 A CN 202011079403A CN 112269422 A CN112269422 A CN 112269422A
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- clock
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- clock generator
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/04—Generating or distributing clock signals or signals derived directly therefrom
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
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Abstract
The application discloses a clock generation circuit and a spread spectrum test system. A clock generation circuit comprising: a clock generator; a memory storing operating system files; and the processor is respectively connected with the memory and the clock generator and is used for operating the operating system according to the operating system file in the memory and writing the spread spectrum parameters generated by the operating system into the clock generator so as to control the clock generator to output clock signals according to the spread spectrum parameters. Based on the clock generation circuit that this application provided, the accessible utilizes the operating system of operation in the treater to set up the spread spectrum parameter to clock generator, realizes the frequency control to the clock signal that clock generator produced, when testing the anti-electromagnetic interference effect of different spread spectrum scopes, need not to weld parameter configuration resistance and clock generator repeatedly, and then has guaranteed the whole efficiency of spread spectrum test relatively. In addition, the application also provides a spread spectrum testing system, and the beneficial effects are as above.
Description
Technical Field
The present invention relates to the field of spread spectrum testing, and in particular, to a clock generation circuit and a spread spectrum testing system.
Background
Electromagnetic interference (EMI) refers to an interference phenomenon generated after electromagnetic waves interact with electronic components, and is generated by a radiation electromagnetic field or induced voltage and current. How to reduce the electromagnetic interference is a challenge for various electronic devices, and the clock frequency in the current high-speed digital system also causes the problem of the electromagnetic interference.
In order to ensure the reliability of the electronic device, clock spreading is often performed on the electronic device to reduce the electromagnetic interference of the electronic device, so the spreading range of the clock needs to be obtained through a test mode, and in the current test process, the clock frequency generated by the clock generator is affected by the welding position of the parameter configuration resistor welded on the clock generator, so when the anti-electromagnetic interference effect of different spreading ranges is tested, the parameter configuration resistor and the clock generator need to be welded again, and therefore, the overall efficiency of the spreading test is difficult to ensure.
It can be seen that providing a clock generation circuit to relatively ensure the overall efficiency of spread spectrum testing is a problem that needs to be solved by those skilled in the art.
Disclosure of Invention
The present application provides a clock generation circuit and a spread spectrum test system to relatively ensure the overall efficiency of the spread spectrum test.
In order to solve the above technical problem, the present application provides a clock generation circuit, including:
a clock generator;
a memory storing operating system files;
and the processor is respectively connected with the memory and the clock generator and is used for operating the operating system according to the operating system file in the memory and writing the spread spectrum parameters generated by the operating system into the clock generator so as to control the clock generator to output clock signals according to the spread spectrum parameters.
Preferably, the processor and clock generator are connected based on an I2C bus.
Preferably, the circuit further comprises:
and the display is connected with the processor and is used for displaying the running interface of the operating system.
Preferably, the circuit further comprises:
and the keyboard is connected with the processor and is used for inputting the spread spectrum parameters to the operating system.
Preferably, the memory comprises FLASH memory.
Preferably, the processor comprises a CPU processor.
Preferably, the CPU processor model includes LS3A 4000.
Preferably, the model of the clock generator comprises 6P 41505.
Preferably, a clock line is connected between the processor and the clock generator for transmitting the clock signal output by the clock generator to the processor.
In addition, the present application also provides a spread spectrum test system, including:
the clock generation circuit as described above;
and the function circuit to be tested is connected with the clock generating circuit and is used for responding to the clock signal generated by the clock generating circuit to perform spread spectrum test.
The clock generation circuit comprises a clock generator, a memory for storing a system, and a processor respectively connected with the memory and the clock generator, and is used for running an operating system according to an operating system file in the memory, and writing a spread spectrum parameter generated by the operating system into the clock generator so as to control the clock generator to output a clock signal according to the spread spectrum parameter. Based on the clock generation circuit that this application provided, the accessible utilizes the operating system of operation in the treater to set up the spread spectrum parameter to clock generator, realizes the frequency control to the clock signal that clock generator produced, when testing the anti-electromagnetic interference effect of different spread spectrum scopes, need not to weld parameter configuration resistance and clock generator repeatedly, and then has guaranteed the whole efficiency of spread spectrum test relatively. In addition, the application also provides a spread spectrum testing system, and the beneficial effects are as above.
Drawings
In order to more clearly illustrate the embodiments of the present application, the drawings needed for the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings can be obtained by those skilled in the art without inventive effort.
Fig. 1 is a schematic structural diagram of a clock generation circuit disclosed in an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all the embodiments. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments in the present application without any creative effort belong to the protection scope of the present application.
In order to ensure the reliability of the electronic device, clock spreading is often performed on the electronic device to reduce the electromagnetic interference of the electronic device, so the spreading range of the clock needs to be obtained through a test mode, and in the current test process, the clock frequency generated by the clock generator is affected by the welding position of the parameter configuration resistor welded on the clock generator, so when the anti-electromagnetic interference effect of different spreading ranges is tested, the parameter configuration resistor and the clock generator need to be welded again, and therefore, the overall efficiency of the spreading test is difficult to ensure.
Therefore, the core of the present application is to provide a clock generation circuit to relatively ensure the overall efficiency of the spread spectrum test.
In order that those skilled in the art will better understand the disclosure, the following detailed description will be given with reference to the accompanying drawings.
Referring to fig. 1, an embodiment of the present application discloses a clock generation circuit, including:
a clock generator 10;
a memory 11 storing operating system files;
and a processor 12 connected to the memory 11 and the clock generator 10, respectively, for running an operating system according to the operating system file in the memory 11 and writing the spread spectrum parameters generated by the operating system into the clock generator 10, so as to control the clock generator 10 to output the clock signal according to the spread spectrum parameters.
It should be noted that the clock generator 10 in this embodiment refers to a device for generating a clock signal, and the electronic components of the clock generator 10 continuously generate voltage pulses at stable intervals during operation, so that all the components in the electronic device synchronously perform operation with the clock.
In addition, it should be noted that the spread spectrum parameter refers to spread spectrum, that is, a spectrum value constraint parameter of spread spectrum, and the clock generator can output a clock signal of a corresponding clock frequency according to the spread spectrum parameter.
In addition, the operating system referred to in this embodiment includes, but is not limited to, a basic Input Output system (bios) system, i.e., a basic Input Output system, which can further ensure the operating efficiency of the operating system, and thus ensure the efficiency of setting the spreading parameter for the clock generator.
The clock generation circuit comprises a clock generator, a memory for storing a system, and a processor respectively connected with the memory and the clock generator, and is used for running an operating system according to an operating system file in the memory, and writing a spread spectrum parameter generated by the operating system into the clock generator so as to control the clock generator to output a clock signal according to the spread spectrum parameter. Based on the clock generation circuit that this application provided, the accessible utilizes the operating system of operation in the treater to set up the spread spectrum parameter to clock generator, realizes the frequency control to the clock signal that clock generator produced, when testing the anti-electromagnetic interference effect of different spread spectrum scopes, need not to weld parameter configuration resistance and clock generator repeatedly, and then has guaranteed the whole efficiency of spread spectrum test relatively.
On the basis of the above-described embodiment, as a preferred implementation, the processor and the clock generator are connected based on an I2C bus.
In the present embodiment, the processor and the clock generator are connected by the I2C bus, and the I2C bus bidirectional two-wire system synchronous serial bus can transmit information between devices connected to the bus by only two wires, and has high reliability and transmission efficiency, so that the present embodiment can further improve the overall efficiency and reliability of data transmission between the processor and the clock generator.
On the basis of the above embodiment, as a preferred implementation, the circuit further includes:
and the display is connected with the processor and is used for displaying the running interface of the operating system.
In this embodiment, the clock generating circuit further includes a display connected to the processor, and is intended to display an operation interface of the operating system, so as to ensure that an operation and maintenance person can visually check a parameter setting interface for the spread spectrum parameter in the operating system based on the display, and then can relatively accurately set the spread spectrum parameter through the parameter setting interface displayed in the display, so as to control the operating system to generate the spread spectrum parameter and write the spread spectrum parameter into the clock generator, thereby further improving the accuracy of the spread spectrum parameter, and further improving the accuracy of the clock generator outputting a clock signal according to the spread spectrum parameter.
On the basis of the above embodiment, as a preferred implementation, the circuit further includes:
and the keyboard is connected with the processor and is used for inputting the spread spectrum parameters to the operating system.
In this embodiment, the clock generating circuit further includes a keyboard connected to the processor, and is configured to input the spread spectrum parameter to the operating system, so that an operation and maintenance worker can set the spread spectrum parameter to the operating system accurately based on the keyboard, and thus accuracy of the spread spectrum parameter is further improved, and accuracy of the clock generator outputting the clock signal according to the spread spectrum parameter is further improved.
On the basis of the above-described embodiment, as a preferred implementation, the memory includes a FLASH memory.
It should be noted that the FLASH memory is a Non-Volatile (Non-Volatile) memory, and because the FLASH memory has higher read-write performance, in this embodiment, the FLASH memory is used to store the operating system file, and then the processor runs the operating system according to the operating system file in the FLASH memory, so that the running efficiency of the operating system can be further improved, and the overall efficiency of writing the spread spectrum parameters into the clock generator can be further improved.
On the basis of the above embodiments, as a preferred implementation, the processor comprises a CPU processor.
The CPU (central processing unit) is a final execution unit for information processing and program operation, and has high operation stability and operation efficiency, so that the embodiment writes the spread spectrum parameters generated by the operating system into the clock generator based on the CPU, controls the clock generator to output the clock signal according to the spread spectrum parameters, and can further ensure stability and efficiency when controlling the clock generator.
Further, the CPU processor model includes LS3A 4000.
Since the LS3a4000 model CPU processor has high operation stability and operation efficiency, stability and efficiency in controlling the clock generator can be further ensured.
On the basis of the above embodiment, as a preferred implementation, the model of the clock generator includes 6P 41505.
Since the clock generator with the model number of 6P41505 has higher stability and accuracy of the clock frequency, in this embodiment, the clock generator with the model number of 6P41505 outputs the clock signal according to the spread spectrum parameter, which can further improve the stability and accuracy of the clock signal output by the clock generating circuit.
In addition to the above series of embodiments, as a preferred implementation, a clock line is connected between the processor and the clock generator, and is used for transmitting a clock signal output by the clock generator to the processor.
In this embodiment, a clock line is connected between the processor and the clock generator, and the clock line is used to transmit a clock signal from the clock generator back to the processor, so as to control the processor to operate at a clock frequency used in the current test, thereby synchronously implementing a spread spectrum test on the processor, and ensuring the reliability of the operation of the processor.
In addition, the spread spectrum test system comprises:
the clock generation circuit of any of the embodiments above;
and the function circuit to be tested is connected with the clock generating circuit and is used for responding to the clock signal generated by the clock generating circuit to perform spread spectrum test.
The spread spectrum test system comprises a clock generator, a memory for storing a system, and a processor respectively connected with the memory and the clock generator, wherein the processor is used for running an operating system according to an operating system file in the memory, and writing spread spectrum parameters generated by the operating system into the clock generator so as to control the clock generator to output clock signals according to the spread spectrum parameters. Based on spread spectrum test system that this application provided, the accessible utilizes the operating system of operation in the treater to set up the spread spectrum parameter to clock generator, realizes the frequency control to the clock signal that clock generator produced, when testing the anti-electromagnetic interference effect of different spread spectrum scopes, need not to weld parameter configuration resistance and clock generator repeatedly, and then has guaranteed the overall efficiency of spread spectrum test relatively.
The clock generation circuit and the spread spectrum test system provided by the present application are described in detail above. The embodiments are described in a progressive manner in the specification, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other. The device disclosed by the embodiment corresponds to the method disclosed by the embodiment, so that the description is simple, and the relevant points can be referred to the method part for description. It should be noted that, for those skilled in the art, it is possible to make several improvements and modifications to the present application without departing from the principle of the present application, and such improvements and modifications also fall within the scope of the claims of the present application.
It is further noted that, in the present specification, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
Claims (10)
1. A clock generation circuit, comprising:
a clock generator;
a memory storing operating system files;
and the processor is respectively connected with the memory and the clock generator and is used for operating an operating system according to an operating system file in the memory and writing the spread spectrum parameters generated by the operating system into the clock generator so as to control the clock generator to output clock signals according to the spread spectrum parameters.
2. The clock generation circuit of claim 1, wherein the processor and the clock generator are connected based on an I2C bus.
3. The clock generation circuit of claim 1, wherein the circuit further comprises:
and the display is connected with the processor and used for displaying the running interface of the operating system.
4. The clock generation circuit of claim 1, wherein the circuit further comprises:
and the keyboard is connected with the processor and is used for inputting the spread spectrum parameters to the operating system.
5. The clock generation circuit of claim 1, wherein the memory comprises a FLASH memory.
6. The clock generation circuit of claim 1, wherein the processor comprises a CPU processor.
7. The clock generation circuit of claim 6, wherein the model of the CPU processor comprises LS3A 4000.
8. The clock generation circuit of claim 1, wherein the model number of the clock generator comprises 6P 41505.
9. The clock generation circuit according to any one of claims 1 to 8, wherein a clock line is connected between the processor and the clock generator, and is configured to transmit the clock signal output by the clock generator to the processor.
10. A spread spectrum test system, comprising:
the clock generation circuit of any one of claims 1 to 9;
and the functional circuit to be tested is connected with the clock generating circuit and is used for responding to the clock signal generated by the clock generating circuit to perform spread spectrum test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011079403.1A CN112269422A (en) | 2020-10-10 | 2020-10-10 | Clock generation circuit and spread spectrum test system |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202011079403.1A CN112269422A (en) | 2020-10-10 | 2020-10-10 | Clock generation circuit and spread spectrum test system |
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| CN112269422A true CN112269422A (en) | 2021-01-26 |
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| CN202011079403.1A Pending CN112269422A (en) | 2020-10-10 | 2020-10-10 | Clock generation circuit and spread spectrum test system |
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Application publication date: 20210126 |