CN111953411A

CN111953411A - Optical module transmitting end eye diagram debugging method without eye diagram instrument

Info

Publication number: CN111953411A
Application number: CN201910408165.5A
Authority: CN
Inventors: 孙全意; 周四海; 齐鹏远
Original assignee: Sunus Photoelectronic Wuxi Co ltd
Current assignee: Sunus Photoelectronic Wuxi Co ltd
Priority date: 2019-05-15
Filing date: 2019-05-15
Publication date: 2020-11-17

Abstract

The invention discloses an eye pattern debugging method for an optical module transmitting end without an eye pattern instrument, which comprises the following steps: s1, storing LIV curve data of each optical device in the optical module in a server database, wherein the LIV curve data of each optical module corresponds to the external bar code of each optical module one by one; s2, in the process of initial measurement of the optical module, firstly scanning the bar codes of each optical device of the optical module, searching and calling LIV curve data of the corresponding optical device in the server database, searching modulation current and bias current corresponding to the optimal eye pattern on the corresponding LIV curve data, and setting the values of the modulation current and the bias current as required to obtain the required optical module transmitting end eye pattern.

Description

Optical module transmitting end eye diagram debugging method without eye diagram instrument

Technical Field

The invention relates to the technical field of optics, in particular to an eye diagram debugging method for an optical module transmitting end without an eye diagram instrument.

Background

In the production process of various optical modules, the eye diagram debugging of the transmitting end of the optical module needs to be matched with special equipment such as an eye diagram instrument, an error code meter, an optical power meter, an optical attenuator and the like, particularly a DCA (Digital Communication Analyzer, such as agilent 86100 series products), the equipment price is high, the equipment time is long for debugging the eye diagram, and the testing cost is high.

In order to save costs, other alternatives are currently used in the industry, which are broadly divided into two categories:

1. in the initial test process of a product, eye diagrams of the transmitting end of the optical module are not specifically debugged, and only an empirical value is written to ensure that the transmitting end of the optical module works in a normal state. After the product is aged, the eye pattern of the emission end of the optical module is accurately adjusted in the final measurement process of the product. The method does not need to use an eye pattern instrument in the initial adjustment stage of the product, saves the initial adjustment time of the product, but also brings the risk that the product is in an uncertain state during aging, increases the final measurement time and complexity of the product, and increases the risk of controlling the quality of the product.

2. In the initial adjustment process of a product, firstly, the offset of a laser is adjusted, 2 (or more) direct Current working points are set, the LIV (Light-Current-Voltage) curve of the laser at the transmitting end of an optical module is scanned and fitted, and then the modulating Current and the offset Current value of the laser are obtained through calculation, so that the eye diagram of the transmitting end of the optical module is set. However, the method needs to use a single chip Microcomputer (MCU) inside the optical module or a current source and ADC sampling and other devices inside a controller of the main chip, and the precision of these devices on the chip is usually poor, so the precision of the fitted laser LIV curve is also poor, thereby affecting the final eye diagram adjustment effect; in addition, this method requires at least 2 point testing of the laser before fitting an approximate LIV curve, which takes a long test time.

Disclosure of Invention

Aiming at the defects of the prior art, the invention aims to provide an optical module transmitting end eye diagram debugging method without an eye diagram instrument.

In order to achieve the purpose, the technical scheme adopted by the invention is as follows:

an eye pattern debugging method for an optical module transmitting end without an eye pattern instrument comprises the following steps:

s1, in the production process of the optical device, the LIV curve of the optical device needs to be measured by using a professional LIV test, and the measured LIV curve is used as the shipment performance index of the optical device. In the step, the LIV curve data of each optical device in the optical module is stored in a server database, and the LIV curve data of each optical module corresponds to the external bar codes of each optical module one by one;

s2, in the process of initial measurement of the optical module, firstly scanning the bar codes of each optical device of the optical module, searching and calling LIV curve data of the corresponding optical device in the server database, searching modulation current and bias current corresponding to the optimal eye pattern on the corresponding LIV curve data, and setting the values of the modulation current and the bias current as required to obtain the required optical module transmitting end eye pattern.

Further, in step S2, in the automatic gain control mode, the bias current is digitally replaced with the corresponding backlight current value.

The invention has the advantages of simple test method, short test time, low test cost and strong universality.

Detailed Description

The present invention will be further described below, and it should be noted that the present embodiment is based on the technical solution, and a detailed implementation manner and a specific operation process are provided, but the protection scope of the present invention is not limited to the present embodiment.

s1, in the production process of the optical device, the LIV curve of the optical device needs to be measured by using a professional LIV test, and the measured LIV curve is used as the shipment performance index of the optical device. In this step, LIV curve data of each optical device in the optical module is stored in the server database, and the LIV curve data of each optical module corresponds to the external barcode of each optical module one to one.

Generally, the LIV curve data includes data information such as a laser Ith (threshold current), a modulation current, a bias current, a light power value corresponding to all current operating points, and a backlight current value.

And S2, in the initial test process of the optical module, firstly scanning the bar codes of each optical device of the optical module, searching and calling LIV curve data of the corresponding optical device in the server database, searching the modulation current and the bias current corresponding to the optimal eye pattern on the corresponding LIV curve data, and setting the values of the modulation current and the bias current so as to obtain the required optical module transmitting end eye pattern.

Various changes and modifications can be made by those skilled in the art based on the above technical solutions and concepts, and all such changes and modifications should be included in the scope of the present invention.

Claims

1. An optical module transmitting end eye pattern debugging method without an eye pattern instrument is characterized by comprising the following steps:

s1, storing LIV curve data of each optical device in the optical module in a server database, wherein the LIV curve data of each optical module corresponds to the external bar code of each optical module one by one;

2. The method for debugging the eye diagram of the transmitting end of the optical module without the eye diagram instrument as claimed in claim 1, wherein in the step S2, the bias current is digitally replaced by a corresponding backlight current value in the automatic gain control mode.