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CN111830004A - A method of detecting Raman signals - Google Patents

A method of detecting Raman signals Download PDF

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CN111830004A
CN111830004A CN201910313500.3A CN201910313500A CN111830004A CN 111830004 A CN111830004 A CN 111830004A CN 201910313500 A CN201910313500 A CN 201910313500A CN 111830004 A CN111830004 A CN 111830004A
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detected
chip
raman
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刘丽花
李超波
远雁
解婧
王欢
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Institute of Microelectronics of CAS
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    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65Raman scattering
    • G01N21/658Raman scattering enhancement Raman, e.g. surface plasmons

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Abstract

The invention relates to the technical field of laser Raman detection, in particular to a method for detecting Raman signals, which comprises the following steps: dripping the mixed solution on a chip to be detected, wherein metal nano particles or metal nano wires are deposited on a substrate of the chip to be detected, and the mixed solution is specifically an electrolyte solution containing molecules to be detected; placing the chip to be detected dropwise with the mixed solution on a lower electrode plate between an upper electrode plate and a lower electrode plate, and applying voltage to the upper electrode plate and the lower electrode plate; the chip to be detected is detected through the Raman detector, the Raman signal of the chip to be detected is obtained, molecules in an acidic or alkaline solution in the dropwise added mixed solution are ionized under the action of an electrolyte solution to carry charges, and under the action of an electric field, the molecules can move along the opposite direction of an electric field line or an electric field line, so that a large number of molecules to be detected are closer to the chip to be detected, the number of the molecules is larger, the Raman signal is stronger, and the Raman detector can detect the enhanced Raman signal.

Description

一种检测拉曼信号的方法A method of detecting Raman signals

技术领域technical field

本发明涉及激光拉曼检测技术领域,尤其涉及一种检测拉曼信号的方法The invention relates to the technical field of laser Raman detection, in particular to a method for detecting Raman signals

背景技术Background technique

表面增强拉曼散射(SERS)是通过制备等离子体纳米结构来放大与生俱来就很弱的拉曼信号,通常情况下利用拉曼光谱技术能对物质成分进行鉴定,但是,由于很多化学物质直接通过拉曼光谱无法检测出信号,需要通过拉曼增强技术,提高拉曼信号信噪比,从而检测出待检物质的拉曼信号。Surface-enhanced Raman scattering (SERS) is to amplify the inherently weak Raman signal by preparing plasmonic nanostructures. Usually, Raman spectroscopy can be used to identify material components. However, due to many chemical substances The signal cannot be detected directly by Raman spectroscopy. Raman enhancement technology is needed to improve the signal-to-noise ratio of the Raman signal, so as to detect the Raman signal of the substance to be detected.

由于表面增强拉曼散射技术具有极高的灵敏度,独一无二的指纹光谱,非破坏性的数据收集等这些特点成为目前最具前景的分析手段之一。目前,表面增强拉曼散射技术是通过制备各种各样的基底结构实现增强拉曼信号的,但是制备高灵敏的基底结构工艺复杂,均匀性差,成本高,难以批量生产。Surface-enhanced Raman scattering technology has become one of the most promising analytical methods due to its extremely high sensitivity, unique fingerprint spectrum, and non-destructive data collection. At present, surface-enhanced Raman scattering technology can enhance Raman signals by preparing various substrate structures, but the preparation of highly sensitive substrate structures is complicated, with poor uniformity, high cost, and difficulty in mass production.

因此,如何通过简便的方法增强拉曼信号是目前亟待解决的技术问题。Therefore, how to enhance the Raman signal by a simple method is a technical problem that needs to be solved urgently.

发明内容SUMMARY OF THE INVENTION

鉴于上述问题,提出了本发明以便提供一种克服上述问题或者至少部分地解决上述问题的检测拉曼信号的方法。In view of the above-mentioned problems, the present invention is proposed to provide a method of detecting Raman signals that overcomes the above-mentioned problems or at least partially solves the above-mentioned problems.

本发明实施例提供了一种检测拉曼信号的方法,包括:An embodiment of the present invention provides a method for detecting a Raman signal, including:

将混合溶液滴加于待检测芯片上,所述待检测芯片的衬底上沉积有金属纳米粒子或金属纳米线,所述混合溶液具体为包含待测分子的电解质溶液;dropping the mixed solution on the chip to be detected, the substrate of the chip to be detected is deposited with metal nanoparticles or metal nanowires, and the mixed solution is specifically an electrolyte solution containing the molecule to be detected;

将滴加有所述混合溶液的待检测芯片置于上下电极板之间的下电极板上,为所述上下电极板施加电压;placing the chip to be detected dropwise with the mixed solution on the lower electrode plate between the upper and lower electrode plates, and applying a voltage to the upper and lower electrode plates;

将所述待检测芯片通过拉曼检测仪进行检测,获得所述待检测芯片的拉曼信号。The chip to be detected is detected by a Raman detector to obtain a Raman signal of the chip to be detected.

进一步地,所述将所述待检测芯片通过拉曼检测仪进行检测,获得所述待检测芯片的拉曼信号,具体包括:Further, the detection of the chip to be detected by a Raman detector to obtain the Raman signal of the chip to be detected specifically includes:

在对所述上下电极板施加电压后,将所述待检测芯片通过拉曼检测仪进行检测,获得所述待检测芯片的拉曼信号。After the voltage is applied to the upper and lower electrode plates, the chip to be detected is detected by a Raman detector to obtain a Raman signal of the chip to be detected.

进一步地,所述将所述待检测芯片通过拉曼检测仪进行检测,获得所述待检测芯片的拉曼信号,具体包括:Further, the detection of the chip to be detected by a Raman detector to obtain the Raman signal of the chip to be detected specifically includes:

在对所述上下电极板施加电压过程中,将所述待检测芯片通过拉曼检测仪进行检测,获得所述待检测芯片的拉曼信号。In the process of applying voltage to the upper and lower electrode plates, the chip to be detected is detected by a Raman detector to obtain a Raman signal of the chip to be detected.

进一步地,所述衬底具体采用如下任意一种材料:Further, the substrate specifically adopts any one of the following materials:

硅、二氧化硅、黑硅、多孔氧化铝模板、二氧化钛、石墨烯、无纺布、聚甲基丙烯酸甲酯和胶带。Silicon, silica, black silicon, porous alumina templates, titanium dioxide, graphene, non-woven fabrics, polymethyl methacrylate and tape.

进一步地,所述金属纳米粒子具体为单一金属纳米粒子和/或合金纳米粒子:Further, the metal nanoparticles are specifically single metal nanoparticles and/or alloy nanoparticles:

所述单一金属纳米粒子具体为金纳米粒子、银纳米粒子、或铜纳米粒子;The single metal nanoparticle is specifically gold nanoparticle, silver nanoparticle, or copper nanoparticle;

所述合金纳米粒子包含金、银、铜中至少两种金属;The alloy nanoparticles comprise at least two metals in gold, silver and copper;

所述金属纳米线具体为金纳米线、铜纳米线、或银纳米线。The metal nanowires are specifically gold nanowires, copper nanowires, or silver nanowires.

进一步地,所述金属纳米粒子的形状具体为如下任意一种:Further, the shape of the metal nanoparticles is specifically any one of the following:

星型、六边形和圆形。Star, hexagon and circle.

进一步地,所述待测分子具体为如下任意一种物质的分子:Further, the molecule to be tested is specifically a molecule of any of the following substances:

R6G、孔雀石绿和亚甲蓝。R6G, Malachite Green and Methylene Blue.

进一步地,所述电解质溶液具体为如下任意一种:Further, the electrolyte solution is specifically any one of the following:

稀盐酸、稀硫酸、稀磷酸和氯化钠。Dilute hydrochloric acid, dilute sulfuric acid, dilute phosphoric acid and sodium chloride.

进一步地,所述对所述上下电极板施加电压时所施加的电压范围在1V~3V之间,施加电压的时长在10min~30min之间。Further, the voltage range applied when the voltage is applied to the upper and lower electrode plates is between 1V and 3V, and the duration of the voltage application is between 10min and 30min.

进一步地,所述上下电极板具体采用如下任意一种材料:Further, the upper and lower electrode plates are specifically made of any of the following materials:

铜、铁、铝和氧化钛。Copper, iron, aluminum and titanium oxide.

本发明实施例中的一个或多个技术方案,至少具有如下技术效果或优点:One or more technical solutions in the embodiments of the present invention have at least the following technical effects or advantages:

本发明提供的一种检测拉曼信号的方法,采用在待检测芯片上滴加混合溶液,待检测芯片的衬底上沉积有金属纳米粒子或金属纳米线,该混合溶液是包含待测分子的电解质溶液,然后将该滴加有混合溶液的待检测芯片置于上下电极板之间的下电极板上,对上下电极板施加电压,将待检测芯片通过拉曼检测仪进行检测,获得待检测芯片的拉曼信号,采用上述的检测方式,在上下电极板上施加电压产生电场,使得待测分子在电解质溶液的作用下发生电离而带上电荷,在上下电极板的电场作用下,该分子能够沿着电场线或电场线相反方向运动,使得大量分子聚集在待检测芯片上,由于,通过电场的作用使得待测分子与待检测芯片的距离变小,而且,在待检测芯片的预设距离范围内聚集了大量的待测分子,通过物理增强机理使得拉曼信号增强,同时,由于在电场的作用下该待测分子与待检测芯片距离变小,该待测分子与待检测芯片衬底上的金属纳米粒子形成键或发生电荷转移,通过化学增强机理使得拉曼信号增强,使得拉曼检测仪可以检测到待检测芯片增强的拉曼信号。A method for detecting Raman signals provided by the present invention adopts a mixed solution dropwise on a chip to be detected, metal nanoparticles or metal nanowires are deposited on the substrate of the chip to be detected, and the mixed solution contains molecules to be detected Electrolyte solution, and then place the chip to be detected with the mixed solution added dropwise on the lower electrode plate between the upper and lower electrode plates, apply a voltage to the upper and lower electrode plates, and detect the chip to be detected by a Raman detector to obtain a to-be-detected chip The Raman signal of the chip adopts the above-mentioned detection method to apply a voltage on the upper and lower electrode plates to generate an electric field, so that the molecule to be tested is ionized and charged under the action of the electrolyte solution. Under the action of the electric field of the upper and lower electrode plates, the molecule It can move along the electric field line or in the opposite direction of the electric field line, so that a large number of molecules gather on the chip to be detected, because the distance between the molecule to be detected and the chip to be detected is reduced by the action of the electric field, and, in the preset of the chip to be detected A large number of molecules to be tested are gathered in the distance range, and the Raman signal is enhanced through the physical enhancement mechanism. The metal nanoparticles on the bottom form bonds or undergo charge transfer, and the Raman signal is enhanced through a chemical enhancement mechanism, so that the Raman detector can detect the enhanced Raman signal of the chip to be detected.

附图说明Description of drawings

通过阅读下文优选实施方式的详细描述,各种其他的优点和益处对于本领域普通技术人员将变得清楚明了。附图仅用于示出优选实施方式的目的,而并不认为是对本发明的限制。而且在整个附图中,用相同的参考图形表示相同的部件。在附图中:Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are for the purpose of illustrating preferred embodiments only and are not to be considered limiting of the invention. Also, the same components are represented by the same reference figures throughout the drawings. In the attached image:

图1示出了本发明实施例一中的检测拉曼信号的方法的步骤流程示意图;1 shows a schematic flowchart of steps of a method for detecting a Raman signal in Embodiment 1 of the present invention;

图2示出了本发明实施例一中的检测拉曼信号采用的装置的结构示意图;FIG. 2 shows a schematic structural diagram of a device used for detecting Raman signals in Embodiment 1 of the present invention;

图3示出了本发明实施例二中的检测拉曼信号的方法的步骤流程示意图;3 shows a schematic flowchart of steps of a method for detecting a Raman signal in Embodiment 2 of the present invention;

图4示出了本发明实施例二中的检测拉曼信号采用的装置的结构示意图。FIG. 4 shows a schematic structural diagram of an apparatus used for detecting Raman signals in Embodiment 2 of the present invention.

具体实施方式Detailed ways

下面将参照附图更详细地描述本公开的示例性实施例。虽然附图中显示了本公开的示例性实施例,然而应当理解,可以以各种形式实现本公开而不应被这里阐述的实施例所限制。相反,提供这些实施例是为了能够更透彻地理解本公开,并且能够将本公开的范围完整的传达给本领域的技术人员。Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided so that the present disclosure will be more thoroughly understood, and will fully convey the scope of the present disclosure to those skilled in the art.

拉曼散射效应是个非常弱的过程,一般其光强仅约为入射光强的10-10,所以,拉曼信号很弱,无法通过拉曼检测仪直接检测到。The Raman scattering effect is a very weak process. Generally, the light intensity is only about 10 -10 of the incident light intensity. Therefore, the Raman signal is very weak and cannot be directly detected by a Raman detector.

本发明实施例提供了一种检测拉曼信号的方法,包括:将混合溶液滴加于待检测芯片上,待检测芯片的衬底上沉积有金属纳米粒子或金属纳米线,混合溶液具体为包含待测分子的电解质溶液;将滴加有混合溶液的待检测芯片置于上下电极板之间的下电极板上,为上下电极板施加电压;将待检测芯片通过拉曼检测仪进行检测,获得待检测芯片的拉曼信号。An embodiment of the present invention provides a method for detecting a Raman signal, comprising: dropping a mixed solution on a chip to be detected, metal nanoparticles or metal nanowires are deposited on the substrate of the chip to be detected, and the mixed solution specifically contains The electrolyte solution of the molecule to be tested; the chip to be tested with the mixed solution added dropwise is placed on the lower electrode plate between the upper and lower electrode plates, and a voltage is applied to the upper and lower electrode plates; the chip to be detected is detected by a Raman detector to obtain Raman signal of the chip to be detected.

该检测拉曼信号的方法包括两种实施方式,一种是将待检测芯片通过拉曼检测仪进行检测,获得待检测芯片的拉曼信号,具体包括:The method for detecting Raman signals includes two implementations. One is to detect the chip to be detected by a Raman detector to obtain the Raman signal of the chip to be detected, which specifically includes:

在对上下电极板施加电压后,将待检测芯片通过拉曼检测仪进行检测,获得待检测芯片的拉曼信号。After applying voltage to the upper and lower electrode plates, the chip to be detected is detected by a Raman detector to obtain a Raman signal of the chip to be detected.

另一种是将待检测芯片通过拉曼检测仪进行检测,获得待检测芯片的拉曼信号,具体包括:The other is to detect the chip to be detected by a Raman detector to obtain the Raman signal of the chip to be detected, which specifically includes:

在对上下电极板施加电压的过程中,将待检测芯片通过拉曼检测仪进行检测,获得待检测芯片的拉曼信号。In the process of applying voltage to the upper and lower electrode plates, the chip to be detected is detected by a Raman detector to obtain a Raman signal of the chip to be detected.

具体的通过如下实施例进行详细描述。Specifically, the following examples are used to describe in detail.

实施例一Example 1

本发明实施例一提供了一种检测拉曼信号的方法,如图1所示,包括:S101,将混合溶液滴加于待检测芯片上,该待检测芯片的衬底上沉积有金属纳米粒子或金属纳米线,该混合溶液具体为包含待测分子的电解质溶液;S102,将滴加该混合溶液的待检测芯片置于上下电极板之间的下电极板上,为上下电极板施加电压;S103,在对上下电极板施加电压后,将待检测芯片通过拉曼检测仪进行检测,获得待检测芯片的拉曼信号。Embodiment 1 of the present invention provides a method for detecting Raman signals, as shown in FIG. 1 , including: S101 , dropping a mixed solution on a chip to be detected, and metal nanoparticles are deposited on the substrate of the chip to be detected Or metal nanowires, the mixed solution is specifically an electrolyte solution containing the molecule to be tested; S102, the chip to be tested on which the mixed solution is added dropwise is placed on the lower electrode plate between the upper and lower electrode plates, and a voltage is applied to the upper and lower electrode plates; S103, after applying a voltage to the upper and lower electrode plates, the chip to be detected is detected by a Raman detector to obtain a Raman signal of the chip to be detected.

在一种可选的实施方式中,该待检测芯片的衬底上沉积金属纳米粒子或金属米线。In an optional implementation manner, metal nanoparticles or metal rice wires are deposited on the substrate of the chip to be detected.

其中,该衬底具体采用如下任意一种材料:硅、二氧化硅、黑硅、多孔氧化铝模板、二氧化钛、石墨烯、无纺布、聚甲基丙烯酸甲酯和胶带。本发明实施例中并不仅限于上述的材料。Wherein, the substrate specifically adopts any one of the following materials: silicon, silicon dioxide, black silicon, porous alumina template, titanium dioxide, graphene, non-woven fabric, polymethyl methacrylate and adhesive tape. The embodiments of the present invention are not limited to the above-mentioned materials.

该金属纳米粒子具体为单一金属纳米粒子和/或合金纳米粒子。其中,该单一金属纳米粒子具体为金纳米粒子、银纳米粒子、或铜纳米粒子;该合金纳米粒子包含金、银、铜中至少两种金属。合金纳米粒子具体有金和银的合金纳米粒子、金和铜的合金纳米粒子、银和铜的合金纳米粒子、金、银、铜的合金纳米粒子。The metal nanoparticles are specifically single metal nanoparticles and/or alloy nanoparticles. Wherein, the single metal nanoparticle is specifically gold nanoparticle, silver nanoparticle, or copper nanoparticle; the alloy nanoparticle includes at least two metals among gold, silver, and copper. The alloy nanoparticles specifically include alloy nanoparticles of gold and silver, alloy nanoparticles of gold and copper, alloy nanoparticles of silver and copper, and alloy nanoparticles of gold, silver and copper.

比如,可以在该衬底上沉积金纳米粒子、或者金和铜的合金纳米粒子,还可以是既有金纳米粒子,又有金和铜的合金纳米粒子。For example, gold nanoparticles, or alloy nanoparticles of gold and copper, or alloy nanoparticles of both gold and copper can be deposited on the substrate.

另外,该金属纳米线具体为金纳米线、银纳米线、铜纳米线中的任意一种。因此,在该衬底上还可以沉积金纳米线、银纳米线、铜纳米线中的任意一种。In addition, the metal nanowire is specifically any one of gold nanowires, silver nanowires, and copper nanowires. Therefore, any one of gold nanowires, silver nanowires, and copper nanowires can also be deposited on the substrate.

该金属纳米粒子的形状具体为如下任意一种:星型、花型、六边形和圆形。其中,星型可以是五角星、六角星等等。花型具体可以是边缘棱角均匀的形状。The shape of the metal nanoparticle is specifically any one of the following: a star shape, a flower shape, a hexagon and a circle. Among them, the star shape can be a pentagram, a hexagram, and so on. Specifically, the flower pattern can be a shape with uniform edges and corners.

在一种可选的实施方式中,该待测分子具体为如下任意一种物质的分子:R6G、孔雀石绿和亚甲蓝。优选的是R6G,该R6G可以调为溶液,其中,该溶液的浓度为10-5M,该浓度并不做具体限定。In an optional embodiment, the molecule to be detected is specifically a molecule of any one of the following substances: R6G, malachite green and methylene blue. R6G is preferred, and the R6G can be adjusted into a solution, wherein the concentration of the solution is 10 -5 M, and the concentration is not specifically limited.

在本发明实施例中,该电解质溶液具体为如下任意一种:稀盐酸、稀硫酸、稀磷酸中氯化钠。优选的是稀盐酸。In the embodiment of the present invention, the electrolyte solution is any one of the following: dilute hydrochloric acid, dilute sulfuric acid, and sodium chloride in dilute phosphoric acid. Preferred is dilute hydrochloric acid.

在S101,将该混合溶液滴加于待检测芯片上之后,执行S102,将滴加有混合溶液的待检测芯片置于上下电极板之间的下电极板上,为该上下电极板施加电压。如图2所示,为滴加了混合溶液的待检测芯片A置于上下电极板L1和L2之间,通过电源为上下电极板L1和L2施加电压的示意图。In S101, after the mixed solution is dropped on the chip to be detected, S102 is performed, and the chip to be detected with the mixed solution added dropwise is placed on the lower electrode plate between the upper and lower electrode plates, and a voltage is applied to the upper and lower electrode plates. As shown in FIG. 2 , a schematic diagram of applying a voltage to the upper and lower electrode plates L1 and L2 through a power supply is to place the chip A to be detected with the mixed solution added dropwise between the upper and lower electrode plates L1 and L2.

具体地,该上下电极板具体采用铜、铝、铁或氧化钛等导电材料。优选采用铜。Specifically, the upper and lower electrode plates are made of conductive materials such as copper, aluminum, iron or titanium oxide. Copper is preferably used.

上述滴加于待检测芯片上的混合溶液中,待测分子在电解质溶液的作用下发生电离而带上电荷,在上下电极板的电场作用下,该分子能够沿着电场线或电场线相反方向运动,使得大量分子聚集在待检测芯片上,由于,通过电场的作用使得待测分子与待检测芯片的距离变小,而且,在待检测芯片的预设距离范围内聚集了大量的待测分子,通过物理增强机理使得拉曼信号增强,同时,由于在电场的作用下该待测分子与待检测芯片距离变小,该待测分子与待检测芯片衬底上的金属纳米粒子形成键或发生电荷转移,通过化学增强机理使得拉曼信号增强。In the mixed solution dripped on the chip to be tested, the molecules to be tested are ionized and charged under the action of the electrolyte solution. Under the action of the electric field of the upper and lower electrode plates, the molecules can move along the electric field lines or in the opposite direction of the electric field lines. Because of the action of the electric field, the distance between the molecules to be tested and the chip to be detected is reduced, and a large number of molecules to be tested are gathered within the preset distance range of the chip to be detected. , through the physical enhancement mechanism, the Raman signal is enhanced. At the same time, due to the smaller distance between the molecule to be detected and the chip to be detected under the action of the electric field, the molecule to be detected forms a bond with the metal nanoparticles on the substrate of the chip to be detected. Charge transfer, through a chemical enhancement mechanism, enhances the Raman signal.

因此,在S103的过程中,在对上下电极板施加电压后,将该待检测芯片通过拉曼检测仪进行检测,获得该待检测芯片的拉曼信号。即在施加预设时长的电压后,通过拉曼检测仪能够检测获得该待检测芯片增强的拉曼信号。Therefore, in the process of S103, after the voltage is applied to the upper and lower electrode plates, the chip to be detected is detected by a Raman detector to obtain a Raman signal of the chip to be detected. That is, after applying a voltage for a preset duration, a Raman detector can detect and obtain an enhanced Raman signal of the chip to be detected.

在一种可选的实施方式中,对该上下电极板施加的电压范围在1V~3V之间,具体可以是1V,2V,3V,施加的电压时长在10min~30min之间,具体可以是10min,20min,30min。优选地,在对该上下电极板施加3V电压,且施加电压时长在30min,在施加电压30min之后,还包括将该待检测芯片从所述上下电极板之间取出并吹干,具体吹干的方式可以是自然风干或氮气吹干,然后再通过该拉曼检测仪对该待检测芯片进行检测,获得增强的拉曼信号。In an optional embodiment, the voltage range applied to the upper and lower electrode plates is between 1V and 3V, specifically 1V, 2V, and 3V, and the duration of the applied voltage is between 10min and 30min, specifically 10min. , 20min, 30min. Preferably, after applying a voltage of 3V to the upper and lower electrode plates, and applying the voltage for 30 minutes, after applying the voltage for 30 minutes, it also includes taking out the chip to be detected from between the upper and lower electrode plates and drying it. The method can be natural air drying or nitrogen drying, and then the chip to be detected is detected by the Raman detector to obtain an enhanced Raman signal.

该拉曼检测仪在检测拉曼信号时,采用入射波长为532nm的激光,照射至该待检测芯片表面,检测到散射的拉曼光谱,进而获得增强的拉曼信号。When the Raman detector detects the Raman signal, a laser with an incident wavelength of 532 nm is used to irradiate the surface of the chip to be detected, and the scattered Raman spectrum is detected, thereby obtaining an enhanced Raman signal.

实施例二Embodiment 2

本发明实施例还提供了一种检测拉曼信号的方法,如图3所示,包括:An embodiment of the present invention also provides a method for detecting a Raman signal, as shown in FIG. 3 , including:

S301,将混合溶液滴加于待检测芯片上,所述待检测芯片的衬底上沉积有金属纳米粒子或金属纳米线,所述混合溶液具体为包含待测分子的电解质溶液S301, drop a mixed solution on the chip to be detected, where metal nanoparticles or metal nanowires are deposited on the substrate of the chip to be detected, and the mixed solution is specifically an electrolyte solution containing molecules to be detected

S302,将滴加有所述混合溶液的待检测芯片置于上下电极板之间的下电极板上,为所述上下电极板施加电压;S302, placing the chip to be detected with the mixed solution dripped on the lower electrode plate between the upper and lower electrode plates, and applying a voltage to the upper and lower electrode plates;

S303,在对所述上下电极板施加电压的过程中,将待检测芯片通过拉曼检测仪进行检测,获得所述待检测芯片的拉曼信号。S303 , in the process of applying the voltage to the upper and lower electrode plates, the chip to be detected is detected by a Raman detector to obtain a Raman signal of the chip to be detected.

该方法是在施加电压的同时采用拉曼检测仪进行实时在线的检测。因此,在该上下电极板中的上电极板设置有透光区域,使得激光发射端发射的激光能够透过该透光区域到达待检测芯片上,同时,该待检测芯片的散射光能够经过该透光区域到达接收器,实现拉曼检测仪对待检测芯片的检测,从而获得增强的拉曼信号。The method uses a Raman detector for real-time online detection while applying a voltage. Therefore, the upper electrode plate of the upper and lower electrode plates is provided with a light-transmitting area, so that the laser light emitted by the laser emitting end can pass through the light-transmitting area to reach the chip to be detected, and at the same time, the scattered light of the chip to be detected can pass through the The light-transmitting area reaches the receiver to realize the detection of the chip to be detected by the Raman detector, thereby obtaining an enhanced Raman signal.

其中,该上电极板设置的透光区域具体为在该上电极板设置有开孔或者该上电极板直接采用透光导电材料,此时,该上下电极板具体采用铜、铝、铁、氧化钛等导电材料,优选采用氧化钛,可以将整个上极板采用透明的氧化钛材料,还可以将该上极板采用铜、铝、铁等导电材料,在该上极板设置开孔,在该开孔处采用透明的导电板,比如,可以是氧化钛(TiO2)。如图4所示,为在上电极板L1上设置开孔,在该开孔处采用透明的导电板,在该上下电极板L1和L2之间的下电极板L2上放置待检测芯片A的结构示意图。Wherein, the light-transmitting area set on the upper electrode plate is specifically provided with openings on the upper electrode plate or the upper electrode plate is directly made of a light-transmitting conductive material. At this time, the upper and lower electrode plates are specifically made of copper, aluminum, iron, oxide Titanium and other conductive materials, preferably titanium oxide, the entire upper plate can be made of transparent titanium oxide material, and the upper plate can also be made of copper, aluminum, iron and other conductive materials, and the upper plate is provided with openings. A transparent conductive plate, such as titanium oxide (TiO 2 ), is used for the opening. As shown in FIG. 4 , in order to set an opening on the upper electrode plate L1, a transparent conductive plate is used at the opening, and the chip A to be detected is placed on the lower electrode plate L2 between the upper and lower electrode plates L1 and L2. Schematic.

在一种可选的实施方式中,所述待检测芯片的衬底具体采用如下任意一种材料:In an optional implementation manner, the substrate of the to-be-detected chip specifically adopts any one of the following materials:

硅、二氧化硅、黑硅、多孔氧化铝模板、二氧化钛、石墨烯、无纺布、聚甲基丙烯酸甲酯和胶带。Silicon, silica, black silicon, porous alumina templates, titanium dioxide, graphene, non-woven fabrics, polymethyl methacrylate and tape.

在一种可选的实施方式中,所述金属纳米粒子具体为单一金属纳米粒子和/或合金纳米粒子:In an optional embodiment, the metal nanoparticles are specifically single metal nanoparticles and/or alloy nanoparticles:

所述单一金属纳米粒子具体为金纳米粒子、银纳米粒子、或铜纳米粒子;The single metal nanoparticle is specifically gold nanoparticle, silver nanoparticle, or copper nanoparticle;

所述合金纳米粒子包含金、银、铜中至少两种金属;The alloy nanoparticles comprise at least two metals in gold, silver and copper;

所述金属纳米线具体为金纳米线、铜纳米线、或银纳米线。The metal nanowires are specifically gold nanowires, copper nanowires, or silver nanowires.

在一种可选的实施方式中,所述金属纳米粒子的形状具体为如下任意一种:In an optional embodiment, the shape of the metal nanoparticles is any one of the following:

星型、六边形和圆形。还可以采用花型,具体是边缘棱角均匀的形状。Star, hexagon and circle. Patterns can also be used, specifically shapes with even edges and corners.

在一种可选的实施方式中,所述待测分子具体为如下下任意一种物质的分子:In an optional embodiment, the molecule to be tested is specifically a molecule of any one of the following substances:

R6G、孔雀石绿和亚甲蓝。R6G, Malachite Green and Methylene Blue.

在一种可选的实施方式中,所述电解质溶液具体为如下任意一种:In an optional embodiment, the electrolyte solution is any one of the following:

稀盐酸、稀硫酸、稀磷酸和氯化钠。Dilute hydrochloric acid, dilute sulfuric acid, dilute phosphoric acid and sodium chloride.

在一种可选的实施方式中,所述对所述上下电极板施加电压时所施加的电压范围在1V~3V之间,施加电压的时长在10min~30min之间。In an optional implementation manner, the voltage applied to the upper and lower electrode plates ranges from 1V to 3V, and the voltage is applied for a duration of 10min to 30min.

本发明实施例中的一个或多个技术方案,至少具有如下技术效果或优点:One or more technical solutions in the embodiments of the present invention have at least the following technical effects or advantages:

本发明提供的一种检测拉曼信号的方法,采用在待检测芯片上滴加混合溶液,待检测芯片的衬底上沉积有金属纳米粒子或金属纳米线,该混合溶液是包含待测分子的电解质溶液,然后将该滴加有混合溶液的待检测芯片置于上下电极板之间的下电极板上,对上下电极板施加电压,将待检测芯片通过拉曼检测仪进行检测,获得待检测芯片的拉曼信号,采用上述的检测方式,在上下电极板上施加电压产生电场,使得待测分子在电解质溶液的作用下发生电离而带上电荷,在上下电极板的电场作用下,该分子能够沿着电场线或电场线相反方向运动,使得大量分子聚集在待检测芯片上,由于,通过电场的作用使得待测分子与待检测芯片的距离变小,而且,在待检测芯片的预设距离范围内聚集了大量的待测分子,通过物理增强机理使得拉曼信号增强,同时,由于在电场的作用下该待测分子与待检测芯片距离变小,该待测分子与待检测芯片衬底上的金属纳米粒子形成键或发生电荷转移,通过化学增强机理使得拉曼信号增强,使得拉曼检测仪可以检测到待检测芯片增强的拉曼信号。A method for detecting Raman signals provided by the present invention adopts a mixed solution dropwise on a chip to be detected, metal nanoparticles or metal nanowires are deposited on the substrate of the chip to be detected, and the mixed solution contains molecules to be detected Electrolyte solution, and then place the chip to be detected with the mixed solution added dropwise on the lower electrode plate between the upper and lower electrode plates, apply a voltage to the upper and lower electrode plates, and detect the chip to be detected by a Raman detector to obtain a to-be-detected chip The Raman signal of the chip adopts the above-mentioned detection method to apply a voltage on the upper and lower electrode plates to generate an electric field, so that the molecule to be tested is ionized and charged under the action of the electrolyte solution. Under the action of the electric field of the upper and lower electrode plates, the molecule It can move along the electric field line or in the opposite direction of the electric field line, so that a large number of molecules gather on the chip to be detected, because the distance between the molecule to be detected and the chip to be detected is reduced by the action of the electric field, and, in the preset of the chip to be detected A large number of molecules to be tested are gathered in the distance range, and the Raman signal is enhanced through the physical enhancement mechanism. The metal nanoparticles on the bottom form bonds or undergo charge transfer, and the Raman signal is enhanced through a chemical enhancement mechanism, so that the Raman detector can detect the enhanced Raman signal of the chip to be detected.

尽管已描述了本发明的优选实施例,但本领域内的技术人员一旦得知了基本创造性概念,则可对这些实施例作出另外的变更和修改。所以,所附权利要求意欲解释为包括优选实施例以及落入本发明范围的所有变更和修改。Although preferred embodiments of the present invention have been described, additional changes and modifications to these embodiments may occur to those skilled in the art once the basic inventive concepts are known. Therefore, the appended claims are intended to be construed to include the preferred embodiment and all changes and modifications that fall within the scope of the present invention.

显然,本领域的技术人员可以对本发明进行各种改动和变型而不脱离本发明的精神和范围。这样,倘若本发明的这些修改和变型属于本发明权利要求及其等同技术的范围之内,则本发明也意图包含这些改动和变型在内。It will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the spirit and scope of the invention. Thus, provided that these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include these modifications and variations.

Claims (10)

1.一种检测拉曼信号的方法,其特征在于,包括:1. a method for detecting Raman signal, is characterized in that, comprises: 将混合溶液滴加于待检测芯片上,所述待检测芯片的衬底上沉积有金属纳米粒子或金属纳米线,所述混合溶液具体为包含待测分子的电解质溶液;dropping the mixed solution on the chip to be detected, the substrate of the chip to be detected is deposited with metal nanoparticles or metal nanowires, and the mixed solution is specifically an electrolyte solution containing the molecule to be detected; 将滴加有所述混合溶液的待检测芯片置于上下电极板之间的下电极板上,为所述上下电极板施加电压;placing the chip to be detected dropwise with the mixed solution on the lower electrode plate between the upper and lower electrode plates, and applying a voltage to the upper and lower electrode plates; 将所述待检测芯片通过拉曼检测仪进行检测,获得所述待检测芯片的拉曼信号。The chip to be detected is detected by a Raman detector to obtain a Raman signal of the chip to be detected. 2.如权利要求1所述的方法,其特征在于,所述将所述待检测芯片通过拉曼检测仪进行检测,获得所述待检测芯片的拉曼信号,具体包括:2. The method according to claim 1, wherein the detecting the chip to be detected by a Raman detector to obtain a Raman signal of the chip to be detected specifically comprises: 在对所述上下电极板施加电压后,将所述待检测芯片通过拉曼检测仪进行检测,获得所述待检测芯片的拉曼信号。After the voltage is applied to the upper and lower electrode plates, the chip to be detected is detected by a Raman detector to obtain a Raman signal of the chip to be detected. 3.如权利要求1所述的方法,其特征在于,所述将所述待检测芯片通过拉曼检测仪进行检测,获得所述待检测芯片的拉曼信号,具体包括:3. The method according to claim 1, wherein the detecting the chip to be detected by a Raman detector to obtain a Raman signal of the chip to be detected specifically comprises: 在对所述上下电极板施加电压过程中,将所述待检测芯片通过拉曼检测仪进行检测,获得所述待检测芯片的拉曼信号。In the process of applying voltage to the upper and lower electrode plates, the chip to be detected is detected by a Raman detector to obtain a Raman signal of the chip to be detected. 4.如权利要求1所述的方法,其特征在于,所述衬底具体采用如下任意一种材料:4. The method of claim 1, wherein the substrate specifically adopts any one of the following materials: 硅、二氧化硅、黑硅、多孔氧化铝模板、二氧化钛、石墨烯、无纺布、聚甲基丙烯酸甲酯和胶带。Silicon, silica, black silicon, porous alumina templates, titanium dioxide, graphene, non-woven fabrics, polymethyl methacrylate and tape. 5.如权利要求1所述的方法,其特征在于,所述金属纳米粒子具体为单一金属纳米粒子和/或合金纳米粒子:5. The method of claim 1, wherein the metal nanoparticles are specifically single metal nanoparticles and/or alloy nanoparticles: 所述单一金属纳米粒子具体为金纳米粒子、银纳米粒子、或铜纳米粒子;The single metal nanoparticle is specifically gold nanoparticle, silver nanoparticle, or copper nanoparticle; 所述合金纳米粒子包含金、银、铜中至少两种金属;The alloy nanoparticles comprise at least two metals in gold, silver and copper; 所述金属纳米线具体为金纳米线、铜纳米线、或银纳米线。The metal nanowires are specifically gold nanowires, copper nanowires, or silver nanowires. 6.如权利要求1所述的方法,其特征在于,所述金属纳米粒子的形状具体为如下任意一种:6. The method of claim 1, wherein the shape of the metal nanoparticles is any one of the following: 星型、六边形和圆形。Star, hexagon and circle. 7.如权利要求1所述的方法,其特征在于,所述待测分子具体为如下任意一种物质的分子:7. The method of claim 1, wherein the molecule to be tested is specifically a molecule of any one of the following substances: R6G、孔雀石绿和亚甲蓝。R6G, Malachite Green and Methylene Blue. 8.如权利要求1所述的方法,其特征在于,所述电解质溶液具体为如下任意一种:8. The method of claim 1, wherein the electrolyte solution is any one of the following: 稀盐酸、稀硫酸、稀磷酸和氯化钠。Dilute hydrochloric acid, dilute sulfuric acid, dilute phosphoric acid and sodium chloride. 9.如权利要求1所述的方法,其特征在于,所述对所述上下电极板施加电压时所施加的电压范围在1V~3V之间,施加电压的时长在10min~30min之间。9 . The method according to claim 1 , wherein the voltage applied to the upper and lower electrode plates ranges from 1V to 3V, and the duration of voltage application is from 10min to 30min. 10 . 10.如权利要求1所述的方法,其特征在于,所述上下电极板具体采用如下任意一种材料:10. The method of claim 1, wherein the upper and lower electrode plates are made of any one of the following materials: 铜、铁、铝和氧化钛。Copper, iron, aluminum and titanium oxide.
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Application publication date: 20201027