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CN111564521A - Preparation method of all-matte IBC solar cell - Google Patents

Preparation method of all-matte IBC solar cell Download PDF

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CN111564521A
CN111564521A CN201910650899.4A CN201910650899A CN111564521A CN 111564521 A CN111564521 A CN 111564521A CN 201910650899 A CN201910650899 A CN 201910650899A CN 111564521 A CN111564521 A CN 111564521A
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layer
silicon wafer
surface field
antireflection layer
diffusion
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胡林娜
郭永刚
屈小勇
张婷
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Huanghe Hydropower Xining Solar Power Co ltd
Huanghe Hydropower Development Co Ltd
State Power Investment Corp Xian Solar Power Co Ltd
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Huanghe Hydropower Xining Solar Power Co ltd
Huanghe Hydropower Development Co Ltd
State Power Investment Corp Xian Solar Power Co Ltd
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • H10F71/121The active layers comprising only Group IV materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/10Semiconductor bodies
    • H10F77/12Active materials
    • H10F77/122Active materials comprising only Group IV materials
    • H10F77/1223Active materials comprising only Group IV materials characterised by the dopants
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/70Surface textures, e.g. pyramid structures
    • H10F77/703Surface textures, e.g. pyramid structures of the semiconductor bodies, e.g. textured active layers
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/547Monocrystalline silicon PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
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Abstract

本专利提供了一种全绒面IBC太阳电池制备方法,包括清洗制绒工艺、选择性发射极工艺、沉积掩膜层工艺、制备表面场工艺、制备减反射层工艺和电极制作工艺。本发明通过将电极移至背面而增加前表面光吸收率,由此提高短路电流。同时所得电池两面全为绒面极大减小了光反射率,进一步提高光照俘获量,大大简化了工艺流程及降低了成本。

Figure 201910650899

This patent provides a method for preparing a full textured IBC solar cell, including a cleaning and texturing process, a selective emitter process, a mask layer deposition process, a surface field preparation process, an antireflection layer preparation process and an electrode fabrication process. The present invention increases the light absorption rate of the front surface by moving the electrodes to the back surface, thereby increasing the short circuit current. At the same time, both sides of the obtained battery are all suede surfaces, which greatly reduces the light reflectivity, further improves the light capture amount, greatly simplifies the process flow and reduces the cost.

Figure 201910650899

Description

一种全绒面IBC太阳电池制备方法A kind of preparation method of full suede IBC solar cell

技术领域technical field

本发明属于太阳电池领域,特别是涉及一种全绒面太阳电池。The invention belongs to the field of solar cells, in particular to a full-suede solar cell.

背景技术Background technique

基于降低度电成本提高电池效率的宗旨,IBC(Interdigitatedbackcontact)电池以优异的光学吸收及较低内阻的特点被光伏研究者所青睐。相比N-PERT、PERC高效电池而言,IBC电池的电极均位于背面不仅方便了组件封装而且为优化串联电阻提供了较大空间。目前生产IBC电池在制作P+掺杂区及N+掺杂区时采用光刻掩膜法,因工艺流程繁多导致生产成本大幅增加。与现有技术的IBC电池工艺相比,本发明所涉及的制备方法具有生产成本低且工艺步骤少的优点。Based on the purpose of reducing LCOE and improving cell efficiency, IBC (Interdigitated backcontact) cells are favored by photovoltaic researchers due to their excellent optical absorption and low internal resistance. Compared with N-PERT and PERC high-efficiency cells, the electrodes of IBC cells are located on the back, which not only facilitates the packaging of components, but also provides a large space for optimizing the series resistance. At present, the photolithography mask method is used in the production of the P+ doped region and the N+ doped region in the production of IBC cells, and the production cost is greatly increased due to the numerous process flows. Compared with the prior art IBC battery process, the preparation method of the present invention has the advantages of low production cost and fewer process steps.

发明内容SUMMARY OF THE INVENTION

本发明的主要目的在于研制一种全绒面IBC太阳电池制备方法,提出采用氮化硅作为掩膜层,然后通过激光烧蚀法开窗实现另一区的掺杂,大大简化了工艺流程及降低了成本。The main purpose of the present invention is to develop a method for preparing a full-textured IBC solar cell. It proposes to use silicon nitride as a mask layer, and then open a window through a laser ablation method to achieve doping in another area, which greatly simplifies the process flow and Reduced costs.

一种全绒面IBC太阳电池制备方法,其特征在于,包括清洗制绒工艺、选择性发射极工艺、沉积掩膜层工艺、制备表面场工艺、制备减反射层工艺和电极制作工艺;A method for preparing a full-textured IBC solar cell, characterized in that it comprises a cleaning and texturing process, a selective emitter process, a mask layer deposition process, a surface field preparation process, an antireflection layer preparation process and an electrode fabrication process;

所述清洗制绒工艺包括:The cleaning and texturing process includes:

1)将N型硅片放置NaOH及H2O2液中进行硅片表面的机械损伤层和表面油污的清洗;1) Place the N-type silicon wafer in NaOH and H2O2 solution to clean the mechanical damage layer and surface oil on the surface of the silicon wafer;

2)在NaOH及单晶制绒添加剂混合液中进行硅片表面织构化处理;2) The surface texture treatment of silicon wafers is carried out in the mixed solution of NaOH and single crystal texturing additive;

3)在HCl/HF混酸液中进行硅片表面所沾NaOH液的中和、金属离子及氧化层的清洗;3) Neutralize the NaOH solution on the surface of the silicon wafer, clean the metal ions and the oxide layer in the HCl/HF mixed acid solution;

4)进行预脱水及热烘干处理;4) Carry out pre-dehydration and thermal drying treatment;

所述选择性发射极工艺包括:The selective emitter process includes:

1)将所述清洗制绒工艺处理后的硅片单槽双片正面贴正面放置,在三溴化硼氛围中对电池背面进行硼掺杂;1) placing the single-slot double-chip front side of the silicon wafer after the cleaning and texturing process on the front side, and carrying out boron doping on the back side of the battery in a boron tribromide atmosphere;

2)在硼扩散结束降温,通入氧气对硼扩散面进行氧化形成硼硅玻璃(BSG)层;2) At the end of the boron diffusion, the temperature is lowered, and oxygen is introduced to oxidize the boron diffusion surface to form a borosilicate glass (BSG) layer;

3)在HF酸液湿法设备中完成在硼扩散时在电池背面所形成BSG的减薄处理;3) The thinning process of the BSG formed on the back of the battery during boron diffusion is completed in the HF acid wet process equipment;

所述制备沉积掩膜层工艺为在所述选择性发射极工艺中减薄处理后的BSG层上用PECVD完成背面氮化硅层的沉积;The process of preparing the deposition mask layer is to use PECVD to complete the deposition of the backside silicon nitride layer on the BSG layer after the thinning treatment in the selective emitter process;

所述制备表面场工艺包括:The process for preparing the surface field includes:

1)通过激光烧蚀法在电池背面进行磷掺杂区的开窗,去除BSG层和BSG层上的氮化硅层;1) The phosphorus-doped region is opened on the back of the cell by laser ablation, and the BSG layer and the silicon nitride layer on the BSG layer are removed;

2)经18%-20%的碱液处理去除开窗区表面处的硅,降低因激光烧蚀造成的表面损伤而引入的载流子复合速率;2) The silicon on the surface of the window area is removed by 18%-20% alkali solution treatment, and the recombination rate of carriers introduced by the surface damage caused by laser ablation is reduced;

3)再将硅片单槽单片放置,在管式炉中进行双面磷掺杂,同时形成前表面场和背表面场区;3) The silicon wafer is then placed in a single groove and a single wafer, and double-sided phosphorous doping is performed in a tube furnace to form a front surface field and a back surface field region at the same time;

4)将形成背表面场区和前表面场的硅片放置在HF酸液中进行表面磷扩散形成磷硅玻璃(PSG)的减薄处理;4) placing the silicon wafer forming the back surface field region and the front surface field in an HF acid solution to perform a thinning treatment of phosphorus diffusion on the surface to form phosphosilicate glass (PSG);

所述制备减反射层工艺包括The process of preparing the anti-reflection layer includes the following steps:

1)将所述减薄后的硅片用PECVD设备完成电池正面减反射层的沉积;1) using the thinned silicon wafer to complete the deposition of the anti-reflection layer on the front side of the battery with PECVD equipment;

2)将所述完成正面减反射层沉积的硅片在PECVD中进行电池背面减反射层的沉积处理;2) carrying out the deposition process of the anti-reflection layer on the back of the battery in PECVD with the silicon wafer that completes the deposition of the front anti-reflection layer;

所述电极制作工艺包括The electrode fabrication process includes

1)将所述制备减反射层工艺完成后的硅片印刷第一道烧穿型浆料,形成点断式副栅线银、铜、镀银铜、镀镍铜、镀锡铜或合金浆料;1) The first burn-through slurry is printed on the silicon wafer after the preparation of the anti-reflection layer process is completed to form a point-break type secondary grid line silver, copper, silver-plated copper, nickel-plated copper, tin-plated copper or alloy slurry material;

2)再将完成所述第一道印刷烧穿型浆料的硅片印刷第二道线式副栅线银、铜、镀银铜、镀镍铜、镀锡铜或合金浆料;2) printing the second line-type auxiliary grid line silver, copper, silver-plated copper, nickel-plated copper, tin-plated copper or alloy slurry on the silicon wafer that has completed the first printing of the burn-through slurry;

3)第三道及第四道均分步印刷绝缘浆料,二次印刷绝缘浆料的目的为保证主栅线与硼掺杂区及磷掺杂区副栅线间的良好绝缘性;3) The third and fourth tracks are equally divided into step-by-step printing of insulating paste, and the purpose of secondary printing of insulating paste is to ensure good insulation between the main grid line and the boron-doped area and the auxiliary grid lines in the phosphorus-doped area;

4)最后将印刷完所述第四道绝缘浆料的硅片进行第五道主栅线银铝浆料的印刷,用于导出电池所产生的电流;4) Finally, the silicon wafer on which the fourth insulating paste has been printed is subjected to the fifth busbar silver-aluminum paste printing, which is used to derive the current generated by the battery;

优选的,在所述选择性发射极工艺中,所述电池背面硼掺杂的扩散方阻为130-155Ω·cm,扩散温度为700-1100℃。Preferably, in the selective emitter process, the diffusion resistance of boron doping on the back of the battery is 130-155Ω·cm, and the diffusion temperature is 700-1100°C.

优选的,在所述选择性发射极工艺中,所述硼扩散结束后降温至700-900℃。Preferably, in the selective emitter process, the temperature is lowered to 700-900° C. after the boron diffusion is completed.

优选的,在所述制备沉积掩膜层工艺的背面氮化硅层沉积膜厚为40-100nm。Preferably, the deposition film thickness of the silicon nitride layer on the backside of the process of preparing and depositing the mask layer is 40-100 nm.

优选的,在所述制备表面场工艺中,将去除开窗区对应衬底表面处约4-7um的硅。Preferably, in the process of preparing the surface field, about 4-7um of silicon at the surface of the substrate corresponding to the window region will be removed.

优选的,在所述制备表面场工艺中,形成背表面场区的温度为700-1100℃,方阻为100-200Ω·cm。Preferably, in the process of preparing the surface field, the temperature for forming the back surface field region is 700-1100° C., and the square resistance is 100-200 Ω·cm.

优选的,在所述制备表面场工艺中,所述形成前表面场的扩散方阻为100-200Ω·cm,扩散温度为700-1100℃。Preferably, in the process of preparing the surface field, the diffusion resistance of the surface field before forming is 100-200 Ω·cm, and the diffusion temperature is 700-1100°C.

优选的,在所述制备减反射层工艺中,所述电池正面减反射层沉积的折射率在2.0-2.2,温度为300-600℃。Preferably, in the process of preparing the anti-reflection layer, the refractive index of the anti-reflection layer deposited on the front side of the battery is 2.0-2.2, and the temperature is 300-600°C.

优选的,在所述制备减反射层工艺中,所述电池背面减反射层的折射率在2.0-2.2,工艺温度为300-600℃。Preferably, in the process of preparing the anti-reflection layer, the refractive index of the anti-reflection layer on the back of the battery is 2.0-2.2, and the process temperature is 300-600°C.

本发明是一种全绒面IBC太阳电池制备方法,通过将电极移至背表面而增加前表面光吸收率,由此提高短路电流。同时所得电池前表面和背表面全为绒面极大减小了光反射率,进一步提高光照俘获量。本发明与现有技术相比存在以下优点和积极效果:The present invention is a preparation method of a full-suede IBC solar cell, which increases the light absorption rate of the front surface by moving the electrodes to the back surface, thereby increasing the short-circuit current. At the same time, the front surface and the back surface of the obtained battery are all suede surfaces, which greatly reduces the light reflectivity and further improves the light capture amount. Compared with the prior art, the present invention has the following advantages and positive effects:

1)优化工艺方案降低制造成本;1) Optimize the process plan to reduce the manufacturing cost;

2)工艺简单,降低了引入缺陷的概率;2) The process is simple, reducing the probability of introducing defects;

3)方便了出现电池效率下降及缺陷问题时的工艺段源头分析。3) It is convenient to analyze the source of the process section when the battery efficiency declines and defects occur.

附图说明Description of drawings

图1 IBC电池结构图Figure 1 IBC battery structure diagram

图2 IBC电池工艺流程图Figure 2 IBC battery process flow chart

具体实施方式Detailed ways

实施例Example

下面结合实施例对本发明作进一步的说明。本发明包含以下内容,但并不仅限于以下内容。The present invention will be further described below in conjunction with the examples. The present invention includes the following contents, but is not limited to the following contents.

为了解决上述现有技术的不足,本发明提供一种全绒面IBC太阳电池制备方法,其步骤如下:In order to solve the above-mentioned deficiencies of the prior art, the present invention provides a method for preparing a full-suede IBC solar cell, the steps of which are as follows:

(1)所述清洗制绒包括:(1) The cleaning and texturing include:

1)将N型硅片放置NaOH及H2O2液中进行硅片表面的机械损伤层和表面油污的清洗;1) Place the N-type silicon wafer in NaOH and H2O2 solution to clean the mechanical damage layer and surface oil on the surface of the silicon wafer;

2)在NaOH及单晶制绒添加剂混合液中进行硅片表面织构化处理;2) The surface texture treatment of silicon wafers is carried out in the mixed solution of NaOH and single crystal texturing additive;

3)在HCl/HF混酸液中进行硅片表面所沾NaOH液的中和、金属离子及氧化层的清洗;3) Neutralize the NaOH solution on the surface of the silicon wafer, clean the metal ions and the oxide layer in the HCl/HF mixed acid solution;

4)进行预脱水及热烘干处理;4) Carry out pre-dehydration and thermal drying treatment;

(2)所述制备选择性发射极包括:(2) The preparation of the selective emitter includes:

1)将步骤(1)处理后的硅片单槽双片正面贴正面放置,在三溴化硼氛围中对电池背面进行硼掺杂;1) placing the single-slot double-chip front side of the silicon wafer processed in step (1) on the front side, and carrying out boron doping on the back side of the battery in a boron tribromide atmosphere;

2)在硼扩散结束降温,通入氧气对硼扩散面进行氧化形成BSG层;2) At the end of the boron diffusion, the temperature is lowered, and oxygen is introduced to oxidize the boron diffusion surface to form a BSG layer;

3)在HF酸液湿法设备中完成在硼扩散时在电池背面所形成BSG的减薄处理;3) The thinning process of the BSG formed on the back of the battery during boron diffusion is completed in the HF acid wet process equipment;

(3)所述沉积掩膜层包括:(3) The deposition mask layer includes:

1)在步骤(2)中减薄BSG后的硅片上用PECVD设备完成背面氮化硅层的沉积,膜厚控制范围40-120nm;1) on the silicon wafer after thinning the BSG in step (2), use PECVD equipment to complete the deposition of the backside silicon nitride layer, and the film thickness control range is 40-120nm;

(4)所述制备表面场包括:(4) The preparation of the surface field includes:

1)首先通过激光烧蚀法在电池背面进行磷掺杂区的开窗,去除BSG层和BSG层上的氮化硅层;1) First, the phosphor-doped region is opened on the back of the cell by laser ablation, and the BSG layer and the silicon nitride layer on the BSG layer are removed;

2)其次,经18%-20%的碱液处理去除开窗区表面处的硅,,降低因激光烧蚀造成的表面损伤而引入的载流子复合速率;2) Secondly, the silicon on the surface of the window area is removed by 18%-20% alkali solution treatment, so as to reduce the carrier recombination rate introduced by the surface damage caused by laser ablation;

3)再将硅片单槽单片放置,在管式炉中进行双面磷掺杂,同时形成前表面场和背表面场区;最后,将完成表面场的硅片在HF酸液中进行表面磷扩散形成PSG的减薄处理;3) The silicon wafer is then placed in a single groove and a single wafer, and double-sided phosphorous doping is performed in a tube furnace to form the front surface field and the back surface field area at the same time; finally, the silicon wafer with the surface field is completed in HF acid solution. Thinning treatment of PSG formed by surface phosphorus diffusion;

(5)所述制备减反射层工艺包括:(5) The process for preparing the anti-reflection layer includes:

1)将步骤(4)中经PSG减薄后,利用PECVD在PSG上完成电池正面减反射层的沉积,折射率范围在2.0-2.2,工艺温度为300-600℃;1) After the PSG is thinned in step (4), use PECVD to complete the deposition of the anti-reflection layer on the front side of the battery on the PSG, the refractive index is in the range of 2.0-2.2, and the process temperature is 300-600 ° C;

2)其次,在PECVD中进行电池背面减反射层处理,折射率范围在2.0-2.2,工艺温度为300-600℃;2) Secondly, the anti-reflection layer on the back of the battery is processed in PECVD, the refractive index range is 2.0-2.2, and the process temperature is 300-600 °C;

(6)所述电极制作工艺包括五步丝网印刷,具体为:(6) The electrode manufacturing process includes five-step screen printing, specifically:

1)第一道印刷烧穿型浆料,形成点断式副栅线银、铜、镀银铜、镀镍铜、镀锡铜或合金浆料;1) The first pass of printing burn-through paste to form point-breaking secondary grid line silver, copper, silver-plated copper, nickel-plated copper, tin-plated copper or alloy paste;

2)第二道印刷线式副栅线银、铜、镀银铜、镀镍铜、镀锡铜或合金浆料;2) Silver, copper, silver-plated copper, nickel-plated copper, tin-plated copper or alloy paste for the second printed wire-type auxiliary grid line;

3)第三道及第四道均分步印刷绝缘浆料,二次印刷绝缘浆料的目的为保证主栅线与P+区及N+区副栅线间的良好绝缘性;3) The third and fourth tracks are all printed with insulating paste step by step, and the purpose of secondary printing of insulating paste is to ensure good insulation between the main grid line and the auxiliary grid lines in the P+ area and the N+ area;

4)第五道同时印刷正负主栅线银铝浆料,用于导出电池所产生的电流;4) The fifth line simultaneously prints the positive and negative busbar silver-aluminum paste, which is used to derive the current generated by the battery;

以上所述,仅为本发明的较佳实施例,并非对本发明任何形式上和实质上的限制,应当指出,对于本技术领域的普通技术人员,在不脱离本发明方法的前提下,还将可以做出若干改进和补充,这些改进和补充也应视为本发明的保护范围。凡熟悉本专业的技术人员,在不脱离本发明的精神和范围的情况下,当可利用以上所揭示的技术内容而做出的些许更动、修饰与演变的等同变化,均为本发明的等效实施例;同时,凡依据本发明的实质技术对上述实施例所作的任何等同变化的更动、修饰与演变,均仍属于本发明的技术方案的范围内。The above are only preferred embodiments of the present invention, and are not intended to limit the present invention in any form or substance. It should be pointed out that for those skilled in the art, without departing from the method of the present invention, the Several improvements and supplements can be made, and these improvements and supplements should also be regarded as the protection scope of the present invention. All those skilled in the art, without departing from the spirit and scope of the present invention, can utilize the above-disclosed technical content to make some changes, modifications and equivalent changes of evolution, all belong to the present invention. Equivalent embodiments; at the same time, any modification, modification and evolution of any equivalent changes made to the above embodiments according to the essential technology of the present invention still fall within the scope of the technical solutions of the present invention.

Claims (9)

1. A preparation method of a full-suede IBC solar cell is characterized by comprising a cleaning and texturing process, a selective emitter process, a mask layer deposition process, a surface field preparation process, an antireflection layer preparation process and an electrode manufacturing process;
the cleaning and texturing process comprises the following steps:
1) placing the N-type silicon wafer in NaOH and H2O2 liquid to clean a mechanical damage layer and surface oil stains on the surface of the silicon wafer;
2) carrying out silicon wafer surface texturing treatment in a mixed solution of NaOH and a single crystal texturing additive;
3) neutralizing NaOH solution on the surface of the silicon wafer and cleaning metal ions and an oxide layer in HCl/HF mixed acid solution;
4) carrying out pre-dehydration and heat drying treatment;
the selective emitter process comprises:
1) placing the front sides of the single-groove double-piece silicon wafer treated by the cleaning and texturing process in a front-side-attached mode, and carrying out boron doping on the back side of the cell in a boron tribromide atmosphere;
2) after the boron diffusion is finished, cooling, introducing oxygen to oxidize the boron diffusion surface to form a BSG layer;
3) finishing the thinning treatment of BSG formed on the back of the battery during boron diffusion in HF acid wet equipment;
the process for preparing the deposition mask layer is to deposit a back silicon nitride layer on the BSG layer after thinning treatment in the selective emitter electrode process by PECVD;
the surface field preparation process comprises the following steps:
1) windowing a phosphorus doped region on the back surface of the battery by a laser ablation method, and removing the BSG layer and the silicon nitride layer on the BSG layer;
2) removing silicon on the surface of the windowing area by treating with 18% -20% alkali liquor;
3) then placing the single silicon wafer in the single groove, carrying out double-sided phosphorus doping in a tube furnace, and simultaneously forming a front surface field region and a back surface field region;
4) placing the silicon wafer with the back surface field region and the front surface field in HF acid solution for surface phosphorus diffusion to form PSG;
the process for preparing the antireflection layer comprises
1) Depositing an antireflection layer on the front side of the cell on the thinned silicon wafer by using PECVD equipment;
2) depositing the silicon wafer on which the front antireflection layer is deposited in a PECVD (plasma enhanced chemical vapor deposition) manner on the back antireflection layer of the cell;
the electrode manufacturing process comprises
1) Printing a first burn-through type slurry on the silicon wafer after the antireflection layer preparation process is completed to form a point-broken auxiliary grid line silver, copper, silver-plated copper, nickel-plated copper, tin-plated copper or alloy slurry;
2) printing a second linear auxiliary grid line silver, copper, silver-plated copper, nickel-plated copper, tin-plated copper or alloy slurry on the silicon wafer on which the first printing burn-through type slurry is finished;
3) step-sharing printing insulation slurry in the third and fourth steps;
4) and finally, printing a fifth main grid line silver-aluminum paste on the silicon wafer on which the fourth insulating paste is printed.
2. The method as claimed in claim 1, wherein in the selective emitter process, the diffusion sheet resistance of boron doping on the back surface of the cell is 130-155 Ω -cm, and the diffusion temperature is 700-1100 ℃.
3. The method as claimed in claim 1, wherein in the selective emitter process, the temperature is reduced to 700-900 ℃ after the boron diffusion is finished.
4. The method for preparing an all-matte IBC solar cell according to claim 1, wherein the thickness of the deposited silicon nitride layer on the back side of the process for preparing the deposition mask layer is 40-120 nm.
5. The method of claim 1, wherein about 4-7um of silicon at the surface of the window is removed during the surface field preparation process.
6. The method as claimed in claim 1, wherein in the surface field preparation process, the temperature for forming the back surface field region is 700-1100 ℃, and the sheet resistance is 100-200 Ω -cm.
7. The method as claimed in claim 1, wherein in the surface field preparation process, the diffusion sheet resistance of the front surface field is 100-200 Ω -cm, and the diffusion temperature is 700-1100 ℃.
8. The method as claimed in claim 1, wherein in the step of forming the antireflection layer, the refractive index of the antireflection layer deposited on the front surface of the cell is 2.0-2.2 at 300-600 ℃.
9. The method as claimed in claim 1, wherein in the step of preparing the antireflection layer, the refractive index of the antireflection layer on the back surface of the cell is 2.0-2.2, and the process temperature is 300-600 ℃.
CN201910650899.4A 2019-07-18 2019-07-18 Preparation method of all-matte IBC solar cell Pending CN111564521A (en)

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Application publication date: 20200821