CN111551815B - Performance test device of thermal protector - Google Patents
Performance test device of thermal protector Download PDFInfo
- Publication number
- CN111551815B CN111551815B CN202010530744.XA CN202010530744A CN111551815B CN 111551815 B CN111551815 B CN 111551815B CN 202010530744 A CN202010530744 A CN 202010530744A CN 111551815 B CN111551815 B CN 111551815B
- Authority
- CN
- China
- Prior art keywords
- test
- temperature
- thermal protector
- chamber
- driver
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 230000001012 protector Effects 0.000 title claims abstract description 120
- 238000011056 performance test Methods 0.000 title claims abstract description 36
- 238000012360 testing method Methods 0.000 claims abstract description 244
- 238000001514 detection method Methods 0.000 claims description 77
- 238000007689 inspection Methods 0.000 claims description 35
- 239000000463 material Substances 0.000 claims description 29
- 238000012546 transfer Methods 0.000 claims description 10
- 238000013459 approach Methods 0.000 claims description 6
- 238000009434 installation Methods 0.000 claims description 4
- 238000007599 discharging Methods 0.000 abstract description 34
- 230000000694 effects Effects 0.000 abstract description 6
- 230000005540 biological transmission Effects 0.000 abstract description 2
- 208000028659 discharge Diseases 0.000 description 50
- 238000007789 sealing Methods 0.000 description 28
- 238000010586 diagram Methods 0.000 description 4
- 239000000956 alloy Substances 0.000 description 3
- 229910045601 alloy Inorganic materials 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000012545 processing Methods 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
一种热保护器的性能测试装置，包括：测试安装基座、测试送料通道、测试传送组件、温度测试仓和性能测试器；测试送料通道和温度测试仓安装于测试安装基座；测试件驱动器的固定端安装于测试安装基座，其输出端连接于测试传料板，用于驱动测试传料板移动，使测试传料板经过于测试送料通道的输出口和温度测试仓的输入口；入仓驱动器的输出端向温度测试仓的输入口和测试传料板的方向移动；性能测试器用于对经过温度测试仓内或外的热保护器进行性能测试。本性能测试装置，用于对热保护器进行性能测试，能用于将热保护器置于温度测试仓内，具有全自动入料、测试和出料的功能，达到精确、快速和大批量地测试热保护器性能的效果。
A performance test device for a thermal protector includes: a test mounting base, a test feeding channel, a test transmission component, a temperature test chamber and a performance tester; the test feeding channel and the temperature test chamber are mounted on the test mounting base; the fixed end of the test piece driver is mounted on the test mounting base, and its output end is connected to the test feed plate, which is used to drive the test feed plate to move so that the test feed plate passes through the output port of the test feeding channel and the input port of the temperature test chamber; the output end of the chamber driver moves toward the input port of the temperature test chamber and the direction of the test feed plate; the performance tester is used to perform performance tests on thermal protectors passing through the temperature test chamber or outside. This performance test device is used to perform performance tests on thermal protectors, and can be used to place the thermal protector in the temperature test chamber. It has the functions of fully automatic feeding, testing and discharging, and can achieve the effect of accurately, quickly and in large quantities testing the performance of thermal protectors.
Description
Technical Field
The invention relates to the technical field of performance testing devices, in particular to a performance testing device of a thermal protector.
Background
The thermal protector is composed of two different alloys, which can generate heat after passing through the current, and the alloy tends to bend towards one direction due to the different thermal expansion coefficients of the two different alloys, so that the contact leaves, and the power is cut off. The bending speed is proportional to the magnitude of the current passing through. Thus protecting the electric equipment. After the thermal protector is assembled, performance test is required, but because the thermal protector is small in body, labor cost is increased by manual operation, the test result is inaccurate, the processing of the test result is not facilitated, and the test time is long.
Disclosure of Invention
The invention aims to provide a performance testing device of a thermal protector, which is used for carrying out performance test through a performance tester after a workpiece is placed in a temperature testing bin.
To achieve the purpose, the invention adopts the following technical scheme:
a performance testing device of a thermal protector comprises a testing installation base, a testing feeding channel, a testing transmission assembly, a temperature testing bin and a performance tester;
The test feeding channel and the temperature test bin are arranged on the test mounting base;
The test conveying assembly comprises a test piece driver, a test conveying plate and a warehouse entry driver;
The fixed end of the test piece driver is arranged on the test mounting base, the output end of the test piece driver is connected with the test material conveying plate and is used for driving the test material conveying plate to move so that the test material conveying plate passes through the output port of the test feeding channel and the input port of the temperature test bin;
The performance tester is arranged in the temperature test bin and is used for performing performance test on the thermal protector passing through the inside or the outside of the temperature test bin.
Preferably, the device also comprises a primary detection and discharge assembly;
The preliminary examination discharging assembly includes a preliminary examination discharging passage;
The input port of the primary detection discharge channel and the output port of the test feeding channel are oppositely arranged at two sides of the test material conveying plate.
Preferably, the preliminary examination discharging assembly comprises a preliminary examination discharging driver and a preliminary examination discharging block;
the output end of the primary inspection discharge driver is connected with the primary inspection discharge block and is used for driving the primary inspection discharge block to extend into and separate from the primary inspection discharge channel.
Preferably, the temperature test bin comprises a low-temperature sealing bin and a high-temperature sealing bin;
the low-temperature sealing bin is communicated and connected with the high-temperature sealing bin.
Preferably, the performance tester further comprises a discharge detection assembly;
the discharging detection assembly is arranged on at least one of the low-temperature sealed bin and the high-temperature sealed bin and comprises a discharging detection supporting seat, a discharging detection driver and a detection proximity switch, wherein the discharging detection supporting seat is connected with the temperature test bin, the fixed end of the discharging detection driver is fixed on the discharging detection supporting seat, and the output end of the discharging detection driver is connected with the detection proximity switch and is used for driving the detection proximity switch to vertically extend into the temperature test bin so that the detection proximity switch approaches or contacts the thermal protector.
Preferably, the number of temperature test bins is at least 2.
Preferably, the primary inspection discharging block is provided with at least 1 guiding part, and the guiding part passes through the output port of the test feeding channel and the input port of the temperature test bin when moving.
Preferably, the performance tester comprises an electrical performance test base, an electrical performance test channel and an internal resistance tester, wherein the electrical performance test channel is arranged on the electrical performance test base, an input port of the electrical performance test channel is communicated with the temperature test bin, and the internal resistance tester is arranged on the electrical performance test channel and used for testing the internal resistance of the thermal protector.
The performance tester comprises a backstop assembly, wherein the backstop assembly comprises a backstop base, a backstop driver and backstop limit posts, the backstop base is arranged on the electrical performance test base, the fixed end of the backstop driver is arranged on the backstop base, the output end of the backstop driver is connected with the backstop limit posts and used for driving the backstop limit posts to vertically move so that the backstop limit posts extend into the electrical performance test channel, and the backstop limit posts are distributed on two sides of the electrical performance test channel.
Preferably, the surface detection device is arranged at the position of at least one of the test feeding channel, the test material conveying plate and the temperature test bin.
The invention has the beneficial effects that:
the property testing device is used for testing the properties of the thermal protector, can be used for placing the thermal protector in a temperature testing bin, has the functions of full-automatic feeding, testing and discharging, and achieves the effect of accurately, quickly and massively testing the properties of the thermal protector.
Drawings
FIG. 1 is a schematic diagram of a test apparatus;
FIG. 2 is a schematic diagram of the structure of the test device;
FIG. 3 is an enlarged view of portion A of FIG. 2;
FIG. 4 is a schematic structural view of the discharge detection assembly;
FIG. 5 is a schematic structural view of a thermal protector;
FIG. 6 is a schematic diagram of an electrical performance testing apparatus;
FIG. 7 is a schematic view of a test transfer plate;
fig. 8 is a schematic diagram of the structure of the performance tester.
Wherein:
the device comprises a test mounting base 21, a test feeding channel 22, a test conveying assembly 23, a temperature test bin 24, a performance tester 25, a primary inspection discharging assembly 26, a discharge detection assembly 27 and a surface detection device 28;
A low temperature seal bin 241, a high temperature seal bin 242;
a test piece driver 231, a test transfer plate 232, and a binning driver 233;
a preliminary examination discharge passage 261, a preliminary examination discharge driver 262, a preliminary examination discharge block 263;
a discharge detection support 271, a discharge detection driver 272, and a detection proximity switch 273;
a vertical positioning driver 2721, a vertical movement positioning plate 2722, and a vertical positioning guide post 2723;
An introduction unit 2321;
an electrical performance test base 251, an electrical performance test channel 252, an internal resistance tester 253, a backstop assembly 254;
a backstop base 2541, a backstop driver 2542, and a backstop stop post 2543.
Detailed Description
The technical scheme of the invention is further described by the detailed description below with reference to the accompanying drawings.
A performance testing device of a thermal protector comprises a testing mounting base 21, a testing feeding channel 22, a testing conveying assembly 23, a temperature testing bin 24 and a performance tester 25;
The test feeding channel 22 and the temperature test bin 24 are mounted on the test mounting base 21;
the test transfer assembly 23 includes a test piece driver 231, a test transfer plate 232, and a binning driver 233;
The fixed end of the test piece driver 231 is mounted on the test mounting base 21, and the output end of the test piece driver 231 is connected to the test material conveying plate 232 and is used for driving the test material conveying plate 232 to move so that the test material conveying plate 232 passes through the output port of the test feeding channel 22 and the input port of the temperature test bin 24;
the performance tester 25 is installed in the temperature test chamber 24, and is used for performing performance test on the thermal protector passing through the inside or outside of the temperature test chamber 24.
The property testing device is used for testing the property of the thermal protector 01, can be used for placing the thermal protector 01 in the temperature testing bin 24, has the functions of full-automatic feeding, testing and discharging, and achieves the effect of accurately, quickly and massively testing the property of the thermal protector.
Specifically, the test feeding channel 22 is used for outputting the thermal protector 01, the output end of the test piece driver 231 is driven to move the test material conveying plate 232, so that the test material conveying plate 232 can move between the output end of the test feeding channel 22 and the input end of the temperature test bin 24, the test feeding channel 22 conveys the thermal protector to the test material conveying plate 232, the output end of the test piece driver 231 resets to send the thermal protector to the input end of the temperature test bin 24, the output end of the bin driver 233 is aligned to the input end of the temperature test bin 24 and the direction of the test material conveying plate 232, the output end of the bin driver 233 moves, and the thermal protector positioned on the test material conveying plate 232 is continuously sent to the temperature test bin 24, so that the effect of sending the thermal protector to the temperature test bin 24 is achieved. The temperature test chamber 24 is provided with different temperature sections to allow the thermal protector to stay in different temperature environments for a period of time to test for changes in the condition of the thermal protector under specified temperature conditions. And a performance tester 25 for testing the performance of the thermal protector in or out of the temperature test chamber 24, wherein the performance tester 25 can be the performance index of the existing thermal protector, such as appearance and conductivity, the performance index of appearance, such as dimensional change, and the conductivity index, such as internal resistance.
The test element driver 231 and/or the binning driver 233 are replaced by a well-known horizontal driver, such as a cylinder, or a motor-screw-coupled driver.
In the movement of the thermal protector in the test feeding path 22, the test feeding path 22 may be replaced by a well-known horizontal movement driving device, such as a conveyor belt, etc., or the thermal protector may be continuously introduced by arranging the thermal protector, driving the introduced thermal protector by the horizontal driver, so that the thermal protector is continuously moved forward by one unit, and finally, the thermal protector is fed into the test feeding plate 232.
Preferably, the device also comprises a primary inspection discharge assembly 26, wherein the primary inspection discharge assembly 26 comprises a primary inspection discharge channel 261;
The input port of the primary inspection discharge channel 261 and the output port of the test feeding channel 22 are disposed at two sides of the test material conveying plate 232;
the primary discharge assembly 26 is used for selecting the thermal protector fed into the test feed plate 232, if the thermal protector is qualified, the test feed plate 232 is controlled to feed the thermal protector located at the output port of the test feed channel 22 to the input port of the temperature test bin 24, and if the thermal protector is unqualified, the unqualified thermal protector is discharged from the output port of the primary discharge channel 261, for example, a surface detection device 28 arranged above the test feed channel 22 is used for identifying the surface of the thermal protector.
Preferably, the primary discharge assembly 26 includes a primary discharge drive 262 and a primary discharge block 263;
the output end of the primary inspection discharge driver 262 is connected with the primary inspection discharge block 263, and is used for driving the primary inspection discharge block 263 to extend into and separate from the primary inspection discharge channel 261.
Specifically, if the system finds an unqualified thermal protector, the primary inspection discharge driver 262 is started, so that the output end of the primary inspection discharge driver 262 drives the primary inspection discharge block 263 to move, the primary inspection discharge block 263 is separated from the output port of the primary inspection discharge channel 261, the unqualified thermal protector enters the primary inspection discharge channel 261, and the thermal protector is separated from the test feeding channel 22 and enters the primary inspection discharge channel 261.
Further, initially, the primary discharge block 263 can extend into the primary discharge channel 261, the primary discharge block 263 can extend into the input port of the primary discharge channel 261 to limit the thermal protector from entering the primary discharge channel 261, and when the system detects that the thermal protector is abnormal at the test material conveying plate 232 or the test material conveying channel 22, the primary discharge block 263 moves to enable the thermal protector to enter the primary discharge channel 261, thereby achieving the effect of isolating the unqualified thermal protector.
Preferably, the temperature test chamber 24 comprises a low temperature sealing chamber 241 and a high temperature sealing chamber 242;
the low-temperature sealing bin 241 is communicated with the high-temperature sealing bin 242.
The temperature of the low-temperature sealing bin 241 is lower than that of the high-temperature sealing bin 242, the low-temperature sealing bin 241 is communicated with the high-temperature sealing bin 242, the input port of the low-temperature sealing bin 241 can be communicated with the test material conveying plate 232, the output port of the low-temperature sealing bin 241 is communicated with the input port of the high-temperature sealing bin 242, namely, the low temperature is detected firstly and then the high temperature is detected, or the input port of the high-temperature sealing bin 242 is communicated with the test material conveying plate 232, and the output port of the high-temperature sealing bin 242 is communicated with the input port of the low-temperature sealing bin 241, namely, the high temperature is detected firstly and then the low temperature is detected.
The low temperature sealing bin 241 and the high temperature sealing bin 242 are internally provided with temperature control devices, so that the low temperature sealing bin 241 keeps low temperature, the high temperature sealing bin 242 keeps high temperature, the thermal protector is a temperature sensitive element, and physical parameters of the thermal protector can be changed in the testing process of the low temperature sealing bin 241 and the high temperature sealing bin 242.
Preferably, the performance tester further comprises a discharge detection assembly 27;
the discharge detection assembly 27 is mounted to at least one of the low temperature seal cartridge 241 and the high temperature seal cartridge 242;
the discharging detection component 27 comprises a discharging detection supporting seat 271, a discharging detection driver 272 and a detection approaching switch 273;
the discharging detection support seat 271 is connected to the temperature test bin 24, the fixed end of the discharging detection driver 272 is fixed to the discharging detection support seat 271, and the output end of the discharging detection driver 272 is connected to the detection proximity switch 273, so as to drive the detection proximity switch 273 to vertically extend into the temperature test bin 24, so that the detection proximity switch 273 approaches or contacts the thermal protector.
The discharge detection assembly 27 may be mounted to the low temperature seal cartridge 241 and/or the high temperature seal cartridge 242 at an input, output or intermediate location of the two. As shown in fig. 1, the discharge detection assembly 27 is disposed at the output of the low temperature seal cartridge 241 and the high temperature seal cartridge 242.
When the thermal protector passes through the discharging detection assembly 27, the discharging detection driver 272 drives the detection approaching switch 273 to vertically move to enable the detection approaching switch 273 to approach the thermal protector, and after the thermal protector changes in temperature, the structure of the thermal protector changes, such as the structure of the thermal protector is changed, when the thermal protector is in a disconnected state, when the thermal protector is at a low temperature, the elastic piece is not tilted, the thermal protector is in a connected state, and when the thermal protector is detected to be discharged from the low-temperature sealing bin 241 and the high-temperature sealing bin 242, the thermal protector is in a state, if the performance of the thermal protector is not qualified, the thermal protector is tilted after passing through the low-temperature sealing bin 241 or is not tilted after passing through the high-temperature sealing bin 242, and when the thermal protector is detected to be in a low temperature, generally, the elastic piece is not tilted after the detection approaching switch 273 falls, the thermal protector is not contacted with the detection approaching switch 273, and when the detection approaching switch is in a record of the position of the unqualified thermal protector is not triggered, and when the detection approaching switch is in a position of the unqualified thermal protector is discharged after the detection approaching switch. At high temperature, the spring plate of the heat protector which is generally qualified can be lifted, and if the detection is close to the falling end of the switch 273, the spring plate can not contact any lifting end of the heat protector, namely the spring plate is unqualified.
Wherein the discharge detection drive 272 may be a well-known linear drive such as a cylinder, or a motor in combination with a screw; the detection proximity switch 273 is connected either indirectly or directly to the output of the discharge detection driver 272. The discharging detection driver 272 in this embodiment includes a vertical positioning driver 2721, a vertical moving positioning plate 2722 and a vertical positioning guide post 2723, the vertical positioning guide post 2723 is mounted on the discharging detection support stand 271, the vertical moving positioning plate 2722 is mounted on the vertical positioning guide post 2723 in a vertically movable manner, the vertical positioning driver 2721 is fixed on the discharging detection support stand 271, the output end of the vertical positioning driver 2721 is connected with the vertical moving positioning plate 2722 for driving the vertical moving positioning plate 2722 to move, and the detection proximity switch 273 is mounted on the driving vertical moving positioning plate 2722, and the detection proximity switch 273 moves under the driving action of the vertical positioning driver 2721.
Preferably, the number of temperature test bins 24 is at least 2.
When the number of the temperature test bins 24 is at least 2, that is, the number of the temperature test bins 24 is a plurality of, the output end of the test piece driver 231 drives the test material conveying plate 232 to move to the input port of each temperature test bin 24, and the thermal protector is sent into the bin through the corresponding bin entering driver 233 of each temperature test bin 24. The output end of the test piece driver 231 is controlled, so that the test material conveying plate 232 receives the thermal protector from the test material conveying channel 22 and conveys the thermal protector to different temperature test bins 24 through the warehouse entry driver 233, and batch and repeated feeding of the thermal protector into the temperature test bins 24 can be realized.
Preferably, the initial inspection discharge block 263 is provided with at least 1 introduction portion 2321, and the introduction portion 2321 passes through the output port of the test feed channel 22 and the input port of the temperature test chamber 24 when moving.
The introduction portion 2321 is a structure for introducing the thermal protector, and may preferably limit the thermal protector, so that the transfer process of the thermal protector is more stable and cannot loosen, such as a groove structure, a protrusion structure, a receiving cavity, an adsorption structure, and the like. The number of the introducing portions 2321 may be set to be plural, preferably, the distance a between the introducing portions 2321 and the introducing portions 2321 corresponds to the input port distance b between the temperature testing bin 24 and the temperature testing bin 24, when a=b, the n+1th introducing portion 2321 will send out the thermal protector at the input port of the other temperature testing bin 24 when the first introducing portion 2321 takes out the thermal protector in the test feeding channel 22, so as to realize the effect of synchronous discharging. As shown in fig. 2 and 7, the initial inspection discharging block 263 is provided with 2 introducing parts 2321, when the first introducing part 2321 takes out the thermal protector in the test feeding channel 22, the second introducing part 2321 discharges in one of the temperature test bins 24, and when the first introducing part 2321 moves to the other temperature test bin 24 for discharging after the initial inspection discharging block 263 moves, the second introducing part 2321 takes out the thermal protector in the test feeding channel 22, so that synchronous feeding and taking out are repeatedly performed, and the test efficiency of the thermal protector is improved.
Preferably, the performance tester 25 includes an electrical performance test base 251, an electrical performance test channel 252, and an internal resistance tester 253;
The electrical performance testing channel 252 is mounted on the electrical performance testing base 251, an input port of the electrical performance testing channel 252 is communicated with the temperature testing bin 24, and the internal resistance tester 253 is mounted on the electrical performance testing channel 252 and is used for testing internal resistance of the thermal protector.
The thermal protector enters the electrical property test channel 252 after being output by the temperature test bin 24, and the electrical property test channel 252 is provided with an internal resistance tester 253 which can be used for testing the internal resistance of the thermal protector so as to detect the performance change of the thermal protector after the temperature change and conveniently discharge unqualified parts at the rear end. The performance tester 25 may be disposed at the input of the temperature test chamber 24, the output of the temperature test chamber 24, or at a central location of the temperature test chamber 24, as shown in fig. 1 for only one embodiment in which the performance tester 25 is disposed at the output of the temperature test chamber 24. Further, to ensure the accuracy of testing the internal resistance, the performance tester 25 is provided with an internal limit testing pressure head 2543, and the internal limit testing pressure head 2543 can vertically extend into the electrical performance testing channel 252 in a lifting manner to press the thermal protector downward to the internal resistance tester, so that the thermal protector is prevented from loosening in the testing process. The performance tester 25 includes a ram drive assembly 254, the ram drive assembly 25 including a ram drive base 2541 and a ram drive driver 2542;
the pressure head driving base 2541 is mounted on the electrical performance testing base 251, the fixed end of the pressure head driving driver 2542 is mounted on the pressure head driving base 2541, the output end of the pressure head driving driver 2542 is connected with an inner limit testing pressure head 2543, the pressure head driving inner limit testing pressure head 2543 is used for driving the pressure head to vertically move, the inner limit testing pressure head 2543 stretches into the electrical performance testing channel 252 to press the thermal protector on the internal resistance tester 253, and the pressure head driving limit columns 2543 are distributed on two sides of the electrical performance testing channel 252.
Preferably, the performance tester 25 includes a backstop assembly 255;
the retaining assembly 255 comprises a retaining base 2551, a retaining driver 2552 and a retaining spacing post 2553;
The anti-back base 2551 is mounted on the electrical performance testing base 251, the fixed end of the anti-back driver 2552 is mounted on the anti-back base 2551, the output end of the anti-back driver 2552 is connected with the anti-back limiting column 2553 and used for driving the anti-back limiting column 2553 to move vertically, the anti-back limiting column 2553 stretches into the electrical performance testing channel 252, and the anti-back limiting columns 2553 are distributed on two sides of the electrical performance testing channel 252.
The thermal protector is provided with base positioning holes 1917 for positioning during batch processing of the thermal protector. The anti-back driver 2552 indirectly or directly drives the anti-back limiting column 2553 to enable the anti-back limiting column 2553 to vertically move, the anti-back limiting column 2553 vertically stretches into the electrical property test channel 252 and stretches into the portion of the base locating hole 1917, so that the thermal protector cannot tilt, the thermal protector can expand or shrink to different degrees, the anti-back limiting column 2553 is arranged, after the thermal protector is expanded, the thermal protector is stable in size, the anti-back limiting columns 2553 on two sides can accurately locate two ends of the thermal protector, the thermal protector can be guaranteed to accurately contact with the internal resistance tester 253 to accurately measure internal resistance, after the thermal protector is expanded in size, the base locating hole 1917 and the anti-back limiting column 2553 are misplaced, the thermal protector cannot be located through the base locating hole 1917, therefore, the situation that the anti-back limiting column 2553 on one side is inaccurate in location and the internal resistance test can be judged, and the thermal protector on the non-standard internal resistance can be discharged from the rear end portion.
Preferably, further comprises a surface detection device 28;
The surface detection device 28 is disposed at a position of at least one of the test feeding channel 22, the test feeding plate 232 and the temperature test bin 24.
The surface detection device 28 can be arranged at any position in the performance test device, such as the test feeding channel 22, the test material conveying plate 232 and the temperature test bin 24, when the surface detection device 28 is arranged in the test feeding channel 22, if the problem of the thermal protector of the test feeding channel 22 is found, the unqualified thermal protector is directly discharged through the initial detection discharging assembly 26, and the position of the thermal protector is directly marked by the surface detection device 28 when the thermal protector appears in the test material conveying plate 232 or the temperature test bin 24, and the thermal protector is discharged after the thermal protector moves to a designated unit. The surface detection device 28 is a well known device, such as an industrial camera, an infrared detection device, etc., for finding surface problems with the thermal protector.
In the description of the present invention, it should be understood that the terms "front", "rear", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", "side", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, are merely for convenience in describing the present invention and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present invention.
The technical principle of the present invention is described above in connection with the specific embodiments. The description is made for the purpose of illustrating the general principles of the invention and should not be taken in any way as limiting the scope of the invention. Other embodiments of the invention will be apparent to those skilled in the art from consideration of this specification without undue burden.
Claims (6)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010530744.XA CN111551815B (en) | 2020-06-11 | 2020-06-11 | Performance test device of thermal protector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010530744.XA CN111551815B (en) | 2020-06-11 | 2020-06-11 | Performance test device of thermal protector |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111551815A CN111551815A (en) | 2020-08-18 |
| CN111551815B true CN111551815B (en) | 2025-04-08 |
Family
ID=72008679
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010530744.XA Active CN111551815B (en) | 2020-06-11 | 2020-06-11 | Performance test device of thermal protector |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111551815B (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN212540576U (en) * | 2020-06-11 | 2021-02-12 | 中山市川成精密电子有限公司 | Performance testing device of thermal protector |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003136655A (en) * | 2001-10-30 | 2003-05-14 | Toray Ind Inc | Laminated film for thermal transfer material |
| KR20100020906A (en) * | 2008-08-13 | 2010-02-23 | 소니 가부시끼가이샤 | Optical film and manufacturing method therefor, antiglare film, optical layer-attached polarizer, and display apparatus |
| CN101799428B (en) * | 2010-04-09 | 2012-06-06 | 深圳信息职业技术学院 | Ball grid array welding spot remelting test method |
| US10316993B2 (en) * | 2017-03-15 | 2019-06-11 | Novelis Inc. | Corrugated heat protection tube and methods of making the same |
-
2020
- 2020-06-11 CN CN202010530744.XA patent/CN111551815B/en active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN212540576U (en) * | 2020-06-11 | 2021-02-12 | 中山市川成精密电子有限公司 | Performance testing device of thermal protector |
Also Published As
| Publication number | Publication date |
|---|---|
| CN111551815A (en) | 2020-08-18 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP4286864A1 (en) | Battery internal resistance measurement device and battery production system | |
| CN211293147U (en) | Self-adjustable function testing device | |
| CN106298320B (en) | A kind of robot automatic assembly line of switch product | |
| CN108169667A (en) | Breaker of plastic casing end pressure, loop resistance, tripping force automatic checkout equipment | |
| CN217595213U (en) | Probe test equipment | |
| CN111551815B (en) | Performance test device of thermal protector | |
| CN206484792U (en) | Insert injection moulding automatic detection device | |
| CN110031222B (en) | Detection machine with built-in disc spring bearing | |
| CN212540576U (en) | Performance testing device of thermal protector | |
| CN111044929A (en) | Battery module electrical property detects machine | |
| CN104267342B (en) | Method for testing on-off state of elastic sheet contact and instantaneous pressure during switching off | |
| CN112952174B (en) | Pressing machine and pressing assembly for pressing fuel cell stack | |
| CN219349060U (en) | PCBA testing device | |
| CN222267930U (en) | Battery cell sorting equipment | |
| CN114261758A (en) | Material transfer system of drum-type battery conveying system | |
| CN109116221A (en) | A kind of Multi-band switch detection device | |
| CN113484146A (en) | Stress test equipment control system | |
| EP4528297A1 (en) | Battery testing device | |
| CN218383192U (en) | Comprehensive parameter testing device of microswitch | |
| CN113991392B (en) | Socket assembly equipment | |
| CN114236634B (en) | A connector installation testing device and testing method | |
| CN111167750A (en) | Test sorting unit of slide switch production facility | |
| CN216955497U (en) | Reinforcing bar testing arrangement | |
| CN212159863U (en) | Adjustable detection device | |
| CN213468710U (en) | Temperature controller detection device and automatic detection equipment using same |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |