CN111458343B - Testing equipment and testing methods - Google Patents
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- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
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Abstract
本发明提供一种检测设备及检测方法,其中,检测设备包括:第一频闪光源,被配置为向承载面的待测物发射第一探测光,所述第一探测光经待测物形成第一信号光;第二频闪光源,被配置为向承载面的待测物发射第二探测光,所述第二探测光经待测物形成第二信号光,所述第一频闪光源和第二频闪光源被配置为多次交替地向所述待测物发射第一探测光和第二探测光;第一探测装置,被配置为多次交替地探测所述第一信号光和第二信号光,获取第一探测信息。所述检测设备结构简单,成本较低,且能够减少误检。
The present invention provides a detection device and a detection method, wherein the detection device comprises: a first stroboscopic light source, configured to emit a first detection light to an object to be detected on a carrying surface, the first detection light forms a first signal light through the object to be detected; a second stroboscopic light source, configured to emit a second detection light to the object to be detected on the carrying surface, the second detection light forms a second signal light through the object to be detected, the first stroboscopic light source and the second stroboscopic light source are configured to alternately emit the first detection light and the second detection light to the object to be detected multiple times; a first detection device, configured to alternately detect the first signal light and the second signal light multiple times to obtain first detection information. The detection device has a simple structure, low cost, and can reduce false detections.
Description
技术领域Technical Field
本发明涉及检测领域,特别涉及一种检测设备及检测方法。The present invention relates to the field of detection, and in particular to a detection device and a detection method.
背景技术Background technique
玻璃材料在现代工业制造中被广泛使用,例如作为手机屏幕、光学透镜、电池片、曲面显示屏等。随着加工水平的进步,越来越多的玻璃产品被设计成曲面结构,以实现更好的功能或达到更好的外观。由于曲面部分加工难度较大,镜面曲面有较大的可能出现缺陷,从而影响其功能及外观,因此需要对这部分进行检测,以保证产品合格率。Glass materials are widely used in modern industrial manufacturing, such as mobile phone screens, optical lenses, battery cells, curved display screens, etc. With the improvement of processing level, more and more glass products are designed into curved structures to achieve better functions or better appearance. Since the curved surface is difficult to process, the mirror surface is more likely to have defects, thus affecting its function and appearance. Therefore, this part needs to be tested to ensure the product qualification rate.
对玻璃产品表面缺陷的检测主要采用光学检测的方法,为了增加检测精度,减少误检率,往往需要对产品进行多通道检测,包括明场检测、暗场检测和背光检测。明场检测是通过探测待测物表面反射的光束强度,来实现对待测物表面进行检测的方法。明场检测具有灵敏度高、程序设定简单等优点,在工业检测中具有重要应用。暗场检测是通过探测待测物表面的散射光强度,来实现对待测物表面进行检测的方法。暗场检测对凸起等缺陷的检测可实现更好的灵敏度。背光检测是通过使光束穿过玻璃产品,对透过玻璃产品的光束进行探测。背光探测对检测玻璃产品的崩边具有很高的精度。The detection of surface defects of glass products mainly adopts the optical detection method. In order to increase the detection accuracy and reduce the false detection rate, it is often necessary to perform multi-channel detection on the product, including bright field detection, dark field detection and backlight detection. Bright field detection is a method of detecting the surface of the object to be tested by detecting the intensity of the light beam reflected from the surface of the object to be tested. Bright field detection has the advantages of high sensitivity and simple program setting, and has important applications in industrial detection. Dark field detection is a method of detecting the surface of the object to be tested by detecting the intensity of scattered light on the surface of the object to be tested. Dark field detection can achieve better sensitivity for the detection of defects such as bulges. Backlight detection is to detect the light beam passing through the glass product by passing the light beam through the glass product. Backlight detection has high accuracy in detecting the broken edge of glass products.
然而,现有技术通过多通道对产品进行检测的设备往往体积较大,结构复杂,成本较高。However, the existing equipment for testing products through multiple channels is often large in size, complex in structure and high in cost.
发明内容Summary of the invention
本发明解决的问题是提供一种检测设备和检测方法,能够简化多通道检测设备的结构,降低成本。The problem solved by the present invention is to provide a detection device and a detection method, which can simplify the structure of a multi-channel detection device and reduce the cost.
为解决上述问题,本发明提供一种检测设备,包括用于放置待测物的承载面,其特征在于,检测设备包括:第一频闪光源,被配置为向承载面的待测物发射第一探测光,所述第一探测光经待测物形成第一信号光;第二频闪光源,被配置为向承载面的待测物发射第二探测光,所述第二探测光经待测物形成第二信号光,所述第一频闪光源和第二频闪光源被配置为多次交替地向所述待测物发射第一探测光和第二探测光;第一探测装置,被配置为多次交替地探测所述第一信号光和第二信号光,获取第一探测信息。To solve the above problems, the present invention provides a detection device, including a carrying surface for placing an object to be tested, characterized in that the detection device includes: a first stroboscopic light source, configured to emit a first detection light to the object to be tested on the carrying surface, the first detection light forms a first signal light through the object to be tested; a second stroboscopic light source, configured to emit a second detection light to the object to be tested on the carrying surface, the second detection light forms a second signal light through the object to be tested, the first stroboscopic light source and the second stroboscopic light source are configured to alternately emit the first detection light and the second detection light to the object to be tested multiple times; a first detection device, configured to alternately detect the first signal light and the second signal light multiple times to obtain first detection information.
可选的,所述第一探测光和第二探测光的波长相同。Optionally, the first detection light and the second detection light have the same wavelength.
可选的,所述检测设备包括移动装置,所述移动装置用于带动待测物相对于所述第一光源、第二光源和第一探测装置移动。Optionally, the detection device includes a moving device, and the moving device is used to drive the object to be detected to move relative to the first light source, the second light source and the first detection device.
可选的,所述移动装置包括多个传送带装置,多个传送带装置用于使待测物沿相同的传送方向移动;相邻传送带装置之间具有空隙;所述承载面位于传送带装置表面,检测时待测物位于所述承载面且横跨所述空隙。Optionally, the moving device includes multiple conveyor belt devices, which are used to move the object to be tested along the same conveying direction; there are gaps between adjacent conveyor belt devices; the bearing surface is located on the surface of the conveyor belt device, and during detection, the object to be tested is located on the bearing surface and spans the gap.
可选的,所述传送带装置具有一个或多个空隙,所述一个或多个空隙包括第一空隙,所述第二频闪光源位于承载面靠近所述传送装置的一侧;所述第二探测光用于穿过所述第一空隙到达待测物表面。Optionally, the conveyor device has one or more gaps, the one or more gaps include a first gap, the second stroboscopic light source is located on a side of the bearing surface close to the conveyor device; the second detection light is used to pass through the first gap to reach the surface of the object to be measured.
可选的,所述第一频闪光源为明场光源,所述第二频闪光源为暗场光源或背光源;或者,所述第一频闪光源和第二频闪光源均为暗场光源,所述第一探测光和第二探测光的传播方向不同;或者,所述第二频闪光源为明场光源,所述第一频闪光源为暗场光源或背光源。Optionally, the first stroboscopic light source is a bright field light source, and the second stroboscopic light source is a dark field light source or a backlight source; or, the first stroboscopic light source and the second stroboscopic light source are both dark field light sources, and the propagation directions of the first detection light and the second detection light are different; or, the second stroboscopic light source is a bright field light source, and the first stroboscopic light source is a dark field light source or a backlight source.
可选的,所述检测设备还包括第三频闪光源,被配置为向待测物发射第三探测光,所述第三探测光经待测物形成第三信号光,所述第一光源、第二光源和第三光源被配置为多次交替地向所述待测物发射第一探测光、第二探测光和第三探测光;所述第一探测装置还被配置为探测所述第三探测光;所述第三频闪光源为暗场光源,所述第三频闪光源的个数为一个或多个,多个暗场光源发射的探测光的传播方向不同。Optionally, the detection equipment also includes a third stroboscopic light source, which is configured to emit a third detection light to the object to be tested, and the third detection light forms a third signal light through the object to be tested. The first light source, the second light source and the third light source are configured to alternately emit the first detection light, the second detection light and the third detection light to the object to be tested multiple times; the first detection device is also configured to detect the third detection light; the third stroboscopic light source is a dark field light source, and the number of the third stroboscopic light sources is one or more, and the propagation directions of the detection lights emitted by the multiple dark field light sources are different.
可选的,所述第一频闪光源和第二频闪光源为线光源,所述第一频闪光源和第二频闪光源在待测物表面形成光斑的延伸方向垂直于传送方向,且光斑沿传送方向贯穿待测物的待测区。Optionally, the first stroboscopic light source and the second stroboscopic light source are linear light sources, and the extension direction of the light spots formed by the first stroboscopic light source and the second stroboscopic light source on the surface of the object to be measured is perpendicular to the transmission direction, and the light spots pass through the test area of the object to be measured along the transmission direction.
可选的,所述第一探测装置的频率为15k~25k次/秒;所述第一频闪光源的闪光频率为30k~50k次/秒;所述第二频闪光源的闪光频率为30k~50k次/秒。Optionally, the frequency of the first detection device is 15k~25k times/second; the flash frequency of the first stroboscopic light source is 30k~50k times/second; and the flash frequency of the second stroboscopic light source is 30k~50k times/second.
可选的,所述检测设备还包括:第一照明光源,所述第一照明光源为弧形光源,所述弧形光源的发光面为弧面,所述弧形光源的弧面朝背离承载面的方向凸出;所述第一照明光源被配置为向待测物发射第四探测光,所述第四探测光经待测物反射形成第四信号光;第二探测装置,用于探测所述第四信号光获取第二探测信息。Optionally, the detection equipment also includes: a first illumination light source, the first illumination light source is an arc light source, the light emitting surface of the arc light source is an arc surface, and the arc surface of the arc light source protrudes in a direction away from the bearing surface; the first illumination light source is configured to emit a fourth detection light to the object to be tested, and the fourth detection light is reflected by the object to be tested to form a fourth signal light; a second detection device, used to detect the fourth signal light to obtain second detection information.
可选的,所述第一频闪光源为明场光源,所述第一频闪光源的发光面为平面或弧面;所述第一照明光源与第一频闪光源分别用于照射待测物相对的两个表面。Optionally, the first stroboscopic light source is a bright field light source, and the light-emitting surface of the first stroboscopic light source is a plane or a curved surface; the first illumination light source and the first stroboscopic light source are respectively used to illuminate two opposite surfaces of the object to be measured.
可选的,还包括:移动装置,所述移动装置包括多个传送带装置,多个传送带装置用于使待测物沿相同的传送方向移动,所述承载面位于传送带装置表面;相邻传送带装置之间具有空隙;所述传送带装置具有一个或多个空隙,所述一个或多个空隙包括第二空隙,检测时所述待测物位于所述承载面且横跨所述第二空隙;所述第四探测装置及至少部分第一照明光源位于所述承载面靠近第二空隙一侧,所述第四探测光用于穿过所述第二空隙到达所述待测物表面。Optionally, it also includes: a moving device, the moving device includes multiple conveyor belt devices, the multiple conveyor belt devices are used to move the object to be tested along the same conveying direction, the carrying surface is located on the surface of the conveyor belt device; there is a gap between adjacent conveyor belt devices; the conveyor belt device has one or more gaps, the one or more gaps include a second gap, and during detection, the object to be tested is located on the carrying surface and spans the second gap; the fourth detection device and at least part of the first illumination light source are located on the side of the carrying surface close to the second gap, and the fourth detection light is used to pass through the second gap to reach the surface of the object to be tested.
可选的,所述第一频闪光源为明场光源,所述第二频闪光源为背光源;所述一个或多个空隙包括第三空隙;所述检测设备还包括:第二照明光源,用于向所述第三空隙发射第六探测光,所述第六探测光经待测物散射形成第六信号光;第四探测装置,用于探测所述第六信号光获取第四探测信息;第三照明光源,用于向所述第三空隙发射第七探测光,所述第七探测光经待测物散射形成第七信号光,所述第三照明光源和第二照明光源分别用于照射待测物相对的两个面;第五探测装置,用于探测所述第七信号光获取第四探测信息。Optionally, the first stroboscopic light source is a bright field light source, and the second stroboscopic light source is a backlight source; the one or more gaps include a third gap; the detection equipment also includes: a second illumination light source, used to emit a sixth detection light to the third gap, the sixth detection light is scattered by the object to be detected to form a sixth signal light; a fourth detection device, used to detect the sixth signal light to obtain fourth detection information; a third illumination light source, used to emit a seventh detection light to the third gap, the seventh detection light is scattered by the object to be detected to form a seventh signal light, and the third illumination light source and the second illumination light source are respectively used to illuminate two opposite surfaces of the object to be detected; and a fifth detection device, used to detect the seventh signal light to obtain fourth detection information.
可选的,还包括:处理系统,用于根据第一探测装置不同时刻的第一探测信息,分别提取第一信号光和第二信号光的第一探测信息,形成第一图像和第二图像。Optionally, it also includes: a processing system for respectively extracting first detection information of the first signal light and the second signal light according to first detection information of the first detection device at different times to form a first image and a second image.
可选的,还包括:控制装置,用于向第一频闪光源和第一探测装置发送第一频闪触发信号,向第二频闪光源和第一探测装置发送第二频闪触发信号,所述第一频闪触发信号和第二频闪触发信号的触发时间交替排列;所述处理系统用于根据所述第一频闪触发信号的触发时间获取第一信号光的第一探测信息形成第一图像,并根据所述第二频闪触发信号的触发时间获取第二信号光的第一探测信息形成第二图像。Optionally, it also includes: a control device, used to send a first stroboscopic trigger signal to the first stroboscopic light source and the first detection device, and send a second stroboscopic trigger signal to the second stroboscopic light source and the first detection device, and the triggering times of the first stroboscopic trigger signal and the second stroboscopic trigger signal are arranged alternately; the processing system is used to obtain first detection information of the first signal light according to the triggering time of the first stroboscopic trigger signal to form a first image, and to obtain first detection information of the second signal light according to the triggering time of the second stroboscopic trigger signal to form a second image.
可选的,还包括:第四频闪光源,用于向待测物发射第五探测光,所述第五探测光经待测物形成第五信号光,所述第四频闪光源与第一频闪光源分别位于所述承载面两侧;第三探测装置,用于探测所述第五信号光获取第三探测信息,所述第三探测装置和第一探测装置分别位于所述承载面两侧。Optionally, it also includes: a fourth stroboscopic light source, used to emit a fifth detection light to the object to be tested, the fifth detection light forms a fifth signal light through the object to be tested, and the fourth stroboscopic light source and the first stroboscopic light source are respectively located on both sides of the carrying surface; a third detection device, used to detect the fifth signal light to obtain third detection information, and the third detection device and the first detection device are respectively located on both sides of the carrying surface.
可选的,所述第一频闪光源、第二频闪光源和第四频闪光源用于交替地向待测物发射探测光;或者,所述第四探测光与第一探测光的波长不相同,且所述第四探测光与第二探测光的波长不相同;第一探测装置包括第一滤光组件,用于滤除第四信号光;所述第三探测装置包括第二滤光组件,用于滤除第一信号光和第二信号光。Optionally, the first stroboscopic light source, the second stroboscopic light source and the fourth stroboscopic light source are used to alternately emit detection light to the object to be measured; or, the wavelength of the fourth detection light is different from that of the first detection light, and the wavelength of the fourth detection light is different from that of the second detection light; the first detection device includes a first filter component for filtering out the fourth signal light; and the third detection device includes a second filter component for filtering out the first signal light and the second signal light.
相应的,本发明还提供一种检测方法,其特征在于,包括:将待测物放置于检测设备的承载面;通过第一频闪光源和第二频闪光源多次交替地向所述待测物发射第一探测光和第二探测光,所述第一探测光经待测物形成第一信号光,所述第二探测光经待测物形成第二信号光;通过第一探测装置多次交替地探测所述第一信号光和第二信号光,获取第一探测信息。Correspondingly, the present invention also provides a detection method, which is characterized in that it includes: placing an object to be tested on a carrying surface of a detection device; emitting a first detection light and a second detection light to the object to be tested alternately multiple times by a first stroboscopic light source and a second stroboscopic light source, wherein the first detection light forms a first signal light after passing through the object to be tested, and the second detection light forms a second signal light after passing through the object to be tested; and alternately detecting the first signal light and the second signal light multiple times by a first detection device to obtain first detection information.
可选的,所述检测设备还包括处理系统时,检测方法还包括:通过处理系统根据第一探测装置不同时刻的第一探测信息,分别提取第一信号光和第二信号光的第一探测信息,形成第一图像和第二图像。Optionally, when the detection device further includes a processing system, the detection method further includes: extracting first detection information of the first signal light and the second signal light respectively according to first detection information of the first detection device at different times through the processing system to form a first image and a second image.
可选的,所述检测设备还包括控制装置时,通过第一频闪光源和第二频闪光源多次交替地向所述待测物发射第一探测光和第二探测光包括:通过控制装置向第一频闪光源和第一探测装置发送第一频闪触发信号;向第二频闪光源和第二探测装置发送第二频闪触发信号;形成第一图像和第二图像包括:根据所述第一频闪触发信号的触发时间获取第一信号光的第一探测信息形成第一图像;根据所述第二频闪触发信号的触发时间获取第二信号光的第一探测信息形成第二图像。Optionally, when the detection equipment also includes a control device, emitting the first detection light and the second detection light to the object to be detected multiple times and alternately through the first stroboscopic light source and the second stroboscopic light source includes: sending a first stroboscopic trigger signal to the first stroboscopic light source and the first detection device through the control device; sending a second stroboscopic trigger signal to the second stroboscopic light source and the second detection device; forming the first image and the second image includes: acquiring first detection information of the first signal light according to the trigger time of the first stroboscopic trigger signal to form the first image; acquiring first detection information of the second signal light according to the trigger time of the second stroboscopic trigger signal to form the second image.
可选的,当检测设备还包括:第四频闪光源和第三探测装置时;多次交替地向所述待测物发射第一探测光和第二探测光包括:使所述第一频闪光源、第二频闪光源和第四频闪光源多次交替地向待测物发射探测光;获取第一探测信息包括:通过第一探测装置多次交替地探测第一信号光、第二信号光和第五信号光;所述检测方法还包括:通过第三探测装置多次交替地探测第一信号光、第二信号光和第五信号光,获取第三探测信息。Optionally, when the detection equipment further includes: a fourth stroboscopic light source and a third detection device; multiple times of alternately emitting the first detection light and the second detection light to the object to be detected includes: making the first stroboscopic light source, the second stroboscopic light source and the fourth stroboscopic light source multiple times of alternately emitting detection light to the object to be detected; obtaining the first detection information includes: multiple times of alternately detecting the first signal light, the second signal light and the fifth signal light by the first detection device; the detection method further includes: multiple times of alternately detecting the first signal light, the second signal light and the fifth signal light by the third detection device to obtain the third detection information.
可选的,所述第五探测光与第一探测光的波长不相同,且所述第五探测光与第二探测光的波长不相同时;所述检测方法还包括:通过第三探测装置探测所述第五信号光,获取第三探测信息;通过第三探测装置探测所述第五信号光的时刻与第一探测装置探测第一信号光或第二信号光的时刻部分或全部重叠。Optionally, when the wavelength of the fifth detection light is different from that of the first detection light, and the wavelength of the fifth detection light is different from that of the second detection light; the detection method further includes: detecting the fifth signal light by a third detection device to obtain third detection information; the moment when the fifth signal light is detected by the third detection device partially or completely overlaps with the moment when the first detection device detects the first signal light or the second signal light.
可选的,当所述检测设备还包括:第一照明光源,所述第一照明光源为弧形光源,所述弧形光源的发光面为弧面,所述弧形光源的弧面朝背离承载面的方向凸出;所述第四探测光用于穿过所述第二空隙到达所述待测物表面时;所述待测物包括相对的第一面和第二面,所述第一面为凹面,所述第二面为凸面;将待测物放置于检测设备的承载面包括:使所述第二面与承载面接触。Optionally, when the detection device further includes: a first illumination light source, the first illumination light source is an arc-shaped light source, the light-emitting surface of the arc-shaped light source is an arc-shaped surface, and the arc-shaped surface of the arc-shaped light source protrudes in a direction away from the bearing surface; the fourth detection light is used to pass through the second gap to reach the surface of the object to be tested; the object to be tested includes a first surface and a second surface relative to each other, the first surface is a concave surface, and the second surface is a convex surface; placing the object to be tested on the bearing surface of the detection device includes: making the second surface contact with the bearing surface.
与现有技术相比,本发明的技术方案具有以下优点:Compared with the prior art, the technical solution of the present invention has the following advantages:
本发明技术方案提供的检测设备中,所述检测设备包括第一频闪光源和第二频闪光源。由于所述第一频闪光源和第二频闪光源被配置为多次交替地向所述待测物发射第一探测光和第二探测光,第一探测装置被配置为多次交替地探测所述第一信号光和第二信号光,则能够根据探测时间将第一探测装置根据第一信号光和第二信号光获取的第一探测信息分离,获取不同通道的第一探测信息。由于时间不会有重叠,从而能够提高检测精度。同时,所述检测设备能够通过一个第一探测装置获取第一信号光和第二探测光的第一探测信息,从而能够简化检测设备的结构,提高集成度,并能够降低成本。In the detection device provided by the technical solution of the present invention, the detection device includes a first stroboscopic light source and a second stroboscopic light source. Since the first stroboscopic light source and the second stroboscopic light source are configured to emit the first detection light and the second detection light to the object to be detected multiple times alternately, and the first detection device is configured to detect the first signal light and the second signal light multiple times alternately, the first detection information obtained by the first detection device based on the first signal light and the second signal light can be separated according to the detection time to obtain the first detection information of different channels. Since there is no overlap in time, the detection accuracy can be improved. At the same time, the detection device can obtain the first detection information of the first signal light and the second detection light through a first detection device, so that the structure of the detection device can be simplified, the integration can be improved, and the cost can be reduced.
进一步,所述检测设备包括移动装置,且所述第一频闪光源和第二频闪光源被配置为多次交替地向待测物发射第一探测光和第二探测光。利用所述检测设备带动待测物移动,并使第一频闪光源和第二频闪光源多次交替地向所述待测物发射第一探测光和第二探测光,利用探测装置进行探测,能够获取待测物表面较大区域的探测图像。Furthermore, the detection device includes a moving device, and the first stroboscopic light source and the second stroboscopic light source are configured to emit the first detection light and the second detection light to the object to be detected multiple times alternately. The detection device is used to drive the object to be detected to move, and the first stroboscopic light source and the second stroboscopic light source are used to emit the first detection light and the second detection light to the object to be detected multiple times alternately. The detection device is used to detect, so that a detection image of a larger area of the surface of the object to be detected can be obtained.
进一步,多个传送带装置之间具有空隙,所述第二探测光能够穿过所述空隙到达待测物,从而能够实现对待测物的背光检测,或者对待测物靠近移动装置的一面进行明场或暗场检测。Furthermore, there are gaps between the multiple conveyor belt devices, and the second detection light can pass through the gaps to reach the object to be tested, thereby realizing backlight detection of the object to be tested, or performing bright field or dark field detection on the side of the object to be tested close to the moving device.
进一步,所述检测设备还包括:弧形光源,所述弧形光源的发光面为弧面,所述弧形光源的弧面朝向背离承载面的方向凹陷。通过所述弧形光源及第二探测装置能够对具有凸面的待测物进行明场检测。所述第一频闪光源的发光面为平面或弧面可实现对具有待测物的平面和凹面进行明场检测。因此,所述检测设备能够实现对具有曲面的待测物进行双面明场检测。Furthermore, the detection device further comprises: an arc-shaped light source, the light-emitting surface of the arc-shaped light source is an arc-shaped surface, and the arc-shaped surface of the arc-shaped light source is concave in the direction away from the bearing surface. The arc-shaped light source and the second detection device can perform bright field detection on the object to be tested with a convex surface. The light-emitting surface of the first stroboscopic light source is a plane or an arc-shaped surface, which can realize bright field detection of the plane and concave surface of the object to be tested. Therefore, the detection device can realize double-sided bright field detection of the object to be tested with a curved surface.
进一步,通过第二探测装置对第四探测光进行探测,能够增加第一探测装置对第一探测光和第二探测光探测的曝光时间,进而能够提高探测图像的清晰度。Furthermore, by detecting the fourth detection light through the second detection device, the exposure time of the first detection device for detecting the first detection light and the second detection light can be increased, thereby improving the clarity of the detected image.
附图说明BRIEF DESCRIPTION OF THE DRAWINGS
图1是本发明的检测设备一实施例的结构示意图;FIG1 is a schematic structural diagram of an embodiment of a detection device of the present invention;
图2和图3是本发明的检测设备二实施例的结构示意图;2 and 3 are schematic diagrams of the structure of a second embodiment of a detection device of the present invention;
图4是本发明的检测设备三实施例的结构示意图;FIG4 is a schematic structural diagram of a third embodiment of a detection device of the present invention;
图5是本发明的检测设备四实施例的结构示意图;5 is a schematic structural diagram of a fourth embodiment of a detection device of the present invention;
图6是本发明的检测设备五实施例的结构示意图;6 is a schematic diagram of the structure of a fifth embodiment of a detection device of the present invention;
图7是本发明的检测方法一实施例中各步骤的流程图。FIG. 7 is a flow chart of the steps in an embodiment of a detection method of the present invention.
具体实施方式Detailed ways
现有的检测设备存在诸多问题,例如:检测设备结构复杂,成本较高。There are many problems with existing testing equipment, such as complex structure and high cost.
现结合一种检测设备分析其结构复杂,成本较高的原因。Now we analyze the reasons for its complex structure and high cost by combining a detection equipment.
为了提高检测的精度,减少误检,现有的检测设备往往设置多个通道对产品进行检测。由于检测通道较多,导致检测设备结构复杂,成本较高。In order to improve the accuracy of detection and reduce false detection, existing detection equipment often sets multiple channels to detect products. Due to the large number of detection channels, the detection equipment structure is complex and the cost is high.
为了简化检测设备的结构,一种方法是对不同通道使用不同波长的光束进行探测,根据光束波长不同使不同通道拍摄的图像分离。然而由于可见光范围内的光束往往会有重叠,因此该方法容易导致检测精度降低。In order to simplify the structure of the detection equipment, one method is to use light beams of different wavelengths to detect different channels, and separate the images taken by different channels according to the different wavelengths of the light beams. However, since the light beams in the visible light range often overlap, this method easily leads to reduced detection accuracy.
为解决所述技术问题,本发明提供了一种检测设备,包括:第一频闪光源,被配置为向承载面的待测物发射第一探测光,所述第一探测光经待测物形成第一信号光;第二频闪光源,被配置为向承载面的待测物发射第二探测光,所述第二探测光经待测物形成第二信号光,所述第一频闪光源和第二频闪光源被配置为多次交替地向所述待测物发射第一探测光和第二探测光;第一探测装置,被配置为多次交替地探测所述第一信号光和第二信号光,获取第一探测信息。所述检测设备结构简单,成本较低,且能够减少误检。To solve the technical problem, the present invention provides a detection device, comprising: a first stroboscopic light source, configured to emit a first detection light to the object to be detected on the carrying surface, the first detection light forms a first signal light through the object to be detected; a second stroboscopic light source, configured to emit a second detection light to the object to be detected on the carrying surface, the second detection light forms a second signal light through the object to be detected, the first stroboscopic light source and the second stroboscopic light source are configured to alternately emit the first detection light and the second detection light to the object to be detected multiple times; a first detection device, configured to alternately detect the first signal light and the second signal light multiple times to obtain first detection information. The detection device has a simple structure, low cost, and can reduce false detections.
为使本发明的上述目的、特征和优点能够更为明显易懂,下面结合附图对本发明的具体实施例做详细的说明。In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, specific embodiments of the present invention are described in detail below with reference to the accompanying drawings.
图1是本发明的检测设备一实施例的结构示意图。FIG. 1 is a schematic structural diagram of an embodiment of a detection device of the present invention.
请参考图1,所述检测设备包括:第一频闪光源121,被配置为向待测物110发射第一探测光,所述第一探测光经待测物110形成第一信号光;Please refer to FIG. 1 , the detection device includes: a first stroboscopic light source 121 configured to emit a first detection light to the object to be detected 110 , wherein the first detection light forms a first signal light through the object to be detected 110 ;
第二频闪光源122,被配置为向待测物110发射第二探测光,所述第二探测光经待测物110形成第二信号光,所述第一频闪光源121和第二频闪光源122被配置为多次交替地向所述待测物110发射第一探测光和第二探测光;The second stroboscopic light source 122 is configured to emit a second detection light to the object under test 110, and the second detection light forms a second signal light through the object under test 110. The first stroboscopic light source 121 and the second stroboscopic light source 122 are configured to emit the first detection light and the second detection light to the object under test 110 alternately for multiple times.
第一探测装置111,被配置为多次交替地探测所述第一信号光和第二信号光,获取第一探测信息。The first detection device 111 is configured to detect the first signal light and the second signal light alternately for multiple times to obtain first detection information.
所述检测设备包括第一频闪光源121和第二频闪光源122。由于所述第一频闪光源121和第二频闪光源122被配置为多次交替地向所述待测物110发射第一探测光和第二探测光,第一探测装置111被配置为多次交替地探测所述第一信号光和第二信号光,则能够根据探测时间将第一探测装置111根据第一信号光和第二信号光获取的第一探测信息分离,获取不同通道的第一探测信息。由于时间不会有重叠,从而能够提高检测精度。同时,所述检测设备能够通过一个第一探测装置111获取第一信号光和第二信号光的第一探测信息,从而能够简化检测设备的结构,提高集成度,并能够降低成本。The detection device includes a first stroboscopic light source 121 and a second stroboscopic light source 122. Since the first stroboscopic light source 121 and the second stroboscopic light source 122 are configured to emit the first detection light and the second detection light to the object to be detected 110 alternately for multiple times, and the first detection device 111 is configured to detect the first signal light and the second signal light alternately for multiple times, the first detection information obtained by the first detection device 111 according to the first signal light and the second signal light can be separated according to the detection time, and the first detection information of different channels can be obtained. Since there is no overlap in time, the detection accuracy can be improved. At the same time, the detection device can obtain the first detection information of the first signal light and the second signal light through a first detection device 111, so that the structure of the detection device can be simplified, the integration can be improved, and the cost can be reduced.
本实施例中,所述检测设备包括用于放置待测物110的承载面。本实施例中,所述检测设备还包括移动装置,移动装置用于带动待测物110相对于所述第一频闪光源121、第二频闪光源122和第一探测装置111移动。In this embodiment, the detection device includes a carrying surface for placing the object to be detected 110. In this embodiment, the detection device also includes a moving device for driving the object to be detected 110 to move relative to the first stroboscopic light source 121, the second stroboscopic light source 122 and the first detection device 111.
所述移动装置用于带动待测物110相对于所述第一光源、第二光源和第一探测装置111沿传送方向移动。所述承载面位于移动装置表面。The moving device is used to drive the object to be detected 110 to move along the transmission direction relative to the first light source, the second light source and the first detection device 111. The bearing surface is located on the surface of the moving device.
所述待测物110包括相对的第一面和第二面,所述第二面用于与所述移动装置接触。The object to be tested 110 includes a first surface and a second surface opposite to each other, and the second surface is used for contacting with the mobile device.
本实施例中,所述第一频闪光源121为明场光源,所述第一探测光经待测物110反射后形成第一信号光;所述第二频闪光源122为背光源,即所述第二探测光穿过所述待测物110,形成第一信号光被第一探测装置111接收。所述第一频闪光源121与第一探测装置111位于所述承载面的同一侧。具体的,所述第一频闪光源121与第一探测装置111位于所述承载面远离移动装置的一侧;所述第二频闪光源122和第一探测装置111分别位于所述承载面两侧,即所述第二频闪光源122位于所述承载面靠近移动装置的一侧。In this embodiment, the first stroboscopic light source 121 is a bright field light source, and the first detection light forms a first signal light after being reflected by the object to be measured 110; the second stroboscopic light source 122 is a backlight source, that is, the second detection light passes through the object to be measured 110 to form a first signal light received by the first detection device 111. The first stroboscopic light source 121 and the first detection device 111 are located on the same side of the carrying surface. Specifically, the first stroboscopic light source 121 and the first detection device 111 are located on the side of the carrying surface away from the mobile device; the second stroboscopic light source 122 and the first detection device 111 are respectively located on both sides of the carrying surface, that is, the second stroboscopic light source 122 is located on the side of the carrying surface close to the mobile device.
本实施例中,所述第一频闪光源121和第二频闪光源122交替发光,所述第一探测装置111仅交替探测所述第一信号光和第二信号光。In this embodiment, the first stroboscopic light source 121 and the second stroboscopic light source 122 emit light alternately, and the first detection device 111 only detects the first signal light and the second signal light alternately.
本实施例中,所述第一探测光和第二探测光的波长相同。所述第一探测光和第二探测光的波长相同,能够简化第一探测装置111的调节难度。在其他实施例中,所述第一探测光和第二探测光的波长可以不相同。In this embodiment, the wavelengths of the first detection light and the second detection light are the same. The wavelengths of the first detection light and the second detection light are the same, which can simplify the difficulty of adjusting the first detection device 111. In other embodiments, the wavelengths of the first detection light and the second detection light may be different.
所述第一探测装置111为线探测器,即所述第一探测装置111在待测物110表面的探测区为线形。具体的,本实施例中,所述探测区为第一探测装置111拍摄一次图像所拍摄的待测物110表面区域。所述第一探测装置111的探测区沿垂直于所述传送方向贯穿所述待测物110的待测区。The first detection device 111 is a line detector, that is, the detection area of the first detection device 111 on the surface of the object to be detected 110 is linear. Specifically, in this embodiment, the detection area is the surface area of the object to be detected 110 captured by the first detection device 111. The detection area of the first detection device 111 passes through the detection area of the object to be detected 110 perpendicular to the transmission direction.
所述第一频闪光源121和第二频闪光源122为线光源,所述第一频闪光源121和第二频闪光源122在待测物110表面形成光斑的延伸方向垂直于传送方向,且光斑沿传送方向贯穿所述待测物110的待测区。所述线光源指的是光源发光面的长度远大于宽度。The first stroboscopic light source 121 and the second stroboscopic light source 122 are linear light sources, and the extension direction of the light spots formed by the first stroboscopic light source 121 and the second stroboscopic light source 122 on the surface of the object to be tested 110 is perpendicular to the transmission direction, and the light spots pass through the test area of the object to be tested 110 along the transmission direction. The linear light source refers to a light source whose light-emitting surface is much longer than its width.
在其他实施例中,所述第一频闪光源和第二频闪光源可以为面光源,所述第一探测装置可以为面探测器。In other embodiments, the first stroboscopic light source and the second stroboscopic light source may be surface light sources, and the first detection device may be a surface detector.
本时候例中,所述第一频闪光源121和第二频闪光源122均为LED光源。在其他实施例中,所述第一频闪光源和第二频闪光源可以为激光光源。In this example, both the first stroboscopic light source 121 and the second stroboscopic light source 122 are LED light sources. In other embodiments, the first stroboscopic light source and the second stroboscopic light source may be laser light sources.
本实施例中,所述第一探测光和第二探测光为红光。在其他实施例中,所述第一探测光和第二探测光可以为黄光或蓝光。In this embodiment, the first detection light and the second detection light are red light. In other embodiments, the first detection light and the second detection light can be yellow light or blue light.
通过所述检测设备对待测物110表面进行扫描,获取待测物110表面图像时,需要待测物110相对于所述第一探测装置111移动,如果待测物110移动速度过小,容易降低检测速度,降低检测效率;如果待测物110移动速度过大,不容易使第一探测装置111获取整个待测区表面的图像。When the surface of the object to be tested 110 is scanned by the detection device to obtain the surface image of the object to be tested 110, the object to be tested 110 needs to move relative to the first detection device 111. If the moving speed of the object to be tested 110 is too slow, the detection speed and detection efficiency are easily reduced; if the moving speed of the object to be tested 110 is too fast, it is not easy for the first detection device 111 to obtain the image of the entire surface of the test area.
如果第一探测装置111的拍摄频率过小,拍摄一次照片的时间间隔较长,在该时间间隔内待测物110移动的距离较大,从而容易导致待测物110表面部分区域漏拍,因此,第一探测装置111的拍摄频率不宜过小。如果第一探测装置111需要探测的探测光由较多的光源发出,则为了减少漏拍,所述第一探测装置111的拍摄频率较高。If the shooting frequency of the first detection device 111 is too low, the time interval between taking a photo is long, and the distance moved by the object to be tested 110 during the time interval is large, which may easily lead to missing photos of some areas on the surface of the object to be tested 110. Therefore, the shooting frequency of the first detection device 111 should not be too low. If the detection light to be detected by the first detection device 111 is emitted by more light sources, the shooting frequency of the first detection device 111 is higher in order to reduce missed photos.
如果第一探测装置111的拍摄频率较高,第一探测装置111拍摄两张图像的时间间隔较小。由于第一探测装置111拍摄每张图像的曝光时间需小于拍摄两张图像之间的时间间隔,因此如果第一探测装置111需要探测的探测光由较多的光源发出,则拍摄每张图像时,第一探测装置111的曝光时间较短,从而容易降低每张图像的清晰度,进而第一探测装置111需要探测的不同探测光的数量不易过多,因此,本实施中,所述第一频闪光源121和第二频闪光源122交替发光,所述第一探测装置111仅交替探测所述的第一信号光和第二信号光。If the shooting frequency of the first detection device 111 is high, the time interval between the first detection device 111 shooting two images is short. Since the exposure time of the first detection device 111 shooting each image needs to be less than the time interval between shooting two images, if the detection light that the first detection device 111 needs to detect is emitted by more light sources, the exposure time of the first detection device 111 is short when shooting each image, which is easy to reduce the clarity of each image, and thus the number of different detection lights that the first detection device 111 needs to detect is not too large. Therefore, in this embodiment, the first stroboscopic light source 121 and the second stroboscopic light source 122 emit light alternately, and the first detection device 111 only detects the first signal light and the second signal light alternately.
所述第一探测装置的频率大于或等于发射第一探测装置接受的信号光的探测装置的频率之和。具体的,本实施例中,所述第一探测装置的频率等于发射第一探测装置接受的信号光的探测装置的频率之和。The frequency of the first detection device is greater than or equal to the sum of the frequencies of the detection devices that emit the signal light received by the first detection device. Specifically, in this embodiment, the frequency of the first detection device is equal to the sum of the frequencies of the detection devices that emit the signal light received by the first detection device.
具体的,本实施例中,所述第一探测装置111的行频为15k~25k次/秒;所述第一频闪光源121的闪光频率为30k~50k次/秒;所述第二频闪光源122的闪光频率为30k~50k次/秒。Specifically, in this embodiment, the line frequency of the first detection device 111 is 15k~25k times/second; the flash frequency of the first stroboscopic light source 121 is 30k~50k times/second; the flash frequency of the second stroboscopic light source 122 is 30k~50k times/second.
本实施例中,所述第一频闪光源121的发光面为平面。平面光源的加工成本低,能够降低检测设备的成本。在其他实施例中,所述第一频闪光源的发光面可以为曲面。In this embodiment, the light emitting surface of the first stroboscopic light source 121 is a plane. The processing cost of a plane light source is low, which can reduce the cost of the detection equipment. In other embodiments, the light emitting surface of the first stroboscopic light source can be a curved surface.
具体的,所述待测物110为手机壳。在其他实施例中,所述待测物可以为平面玻璃。Specifically, the object to be tested 110 is a mobile phone case. In other embodiments, the object to be tested may be a flat glass.
所述检测设备还包括:处理系统,用于根据第一探测装置111不同时刻的第一探测信息,分别提取第一信号光和第二信号光的第一探测,形成第一图像和第二图像;控制装置,用于向第一频闪光源121和第一探测装置111发送第一频闪触发信号,向第二频闪光源122和第二探测装置112发送第二频闪触发信号。The detection device also includes: a processing system for extracting the first detection of the first signal light and the second signal light respectively according to the first detection information of the first detection device 111 at different times to form a first image and a second image; a control device for sending a first stroboscopic trigger signal to the first stroboscopic light source 121 and the first detection device 111, and sending a second stroboscopic trigger signal to the second stroboscopic light source 122 and the second detection device 112.
所述处理系统用于根据所述第一频闪触发信号的触发时间获取第一信号光的第一探测信息形成第一图像,并根据所述第二频闪触发信号的触发时间获取第二信号光的第一探测信息形成第二图像。The processing system is used to acquire first detection information of the first signal light according to the trigger time of the first stroboscopic trigger signal to form a first image, and to acquire first detection information of the second signal light according to the trigger time of the second stroboscopic trigger signal to form a second image.
触发时间指的是使光源发射探测光或使探测装置获取第一探测信息的时间。The trigger time refers to the time when the light source emits detection light or the detection device acquires the first detection information.
本实施例中,所述移动装置包括多个传送带装置100,多个传送带装置100用于使待测物110沿相同的传送方向移动;相邻传送带装置100之间具有空隙,所述移动装置用于使待测物110自一个传送装置100横跨所述空隙传送至另一传送装置100。In this embodiment, the moving device includes multiple conveyor belt devices 100, and the multiple conveyor belt devices 100 are used to move the object to be tested 110 along the same conveying direction; there are gaps between adjacent conveyor belt devices 100, and the moving device is used to transfer the object to be tested 110 from one conveyor device 100 to another conveyor device 100 across the gaps.
相邻传送带装置100与待测物110的接触点之间的最小距离小于待测物沿传送方向尺寸的一半。The minimum distance between the contact points between adjacent conveyor belt devices 100 and the object to be measured 110 is less than half of the dimension of the object to be measured along the conveying direction.
本实施例中,所述传送带装置100具有一个或多个空隙,所述一个或多个空隙包括第一空隙,所述第二频闪光源122位于承载面靠近所述传送装置的一侧;所述第二探测光用于穿过所述第一空隙到达所述待测物110。In this embodiment, the conveyor device 100 has one or more gaps, which include a first gap. The second stroboscopic light source 122 is located on a side of the carrying surface close to the conveyor device. The second detection light is used to pass through the first gap to reach the object to be detected 110.
本实施例中,所述第二频闪光源122为背光源,且位于所述承载面靠近移动装置的一侧。所述第二探测光穿过所述第一空隙,照射至待测物110第二面,并透过所述待测物110形成第二信号光,被第一探测装置111接收。In this embodiment, the second stroboscopic light source 122 is a backlight source and is located on the side of the carrying surface close to the mobile device. The second detection light passes through the first gap, irradiates the second surface of the object under test 110, and passes through the object under test 110 to form a second signal light, which is received by the first detection device 111.
所述传送带装置100包括两个旋转轮101和传送带102,所述传送带102绕在旋转轮101上,所述旋转轮101带动传送带102转动。对待测物110进行检测时,所述待测物110放置于所述传送带102上,当旋转轮101旋转时,传送带102带动所述待测物110沿传送方向移动。The conveyor belt device 100 includes two rotating wheels 101 and a conveyor belt 102. The conveyor belt 102 is wound around the rotating wheels 101, and the rotating wheels 101 drive the conveyor belt 102 to rotate. When the object to be tested 110 is tested, the object to be tested 110 is placed on the conveyor belt 102. When the rotating wheels 101 rotate, the conveyor belt 102 drives the object to be tested 110 to move along the conveying direction.
如果相邻传送带装置100之间空隙的深宽比过大,容易对第二探测光产生遮挡;如果相邻传送带装置100之间的深宽比过小,相邻传送带装置100之间间距过大待测物110容易从所述空隙中滑落,如果所述旋转率半径较小,曲率较大,容易导致传送带102与待测物110接触的表面不平。具体的,本实施例中,相邻传送带装置100之间的最小间距为40mm~55m,例如45mm;旋转轮101的直径为13mm~17mm,例如15mm;皮带的直径为1.5mm~2.5mm,例如2mm。If the aspect ratio of the gap between adjacent conveyor belt devices 100 is too large, the second detection light is easily blocked; if the aspect ratio between adjacent conveyor belt devices 100 is too small, the distance between adjacent conveyor belt devices 100 is too large, and the object to be tested 110 is easy to slide from the gap; if the rotation rate radius is small and the curvature is large, it is easy to cause the surface of the conveyor belt 102 in contact with the object to be tested 110 to be uneven. Specifically, in this embodiment, the minimum distance between adjacent conveyor belt devices 100 is 40mm~55mm, for example 45mm; the diameter of the rotating wheel 101 is 13mm~17mm, for example 15mm; the diameter of the belt is 1.5mm~2.5mm, for example 2mm.
所述第一探测装置111包括物镜和图像传感器,所述物镜用于收集第一信号光和第二信号光,并将第一信号光和第二信号光汇聚至所述图像传感器上;所述图像传感器用于根据所述第一信号光和第二信号光获取第一探测信息。The first detection device 111 includes an objective lens and an image sensor. The objective lens is used to collect the first signal light and the second signal light, and converge the first signal light and the second signal light onto the image sensor; the image sensor is used to obtain first detection information according to the first signal light and the second signal light.
本实施例中,所述第二频闪光源122为背光源,则所述第二探测光中心轴线与第一探测装置111的物镜光轴平行。由于第一频闪光源121为明场光源,所述第一探测装置111和第一频闪光源121分别位于垂直所述传送方向的平面两侧,且第一探测光的中心轴与垂直所述传送方向的平面之间的锐角夹角等于第一探测装置111的物镜光轴与垂直所述传送方向的平面之间的锐角夹角。In this embodiment, the second stroboscopic light source 122 is a backlight source, and the central axis of the second detection light is parallel to the optical axis of the objective lens of the first detection device 111. Since the first stroboscopic light source 121 is a bright field light source, the first detection device 111 and the first stroboscopic light source 121 are respectively located on both sides of a plane perpendicular to the transmission direction, and the acute angle between the central axis of the first detection light and the plane perpendicular to the transmission direction is equal to the acute angle between the optical axis of the objective lens of the first detection device 111 and the plane perpendicular to the transmission direction.
本实施例中,待测物110为手机壳或平面玻璃。In this embodiment, the object to be tested 110 is a mobile phone case or a flat glass.
在其他实施中,第一探测光的中心轴与垂直所述传送方向的平面之间的锐角夹角可调;第一探测装置的物镜光轴与垂直所述传送方向的平面之间的锐角夹角可调。In other implementations, the acute angle between the central axis of the first detection light and the plane perpendicular to the transmission direction is adjustable; the acute angle between the objective lens optical axis of the first detection device and the plane perpendicular to the transmission direction is adjustable.
如果第二探测光中心线与所述垂直所述传送方向的平面之间的锐角夹角过大,则第二探测光容易被传送带装置100遮挡;如果第二探测光中心线与所述垂直所述传送方向的平面之间的锐角夹角过小,则第二探测光和第二信号光容易被第一频闪光源121遮挡。具体的,本实施例中,所述第二探测光中心线与所述垂直所述传送方向的平面之间的锐角夹角为25°~35°。If the acute angle between the center line of the second detection light and the plane perpendicular to the transmission direction is too large, the second detection light is easily blocked by the conveyor belt device 100; if the acute angle between the center line of the second detection light and the plane perpendicular to the transmission direction is too small, the second detection light and the second signal light are easily blocked by the first stroboscopic light source 121. Specifically, in this embodiment, the acute angle between the center line of the second detection light and the plane perpendicular to the transmission direction is 25° to 35°.
在其他实施例中,第二探测光中心线与垂直所述传送方向的平面之间的锐角夹角可调。In other embodiments, the acute angle between the center line of the second detection light and the plane perpendicular to the transmission direction is adjustable.
图2和图3是本发明的检测设备另一实施例的结构示意图。2 and 3 are schematic structural diagrams of another embodiment of the detection device of the present invention.
请参考图2和图3,图3是图2中区域1中部分沿x方向的侧视图。Please refer to FIG. 2 and FIG. 3 , FIG. 3 is a side view of a portion of area 1 in FIG. 2 along the x direction.
本实施例与上一实施例的相同之处在此不多做赘述,不同之处包括:The similarities between this embodiment and the previous embodiment are not described in detail here, and the differences include:
本实施中,所述检测设备还包括:第一照明光源131,所述第一照明光源131为弧形光源,所述弧形光源的发光面为弧面,所述弧形光源的弧面朝背离承载面的方向凹陷;In this embodiment, the detection device further includes: a first illumination light source 131, wherein the first illumination light source 131 is an arc-shaped light source, the light emitting surface of the arc-shaped light source is an arc surface, and the arc surface of the arc-shaped light source is concave in a direction away from the bearing surface;
所述第一照明光源131被配置为向待测物110发射第四探测光,所述第四探测光经待测物110反射形成第四信号光,所述第一照明光源131与第一频闪光源121分别用于照射待测物110相对的两个表面;第二探测装置112,用于探测所述第四信号光获取第二探测信息。The first illumination light source 131 is configured to emit a fourth detection light to the object under test 110, and the fourth detection light is reflected by the object under test 110 to form a fourth signal light. The first illumination light source 131 and the first stroboscopic light source 121 are respectively used to illuminate two opposite surfaces of the object under test 110; the second detection device 112 is used to detect the fourth signal light to obtain second detection information.
具体的,本实施例中,所述待测物110包括相对的第一面和第二面,所述第一面和第二面具为弧面;所述第一面为凹面,即所述第一面朝向第二面凹陷;所述第二面为凸面,即所述第二面朝背离第一面的方向凸出。Specifically, in this embodiment, the object to be tested 110 includes a first surface and a second surface relative to each other, the first surface and the second surface are arc surfaces; the first surface is a concave surface, that is, the first surface is concave toward the second surface; the second surface is a convex surface, that is, the second surface protrudes in a direction away from the first surface.
本实施例中,所述第一频闪光源121的发光面为平面,则所述第一频闪光源121用于照射所述第一面,从而对所述第一面进行检测。In this embodiment, the light emitting surface of the first stroboscopic light source 121 is a plane, and the first stroboscopic light source 121 is used to illuminate the first surface, so as to detect the first surface.
所述第一照明光源131被配置为向具有至少一个弯曲检测表面的待测物提供探测光,所述弯曲检测表面在弯曲方向上至少有两个位置的法线不平行;The first illumination light source 131 is configured to provide detection light to the object to be tested having at least one curved detection surface, wherein the normal lines of at least two positions of the curved detection surface in the bending direction are not parallel;
第二探测装置112用于采集所述探测光在所述待测物沿所述弯曲方向连续的表面的反射光。The second detection device 112 is used to collect the reflected light of the detection light on the surface of the object to be detected that is continuous along the bending direction.
本实施例中,所述第一频闪光源121和第二照明光源141能够实现对弯曲待测物110的双面检测。In this embodiment, the first stroboscopic light source 121 and the second illumination light source 141 can realize double-sided detection of the curved object to be tested 110 .
所述第一照明光源131为弧形光源,用于照射凸面,从而对凸面进行检测。由于所述第一照明光源131为弧形光源,所述弧形光源向凸面发射的第四探测光的传播方向不同,容易保证第四探测光经过凸面反射后形成的第四信号光能够被第二探测装置112接收,从而能够对凸面进行检测。The first illumination light source 131 is an arc light source, which is used to illuminate the convex surface, so as to detect the convex surface. Since the first illumination light source 131 is an arc light source, the propagation direction of the fourth detection light emitted by the arc light source to the convex surface is different, which makes it easy to ensure that the fourth signal light formed by the fourth detection light after being reflected by the convex surface can be received by the second detection device 112, so that the convex surface can be detected.
所述第二探测装置112的镜头的光轴与垂直传送方向的平面之间具有第一锐角夹角。所述第一照明光源131发射的第四探测光具有对称面,所述对称面与垂直于所述传送方向的平面之间具有第二锐角夹角,所述第二锐角夹角等于第一锐角夹角。There is a first acute angle between the optical axis of the lens of the second detection device 112 and the plane perpendicular to the transmission direction. The fourth detection light emitted by the first illumination light source 131 has a symmetry plane, and there is a second acute angle between the symmetry plane and the plane perpendicular to the transmission direction, and the second acute angle is equal to the first acute angle.
本实施中,所述一个或多个空隙还包括第二空隙。In this embodiment, the one or more gaps further include a second gap.
本实施例中,至少部分第一照明光源131及所述第二探测装置112位于承载面靠近移动装置的一侧。所述第四探测光穿过所述第二空隙入射至所述待测物110表面。In this embodiment, at least part of the first illumination light source 131 and the second detection device 112 are located on a side of the carrying surface close to the moving device. The fourth detection light passes through the second gap and is incident on the surface of the object to be detected 110 .
如果所述第一锐角夹角过大,容易被移动装置遮挡;如果所述第一锐角夹角过小,不利于第二探测装置112和第一照明光源131的安装。具体的,所述第一锐角夹角为10°~20°。If the first acute angle is too large, it is easy to be blocked by the mobile device; if the first acute angle is too small, it is not conducive to the installation of the second detection device 112 and the first illumination light source 131. Specifically, the first acute angle is 10° to 20°.
本实施例中,所述第一照明光源131的发光面为连续的曲面。即所述第一照明光源131中间不具有开口,则所述第一照明光源131能够为待测物110提供强度较均匀的第四探测光,从而能够提高检测精度。In this embodiment, the light emitting surface of the first illumination light source 131 is a continuous curved surface, that is, the first illumination light source 131 has no opening in the middle, so the first illumination light source 131 can provide the object to be detected 110 with fourth detection light of relatively uniform intensity, thereby improving detection accuracy.
图4是本发明的检测设备第三实施例的结构示意图。FIG. 4 is a schematic structural diagram of a third embodiment of a detection device of the present invention.
请参考图4,本实施例与图2和图3所示实施例的相同之处在此不多做赘述,不同之处包括:Please refer to FIG. 4 . The similarities between this embodiment and the embodiments shown in FIG. 2 and FIG. 3 are not described in detail here. The differences include:
本实施例中,所述检测设备还包括:第二照明光源141,用于向待测物110发射第六探测光,所述第六探测光经待测物110形成第六信号光;第四探测装置113,用于探测所述第六信号光,获取第四探测信息。In this embodiment, the detection device further includes: a second illumination light source 141, used for emitting a sixth detection light to the object to be detected 110, the sixth detection light forms a sixth signal light through the object to be detected 110; a fourth detection device 113, used for detecting the sixth signal light to obtain fourth detection information.
第三照明光源142,用于向待测物110发射第七探测光,所述第七探测光经待测物110形成第七信号光;第五探测装置114,用于探测所述第七信号光,获取第五探测信息。The third illumination light source 142 is used to emit seventh detection light to the object to be measured 110, and the seventh detection light forms seventh signal light through the object to be measured 110; the fifth detection device 114 is used to detect the seventh signal light to obtain fifth detection information.
本实施例中,所述第一频闪光源121为明场光源;所述第二频闪光源122为背光源;所述第二照明光源141为暗场光源,所述六信号光为第六探测光经待测物110散射形成的散射光。所述第一照明光源131为明场光源,所述第三照明光源142为暗场光源。在其他实施例中,所述第一频闪光源为暗场光源,所述第二频闪光源为背光源,所述第二照明光源为明场光源;或者,所述第一频闪光源为明场光源,所述第二频闪光源为暗场光源,所述第二照明光源为背光源,所述第三照明光源为暗场光源。In this embodiment, the first stroboscopic light source 121 is a bright field light source; the second stroboscopic light source 122 is a backlight source; the second illumination light source 141 is a dark field light source, and the six signal lights are scattered lights formed by the sixth detection light being scattered by the object to be measured 110. The first illumination light source 131 is a bright field light source, and the third illumination light source 142 is a dark field light source. In other embodiments, the first stroboscopic light source is a dark field light source, the second stroboscopic light source is a backlight source, and the second illumination light source is a bright field light source; or, the first stroboscopic light source is a bright field light source, the second stroboscopic light source is a dark field light source, the second illumination light source is a backlight source, and the third illumination light source is a dark field light source.
具体的,第二照明光源141用于向所述第三空隙发射第六探测光,所述第六探测光经待测物110散射形成第六信号光;Specifically, the second illumination light source 141 is used to emit a sixth detection light to the third gap, and the sixth detection light is scattered by the object to be detected 110 to form a sixth signal light;
第四探测装置113用于探测所述第六信号光获取第四探测信息;The fourth detection device 113 is used to detect the sixth signal light to obtain fourth detection information;
第三照明光源142,用于向所述第三空隙发射第七探测光,所述第七探测光经待测物散射形成第七信号光,所述第三照明光源142和第二照明光源141分别用于照射待测物110相对的两个面;A third illumination light source 142 is used to emit a seventh detection light to the third gap, and the seventh detection light is scattered by the object to be measured to form a seventh signal light. The third illumination light source 142 and the second illumination light source 141 are used to illuminate two opposite surfaces of the object to be measured 110 respectively;
第五探测装置114用于探测所述第七信号光获取第四探测信息。The fifth detection device 114 is used to detect the seventh signal light to obtain fourth detection information.
本实施例能够实现对待测物110双面的明场和暗场检测,以及背光检测,从而能够对待测物110进行多通道检测,进而提高检测精度,减少缺陷的漏检。This embodiment can realize bright field and dark field detection on both sides of the object to be tested 110, as well as backlight detection, so that multi-channel detection can be performed on the object to be tested 110, thereby improving the detection accuracy and reducing the missed detection of defects.
本实施例中,所述第二照明光源141和第三照明光源142的个数为一个。在其他实施例中,所述第二照明光源为暗场光源时,所述第二照明光源的个数可以为多个,多个第二照明光源发射的第六探测光的传播方向不同。所述第三照明光源为暗场光源时,所述第三照明光源的个数可以为多个,多个第三照明光源发射的第七探测光的传播方向不同。In this embodiment, the number of the second illumination light source 141 and the third illumination light source 142 is one. In other embodiments, when the second illumination light source is a dark field light source, the number of the second illumination light sources may be multiple, and the propagation directions of the sixth detection light emitted by the multiple second illumination light sources are different. When the third illumination light source is a dark field light source, the number of the third illumination light sources may be multiple, and the propagation directions of the seventh detection light emitted by the multiple third illumination light sources are different.
本实施例中,所述第六探测光的传播方向垂直于所述承载面;所述第四探测装置113的镜头的光轴与垂直于所述传送方向的平面之间具有锐角夹角。所述第七探测光的传播方向与垂直于所述传送方向的平面之间具有锐角夹角,所述第五探测装置114的镜头光轴与承载面法线平行。In this embodiment, the propagation direction of the sixth detection light is perpendicular to the carrying surface; an acute angle is formed between the optical axis of the lens of the fourth detection device 113 and the plane perpendicular to the transmission direction. An acute angle is formed between the propagation direction of the seventh detection light and the plane perpendicular to the transmission direction, and the optical axis of the lens of the fifth detection device 114 is parallel to the normal of the carrying surface.
图5是本发明检测设备第四实施例的结构示意图。FIG. 5 is a schematic structural diagram of a fourth embodiment of a detection device according to the present invention.
请参考图5,本实施例图1所示实施例的相同之处在此不做赘述,不同之处包括:Please refer to FIG. 5 . The same aspects as those of the embodiment shown in FIG. 1 are not described in detail here. The differences include:
本实施例中,所述第二频闪光源221为暗场光源。在其他实施例中,所述第二频闪光源可以为背光源。In this embodiment, the second stroboscopic light source 221 is a dark field light source. In other embodiments, the second stroboscopic light source may be a backlight source.
本实施例中,所述检测设备还包括第三频闪光源222,被配置为向待测物110发射第三探测光,所述第三探测光经待测物110形成第三信号光,所述第一光源、第二光源和第三光源被配置为多次交替地向所述待测物110发射第一探测光、第二探测光和第三探测光;所述第一探测装置111还被配置为探测所述第三探测光。In this embodiment, the detection device also includes a third stroboscopic light source 222, which is configured to emit a third detection light to the object under test 110, and the third detection light forms a third signal light through the object under test 110. The first light source, the second light source and the third light source are configured to alternately emit the first detection light, the second detection light and the third detection light to the object under test 110 for multiple times; the first detection device 111 is also configured to detect the third detection light.
本实施例中,所述第三频闪光源222为暗场光源,所述第三频闪光源222的个数为一个或多个,多个暗场光源发射的探测光的传播方向不同。In this embodiment, the third stroboscopic light source 222 is a dark field light source. There are one or more third stroboscopic light sources 222 . The propagation directions of the detection lights emitted by the multiple dark field light sources are different.
所述控制装置还用于向第三频闪光源222和第一探测装置111发射第三频闪触发信号,所述第一频闪触发信号、第二频闪触发信号和第三频闪触发信号的触发时间交替排列。The control device is further used for transmitting a third stroboscopic trigger signal to the third stroboscopic trigger source 222 and the first detection device 111 , and the triggering times of the first stroboscopic trigger signal, the second stroboscopic trigger signal and the third stroboscopic trigger signal are arranged alternately.
图6是本发明的检测设备第五实施例的结构示意图。FIG. 6 is a schematic structural diagram of a fifth embodiment of a detection device according to the present invention.
请参考图6,本实施例与图5所示实施例的相同之处在此不多做赘述,不同之处包括:Please refer to FIG. 6 . The similarities between this embodiment and the embodiment shown in FIG. 5 are not described in detail here. The differences include:
本实施例中,所述检测设备还包括:第四频闪光源224,用于向待测物110发射第五探测光,所述第五探测光经待测物110形成第五信号光,所述第四频闪光源224与第一频闪光源121分别位于承载面两侧;第三探测装置211,用于探测所述第五信号光获取第三探测信息,所述第三探测装置211和第一探测装置111分别位于所述承载面两侧。In this embodiment, the detection equipment also includes: a fourth stroboscopic light source 224, which is used to emit a fifth detection light to the object to be detected 110, and the fifth detection light forms a fifth signal light through the object to be detected 110, and the fourth stroboscopic light source 224 and the first stroboscopic light source 121 are respectively located on both sides of the carrying surface; a third detection device 211, which is used to detect the fifth signal light to obtain third detection information, and the third detection device 211 and the first detection device 111 are respectively located on both sides of the carrying surface.
所述第一频闪光源121位于承载面远离移动装置的一侧,所述第四频闪光源224位于承载面靠近移动装置的一侧。所述第五探测光穿过所述第一空隙照射所述待测物110表面。The first stroboscopic light source 121 is located on the side of the carrying surface away from the mobile device, and the fourth stroboscopic light source 224 is located on the side of the carrying surface close to the mobile device. The fifth detection light passes through the first gap to illuminate the surface of the object to be detected 110 .
所述第一探测装置111和第二探测装置112在承载面的探测区域至少部分重叠。The first detection device 111 and the second detection device 112 at least partially overlap in the detection area of the carrying surface.
本实施例中,所述第一频闪光源121、第二频闪光源221、第三频闪光源222和第四频闪光源224交替向待测物110发射探测光。所述第一探测装置111在任意一个频闪光源发光时分别进行一次拍摄处理,获取相应的第一探测信息;所述第三探测装置211在任意一个频闪光源发光时分别进行一次拍摄处理,获取相应的第三探测信息。In this embodiment, the first stroboscopic light source 121, the second stroboscopic light source 221, the third stroboscopic light source 222 and the fourth stroboscopic light source 224 alternately emit detection light to the object to be detected 110. The first detection device 111 performs a shooting process when any stroboscopic light source emits light, and obtains corresponding first detection information; the third detection device 211 performs a shooting process when any stroboscopic light source emits light, and obtains corresponding third detection information.
本实施例中,所述控制装置还用于向第四频闪光源224和第一探测装置111发送第四频闪触发信号,所述第一频闪触发信号、第二频闪触发信号、第三频闪触发信号和第四频闪触发信号的触发时间交替排列。当不存在第三频闪光源222时,不发送所述第三频闪触发信号。In this embodiment, the control device is further used to send a fourth stroboscopic trigger signal to the fourth stroboscopic light source 224 and the first detection device 111, and the triggering times of the first stroboscopic trigger signal, the second stroboscopic trigger signal, the third stroboscopic trigger signal and the fourth stroboscopic trigger signal are arranged alternately. When the third stroboscopic light source 222 does not exist, the third stroboscopic trigger signal is not sent.
本实施例中,所述控制装置还用于向所述第二探测装置112发送第一频闪触发信号、第二频闪触发信号、第三频闪触发信号和第四频闪触发信号。In this embodiment, the control device is further used to send a first strobe trigger signal, a second strobe trigger signal, a third strobe trigger signal and a fourth strobe trigger signal to the second detection device 112 .
本实施例中,所有探测光的波长相同。具体的,所述第一探测光、第二探测光、第三探测光和第四探测光的波长相同。In this embodiment, the wavelengths of all the detection lights are the same. Specifically, the wavelengths of the first detection light, the second detection light, the third detection light and the fourth detection light are the same.
本实施例中,所述第一探测装置111还用于探测透过待测物110的第五信号光;所述第二探测装置112还用于探测透过待测物110的第一信号光、第二信号光和第三信号光。In this embodiment, the first detection device 111 is further used to detect the fifth signal light that passes through the object to be detected 110 ; the second detection device 112 is further used to detect the first signal light, the second signal light and the third signal light that pass through the object to be detected 110 .
本实施例中,所述第三探测装置211探测的第五信光为第五探测光经待测物散射形成的散射光。所述第四频闪光源224的个数为一个或多个。在其他实施例中,所述第三探测装置211探测的第五信光为第五探测光经待测物反射形成的反射光。In this embodiment, the fifth signal light detected by the third detection device 211 is the scattered light formed by the fifth detection light being scattered by the object to be detected. The number of the fourth stroboscopic light sources 224 is one or more. In other embodiments, the fifth signal light detected by the third detection device 211 is the reflected light formed by the fifth detection light being reflected by the object to be detected.
本实施例中,所述第一探测装置111获取第一探测信息的频率大于或等于第一频闪光源121、第二频闪光源221、第三频闪光源222和第四频闪光源224闪光频率之和。当所述检测设备不包括所述第三频闪光源222时,所述第一探测装置111获取第一探测信息的频率大于或等于第一频闪光源121、第二频闪光源221和第四频闪光源224闪光频率之和。In this embodiment, the frequency at which the first detection device 111 acquires the first detection information is greater than or equal to the sum of the flash frequencies of the first stroboscopic light source 121, the second stroboscopic light source 221, the third stroboscopic light source 222, and the fourth stroboscopic light source 224. When the detection device does not include the third stroboscopic light source 222, the frequency at which the first detection device 111 acquires the first detection information is greater than or equal to the sum of the flash frequencies of the first stroboscopic light source 121, the second stroboscopic light source 221, and the fourth stroboscopic light source 224.
在其他实施例中,所述检测设备可以不包括第三频闪光源222,则第一频闪光源121、第二频闪光源221和第四频闪光源224多次交替地向待测物110发射探测光。所述第一探测光、第二探测光和第四探测光的波长相同。所述第一探测装置111还用于探测第五信号光;所述第三探测装置211还用于探测第一信号光和第二信号光。In other embodiments, the detection device may not include the third stroboscopic light source 222, and the first stroboscopic light source 121, the second stroboscopic light source 221 and the fourth stroboscopic light source 224 repeatedly and alternately emit detection light to the object to be detected 110. The wavelengths of the first detection light, the second detection light and the fourth detection light are the same. The first detection device 111 is also used to detect the fifth signal light; the third detection device 211 is also used to detect the first signal light and the second signal light.
在另一实施中,所述第一探测光和第五探测光的波长不相同,所述的第二探测光与第五探测光的波长不同。所述第一探测装置111包括第一滤光组件,用于滤除第五信号光;所述第三探测装置211包括第二滤光组件,用于滤除第一信号光和第二信号光。当所述检测设备包括第三频闪光源222时,所述第二滤光组件还用于滤除第三信号光。In another implementation, the wavelengths of the first detection light and the fifth detection light are different, and the wavelengths of the second detection light and the fifth detection light are different. The first detection device 111 includes a first filter component for filtering out the fifth signal light; the third detection device 211 includes a second filter component for filtering out the first signal light and the second signal light. When the detection device includes a third stroboscopic light source 222, the second filter component is also used to filter out the third signal light.
所述第一滤光组件包括滤光片和光栅中的一种或多种组合;所述第二滤光组件包括滤光片和光栅中的一种或多种组合。The first optical filter component includes one or more combinations of an optical filter and a grating; the second optical filter component includes one or more combinations of an optical filter and a grating.
所述第一频闪光源121和第二频闪光源221多次交替地向待测物110发射探测光,第一探测装置111多次交替地获取第一信号光和第二信号光。当所述第四频闪光源224的个数为多个时,多个第四频闪光源224多次交替地向待测物110发射第五探测光。第四频闪光源224与第一频闪光源121、第二频闪光源221或第三频闪光源222可以同时发射探测光。The first stroboscopic light source 121 and the second stroboscopic light source 221 repeatedly and alternately emit detection light to the object under test 110, and the first detection device 111 repeatedly and alternately obtains the first signal light and the second signal light. When there are multiple fourth stroboscopic light sources 224, the multiple fourth stroboscopic light sources 224 repeatedly and alternately emit the fifth detection light to the object under test 110. The fourth stroboscopic light source 224 and the first stroboscopic light source 121, the second stroboscopic light source 221 or the third stroboscopic light source 222 can emit detection light simultaneously.
具体的,所述控制装置用于向第一频闪光源121和第一探测装置111发送第一频闪触发信号,向第二频闪光源221和第一探测装置111发送第二频闪触发信号,向第四频闪光源224和第二探测装置112发送第四频闪触发信号。当存在第三频闪光源222时,所述控制装置还用于向第三频闪光源222和第一探测装置111发送第三频闪触发信号。Specifically, the control device is used to send a first stroboscopic trigger signal to the first stroboscopic light source 121 and the first detection device 111, send a second stroboscopic trigger signal to the second stroboscopic light source 221 and the first detection device 111, and send a fourth stroboscopic trigger signal to the fourth stroboscopic light source 224 and the second detection device 112. When the third stroboscopic light source 222 exists, the control device is also used to send a third stroboscopic trigger signal to the third stroboscopic light source 222 and the first detection device 111.
所述处理系统根据第一频闪触发信号的触发时间以及第一探测装置111的第一探测信息获取第一图像;根据第二频闪触发信号的触发时间以及第一探测装置111的第一探测信息获取第二图像;根据第三频闪触发信号的触发时间以及第一探测装置111的第一探测信息获取第三图像;分别根据多个不同第四频闪触发信号的触发时间以及第三探测装置211的第三探测信息获取第四图像。The processing system acquires a first image according to the trigger time of the first stroboscopic trigger signal and the first detection information of the first detection device 111; acquires a second image according to the trigger time of the second stroboscopic trigger signal and the first detection information of the first detection device 111; acquires a third image according to the trigger time of the third stroboscopic trigger signal and the first detection information of the first detection device 111; and acquires a fourth image according to the trigger times of multiple different fourth stroboscopic trigger signals and the third detection information of the third detection device 211.
第一探测装置111获取探测信息的频率大于或等于第一频闪光源121、第二频闪光源221和第三频闪光源222之和;当不存在第三频闪光源222时,第一探测装置111获取探测信息的频率大于或等于第一频闪光源121和第二频闪光源221的闪光频率之和。所述第三探测装置211获取探测信息的频率大于或等于第四频闪光源224的闪光频率之间。The frequency of the first detection device 111 acquiring detection information is greater than or equal to the sum of the first stroboscopic light source 121, the second stroboscopic light source 221 and the third stroboscopic light source 222; when the third stroboscopic light source 222 does not exist, the frequency of the first detection device 111 acquiring detection information is greater than or equal to the sum of the flash frequencies of the first stroboscopic light source 121 and the second stroboscopic light source 221. The frequency of the third detection device 211 acquiring detection information is greater than or equal to the flash frequency of the fourth stroboscopic light source 224.
本实施例中,所述第一探测装置111获取探测信息的频率即第一探测装置111拍摄图像的频率;所述第三探测装置211获取探测信息的频率即第三探测装置211拍摄图像的频率。In this embodiment, the frequency at which the first detection device 111 acquires detection information is the frequency at which the first detection device 111 takes images; the frequency at which the third detection device 211 acquires detection information is the frequency at which the third detection device 211 takes images.
第四频闪触发信号的触发时间可以与第一频闪触发信号、第二频闪触发信号和第三频闪触发信号的触发时间部分或全部重叠,能够同时获取不同检测通道的探测信息,能够提高检测速度。同时,第一探测装置111拍摄图像的频率可以较低,从而能够增加拍摄图像的曝光时间,进而增加图像的清晰度,提高检测精度。The triggering time of the fourth stroboscopic trigger signal can partially or completely overlap with the triggering time of the first stroboscopic trigger signal, the second stroboscopic trigger signal and the third stroboscopic trigger signal, so that the detection information of different detection channels can be obtained at the same time, and the detection speed can be improved. At the same time, the frequency of the first detection device 111 taking images can be low, so that the exposure time of the taken images can be increased, thereby increasing the clarity of the image and improving the detection accuracy.
图7是本发明的检测方法一实施例各步骤的流程图。FIG. 7 is a flow chart of the steps of an embodiment of a detection method of the present invention.
请参考图7,本发明实施例还提供一种检测方法,包括:Referring to FIG. 7 , an embodiment of the present invention further provides a detection method, including:
步骤S01,将待测物放置于检测设备的承载面。Step S01, placing the object to be tested on the carrying surface of the testing equipment.
步骤S02,通过第一频闪光源和第二频闪光源多次交替地向所述待测物发射第一探测光和第二探测光,所述第一探测光经待测物形成第一信号光,所述第二探测光经待测物形成第二信号光;Step S02, emitting a first detection light and a second detection light to the object to be tested alternately multiple times by a first stroboscopic light source and a second stroboscopic light source, wherein the first detection light forms a first signal light after passing through the object to be tested, and the second detection light forms a second signal light after passing through the object to be tested;
步骤S03,通过第一探测装置多次交替地探测所述第一信号光和第二信号光,获取第一探测信息。Step S03: using a first detection device to detect the first signal light and the second signal light alternately for multiple times to obtain first detection information.
下面结合附图对检测方法进行详细说明。The detection method is described in detail below with reference to the accompanying drawings.
结合参考图4,提供待测物110,所述待测物110包括待测区;提供检测设备。With reference to FIG. 4 , a test object 110 is provided, wherein the test object 110 includes a test area; and a detection device is provided.
本实施例中,所述待测物110为曲面或平面玻璃。具体的,所述待测物110为手机壳。所述待测物110包括相对的第一面和第二面,所述第一面为凹面,所述第二面为凸面。所述第二面包括平面和与平面两端连接的弧面。In this embodiment, the object to be tested 110 is a curved or flat glass. Specifically, the object to be tested 110 is a mobile phone case. The object to be tested 110 includes a first surface and a second surface opposite to each other, the first surface is a concave surface, and the second surface is a convex surface. The second surface includes a plane and a curved surface connected to both ends of the plane.
继续结合参考图4,执行步骤S01,将待测物110放置于检测设备的承载面。Continuing with reference to FIG. 4 , step S01 is performed to place the object to be tested 110 on the carrying surface of the testing device.
本实施例中,将所述待测物110放置于所述传送装置的承载面包括:使所述第二面与所述承载面接触。所述第二面与所述承载面接触能够使待测物110的平面与承载面接触,能够使待测物110稳定,减少待测物110在检测过程中的偏移。In this embodiment, placing the object to be tested 110 on the carrying surface of the conveying device includes: making the second surface contact with the carrying surface. The contact between the second surface and the carrying surface can make the plane of the object to be tested 110 contact with the carrying surface, can stabilize the object to be tested 110, and reduce the deviation of the object to be tested 110 during the detection process.
继续参考图4,将待测物110放置于所述承载面之后,使待测物110相对于所述第一探测装置111、第一频闪光源121和第二频闪光源122移动。4 , after the object to be tested 110 is placed on the carrying surface, the object to be tested 110 is moved relative to the first detection device 111 , the first stroboscopic light source 121 and the second stroboscopic light source 122 .
本实施例中,所述承载装置包括移动装置,所述移动装置用于带动待测物110沿传送方向移动。在其他实施例中,可以使移动装置带动第一探测装置、第一频闪光源和第二频闪光源移动。In this embodiment, the carrying device includes a moving device, and the moving device is used to drive the object to be detected 110 to move along the conveying direction. In other embodiments, the moving device can drive the first detection device, the first stroboscopic light source, and the second stroboscopic light source to move.
本实施例中,所述传送装置带动所述待测物110沿传送方向移动。当所述待测物110到达所述第二空隙时,所述检测方法还包括:使所述第一照明光源131向待测物110发射第四探测光,所述第四探测光经待测物110反射形成第四信号光;通过所述第三探测装置211对所述第四信号光进行探测,获取第二探测信息。In this embodiment, the transmission device drives the object to be tested 110 to move along the transmission direction. When the object to be tested 110 reaches the second gap, the detection method further includes: causing the first illumination light source 131 to emit a fourth detection light to the object to be tested 110, the fourth detection light is reflected by the object to be tested 110 to form a fourth signal light; and detecting the fourth signal light by the third detection device 211 to obtain second detection information.
由于本实施例中,所述第一照明光源131的发光面为弧形,且至少部分第一照明光源131及所述第二探测装置112位于承载面靠近第二空隙的一侧,所述第一照明光源131的发光面朝背离承载面的方向凹陷,经所述平面和弧面反射形成的第四信号光均能够被第二探测装置112探测,从而能够对待测物110的凸面进行明场检测。In this embodiment, the light-emitting surface of the first illumination light source 131 is arc-shaped, and at least part of the first illumination light source 131 and the second detection device 112 are located on the side of the bearing surface close to the second gap, and the light-emitting surface of the first illumination light source 131 is recessed in the direction away from the bearing surface, and the fourth signal light formed by reflection from the plane and the arc surface can be detected by the second detection device 112, so that bright field detection can be performed on the convex surface of the object to be measured 110.
所述第二探测装置112的探测区域沿垂直传送方向上贯穿待测区,因此当待测物110自所述第二空隙穿过之后,所述检测设备能够对整个探测区第二面进行检测。The detection area of the second detection device 112 passes through the detection area along the vertical transmission direction. Therefore, after the object to be detected 110 passes through the second gap, the detection device can detect the entire second surface of the detection area.
在对所述待测物110进行检测的过程中,所述待测物110相对于第一照明光源131和第二探测装置112移动。During the process of detecting the object to be detected 110 , the object to be detected 110 moves relative to the first illumination light source 131 and the second detection device 112 .
当所述待测物110到达所述第三空隙时,所述检测方法还包括:使所述第二照明光源141向所述待测物110发射第六探测光,所述第六探测光经待测物110形成第六信号光;通过所述第四探测装置113对所述第六信号光进行探测,获取第四探测信息;使所述第三照明光源142向所述待测物110发射第七探测光,所述第七探测光经待测物110形成第七信号光;通过所述第五探测装置114对所述第七信号光进行探测,获取第五探测信息。When the object to be measured 110 reaches the third gap, the detection method further includes: enabling the second illumination light source 141 to emit a sixth detection light to the object to be measured 110, and the sixth detection light forms a sixth signal light through the object to be measured 110; detecting the sixth signal light by the fourth detection device 113 to obtain fourth detection information; enabling the third illumination light source 142 to emit a seventh detection light to the object to be measured 110, and the seventh detection light forms a seventh signal light through the object to be measured 110; detecting the seventh signal light by the fifth detection device 114 to obtain fifth detection information.
本实施例中,所述第六信号光为第五探测光经待测物110第一面散射形成的散射光;所述第七信号光为第七探测光经待测物110第二面散射形成的散射光。当所述待测物110自所述第三空隙穿过之后,能够实现对待测区第一面和第二面的暗场检测。In this embodiment, the sixth signal light is the scattered light formed by the fifth detection light being scattered by the first surface of the object to be tested 110; the seventh signal light is the scattered light formed by the seventh detection light being scattered by the second surface of the object to be tested 110. After the object to be tested 110 passes through the third gap, dark field detection of the first surface and the second surface of the test area can be achieved.
继续结合参考图4,执行步骤S02,通过第一频闪光源121和第二频闪光源122多次交替地向所述待测物110发射第一探测光和第二探测光,所述第一探测光经待测物110形成第一信号光,所述第二探测光经待测物110形成第二信号光;执行步骤S03,通过第一探测装置111多次交替地探测所述第一信号光和第二信号光,获取第一探测信息。Continuing with reference to FIG4 , step S02 is performed, wherein the first stroboscopic light source 121 and the second stroboscopic light source 122 are used to alternately emit the first detection light and the second detection light to the object under test 110 for multiple times, wherein the first detection light forms a first signal light through the object under test 110, and the second detection light forms a second signal light through the object under test 110; step S03 is performed, wherein the first detection device 111 is used to alternately detect the first signal light and the second signal light for multiple times to obtain first detection information.
所述检测设备包括第一频闪光源121和第二频闪光源122。由于所述第一频闪光源121和第二频闪光源122被配置为多次交替地向所述待测物110发射第一探测光和第二探测光,第一探测装置111被配置为多次交替地探测所述第一信号光和第二信号光,则能够根据探测时间将第一探测装置111根据第一信号光和第二信号光获取的第一探测信息分离,获取不同通道的第一探测信息。由于时间不会有重叠,从而能够提高检测精度。同时,所述检测设备能够通过一个第一探测装置111获取第一信号光和第二信号光的第一探测信息,从而能够简化检测设备的结构,提高集成度,并能够降低成本。The detection device includes a first stroboscopic light source 121 and a second stroboscopic light source 122. Since the first stroboscopic light source 121 and the second stroboscopic light source 122 are configured to emit the first detection light and the second detection light to the object to be detected 110 alternately for multiple times, and the first detection device 111 is configured to detect the first signal light and the second signal light alternately for multiple times, the first detection information obtained by the first detection device 111 according to the first signal light and the second signal light can be separated according to the detection time, and the first detection information of different channels can be obtained. Since there is no overlap in time, the detection accuracy can be improved. At the same time, the detection device can obtain the first detection information of the first signal light and the second signal light through a first detection device 111, so that the structure of the detection device can be simplified, the integration can be improved, and the cost can be reduced.
当所述待测物110到达第一空隙时,向所述待测物110发射第一探测光和第二探测光。When the object to be detected 110 reaches the first gap, the first detection light and the second detection light are emitted to the object to be detected 110 .
通过第一频闪光源121和第二频闪光源122多次交替地向所述待测物110发射第一探测光和第二探测光包括:通过控制装置向第一频闪光源121和第一探测装置111发送第一频闪触发信号,向第二频闪光源122和第二探测装置112发送第二频闪触发信号。Multiple times of alternately emitting the first detection light and the second detection light to the object under test 110 by the first stroboscopic light source 121 and the second stroboscopic light source 122 include: sending a first stroboscopic trigger signal to the first stroboscopic light source 121 and the first detection device 111, and sending a second stroboscopic trigger signal to the second stroboscopic light source 122 and the second detection device 112 by the control device.
本实施例中,所述第一信号光为第一探测光经第一面反射形成的反射光,所述第一频闪光源121和第一探测装置111能够实现对第一面的明场检测。所述第二频闪光源122为背光源,所述第二频闪光源122和第一探测装置111能够实现对待测物110的背光检测。In this embodiment, the first signal light is the reflected light formed by the first detection light reflected by the first surface, and the first stroboscopic light source 121 and the first detection device 111 can realize bright field detection of the first surface. The second stroboscopic light source 122 is a backlight source, and the second stroboscopic light source 122 and the first detection device 111 can realize backlight detection of the object to be detected 110.
所述检测方法还包括通过处理系统根据第一探测装置111不同时刻的第一探测信息,分别提取第一信号光和第二信号光的第一探测信息,形成第一图像和第二图像。The detection method further includes extracting first detection information of the first signal light and the second signal light respectively according to first detection information of the first detection device 111 at different times by a processing system to form a first image and a second image.
具体的,形成第一图像和第二图像包括:根据所述第一频闪触发信号的触发时间获取第一信号光的第一探测信息形成第一图像;根据所述第二频闪触发信号的触发时间获取第二信号光的第一探测信息形成第二图像。Specifically, forming the first image and the second image includes: acquiring first detection information of the first signal light according to the trigger time of the first stroboscopic trigger signal to form the first image; acquiring first detection information of the second signal light according to the trigger time of the second stroboscopic trigger signal to form the second image.
具体的,形成第一图像包括:根据第一频闪触发信号的触发时间获取第一探测装置111的第一探测信息,并进行拼接形成第一图像;形成第二图像包括:根据第二频闪触发信号的触发时间获取第一探测装置111的第一探测信息,并进行拼接形成第二图像。Specifically, forming the first image includes: acquiring the first detection information of the first detection device 111 according to the trigger time of the first stroboscopic trigger signal, and splicing it to form the first image; forming the second image includes: acquiring the first detection information of the first detection device 111 according to the trigger time of the second stroboscopic trigger signal, and splicing it to form the second image.
结合参考图6,本发明实施例还提供另一种检测方法。With reference to FIG6 , another detection method is also provided in the embodiment of the present invention.
本实施例的检测方法与上一实施例的相同之处在此不做赘述,不同之处包括:The similarities between the detection method of this embodiment and the previous embodiment are not described in detail here, and the differences include:
多次交替地向所述待测物发射第一探测光和第二探测光包括:使所述第一频闪光源121、第二频闪光源221和第四频闪光源224多次交替地向待测物110发射探测光;Alternatingly emitting the first detection light and the second detection light to the object to be tested for multiple times includes: causing the first stroboscopic light source 121, the second stroboscopic light source 221, and the fourth stroboscopic light source 224 to alternately emit the detection light to the object to be tested 110 for multiple times;
获取第一探测信息包括:通过第一探测装置111多次交替地探测第一信号光、第二信号光、第三信号光和第五信号光。当不存在第三频闪光源时,不探测第三信号光。Acquiring the first detection information includes: alternately detecting the first signal light, the second signal light, the third signal light and the fifth signal light multiple times by the first detection device 111. When the third stroboscopic light source does not exist, the third signal light is not detected.
所述检测方法还包括:通过第三探测装置211多次交替地探测第一信号光、第二信号光、第三信号光和第五信号光,获取第三探测信息。当不存在第三频闪光源时,不探测第三信号光。The detection method further includes: acquiring third detection information by alternately detecting the first signal light, the second signal light, the third signal light and the fifth signal light multiple times by the third detection device 211. When the third stroboscopic light source does not exist, the third signal light is not detected.
所述检测方法还包括:向所述第三探测装置211发送第一频闪触发信号、第二频闪触发信号和第三频闪触发信号,使所述第三探测装置211根据第一频闪触发信号、第二频闪触发信号和第三频闪触发信号获取第四探测信息。当不存在第三频闪光源222时,不发送第三频闪触发信号。The detection method further includes: sending a first stroboscopic trigger signal, a second stroboscopic trigger signal, and a third stroboscopic trigger signal to the third detection device 211, so that the third detection device 211 obtains fourth detection information according to the first stroboscopic trigger signal, the second stroboscopic trigger signal, and the third stroboscopic trigger signal. When the third stroboscopic light source 222 does not exist, the third stroboscopic trigger signal is not sent.
本实施例中,所述检测方法还包括:向所述第三探测装置211和第四频闪光源224发送第四频闪触发信号,使所述第三探测装置211根据第四频闪触发信号获取第三探测信息。In this embodiment, the detection method further includes: sending a fourth stroboscopic trigger signal to the third detection device 211 and the fourth stroboscopic light source 224, so that the third detection device 211 obtains third detection information according to the fourth stroboscopic trigger signal.
本实施例中,所述检测方法还包括:向所述第一探测装置111发送第四频闪触发信号;向所述第三探测装置211发送第一频闪触发信号、第二频闪触发信号和第三频闪触发信号。当不存在第三频闪光源222时,不发送第三频闪触发信号。In this embodiment, the detection method further includes: sending a fourth stroboscopic trigger signal to the first detection device 111; sending a first stroboscopic trigger signal, a second stroboscopic trigger signal and a third stroboscopic trigger signal to the third detection device 211. When the third stroboscopic light source 222 does not exist, the third stroboscopic trigger signal is not sent.
第一频闪触发信号、第二频闪触发信号、第三频闪触发信号和第四频闪触发信号的触发时间依次交替排列。第一频闪光源121、第二频闪光源221、第三频闪光源222和第四频闪光源224依次交替地向待测物110发射探测光,且每次光源发射探测光时,第一探测装置111和第三探测装置211均对信号光进行探测,获取第一探测信息和第三探测信息。The triggering times of the first stroboscopic trigger signal, the second stroboscopic trigger signal, the third stroboscopic trigger signal and the fourth stroboscopic trigger signal are arranged alternately in sequence. The first stroboscopic light source 121, the second stroboscopic light source 221, the third stroboscopic light source 222 and the fourth stroboscopic light source 224 emit detection light to the object to be measured 110 alternately in sequence, and each time the light source emits detection light, the first detection device 111 and the third detection device 211 detect the signal light to obtain the first detection information and the third detection information.
本实施例中,在通过第一探测装置111和第三探测装置211对待测物110进行检测的过程中,所述待测物110相对第一探测装置111、第三探测装置211、第一频闪光源121、第二频闪光源221和第四频闪光源224移动。In this embodiment, during the detection of the object 110 by the first detection device 111 and the third detection device 211 , the object 110 moves relative to the first detection device 111 , the third detection device 211 , the first stroboscopic light source 121 , the second stroboscopic light source 221 and the fourth stroboscopic light source 224 .
所述第一探测装置111和第三探测装置211的探测区域重叠。The detection areas of the first detection device 111 and the third detection device 211 overlap.
第一频闪光源121、第二频闪光源221、第三频闪光源222和第四频闪光源224依次交替地向待测物110发射探测光至第一探测装置111获取到整个待测区第一面的探测信息。The first stroboscopic light source 121 , the second stroboscopic light source 221 , the third stroboscopic light source 222 and the fourth stroboscopic light source 224 sequentially and alternately emit detection light to the object to be detected 110 to the first detection device 111 to obtain detection information of the first surface of the entire test area.
在其他实施例中,所述第一频闪触发信号、第二频闪触发信号和第三频闪触发信号仅向第一探测装置111发送;所述第四频闪触发信号仅向第三探测装置211发送。所述第四频闪触发信号的触发时间可以与第一频闪触发信号、第二频闪触发信号或第三频闪触发信号部分或全部重叠。即第四频闪光源224可以与第一频闪光源121、第二频闪光源221或第三频闪光源222发射探测光的时间部分或全部重叠。当第四频闪光源224为多个时,多个第四频闪光源224多次交替向待测物110发射探测光。In other embodiments, the first strobe trigger signal, the second strobe trigger signal and the third strobe trigger signal are only sent to the first detection device 111; the fourth strobe trigger signal is only sent to the third detection device 211. The triggering time of the fourth strobe trigger signal may partially or completely overlap with the first strobe trigger signal, the second strobe trigger signal or the third strobe trigger signal. That is, the fourth strobe light source 224 may partially or completely overlap with the time when the first strobe light source 121, the second strobe light source 221 or the third strobe light source 222 emits detection light. When there are multiple fourth strobe light sources 224, the multiple fourth strobe light sources 224 alternately emit detection light to the object to be measured 110 multiple times.
所述第一滤光组件能够滤除第五信号光,提高检测精度。所述第二滤光组件能够滤除第一信号光、第二信号光和第三信号光,提高检测精度。The first filter component can filter out the fifth signal light, thereby improving detection accuracy. The second filter component can filter out the first signal light, the second signal light and the third signal light, thereby improving detection accuracy.
本实施例中,可以在第一空隙、第二空隙和第三空隙处对不同的待测物同时进行检测。In this embodiment, different objects to be detected can be detected at the first gap, the second gap, and the third gap at the same time.
虽然本发明披露如上,但本发明并非限定于此。任何本领域技术人员,在不脱离本发明的精神和范围内,均可作各种更动与修改,因此本发明的保护范围应当以权利要求所限定的范围为准。Although the present invention is disclosed as above, the present invention is not limited thereto. Any person skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the scope defined by the claims.
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