CN111400851A - Node layout method and system - Google Patents
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- CN111400851A CN111400851A CN201811634943.4A CN201811634943A CN111400851A CN 111400851 A CN111400851 A CN 111400851A CN 201811634943 A CN201811634943 A CN 201811634943A CN 111400851 A CN111400851 A CN 111400851A
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Abstract
The invention provides a node layout method and a node layout system. The node layout method comprises the following steps: receiving the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the deflection angle of the measuring line and the deflection angle between the first measuring node and the known offset node; measuring the distance between a known offset node and an unknown offset node and the deflection angle between the known offset node and the unknown offset node, and respectively inputting the data into an offset model and an offset angle model to obtain the offset of the unknown offset node and each second measurement node in the vertical direction and the deflection angle of the unknown offset node and each second measurement node; when the offset is smaller than or equal to the offset threshold value and the offset angle is smaller than or equal to the offset angle threshold value, calculating the coordinates of the unknown offset nodes, otherwise, rearranging the unknown offset nodes; and outputting the pile number of the second measurement node corresponding to the unknown offset node and the coordinates of the unknown offset node, so that construction links can be reduced, and the construction efficiency is improved.
Description
Technical Field
The invention relates to the field of exploration, in particular to a node layout method and a node layout system.
Background
At present, due to the popularization of green exploration, the node unit is increasingly applied to the petroleum exploration industry with the technical advantages of low field labor intensity, low power consumption, environmental friendliness and the like, but the node unit also has certain limitation in the field production process: under complex terrains such as jungles, the node units often cannot be accurately placed at the positions of pile flags. At the moment, the node unit needs to match the pile number by means of the GPS positioning coordinate recorded by the node unit, the node unit may not receive the GPS positioning coordinate in a dense forest area, so that the node unit cannot be constructed, and a wired instrument cannot efficiently and quickly pass through a complex surface area. The node layout mode can generate positioning deviation, the condition of wrong pile number matching reduces the construction efficiency and influences the construction progress.
Disclosure of Invention
The embodiment of the invention mainly aims to provide a node layout method and a node layout system, so that nodes are accurately positioned and matched with pile numbers, construction links are reduced, and construction efficiency is improved.
In order to achieve the above object, an embodiment of the present invention provides a node layout method, including:
receiving the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the deflection angle of the measuring line and the deflection angle of the first measuring node and the known offset node; the first measuring node and each second measuring node are positioned on the measuring line;
measuring the distance between a known offset node and an unknown offset node and the deflection angle of the known offset node and the unknown offset node;
creating an offset model and an offset angle model;
inputting the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the distance between the known offset node and the unknown offset node, the deflection angle of the measuring line, the deflection angle between the first measuring node and the known offset node, and the deflection angle between the known offset node and the unknown offset node into an offset model to obtain the offset of the unknown offset node and each second measuring node in the vertical direction;
inputting the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the distance between the known offset node and the unknown offset node, the deflection angle of the measuring line, the deflection angle between the first measuring node and the known offset node, and the deflection angle between the known offset node and the unknown offset node into a deflection angle model to obtain the deflection angle between the unknown offset node and each second measuring node;
judging whether the offset of the unknown offset node and each second measurement node in the vertical direction is smaller than or equal to an offset threshold value or not, and judging whether the offset angle of the unknown offset node and each second measurement node is smaller than or equal to an offset angle threshold value or not;
when the offset of the unknown offset node and one of the second measurement nodes in the vertical direction is smaller than or equal to the offset threshold value, and the offset angle of the unknown offset node and the second measurement node is smaller than or equal to the offset angle threshold value, inputting the coordinate of the known offset node, the distance between the known offset node and the unknown offset node, and the offset angle of the known offset node and the unknown offset node into a preset coordinate model to obtain the coordinate of the unknown offset node, otherwise, laying the unknown offset node again until the offset of the unknown offset node and one of the second measurement nodes in the vertical direction is smaller than or equal to the offset threshold value, and the offset angle of the unknown offset node and the second measurement node is smaller than or equal to the offset angle threshold value;
and outputting the stake number of the second measurement node corresponding to the unknown offset node and the coordinates of the unknown offset node.
An embodiment of the present invention further provides a node layout system, including:
the receiving unit is used for receiving the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the deflection angle of the measuring line and the deflection angle of the first measuring node and the known offset node; the first measuring node and each second measuring node are positioned on the measuring line;
the measuring unit is used for measuring the distance between the known offset node and the unknown offset node and the deflection angle between the known offset node and the unknown offset node;
a model creating unit for creating an offset model and an offset angle model;
the offset unit is used for inputting the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the distance between the known offset node and the unknown offset node, the deflection angle of the measuring line, the deflection angle of the first measuring node and the known offset node, and the deflection angle of the known offset node and the unknown offset node into the offset model to obtain the offset of the unknown offset node and each second measuring node in the vertical direction;
the offset angle unit is used for inputting the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the distance between the known offset node and the unknown offset node, the offset angle of the measuring line, the offset angle between the first measuring node and the known offset node and the offset angle between the known offset node and the unknown offset node into an offset angle model to obtain the offset angle between the unknown offset node and each second measuring node;
the judging unit is used for judging whether the offset of the unknown offset node and each second measuring node in the vertical direction is smaller than or equal to an offset threshold value or not and judging whether the offset angle of the unknown offset node and each second measuring node is smaller than or equal to an offset angle threshold value or not;
the coordinate unit of the unknown offset node is used for inputting the coordinates of the known offset node, the distance between the known offset node and the unknown offset node and the deflection angle between the known offset node and the unknown offset node into a preset coordinate model to obtain the coordinates of the unknown offset node;
the laying unit is used for laying unknown offset nodes again;
and the output unit is used for outputting the stake number of the second measurement node corresponding to the unknown offset node and the coordinates of the unknown offset node.
The embodiment of the present invention further provides a computer device, which includes a memory, a processor, and a computer program stored in the memory and capable of running on the processor, and when the processor executes the computer program, the following steps are implemented:
receiving the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the deflection angle of the measuring line and the deflection angle of the first measuring node and the known offset node; the first measuring node and each second measuring node are positioned on the measuring line;
measuring the distance between a known offset node and an unknown offset node and the deflection angle of the known offset node and the unknown offset node;
creating an offset model and an offset angle model;
inputting the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the distance between the known offset node and the unknown offset node, the deflection angle of the measuring line, the deflection angle between the first measuring node and the known offset node, and the deflection angle between the known offset node and the unknown offset node into an offset model to obtain the offset of the unknown offset node and each second measuring node in the vertical direction;
inputting the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the distance between the known offset node and the unknown offset node, the deflection angle of the measuring line, the deflection angle between the first measuring node and the known offset node, and the deflection angle between the known offset node and the unknown offset node into a deflection angle model to obtain the deflection angle between the unknown offset node and each second measuring node;
judging whether the offset of the unknown offset node and each second measurement node in the vertical direction is smaller than or equal to an offset threshold value or not, and judging whether the offset angle of the unknown offset node and each second measurement node is smaller than or equal to an offset angle threshold value or not;
when the offset of the unknown offset node and one of the second measurement nodes in the vertical direction is smaller than or equal to the offset threshold value, and the offset angle of the unknown offset node and the second measurement node is smaller than or equal to the offset angle threshold value, inputting the coordinate of the known offset node, the distance between the known offset node and the unknown offset node, and the offset angle of the known offset node and the unknown offset node into a preset coordinate model to obtain the coordinate of the unknown offset node, otherwise, laying the unknown offset node again until the offset of the unknown offset node and one of the second measurement nodes in the vertical direction is smaller than or equal to the offset threshold value, and the offset angle of the unknown offset node and the second measurement node is smaller than or equal to the offset angle threshold value;
and outputting the stake number of the second measurement node corresponding to the unknown offset node and the coordinates of the unknown offset node.
An embodiment of the present invention further provides a computer-readable storage medium, on which a computer program is stored, where the computer program, when executed by a processor, implements the following steps:
receiving the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the deflection angle of the measuring line and the deflection angle of the first measuring node and the known offset node; the first measuring node and each second measuring node are positioned on the measuring line;
measuring the distance between a known offset node and an unknown offset node and the deflection angle of the known offset node and the unknown offset node;
creating an offset model and an offset angle model;
inputting the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the distance between the known offset node and the unknown offset node, the deflection angle of the measuring line, the deflection angle between the first measuring node and the known offset node, and the deflection angle between the known offset node and the unknown offset node into an offset model to obtain the offset of the unknown offset node and each second measuring node in the vertical direction;
inputting the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the distance between the known offset node and the unknown offset node, the deflection angle of the measuring line, the deflection angle between the first measuring node and the known offset node, and the deflection angle between the known offset node and the unknown offset node into a deflection angle model to obtain the deflection angle between the unknown offset node and each second measuring node;
judging whether the offset of the unknown offset node and each second measurement node in the vertical direction is smaller than or equal to an offset threshold value or not, and judging whether the offset angle of the unknown offset node and each second measurement node is smaller than or equal to an offset angle threshold value or not;
when the offset of the unknown offset node and one of the second measurement nodes in the vertical direction is smaller than or equal to the offset threshold value, and the offset angle of the unknown offset node and the second measurement node is smaller than or equal to the offset angle threshold value, inputting the coordinate of the known offset node, the distance between the known offset node and the unknown offset node, and the offset angle of the known offset node and the unknown offset node into a preset coordinate model to obtain the coordinate of the unknown offset node, otherwise, laying the unknown offset node again until the offset of the unknown offset node and one of the second measurement nodes in the vertical direction is smaller than or equal to the offset threshold value, and the offset angle of the unknown offset node and the second measurement node is smaller than or equal to the offset angle threshold value;
and outputting the stake number of the second measurement node corresponding to the unknown offset node and the coordinates of the unknown offset node.
The node layout method and the system of the embodiment of the invention firstly receive the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the deflection angle of the measuring line, and the deflection angle between the first measuring node and the known offset node, measure the distance between the known offset node and the unknown offset node, and the deflection angle between the known offset node and the unknown offset node, and then respectively input the data into the offset model and the offset angle model to respectively obtain the offset of the unknown offset node and each second measuring node in the vertical direction and the deflection angle of the unknown offset node and each second measuring node; when the offset is smaller than or equal to the offset threshold value, and the offset angle is smaller than or equal to the offset angle threshold value, inputting the coordinates of the known offset node, the distance between the known offset node and the unknown offset node, and the offset angle between the known offset node and the unknown offset node into a preset coordinate model to obtain the coordinates of the unknown offset node, otherwise, rearranging the unknown offset node until the offset is smaller than or equal to the offset threshold value, and the offset angle is smaller than or equal to the offset angle threshold value, and finally outputting the pile number of the second measurement node corresponding to the unknown offset node and the coordinates of the unknown offset node.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained based on these drawings without creative efforts.
FIG. 1 is a flowchart of a node layout method according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of one of the node placement models in an embodiment of the invention;
FIG. 3 is a schematic diagram of one of the node placement models in another embodiment of the present invention;
FIG. 4 is a block diagram of a reflection time correction system for seismic traces in an embodiment of the invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In view of the fact that positioning deviation and pile number matching errors may occur in the prior art, construction efficiency is reduced, and construction progress is affected, the embodiment of the invention provides a node layout method, so that nodes are accurately positioned and matched with pile numbers, construction links are reduced, and construction efficiency is improved. The present invention will be described in detail below with reference to the accompanying drawings.
Fig. 1 is a flowchart of a node layout method in an embodiment of the present invention. As shown in fig. 1, the node layout method includes:
s101: receiving the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the deflection angle of the measuring line and the deflection angle of the first measuring node and the known offset node; and the first measuring node and each second measuring node are positioned on the measuring line.
S102: and measuring the distance between the known offset node and the unknown offset node and the drift angle of the known offset node and the unknown offset node.
The distance between the known offset node and the unknown offset node can be accurately measured by adopting a laser ranging unit in the unknown offset node.
S103: an offset model and an offset angle model are created.
S104: and inputting the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the distance between the known offset node and the unknown offset node, the deflection angle of the measuring line, the deflection angle between the first measuring node and the known offset node, and the deflection angle between the known offset node and the unknown offset node into an offset model to obtain the offset of the unknown offset node and each second measuring node in the vertical direction.
S105: and inputting the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the distance between the known offset node and the unknown offset node, the deflection angle of the measuring line, the deflection angle between the first measuring node and the known offset node and the deflection angle between the known offset node and the unknown offset node into a deflection angle model to obtain the deflection angle between the unknown offset node and each second measuring node.
S106: and judging whether the offset of the unknown offset node and each second measurement node in the vertical direction is less than or equal to an offset threshold value or not, and judging whether the offset angle of the unknown offset node and each second measurement node is less than or equal to an offset angle threshold value or not.
S107: when the offset of the unknown offset node and one of the second measurement nodes in the vertical direction is smaller than or equal to the offset threshold value, and the offset angle of the unknown offset node and the second measurement node is smaller than or equal to the offset angle threshold value, inputting the coordinate of the known offset node, the distance between the known offset node and the unknown offset node, and the offset angle of the known offset node and the unknown offset node into a preset coordinate model to obtain the coordinate of the unknown offset node, otherwise, laying the unknown offset node again until the offset of the unknown offset node and one of the second measurement nodes in the vertical direction is smaller than or equal to the offset threshold value, and the offset angle of the unknown offset node and the second measurement node is smaller than or equal to the offset angle threshold value.
S108: and outputting the stake number of the second measurement node corresponding to the unknown offset node and the coordinates of the unknown offset node.
The execution subject of the node layout method shown in fig. 1 may be a computer. As can be seen from the process shown in fig. 1, the node layout method according to the embodiment of the present invention receives a distance between the first measurement node and each second measurement node, a distance between the known offset node and the first measurement node, a deflection angle of a measurement line, and a deflection angle between the first measurement node and the known offset node, measures a distance between the known offset node and the unknown offset node, and a deflection angle between the known offset node and the unknown offset node, and inputs the data into the offset model and the offset angle model, respectively, to obtain an offset between the unknown offset node and each second measurement node in the vertical direction and a deflection angle between the unknown offset node and each second measurement node; when the offset is smaller than or equal to the offset threshold value, and the offset angle is smaller than or equal to the offset angle threshold value, inputting the coordinates of the known offset node, the distance between the known offset node and the unknown offset node, and the offset angle between the known offset node and the unknown offset node into a preset coordinate model to obtain the coordinates of the unknown offset node, otherwise, rearranging the unknown offset node until the offset is smaller than or equal to the offset threshold value, and the offset angle is smaller than or equal to the offset angle threshold value, and finally outputting the pile number of the second measurement node corresponding to the unknown offset node and the coordinates of the unknown offset node.
In one embodiment, the offset of the unknown offset node and the second measurement node in the vertical direction is obtained through the following offset model:
h is the offset of the unknown offset node and the second measurement node in the vertical direction, dcIs the distance between the first and second measurement nodes, d0For the distance between the known offset node and the first measurement node, d1For the distance between the known offset node and the unknown offset node, α is the declination of the line, β is the declination of the first measurement node from the known offset node, and θ is the declination of the known offset node from the unknown offset node.
In one embodiment, the offset angle between the unknown offset node and the second measurement node is obtained by the following offset angle model:
η is the offset angle between the unknown offset node and the second measurement node, dcIs the distance between the first and second measurement nodes, d0For the distance between the known offset node and the first measurement node, d1For the distance between the known offset node and the unknown offset node, α is the declination of the line, β is the declination of the first measurement node from the known offset node, and θ is the declination of the known offset node from the unknown offset node.
In one embodiment, the coordinates of the unknown offset node are obtained by the following coordinate model:
wherein (x, y) is the coordinate of the unknown offset node, x0Is the abscissa, y, of a known offset node0As ordinate of known offset node, d1And theta is the distance between the known offset node and the unknown offset node, and theta is the deflection angle of the known offset node and the unknown offset node.
FIG. 2 is a diagram of one of the node placement models according to an embodiment of the present invention. As shown in FIG. 2, A is a first measurement node, B is one of the second measurement nodes (the other second measurement nodes are on the measuring line, not shown in FIG. 2), A0For a known offset node, B0As a node of unknown offset, dcTrack pitch, i.e. the distance between AB (the distance between the first and second measuring nodes), d0Is A0Distance between A (distance between the known offset node and the first measurement node), d1Is A0B0Distance between (distance between known offset node and unknown offset node), α is deviation angle of line, β is A and A0Is a (deviation angle of the first measured node from the known deviation node) and theta is A0And B0Angle of (off angle of known offset node from unknown offset node). In the figure, the dotted lines are all in the north-south direction or the east-west direction, A0Has the coordinates of (x)0,y0)，B0The coordinates of (c) are (x, y), and the node is a node unit.
As shown in FIG. 2, | A1A|＝d0sinβ，|A0A1|＝d0cosβ；
The offset h of the unknown offset node and the second measurement node in the vertical direction is as follows:
the offset angle η of the unknown offset node from the second measurement node is:
node B of unknown offset0The coordinates of (a) are:
FIG. 3 is another embodiment of the present inventionIn one embodiment, a schematic diagram of a node layout model is provided. When the offset node is known to be routed to the location of the first measurement node, d0The node layout model is shown in fig. 3, where a is a first measurement node, B is one of the second measurement nodes (the other second measurement nodes are on the measurement line, and are not shown in fig. 3), and B is 0, β is 00As a node of unknown offset, dcTrack pitch, i.e. the distance between AB (the distance between the first and second measuring nodes), d1Is AB0Distance between (distance between known offset node and unknown offset node), α is deviation angle of line, β is A and A0Is a (deviation angle of the first measured node from the known deviation node) and theta is A0And B0Angle of (angle of the first measurement node from the unknown offset node). In the figure, the dotted lines are all in the north-south direction or the east-west direction, A0Has the coordinates of (x)0,y0)，B0The coordinates of (a) are (x, y).
As shown in fig. 3, the offset h of the unknown offset node from the second measurement node in the vertical direction is:
the offset angle η of the unknown offset node from the second measurement node is:
node B of unknown offset0The coordinates of (a) are:
the specific process of the embodiment of the invention is as follows:
1. receiving the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the deflection angle of the measuring line and the deflection angle of the first measuring node and the known offset node; and the first measuring node and each second measuring node are positioned on the measuring line.
2. And measuring the distance between the known offset node and the unknown offset node and the deflection angle of the known offset node and the unknown offset node by using a laser. Wherein the precision of the distance needs to reach RTK (Real-time kinematic) precision (centimeter level).
3. An offset model and an offset angle model are created.
4. Obtaining the offset of the unknown offset node and the second measurement node in the vertical direction through the following offset model:
h is the offset of the unknown offset node and the second measurement node in the vertical direction, dcIs the distance between the first and second measurement nodes, d0For the distance between the known offset node and the first measurement node, d1For the distance between the known offset node and the unknown offset node, α is the declination of the line, β is the declination of the first measurement node from the known offset node, and θ is the declination of the known offset node from the unknown offset node.
5. Obtaining the offset angle between the unknown offset node and the second measurement node through the following offset angle model:
η is the offset angle between the unknown offset node and the second measurement node, dcIs the distance between the first and second measurement nodes, d0For the distance between the known offset node and the first measurement node, d1For the distance between the known offset node and the unknown offset node, α is the declination of the line, β is the declination of the first measurement node from the known offset node, and θ is the declination of the known offset node from the unknown offset node.
6. And judging whether the offset of the unknown offset node and each second measurement node in the vertical direction is less than or equal to an offset threshold value or not, and judging whether the offset angle of the unknown offset node and each second measurement node is less than or equal to an offset angle threshold value or not.
7. When the unknown offset node and each second measurement node do not meet the condition that the offset of the unknown offset node and each second measurement node in the vertical direction is smaller than or equal to the offset threshold value, and the offset angle of the unknown offset node and each second measurement node is smaller than or equal to the offset angle threshold value, it is indicated that the position of the unknown offset node does not meet the construction requirement, at the moment, an alarm signal is sent out, the unknown offset nodes are re-arranged, the steps 1-6 are repeated until the offset of the unknown offset node and one of the second measurement nodes in the vertical direction is smaller than or equal to the offset threshold value, and the offset angle of the unknown offset node and each second measurement node is smaller than or equal to the offset angle threshold value.
8. When the offset of the unknown offset node and one of the second measurement nodes in the vertical direction is smaller than or equal to the offset threshold value, and the offset angle of the unknown offset node and the second measurement node is smaller than or equal to the offset angle threshold value, it is indicated that the position of the unknown offset node meets the construction requirement, and at this time, the coordinate of the unknown offset node is obtained through the following coordinate model:
wherein (x, y) is the coordinate of the unknown offset node, x0Is the abscissa, y, of a known offset node0As ordinate of known offset node, d1And theta is the distance between the known offset node and the unknown offset node, and theta is the deflection angle of the known offset node and the unknown offset node.
To sum up, the node layout method according to the embodiment of the present invention receives the distance between the first measurement node and each second measurement node, the distance between the known offset node and the first measurement node, the deflection angle of the measurement line, and the deflection angle between the first measurement node and the known offset node, measures the distance between the known offset node and the unknown offset node, and the deflection angle between the known offset node and the unknown offset node, and then inputs the data into the offset model and the offset angle model, respectively, to obtain the offset amount of the unknown offset node and each second measurement node in the vertical direction, and the deflection angle of the unknown offset node and each second measurement node; when the offset is smaller than or equal to the offset threshold value, and the offset angle is smaller than or equal to the offset angle threshold value, inputting the coordinates of the known offset node, the distance between the known offset node and the unknown offset node, and the offset angle between the known offset node and the unknown offset node into a preset coordinate model to obtain the coordinates of the unknown offset node, otherwise, rearranging the unknown offset node until the offset is smaller than or equal to the offset threshold value, and the offset angle is smaller than or equal to the offset angle threshold value, and finally outputting the pile number of the second measurement node corresponding to the unknown offset node and the coordinates of the unknown offset node.
The node layout method provided by the embodiment of the invention has the following beneficial effects:
(1) when node units are laid in the field, the pile numbers of the measuring nodes can be matched without depending on GPS for positioning, and the method is particularly suitable for seismic exploration construction in areas without GPS signals, such as deep trenches, jungles and the like;
(2) the positioning precision is high, the method is accurate and reliable, the pile number is not required to be checked manually, and the pile number matching accuracy can be effectively improved, so that the construction efficiency is improved;
(3) and when the position of the unknown offset node does not meet the construction requirement, an alarm signal is sent out, so that a complicated manual checking procedure is avoided, the construction operation intensity is effectively reduced, and the construction efficiency is improved.
Based on the same inventive concept, the embodiment of the invention also provides a node layout system, and as the principle of solving the problems of the system is similar to the node layout method, the implementation of the system can refer to the implementation of the method, and repeated parts are not described again.
Fig. 4 is a structural block diagram of the node layout system in the embodiment of the present invention. As shown in fig. 4, the node layout system includes:
the receiving unit is used for receiving the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the deflection angle of the measuring line and the deflection angle of the first measuring node and the known offset node; the first measuring node and each second measuring node are positioned on the measuring line;
the measuring unit is used for measuring the distance between the known offset node and the unknown offset node and the deflection angle between the known offset node and the unknown offset node;
a model creating unit for creating an offset model and an offset angle model;
the offset unit is used for inputting the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the distance between the known offset node and the unknown offset node, the deflection angle of the measuring line, the deflection angle of the first measuring node and the known offset node, and the deflection angle of the known offset node and the unknown offset node into the offset model to obtain the offset of the unknown offset node and each second measuring node in the vertical direction;
the offset angle unit is used for inputting the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the distance between the known offset node and the unknown offset node, the offset angle of the measuring line, the offset angle between the first measuring node and the known offset node and the offset angle between the known offset node and the unknown offset node into an offset angle model to obtain the offset angle between the unknown offset node and each second measuring node;
the judging unit is used for judging whether the offset of the unknown offset node and each second measuring node in the vertical direction is smaller than or equal to an offset threshold value or not and judging whether the offset angle of the unknown offset node and each second measuring node is smaller than or equal to an offset angle threshold value or not;
the coordinate unit of the unknown offset node is used for inputting the coordinates of the known offset node, the distance between the known offset node and the unknown offset node and the deflection angle between the known offset node and the unknown offset node into a preset coordinate model to obtain the coordinates of the unknown offset node;
the laying unit is used for laying unknown offset nodes again;
and the output unit is used for outputting the stake number of the second measurement node corresponding to the unknown offset node and the coordinates of the unknown offset node.
In one embodiment, the offset of the unknown offset node from the second measurement node in the vertical direction is obtained through the following offset model:
h is the offset of the unknown offset node and the second measurement node in the vertical direction, dcIs the distance between the first and second measurement nodes, d0For the distance between the known offset node and the first measurement node, d1For the distance between the known offset node and the unknown offset node, α is the declination of the line, β is the declination of the first measurement node from the known offset node, and θ is the declination of the known offset node from the unknown offset node.
In one embodiment, the offset angle of the unknown offset node and the second measurement node is obtained by the following offset angle model:
η is the offset angle between the unknown offset node and the second measurement node, dcIs the distance between the first and second measurement nodes, d0For the distance between the known offset node and the first measurement node, d1For the distance between the known offset node and the unknown offset node, α is the declination of the line, β is the declination of the first measurement node from the known offset node, and θ is the declination of the known offset node from the unknown offset node.
In one embodiment, the coordinates of the unknown offset node are obtained by the following coordinate model:
wherein (x, y) is the coordinate of the unknown offset node, x0Is the abscissa, y, of a known offset node0As ordinate of known offset node, d1And theta is the distance between the known offset node and the unknown offset node, and theta is the deflection angle of the known offset node and the unknown offset node.
To sum up, the node layout system according to the embodiment of the present invention first receives the distance between the first measurement node and each second measurement node, the distance between the known offset node and the first measurement node, the deflection angle of the measurement line, and the deflection angle between the first measurement node and the known offset node, measures the distance between the known offset node and the unknown offset node, and the deflection angle between the known offset node and the unknown offset node, and then inputs the data into the offset model and the offset angle model, respectively, to obtain the offset amount of the unknown offset node and each second measurement node in the vertical direction, and the deflection angle of the unknown offset node and each second measurement node; when the offset is smaller than or equal to the offset threshold value, and the offset angle is smaller than or equal to the offset angle threshold value, inputting the coordinates of the known offset node, the distance between the known offset node and the unknown offset node, and the offset angle between the known offset node and the unknown offset node into a preset coordinate model to obtain the coordinates of the unknown offset node, otherwise, rearranging the unknown offset node until the offset is smaller than or equal to the offset threshold value, and the offset angle is smaller than or equal to the offset angle threshold value, and finally outputting the pile number of the second measurement node corresponding to the unknown offset node and the coordinates of the unknown offset node.
The embodiment of the present invention further provides a computer device, which includes a memory, a processor, and a computer program stored in the memory and capable of running on the processor, and when the processor executes the computer program, the following steps are implemented:
receiving the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the deflection angle of the measuring line and the deflection angle of the first measuring node and the known offset node; the first measuring node and each second measuring node are positioned on the measuring line;
measuring the distance between a known offset node and an unknown offset node and the deflection angle of the known offset node and the unknown offset node;
creating an offset model and an offset angle model;
inputting the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the distance between the known offset node and the unknown offset node, the deflection angle of the measuring line, the deflection angle between the first measuring node and the known offset node, and the deflection angle between the known offset node and the unknown offset node into an offset model to obtain the offset of the unknown offset node and each second measuring node in the vertical direction;
inputting the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the distance between the known offset node and the unknown offset node, the deflection angle of the measuring line, the deflection angle between the first measuring node and the known offset node, and the deflection angle between the known offset node and the unknown offset node into a deflection angle model to obtain the deflection angle between the unknown offset node and each second measuring node;
judging whether the offset of the unknown offset node and each second measurement node in the vertical direction is smaller than or equal to an offset threshold value or not, and judging whether the offset angle of the unknown offset node and each second measurement node is smaller than or equal to an offset angle threshold value or not;
when the offset of the unknown offset node and one of the second measurement nodes in the vertical direction is smaller than or equal to the offset threshold value, and the offset angle of the unknown offset node and the second measurement node is smaller than or equal to the offset angle threshold value, inputting the coordinate of the known offset node, the distance between the known offset node and the unknown offset node, and the offset angle of the known offset node and the unknown offset node into a preset coordinate model to obtain the coordinate of the unknown offset node, otherwise, laying the unknown offset node again until the offset of the unknown offset node and one of the second measurement nodes in the vertical direction is smaller than or equal to the offset threshold value, and the offset angle of the unknown offset node and the second measurement node is smaller than or equal to the offset angle threshold value;
and outputting the stake number of the second measurement node corresponding to the unknown offset node and the coordinates of the unknown offset node.
To sum up, the computer device of the embodiment of the present invention receives the distance between the first measurement node and each second measurement node, the distance between the known offset node and the first measurement node, the deflection angle of the measurement line, and the deflection angle between the first measurement node and the known offset node, measures the distance between the known offset node and the unknown offset node, and the deflection angle between the known offset node and the unknown offset node, and then inputs the data into the offset model and the offset angle model, respectively, to obtain the offset amount of the unknown offset node and each second measurement node in the vertical direction, and the deflection angle of the unknown offset node and each second measurement node; when the offset is smaller than or equal to the offset threshold value, and the offset angle is smaller than or equal to the offset angle threshold value, inputting the coordinates of the known offset node, the distance between the known offset node and the unknown offset node, and the offset angle between the known offset node and the unknown offset node into a preset coordinate model to obtain the coordinates of the unknown offset node, otherwise, rearranging the unknown offset node until the offset is smaller than or equal to the offset threshold value, and the offset angle is smaller than or equal to the offset angle threshold value, and finally outputting the pile number of the second measurement node corresponding to the unknown offset node and the coordinates of the unknown offset node.
An embodiment of the present invention further provides a computer-readable storage medium, on which a computer program is stored, where the computer program, when executed by a processor, implements the following steps:
receiving the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the deflection angle of the measuring line and the deflection angle of the first measuring node and the known offset node; the first measuring node and each second measuring node are positioned on the measuring line;
measuring the distance between a known offset node and an unknown offset node and the deflection angle of the known offset node and the unknown offset node;
creating an offset model and an offset angle model;
inputting the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the distance between the known offset node and the unknown offset node, the deflection angle of the measuring line, the deflection angle between the first measuring node and the known offset node, and the deflection angle between the known offset node and the unknown offset node into an offset model to obtain the offset of the unknown offset node and each second measuring node in the vertical direction;
inputting the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the distance between the known offset node and the unknown offset node, the deflection angle of the measuring line, the deflection angle between the first measuring node and the known offset node, and the deflection angle between the known offset node and the unknown offset node into a deflection angle model to obtain the deflection angle between the unknown offset node and each second measuring node;
judging whether the offset of the unknown offset node and each second measurement node in the vertical direction is smaller than or equal to an offset threshold value or not, and judging whether the offset angle of the unknown offset node and each second measurement node is smaller than or equal to an offset angle threshold value or not;
when the offset of the unknown offset node and one of the second measurement nodes in the vertical direction is smaller than or equal to the offset threshold value, and the offset angle of the unknown offset node and the second measurement node is smaller than or equal to the offset angle threshold value, inputting the coordinate of the known offset node, the distance between the known offset node and the unknown offset node, and the offset angle of the known offset node and the unknown offset node into a preset coordinate model to obtain the coordinate of the unknown offset node, otherwise, laying the unknown offset node again until the offset of the unknown offset node and one of the second measurement nodes in the vertical direction is smaller than or equal to the offset threshold value, and the offset angle of the unknown offset node and the second measurement node is smaller than or equal to the offset angle threshold value;
and outputting the stake number of the second measurement node corresponding to the unknown offset node and the coordinates of the unknown offset node.
To sum up, the computer-readable storage medium according to the embodiment of the present invention receives the distance between the first measurement node and each second measurement node, the distance between the known offset node and the first measurement node, the deflection angle of the measurement line, and the deflection angle between the first measurement node and the known offset node, measures the distance between the known offset node and the unknown offset node, and the deflection angle between the known offset node and the unknown offset node, and inputs the data into the offset model and the offset angle model, respectively, to obtain the offset amount of the unknown offset node and each second measurement node in the vertical direction, and the deflection angle of the unknown offset node and each second measurement node; when the offset is smaller than or equal to the offset threshold value, and the offset angle is smaller than or equal to the offset angle threshold value, inputting the coordinates of the known offset node, the distance between the known offset node and the unknown offset node, and the offset angle between the known offset node and the unknown offset node into a preset coordinate model to obtain the coordinates of the unknown offset node, otherwise, rearranging the unknown offset node until the offset is smaller than or equal to the offset threshold value, and the offset angle is smaller than or equal to the offset angle threshold value, and finally outputting the pile number of the second measurement node corresponding to the unknown offset node and the coordinates of the unknown offset node.
The above-mentioned embodiments are intended to illustrate the objects, technical solutions and advantages of the present invention in further detail, and it should be understood that the above-mentioned embodiments are only exemplary embodiments of the present invention, and are not intended to limit the scope of the present invention, and any modifications, equivalent substitutions, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (10)
1. A node layout method is characterized by comprising the following steps:
receiving a distance between a first measurement node and each second measurement node, a distance between a known offset node and the first measurement node, a deflection angle of a survey line, and a deflection angle of the first measurement node and the known offset node; wherein the first measurement node and each second measurement node are located on the survey line;
measuring a distance between the known offset node and an unknown offset node, and a declination angle of the known offset node and the unknown offset node;
creating an offset model and an offset angle model;
inputting the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the distance between the known offset node and the unknown offset node, the deflection angle of the measuring line, the deflection angle between the first measuring node and the known offset node, and the deflection angle between the known offset node and the unknown offset node into the offset model to obtain the offset of the unknown offset node and each second measuring node in the vertical direction;
inputting the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the distance between the known offset node and the unknown offset node, the deflection angle of the measuring line, the deflection angle between the first measuring node and the known offset node, and the deflection angle between the known offset node and the unknown offset node into the deflection angle model to obtain the deflection angle between the unknown offset node and each second measuring node;
judging whether the offset of the unknown offset node and each second measurement node in the vertical direction is smaller than or equal to an offset threshold value or not, and judging whether the offset angle of the unknown offset node and each second measurement node is smaller than or equal to an offset angle threshold value or not;
when the offset of the unknown offset node and one of the second measurement nodes in the vertical direction is smaller than or equal to an offset threshold value, and the offset angle of the unknown offset node and the second measurement node is smaller than or equal to an offset angle threshold value, inputting the coordinate of the known offset node, the distance between the known offset node and the unknown offset node, and the offset angle of the known offset node and the unknown offset node into a preset coordinate model to obtain the coordinate of the unknown offset node, otherwise, laying the unknown offset node again until the offset of the unknown offset node and one of the second measurement nodes in the vertical direction is smaller than or equal to the offset threshold value, and the offset angle of the unknown offset node and the second measurement node is smaller than or equal to the offset angle threshold value;
and outputting the pile number of the second measurement node corresponding to the unknown offset node and the coordinates of the unknown offset node.
2. The node layout method according to claim 1, wherein the offset of the unknown offset node from the second measurement node in the vertical direction is obtained by an offset model as follows:
h is the offset of the unknown offset node and the second measurement node in the vertical direction, dcIs the distance between the first measurement node and the second measurement node, d0As the distance between the known offset node and the first measurement node, d1For the distance between the known offset node and the unknown offset node, α is the declination of the line, β is the declination of the first measurement node and the known offset node, θ is the declination of the known offset node and the unknown offset node.
3. The node layout method according to claim 1, wherein the offset angle of the unknown offset node and the second measurement node is obtained by an offset angle model as follows:
η is the offset angle between the unknown offset node and the second measurement node, dcIs the distance between the first measurement node and the second measurement node, d0As the distance between the known offset node and the first measurement node, d1For the distance between the known offset node and the unknown offset node, α is the declination of the line, β is the declination of the first measurement node and the known offset node, θ is the declination of the known offset node and the unknown offset node.
4. The node layout method according to claim 1, wherein the coordinates of the unknown offset node are obtained by the following coordinate model:
wherein (x, y) is the coordinate of the unknown offset node, x0Is the abscissa, y, of the known offset node0Is the ordinate of the known offset node, d1θ is the declination angle of the known offset node and the unknown offset node.
5. A node deployment system, comprising:
a receiving unit, configured to receive a distance between a first measurement node and each second measurement node, a distance between a known offset node and the first measurement node, a deflection angle of a measurement line, and a deflection angle of the first measurement node and the known offset node; wherein the first measurement node and each second measurement node are located on the survey line;
a measuring unit, configured to measure a distance between the known offset node and an unknown offset node, and a drift angle of the known offset node and the unknown offset node;
a model creating unit for creating an offset model and an offset angle model;
an offset unit, configured to input a distance between the first measurement node and each second measurement node, a distance between the known offset node and the first measurement node, a distance between the known offset node and the unknown offset node, a deflection angle of the measurement line, a deflection angle of the first measurement node and the known offset node, and a deflection angle of the known offset node and the unknown offset node into the offset model, so as to obtain an offset of the unknown offset node and each second measurement node in a vertical direction;
the offset angle unit is used for inputting the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the distance between the known offset node and the unknown offset node, the offset angle of the measuring line, the offset angle between the first measuring node and the known offset node, and the offset angle between the known offset node and the unknown offset node into the offset angle model to obtain the offset angle between the unknown offset node and each second measuring node;
the judging unit is used for judging whether the offset of the unknown offset node and each second measuring node in the vertical direction is smaller than or equal to an offset threshold value or not and judging whether the offset angle of the unknown offset node and each second measuring node is smaller than or equal to an offset angle threshold value or not;
the coordinate unit of the unknown offset node is used for inputting the coordinates of the known offset node, the distance between the known offset node and the unknown offset node and the deflection angle between the known offset node and the unknown offset node into a preset coordinate model to obtain the coordinates of the unknown offset node;
the laying unit is used for laying the unknown offset nodes again;
and the output unit is used for outputting the stake number of the second measurement node corresponding to the unknown offset node and the coordinates of the unknown offset node.
6. The node layout system according to claim 5, wherein the offset of the unknown offset node from the second measurement node in the vertical direction is obtained by an offset model as follows:
h is the offset of the unknown offset node and the second measurement node in the vertical direction, dcIs the distance between the first measurement node and the second measurement node, d0As the distance between the known offset node and the first measurement node, d1For the distance between the known offset node and the unknown offset node, α is the declination of the line, β is the declination of the first measurement node and the known offset node, θ is the declination of the known offset node and the unknown offset node.
7. The node layout system according to claim 5, wherein the offset angle of the unknown offset node and the second measurement node is obtained by an offset angle model:
η is the offset angle between the unknown offset node and the second measurement node, dcIs the distance between the first measurement node and the second measurement node, d0As the distance between the known offset node and the first measurement node, d1For the distance between the known offset node and the unknown offset node, α is the declination of the line, β is the declination of the first measurement node and the known offset node, θ is the declination of the known offset node and the unknown offset node.
8. The node placement system as claimed in claim 5, wherein the coordinates of the unknown offset node are obtained by a coordinate model:
wherein (x, y) is the coordinate of the unknown offset node, x0Is the abscissa, y, of the known offset node0Is the ordinate of the known offset node, d1θ is the declination angle of the known offset node and the unknown offset node.
9. A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor when executing the computer program implements the steps of:
receiving a distance between a first measurement node and each second measurement node, a distance between a known offset node and the first measurement node, a deflection angle of a survey line, and a deflection angle of the first measurement node and the known offset node; wherein the first measurement node and each second measurement node are located on the survey line;
measuring a distance between the known offset node and an unknown offset node, and a declination angle of the known offset node and the unknown offset node;
creating an offset model and an offset angle model;
inputting the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the distance between the known offset node and the unknown offset node, the deflection angle of the measuring line, the deflection angle between the first measuring node and the known offset node, and the deflection angle between the known offset node and the unknown offset node into the offset model to obtain the offset of the unknown offset node and each second measuring node in the vertical direction;
inputting the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the distance between the known offset node and the unknown offset node, the deflection angle of the measuring line, the deflection angle between the first measuring node and the known offset node, and the deflection angle between the known offset node and the unknown offset node into the deflection angle model to obtain the deflection angle between the unknown offset node and each second measuring node;
judging whether the offset of the unknown offset node and each second measurement node in the vertical direction is smaller than or equal to an offset threshold value or not, and judging whether the offset angle of the unknown offset node and each second measurement node is smaller than or equal to an offset angle threshold value or not;
when the offset of the unknown offset node and one of the second measurement nodes in the vertical direction is smaller than or equal to an offset threshold value, and the offset angle of the unknown offset node and the second measurement node is smaller than or equal to an offset angle threshold value, inputting the coordinate of the known offset node, the distance between the known offset node and the unknown offset node, and the offset angle of the known offset node and the unknown offset node into a preset coordinate model to obtain the coordinate of the unknown offset node, otherwise, laying the unknown offset node again until the offset of the unknown offset node and one of the second measurement nodes in the vertical direction is smaller than or equal to the offset threshold value, and the offset angle of the unknown offset node and the second measurement node is smaller than or equal to the offset angle threshold value;
and outputting the pile number of the second measurement node corresponding to the unknown offset node and the coordinates of the unknown offset node.
10. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of:
receiving a distance between a first measurement node and each second measurement node, a distance between a known offset node and the first measurement node, a deflection angle of a survey line, and a deflection angle of the first measurement node and the known offset node; wherein the first measurement node and each second measurement node are located on the survey line;
measuring a distance between the known offset node and an unknown offset node, and a declination angle of the known offset node and the unknown offset node;
creating an offset model and an offset angle model;
inputting the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the distance between the known offset node and the unknown offset node, the deflection angle of the measuring line, the deflection angle between the first measuring node and the known offset node, and the deflection angle between the known offset node and the unknown offset node into the offset model to obtain the offset of the unknown offset node and each second measuring node in the vertical direction;
inputting the distance between the first measuring node and each second measuring node, the distance between the known offset node and the first measuring node, the distance between the known offset node and the unknown offset node, the deflection angle of the measuring line, the deflection angle between the first measuring node and the known offset node, and the deflection angle between the known offset node and the unknown offset node into the deflection angle model to obtain the deflection angle between the unknown offset node and each second measuring node;
judging whether the offset of the unknown offset node and each second measurement node in the vertical direction is smaller than or equal to an offset threshold value or not, and judging whether the offset angle of the unknown offset node and each second measurement node is smaller than or equal to an offset angle threshold value or not;
when the offset of the unknown offset node and one of the second measurement nodes in the vertical direction is smaller than or equal to an offset threshold value, and the offset angle of the unknown offset node and the second measurement node is smaller than or equal to an offset angle threshold value, inputting the coordinate of the known offset node, the distance between the known offset node and the unknown offset node, and the offset angle of the known offset node and the unknown offset node into a preset coordinate model to obtain the coordinate of the unknown offset node, otherwise, laying the unknown offset node again until the offset of the unknown offset node and one of the second measurement nodes in the vertical direction is smaller than or equal to the offset threshold value, and the offset angle of the unknown offset node and the second measurement node is smaller than or equal to the offset angle threshold value;
and outputting the pile number of the second measurement node corresponding to the unknown offset node and the coordinates of the unknown offset node.
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