CN1111284C - Comprehensive aging screening device for electronic components - Google Patents
Comprehensive aging screening device for electronic components Download PDFInfo
- Publication number
- CN1111284C CN1111284C CN 99126840 CN99126840A CN1111284C CN 1111284 C CN1111284 C CN 1111284C CN 99126840 CN99126840 CN 99126840 CN 99126840 A CN99126840 A CN 99126840A CN 1111284 C CN1111284 C CN 1111284C
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- burn
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- aging
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- Expired - Lifetime
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- 230000032683 aging Effects 0.000 title claims abstract description 26
- 238000012216 screening Methods 0.000 title abstract description 7
- 238000012360 testing method Methods 0.000 claims abstract description 55
- 238000006243 chemical reaction Methods 0.000 claims abstract description 15
- 238000009423 ventilation Methods 0.000 claims abstract description 6
- 238000004891 communication Methods 0.000 claims abstract description 5
- 239000002184 metal Substances 0.000 claims description 2
- 238000007689 inspection Methods 0.000 abstract 2
- 230000017525 heat dissipation Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 3
- 230000035882 stress Effects 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000005070 sampling Methods 0.000 description 2
- 238000003491 array Methods 0.000 description 1
- 208000002925 dental caries Diseases 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000003014 reinforcing effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
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Abstract
The invention relates to a comprehensive aging screening device for electronic components, wherein a test cavity, a ventilation and heat dissipation device, an electric signal connecting device, an electronic switch array, an aging board, an aging power supply, a power supply polarity conversion device, an inspection control instrument, an information input device and a display device are arranged in a shell of the comprehensive aging screening device. The test cavity is provided with an aging board and a fan for installing a test article, the test article is connected with a power supply polarity conversion circuit and an aging power supply, a voltage and current signal of the test article on the aging board is input to a singlechip in the inspection control instrument through an electronic switch array and is subjected to P-N polarity conversion by a voltage frequency conversion measuring circuit, the singlechip circuit outputs related information on a display device after processing, man-machine conversation is realized through an information input device and a display output device, the control instrument is connected with the electronic switch array, a communication interface, an upper computer microcomputer and a printer.
Description
One, technical field
The present invention relates to the comprehensive burn-in screen device of a kind of electronic devices and components, be used for following various dissimilar, the different encapsulation of frequency 1000MH, opposed polarity two, electronic devices and components (hereinafter to be referred as test product) such as triode, controllable silicon, three terminal regulator, resistance, make stable state full load aging test or junction temperature aging test, for the user to kind widely test product carry out the burn-in screen analysis of experiments and use.
Two, technical background:
The inefficacy of electronic devices and components can be divided into initial failure, random failure, wearout failure, various electronic devices and components often influence the reliability of complete machine owing to reasons such as manufacturing defect cause initial failure in operate as normal, the initial failure test product is rejected in burn-in screen by test product, improves the quality of products.The various electronic devices and components testing equipments of selling in the market and using substantially all are applicable to single variety, often will buy several or tens test units in the time of need carrying out burn-in screen to tens kinds of test products that use as the user, there is following shortcoming in this present situation:
1, plant factor is low, can not take into account mutually, and the screening cost improves.
2, the equipment purchasing expense increases, and takies a large amount of factory buildings and operating personnel, and labour productivity is low.
3, automaticity is low, and measuring accuracy is low, and not automatic analysis, statistical function can not be set up effective test product screening and analyze archives.
Three, summary of the invention:
The present invention to solve existing electronic devices and components ageing testing equipment applicable surface narrow, can not interactive shortcoming, provide a kind of modular construction be applicable to kind, type extensively, the device overall volume is little, cost is low, automaticity is high, the comprehensive burn-in screen device that can carry out burn-in screen simultaneously to 1000 left and right sides test products.
The comprehensive burn-in screen device of electronic devices and components of the present invention, comprise metal shell, test cavity, ventilation heat abstractor, aging power supply, connecting device of electrical signals, burn-in board also comprise electronic switch array, patrol and examine controller, electric power polarity converting means, message input device, display device, communication interface, host computer micro computer, printer;
Test product is installed on the burn-in board, burn-in board can be installed in the test cavity with plugging, ventilation heat abstractor is installed in test cavity both sides, and the burn-in board device is connected with the electric power polarity converting means with electronic switch array by connecting device of electrical signals, and the electric power polarity converting means is connected with aging power supply;
Patrol and examine controller and control electronic switch array, electric power polarity converting means and blower voltage respectively, the described controller of patrolling and examining comprises single-chip microcomputer and voltage-frequency conversion metering circuit, described single-chip microcomputer and voltage-frequency conversion metering circuit collect the current signal of each burn-in board test product output by electronic switch array, show output unit by information input keyboard and information, realize man-machine conversation.
Describedly patrol and examine voltage, the current signal that single-chip microcomputer in the controller device and voltage-frequency conversion metering circuit receive the test product output that electronic switch array collects, this signal after P-N reversal, current-voltage conversion, voltage-frequency conversion metering circuit, single-chip microcomputer CTC handle, is shown the current/voltage parameter on charactron; Show output unit by information input keyboard and information, realize that man-machine conversation, input can be provided with upper lower limit value, the time of printout, form that plate, item, interval time, the parameter of patrolling and examining are reported to the police; Information output can show plate, the item of patrolling and examining, electric current, voltage parameter value, and the pipe item of ineffective part, each burn-in board are inserted the state of correctness.
Advantage of the present invention is:
1, plant factor height, nearly 1024 of test stations, various test products can carry out the burn-in screen of opposed polarity, different tests voltage, different packing forms in four zones of single equipment.
2, the equipment purchasing expense reduces, and floor area is little, and operating personnel reduce, and reduces the aging cost of screening greatly.
3, adopt modular construction, the standardization of reinforcing member, universalization degree are convenient to maintenance, and for some tests that can not interrupt, advantage is tangible especially.
4, automaticity height can show inefficacy test product position, is convenient to reject, and utilizes high capacity great proficiency dish, internal memory behind the upper machine communication, can set up the test of long duration database.
Can apply electric stress, temperature stress, time stress to test product with test unit of the present invention, make test product quicken to expose latent defect, enter earlier failure period ahead of time, reject unacceptable product, can be widely used in electronic devices and components and use producer and research institute, also can be used for Electronic Components Manufacturing producer.
Four, description of drawings:
Fig. 1: comprehensive burn-in screen device block scheme.
Fig. 2: the aging test cavity is faced, backsight, sectional view.
Fig. 3: burn-in board pin A face, B face and connecting device of electrical signals functional diagram.
Fig. 4: the test circuit figure of 11 types of test products.
Fig. 5: patrol and examine the controller circuit block-diagram.
Fig. 6: aging power supply and electric power polarity converting means circuit diagram.
Five, embodiment
Further specify the present invention below in conjunction with accompanying drawing:
The test cavity of this device can be placed the burn-in board of 16 normal widths, pull-up resistor is housed on the burn-in board, sampling resistor, aging clamp, the test cavity frame adopts stamping parts, 8 grooves in every limit, totally 4 be installed in respectively about on two cavitys, burn-in board adopts double-clad board, can plug the output terminals A of burn-in board flexibly, the B face passes through connecting device of electrical signals, be connected with the electric power polarity converting means with electronic switch array, burn-in board adopts parallel placement, and the left and right sides has been installed 16 axial flow blowers altogether, by regulating blower voltage, make wind speed adjustable, the burn-in board plug is installed firmly easily in the test cavity, and the parallel placement of test product connects reliable; Patrol and examine controller device control electric power polarity converting means and make aging power supply satisfy the requirement of opposed polarity component aging, patrol and examine controller device control electronic switch array, electric current, the voltage signal of each station in 16 burn-in board devices detected automatically; Various test products different classes of, polarity become to satisfy the various different burn-in board devices of different outline packages test products according to test circuit figure provided by the invention and the periphery circuit design among the figure; Patrol and examine single-chip microcomputer and voltage-frequency conversion metering circuit in the controller device, collect voltage, the current signal of each burn-in board test product output by electronic switch array, show output unit by information input keyboard and information, realize man-machine conversation, information input can be provided with upper limit value and lower limit value, the time of printout, the form that plate, item, interval time, the parameter of patrolling and examining are reported to the police, and information output can show the plate of patrolling and examining, item, electric current, voltage parameter value, the pipe item of ineffective part, the state that each burn-in board is inserted correctness etc.
The course of work of the present invention is as follows:
Test product is installed on the corresponding burn-in board, inserting test cavity contacts with connecting device of electrical signals well, aging electric power polarity converting means switches in corresponding position, open aging power supply Vb, Vc, controller is patrolled and examined in unlatching, by the information input keyboard be set date of test successively, patrol and examine plate number, patrol and examine figure place, the failure criteria bound, parameter warning bound, the form of printout, time, and make and patrol and examine first that is fixed on each plate item, regulate the Vc power supply to being slightly less than required Vc value, regulate the Vb power supply, on required IC value, finely tune the Vc power supply again to required trial voltage, finish above operation, device enters ageing state; Selection need be carried out the plate position of parameter detecting, and keypad " is patrolled and examined initiating key " then, patrols and examines controller and enters patrolling and examining in real time in the ageing process; Signal on the burn-in board sampling resistor outputs to 8 * 8 electronic switch arrays by connecting device of electrical signals, single-chip microcomputer is according to the plate of keyboard input, item sends the ranks gating signal, control by software program, has only a behavior low level among the PA0-PA7, has only the high level of classifying as among the PB0-PB7, PA0-PA7 forms horizontal drive circuit by integrated circuit 75361, the column drive circuit that PB0-PB7 forms by MC1413, the point of crossing of ranks is relay gate, the detection signal that comes from relay passes through the electric current that the P-N polar switching is exported test product, voltage signal is added to the signal voltage of VFC LF331 input end 0-10V, the pulse signal of VFC output 0-100K, pulse signal shows the current/voltage parameter value by single-chip microcomputer CTC counting back by the charactron in the output display device.Show the plate patrol and examine number, item, the pipe item of ineffective part, the information such as state that each burn-in board is inserted correctness by software control simultaneously, patrol and examine controller and also disposed printer interface and 485 communication interfaces, be connected usefulness with printer for host computer.Regulate the wind speed of fan speed regulation potentiometer control ventilation heat abstractor, guarantee that test product is operated in 75 ℃ ± 5 ℃.
Claims (2)
1, the comprehensive burn-in screen device of a kind of electronic devices and components, this test unit comprises metal shell, test cavity, ventilation heat abstractor, aging power supply, connecting device of electrical signals, burn-in board is characterized in that also comprising electronic switch array, patrol and examine controller, electric power polarity converting means, message input device, display device, communication interface, host computer micro computer, printer;
Test product is installed on the burn-in board, burn-in board can be installed in the test cavity with plugging, ventilation heat abstractor is installed in test cavity both sides, and the burn-in board device is connected with the electric power polarity converting means with electronic switch array by connecting device of electrical signals, and the electric power polarity converting means is connected with aging power supply;
Patrol and examine controller and control electronic switch array, electric power polarity converting means and blower voltage respectively, the described controller of patrolling and examining comprises single-chip microcomputer and voltage-frequency conversion metering circuit, described single-chip microcomputer and voltage-frequency conversion metering circuit collect the current signal of each burn-in board test product output by electronic switch array, show output unit by information input keyboard and information, realize man-machine conversation.
2. the comprehensive burn-in screen device of electronic devices and components as claimed in claim 1, it is characterized in that described voltage, the current signal that single-chip microcomputer in the controller device and voltage-frequency conversion metering circuit receive the test product output that electronic switch array collects of patrolling and examining, this signal after P-N reversal, current-voltage conversion, voltage-frequency conversion metering circuit, single-chip microcomputer CTC handle, is shown the current/voltage parameter on charactron; Show output unit by information input keyboard and information, realize that man-machine conversation, input can be provided with upper lower limit value, the time of printout, form that plate, item, interval time, the parameter of patrolling and examining are reported to the police; Information output can show plate, the item of patrolling and examining, electric current, voltage parameter value, and the pipe item of ineffective part, each burn-in board are inserted the state of correctness.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 99126840 CN1111284C (en) | 1999-12-15 | 1999-12-15 | Comprehensive aging screening device for electronic components |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 99126840 CN1111284C (en) | 1999-12-15 | 1999-12-15 | Comprehensive aging screening device for electronic components |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1299974A CN1299974A (en) | 2001-06-20 |
| CN1111284C true CN1111284C (en) | 2003-06-11 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 99126840 Expired - Lifetime CN1111284C (en) | 1999-12-15 | 1999-12-15 | Comprehensive aging screening device for electronic components |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1111284C (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1307425C (en) * | 2003-03-13 | 2007-03-28 | 鸿富锦精密工业（深圳）有限公司 | Ageing trolley detecting monitoring improving method and apparatus |
| CN100412558C (en) * | 2005-01-07 | 2008-08-20 | 统宝光电股份有限公司 | High-temperature aging test device for display panel |
| CN102305908B (en) * | 2011-08-03 | 2013-07-03 | 华南理工大学 | Parameter test platform for electronic component |
| TWI548886B (en) * | 2014-04-18 | 2016-09-11 | 創意電子股份有限公司 | Aging detection circuit and method thereof |
| CN104614622A (en) * | 2015-02-13 | 2015-05-13 | 南京六九零二科技有限公司 | Intelligent aging rack |
| CN112305362A (en) * | 2020-11-18 | 2021-02-02 | 安徽远创电子有限公司 | Electrical product aging tester |
-
1999
- 1999-12-15 CN CN 99126840 patent/CN1111284C/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| CN1299974A (en) | 2001-06-20 |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| ASS | Succession or assignment of patent right |
Owner name: HANGZHOU TONGCE MICROELECTRONICS CO., LTD. Free format text: FORMER OWNER: CAO JI Effective date: 20060407 |
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| C41 | Transfer of patent application or patent right or utility model | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20060407 Address after: South Zone of high road 311231 of Zhejiang Province, Hangzhou Xiaoshan economic and Technological Development Zone No. 77 Patentee after: Hangzhou Tongce Micro-Electronic Co., Ltd. Address before: 310021 No. 88 Peng Pang Road, Zhejiang, Hangzhou Patentee before: Cao Ji |
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| EE01 | Entry into force of recordation of patent licensing contract |
Assignee: Hangzhou Reliability Electronic Ltd. Assignor: Hangzhou Tongce Micro-Electronic Co., Ltd. Contract fulfillment period: 2008.9.9 to 2013.9.9 Contract record no.: 2008330001102 Denomination of invention: Comprehensive aging and screening equipment for electronic components and devices Granted publication date: 20030611 License type: Exclusive license Record date: 20081016 |
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| LIC | Patent licence contract for exploitation submitted for record |
Free format text: EXCLUSIVE LICENSE; TIME LIMIT OF IMPLEMENTING CONTACT: 2008.9.9 TO 2013.9.9; CHANGE OF CONTRACT Name of requester: HANGZHOU RELIABLE INSTRUMENT FACTORY Effective date: 20081016 |
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| CX01 | Expiry of patent term |
Granted publication date: 20030611 |
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| CX01 | Expiry of patent term |