CN111060979B - Method and device for determining apparent resistivity - Google Patents

Abstract

The invention discloses a method and a device for determining apparent resistivity. Wherein, the method includes: determining the magnetic field component of the measuring point in the frequency domain in the horizontal Y direction; determining the normalization function corresponding to the magnetic field component; determining the magnetic field component in the frequency domain according to the normalization function and frequency domain parameters Apparent resistivity. The invention solves the technical problem that the electromagnetic measurement technology in the related art cannot independently measure and process the magnetic field component in the horizontal Y direction of the frequency domain.

Description

Method and device for determining apparent resistivity

technical field

The invention relates to the field of geological exploration, in particular, to a method and device for determining apparent resistivity.

Background technique

At present, the electromagnetic measurement technology generally uses the controllable source audio frequency geomagnetic sounding method CSAMT to synchronously measure the horizontal X-direction electric field component and the Y-direction magnetic field component in the frequency domain. However, the horizontal Y-direction magnetic field component in the frequency domain cannot be processed separately, and the definition and calculation method of the overall apparent resistivity of the horizontal Y-direction magnetic field component cannot be formed. The ratio of the components is calculated to approximate the apparent Carnia resistivity. However, the above methods are easily affected by static displacement and terrain; in addition, most of the electric field measurement is the average information within the range covered by the electrode about 50-100 meters, which is weak in fixed point and low in lateral resolution.

Aiming at the problem that the electromagnetic measurement technology in the above-mentioned related art cannot separately measure and process the magnetic field component in the horizontal Y direction in the frequency domain, an effective solution has not yet been proposed.

SUMMARY OF THE INVENTION

Embodiments of the present invention provide a method and device for determining apparent resistivity, so as to at least solve the technical problem that the electromagnetic measurement technology in the related art cannot independently measure and process the magnetic field component in the horizontal Y direction in the frequency domain.

According to an aspect of the embodiments of the present invention, a method for determining apparent resistivity is provided, including: determining a magnetic field component of a measuring point in the frequency domain in the horizontal Y direction; determining a normalization function corresponding to the magnetic field component; The normalization function and frequency domain parameters determine apparent resistivity in the frequency domain.

Optionally, determining the apparent resistivity in the frequency domain according to the normalization function and the frequency domain parameters includes: determining the connection between the center point of the electric dipole and the measuring point and the difference between the electric dipoles. The azimuth angle between the azimuth angles is determined; the corresponding relationship between the normalized function and the frequency domain parameter is determined according to the azimuth angle; the apparent resistivity in the frequency domain is determined according to the corresponding relationship.

Optionally, determining the correspondence between the normalization function and the frequency domain parameter according to the azimuth angle includes: when the azimuth angle is 0°≤φ<34° and the azimuth angle is 35.2644° In the case of ≤φ<39.4°, the corresponding relationship between the normalized function and the frequency domain is a first corresponding relationship, wherein the first corresponding relationship is a monotonic relationship; at the azimuth angle is 34.0 In the case of °≤φ<35.2644°, the corresponding relationship between the normalization function and the frequency domain is a second corresponding relationship, wherein the second corresponding relationship is a monotonic relationship and a three-value coexistence relationship; in When the azimuth angle is 39.4°≤φ<45°, the correspondence between the normalization function and the frequency domain is a third correspondence, wherein the third correspondence is monotonic, double value and coexistence of three values; when the azimuth angle is φ=45°, the correspondence between the normalization function and the frequency domain is a fourth correspondence, wherein the fourth correspondence The relationship is a dual value relationship; when the azimuth angle is 45°≤φ<90°, the corresponding relationship between the normalization function and the frequency domain is a fifth corresponding relationship, wherein the first The five corresponding relationships are single-valued and dual-valued coexistence relationships.

Optionally, determining the apparent resistivity in the frequency domain according to the corresponding relationship includes: in the case that the corresponding relationship is the first corresponding relationship, using a dichotomy method to determine the frequency according to the normalization function. Apparent resistivity in the domain.

Optionally, determining the apparent resistivity in the frequency domain according to the corresponding relationship includes: when the corresponding relationship is the second corresponding relationship and the third corresponding relationship, determining the normalization function The interval with a maximum value and the interval with a minimum value; the interval with a maximum value and the interval with a minimum value are corrected to obtain a theoretical normalization function; the frequency is determined according to the theoretical normalization function Apparent resistivity in the domain.

Optionally, determining the apparent resistivity in the frequency domain according to the corresponding relationship includes: in the case that the corresponding relationship is the fourth corresponding relationship, modifying the normalization function according to a predetermined condition to obtain: Theoretical normalization function; search for the maximum value point of the theoretical normalization function, and determine the first sub-normalization function and the second sub-normalization function corresponding to the two sides of the maximum value point respectively; The monotonicity of the first sub-normalization function and the monotonicity of the second sub-normalization function; according to the monotonicity of the first sub-normalization function and the monotonicity of the second sub-normalization function Determine the apparent resistivity in the frequency domain.

Optionally, determining the apparent resistivity in the frequency domain according to the corresponding relationship includes: in the case that the corresponding relationship is the fifth corresponding relationship, determining the first interval corresponding to the first interval of the normalized function. The three-sub-normalization function adopts the dichotomy method to determine the apparent resistivity; the second interval of the normalization function is modified to the fourth sub-normalization function corresponding to the second interval, and the modified first sub-normalization function is obtained. Two sub-normalization functions; the apparent resistivity in the frequency domain is determined according to the modified second sub-normalization function.

Optionally, before determining the apparent resistivity in the frequency domain according to the corresponding relationship, the method for determining the apparent resistivity further includes: determining the first apparent resistivity according to the relationship between the normalization function and a predetermined value. interval and the second interval, wherein the predetermined value is |2cos ² φ-1|, and φ is the azimuth angle.

其中，

为所述理论归一化函数，β为修正系数，

为所述归一化函数，H_y表示频率域内的测点在水平Y方向上的磁场分量。Optionally, modifying an interval with a maximum value and an interval with a minimum value to obtain the theoretical normalization function includes: obtaining the theoretical normalization function through a first formula, where the first formula is:

in,

is the theoretical normalization function, β is the correction coefficient,

As the normalization function, H _y represents the magnetic field component in the horizontal Y direction of the measuring point in the frequency domain.

Optionally, before correcting an interval with a maximum value and an interval with a minimum value to obtain a theoretical normalized function, the above-mentioned method for determining apparent resistivity further includes: determining the correction coefficient.

According to another aspect of the embodiments of the present invention, an apparatus for determining apparent resistivity is also provided, including: a first determining unit for determining a magnetic field component of a measuring point in the frequency domain in the horizontal Y direction; a second determining unit , which is used for determining the normalization function corresponding to the magnetic field component; the third determining unit is used for determining the apparent resistivity in the frequency domain according to the normalization function and the frequency domain parameter.

Optionally, the third determination unit includes: a first determination subunit for determining the connection between the center point of the electric dipole and the measuring point and the azimuth angle between the electric dipoles; The second determination subunit is used to determine the corresponding relationship between the normalized function and the frequency domain parameter according to the azimuth angle; the third determination subunit is used to determine the corresponding relationship in the frequency domain according to the corresponding relationship. Apparent resistivity.

Optionally, the second determination subunit includes: a first determination module, configured to, when the azimuth angle is 0°≤φ<34° and the azimuth angle is 35.2644°≤φ<39.4°, determining the corresponding relationship between the normalized function and the frequency domain as a first corresponding relationship, wherein the first corresponding relationship is a monotonic relationship; the second determining module is used for when the azimuth angle is 34.0° In the case of ≤φ<35.2644°, it is determined that the corresponding relationship between the normalization function and the frequency domain is a second corresponding relationship, wherein the second corresponding relationship is a monotonic relationship and a three-value coexistence relationship; Three determination modules, configured to determine the correspondence between the normalization function and the frequency domain as a third correspondence when the azimuth angle is 39.4°≤φ<45°, wherein the The third corresponding relationship is a relationship of coexistence of monotonicity, double value and three values; the fourth determination module is used for determining the relationship between the normalization function and the frequency domain when the azimuth angle is φ=45° The corresponding relationship between is a fourth corresponding relationship, wherein the fourth corresponding relationship is a dual value relationship; a fifth determination module is used to determine the normalization when the azimuth angle is 45°≤φ<90°. The correspondence between the normalization function and the frequency domain is a fifth correspondence, wherein the fifth correspondence is a single-value and a dual-value coexistence relationship.

Optionally, the third determination subunit includes: a sixth determination module, configured to determine the frequency according to the normalization function by using a dichotomy method when the corresponding relationship is the first corresponding relationship Apparent resistivity in the domain.

Optionally, the third determination subunit includes: a seventh determination module, configured to determine the normalization function when the corresponding relationship is the second corresponding relationship and the third corresponding relationship an interval with a maximum value and an interval with a minimum value; the first acquisition module is used to correct the interval with a maximum value and the interval with a minimum value to obtain a theoretical normalization function; the eighth determination module, for determining apparent resistivity in the frequency domain according to the theoretical normalization function.

Optionally, the third determination subunit includes: a second acquisition module, configured to modify the normalization function according to a predetermined condition when the corresponding relationship is the fourth corresponding relationship, to obtain Theoretical normalization function; the ninth determination module is used to search for the maximum point of the theoretical normalization function, and determine the first sub-normalization function and the second sub-normalization corresponding to both sides of the maximum point respectively The tenth determination module is used to determine the monotonicity of the first sub-normalized function and the monotonicity of the second sub-normalized function; the eleventh determination module is used to determine the monotonicity of the second sub-normalized function according to the The monotonicity of the first sub-normalization function and the monotonicity of the second sub-normalization function determine the apparent resistivity in the frequency domain.

Optionally, the third determination subunit includes: a twelfth determination module, configured to, when the corresponding relationship is the fifth corresponding relationship, determine the corresponding value of the first interval of the normalized function. The third sub-normalization function adopts the dichotomy method to determine the apparent resistivity; the thirteenth acquisition module is used for normalizing the second interval of the normalization function to the fourth sub-normalization corresponding to the second interval The function is modified to obtain a modified second sub-normalized function; a fourteenth determination module is configured to determine the apparent resistivity in the frequency domain according to the modified second sub-normalized function.

Optionally, the above-mentioned apparatus for determining apparent resistivity further includes: a fourth determining subunit, used for determining the apparent resistivity in the frequency domain according to the corresponding relationship, according to the difference between the normalization function and a predetermined value. The relationship between the first interval and the second interval is determined, wherein the predetermined value is |2cos ² φ-1|, and φ is the azimuth angle.

其中，

为所述理论归一化函数，β为修正系数，

为所述归一化函数，H_y表示频率域内的测点在水平Y方向上的磁场分量。Optionally, the first obtaining module includes: an obtaining sub-module for obtaining the theoretical normalization function through a first formula, wherein the first formula is:

in,

is the theoretical normalization function, β is the correction coefficient,

As the normalization function, H _y represents the magnetic field component in the horizontal Y direction of the measuring point in the frequency domain.

Optionally, the above-mentioned apparatus for determining apparent resistivity further includes: a fifteenth determination module, configured to determine all the parameters before correcting the interval with a maximum value and the interval with a minimum value to obtain the theoretical normalization function. the correction factor.

According to another aspect of the embodiments of the present invention, a storage medium is further provided, and the storage medium includes a stored program, wherein the program executes any one of the above-mentioned methods for determining apparent resistivity.

According to another aspect of the embodiments of the present invention, a processor is also provided, and the processor is configured to run a program, wherein when the program is run, any one of the above-mentioned methods for determining apparent resistivity is executed.

In the embodiment of the present invention, the magnetic field component of the measuring point in the frequency domain in the horizontal Y direction is determined; then the normalization function corresponding to the magnetic field component is determined; then the normalization function and the frequency domain parameters are used to determine the the apparent resistivity in the frequency domain. Through the method for determining apparent resistivity provided in the embodiment of the present invention, the horizontal Y-direction magnetic field component in the frequency domain can be established for independent measurement and processing, thereby effectively reducing the static displacement effect existing in the horizontal electric field component, and measuring in areas with complex terrain It can realize small point distance measurement and improve the horizontal and lateral resolution of the underground medium, thus solving the problem that the electromagnetic measurement technology in the related technology cannot measure the frequency. The technical problem of separate measurement and processing of the magnetic field components in the Y direction of the domain level.

Description of drawings

The accompanying drawings described herein are used to provide a further understanding of the present invention and constitute a part of the present application. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the attached image:

1 is a flowchart of a method for determining apparent resistivity according to an embodiment of the present invention;

FIG. 2 is a schematic diagram of field layout of the frequency domain terrestrial electromagnetic method according to an embodiment of the present invention;

Figure 3 is a schematic diagram of "full area" apparent resistivity according to an embodiment of the present invention;

FIG. 4 is a schematic diagram of an apparatus for determining apparent resistivity according to an embodiment of the present invention.

Detailed ways

In order to make those skilled in the art better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only Embodiments are part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

It should be noted that the terms "first", "second" and the like in the description and claims of the present invention and the above drawings are used to distinguish similar objects, and are not necessarily used to describe a specific sequence or sequence. It is to be understood that the data so used may be interchanged under appropriate circumstances such that the embodiments of the invention described herein can be practiced in sequences other than those illustrated or described herein. Furthermore, the terms "comprising" and "having" and any variations thereof, are intended to cover non-exclusive inclusion, for example, a process, method, system, product or device comprising a series of steps or units is not necessarily limited to those expressly listed Rather, those steps or units may include other steps or units not expressly listed or inherent to these processes, methods, products or devices.

For the convenience of description, some nouns or terms appearing in the embodiments of the present invention are described in detail below:

Frequency domain: It refers to analyzing the function from the perspective of the frequency of the function, and the time domain is opposite to the frequency domain. That is, if the signal is analyzed from the time domain, the time is the abscissa, and the amplitude is the ordinate, and when the frequency domain is analyzed, the frequency is the abscissa, and the amplitude is the ordinate.

Electric dipole: A system of two equal and opposite point charges. Its characteristics are described by the electric dipole moment p=qi, where i is the distance between two point charges, and the directions of i and p are specified from -q to +q.

Circular frequency: It means that the motion of an object in simple harmonic vibration can be described by a reference circle. The particle makes a uniform circular motion around the center of the circle with the amplitude as the radius, and the angular velocity is 2π times the vibration frequency of the particle. One revolution of a particle around the center of a circle is equivalent to one cycle of angular vibration defined as uniform circular motion.

Resistivity: It is a physical quantity used to express the resistance characteristics of various substances, that is, the ratio of the product of the resistance and the cross-sectional area of the original made of a certain substance (20°C at room temperature) to the length. The resistivity has nothing to do with the length and cross-sectional area of the conductor. It is the electrical property of the conductor material itself, which is determined by the material of the conductor and is related to temperature.

Quantity: is a concept from functionals and functions of complex variables.

Spectrum: short for frequency spectral density, is the frequency distribution curve. Complex oscillations are decomposed into harmonic oscillations with different amplitudes and frequencies, and the graph in which the amplitudes of these harmonic oscillations are arranged according to frequency is called spectrum.

Apparent resistivity: is a parameter used to reflect changes in the electrical conductivity of rocks and ores. In the case of uneven electrical distribution of underground rock or uneven surface, the resistivity obtained by the method and calculation formula for measuring the earth resistivity at a uniform level is called apparent resistivity, which is represented by the symbol ps, and the unit and The resistivity is the same as Ω·m.

Normalization: It is a way of simplifying calculation, that is, a dimensional expression is transformed into a dimensionless expression and becomes a scalar.

Example 1

According to an embodiment of the present invention, a method embodiment of a method for determining apparent resistivity is provided. It should be noted that the steps shown in the flowchart of the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions and, although a logical order is shown in the flowcharts, in some cases the steps shown or described may be performed in an order different from that herein.

1 is a flowchart of a method for determining apparent resistivity according to an embodiment of the present invention. As shown in FIG. 1 , the method for determining apparent resistivity includes the following steps:

Step S102, determining the magnetic field component of the measuring point in the frequency domain in the horizontal Y direction.

Among them, the ground electromagnetic method is an electromagnetic exploration method that uses artificial sources to transmit excitation signals and observe the induced electromagnetic field in the study area to study the underground electrical structure.

为收发距(AB中点O到测点P的距离，单位：米)，φ为发射电偶极子中心点O和测点P的连线与发射电偶极子AB间的夹角。H_y(f)为与发射电偶极子垂直方向的水平Y方向磁场分量。图中圆点为测点，通常点距2-10米。FIG. 2 is a schematic diagram of field layout of the frequency domain terrestrial electromagnetic method according to an embodiment of the present invention. As shown in Figure 2, the physical quantity measured at the observation point is the magnetic field in the horizontal Y direction, namely: H _y (f) (unit: nt), where f is the observation frequency (unit: Hz). In Figure 2, AB is the transmitting electric dipole, the current intensity of the sinusoidal waveform fed into the ground through the transmitter is I, and the dipole moment of the transmitting electric dipole is P _E =I·AB (ampere/meter),

is the sending and receiving distance (the distance from the midpoint O of AB to the measuring point P, unit: m), and φ is the angle between the connecting line between the center point O of the transmitting electric dipole and the measuring point P and the transmitting electric dipole AB. Hy (f) is the horizontal _Y -direction magnetic field component in the direction perpendicular to the emitting electric dipole. The dots in the figure are measuring points, usually 2-10 meters away.

Generally, in a limited time range (for example, 1 day or 1 week), the frequency spectrum of the total horizontal magnetic field component is obtained at all measuring points one by one, namely: H _y (x _i , y _i , ω _j ) , i=1,...,M; j=1,...,N. M is the number of points actually observed on the ground, and N is the total number of frequency points observed on each measurement point. ω is the circular frequency, ω _j =2πf _j . Through the processing and inversion of the spectral data, the resistivity plane distribution data of the underground formation at a specific depth (for example, the ignition layer during fire flooding mining) can be obtained.

Step S104, determining the normalization function corresponding to the magnetic field component.

Step S106, the apparent resistivity in the frequency domain is determined according to the normalization function and the frequency domain parameters.

In the above steps, the magnetic field component in the horizontal Y direction of the measuring point in the frequency domain can be determined, and then the normalization function corresponding to the magnetic field component can be determined, and the apparent resistivity in the frequency domain can be determined according to the normalization function and the frequency domain parameters. . Compared with the disadvantage that the electromagnetic measurement technology in the related art cannot independently measure and process the horizontal Y-direction magnetic field component in the frequency domain, the method for determining the apparent resistivity provided in the embodiment of the present invention can establish the horizontal Y-direction magnetic field component in the frequency domain. Separate measurement and processing can effectively reduce the static displacement effect in the electric field component in the horizontal direction, the terrain effect of measuring in complex terrain areas, and the disadvantages of difficult layout of measuring points when measuring in complex terrain areas, and can achieve small point distance. It measures and improves the horizontal and lateral resolution of the underground medium, thereby solving the technical problem that the electromagnetic measurement technology in the related art cannot measure and process the magnetic field component in the horizontal Y direction in the frequency domain alone.

In the embodiment of the present invention, the artificial source method is adopted, and the layout method as shown in FIG. 2 is adopted for data collection in the field, and the measuring points can be formed in a line or a plane within a certain area. An independent horizontal Y-direction magnetic field component probe (for example, an induction coil) is arranged on each measuring point. In a limited and short time range, the frequency spectrum of the horizontal Y-direction magnetic field component is obtained at all measuring points one by one.

隐含在以下等式(1)中："Full Area" Apparent Resistivity in Embodiments of the Invention

Implicit in the following equation (1):

I,K分别是宗量为

的第一类和第二类变型贝塞尔函数。in,

I, K are respectively the volume of

The first and second types of variant Bessel functions.

称为水平Y方向磁场分量理论归一化函数，其形式为公式(2)：in addition,

It is called the theoretical normalization function of the magnetic field component in the horizontal Y direction, and its form is formula (2):

Through the conversion process, the normalization function of the magnetic field component in the horizontal Y direction is calculated:

As an optional embodiment of the present invention, determining the apparent resistivity in the frequency domain according to the normalization function and the frequency domain parameters may include: determining the connection between the center point of the electric dipole and the measuring point and the electric dipole The azimuth between the azimuths; the corresponding relationship between the normalization function and the frequency domain parameters is determined according to the azimuth; the apparent resistivity in the frequency domain is determined according to the corresponding relationship.

In the above embodiment, determining the correspondence between the normalization function and the frequency domain parameters according to the azimuth angle may include: when the azimuth angle is 0°≤φ<34° and the azimuth angle is 35.2644°≤φ<39.4° , the corresponding relationship between the normalized function and the frequency domain is the first corresponding relationship, where the first corresponding relationship is a monotonic relationship; when the azimuth angle is 34.0°≤φ<35.2644°, the normalized function and the The correspondence between the frequency domains is the second correspondence, where the second correspondence is a monotonic relationship and a three-value coexistence relationship; when the azimuth angle is 39.4°≤φ<45°, the normalization function and the frequency domain The correspondence between them is the third correspondence, wherein the third correspondence is the coexistence of monotonic, double and triple values; when the azimuth angle is φ=45°, the relationship between the normalization function and the frequency domain The corresponding relationship is the fourth corresponding relationship, wherein the fourth corresponding relationship is a dual value relationship; when the azimuth angle is 45°≤φ<90°, the corresponding relationship between the normalized function and the frequency domain is the fifth corresponding relationship relationship, wherein the fifth corresponding relationship is a single-valued and a dual-valued coexistence relationship.

It can be known from the above embodiments that in the case where the corresponding relationship between the normalization function and the frequency domain parameter is different, the method for determining the apparent resistivity is also different, which will be described in detail below.

For example, determining the apparent resistivity in the frequency domain according to the corresponding relationship may include: when the corresponding relationship is the first corresponding relationship, using a dichotomy method to determine the apparent resistivity in the frequency domain according to a normalization function.

For another example, determining the apparent resistivity in the frequency domain according to the corresponding relationship may include: in the case that the corresponding relationship is the second corresponding relationship and the third corresponding relationship, determining the normalized function has an interval with a maximum value and a region with a minimum value. interval; correct the interval with a maximum value and an interval with a minimum value to obtain a theoretical normalization function; determine the apparent resistivity in the frequency domain according to the theoretical normalization function.

For another example, determining the apparent resistivity in the frequency domain according to the corresponding relationship may include: when the corresponding relationship is the fourth corresponding relationship, modifying the normalization function according to a predetermined condition to obtain a theoretical normalization function; searching for a theoretical normalization function The maximum point of the function is determined, and the first sub-normalization function and the second sub-normalization function corresponding to both sides of the maximum point are determined; Monotonicity of the normalized function; the apparent resistivity in the frequency domain is determined from the monotonicity of the first sub-normalized function and the monotonicity of the second sub-normalized function.

In addition, determining the apparent resistivity in the frequency domain according to the corresponding relationship may include: in the case that the corresponding relationship is the fifth corresponding relationship, using a dichotomy method for the third sub-normalized function corresponding to the first interval of the normalized function to determine the apparent resistivity Resistivity; modify the fourth sub-normalization function corresponding to the second interval in the second interval of the normalization function to obtain the second sub-normalization function after modification; according to the second sub-normalization function after modification The function determines the apparent resistivity in the frequency domain.

As an optional embodiment of the present invention, before determining the apparent resistivity in the frequency domain according to the corresponding relationship, the above-mentioned method for determining the apparent resistivity may further include: determining the first interval according to the relationship between the normalization function and the predetermined value and the second interval, where the predetermined value is |2cos ² φ-1|, and φ is the azimuth angle.

其中，

为理论归一化函数，β为修正系数，

为归一化函数，Hy表示频率域内的测点在水平Y方向上的磁场分量。As an optional embodiment of the present invention, modifying an interval with a maximum value and an interval with a minimum value to obtain the theoretical normalized function may include: obtaining the theoretical normalized function by using the first formula, wherein the first A formula is:

in,

is the theoretical normalization function, β is the correction coefficient,

As a normalization function, Hy represents the magnetic field component in the horizontal Y direction of the measuring point in the frequency domain.

As an optional embodiment of the present invention, before correcting the interval with a maximum value and the interval with a minimum value to obtain a theoretical normalization function, the above-mentioned method for determining apparent resistivity may further include: determining a correction coefficient .

The method for determining the apparent resistivity provided in the embodiments of the present invention will be described in detail below.

Step 1. Obtain the recorded data of the horizontal Y-direction magnetic field in the frequency domain collected in the field Hy (x _i , _{y i} , ω _j ), i=1,...,M; j=1,...,N.

Using the arrangement shown in Figure 2, an independent horizontal Y-direction magnetic field component probe (for example, an induction coil) is arranged on each measuring point. In a limited and short time range (eg 1 day or 1 week), the frequency spectrum of the horizontal Y-direction magnetic field component is obtained at all measuring points one by one.

The second step. Calculate the measured normalization function of the magnetic field component in the horizontal Y direction. This can be done using formula (3).

具体计算过程如下。The third step. Calculate the apparent resistivity of the "full area" by using the "morphological stretching method" and "dichotomy method" for the measured normalization function of the horizontal Y-direction magnetic field component in the frequency domain

The specific calculation process is as follows.

与变量a＝real(k)r(a为频率域参数)之间的关系是单调的，故可采用“二分法”计算

初始端点值取为(即界定隔根区间)

和

这里所称“二分法”是指数值计算方法中的解非线性方程的“二分法”。(1) When the azimuth angle is 0°≤φ<34°, due to

The relationship with the variable a=real(k)r (a is the frequency domain parameter) is monotonic, so the "dichotomy" method can be used to calculate

The initial endpoint value is taken as (that is, to define the interval between the roots)

and

The "dichotomy" referred to here is the "dichotomy" for solving nonlinear equations in the exponential value calculation method.

与变量a之间关系是单调和三值共存的。因此对水平Y方向磁场分量实测归一化函数

在出现局部极大和极小值的区间要由“形态伸缩法”修正为

再计算

这里所称“形态伸缩法”是指将区间内的所有实测归一化函数修正为形式化和标准化(满足均匀半空间的理论归一化函数特征)的归一化场值，称这种修正为归一化函数的“形态伸缩法”。预先由均匀半空间的解析解(上述公式(2))计算属于该方位角的水平Y方向磁场分量理论归一化函数的特征参数

和

即可在三个等效解中排除两个伪解而获得唯一的一个真解。这里a＝real(k)r。(2) When 34.0°≤φ＜35.2644°,

The relationship with variable a is monotonic and three-valued coexist. Therefore, the measured normalization function of the magnetic field component in the horizontal Y direction

In the interval where local maxima and minima appear, it should be corrected by the "morphological stretching method" as

recalculate

The "morphological scaling method" referred to here refers to modifying all the measured normalization functions in the interval into normalized field values that are formalized and standardized (the theoretical normalization function characteristics that satisfy the uniform half-space), which is called this modification. is the "morphological scaling method" of the normalized function. The characteristic parameters of the theoretical normalization function of the horizontal Y-direction magnetic field component belonging to the azimuth are calculated in advance from the analytical solution of the uniform half-space (formula (2) above)

and

That is, two false solutions can be excluded from the three equivalent solutions to obtain only one true solution. Here a=real(k)r.

与变量a之间关系是单调的。采用“二分法”计算

初始端点值(即隔根区间)取为

和

(3) When 35.2644°≤φ＜39.4°,

The relationship with variable a is monotonic. Calculated using the "dichotomy" method

The initial endpoint value (ie interval interval) is taken as

and

与变量a之间关系是单调、双值和三值并存的。因此对水平Y方向磁场分量实测归一化函数

在出现局部极大和极小值的区间要由“形态伸缩法”修正为

再计算

预先由均匀半空间的解析解(上述公式(2))计算属于该方位角的特征参数

和

即可在三个等效解中排除两个伪解。(4) When 39.4°≤φ＜45°,

The relationship with the variable a is monotonic, double-valued and triple-valued. Therefore, the measured normalization function of the magnetic field component in the horizontal Y direction

In the interval where local maxima and minima appear, it should be corrected by the "morphological stretching method" as

recalculate

The characteristic parameters belonging to the azimuth are calculated in advance from the analytical solution of the uniform half space (formula (2) above)

and

Two pseudo-solutions can be excluded from the three equivalent solutions.

时：

与变量a之间关系双值对应关系。属于此方位角的特征参数为

将水平Y方向磁场分量实测归一化函数“形态伸缩”到其最大值

等于0.2491125的状态。然后在其极大值点两侧分别按单调情况采用“二分法”计算

(5) When

Time:

There is a double-valued correspondence between the relationship and the variable a. The characteristic parameters belonging to this azimuth are

The measured normalization function of the horizontal Y-direction magnetic field component is "morphologically stretched" to its maximum value

A state equal to 0.2491125. Then, the "dichotomy" method is used to calculate the monotonic case on both sides of the maximum point.

与频率参数a之间关系是单值和双值并存的。在水平Y方向磁场分量实测归一化函数

的区间采用“二分法”

在水平Y方向磁场分量实测归一化函数

出现局部极大的区间

由“形态伸缩法”修正为

再计算

预先由均匀半空间的解析解(上述公式(2))计算属于该方位角的特征参数即

和

即可在两个等效解中排除一个伪解。“形态伸缩法”的校正系数β可以通过公式(4)取为：(6) For 45°≤φ<90°.

The relationship with the frequency parameter a is the coexistence of single value and double value. The measured normalization function of the magnetic field component in the horizontal Y direction

The interval of the "dichotomy"

The measured normalization function of the magnetic field component in the horizontal Y direction

local maxima

Modified from "Shape Scaling" to

recalculate

The characteristic parameters belonging to the azimuth are calculated in advance from the analytical solution of the uniform half-space (formula (2) above), namely

and

One of the pseudo-solutions can be excluded from the two equivalent solutions. The correction coefficient β of the "morphological stretching method" can be taken as:

Therefore, the measured normalization function of the magnetic field component in the horizontal Y direction is modified by the "morphological stretching method" into the form shown in formula (5):

According to the above steps, the "full area" apparent resistivity corresponding to the magnetic field component in the horizontal Y direction at any azimuth angle can be calculated

3 is a schematic diagram of the apparent resistivity of the "full area" according to an embodiment of the present invention, which is a continuous curve and maintains an approximate positive correspondence with the resistivity characteristics of the underground electrical formation. Its main functions are as follows: first, it is convenient to find the initial model of the inversion, and second, it can be used to construct a suitable inversion objective function, so as to ensure that the inversion can start normally, continue and converge to the true solution.

Compared with the prior art, the method for determining apparent resistivity provided by the embodiment of the present invention has the following effects:

(1) Only the magnetic field component in the horizontal Y direction is collected, which reduces the engineering cost.

(2) The acquisition device is a magnetic probe. If an induction coil (magnetic rod) is used, its size is small, so that it has better detection signal fixed-point. If a smaller measuring point distance is selected, the horizontal stratigraphic resolution capability of engineering survey can be improved.

(3) Since the magnetic field components in the horizontal Y direction are collected, the mutual interference between the measuring points is small, thereby improving the signal-to-noise ratio of the data.

(4) In a limited and short time range (for example, 1 day or 1 week), obtain the frequency spectrum of the horizontal magnetic field component at all measuring points one by one. This is equivalent to synchronously collecting data of all measuring points in a survey area, so it is time-sensitive. The accuracy of reservoir dynamic monitoring is improved.

(5) The definition and calculation method of the exact but not approximate "full area" apparent resistivity are given. The key technical difficulties of subsequent processing and inversion are solved.

Table 1 shows the correspondence between the number of layers and the resistivity and the thickness of the bottom layer, as shown in Table 1.

Table 1

Example 2

According to an embodiment of the present invention, an apparatus for determining apparent resistivity is also provided. It should be noted that the apparatus for determining apparent resistivity in the embodiment of the present invention can be used to execute the method for determining apparent resistivity provided by the embodiment of the present invention. . The following describes the device for determining apparent resistivity provided by the embodiments of the present invention.

FIG. 4 is a schematic diagram of an apparatus for determining apparent resistivity according to an embodiment of the present invention. As shown in FIG. 4 , it includes: a first determining unit 41 , a second determining unit 43 and a third determining unit 45 . The device for determining the apparent resistivity will be described in detail below.

The first determining unit 41 is configured to determine the magnetic field component of the measuring point in the frequency domain in the horizontal Y direction.

The second determining unit 43 is connected to the above-mentioned second determining unit 43, and is configured to determine the normalization function corresponding to the magnetic field component.

The third determining unit 45 is connected to the above-mentioned second determining unit 43, and is configured to determine the apparent resistivity in the frequency domain according to the normalization function and the frequency domain parameters.

In the above embodiment, the first determining unit may be used to determine the magnetic field component of the measuring point in the frequency domain in the horizontal Y direction; then the second determining unit may be used to determine the normalization function corresponding to the magnetic field component; and the third determining unit may be used according to The normalization function and frequency domain parameters determine the apparent resistivity in the frequency domain. Compared with the disadvantage that the electromagnetic measurement technology in the related art cannot independently measure and process the horizontal Y-direction magnetic field component in the frequency domain, the device for determining the apparent resistivity provided in the embodiment of the present invention can establish the horizontal Y-direction magnetic field component in the frequency domain. Separate measurement and processing can effectively reduce the static displacement effect in the electric field component in the horizontal direction, the terrain effect of measuring in complex terrain areas, and the disadvantages of difficult layout of measuring points when measuring in complex terrain areas, and can achieve small point distance. It measures and improves the horizontal and lateral resolution of the underground medium, thereby solving the technical problem that the electromagnetic measurement technology in the related art cannot measure and process the magnetic field component in the horizontal Y direction in the frequency domain alone.

As an optional embodiment of the present invention, the above-mentioned third determination unit may include: a first determination subunit, configured to determine the connection line between the center point of the electric dipole and the measuring point and the connection between the electric dipoles The azimuth angle; the second determination subunit is used to determine the correspondence between the normalized function and the frequency domain parameter according to the azimuth angle; the third determination subunit is used to determine the apparent resistivity in the frequency domain according to the correspondence.

As an optional embodiment of the present invention, the above-mentioned second determination subunit may include: a first determination module, configured to be used when the azimuth angle is 0°≤φ<34° and the azimuth angle is 35.2644°≤φ<39.4° Next, determine the correspondence between the normalized function and the frequency domain as the first correspondence, wherein the first correspondence is a monotonic relationship; the second determination module is used for the azimuth angle of 34.0°≤φ<35.2644° In this case, the corresponding relationship between the normalization function and the frequency domain is determined as the second correspondence relationship, wherein the second correspondence relationship is a monotonic relationship and a three-value coexistence relationship; the third determination module is used for the azimuth angle of 39.4° In the case of ≤φ<45°, the corresponding relationship between the normalization function and the frequency domain is determined to be the third corresponding relationship, wherein the third corresponding relationship is a relationship of coexistence of monotonic, double-valued and three-valued; the fourth determination module , which is used to determine the correspondence between the normalized function and the frequency domain as the fourth correspondence, where the azimuth angle is φ=45°, where the fourth correspondence is a dual value relationship; the fifth determination module, using In the case where the azimuth angle is 45°≤φ<90°, the corresponding relationship between the normalization function and the frequency domain is determined as a fifth corresponding relationship, wherein the fifth corresponding relationship is a single-valued and a dual-valued coexistence relationship.

As an optional embodiment of the present invention, the above-mentioned third determination subunit may include: a sixth determination module, configured to use a dichotomy method to determine the frequency domain according to the normalization function when the corresponding relationship is the first corresponding relationship. Apparent resistivity.

As an optional embodiment of the present invention, the above-mentioned third determination subunit may include: a seventh determination module, configured to determine that the normalization function has a pole when the corresponding relationship is the second corresponding relationship and the third corresponding relationship The interval with large value and the interval with minimum value; the first acquisition module is used to revise the interval with maximum value and the interval with minimum value to obtain a theoretical normalization function; the eighth determination module is used for Determine the apparent resistivity in the frequency domain from a theoretical normalization function.

As an optional embodiment of the present invention, the above-mentioned third determination subunit may include: a second acquisition module, configured to modify the normalization function according to a predetermined condition when the corresponding relationship is the fourth corresponding relationship to obtain Theoretical normalization function; the ninth determination module is used to search for the maximum point of the theoretical normalization function, and determine the first sub-normalization function and the second sub-normalization function corresponding to the two sides of the maximum point respectively The tenth determination module is used to determine the monotonicity of the first sub-normalized function and the monotonicity of the second sub-normalized function; the eleventh determination module is used to determine the monotonicity of the first sub-normalized function according to the monotonicity of the first sub-normalized function. and the monotonicity of the second sub-normalization function determine the apparent resistivity in the frequency domain.

As an optional embodiment of the present invention, the above-mentioned third determination subunit may include: a twelfth determination module, configured to, when the correspondence is the fifth correspondence, The third sub-normalization function adopts the dichotomy method to determine the apparent resistivity; the thirteenth acquisition module is used to modify the second interval of the normalization function and the fourth sub-normalization function corresponding to the second interval to obtain the modified the second sub-normalization function after modification; the fourteenth determining module is used for determining the apparent resistivity in the frequency domain according to the second sub-normalization function after modification.

As an optional embodiment of the present invention, the above-mentioned apparatus for determining apparent resistivity may further include: a fourth determining subunit, configured to determine the apparent resistivity in the frequency domain according to the corresponding relationship, according to the normalization function and the predetermined value before determining the apparent resistivity in the frequency domain. The relationship between determines the first interval and the second interval, wherein the predetermined value is |2cos ² φ-1|, and φ is the azimuth angle.

其中，

为理论归一化函数，β为修正系数，

为归一化函数，H_y表示频率域内的测点在水平Y方向上的磁场分量。As an optional embodiment of the present invention, the above-mentioned first obtaining module may include: an obtaining sub-module for obtaining the theoretical normalization function through a first formula, wherein the first formula is:

in,

is the theoretical normalization function, β is the correction coefficient,

As a normalization function, H _y represents the magnetic field component in the horizontal Y direction of the measuring point in the frequency domain.

As an optional embodiment of the present invention, the above-mentioned apparatus for determining apparent resistivity may further include: a fifteenth determination module, configured to correct the interval with a maximum value and an interval with a minimum value to obtain a theoretical normalization Before normalizing the function, determine the correction factor.

The above-mentioned apparatus for determining apparent resistivity includes a processor and a memory. The above-mentioned first determining unit 41, second determining unit 43, and third determining unit 45 are all stored in the memory as program units, and the processor executes the procedures stored in the memory. The above program unit to achieve the corresponding function.

The above-mentioned processor includes a kernel, and the corresponding program unit is called from the memory by the kernel. The kernel can be set to one or more, and the apparent resistivity in the frequency domain can be determined according to the normalization function and the frequency domain parameters by adjusting the kernel parameters.

The above-mentioned memory may include non-persistent memory in computer readable medium, random access memory (RAM) and/or non-volatile memory, such as read only memory (ROM) or flash memory (flash RAM), the memory includes at least a memory chip.

According to another aspect of the embodiments of the present invention, a storage medium is further provided, and the storage medium includes a stored program, wherein the program executes any one of the above-mentioned methods for determining apparent resistivity.

According to another aspect of the embodiments of the present invention, a processor is also provided, and the processor is used for running a program, wherein when the program is running, any one of the above-mentioned methods for determining apparent resistivity is executed.

An embodiment of the present invention also provides a device, the device includes a processor, a memory, and a program stored in the memory and running on the processor. When the processor executes the program, the following steps are implemented: determining a measurement point in the frequency domain The magnetic field component in the horizontal Y direction; the normalization function corresponding to the magnetic field component is determined; the apparent resistivity in the frequency domain is determined according to the normalization function and the frequency domain parameters.

In an embodiment of the present invention, a computer program product is also provided, which, when executed on a data processing device, is suitable for executing a program initialized with the following method steps: determining the magnetic field component of the measuring point in the frequency domain in the horizontal Y direction; Determine the normalization function corresponding to the magnetic field component; determine the apparent resistivity in the frequency domain according to the normalization function and the frequency domain parameters.

The above-mentioned serial numbers of the embodiments of the present invention are only for description, and do not represent the advantages or disadvantages of the embodiments.

In the above-mentioned embodiments of the present invention, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.

In the several embodiments provided in this application, it should be understood that the disclosed technical content can be implemented in other ways. The device embodiments described above are only illustrative, for example, the division of the units may be a logical function division, and there may be other division methods in actual implementation, for example, multiple units or components may be combined or Integration into another system, or some features can be ignored, or not implemented. On the other hand, the shown or discussed mutual coupling or direct coupling or communication connection may be through some interfaces, indirect coupling or communication connection of units or modules, and may be in electrical or other forms.

The units described as separate components may or may not be physically separated, and components shown as units may or may not be physical units, that is, may be located in one place, or may be distributed to multiple units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution in this embodiment.

In addition, each functional unit in each embodiment of the present invention may be integrated into one processing unit, or each unit may exist physically alone, or two or more units may be integrated into one unit. The above-mentioned integrated units may be implemented in the form of hardware, or may be implemented in the form of software functional units.

The integrated unit, if implemented in the form of a software functional unit and sold or used as an independent product, may be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention is essentially or the part that contributes to the prior art, or all or part of the technical solution can be embodied in the form of a software product, and the computer software product is stored in a storage medium , including several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes: U disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), mobile hard disk, magnetic disk or optical disk and other media that can store program codes .

The above are only the preferred embodiments of the present invention. It should be pointed out that for those skilled in the art, without departing from the principles of the present invention, several improvements and modifications can be made. It should be regarded as the protection scope of the present invention.

Claims (16)

1. A method for determining apparent resistivity, comprising:

determining a magnetic field component of a measuring point in a frequency domain in the horizontal Y direction;

determining a normalization function corresponding to the magnetic field component;

determining apparent resistivity in the frequency domain according to the normalization function and the frequency domain parameters;

wherein determining apparent resistivity in the frequency domain from the normalization function and the frequency domain parameters comprises: determining a connecting line between a central point and a measuring point of an electric dipole and an azimuth angle between the electric dipole; determining a corresponding relation between the normalization function and the frequency domain parameters according to the azimuth angles; determining apparent resistivity in the frequency domain according to the corresponding relation;

wherein determining the corresponding relationship between the normalization function and the frequency domain parameter according to the azimuth angle comprises: at said azimuth angle of

And the azimuth angle is

In the case of (a), a correspondence between the normalization function and the frequency domain is a first correspondence, wherein the first correspondence is a monotonic relationship; at said azimuth angle of

In the case of (3), a correspondence between the normalization function and the frequency domain is a second correspondence, where the second correspondence is a monotonic relationship and a three-value coexistence relationship; at said azimuth angle of

In the case of (3), a correspondence between the normalization function and the frequency domain is a third correspondence, where the third correspondence is a relationship of monotone, binary, and coexistence of ternary; at said azimuth angle of

In the case of (3), a correspondence between the normalization function and the frequency domain is a fourth correspondence, wherein the fourth correspondence is a two-valued relationship; at said azimuth angle of

In this case, the correspondence between the normalization function and the frequency domain is a fifth correspondence, where the fifth correspondence is a single-value and double-value coexistence relationship.

2. The method of claim 1, wherein determining apparent resistivity in the frequency domain from the correspondence comprises:

and determining apparent resistivity in the frequency domain by adopting a dichotomy according to the normalization function under the condition that the corresponding relation is the first corresponding relation.

3. The method of claim 1, wherein determining apparent resistivity in the frequency domain from the correspondence comprises:

determining an interval in which the normalization function has a maximum value and an interval in which the normalization function has a minimum value under the condition that the corresponding relationship is the second corresponding relationship and the third corresponding relationship;

correcting the interval with the maximum value and the interval with the minimum value to obtain a theoretical normalization function;

and determining apparent resistivity in the frequency domain according to the theoretical normalization function.

4. The method of claim 1, wherein determining apparent resistivity in the frequency domain from the correspondence comprises:

under the condition that the corresponding relation is the fourth corresponding relation, correcting the normalization function according to a preset condition to obtain a theoretical normalization function;

searching a maximum value point of a theoretical normalization function, and determining a first sub-normalization function and a second sub-normalization function which respectively correspond to two sides of the maximum value point;

determining a monotonicity according to the first sub-normalization function and a monotonicity of the second sub-normalization function;

and determining apparent resistivity in the frequency domain according to the monotonicity of the first sub-normalization function and the monotonicity of the second sub-normalization function.

5. The method of claim 1, wherein determining apparent resistivity in the frequency domain from the correspondence comprises:

determining the apparent resistivity by adopting a dichotomy for a third sub-normalization function corresponding to the first interval of the normalization function under the condition that the corresponding relation is the fifth corresponding relation;

correcting a fourth sub-normalization function corresponding to a second interval of the normalization function to obtain a corrected second sub-normalization function;

and determining apparent resistivity in the frequency domain according to the corrected second sub-normalization function.

6. The method of claim 5, further comprising, prior to determining apparent resistivity in the frequency domain from the correspondence:

determining the first interval and the second interval according to the relation between the normalization function and a predetermined value, wherein the predetermined value is |2cos²Phi-1, phi being the azimuth.

7. The method of claim 3, wherein modifying the interval in which the maximum value exists and the interval in which the minimum value exists to obtain the theoretical normalization function comprises:

obtaining a theoretical normalization function through a first formula, wherein the first formula is as follows:

wherein,

for the theoretical normalization function, β is a correction factor,

as the normalization function, H_yRepresenting the magnetic field component in the horizontal Y-direction of the measurement point in the frequency domain.

8. An apparent resistivity determination apparatus, comprising:

a first determination unit for determining a magnetic field component of a measurement point in a frequency domain in a horizontal Y direction;

a second determination unit for determining a normalization function corresponding to the magnetic field component;

a third determining unit, configured to determine apparent resistivity in the frequency domain according to the normalization function and the frequency domain parameter;

wherein the third determination unit includes: the first determining subunit is used for determining a connecting line between a central point and a measuring point of an electric dipole and an azimuth angle between the electric dipole; the second determining subunit is used for determining the corresponding relation between the normalization function and the frequency domain parameter according to the azimuth angle; the third determining subunit is used for determining the apparent resistivity in the frequency domain according to the corresponding relation;

wherein the second determining subunit includes: a first determination module for determining at said azimuth angle

And the azimuth angle is

Determining that a correspondence between the normalization function and the frequency domain is a first correspondence, wherein the first correspondence is a monotonic relationship; a second determination module for determining at said azimuth angle

Determining a corresponding relation between the normalization function and the frequency domain as a second corresponding relation, wherein the second corresponding relation is a monotonic relation and a three-value coexistence relation; a third determining module for determining at said azimuth angle

Determining that a corresponding relation between the normalization function and the frequency domain is a third corresponding relation, wherein the third corresponding relation is a relation of monotone, double values and coexistence of three values; a fourth determining module for determining at said azimuth angle

Determining that a correspondence between the normalization function and the frequency domain is a fourth correspondence, wherein the fourth correspondence is a two-valued correspondence; a fifth determining module for determining at said azimuth angle

Determining that a corresponding relation between the normalization function and the frequency domain is a fifth corresponding relation, wherein the fifth corresponding relation is a single-value and double-value coexistence relation.

9. The apparatus of claim 8, wherein the third determining subunit comprises:

and a sixth determining module, configured to determine, according to the normalization function, apparent resistivity in the frequency domain by using a dichotomy when the correspondence is the first correspondence.

10. The apparatus of claim 9, wherein the third determining subunit comprises:

a seventh determining module, configured to determine, when the correspondence is the second correspondence or the third correspondence, an interval in which a maximum value exists and an interval in which a minimum value exists in the normalization function;

the first acquisition module is used for correcting the interval with the maximum value and the interval with the minimum value to obtain a theoretical normalization function;

and the eighth determining module is used for determining the apparent resistivity in the frequency domain according to the theoretical normalization function.

11. The apparatus of claim 8, wherein the third determining subunit comprises:

the second obtaining module is used for correcting the normalization function according to a preset condition under the condition that the corresponding relation is the fourth corresponding relation to obtain a theoretical normalization function;

a ninth determining module, configured to search a maximum point of a theoretical normalization function, and determine a first sub-normalization function and a second sub-normalization function that correspond to two sides of the maximum point, respectively;

a tenth determining module, configured to determine monotonicity according to the first sub-normalization function and monotonicity of the second sub-normalization function;

an eleventh determining module, configured to determine apparent resistivity in the frequency domain according to a monotonicity of the first sub-normalization function and a monotonicity of the second sub-normalization function.

12. The apparatus of claim 8, wherein the third determining subunit comprises:

a twelfth determining module, configured to determine, by using a dichotomy method, the apparent resistivity for a third sub-normalization function corresponding to a first interval of the normalization function when the correspondence is the fifth correspondence;

a thirteenth obtaining module, configured to modify a fourth sub-normalization function corresponding to a second interval of the normalization function to obtain a modified second sub-normalization function;

a fourteenth determining module, configured to determine apparent resistivity in the frequency domain according to the modified second sub-normalization function.

13. The apparatus of claim 12, further comprising:

a fourth determining subunit for determining whether to perform the following operationsBefore the apparent resistivity in the frequency domain is determined according to the corresponding relation, determining the first interval and the second interval according to the relation between the normalization function and a preset value, wherein the preset value is |2cos²Phi-1, phi being the azimuth.

14. The apparatus of claim 10, wherein the first obtaining module comprises:

the obtaining submodule is used for obtaining a theoretical normalization function through a first formula, wherein the first formula is as follows:

wherein,

for the theoretical normalization function, β is a correction factor,

as the normalization function, H_yRepresenting the magnetic field component in the horizontal Y-direction of the measurement point in the frequency domain.

15. A storage medium characterized by comprising a stored program, wherein the program executes the determination method of apparent resistivity according to any one of claims 1 to 7.

16. A processor, characterized in that the processor is configured to run a program, wherein the program is configured to perform the method of determining apparent resistivity of any one of claims 1 to 7 when running.

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