CN119815200B - Pixel circuit, image sensor, image pickup module, device, and image generation method - Google Patents
Pixel circuit, image sensor, image pickup module, device, and image generation methodInfo
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- CN119815200B CN119815200B CN202411962692.8A CN202411962692A CN119815200B CN 119815200 B CN119815200 B CN 119815200B CN 202411962692 A CN202411962692 A CN 202411962692A CN 119815200 B CN119815200 B CN 119815200B
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Abstract
本申请公开了一种像素电路、图像传感器、摄像模组、设备及图像生成方法，属于摄像技术领域。像素电路包括多行多列的像素单元和多个信号读出单元；多个信号读出单元的输入端与多行像素单元一一电连接；多个信号读出单元的输入端与多个模数转换器一一电连接；每个像素单元包括校准子单元、补偿子单元和n行n列的像素子单元；校准子单元的第一端与像素子单元包括的感光元件的正极电连接；校准子单元的第二端与第一模数转换器电连接；校准子单元的第三端与补偿子单元的输出端电连接；补偿子单元的输入端与图像处理器电连接；补偿子单元用于接收图像处理器发送的基准值，对每个感光元件的感光值进行校准；图像处理器与多个模数转换器电连接。
This application discloses a pixel circuit, an image sensor, a camera module, a device, and an image generation method, belonging to the field of camera technology. The pixel circuit includes multiple rows and columns of pixel units and multiple signal readout units; the input terminals of the multiple signal readout units are electrically connected to each of the multiple rows of pixel units; the input terminals of the multiple signal readout units are electrically connected to each of the multiple analog-to-digital converters; each pixel unit includes a calibration subunit, a compensation subunit, and n rows and n columns of pixel subunits; the first terminal of the calibration subunit is electrically connected to the positive electrode of the photosensitive element included in the pixel subunit; the second terminal of the calibration subunit is electrically connected to a first analog-to-digital converter; the third terminal of the calibration subunit is electrically connected to the output terminal of the compensation subunit; the input terminal of the compensation subunit is electrically connected to an image processor; the compensation subunit is used to receive a reference value sent by the image processor and calibrate the photosensitive value of each photosensitive element; the image processor is electrically connected to the multiple analog-to-digital converters.
Description
Technical Field
The application belongs to the technical field of image pickup, and particularly relates to a pixel circuit, an image sensor, an image pickup module, equipment and an image generation method.
Background
The industries of electronic equipment such as mobile phones and cameras compete strongly, and more pursuit of photographing clearer images is more and more pursued.
In the related art, in order to improve the image sharpness, an image is generally generated by a pixel-by-pixel method, for example, four-in-one, nine-in-one, and sixteen-in-one, and the generated image is a multiple bayer image, and when the multiple bayer image is generated, each pixel is output, and the multiple bayer image is finally generated.
However, the image processor can only process bayer images, and multiple bayer images need to be processed into bayer images through a re-integration (remosaic) algorithm. However, when the multiple bayer image is processed into a bayer image using the remosaic algorithm, the image sharpness is reduced due to the influence of crosstalk (Xtalk), resulting in image blurring.
Disclosure of Invention
The embodiment of the application aims to provide a pixel circuit, an image sensor, an image pickup module, equipment and an image generation method, which can improve the definition of an image.
In a first aspect, an embodiment of the present application provides a pixel circuit including a plurality of rows and columns of pixel units and a plurality of signal readout units;
the input ends of the signal reading units are electrically connected with the pixel units in a plurality of rows one by one;
the signal reading units are used for reading out voltage signals corresponding to each row of pixel units to the analog-to-digital converters;
Each pixel unit comprises a calibration subunit, a compensation subunit and n rows and n columns of pixel subunits, wherein n is a positive integer greater than or equal to 2, and the colors corresponding to the pixel subunits included in the same pixel unit are the same;
the first end of the calibration subunit is electrically connected with the anode of the photosensitive element included in the pixel subunit;
The second end of the calibration subunit is electrically connected with a first analog-to-digital converter, wherein the first analog-to-digital converter is an analog-to-digital converter electrically connected with the row where the pixel unit is located;
The third end of the calibration subunit is electrically connected with the output end of the compensation subunit;
The compensation subunit is used for receiving a reference value which is sent by the image processor and used for calibrating the photosensitive value of each photosensitive element, and calibrating the photosensitive value of each photosensitive element;
the image processor is electrically connected with the plurality of analog-to-digital converters.
In a second aspect, an embodiment of the present application provides an image sensor, including:
The pixel circuit provided by the embodiment of the application.
In a third aspect, an embodiment of the present application provides an image capturing module, including:
the embodiment of the application provides an image sensor.
In a fourth aspect, an embodiment of the present application provides an electronic device, including:
the embodiment of the application provides a camera module.
Fifth, an embodiment of the present application provides an image generating method, which is applied to the electronic device provided by the embodiment of the present application, and the method includes:
Acquiring a photosensitive value of each pixel subunit in n rows and n columns of pixel subunits;
Determining a reference value for calibrating the sensitization value of the pixel subunit according to the sensitization value;
and calibrating the photosensitive value of each pixel subunit according to the reference value to obtain a calibrated Bayer image with n 2 times.
The pixel circuit comprises a plurality of rows and columns of pixel units and a plurality of signal reading units, wherein the input ends of the plurality of signal reading units are electrically connected with the plurality of rows of pixel units one by one, the plurality of signal reading units are electrically connected with the plurality of analog-to-digital converters one by one, the signal reading units are used for reading voltage signals corresponding to each row of pixel units to the analog-to-digital converters, each pixel unit comprises a calibration subunit, a compensation subunit and n rows and n columns of pixel subunits, n is a positive integer greater than or equal to 2, the colors corresponding to the pixel subunits included in the same pixel unit are the same, the first end of the calibration subunit is electrically connected with the positive electrode of a photosensitive element included in the pixel subunit, the second end of the calibration subunit is electrically connected with the first analog-to-digital converter, the third end of the calibration subunit is electrically connected with the output end of the compensation subunit, the input end of the compensation subunit is electrically connected with the image processor, the compensation subunit is used for receiving values sent by the image processor for calibrating the photosensitive elements, and the first analog-to-digital converter is electrically connected with the photosensitive element. The photosensitive value of each photosensitive element is calibrated through the electric signal of the positive electrode of the photosensitive element, the Bayer image with n 2 times of the calibrated photosensitive value is obtained, the influence of crosstalk can be eliminated, and the image definition is improved.
Drawings
Fig. 1 is a schematic structural diagram of a pixel circuit according to an embodiment of the present application;
fig. 2 is a schematic diagram of a first structure of a pixel unit according to an embodiment of the present application;
fig. 3 is a schematic diagram of a second structure of a pixel unit according to an embodiment of the present application;
Fig. 4 is a schematic diagram of a third structure of a pixel unit according to an embodiment of the present application;
fig. 5 is a schematic diagram of a fourth structure of a pixel unit according to an embodiment of the present application;
Fig. 6 is a schematic diagram of a fifth structure of a pixel unit according to an embodiment of the present application;
fig. 7 is a schematic diagram of a specific structure of a pixel unit according to an embodiment of the present application;
FIG. 8 is a flow chart of an image generation method according to an embodiment of the present application;
Fig. 9 is a schematic diagram of a hardware structure of an electronic device implementing an embodiment of the present application.
Detailed Description
The technical solutions of the embodiments of the present application will be clearly described below with reference to the drawings in the embodiments of the present application, and it is apparent that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which are obtained by a person skilled in the art based on the embodiments of the present application, fall within the scope of protection of the present application.
The terms first, second and the like in the description and in the claims, are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the terms so used are interchangeable under appropriate circumstances such that the embodiments of the application are capable of operation in sequences other than those illustrated or otherwise described herein, and that the objects identified by "first," "second," etc. are generally of a type not limited to the number of objects, for example, the first object may be one or more. Furthermore, in the description and claims, "and/or" means at least one of the connected objects, and the character "/", generally means that the associated object is an "or" relationship.
The pixel circuit, the image sensor, the image capturing module, the device and the image generating method provided by the embodiment of the application are described in detail below through specific embodiments and application scenes thereof with reference to the accompanying drawings.
The pixel circuit provided by the embodiment of the application comprises a plurality of rows and a plurality of columns of pixel units and a plurality of signal reading units, wherein the input ends of the plurality of signal reading units are electrically connected with the plurality of rows of pixel units one by one, the plurality of signal reading units are electrically connected with a plurality of analog-to-digital converters one by one, the signal reading units are used for reading voltage signals corresponding to the pixel units in each row to the analog-to-digital converters, the plurality of analog-to-digital converters are connected with an image processor, and the image processor generates an image according to digital signals generated by the analog-to-digital converters.
As shown in fig. 1, fig. 1 is a schematic structural diagram of a pixel circuit according to an embodiment of the present application. In fig. 1, a pixel circuit 100 includes a plurality of rows and columns of pixel units 11 and a plurality of signal readout units 12, wherein input ends of the plurality of signal readout units 12 are electrically connected with the plurality of rows of pixel units 11 one by one, the plurality of signal readout units 12 are electrically connected with the plurality of analog-to-digital converters 200 one by one, an image processor 300 is electrically connected with the plurality of analog-to-digital converters 200, the analog-to-digital converters 200 convert voltage signals of each row of pixel units obtained by sampling into digital signals, and the image processor 300 generates an image according to the digital signals generated by the analog-to-digital converters 200.
In some possible implementations of the embodiments of the present application, each pixel unit in the embodiments of the present application includes a calibration subunit, a compensation subunit, and n rows and n columns of pixel subunits, where n is a positive integer greater than or equal to 2, where the pixel subunits included in the same pixel unit have the same color, a first end of the calibration subunit is electrically connected to an anode of a photosensitive element included in the pixel subunit, a second end of the calibration subunit is electrically connected to a first analog-to-digital converter, where the first analog-to-digital converter is an analog-to-digital converter electrically connected to a row where the pixel unit is located, a third end of the calibration subunit is electrically connected to an output end of the compensation subunit, an input end of the compensation subunit is electrically connected to an image processor, the compensation subunit is configured to receive a reference value sent by the image processor for calibrating a photosensitive value of each photosensitive element, and calibrate the photosensitive value of each photosensitive element, and the image processor is electrically connected to a plurality of analog-to-digital converters.
It will be appreciated that when n is 2, the pixel unit is a four-in-one pixel unit, when n is 3, the pixel unit is a nine-in-one pixel unit, and when n is 4, the pixel unit is a sixteen-in-one pixel unit.
The color corresponding to the pixel sub-units included in the same pixel unit can be red, green, blue, or both.
As shown in fig. 2, fig. 2 is a schematic diagram of a first structure of a pixel unit according to an embodiment of the application. In fig. 2, the pixel unit 11 includes a calibration subunit 112, a compensation subunit 113, and n rows and n columns of pixel subunits 111. The first end of the calibration subunit 112 is electrically connected to the positive electrode of the photosensitive element PD included in the pixel subunit 111, the second end of the calibration subunit 112 is electrically connected to the analog-to-digital converter 200 where the pixel unit 11 is located, the third end of the calibration subunit 112 is electrically connected to the output end of the compensation subunit 113, the input end of the compensation subunit 113 is electrically connected to the image processor 300, the compensation subunit 113 is configured to receive a reference value sent by the image processor 300 for calibrating the photosensitive value of each photosensitive element, calibrate the photosensitive value of each photosensitive element PD, and the image processor 300 is electrically connected to the analog-to-digital converter 200.
In some possible implementations of the embodiments of the present application, the pixel subunit includes a first switching tube, a photosensitive element, and a second switching tube, where a negative electrode of the photosensitive element is electrically connected to a source electrode of the first switching tube, a drain electrode of the first switching tube is electrically connected to a first signal readout unit, where the first signal readout unit is a signal readout unit electrically connected to the pixel unit including the photosensitive element, a positive electrode of the photosensitive element is electrically connected to a drain electrode of the second switching tube, and a source electrode of the second switching tube is grounded.
As shown in fig. 3, fig. 3 is a schematic diagram of a second structure of a pixel unit according to an embodiment of the application. In fig. 3, the pixel sub-unit 111 includes a first switching tube TG1, a photosensitive element PD, and a second switching tube TG2, a negative electrode of the photosensitive element PD is electrically connected to a source electrode of the first switching tube TG1, a drain electrode of the first switching tube TG1 is electrically connected to a signal readout unit 12 including the pixel unit of the photosensitive element PD, a positive electrode of the photosensitive element PD is electrically connected to a drain electrode of the second switching tube TG2, and a source electrode of the second switching tube TG2 is grounded.
In some possible implementations of the embodiments of the present application, the calibration subunit may include a third switching tube and a first capacitor, where a drain electrode of the third switching tube is electrically connected to an anode of the photosensitive element of the pixel subunit, a source electrode of the third switching tube is electrically connected to a first plate of the first capacitor, an output end of the compensation subunit, and the analog-to-digital converter, respectively, and a second plate of the first capacitor is grounded.
As shown in fig. 4, fig. 4 is a schematic diagram of a third structure of a pixel unit according to an embodiment of the application. In fig. 4, the calibration subunit 112 includes a third switching tube TG3 and a first capacitor C1. The drain electrode of the third switching tube TG3 is electrically connected to the positive electrode of the photosensitive element PD of the pixel subunit 111, the source electrode of the third switching tube TG3 is electrically connected to the first plate of the first capacitor C1, the output end of the compensation subunit 113 is electrically connected to the analog-to-digital converter 200, and the second plate of the first capacitor C1 is grounded.
In some possible implementations of the embodiments of the present application, the calibration subunit may further include a fourth switching tube, a drain electrode of the fourth switching tube is connected to the power supply, and a source electrode of the fourth switching tube is electrically connected to the first plate of the first capacitor.
As shown in fig. 5, fig. 5 is a schematic diagram of a fourth structure of a pixel unit according to an embodiment of the present application. In fig. 5, the calibration subunit 112 includes a third switching tube TG3, a first capacitor C1, and a fourth switching tube TG4. The drain electrode of the third switching tube TG3 is electrically connected with the positive electrode of the photosensitive element PD of the pixel subunit 111, the source electrode of the third switching tube TG3 is electrically connected with the first electrode plate of the first capacitor C1, the source electrode of the fourth switching tube TG4, the output end of the compensation subunit 113 and the analog-to-digital converter 200, the drain electrode of the fourth switching tube is connected with the power supply VDD, and the second electrode plate of the first capacitor C1 is grounded.
When the fourth switching tube TG4 is opened, the first capacitor C1 is emptied.
In some possible implementations of embodiments of the application, the calibration subunit may further include a signal amplifier and a row selector, the drain of the signal amplifier being connected to a power supply, the source of the signal amplifier being electrically connected to the drain of the row selector, the gate of the signal amplifier being electrically connected to the first plate of the first capacitor, the source of the row selector being electrically connected to the analog-to-digital converter.
As shown in fig. 6, fig. 6 is a schematic diagram of a fifth structure of a pixel unit according to an embodiment of the application. In fig. 6, the calibration subunit 112 includes a third switching tube TG3, a first capacitor C1, a signal amplifier TG5, and a row selector TG6, where a drain electrode of the third switching tube TG3 is electrically connected to an anode electrode of the photosensitive element PD of the pixel subunit 111, a source electrode of the third switching tube TG3 is electrically connected to a first plate of the first capacitor C1, a gate electrode of the signal amplifier TG5, and an output end of the compensation subunit 113, a second plate of the first capacitor C1 is grounded, a drain electrode of the signal amplifier TG5 is connected to a power supply VDD, a source electrode of the signal amplifier TG5 is electrically connected to a drain electrode of the row selector TG6, and a source electrode of the row selector TG6 is electrically connected to the analog-to-digital converter 200.
The voltage signal of the first capacitor C1 is amplified by the signal amplifier TG5 and the row selector TG6 and then transmitted to the analog-to-digital converter for reading.
In some possible implementations of the embodiments of the present application, the first capacitor in the embodiments of the present application is a variable capacitor.
Fig. 7 is a schematic diagram of a specific structure of a pixel unit according to an embodiment of the present application.
In fig. 7, the pixel unit 11 includes, a calibration subunit 112, a compensation subunit 113, and 2 rows and 2 columns of pixel subunits 111. The pixel sub-unit 111 includes a first switching transistor TG1, a second switching transistor TG2, and a photosensitive element PD, the calibration sub-unit 112 includes a third switching transistor TG3, a first capacitor C1, a fourth switching transistor TG4, a signal amplifier TG5, and a row selector TG6, and the signal readout unit 12 includes a reset transistor RST, a parasitic capacitor FD, a signal amplifier SF, and a row selector SET.
The pixel sub-units of 2 rows and 2 columns comprise an upper left pixel sub-unit, an upper right pixel sub-unit, a lower left pixel sub-unit and a lower right pixel sub-unit.
In some possible implementations of embodiments of the present application, the switching transistors, signal amplifiers, row selectors, and reset transistors in embodiments of the present application may be Metal-Oxide-semiconductor field effect transistors (MOSFETs).
The cathode of the photosensitive element PD is electrically connected with the source electrode of a first switching tube TG1, the drain electrode of the first switching tube TG1 is electrically connected with the drain electrode of a reset triode RST, a first polar plate of a parasitic capacitor FD and the grid electrode of a signal amplifier SF respectively, the second polar plate of the parasitic capacitor FD is grounded, the source electrode of the reset triode RST and the source electrode of the signal amplifier SF are connected with a power supply VDD, the drain electrode of the signal amplifier SF is electrically connected with the source electrode of a row selector SET, the drain electrode of the row selector SET is electrically connected with the anode of a direct current power supply DC and an analog-digital converter 200 respectively, the anode of the photosensitive element PD is electrically connected with the drain electrode of a second switching tube TG2, and the source electrode of the second switching tube TG2 is grounded. The analog-to-digital converter 200 is connected to an image processor 300.
The drain electrode of the third switching tube TG3 is electrically connected with the positive electrode of the photosensitive element PD of each row of pixel subunits, the source electrode of the third switching tube TG3 is electrically connected with the first polar plate of the first capacitor C1, the source electrode of the fourth switching tube TG4, the output end of the compensation subunit 113 and the gate electrode of the signal amplifier TG5, the drain electrode of the fourth switching tube TG4 and the drain electrode of the signal amplifier TG5 are electrically connected with the power supply VDD, the source electrode of the signal amplifier TG5 is electrically connected with the drain electrode of the row selector TG6, and the source electrode of the row selector TG6 is electrically connected with the analog-to-digital converter 200.
When the pixel is exposed, the reset transistor RST, the fourth switching transistor TG4 and each pixel subunit including the first switching transistor TG1 are turned on, and the first capacitor C1 and the parasitic capacitor FD are emptied. Electron-hole pairs generated by light irradiation are separated by the electric field of the photosensitive element PD, and electrons move to the N region and holes move to the P region. At the end of exposure, the reset transistor RST is turned on, resetting the parasitic capacitance FD to a high level. After the reset is completed, the reset level of the parasitic capacitor FD is read out through the signal amplifier SF and the row selector SET, the signal read at this time is stored as a voltage signal value a, the first switching transistor TG1 included in each pixel subunit is closed, and the charge is completely transferred from the photosensitive region to the parasitic capacitor FD for the second readout. The voltage signal of the parasitic capacitor FD is read out for the second time through the signal amplifier SF and the row selector SET, the signal read at this time is stored as a voltage signal value B, the stored two voltage signal values are subtracted, the obtained voltage signal is a voltage value corresponding to a pure optical signal, and the voltage value is amplified through analog and sampled through the analog-to-digital converter 200, so as to obtain a digital signal corresponding to the optical signal. The analog-to-digital converter 200 sends the digital signal corresponding to the optical signal of each photosensitive element to the image processor 300, and the image processor 300 averages the digital signal corresponding to the photosensitive element included in each pixel unit to obtain the reference value of the corresponding pixel unit, where the digital signal corresponding to the optical signal of each photosensitive element is the photosensitive value of each pixel subunit.
Illustratively, assuming that the photosensitizing value of the photosensitizing element included in the upper left pixel subunit is 85 least significant bits (LEAST SIGNIFICANT Bit, LSB), the photosensitizing value of the photosensitizing element included in the upper right pixel subunit is 110LSB, the photosensitizing value of the photosensitizing element included in the lower left pixel subunit is 90LSB, and the photosensitizing value of the photosensitizing element included in the lower right pixel subunit is 75LSB, the reference value for calibrating the photosensitizing value of the photosensitizing element included in the pixel subunit is (85+110+90+75)/4=90 LSB. And further the photosensitizing value of the photosensitizing element included in the pixel sub-unit is calibrated to 90LSB.
Illustratively, when calibrating the photosensitive value of the photosensitive element included in the upper left pixel subunit, the second switching tube TG2 at the positive end of the photosensitive element included in the upper left pixel subunit is opened, the third switching tube TG3 and the fourth switching tube TG4 are closed, the positively charged holes of the photosensitive element included in the upper left pixel subunit are all transferred to the first capacitor C1, and the calibration parameter corresponding to the photosensitive element included in the upper left pixel subunit is 90LSB/85 lsb=1.059. Assuming that the original capacitance value of the first capacitor C1 is 1 microfarad (uf), the capacitance value of the first capacitor C1 is adjusted to be 1/1.059=0.944 uf by the compensation subunit. After the capacitance value of the first capacitor C1 becomes 0.944uf, the actual voltage of the first capacitor C1 is 1.059 times the original voltage. The voltage signal of the first capacitor C1 is transmitted to the analog-to-digital converter 200 through the signal amplifier TG5 and the row selector TG6 for reading, and the sensitization value 90LSB of the sensitization element included in the calibrated upper left pixel subunit is obtained.
When the photosensitive value of the photosensitive element included in the upper right pixel subunit is calibrated, the fourth switching tube TG4 is opened, the first capacitor C1 is emptied, the third switching tube TG3 is opened, the second switching tube TG2 at the positive end of the photosensitive element included in the upper left pixel subunit is closed, then the second switching tube TG2 at the positive end of the photosensitive element included in the upper right pixel subunit is opened, the third switching tube TG3 and the fourth switching tube TG4 are closed, the positively charged holes of the photosensitive element included in the upper right pixel subunit are all transmitted to the first capacitor C1, and the calibration parameter corresponding to the photosensitive element included in the upper right pixel subunit is 90LSB/110 lsb=0.82. Assuming that the original capacitance value of the first capacitor C1 is 1uf, the capacitance value of the first capacitor C1 is adjusted to be 1/0.82=1.22 uf by the compensation subunit. After the capacitance value of the first capacitor C1 becomes 1.22uf, the actual voltage of the first capacitor C1 is 0.82 times the original voltage. The voltage signal of the first capacitor C1 is transmitted to the analog-to-digital converter 200 through the signal amplifier TG5 and the row selector TG6 for reading, and the sensitization value 90LSB of the sensitization element included in the calibrated upper right pixel subunit is obtained.
When the photosensitive value of the photosensitive element included in the lower left pixel subunit is calibrated, the fourth switching tube TG4 is opened, the first capacitor C1 is emptied, the third switching tube TG3 is opened, the second switching tube TG2 at the positive end of the photosensitive element included in the upper right pixel subunit is closed, then the second switching tube TG2 at the positive end of the photosensitive element included in the lower left pixel subunit is opened, the third switching tube TG3 and the fourth switching tube TG4 are closed, the positively charged holes of the photosensitive element included in the lower left pixel subunit are all transmitted to the first capacitor C1, and the calibration parameter corresponding to the photosensitive element included in the lower left pixel subunit is 90LSB/90 lsb=1. Assuming that the original capacitance value of the first capacitor C1 is 1uf, the capacitance value of the first capacitor C1 is adjusted to be 1/1=1uf by the compensation subunit. The capacitance value of the first capacitor C1 is unchanged, and the actual voltage of the first capacitor C1 is 1 time of the original voltage. The voltage signal of the first capacitor C1 is transmitted to the analog-to-digital converter 200 through the signal amplifier TG5 and the row selector TG6 for reading, and the sensitization value 90LSB of the sensitization element included in the calibrated lower left pixel subunit is obtained.
When the photosensitive value of the photosensitive element included in the lower right pixel subunit is calibrated, the fourth switching tube TG4 is opened, the first capacitor C1 is emptied, the third switching tube TG3 is opened, the second switching tube TG2 at the positive end of the photosensitive element included in the lower left pixel subunit is closed, then the second switching tube TG2 at the positive end of the photosensitive element included in the lower right pixel subunit is opened, the third switching tube TG3 and the fourth switching tube TG4 are closed, the positively charged holes of the photosensitive element included in the lower right pixel subunit are all transmitted to the first capacitor C1, and the calibration parameter corresponding to the photosensitive element included in the lower right pixel subunit is 90LSB/75 lsb=1.2. Assuming that the original capacitance value of the first capacitor C1 is 1uf, the capacitance value of the first capacitor C1 is adjusted to be 1/1.2=0.83 uf by the compensation subunit. After the capacitance value of the first capacitor C1 becomes 0.83uf, the actual voltage of the first capacitor C1 is 1.2 times the original voltage. The voltage signal of the first capacitor C1 is transmitted to the analog-to-digital converter 200 through the signal amplifier TG5 and the row selector TG6 for reading, and the light sensing value 90LSB of the light sensing element included in the calibrated lower right pixel subunit is obtained.
In the embodiment of the application, the photosensitive value of each pixel subunit is calibrated by the electric signal of the positive electrode of the photosensitive element, so that the influence of crosstalk can be eliminated, and further, when a multiple Bayer image is processed into a Bayer image by utilizing remosaic algorithm, the decline of the image definition can be avoided, and the image definition can be improved.
The positive electrode and the negative electrode of the pixel subunit in the embodiment of the application can output two voltage signals, can acquire high-resolution images after calibration crosstalk while not affecting normal pixel functions, can effectively improve the number of real photosensitive pixels, can not generate the condition of image blurring caused by moving or scenery moving when a user photographs, and can improve the image quality.
The embodiment of the application also provides an image sensor, which comprises the pixel circuit provided by the embodiment of the application.
The embodiment of the application also provides a camera module, which comprises the image sensor provided by the embodiment of the application.
The embodiment of the application also provides electronic equipment comprising the camera module provided by the embodiment of the application.
The electronic device in the embodiment of the application can be a terminal or other devices except the terminal. The electronic device may be a Mobile phone, a tablet computer, a notebook computer, a palm computer, a vehicle-mounted electronic device, a Mobile internet appliance (Mobile INTERNET DEVICE, MID), an augmented reality (augmented reality, AR)/Virtual Reality (VR) device, a robot, a wearable device, an ultra-Mobile personal computer (UMPC), a netbook or a Personal Digital Assistant (PDA), etc., and may also be a server, a network attached storage (Network Attached Storage, NAS), a personal computer (personal computer, PC), a Television (TV), a teller machine, a self-service machine, etc., which are not particularly limited in the embodiments of the present application.
The electronic device in the embodiment of the application can be an electronic device with an operating system. The operating system may be an Android operating system, an iOS operating system, or other possible operating systems, and the embodiment of the present application is not limited specifically.
The embodiment of the application also provides an image generation method which is applied to the electronic equipment provided by the embodiment of the application.
Fig. 8 is a flowchart of an image generating method according to an embodiment of the present application. The image generation method may include the steps of:
Step 801, acquiring a photosensitive value of each pixel subunit in n rows and n columns of pixel subunits;
step 802, determining a reference value for calibrating the sensitization value of the pixel subunit according to the sensitization value;
and 803, calibrating the photosensitive value of each pixel subunit according to the reference value to obtain a Bayer image with n 2 times of calibrated photosensitive value.
In some possible implementations of the embodiments of the present application, step 802 may include determining an average value of the sensitization values of the pixel sub-units in the n rows and n columns of pixel sub-units, and taking the average value as a reference value corresponding to the n rows and n columns of pixel sub-units.
In some possible implementations of embodiments of the application, step 803 may include calibrating the sensitization value of each pixel subunit to a baseline value.
Illustratively, the following description will be given by taking an example in which the pixel sub-units of 2 rows and 2 columns include an upper left pixel sub-unit, an upper right pixel sub-unit, a lower left pixel sub-unit, and a lower right pixel sub-unit. Assuming that the pixel sub-unit includes a photosensitive element having a photosensitive value of 85 least significant bits (LEAST SIGNIFICANT Bit, LSB), the pixel sub-unit includes a photosensitive element having a photosensitive value of 110LSB, the pixel sub-unit includes a photosensitive element having a photosensitive value of 90LSB, and the pixel sub-unit includes a photosensitive element having a photosensitive value of 75LSB, the reference value for calibrating the photosensitive value of the photosensitive element included in the pixel sub-unit is (85+110+90+75)/4=90 LSB. And further the photosensitizing value of the photosensitizing element included in the pixel sub-unit is calibrated to 90LSB.
In some possible implementations of the embodiments of the present application, calibrating the photosensitive value of each pixel subunit to a reference value may include calculating, for a first pixel subunit, a ratio of the reference value to the photosensitive value of the first pixel subunit, where the first pixel subunit is any one of n rows and n columns of pixel subunits, opening a second switching tube electrically connected to an anode of the photosensitive element of the first pixel subunit, closing a third switching tube included in the calibration subunit, and adjusting, by the compensation subunit, a capacitance value of a first capacitor included in the calibration subunit to be a fraction of a ratio of an original capacitance value of the first capacitor to calibrate the photosensitive value of the first pixel subunit to the reference value.
Illustratively, the following description will be given by taking an example in which the pixel sub-units of 2 rows and 2 columns include an upper left pixel sub-unit, an upper right pixel sub-unit, a lower left pixel sub-unit, and a lower right pixel sub-unit. The upper left pixel subunit includes a photosensitive element having a photosensitive value of 85LSB, the upper right pixel subunit includes a photosensitive element having a photosensitive value of 110LSB, the lower left pixel subunit includes a photosensitive element having a photosensitive value of 90LSB, and the lower right pixel subunit includes a photosensitive element having a photosensitive value of 75LSB. The reference value corresponding to the pixel sub-units of 2 rows and 2 columns is (85+110+90+75)/4=90 LSB.
When the photosensitive value of the photosensitive element included in the upper left pixel subunit is calibrated, the second switching tube at the positive end of the photosensitive element included in the upper left pixel subunit is opened, the third switching tube and the fourth switching tube are closed, the positively charged holes of the photosensitive element included in the upper left pixel subunit are all transmitted to the first capacitor, and the corresponding calibration parameter of the photosensitive element included in the upper left pixel subunit is 90LSB/85 LSB=1.059. Assuming that the original capacitance value of the first capacitor is 1uf, the capacitance value of the first capacitor is adjusted to be 1/1.059=0.944 uf by the compensation subunit. After the capacitance value of the first capacitor becomes 0.944uf, the actual voltage of the first capacitor is 1.059 times the original voltage. And transmitting the voltage signal of the first capacitor to an analog-to-digital converter through a signal amplifier and a row selector for reading, and obtaining the sensitization value 90LSB of the sensitization element included in the calibrated upper left pixel subunit.
When the photosensitive value of the photosensitive element included in the upper right pixel subunit is calibrated, the fourth switching tube is opened, the first capacitor is emptied, the third switching tube is opened, the second switching tube at the positive end of the photosensitive element included in the upper left pixel subunit is closed, then the second switching tube at the positive end of the photosensitive element included in the upper right pixel subunit is opened, the third switching tube and the fourth switching tube are closed, all positively charged holes of the photosensitive element included in the upper right pixel subunit are transmitted to the first capacitor, and the calibration parameter corresponding to the photosensitive element included in the upper right pixel subunit is 90LSB/110 LSB=0.82. Assuming that the original capacitance value of the first capacitor is 1uf, the capacitance value of the first capacitor is adjusted to be 1/0.82=1.22 uf through the compensation subunit. After the capacitance value of the first capacitor becomes 1.22uf, the actual voltage of the first capacitor is 0.82 times of the original voltage. And transmitting the voltage signal of the first capacitor to an analog-to-digital converter through a signal amplifier and a row selector for reading, and obtaining the sensitization value 90LSB of the sensitization element included in the calibrated upper right pixel subunit.
When the photosensitive value of the photosensitive element included in the lower left pixel subunit is calibrated, the fourth switching tube is opened, the first capacitor is emptied, the third switching tube is opened, the second switching tube at the positive end of the photosensitive element included in the upper right pixel subunit is closed, then the second switching tube at the positive end of the photosensitive element included in the lower left pixel subunit is opened, the third switching tube and the fourth switching tube are closed, all positively charged holes of the photosensitive element included in the lower left pixel subunit are transmitted to the first capacitor, and the corresponding calibration parameter of the photosensitive element included in the lower left pixel subunit is 90LSB/90 LSB=1. Assuming that the original capacitance value of the first capacitor is 1uf, the capacitance value of the first capacitor C1 is adjusted to be 1/1=1 uf by the compensation subunit. The capacitance value of the first capacitor is unchanged, and the actual voltage of the first capacitor is 1 time of the original voltage. And transmitting the voltage signal of the first capacitor to an analog-to-digital converter through a signal amplifier and a row selector for reading, and obtaining the sensitization value 90LSB of the sensitization element included in the calibrated lower left pixel subunit.
When the photosensitive value of the photosensitive element included in the lower right pixel subunit is calibrated, the fourth switching tube is opened, the first capacitor is emptied, the third switching tube is opened, the second switching tube at the positive end of the photosensitive element included in the lower left pixel subunit is closed, then the second switching tube at the positive end of the photosensitive element included in the lower right pixel subunit is opened, the third switching tube and the fourth switching tube are closed, all positive holes of the photosensitive element included in the lower right pixel subunit are transmitted to the first capacitor, and the calibration parameter corresponding to the photosensitive element included in the lower right pixel subunit is 90LSB/75 LSB=1.2. Assuming that the original capacitance value of the first capacitor is 1uf, the capacitance value of the first capacitor C1 is adjusted to be 1/1.2=0.83 uf by the compensation subunit. After the capacitance value of the first capacitor becomes 0.83uf, the actual voltage of the first capacitor is 1.2 times of the original voltage. And transmitting the voltage signal of the first capacitor to an analog-to-digital converter through a signal amplifier and a row selector for reading, and obtaining the sensitization value 90LSB of the sensitization element included in the calibrated right lower pixel subunit.
In the embodiment of the application, the photosensitive value of each pixel subunit is calibrated by the electric signal of the positive electrode of the photosensitive element, so that the influence of crosstalk can be eliminated, and further, when a multiple Bayer image is processed into a Bayer image by utilizing remosaic algorithm, the decline of the image definition can be avoided, and the image definition can be improved.
Fig. 9 is a schematic diagram of a hardware structure of an electronic device implementing an embodiment of the present application.
The electronic device 900 includes, but is not limited to, a radio frequency unit 901, a network module 902, an audio output unit 903, an input unit 904, a sensor 905, a display unit 906, a user input unit 907, an interface unit 908, a memory 909, and a processor 910.
Those skilled in the art will appreciate that the electronic device 900 may also include a power source (e.g., a battery) for powering the various components, which may be logically connected to the processor 910 by a power management system to perform functions such as managing charge, discharge, and power consumption by the power management system. The electronic device structure shown in fig. 9 does not constitute a limitation of the electronic device, and the electronic device may include more or less components than shown, or may combine certain components, or may be arranged in different components, which are not described in detail herein.
The electronic device 900 in the embodiment of the application comprises the camera module provided by the embodiment of the application, the camera module provided by the embodiment of the application comprises the image sensor provided by the embodiment of the application, and the image sensor provided by the embodiment of the application comprises the pixel circuit provided by the embodiment of the application.
The processor 910 is configured to obtain a light sensing value of each pixel subunit in n rows and n columns of pixel subunits, determine a reference value for calibrating the light sensing value of the pixel subunit according to the light sensing value, and calibrate the light sensing value of each pixel subunit according to the reference value to obtain a bayer image n2 times of the calibrated light sensing value.
In the embodiment of the application, the influence of crosstalk can be eliminated by calibrating the photosensitive value of each pixel subunit, so that the decline of the image definition can be avoided and the image definition can be improved when the multiple Bayer image is processed into the Bayer image by remosaic algorithm.
It should be appreciated that in embodiments of the present application, the input unit 904 may include a graphics processor (Graphics Processing Unit, GPU) 9041 and a microphone 9042, with the graphics processor 9041 processing image data of still pictures or video obtained by an image capture device (e.g., a camera) in a video capture mode or an image capture mode. The display unit 906 may include a display panel 9061, and the display panel 9061 may be configured in the form of a liquid crystal display, an organic light emitting diode, or the like. The user input unit 907 includes at least one of a touch panel 9071 and other input devices 9072. Touch panel 9071, also referred to as a touch screen. The touch panel 9071 may include two parts, a touch detection device and a touch controller. Other input devices 9072 may include, but are not limited to, a physical keyboard, function keys (e.g., volume control keys, switch keys, etc.), a trackball, a mouse, a joystick, and so forth, which are not described in detail herein.
The memory 909 may be used to store software programs as well as various data. The memory 909 may mainly include a first storage area storing programs or instructions and a second storage area storing data, wherein the first storage area may store an operating system, application programs or instructions (such as a sound playing function, an image playing function, etc.) required for at least one function, and the like. Further, the memory 909 may include a volatile memory or a nonvolatile memory, or the memory 909 may include both volatile and nonvolatile memories. The nonvolatile Memory may be a Read-Only Memory (ROM), a Programmable ROM (PROM), an Erasable PROM (EPROM), an Electrically Erasable EPROM (EEPROM), or a flash Memory. The volatile memory may be random access memory (Random Access Memory, RAM), static random access memory (STATIC RAM, SRAM), dynamic random access memory (DYNAMIC RAM, DRAM), synchronous Dynamic Random Access Memory (SDRAM), double data rate Synchronous dynamic random access memory (Double DATA RATE SDRAM, DDRSDRAM), enhanced Synchronous dynamic random access memory (ENHANCED SDRAM, ESDRAM), synchronous link dynamic random access memory (SYNCH LINK DRAM, SLDRAM), and Direct random access memory (DRRAM). Memory 909 in embodiments of the application includes, but is not limited to, these and any other suitable types of memory.
Processor 910 may include one or more processing units, and optionally, processor 910 integrates an application processor that primarily processes operations involving an operating system, user interface, application program, etc., and a modem processor that primarily processes wireless communication signals, such as a baseband processor. It will be appreciated that the modem processor described above may not be integrated into the processor 910.
The embodiment of the application also provides a readable storage medium, on which a program or an instruction is stored, which when executed by a processor, implements each process of the above-mentioned image generation method embodiment, and can achieve the same technical effects, and in order to avoid repetition, the description is omitted here.
Wherein the processor is a processor in the electronic device described in the above embodiment. The readable storage medium includes a computer readable storage medium, and examples of the computer readable storage medium include a non-transitory computer readable medium such as a computer read-only memory ROM, a random access memory RAM, a magnetic disk or optical disk, and the like.
The embodiment of the application also provides a chip, which comprises a processor and a communication interface, wherein the communication interface is coupled with the processor, and the processor is used for running programs or instructions to realize the processes of the embodiment of the image generation method, and can achieve the same technical effects, so that repetition is avoided, and the description is omitted here.
It should be understood that the chips referred to in the embodiments of the present application may also be referred to as system-on-chip chips, chip systems, or system-on-chip chips, etc.
Embodiments of the present application also provide a computer program product stored in a storage medium, where the program product is executed by at least one processor to implement the respective processes of the above-described image generating method embodiment, and achieve the same technical effects, and for avoiding repetition, a detailed description is omitted herein.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element. Furthermore, it should be noted that the scope of the methods and apparatus in the embodiments of the present application is not limited to performing the functions in the order shown or discussed, but may also include performing the functions in a substantially simultaneous manner or in an opposite order depending on the functions involved, e.g., the described methods may be performed in an order different from that described, and various steps may be added, omitted, or combined. Additionally, features described with reference to certain examples may be combined in other examples.
From the above description of the embodiments, it will be clear to those skilled in the art that the above-described embodiment method may be implemented by means of software plus a necessary general hardware platform, but of course may also be implemented by means of hardware, but in many cases the former is a preferred embodiment. Based on such understanding, the technical solution of the present application may be embodied essentially or in a part contributing to the prior art in the form of a computer software product stored in a storage medium (e.g. ROM/RAM, magnetic disk, optical disk) comprising instructions for causing a terminal (which may be a mobile phone, a computer, a server, or a network device, etc.) to perform the method according to the embodiments of the present application.
The embodiments of the present application have been described above with reference to the accompanying drawings, but the present application is not limited to the above-described embodiments, which are merely illustrative and not restrictive, and many forms may be made by those having ordinary skill in the art without departing from the spirit of the present application and the scope of the claims, which are to be protected by the present application.
Claims (13)
1. A pixel circuit is characterized by comprising a plurality of rows and columns of pixel units and a plurality of signal reading units;
the input ends of the signal reading units are electrically connected with the pixel units in a plurality of rows one by one;
The output ends of the signal reading units are electrically connected with the analog-to-digital converters one by one, and the signal reading units are used for reading out voltage signals corresponding to each row of pixel units to the analog-to-digital converters;
Each pixel unit comprises a calibration subunit, a compensation subunit and n rows and n columns of pixel subunits, wherein n is a positive integer greater than or equal to 2, and the colors corresponding to the pixel subunits included in the same pixel unit are the same;
the first end of the calibration subunit is electrically connected with the anode of the photosensitive element included in the pixel subunit;
the second end of the calibration subunit is electrically connected with a first analog-to-digital converter, wherein the first analog-to-digital converter is an analog-to-digital converter electrically connected with the row where the pixel unit is located;
The third end of the calibration subunit is electrically connected with the output end of the compensation subunit;
The compensation subunit is used for receiving a reference value which is sent by the image processor and used for calibrating the photosensitive value of each photosensitive element, and calibrating the photosensitive value of each photosensitive element;
the image processor is electrically connected with the plurality of analog-to-digital converters.
2. The pixel circuit of claim 1, wherein the pixel sub-unit comprises a first switching tube, a photosensitive element, and a second switching tube;
The negative electrode of the photosensitive element is electrically connected with the source electrode of the first switch tube;
The drain electrode of the first switch tube is electrically connected with a first signal reading unit, wherein the first signal reading unit is a signal reading unit electrically connected with a pixel unit comprising the photosensitive element;
the anode of the photosensitive element is electrically connected with the drain electrode of the second switching tube;
and the source electrode of the second switching tube is grounded.
3. The pixel circuit of claim 1, wherein the calibration subunit comprises a third switching tube and a first capacitor;
The drain electrode of the third switching tube is electrically connected with the anode of the photosensitive element of the pixel subunit;
The source electrode of the third switching tube is respectively and electrically connected with the first polar plate of the first capacitor, the output end of the compensation subunit and the analog-to-digital converter;
The second polar plate of the first capacitor is grounded.
4. The pixel circuit of claim 3 wherein the calibration subunit further comprises a fourth switching tube;
the drain electrode of the fourth switching tube is connected with a power supply;
and the source electrode of the fourth switching tube is electrically connected with the first polar plate of the first capacitor.
5. The pixel circuit of claim 3 wherein the calibration subunit further comprises a signal amplifier and a row selector;
the drain electrode of the signal amplifier is connected with a power supply;
the source electrode of the signal amplifier is electrically connected with the drain electrode of the row selector;
The grid electrode of the signal amplifier is electrically connected with the first polar plate of the first capacitor;
the source of the row selector is electrically connected to the first analog-to-digital converter.
6. A pixel circuit according to claim 3, wherein the first capacitance is a variable capacitance.
7. An image sensor, characterized in that the image sensor comprises the pixel circuit of any one of claims 1 to 6.
8. A camera module is characterized in that, the camera module comprises the image sensor of claim 7.
9. An electronic device, characterized in that, the electronic device comprises the camera module of claim 8.
10. An image generation method, characterized in that it is applied to the electronic device of claim 9, comprising:
acquiring a photosensitive value of each pixel subunit in the n rows and n columns of pixel subunits;
determining a reference value for calibrating the sensitization value of the pixel subunit according to the sensitization value;
And calibrating the photosensitive value of each pixel subunit according to the reference value to obtain a Bayer image with n 2 times of calibrated value.
11. The method of claim 10, wherein determining a reference value for calibrating the pixel sub-unit's exposure value based on the exposure value comprises:
determining an average value of the sensitization values of the pixel sub-units in the pixel sub-units of n rows and n columns;
and taking the average value as the reference value corresponding to the pixel sub-units of the n rows and the n columns.
12. The method of claim 10, wherein calibrating the pixel sub-unit's sensitization value based on the baseline value comprises:
and calibrating the sensitization value of each pixel subunit to the reference value.
13. The method of claim 12, wherein said calibrating the exposure value of each pixel subunit to the baseline value comprises:
Calculating a ratio of the reference value to a light sensing value of a first pixel subunit for the first pixel subunit, wherein the first pixel subunit is any one of the n rows and n columns of pixel subunits;
A second switching tube for disconnecting the first pixel subunit from the anode of the photosensitive element;
Closing a third switching tube included in the calibration subunit;
And adjusting the capacitance value of the first capacitor included in the calibration subunit to be one half of the ratio of the original capacitance value of the first capacitor through the compensation subunit so as to calibrate the photosensitive value of the first pixel subunit to the reference value.
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